CN113009636B - Method and system for preparing dense wavelength division multiplexing device with high precision - Google Patents
Method and system for preparing dense wavelength division multiplexing device with high precision Download PDFInfo
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- CN113009636B CN113009636B CN202110389404.4A CN202110389404A CN113009636B CN 113009636 B CN113009636 B CN 113009636B CN 202110389404 A CN202110389404 A CN 202110389404A CN 113009636 B CN113009636 B CN 113009636B
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/28—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
- G02B6/293—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
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- H—ELECTRICITY
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- H04J—MULTIPLEX COMMUNICATION
- H04J14/00—Optical multiplex systems
- H04J14/02—Wavelength-division multiplex systems
Abstract
The invention discloses a method and a system for preparing a dense wavelength division multiplexing device with high precision, which comprises the steps of testing the optical path of the dense wavelength division multiplexing device by using an optical frequency domain reflectometer to obtain the optical path value of each wavelength channel of the dense wavelength division multiplexing device; the data center sorts and groups the optical path values, screens an optical path value array meeting preset conditions, and sets an optical path reference value to obtain an optical fiber processing task; executing an optical fiber processing task according to the optical path reference value; compensating the optical fiber which does not accord with the preset condition, and processing the optical fiber after the optical fiber accords with the preset condition; therefore, the phase consistency of microwave signal optical fiber transmission is realized, the processability of all dense wavelength division multiplexing devices is ensured, and the utilization rate is improved.
Description
Technical Field
The invention relates to the technical field of microwave optoelectronic device preparation, in particular to a method and a system for preparing a dense wavelength division multiplexing device with high precision.
Background
Microwave optical transmission is one of core transmission means of signals such as local oscillators, clocks and the like of modern radars and measurement and control systems, and has large-scale and high-precision requirements on phase delay among various subarrays. The dense wavelength division multiplexing technology can save circuit materials, and aiming at the circuit design of microwave optical transmission with the requirements, if any large-scale and high-precision manufacturing measures are not adopted, the production and manufacturing process is extremely heavy, and the manufacturing precision cannot be ensured. Therefore, the technology for preparing the microwave signal optical fiber transmission phase consistency of the dense wavelength division multiplexing device with high precision has very important significance for improving the production efficiency and the product performance parameters.
In the conventional dense wavelength division multiplexing microwave optical fiber transmission phase delay design, in order to maintain phase consistency of each sub-channel, the following two methods are generally adopted: the dense wavelength division multiplexing microwave optical fiber transmission device is arranged in a transmission system, a phase reference is set by testing the parameters of transmitting and receiving electric signals of each path, and all channels are processed according to the reference to ensure the consistency of phase delay; and secondly, measuring the length of the optical fiber of each wavelength channel of the DWDM device by a physical measurement (such as a vernier caliper) method, setting a length reference value of each wavelength channel, and processing all the devices according to the reference value by using an optical fiber cutter and a fusion splicer. The common defects of the two methods are that the reference is required to be set, all channels are processed according to the same reference, if the deviation of the device from the reference is too large, the corresponding device cannot be processed, and the two methods also have the defects of complex work, large workload and low manufacturing precision.
Disclosure of Invention
The invention aims to solve the technical problem of providing a method and a system for preparing a dense wavelength division multiplexing device with high precision, so as to solve the problems that the device deviates from the reference too much, so that the corresponding device cannot be processed and the manufacturing precision is not high in the prior art.
In order to solve the above problems, the present invention provides a method for manufacturing a dense wavelength division multiplexing device with high precision, which specifically comprises the following steps:
s1: testing the optical path of the DWDM device by using an optical frequency domain reflectometer to obtain the optical path value of each wavelength channel of the DWDM device;
s2: the data center sorts and groups the optical path values, judges whether each optical path value array meets preset processing conditions, if yes, continues to execute the step S3, and if not, executes the step S5;
s3: setting a reference value of an optical path to obtain an optical fiber processing task;
s4: executing an optical fiber processing task according to the optical path reference value;
s5: and (3) compensating the optical fiber which does not accord with the preset processing condition in the step (S2) to enable the optical fiber to accord with the preset processing condition, and repeating the steps (S3) to (S4).
Further, the following steps are included after the step S5:
s6: and the test center performs phase consistency test on the wavelength and the signal modulation frequency of each channel of the processed DWDM device.
