CN112986400B - Probe moving auxiliary device - Google Patents
Probe moving auxiliary device Download PDFInfo
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- CN112986400B CN112986400B CN201911289191.7A CN201911289191A CN112986400B CN 112986400 B CN112986400 B CN 112986400B CN 201911289191 A CN201911289191 A CN 201911289191A CN 112986400 B CN112986400 B CN 112986400B
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- plate
- frame body
- clamping block
- probe
- connecting hole
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
- G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
Abstract
The invention provides a probe moving auxiliary device, which belongs to the technical field of ultrasonic detection and comprises a frame body, a clamping block and a positioning plate, wherein the lower end of the frame body is provided with a limiting plate; the frame body is provided with a first connecting hole; the clamping block is arranged at the lower end of the frame body and is arranged at a distance from the limiting plate, and an installation space for installing the test block is formed between the clamping block and the limiting plate; the clamping block is provided with a first strip hole corresponding to the first connecting hole, and the clamping block and the frame body are detachably connected through a fixing piece penetrating through the first connecting hole and the first strip hole; the positioning plate is arranged on the frame body and is positioned on one side of the frame body far away from the clamping block; the probe moving auxiliary device provided by the invention can adjust the distance between the clamping block and the limiting plate according to the size of the test block, so that the first connecting hole always corresponds to the first connecting hole, the clamping block is conveniently connected with the frame body, and the calibration efficiency is improved.
Description
Technical Field
The invention belongs to the technical field of ultrasonic detection, and particularly relates to a probe movement auxiliary device.
Background
The phased array technology is a new technology based on an ultrasonic principle developed in recent years, the angle of the phased array probe is different from the fixed value of a conventional ultrasonic single-chip probe, the phased array probe comprises a plurality of chips, and through software control of an instrument, different chips can be triggered and delayed for setting, so that deflection and focusing of an acoustic beam are realized. Because the number of the excited wafers is large, the DAC (distance amplitude) curve, the TCG (time gain) curve and the like need to be calibrated before detection, in order to calibrate the excitation angle interval of the detection depth range, the probe needs to move a longer distance on a test block scanning surface during calibration, when a main sound beam and a horizontal through Kong Can body axis are not perpendicular during probe movement, calibration will have deviation, positioning and quantification of a reflection signal in a test block are influenced, and due to different test block widths specified by different standards, the conventional device cannot be matched and installed with test blocks with different sizes, so that the device needs to be replaced for many times during calibration, and the working efficiency is reduced.
Disclosure of Invention
The invention aims to provide a probe moving auxiliary device to solve the technical problem that the existing device in the prior art cannot meet test blocks of various sizes, so that the working efficiency is low.
In order to realize the purpose, the invention adopts the technical scheme that: the probe moving auxiliary device comprises a frame body, a clamping block and a positioning plate, wherein the lower end of the frame body is provided with a limiting plate; the frame body is provided with a first connecting hole; the clamping block is arranged at the lower end of the frame body and is arranged at an interval with the limiting plate, and an installation space for installing the test block is formed between the clamping block and the limiting plate; the clamping block is provided with a first long hole corresponding to the first connecting hole, and the clamping block and the frame body are detachably connected through a fixing piece penetrating through the first connecting hole and the first long hole; the positioning plate is arranged on the frame body and is positioned on one side of the frame body, which is far away from the clamping block; the probe is arranged on the test block, one side of the probe is abutted against the side face of the positioning plate, and the probe moves along the positioning plate.
As another embodiment of the present application, the clamping block includes:
the transverse plate is connected with the lower end face of the frame body; the first strip hole is formed in the transverse plate; and
the vertical plate is fixedly arranged on one side, close to the limiting plate, of the transverse plate, corresponds to the limiting plate and forms the installation space.
As another embodiment of this application, the support body is kept away from the one end of first connecting hole is equipped with the second connecting hole, be equipped with on the locating plate with the second rectangular hole that the second connecting hole is relative, the locating plate with the support body is through passing the second rectangular hole with the connection can be dismantled to the mounting of second connecting hole.
