CN113030577A - Clock and sine wave generating system and generating method - Google Patents
Clock and sine wave generating system and generating method Download PDFInfo
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- CN113030577A CN113030577A CN202110295436.8A CN202110295436A CN113030577A CN 113030577 A CN113030577 A CN 113030577A CN 202110295436 A CN202110295436 A CN 202110295436A CN 113030577 A CN113030577 A CN 113030577A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
The invention relates to a clock and sine wave generating system and a generating method, comprising a high-precision crystal oscillator, a DDS module A, a comparator, a PLL module, a multi-channel clock buffer, a DDS module B and a programmable digital circuit. The invention solves the problem of generating a clock with sine wave in the frequency range of 1Hz-150MHz and simultaneously ensuring high frequency resolution, the frequency range can reach 1Hz-150MHz by using the AC impedance test equipment, and the frequency resolution can reach 2.2 multiplied by 10 to the maximum‑13Hz; the invention can be used for alternating current impedance test equipment and can also be applied to other scenes needing wide-range high-precision sine waves; the invention breaks through the technical monopoly that foreign enterprises adopt customized integrated circuits or limit the export of China and the like to carry out China for a long time, and can promote the development of domestic alternating current impedance test equipment.
Description
The technical field is as follows:
the invention relates to the technical field of alternating current impedance testing, in particular to a clock and sine wave generating system and a clock and sine wave generating method for high-precision broadband alternating current impedance testing.
Background art:
the alternating current impedance test needs to use one or more sine wave signal sources with high precision, a plurality of high-precision and high-speed analog-digital converters and digital-analog converters are arranged inside the alternating current impedance test, and a mixer is also needed in some high-frequency alternating current impedance tests. The quality of the signal source, the conversion precision of the analog-digital converter, the conversion precision of the digital-analog converter and the mixing result of the mixer directly determine the accuracy of the impedance test. With the improvement of the test precision and the test frequency of the alternating current impedance test equipment, the requirement on the clock used by the internal circuit of the test equipment is higher and higher. The frequency range of the test signal of the ac impedance test equipment is generally wide, with a minimum of several hertz (Hz) and a maximum of one hundred megahertz (MHz). And at one hundred megahertz the frequency resolution still reaches millihertz (mHz) and even micro hertz (uHz).
Domestic high-end impedance test equipment is monopolized by countries such as the United states, the United kingdom and the like for a long time, the high-end impedance test equipment cannot be separated from a sine wave signal source with high precision and low distortion degree, and the high precision and the low distortion degree of the signal source cannot be separated from a clock generating the signal source. Foreign enterprises adopt methods of customizing integrated circuits or limiting export to China and the like to carry out technical monopoly on China for a long time, and the development of domestic impedance test equipment is seriously hindered.
The invention content is as follows:
aiming at the problems, the invention designs a clock and sine wave generating system and a clock and sine wave generating method for high-precision broadband alternating current impedance testing, breaks through the technical barriers abroad, can achieve or exceed the effect of a customized integrated circuit abroad by using common components, and can ensure that the testing frequency range of alternating current impedance testing equipment reaches 1Hz-150MHz and the frequency resolution reaches uHz.
The invention is realized by the following technical scheme:
a clock and sine wave generating system includes
The high-precision crystal oscillator is used for providing a clock;
the DDS module A is connected with the high-precision crystal oscillator and is used for generating a sine wave of 1MHz-30 MHz;
the comparator is connected with the DDS module A and is used for converting sine waves generated by the DDS module A into square waves;
a PLL module connected to the comparator, for multiplying the input clock 16 by a frequency and then outputting the multiplied frequency;
the multi-channel clock buffer is connected with the PLL module and is used for dividing an input clock into a plurality of clocks with the same frequency to be output;
the DDS module B is connected with the multi-channel clock buffer and is used for generating a sine wave of 1Hz-150 MHz;
and the programmable digital circuit is respectively connected with the DDS module A, PLL and the DDS module B and is used for controlling the DDS module A, PLL and the DDS module B.