Further, the step S2 specifically includes the following steps:
s201: the data center collects the optical path value tested by the optical frequency domain reflectometer;
s202: arranging all optical path values in a descending order and calculating the mean square error;
s203: setting a length difference value, dividing all the optical path values into a plurality of arrays, judging whether each array meets the preset processing condition, if so, continuing to execute the step S3, and if not, executing the step S5.
Further, the step S4 specifically includes the following steps:
s401: the dense wavelength division multiplexing devices with the same processing requirements are screened out again according to the set optical path reference value for the optical path value array meeting the preset processing conditions;
s402: the optical fiber cutter executes an optical fiber processing task on the selected dense wavelength division multiplexing device according to the set optical path reference value;
s403: the optical fiber welding machine carries out welding repair on the optical fiber processed by the optical fiber cutter;
s404: performing fiber fusion cutting treatment on other unprocessed optical fibers in the optical path value array which accords with the preset processing condition in the step S401;
s405: steps S402 to S403 are repeated to process the unprocessed optical fiber.
Further, the step S5 specifically includes the following steps:
s501: comparing the difference values between the arrays which do not accord with the preset condition, and respectively screening the arrays which are larger than the preset condition and smaller than the preset condition;
s502: reducing the optical path data of the optical fibers in the array which are larger than the preset condition to be within the range of the preset condition by cutting the reduced optical fibers;
s503: increasing optical fibers in the array which are smaller than the preset condition by fusion so that the optical path data reach the range of the preset condition;
s504: and repeating the steps S3 to S4 to execute the optical fiber processing task.
On the other hand, the invention also provides a system for preparing the dense wavelength division multiplexing device with high precision, which is used for realizing the method for preparing the dense wavelength division multiplexing device with high precision; the system for preparing the dense wavelength division multiplexing device with high precision comprises an optical frequency domain reflectometer, a data center, an optical fiber cutter and an optical fiber fusion splicer which are sequentially connected, wherein the optical frequency domain reflectometer is also connected with a COM end of the dense wavelength division multiplexing device to be processed through an optical fiber and is used for testing optical path values of wavelength channels of the dense wavelength division multiplexing device, and the data center is used for collecting the optical path values tested by the optical frequency domain reflectometer, carrying out normalization analysis and grouping on the optical path values and obtaining a cutting size meeting preset conditions; the optical fiber cutter is used for executing processing tasks on the selected optical fibers according to the cutting size obtained by the data center; the optical fiber welding machine is used for welding and repairing the optical fiber cut by the optical fiber cutter; the optical fiber fusion splicer is further connected with the data center and used for feeding back fusion-spliced and repaired data to the data center.
Furthermore, the system for preparing the dense wavelength division multiplexing device with high precision also comprises a test center, wherein the test center is used for carrying out phase consistency test on the wavelength and the signal modulation frequency of each channel of the dense wavelength division multiplexing device after the processing is finished.
Further, the data center is loaded on a computer, and the optical frequency domain reflectometer is connected with the computer in a wired or wireless mode.
The optical path of each channel wavelength of the dense wavelength division multiplexing device is tested by an optical frequency domain reflectometer, a specific optical path value of each channel wavelength according with the dense wavelength division multiplexing waveband is selected, the data center calculates the optical path reference of the equiphase of each waveband according to the distribution condition of the optical path values, and the selected optical fiber is subjected to isometric processing according to the calculated optical path reference value, so that the transmission phase consistency of the microwave signal optical fiber is realized, the processability of all dense wavelength division multiplexing devices is ensured, and the utilization rate is improved.
Drawings
Fig. 1 is a flow chart of a preferred embodiment of a method for fabricating a dense wavelength division multiplexing device with high accuracy according to the present invention.
Fig. 2 is a flowchart of step S2 in fig. 1.
Fig. 3 is a flowchart of step S4 in fig. 1.
Fig. 4 is a flowchart of step S5 in fig. 1.
Fig. 5 is a schematic system diagram of a preferred embodiment of a system for fabricating a dwdm device with high accuracy according to the present invention.
Detailed Description
The invention will be further described with reference to the accompanying drawings.
Example one
As shown in fig. 1, a flow chart of a preferred embodiment of the method for fabricating a dense wavelength division multiplexing device with high precision of the present invention specifically includes the following steps:
the method specifically comprises the following steps:
s1: the optical path of the DWDM device is tested by using an optical frequency domain reflectometer 1.
