CN112986800A - POR circuit testing method and device - Google Patents
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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- G—PHYSICS
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Abstract
The utility model provides a POR circuit testing method and a device, which respond to the received testing instruction and obtain the working mode and the detecting mode; sending a preset power supply model to the equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal; the method comprises the steps of receiving a reset feedback signal sent by equipment to be tested aiming at one-time test of a power model, determining the reset characteristic of the reset feedback signal according to a detection mode, and determining a test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic. The POR output end of the device to be tested does not need to be led out, the identification and the test of the reset signal are realized on the premise of not influencing the device to be tested, the independent test packaging is not needed, and the production cost is reduced; the embodiment of the disclosure can also automatically realize closed-loop test without manual participation in the test, and reduce the time cost and the labor cost of POR circuit test.
Description
Technical Field
The disclosure relates to the technical field of electronics, in particular to a POR circuit testing method and device.
Background
A Power-On Reset (POR) circuit is generally integrated in an integrated circuit with a main control chip to provide a Reset function. Whether the POR circuit can send out correct reset signals in various working environments or not determines whether the system can be started normally or not, and therefore the completeness of the test of the POR circuit is very important.
Traditional POR circuit test needs to draw forth POR's output, and the encapsulation of actual volume production probably can't satisfy the test demand, leads to needs solitary test encapsulation, improves manufacturing cost. Because the traditional POR circuit test needs a large amount of power supply environment as the input of the equipment to be tested, whether the output signal of the equipment to be tested meets the reset requirement needs manual judgment, the POR circuit test is time-consuming and labor-consuming, and the test is difficult to complete.
Disclosure of Invention
The present disclosure provides a POR circuit testing method and apparatus.
In a first aspect, an embodiment of the present disclosure provides a POR circuit testing method, including:
responding to the received test instruction, and acquiring a working mode and a detection mode in the test instruction;
sending a preset power supply model to equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal;
and aiming at the primary test of the power supply model, receiving a reset feedback signal sent by the equipment to be tested, determining the reset characteristic of the reset feedback signal according to the detection mode, and determining the test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic.
In some embodiments, the sending the preset power model to the device under test according to the operating mode includes:
responding to the fact that the working mode is an automatic mode, and sending a preset power supply model to the equipment to be tested; and after the test result of the power supply model at this time is determined, sending the power supply model to the equipment to be tested again, and stopping sending the power supply model to the equipment to be tested until the test times reach the preset times.
In some embodiments, the number of the preset power supply models is at least two, and after a preset number of tests are completed for one preset power supply model, another untested preset power supply model is sent to the device to be tested according to the working mode, so that the tests are performed for the preset number of times for the other untested preset power supply model until all the preset power supply models are tested.
In some embodiments, the preset power model includes a first power model and/or a second power model, the first power model is a dc power model, and the second power model is a non-dc power model.
In some embodiments, the step of generating the second power supply model comprises:
receiving power supply parameters;
a second power model having a waveform signal is generated from the power parameters.
In some embodiments, the power supply parameters include one or any combination of: the phase of the waveform, the time of the rising edge of the waveform, the amplitude of the waveform, and the frequency of the waveform.
In some embodiments, the receiving a reset feedback signal sent by the device under test includes:
and receiving a reset feedback signal sent by the equipment to be tested according to the preset delay time.
In some embodiments, the reset feature comprises one of: the number of rising edges, the number of falling edges, the duration of the high level, the duration of the low level.
In still another aspect, an embodiment of the present disclosure further provides a POR circuit testing apparatus, including a main control chip and a selector, where the main control chip includes a main control unit and a detection unit,
the main control unit is used for responding to the received test instruction and acquiring a working mode and a detection mode in the test instruction;
the selector is used for sending a preset power supply model to the equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal;
the detection unit is used for receiving a reset feedback signal sent by the equipment to be tested, determining the reset characteristic of the reset feedback signal according to the detection mode, and determining the test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic.