As another embodiment of the application, the positioning plate is provided with lightening holes.
As another embodiment of this application, be equipped with on the locating plate with support body sliding fit's spout.
As another embodiment of this application, be equipped with on the support body and be used for the accurate installation the scale mark of locating plate, the zero point of scale mark with the limiting plate is close to the side alignment of grip block.
As another embodiment of the present application, the rack body includes:
the number of the supporting plates is two, and the supporting plates are arranged in parallel at intervals; the limiting plates are fixedly arranged at the lower ends of the two supporting plates; the support plate is provided with the first connecting hole; the clamping block is arranged at the lower end of the supporting plate, and the positioning plate is arranged at the upper end of one side of the clamping block, which is far away from the supporting plate.
As another embodiment of the present application, the two support plates and the limit plate are integrally formed.
As another embodiment of the present application, the supporting plate and the limiting plate are T-shaped structures.
As another embodiment of the application, the fixing piece is a bolt and a wing nut matched with the bolt.
The probe moving auxiliary device provided by the invention has the beneficial effects that: compared with the prior art, the probe moving auxiliary device disclosed by the invention has the advantages that when the probe moving auxiliary device is used, the rack body is firstly placed on the test block, the limiting plate is in contact alignment with one side of the test block, the clamping block is further used for contact alignment with the other side of the test block, the first strip hole corresponds to the first connecting hole, the rack body is connected with the clamping block by the fixing piece, the stability of the rack body and the clamping block is ensured, the locating plate is connected onto the rack body and is positioned above the limiting plate, finally, a worker places the probe on the rack body and is in contact with one side of the locating plate, the worker controls the probe to accurately move, the wafer excitation data is objective, and the defect quantification and the accurate rating are ensured. Through this kind of mode, can be according to the size of test block, adjust the interval of grip block and limiting plate, make first connecting hole correspond with first connecting hole all the time, the grip block of being convenient for is connected with the support body, has improved the efficiency of calibration work.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a first schematic structural diagram of a probe movement assisting device according to an embodiment of the present invention;
fig. 2 is a second schematic structural diagram of a probe movement assisting device according to an embodiment of the present invention;
FIG. 3 is a front view of a probe movement assistance device according to an embodiment of the present invention;
FIG. 4 is a top view of a probe movement assistance device according to an embodiment of the present invention;
fig. 5 is a usage state diagram of the probe movement assisting device according to the embodiment of the present invention.
Wherein, in the figures, the respective reference numerals:
1. a frame body; 11. a limiting plate; 12. scale marks; 13. a support plate; 2. a clamping block; 21. a first elongated hole; 22. a transverse plate; 23. a vertical plate; 3. positioning a plate; 31. a second elongated hole; 32. lightening holes; 33. a chute; 4. a fixing member; 41. a bolt; 42. a butterfly nut; 5. testing blocks; 6. a probe.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not limit the invention.
Referring to fig. 1 to 5, the probe moving assistance device provided by the present invention will now be described. A probe moving auxiliary device comprises a frame body 1, a clamping block 2 and a positioning plate 3, wherein a limiting plate 11 is arranged at the lower end of the frame body 1; the frame body 1 is provided with a first connecting hole; the clamping block 2 is arranged at the lower end of the frame body 1 and is arranged at an interval with the limiting plate 11, and an installation space for installing the test block 5 is formed between the clamping block 2 and the limiting plate 11; the clamping block 2 is provided with a first long hole 21 corresponding to the first connecting hole, and the clamping block 2 and the frame body 1 are detachably connected through a fixing piece 4 penetrating through the first connecting hole and the first long hole 21; the positioning plate 3 is arranged on the frame body 1 and is positioned on one side of the frame body 1 far away from the clamping block 2; the probe 6 is arranged on the test block 5, one side of the probe abuts against the side face of the positioning plate 3, and the probe moves along the positioning plate 3.