The above-mentioned DDS module refers to a direct digital frequency synthesizer.
In a preferred embodiment of the present invention, the high-precision crystal oscillator is 131.072MHz and has a frequency stability of 20ppm or more.
Preferably, the DDS module a is 48 bits wide; the DDS module B adopts 32 bit wide.
The invention also provides a clock and sine wave generating method, which adopts the clock and sine wave generating system and comprises the following steps:
(1) firstly, according to the required output frequency of DDS module B, table look-up is carried out to obtain the frequency control word of DDS module B, then according to formula
Calculating the output frequency of the DDS module A;
(3) according to the formula
Calculating a frequency control word of the DDS module A;
(3) and transmitting the calculated DDS module B frequency control word, the DDS module A frequency control word and the PLL module control word to the DDS module A, DDS module B and the PLL module through a programmable digital circuit, thus finishing the control of the whole circuit and generating the required clock.
Wherein, the frequency resolution of the DDS module B output frequency is calculated as follows
When the output frequency is 60MHz-150MHz, the frequency control word of DDS module B is maximum, the frequency resolution is lowest, 2.3X 10-6Hz; when the output frequency is 1Hz-10Hz, the frequency control word of the DDS module B is minimum, the frequency resolution is the highest, and is 2.2 multiplied by 10-13Hz。
The invention has the beneficial effects that:
(1) the invention designs a clock and a sine wave generating system and a generating method, solves the problem of generating a clock with sine wave in the frequency range of 1Hz-150MHz and simultaneously ensuring high frequency resolution, and uses an alternating current impedance testing device to test the frequency range of 1Hz-150MHz and the frequency resolution of 2.2 multiplied by 10 to the maximum-13Hz；
(2) The invention can be used for alternating current impedance test equipment and can also be applied to other scenes needing wide-range high-precision sine waves;
(3) the invention breaks through the technical monopoly that foreign enterprises adopt customized integrated circuits or limit the export of China and the like to carry out China for a long time, and can promote the development of domestic alternating current impedance test equipment.
Description of the drawings:
FIG. 1 is a schematic diagram of a clock and sine wave generating system according to the present invention.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention more readily understood by those skilled in the art, and thus will more clearly and distinctly define the scope of the invention.
A clock and sine wave generation system as shown in FIG. 1 includes
The high-precision crystal oscillator 100 may be an 131.072MHz crystal oscillator with a frequency stability of 20ppm or higher. This crystal is used to clock the DDS module a. 131.072MHz 1000X 217Hz, the specific frequency is used for enabling the clock and the sine wave to be integers when the DDS module is used for generating the clock and the sine wave later, the number of points of each clock or each cycle of each sine wave is guaranteed to be fixed, and the clock and sine wave generating device can be favorable for stability of the clock and high-precision low-distortion degree of the sine wave.
The programmable digital circuit 200, including but not limited to various single-chip microcomputers, CPLDs, FPGAs, etc., is mainly used for controlling the DDS module A, PLL module and the DDS module B.
The DDS module A is 300-48 bit wide, is used for generating sine waves from a few megahertz to twenty megahertz, can be composed of an FPGA, a digital-to-analog converter and a filter circuit or a DDS chip, and can improve the bit wide to improve the frequency resolution.
The comparator 400 changes the sine wave generated by the DDS module A into a square wave.
The PLL module 500 multiplies the input clock 16 and outputs the multiplied clock, and may be configured by a PLL module or a PLL circuit of an FPGA or a VCO + PLL or the like.
The multi-channel clock buffer 600 divides an input clock into a plurality of clocks with the same frequency to be output, and provides clocks for circuits such as the DDS module B, the analog-to-digital converter, and the digital-to-analog converter.
DDS module B700, 32 bits wide, produces a sine wave of 1Hz-150 MHz. The device is used for alternating current impedance testing equipment or other equipment needing sine waves. The circuit can be composed of an FPGA + digital-to-analog converter + filter circuit or a DDS integrated circuit chip.