In some embodiments, the selector is configured to, in response to the operating mode being an automatic mode, send a preset power model to the device under test; and after the test result of the power supply model at this time is determined, sending the power supply model to the equipment to be tested again, and stopping sending the power supply model to the equipment to be tested until the test times reach the preset times.
In some embodiments, the number of the preset power models is at least two, and the selector is configured to, after a preset number of tests is completed for one preset power model, send another untested preset power model to the device to be tested according to the working mode, so as to test the other untested preset power model for a preset number of times until all the preset power models are tested.
In some embodiments, the preset power model includes a first power model and/or a second power model, the first power model is a dc power model, and the second power model is a non-dc power model.
In some embodiments, the main control chip further includes a waveform generation unit, and the waveform generation unit is configured to receive a power parameter, generate a waveform signal according to the power parameter, and generate a second power model according to the waveform signal.
In some embodiments, the detection unit is configured to receive a reset feedback signal sent by the device under test according to a preset delay time.
The POR circuit testing method provided by the embodiment of the disclosure responds to the received test instruction, and obtains the working mode and the detection mode in the test instruction; sending a preset power supply model to the equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal; the method comprises the steps of receiving a reset feedback signal sent by equipment to be tested aiming at one-time test of a power model, determining the reset characteristic of the reset feedback signal according to a detection mode, and determining a test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic. According to the embodiment of the disclosure, the power model is sent to the device to be tested, whether the reset is effective or not is determined according to the reset feedback signal obtained by resetting the device to be tested based on the power model, the POR output end of the device to be tested is not required to be led out, the identification and the test of the reset signal are realized on the premise of not influencing the device to be tested, the independent test packaging is not required, and the production cost is reduced; the embodiment of the disclosure can also automatically complete the output of the power supply model, automatically detect whether the device to be tested can send out an effective reset feedback signal according to the power-on state of the power supply model, realize closed-loop test, avoid manual participation in the test, and reduce the time cost and the labor cost of POR circuit test.
Drawings
Fig. 1 is a schematic flow chart of a POR circuit testing method provided in the embodiment of the present disclosure;
FIG. 2 is a schematic diagram illustrating a POR circuit testing principle provided by the embodiment of the present disclosure;
FIG. 3 is a schematic flow chart illustrating the generation of a second power model according to an embodiment of the disclosure;
FIG. 4 is a first schematic structural diagram of a POR circuit testing apparatus according to an embodiment of the present disclosure;
fig. 5 is a second schematic structural diagram of a POR circuit testing apparatus according to an embodiment of the disclosure.
Detailed Description
Example embodiments will be described more fully hereinafter with reference to the accompanying drawings, but which may be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
Embodiments described herein may be described with reference to plan and/or cross-sectional views in light of idealized schematic illustrations of the disclosure. Accordingly, the example illustrations can be modified in accordance with manufacturing techniques and/or tolerances. Accordingly, the embodiments are not limited to the embodiments shown in the drawings, but include modifications of configurations formed based on a manufacturing process. Thus, the regions illustrated in the figures have schematic properties, and the shapes of the regions shown in the figures illustrate specific shapes of regions of elements, but are not intended to be limiting.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and the present disclosure, and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
The embodiment of the present disclosure provides a POR circuit testing method, as shown in fig. 2, the POR circuit testing method is applied to a POR circuit testing apparatus, and is used for testing a POR circuit in a DUT (Device Under Test).
With reference to fig. 1 and 2, the POR circuit testing method includes the following steps:
and 11, responding to the received test instruction, and acquiring the working mode and the detection mode in the test instruction.
The POR circuit testing apparatus receives a test instruction input by a user (i.e. a worker), as shown in fig. 2, the test instruction may be input by the user through a key and/or a display screen (e.g. a liquid crystal display) on the POR circuit testing apparatus, and the test instruction carries an operating mode and a detection mode. The working mode at least comprises an automatic mode and a manual mode, and in the automatic mode, the POR circuit test is performed automatically in the whole process without manual intervention. In the manual mode, after each POR circuit test is completed, the next POR circuit test needs to be manually started. And under different detection modes, the selected reset characteristics for carrying out the POR circuit test are different.