Compared with the prior art, when the probe moving auxiliary device is used, the rack body 1 is placed on the test block 5, the limiting plate 11 is in contact alignment with one side of the test block 5, the clamping block 2 is further in contact alignment with the other side of the test block 5, the first strip-shaped hole 21 corresponds to the first connecting hole, the rack body 1 is connected with the clamping block 2 through the fixing piece 4, the stability of the rack body 1 and the clamping block 2 is guaranteed, the positioning plate 3 is connected to the rack body 1 and located above the limiting plate 11, finally a worker places the probe 6 on the rack body 1 and is in contact with one side of the positioning plate 3, the worker controls the probe 6 to move accurately, data of a wafer is stimulated objectively, and quantitative, objective and accurate grading of defects are guaranteed. Through this kind of mode, can be according to the size of test block 5, adjust grip block 2 and limiting plate 11's interval, make first connecting hole correspond with first connecting hole all the time, the grip block 2 of being convenient for is connected with support body 1, has improved the efficiency of calibration work.
A mounting hole with an opening is formed in the frame body 1, and the mounting hole is slightly smaller than the test block 5, so that the frame body 1 is placed on the test block 5; then the lower end of the probe 6 passes through the mounting hole and is directly placed on the test block 5; the side surface of the test block 5 passes through the opening and abuts against the positioning plate 3. Can use the cooperation of bolt 41 nut to connect, realize the dismantlement between grip block 2 and the support body 1 and be connected. The length direction of the rack body 1 is the same as that of the test block 5, so that the probe 6 can slide along the test block 5 on the rack body 1 or through the mounting hole on the rack body 1.
Referring to fig. 1, 3 and 5, as an embodiment of the probe moving auxiliary device provided by the present invention, the clamping block 2 includes a horizontal plate 22 and a vertical plate 23, and the horizontal plate 22 is connected to the lower end surface of the frame body 1; the first strip hole 21 is arranged on the transverse plate 22; the vertical plate 23 is fixedly arranged on one side, close to the limiting plate 11, of the transverse plate 22, corresponds to the limiting plate 11 and forms an installation space, and the transverse plate 22 is a long-strip-shaped plate and corresponds to the frame body 1; the cross plate 22 is located below the frame body 1 and contacts the lower end of the frame body 1 while the first elongated hole 21 is provided on the cross plate 22. The vertical plate 23 is positioned on one side of the limiting plate 11 close to the transverse plate 22, so that the side surface of the vertical plate 23 is completely attached and connected with the side surface of the test block 5. The height that sets up riser 23 is unanimous with limiting plate 11's height, makes both the centre grippings the effort of 5 and the moment of torsion that produces of test block 5 in the both sides of test block 5 the same, guarantees the stability of being connected between support body 1 and the test block 5.
Referring to fig. 1 and 4, as a specific embodiment of the probe movement assisting device provided by the present invention, a second connecting hole is formed at one end of the frame body 1 away from the first connecting hole, a second elongated hole 31 opposite to the second connecting hole is formed in the positioning plate 3, the positioning plate 3 and the frame body 1 are detachably connected by a fixing member 4 penetrating through the second elongated hole 31 and the second connecting hole, so that a connection position between the positioning plate 3 and the frame body 1 can be adjusted, the positioning plate 3 is operated to slide along the frame body 1 to a side away from the clamping block 2 or a side close to the clamping block 2 according to a size of the probe 6, and after the distance is adjusted, the fixing member 4 penetrates through the second elongated hole 31 and the second connecting hole to fixedly connect the positioning plate 3 and the frame body 1, thereby ensuring that the probe 6 accurately moves along the positioning plate 3. The fixing member 4 may be detachably coupled using a bolt 41 and a nut. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to implicitly indicate the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
Referring to fig. 1 and 4, as an embodiment of the probe movement assisting device provided by the present invention, a lightening hole 32 is formed on the positioning plate 3 to lighten the weight of the whole positioning plate 3, so that the installation is convenient. Can offer the holding tank that is used for holding spare part or instrument for the work on locating plate 3, the during operation is placed it in the holding tank, is convenient for take.