The optical path length of each wavelength transmission channel of the dense wavelength division multiplexing device is tested by combining the characteristics of parallel transmission between different wavelengths of the linear frequency sweeping light source of the optical frequency domain reflectometer 1 and the dense wavelength division multiplexing device, and the optical path length value lambda of each wavelength channel of the dense wavelength division multiplexing device can be obtained by selecting the wavelength of the linear frequency sweeping light source or screening the wavelength of the test result.
S2: and the data center sorts and groups the optical path values, judges whether each optical path value array meets preset processing conditions, if so, continues to execute the step S3, and if not, executes the step S5.
The data center 2 collects the optical path values obtained by the test of the optical frequency domain reflectometer 1, normalizes and sorts all the optical path values, divides all the optical path values into a plurality of arrays, judges whether each optical path value array meets preset processing conditions or not, continues to execute the step S3 if the optical path value arrays meet the preset processing conditions, and executes the step S5 if the optical path value arrays do not meet the preset processing conditions. As shown in fig. 2, the method specifically includes the following steps:
s201: the data center 2 collects the optical path value measured by the optical frequency domain reflectometer 1.
In the dataThe center 2 records the optical path value lambda of each wavelength channel of the multiple groups of dense wavelength division multiplexing devices obtained by the test of the optical frequency domain reflectometer 1 np (where n is the number of dense wavelength division multiplexers, and p is the number of wavelength channels per dense wavelength division multiplexing device).
S202: all path values are sorted in descending order and the mean square error is calculated.
The data center 2 performs descending order arrangement on the optical path data with the same p value in the n groups of optical path values, and calculates the corresponding mean square error R p 。
S203: setting a length difference value, dividing all the optical path values into a plurality of arrays, judging whether each array meets the preset processing condition, if so, continuing to execute the step S3, and if not, executing the step S5.
The length difference is set according to the required precision of the processing, and in this embodiment, the length difference is set to 4m (m is the maximum processing length of the optical fiber cutter 3) in combination with the mean square error R calculated in step S202 p Establishing an array of optical path data with the same p value by using the length difference of 4m
The array closest to the mean square error range is set as the preset processing condition, i.e.
Because in each set of optical path data with the same p value, the data fall into the array
The number of dense wavelength division multiplexing devices is the largest, and the processing cost can be the smallest in the processing process, so that the processing cost is saved.
S3: and setting a reference value of the optical path to obtain an optical fiber processing task.
Selecting the optical path value array meeting the preset condition
According to the specific parameters and optical path value array of the optical fiber cutter 3
And setting the optical path reference value in the interval range to obtain the optical fiber processing task.
Specifically, according to the fixed distance L from the tangent point on the optical fiber cutter 3 to the origin of the up-range caliper of the optical fiber cutter 3, the fixed distance L is greater than the maximum processing length m of the optical fiber cutter 3, and therefore the maximum cutting range of the optical fiber cutter 3 which can be designed is L +/-m. According to the maximum range of the cut L ± m, in the present embodiment, the optical path reference value is set to R p -2L。
S4: and executing the optical fiber processing task according to the optical path reference value.
The dense wavelength division multiplexing devices with the same processing requirements in the array are screened out for cutting and welding repair, and the unprocessed dense wavelength division multiplexing devices in the array are cut and welded for repair, so that the processing times are reduced, and the processing efficiency is improved. As shown in fig. 3, the method specifically includes the following steps:
s401: and screening out the dense wavelength division multiplexing devices with the same processing requirements again according to the set optical path reference value for the selected optical path value array.
According to arrays
Optical path reference value R of each path in all wavelength channels of internal dense wavelength division multiplexing device p And 2L of processing requirements, screening partial dense wavelength division multiplexing devices with all wavelength channels having the same processing requirements, and cutting optical fibers on all optical wave channels at night by processing each dense wavelength division multiplexing device once, so that p-1 times of processing can be avoided for each dense wavelength division multiplexing device, and further the processing efficiency is improved.
S402: the optical fiber cutter 3 executes the optical fiber processing task to the dense wavelength division multiplexing device with the same processing requirement screened in the step S301 according to the set optical path reference value, and cuts the optical fiber to R p -2L。
S403: the optical fiber fusion splicer 4 performs fusion splicing repair on the optical fiber processed by the optical fiber cutter 3 in step S402.
S404: to array
Subjecting other optical fibers to fusion treatment to make their lengths exceed R p -2L。
S405: the optical fiber after the fusion splicing process in step S404 is processed in accordance with steps S402 to S403.