And step 12, sending the preset power supply model to the equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal.
The power supply model is preset in the main control chip, and in the step, the mode of sending the power supply model to the device to be tested DUT is different according to different working modes. The power supply model is used as an input signal of the DUT, the DUT is triggered to carry out reset operation, a reset feedback signal is generated after the DUT is reset, and the reset feedback signal is sent to the POR circuit testing device.
And step 13, aiming at the primary test of the power supply model, receiving a reset feedback signal sent by the equipment to be tested, determining the reset characteristic of the reset feedback signal according to the detection mode, and determining the test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic.
The test result comprises the success or failure of reset, and the threshold corresponding to each reset characteristic is preset in the POR circuit test device.
In this step, after receiving a reset feedback signal sent by the device to be tested, the POR circuit testing apparatus determines a reset characteristic corresponding to the detection mode and a corresponding threshold thereof, determines whether the reset characteristic of the feedback signal satisfies the threshold, and if so, considers that the current POR circuit test of the power model passes (i.e., the reset is successful); if not, the POR circuit test of the power model is not passed (i.e. the reset fails).
The POR circuit testing method provided by the embodiment of the disclosure responds to the received test instruction, and obtains the working mode and the detection mode in the test instruction; sending a preset power supply model to the equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal; the method comprises the steps of receiving a reset feedback signal sent by equipment to be tested aiming at one-time test of a power model, determining the reset characteristic of the reset feedback signal according to a detection mode, and determining a test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic. According to the embodiment of the disclosure, the power model is sent to the device to be tested, whether the reset is effective or not is determined according to the reset feedback signal obtained by resetting the device to be tested based on the power model, the POR output end of the device to be tested is not required to be led out, the identification and the test of the reset signal are realized on the premise of not influencing the device to be tested, the independent test packaging is not required, and the production cost is reduced; the embodiment of the disclosure can also automatically complete the output of the power supply model, automatically detect whether the device to be tested can send out an effective reset feedback signal according to the power-on state of the power supply model, realize closed-loop test, avoid manual participation in the test, and reduce the time cost and the labor cost of POR circuit test.
In some embodiments, the step of sending the preset power model to the device under test according to the operation mode (i.e. step 12) includes the following steps: responding to the fact that the working mode is the automatic mode, and sending a preset power supply model to the equipment to be tested; after the test result of the power supply model is determined, the power supply model is sent to the equipment to be tested again, and the power supply model is stopped being sent to the equipment to be tested until the test times reach the preset times. Generally, the POR circuit test is performed several times, and the results of the tests are counted to obtain a final decision whether the reset is successful. That is, in the automatic mode, after 1 POR circuit test for a certain power model is completed, the 2 nd and 3 rd tests for the power model are automatically performed until a preset number of tests are completed. The embodiment of the disclosure can automatically perform repeated tests, and saves manpower and material resources compared with the traditional POR circuit test scheme.
In some embodiments, the step of sending the preset power model to the device under test according to the operation mode (i.e. step 12) includes the following steps: and responding to the fact that the working mode is the manual mode, and sending the preset power supply model to the equipment to be tested. That is, in the manual mode, after 1 POR circuit test for a certain power model is completed, the next test is not automatically performed, but is suspended, and the next test is manually triggered by a user, and the user can analyze the test result between the two tests.
In order to simulate different power environments, in some embodiments, at least two power models are preset, and the embodiments of the present disclosure support the built-in multiple test simulation power models, for example, power models with different rise times, power large ripple models, and the like.
After the preset times of testing is completed for one preset power supply model, the other preset power supply model which is not tested is sent to the equipment to be tested according to the working mode, and testing of the preset times is performed for the other preset power supply model which is not tested until all the preset power supply models are tested. That is, in the automatic mode, the power supply models are tested one by one, and after one power supply model is tested for a preset number of times, the next power supply model is tested. As shown in fig. 2, the selector switches the power supply models to be tested, and it should be noted that the test order of each power supply model is not limited, and may be randomly selected, or may be tested according to the order in which the power supply models are set in the POR circuit testing apparatus by the user.