The principle and process of the clock and sine wave generation method are as follows:
(1) firstly, according to the required output frequency of DDS module B, table look-up is carried out to obtain the frequency control word of DDS module B, then according to formula
Calculating the output frequency of the DDS module A;
(2) according to the formula
Calculating a frequency control word of the DDS module A;
(3) transmitting the calculated DDS module B frequency control word, DDS module A frequency control word and PLL module control word to the DDS module A, DDS module B and PLL module through a programmable digital circuit, thus completing the control of the whole circuit and generating the required clock;
(4) the frequency resolution of the DDS module B output frequency is calculated as follows
From the above formula and table 1, it can be seen that when the output frequency is 60MHz-150MHz, the frequency control word of the DDS module B is the largest, so the frequency resolution is the lowest, 2.3 × 10-6Hz; when the output frequency is 1Hz-10Hz, the frequency control word of the DDS module B is minimum, so the frequency resolution is the highest, which is 2.2 multiplied by 10-13 Hz.
The frequency control word of the DDS module B for each frequency segment is fixed, the above mentioned frequency segments,
the frequency control word and frequency for each segment are shown in table 1 below:
TABLE 1
In summary, the invention designs a clock and a sine wave generating system and a generating method, which solve the problem of generating a clock with sine wave in the frequency range of 1Hz-150MHz and simultaneously ensuring high frequency resolution, and the frequency range can reach 1Hz-150MHz by using an alternating current impedance testing device for testing, and the frequency resolution can reach 2.2 multiplied by 10 to the maximum-13Hz。
The invention can be used for alternating current impedance test equipment and can also be applied to other scenes needing wide-range high-precision sine waves.
The invention breaks through the technical monopoly that foreign enterprises adopt customized integrated circuits or limit the export of China and the like to carry out China for a long time, and can promote the development of domestic alternating current impedance test equipment.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (6)
1. A clock and sine wave generation system, comprising: comprises that
The high-precision crystal oscillator is used for providing a clock;
the DDS module A is connected with the high-precision crystal oscillator and is used for generating a sine wave of 1MHz-30 MHz;
the comparator is connected with the DDS module A and is used for converting sine waves generated by the DDS module A into square waves;
a PLL module connected to the comparator, for multiplying the input clock 16 by a frequency and then outputting the multiplied frequency;
the multi-channel clock buffer is connected with the PLL module and is used for dividing an input clock into a plurality of clocks with the same frequency to be output;
the DDS module B is connected with the multi-channel clock buffer and is used for generating a sine wave of 1Hz-150 MHz;
and the programmable digital circuit is respectively connected with the DDS module A, PLL and the DDS module B and is used for controlling the DDS module A, PLL and the DDS module B.
2. The clock and sine wave generation system of claim 1, wherein: the high-precision crystal oscillator adopts 131.072MHz and has frequency stability of more than 20 ppm.
3. The clock and sine wave generation system of claim 1, wherein: the DDS module A adopts 48-bit width.
4. The clock and sine wave generation system of claim 1, wherein: the DDS module B adopts 32 bit wide.
5. A clock and sine wave generation method using the clock and sine wave generation system for ac impedance testing according to any of claims 1-4, comprising the steps of:
(1) firstly, according to the required output frequency of DDS module B, table look-up is carried out to obtain the frequency control word of DDS module B, then according to formula
Calculating the output frequency of the DDS module A;
(2) according to the formula
Calculating a frequency control word of the DDS module A;
(3) and transmitting the calculated DDS module B frequency control word, the DDS module A frequency control word and the PLL module control word to the DDS module A, DDS module B and the PLL module through a programmable digital circuit, thus finishing the control of the whole circuit and generating the required clock.