Referring to fig. 1 to 3, as a specific embodiment of the probe moving auxiliary device provided by the present invention, the positioning plate 3 is provided with a sliding groove 33 in sliding fit with the frame body 1, when the positioning plate is installed, the sliding groove 33 is installed in fit with the frame body 1, and when the position of the positioning plate 3 is adjusted, the positioning plate 3 can be directly pushed, so that the sliding groove 33 and the frame body 1 move relatively, and the positioning plate 3 moves conveniently and quickly. Meanwhile, the sliding slot 33 also plays a role of guiding the positioning plate 3 to move, so that the second connecting hole and the second elongated hole 31 always correspond to each other.
Referring to fig. 1, 3 and 5, as a specific embodiment of the probe moving auxiliary device provided by the present invention, the frame body 1 is provided with a scale 12 for accurately installing the positioning plate 3, a zero point of the scale 12 is aligned with a side surface of the limiting plate 11 close to the clamping block 2, when the positioning plate 3 is moved, the position of the positioning plate 3 can be accurately installed according to the scale 12, and then the probe 6 is installed to be in contact connection with a side surface of the positioning plate 3, so as to achieve the purpose of positioning the probe 6. Meanwhile, the zero point of the scale mark 12 is aligned with the inner side surface of the limit plate 11, so that the side surface of the test block 5 is always aligned with the zero point. Since the width of the probe 6 is a and the width of the test block 5 is b, when the positioning plate 3 is mounted, the value x of the scale 12 corresponding to one side surface of the positioning plate 3 is:
the midline of the probe 6 and the midline of the test block 5 are ensured to be positioned on the same plane. When the width dimension of the probe 6 is larger than that of the test block 5, the positioning plate 3 moves towards one side departing from the clamping block 2 and is aligned with the corresponding scale mark 12 in numerical value; when the width dimension of the probe 6 is smaller than the test block 5, the positioning plate 3 moves toward the side close to the holding block 2 and is numerically aligned with the corresponding graduation mark 12.
Referring to fig. 1 and 4, as an embodiment of the probe moving auxiliary device provided by the present invention, the frame body 1 includes two support plates 13, and the two support plates 13 are spaced and arranged in parallel; the limiting plate 11 is fixedly arranged at the lower ends of the two supporting plates 13; the support plate 13 is provided with a first connection hole; the clamping block 2 is arranged at the lower end of the supporting plate 13, the positioning plate 3 is arranged at the upper end of one side of the supporting plate 13, which is far away from the clamping block 2, the two supporting plates 13 are oppositely arranged at intervals, during installation, the two supporting plates 13 are placed at two ends of the test block 5, the limiting plate 11 is arranged between the two supporting plates 13 and is used for connecting the two supporting plates 13 together, the clamping block 2 is in a long strip shape and is arranged below the two supporting plates 13, the two ends of the clamping block 2 are respectively provided with a first long strip hole 21, and the two ends of the clamping block 2 are respectively detachably connected with the supporting plates 13 through fixing pieces 4; the locating plate 3 also sets up to rectangular form, and is located the top of two backup pads 13 to all set up the rectangular hole of second 31 at the both ends of locating plate 3, locating plate 3 all can dismantle with two backup pads 13 through mounting 4 and be connected.
Referring to fig. 1 to 3, as a specific embodiment of the probe moving assisting device provided by the present invention, two supporting plates 13 are integrally formed with the limiting plate 11, and the supporting plates 13 and the limiting plate 11 are integrally formed, which is convenient for a worker to directly take the supporting plates 13 and the limiting plate 11 and directly mount on the test block 5 or take the test block 5 off; meanwhile, the connection strength between the supporting plate 13 and the limiting plate 11 is enhanced, and the stability of the whole probe moving auxiliary device is improved.
Referring to fig. 1 and 3, as a specific embodiment of the probe moving assisting device according to the present invention, the supporting plate 13 and the limiting plate 11 are T-shaped, the limiting plate 11 is disposed at a middle position below the supporting plate 13, and divides the supporting plate 13 into a left portion and a right portion, the left portion is used for connecting with the clamping block 2, and the right portion is used for connecting with the positioning plate 3. The scale marks 12 are arranged on the supporting plate 13, and the left part and the right part are respectively provided with the numerical values of the scale marks 12, so that the positioning plate 3 can be accurately installed and the probe 6 can be accurately detected.