In some embodiments, the preset power model includes a first power model and/or a second power model, the first power model is a dc power model, and the second power model is a non-dc power model. The non-dc power source model refers to a power source model having a non-linear waveform, for example, a power source model having a sine wave, a square wave, a triangular wave, or the like. As shown in fig. 2, for example, there are 3 preset power models, 2 first power models, 1.8V dc power model and 3.3V dc power model, and 1 second power model (i.e., power model generated by the waveform generation unit).
In some embodiments, the POR circuit testing apparatus may further generate a second power model, and accordingly, as shown in fig. 3, the step of generating the second power model includes:
step 21, receiving power supply parameters.
The power supply parameters may be set, altered by a user, and in some embodiments, the power supply parameters may include one or any combination of the following: the phase (offset) of the waveform, the time of the rising edge of the waveform, the amplitude of the waveform, and the frequency of the waveform. For example, the amplitude of the waveform may be 0-5V and the frequency of the waveform may be 10 KHz.
And step 22, generating a second power supply model with the waveform signal according to the power supply parameters.
In this step, a second power supply model with a waveform signal is generated by a waveform generation unit (i.e., a waveform generator), as shown in fig. 2. The method includes the steps of triggering a DAC (digital-to-analog converter) chip (such as an STM32 chip) with a DMA (Direct Memory Access) function by using a timer to generate a second power supply model with a waveform signal, sending the second power supply model to a driving module through a DAC interface of a waveform generating unit, and sending the second power supply model to the device to be tested through a selector. The driving module selects a chip with a quick response function, such as an LM675 operational amplifier chip, and the power supply driving adjustment resolution of the chip is 100uS, so that the power supply model can be closer to an actual use scene. The second power model may be a periodic waveform of arbitrary shape and may drive a 300ma load.
In some embodiments, the receiving a reset feedback signal sent by the device under test (step 13) includes the following steps: and receiving a reset feedback signal sent by the equipment to be tested according to the preset delay time. That is, after the preset power model is sent to the device under test, the reset feedback signal sent by the device under test is received by delaying the preset delay time.
In some embodiments, the reset feature may include one of: the number of rising edges, the number of falling edges, the duration of the high level, the duration of the low level. A detection mode corresponds to a reset characteristic, one reset characteristic has a corresponding threshold value, and whether the POR circuit test passes or not is determined by judging whether the reset characteristic of a feedback signal meets the condition of the corresponding threshold value.
In the embodiment of the disclosure, a user starts a POR circuit test through a key and a display screen, and after receiving a test instruction, the POR circuit test device outputs a power supply model to a DUT through a selector, collects a reset feedback signal of the DUT, judges the reset feedback signal and gives a test result. The user can obtain the test report through a display screen or a connected PC.
The embodiment of the disclosure can customize and output the power supply model for POR circuit test, so that the POR circuit test of the product is more perfect, the detection mode can be customized, and the reset effect can be judged under the condition of not influencing a DUT.
Based on the same technical concept, an embodiment of the present disclosure further provides a POR circuit testing apparatus, as shown in fig. 4, including a main control chip 10 and a selector 20, where the main control chip 10 includes a main control unit 101 and a detection unit 102, and the main control unit 101 is configured to, in response to receiving a test instruction, obtain a working mode and a detection mode therein.
The selector 20 is configured to send the preset power model to the device under test according to the working mode, so that the device under test is reset and outputs a reset feedback signal.
The detection unit is used for receiving a reset feedback signal sent by the equipment to be tested, determining the reset characteristic of the reset feedback signal according to the detection mode, and determining the test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic.
In some embodiments, the selector 20 is configured to, in response to the operating mode being the automatic mode, send a preset power model to the device under test; after the test result of the power supply model at this time is determined, the power supply model is sent to the equipment to be tested again, and the power supply model is stopped being sent to the equipment to be tested until the test times reach the preset times.
In some embodiments, there are at least two preset power models, and the selector 20 is configured to, after a preset number of tests is completed for one preset power model, send another non-tested preset power model to the device to be tested according to the working mode, so as to perform the preset number of tests for the other non-tested preset power model until all the preset power models are tested.