6. The clock and sine wave generation method of claim 5, wherein: the frequency resolution of the DDS module B output frequency is calculated as follows
When the output frequency is 60MHz-150MHz, the frequency control word of DDS module B is maximum, the frequency resolution is lowest, 2.3X 10-6Hz; when the output frequency is 1Hz-10Hz, the frequency control word of the DDS module B is minimum, and the frequency resolution isMaximum of 2.2X 10-13Hz。
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Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08256058A (en) * | 1995-03-15 | 1996-10-01 | Anritsu Corp | Signal generator |
| US5598440A (en) * | 1994-11-08 | 1997-01-28 | Mpb Technologies Inc. | DDS driven DDS synthesizer for generating sinewave waveforms with reduced spurious signal levels |
| US20050135524A1 (en) * | 2003-12-23 | 2005-06-23 | Teradyne, Inc. | High resolution synthesizer with improved signal purity |
| US20090295490A1 (en) * | 2008-05-30 | 2009-12-03 | Fujitsu Limited | Dds circuit and electronic device having the same |
| CN101847992A (en) * | 2009-12-31 | 2010-09-29 | 南京国睿安泰信科技股份有限公司 | Frequency synthesis system for enhancing spectrum purity of direct digital frequency synthesizer |
| CN107222207A (en) * | 2017-06-05 | 2017-09-29 | 中国电子科技集团公司第四十研究所 | A kind of 1Hz 1GHz clock generation circuits and method |
| CN108039888A (en) * | 2018-01-17 | 2018-05-15 | 优利德科技(中国)有限公司 | A kind of DDS signal sources clock generating circuit, signal source and its method |
| CN109542161A (en) * | 2019-01-30 | 2019-03-29 | 北京昊海雅正科技有限公司 | A kind of clock signal generating apparatus and method |
| CN109698698A (en) * | 2019-02-21 | 2019-04-30 | 中国人民解放军火箭军工程大学 | A kind of broadband mixing synthetic method and device for distribution interference |
| CN109709393A (en) * | 2018-12-13 | 2019-05-03 | 江汉大学 | Device based on stability of frequency of time domain signal measurement |
| CN210246719U (en) * | 2019-06-20 | 2020-04-03 | 常州国光数据通信有限公司 | Double-channel local vibration source module for short-wave double-path simultaneous receiving system |
-
2021
- 2021-03-19 CN CN202110295436.8A patent/CN113030577B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5598440A (en) * | 1994-11-08 | 1997-01-28 | Mpb Technologies Inc. | DDS driven DDS synthesizer for generating sinewave waveforms with reduced spurious signal levels |
| JPH08256058A (en) * | 1995-03-15 | 1996-10-01 | Anritsu Corp | Signal generator |
| US20050135524A1 (en) * | 2003-12-23 | 2005-06-23 | Teradyne, Inc. | High resolution synthesizer with improved signal purity |
| US20090295490A1 (en) * | 2008-05-30 | 2009-12-03 | Fujitsu Limited | Dds circuit and electronic device having the same |
| CN101847992A (en) * | 2009-12-31 | 2010-09-29 | 南京国睿安泰信科技股份有限公司 | Frequency synthesis system for enhancing spectrum purity of direct digital frequency synthesizer |
| CN107222207A (en) * | 2017-06-05 | 2017-09-29 | 中国电子科技集团公司第四十研究所 | A kind of 1Hz 1GHz clock generation circuits and method |
| CN108039888A (en) * | 2018-01-17 | 2018-05-15 | 优利德科技(中国)有限公司 | A kind of DDS signal sources clock generating circuit, signal source and its method |
| CN109709393A (en) * | 2018-12-13 | 2019-05-03 | 江汉大学 | Device based on stability of frequency of time domain signal measurement |
| CN109542161A (en) * | 2019-01-30 | 2019-03-29 | 北京昊海雅正科技有限公司 | A kind of clock signal generating apparatus and method |
| CN109698698A (en) * | 2019-02-21 | 2019-04-30 | 中国人民解放军火箭军工程大学 | A kind of broadband mixing synthetic method and device for distribution interference |
| CN210246719U (en) * | 2019-06-20 | 2020-04-03 | 常州国光数据通信有限公司 | Double-channel local vibration source module for short-wave double-path simultaneous receiving system |
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