Referring to fig. 1 to 4, as a specific embodiment of the probe moving assisting device provided by the present invention, the fixing member 4 is a bolt 41 and a wing nut 42 used in cooperation with the bolt 41, after the first long hole 21 of the row of the clamping block 2 corresponds to the first connecting hole on the frame body 1, the bolt 41 is firstly used to pass through the first connecting hole and the first long hole 21, and the wing nut 42 is used to lock the bolt 41, so as to achieve the purpose of fixing the clamping block 2 and the frame body 1. The wing nut 42 can be directly operated by hand without using other tools for dismounting.
The present invention is not limited to the above preferred embodiments, and any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (9)
1. Probe movement assistance device, characterized by comprising:
the lower end of the frame body is provided with a limiting plate; the frame body is provided with a first connecting hole;
the clamping block is arranged at the lower end of the frame body and is arranged at an interval with the limiting plate, and an installation space for installing the test block is formed between the clamping block and the limiting plate; the clamping block is provided with a first long hole corresponding to the first connecting hole, and the clamping block and the frame body are detachably connected through a fixing piece penetrating through the first connecting hole and the first long hole; and
positioning a plate; the clamping block is arranged on the frame body and is positioned on one side of the frame body, which is far away from the clamping block; the probe is arranged on the test block, one side of the probe is abutted against the side surface of the positioning plate, and the probe moves along the positioning plate; a second connecting hole is formed in one end, far away from the first connecting hole, of the frame body, a second long hole opposite to the second connecting hole is formed in the positioning plate, and the positioning plate and the frame body are detachably connected through a fixing piece penetrating through the second long hole and the second connecting hole;
the rack body is provided with an installation hole with an opening, the installation hole is smaller than the test block, the rack body is placed on the test block, the lower end of the probe penetrates through the installation hole to be directly placed on the test block, and the side face of the test block penetrates through the installation Kong Dikao to be arranged on the positioning plate.
2. The probe movement assistance device of claim 1, wherein the grip block comprises:
the transverse plate is connected with the lower end face of the frame body; the first strip hole is formed in the transverse plate; and
the vertical plate is fixedly arranged on one side, close to the limiting plate, of the transverse plate, corresponds to the limiting plate and forms the installation space.
3. The probe movement assist device of claim 1, wherein the positioning plate is provided with lightening holes.
4. The probe moving aid of claim 1, wherein the positioning plate has a sliding slot slidably engaged with the frame.
5. The probe moving aid according to claim 1, wherein the frame body is provided with a scale mark for accurately mounting the positioning plate, and the zero point of the scale mark is aligned with the side of the limiting plate close to the clamping block.
6. The probe movement assistance apparatus according to any one of claims 1 to 5, wherein the frame body comprises:
the number of the supporting plates is two, and the supporting plates are arranged in parallel at intervals; the limiting plates are fixedly arranged at the lower ends of the two supporting plates; the support plate is provided with the first connecting hole; the clamping block is arranged at the lower end of the supporting plate, and the positioning plate is arranged at the upper end of one side of the clamping block, which is far away from the supporting plate.
7. The probe movement assist of claim 6, wherein the two support plates are integrally formed with the limit plate.
8. The probe movement aid of claim 6, wherein the support plate and the stop plate are T-shaped.
9. The probe movement aid of claim 1, wherein the fastener is a bolt and a wing nut for cooperating with the bolt.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911289191.7A CN112986400B (en) | 2019-12-13 | 2019-12-13 | Probe moving auxiliary device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911289191.7A CN112986400B (en) | 2019-12-13 | 2019-12-13 | Probe moving auxiliary device |
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| Publication Number | Publication Date |
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| CN112986400A CN112986400A (en) | 2021-06-18 |
| CN112986400B true CN112986400B (en) | 2022-10-25 |
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