In some embodiments, the preset power model includes a first power model and/or a second power model, the first power model is a dc power model, and the second power model is a non-dc power model.
In some embodiments, as shown in fig. 5, the main control chip 10 further includes a waveform generating unit 103, where the waveform generating unit 103 is configured to receive the power parameter, and generate a second power model with a waveform signal according to the power parameter.
In some embodiments, the power supply parameters include one or any combination of: the phase of the waveform, the time of the rising edge of the waveform, the amplitude of the waveform, and the frequency of the waveform.
In some embodiments, the detecting unit 102 is configured to receive a reset feedback signal sent by the device under test according to a preset delay time.
In some embodiments, the reset feature comprises one of: the number of rising edges, the number of falling edges, the duration of the high level, the duration of the low level.
The man-machine interaction interface of the POR circuit testing device in the embodiment of the disclosure is realized by display screen display and key input. The main interface provides 5 functions, namely automatic, inquiry, manual and waveform generation and setting functions, wherein the automatic, inquiry, manual and waveform generation are working modes, and the main interface is switched to a test interface after entering the working modes. The inquiry mode refers to not carrying out POR circuit test, only inquiring historical test results, and the waveform generation mode refers to not carrying out POR circuit test, only generating waveforms (namely, a second power supply model). The manual mode is that the POR circuit testing device generates a power supply model meeting the testing requirement, and a user judges whether the DUT generates an effective reset signal or not so as to be convenient for debugging. The test interface can display the current working mode, and can also display the information of the power supply model currently tested, the detection standard of the reset signal, the current test frequency and the statistical test result. The setup interface currently provides 3 setup items: (1) test delay (Detect delay): for setting a delay time in the detection criteria; (2) detection Mode (Detect Mode); (3) threshold (Detect Number): for setting the threshold of the reset feature.
The main control chip of the POR circuit testing device in the embodiment of the disclosure can select the STM32 chip of the digital-to-analog converter with the hardware DMA function. The detection unit is an input/output interface which is arranged on the main control chip and comprises a rising edge, a falling edge, a high-low level trigger external interrupt function and an Analog-to-digital converter (ADC) function.
As shown in fig. 2, the POR circuit testing apparatus according to the embodiment of the disclosure may further communicate with an upper computer through a USB (Universal Serial Bus) interface, and the upper computer may provide functions of reading or updating a power supply model, configuring a detection mode, reading and generating a test report, and the like. The power supply model can also be manually drawn by the upper computer or automatically generated by setting parameters.
Because the function of the upper computer is more perfect, and the human-computer interaction interface is more friendly, the POR circuit testing function can be directly integrated on the external card of the PC, so that the generation of a test report from the POR circuit testing is more automatic.
It will be understood by those of ordinary skill in the art that all or some of the steps of the methods disclosed above, functional modules/units in the apparatus, may be implemented as software, firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be performed by several physical components in cooperation. Some or all of the physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as is well known to those of ordinary skill in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can accessed by a computer. In addition, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media as known to those skilled in the art.
Example embodiments have been disclosed herein, and although specific terms are employed, they are used and should be interpreted in a generic and descriptive sense only and not for purposes of limitation. In some instances, features, characteristics and/or elements described in connection with a particular embodiment may be used alone or in combination with features, characteristics and/or elements described in connection with other embodiments, unless expressly stated otherwise, as would be apparent to one skilled in the art. It will, therefore, be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of the invention encompassed by the appended claims.
Claims (14)
1. A POR circuit testing method, the method comprising:
responding to the received test instruction, and acquiring a working mode and a detection mode in the test instruction;
sending a preset power supply model to equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal;
and aiming at the primary test of the power supply model, receiving a reset feedback signal sent by the equipment to be tested, determining the reset characteristic of the reset feedback signal according to the detection mode, and determining the test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic.