S5: and compensating the optical fiber which does not accord with the preset condition to ensure that the optical fiber accords with the preset condition, and processing the optical fiber.
Selecting the optical fibers which do not meet the preset condition in the step S2, namely selecting other arrays except the selected array, performing addition and subtraction compensation on the optical fibers in the arrays which do not meet the preset condition at the COM end of the dense wavelength division multiplexing device to preset the optical path data in the arrays in the interval of the condition, and then processing according to the step S3. As shown in fig. 4, the method specifically includes the following steps:
s501: and comparing the difference value between the array which does not accord with the preset condition and the preset condition, and respectively screening the array which is larger than the preset condition and the array which is smaller than the preset condition.
Comparing the array not meeting the preset condition with the preset condition, namely comparing the array not meeting the preset condition with the array not meeting the preset condition
Carrying out comparison; to obtain a solution of more than
Are arrays of (i) i
And is less than
Array of
S502: array to be greater than preset condition
The optical fiber inside reduces the optical path data to
Within the interval.
S503: array to be less than preset condition
The optical fiber inside the optical fiber increases the length of the optical fiber through welding to enable the optical path data to be achieved
Within the interval.
S504: and (3) executing optical fiber processing tasks on the optical fibers compensated in the step (S502) and the step (S503) according to the steps (S3) to (S4) until all the dense wavelength division multiplexing devices are processed completely.
S6: and the test center 5 performs phase consistency test on the wavelength and the signal modulation frequency of each channel of the processed DWDM device.
The testing precision of the optical frequency domain reflectometer 1 can reach 0.01mm and is far higher than that of an optical time domain reflectometer and a vernier caliper, so that the precision of the method for cutting the optical fibers of each wavelength channel of the dense wavelength division multiplexing device is greatly improved, the processing times can be reduced, and the processing efficiency is improved.
Example two
As shown in fig. 5, a system schematic diagram of a preferred embodiment of the system for manufacturing a dense wavelength division multiplexing device with high precision of the present invention includes an optical frequency domain reflectometer 1, a data center 2, an optical fiber cutter 3, an optical fiber fusion splicer 4, and a test center 5, which are connected in sequence. The optical frequency domain reflectometer 1 is connected with a COM end of the dense wavelength division multiplexing device to be processed through an optical fiber and is used for testing optical path values of wavelength channels of the dense wavelength division multiplexing device. The data center 2 is arranged on a computer, and the computer is connected with the optical frequency domain reflectometer 1 in a wired or wireless mode; and the data center 2 is used for collecting the optical path values tested by the optical frequency domain reflectometer 1, and performing normalized analysis and grouping on the optical path values to obtain the cutting size meeting the preset conditions. And the optical fiber cutter 3 is used for executing processing tasks on the selected optical fibers according to the cutting size obtained by the data center 2. The optical fiber fusion splicer 4 is used for carrying out fusion splicing repair on the optical fiber cut by the optical fiber cutter 3; the optical fiber fusion splicer 4 is further connected with the data center 2 and used for feeding back fusion-spliced and repaired data to the data center 2. And the test center 5 is used for carrying out phase consistency test on the wavelength and the signal modulation frequency of each channel of the processed dense wavelength division multiplexing device.
The invention is realized based on optical frequency domain reflectometer 1, optical fiber testing, root mean square method, batch data processing, optical fiber cutting and welding and other theoretical technologies: firstly, selecting a specific optical path test of each channel wavelength according with a band during dense wavelength division multiplexing by using a sweep frequency light source test principle of an optical frequency domain reflectometer 1; then, collecting the optical path data to a data center 2, making a reference value of the optical path of each wavelength channel by the data center 2 according to the distribution condition of the optical path data, and inputting processing limits and requirements to obtain processing tasks, namely data of optical fiber cutting and welding; shearing each wavelength channel in the dense wavelength division period by an optical fiber cutter 3 according to a processing task, and welding and repairing the sheared optical fiber by an optical fiber welding machine 4; and finally, carrying out phase consistency test on the wavelength and the signal modulation frequency of each channel of the processed dense wavelength division multiplexing device through a test center 5.
The optical frequency domain reflectometer 1 adopted by the invention has the testing precision of 0.01mm, and can accurately control optical path data, thereby realizing the phase consistency of microwave signal optical fiber transmission, simultaneously ensuring the processability of all dense wavelength division multiplexing devices, improving the utilization rate and the yield and reducing the production cost.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all equivalent structures made by using the contents of the present specification and the drawings can be directly or indirectly applied to other related technical fields, and are within the scope of the present invention.