2. The method of claim 1, wherein sending the preset power model to the device under test according to the operating mode comprises:
responding to the fact that the working mode is an automatic mode, and sending a preset power supply model to the equipment to be tested; and after the test result of the power supply model at this time is determined, sending the power supply model to the equipment to be tested again, and stopping sending the power supply model to the equipment to be tested until the test times reach the preset times.
3. The method as claimed in claim 2, wherein the number of the preset power models is at least two, and after a preset number of tests are completed on one preset power model, another untested preset power model is sent to the device under test according to the operating mode for testing the other untested preset power model for a preset number of tests until all the preset power models are tested.
4. The method of claim 1, wherein the preset power model comprises a first power model and/or a second power model, the first power model is a DC power model, and the second power model is a non-DC power model.
5. The method of claim 4, wherein the step of generating the second power model comprises:
receiving power supply parameters;
a second power model having a waveform signal is generated from the power parameters.
6. The method of claim 5, wherein the power supply parameters comprise one or any combination of: the phase of the waveform, the time of the rising edge of the waveform, the amplitude of the waveform, and the frequency of the waveform.
7. The method of claim 1, wherein the receiving the reset feedback signal sent by the device under test comprises:
and receiving a reset feedback signal sent by the equipment to be tested according to the preset delay time.
8. The method of any of claims 1-7, wherein the reset feature comprises one of: the number of rising edges, the number of falling edges, the duration of the high level, the duration of the low level.
9. A POR circuit testing device is characterized in that the device comprises a main control chip and a selector, wherein the main control chip comprises a main control unit and a detection unit,
the main control unit is used for responding to the received test instruction and acquiring a working mode and a detection mode in the test instruction;
the selector is used for sending a preset power supply model to the equipment to be tested according to the working mode so as to reset the equipment to be tested and output a reset feedback signal;
the detection unit is used for receiving a reset feedback signal sent by the equipment to be tested, determining the reset characteristic of the reset feedback signal according to the detection mode, and determining the test result according to the reset characteristic of the feedback signal and a preset threshold corresponding to the reset characteristic.
10. The POR circuit testing device according to claim 9, wherein the selector is configured to, in response to the operation mode being an automatic mode, send a preset power model to the device under test; and after the test result of the power supply model at this time is determined, sending the power supply model to the equipment to be tested again, and stopping sending the power supply model to the equipment to be tested until the test times reach the preset times.
11. The POR circuit testing device according to claim 10, wherein the number of the preset power models is at least two, and the selector is configured to, after a preset number of tests on one preset power model is completed, send another untested preset power model to the device under test according to the operating mode, so as to conduct the preset number of tests on the other untested preset power model until all the preset power models are completed.
12. The POR circuit testing device according to claim 11, wherein the predetermined power model comprises a first power model and/or a second power model, the first power model being a DC power model, the second power model being a non-DC power model.
13. The POR circuit testing device according to claim 12, wherein the master chip further comprises a waveform generating unit, the waveform generating unit is configured to receive a power parameter, generate a waveform signal according to the power parameter, and generate a second power model according to the waveform signal.
14. The POR circuit testing apparatus as claimed in claim 9, wherein the detecting unit is configured to receive a reset feedback signal sent by the device under test according to a preset delay time.
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| CN102692596A (en) * | 2011-03-24 | 2012-09-26 | 飞思卡尔半导体公司 | Selectable threshold reset circuit |
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| WO2018059504A1 (en) * | 2016-09-28 | 2018-04-05 | 德布森电气（上海）有限公司 | Single-phase voltage self-resetting module detection apparatus |
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2021
- 2021-02-19 CN CN202110191487.6A patent/CN112986800B/en active Active
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| CN102692596A (en) * | 2011-03-24 | 2012-09-26 | 飞思卡尔半导体公司 | Selectable threshold reset circuit |
| CN106443414A (en) * | 2016-09-28 | 2017-02-22 | 上海德布森电气有限公司 | Detection device for single-phase voltage self-resetting module |
| WO2018059504A1 (en) * | 2016-09-28 | 2018-04-05 | 德布森电气（上海）有限公司 | Single-phase voltage self-resetting module detection apparatus |
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| CN112986800B (en) | 2024-04-09 |
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