Claims (7)
1. A method for preparing a dense wavelength division multiplexing device with high precision is characterized by comprising the following steps:
s1: testing the optical path of the DWDM device by using an optical frequency domain reflectometer to obtain the optical path value of each wavelength channel of the DWDM device;
s2: the data center sorts and groups the optical path values, judges whether each optical path value array meets preset processing conditions or not, if yes, continues to execute the step S3, and if not, executes the step S5;
the step S2 specifically includes the steps of:
s201: the data center collects the optical path value tested by the optical frequency domain reflectometer;
s202: arranging all the optical path values in a descending order and calculating the mean square error;
s203: setting a length difference value, dividing all the optical path values into a plurality of arrays, judging whether each array meets a preset processing condition, if so, continuing to execute the step S3, and if not, executing the step S5;
s3: setting a reference value of an optical path to obtain an optical fiber processing task;
s4: executing an optical fiber processing task according to the optical path reference value;
s5: and (3) compensating the optical fiber which does not accord with the preset processing condition in the step (S2) to enable the optical fiber to accord with the preset processing condition, and repeating the steps (S3) to (S4).
2. A method for fabricating with high precision dense wavelength division multiplexing devices as claimed in claim 1, further comprising the following steps after said step S5:
s6: and the test center performs phase consistency test on the wavelength and the signal modulation frequency of each channel of the processed DWDM device.
3. The method for manufacturing a dense wavelength division multiplexing device with high precision as claimed in claim 1, wherein the step S4 comprises the following steps:
s401: the dense wavelength division multiplexing devices with the same processing requirements are screened out again according to the set optical path reference value for the optical path value array meeting the preset processing conditions;
s402: the optical fiber cutter executes the optical fiber processing task to the selected dense wavelength division multiplexing device according to the set optical path reference value;
s403: the optical fiber welding machine carries out welding repair on the optical fiber processed by the optical fiber cutting knife;
s404: performing fiber fusion cutting treatment on other unprocessed optical fibers in the optical path value array which accords with the preset processing condition in the step S401;
s405: steps S402 to S403 are repeated to process the unprocessed optical fiber.
4. The method for manufacturing a dense wavelength division multiplexing device with high precision as claimed in claim 1, wherein the step S5 specifically comprises the steps of:
s501: comparing the difference values between the arrays which do not accord with the preset condition, and respectively screening the arrays which are larger than the preset condition and smaller than the preset condition;
s502: reducing the optical path data of the optical fibers in the array which are larger than the preset condition to be within the range of the preset condition by cutting the reduced optical fibers;
s503: increasing optical fibers in the array which are smaller than the preset condition by fusion so that the optical path data reach the range of the preset condition;
s504: and repeating the steps S3 to S4 to execute the optical fiber processing task.
5. A system for fabricating a dense wavelength division multiplexing device with high precision for implementing the method for fabricating a dense wavelength division multiplexing device with high precision as claimed in any one of claims 1 to 4, characterized in that: the system for preparing the dense wavelength division multiplexing device with high precision comprises an optical frequency domain reflectometer, a data center, an optical fiber cutter and an optical fiber fusion splicer which are sequentially connected, wherein the optical frequency domain reflectometer is also connected with a COM end of the dense wavelength division multiplexing device to be processed through an optical fiber and is used for testing optical path values of wavelength channels of the dense wavelength division multiplexing device, and the data center is used for collecting the optical path values tested by the optical frequency domain reflectometer, carrying out normalization analysis and grouping on the optical path values and obtaining a cutting size meeting preset conditions; the optical fiber cutter is used for executing processing tasks on the selected optical fibers according to the cutting size obtained by the data center; the optical fiber welding machine is used for welding and repairing the optical fiber cut by the optical fiber cutter; the optical fiber fusion splicer is further connected with the data center and used for feeding back fusion-spliced and repaired data to the data center.
6. The system for manufacturing DWDM devices with high precision according to claim 5, further comprising a test center for performing phase consistency test on the wavelength and signal modulation frequency of each channel of the DWDM devices after processing.
7. A high precision dense wavelength division multiplexing device manufacturing system as claimed in claim 5, wherein said data center is loaded on a computer, and said optical frequency domain reflectometer is connected to the computer by wire or wirelessly.
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