CN112946413A - DSP processing module testing arrangement - Google Patents
DSP processing module testing arrangement Download PDFInfo
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- CN112946413A CN112946413A CN202110093424.7A CN202110093424A CN112946413A CN 112946413 A CN112946413 A CN 112946413A CN 202110093424 A CN202110093424 A CN 202110093424A CN 112946413 A CN112946413 A CN 112946413A
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- processing module
- dsp processing
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- 238000012360 testing method Methods 0.000 title claims abstract description 97
- 238000012545 processing Methods 0.000 title claims abstract description 96
- 238000001514 detection method Methods 0.000 claims abstract description 39
- 239000011229 interlayer Substances 0.000 claims description 5
- 238000004891 communication Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 5
- 230000001427 coherent effect Effects 0.000 abstract 1
- 235000019800 disodium phosphate Nutrition 0.000 description 76
- 239000003292 glue Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
Abstract
The invention discloses a DSP processing module testing device, which comprises a testing tool and a tool conveying belt arranged adjacent to the testing tool; the test tool is a hollow structure with openings at one side and the bottom; this DSP processing module testing arrangement, through the frock conveyer belt, the test fixture, contact switch, voltage output module, the cooperation of model detection module and electromagnetism door is used, this application technical scheme is through coherent and compact structure, traditional testing arrangement has been got rid of, need the manual processing to detect, the method of test, operating time has been saved to a certain extent, work efficiency is improved, and this application technical scheme, can be assembly line work form, insert a plurality of DSP processing modules in proper order in the test fixture and carry out the voltage test, and utilize the frock conveyer belt to transmit the DSP processing module who finishes detecting, the test work with DSP processing module of very big limit is tested to automation, batch test by single slow.
Description
Technical Field
The invention belongs to the field of DSP processing modules, and particularly relates to a DSP processing module testing device.
Background
DSPs, i.e. digital signal processors, are usually used for data arithmetic processing, and their powerful data processing capability and operating speed, compared to other processors, are the biggest features of pipeline architecture.
The DSP processing module testing arrangement who uses in the society at present, it adopts the method of artifical test, places DSP on the frock board, and whether artifical detects, tests its voltage circulation is normal, and this traditional testing arrangement has appeared some drawbacks gradually in the use, and the appearance of this drawback leads to traditional testing arrangement can't satisfy the high standard in this field at present and uses the demand, now carries out following concrete description with the drawback that this traditional testing arrangement exists:
the traditional testing device needs a single worker in the using process, one machine is used in a one-to-one mode, the machine is operated to detect and test the DSP processing module, after the testing is finished, the DSP processing module which is tested is manually taken out, and a new DSP processing module is placed on the testing tool to perform a new round of testing.
Based on this, we propose a new testing apparatus for DSP processing module to solve the above problem.
Disclosure of Invention
In view of the above, an object of the present invention is to provide a testing apparatus for a DSP processing module, so as to solve the problem that the conventional testing apparatus for a DSP processing module in the prior art cannot perform automatic and batch testing on the DSP processing module.
The invention is realized by the following technical scheme:
the utility model provides a DSP processing module testing arrangement which characterized in that: the device comprises a test tool and a tool conveying belt arranged adjacent to the test tool;
the testing tool is a hollow structure with openings at one side and the bottom, a contact switch, a voltage output module and a model detection module are arranged in the testing tool, the opening at one side of the testing tool is a DSP processing module feeding port, an electromagnetic door is arranged at the opening at the bottom of the testing tool, and a supporting seat is arranged at the top of the electromagnetic door and used for forming a supporting surface for supporting the DSP processing module;
the testing tool is characterized in that a jacking part is correspondingly arranged on one side, adjacent to the feeding port, of the interior of the testing tool, the voltage output module and the model detection module are correspondingly arranged on the other side, adjacent to the feeding port, of the interior of the testing tool, the jacking part is arranged opposite to the voltage output module and the model detection module, and the contact switch is arranged at one end, back to the DSP processing module, of the feeding port.
The invention has the beneficial effects that:
the DSP processing module testing device is used by matching the tool conveyor belt, the testing tool, the contact switch, the voltage output module, the model detection module and the electromagnetic door, when the device is used, a user only needs to insert the DSP processing module through an opening on one side of the tool conveyor belt, when the DSP processing module touches the contact switch, the voltage output module outputs voltage, the model detection module detects whether the voltage on the DSP detection module normally flows or not, and transmits the information to the electromagnetic door, and the DSP processing module is then transmitted to other positions through the conveyor belt for the user to take. And the detected DSP processing module is transmitted by using the tool conveyor belt, so that the testing work of the DSP processing module is converted from single slow testing to automatic and batch testing to the utmost extent.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention. The objectives and other advantages of the invention may be realized and attained by the means of the instrumentalities and combinations particularly pointed out hereinafter.
Drawings
FIG. 1 is a schematic perspective view of the present invention;
FIG. 2 is a schematic perspective view of the present invention II;
FIG. 3 is a schematic perspective view III of the present invention;
FIG. 4 is a schematic perspective view IV of the present invention;
FIG. 5 is a side view of the present invention;
FIG. 6 is a schematic view of a portion of a tooling conveyor of the present invention;
FIG. 7 is a partial cross-sectional view of a test fixture of the present invention;
FIG. 8 is a partial perspective view of the electromagnetic door and the support base of the present invention;
fig. 9 is a partial perspective view of the pressing member of the present invention;
fig. 10 is a schematic view of the working state of the electric push rod II after the DSP processing module is inserted.
In the figure: 1. testing the tool; 2. a tooling conveyor belt; 3. an electric push rod I; 4. a contact switch; 5. a jacking member; 501. an electric push rod II; 502. an L-shaped push plate; 6. an electromagnetic gate; 7. a signal indicator light; 8. an anti-slip interlayer; 9. a support assembly; 901. an electric push rod III; 902. a proximity sensor; 10. a support block; 11. supporting the extension portion; 12. a voltage output module; 13. a model detection module; 14. a supporting seat; 15. A DSP processing module; 16. an electric conveyor belt.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
In the specific implementation: as shown in fig. 1 to 10, a DSP processing module testing apparatus includes a testing tool 1 and a tool conveyor 2 disposed adjacent to the testing tool;
the testing tool is a hollow structure with openings at one side and the bottom, a contact switch 4, a voltage output module 12 and a model detection module 13 are arranged in the testing tool, the opening at one side of the testing tool is a DSP processing module feeding port, an electromagnetic door 6 is arranged at the opening at the bottom of the testing tool, and a supporting seat 14 is arranged at the top of the electromagnetic door and used for forming a supporting surface for supporting the DSP processing module; in the technical scheme, two workers are required to work simultaneously in general, one worker sends the DSP processing module to the interior of the test tool at the sending port in batches sequentially, the DSP processing module is contacted with the contact switch when penetrating into the interior of the test tool, and the height of the contact switch corresponds to that of the supporting seat;
the pressing piece 5 is arranged on one side, adjacent to the feeding port, of the interior of the test tool, the voltage output module and the model detection module are arranged on the other side, adjacent to the feeding port, of the interior of the test tool, the pressing piece is arranged opposite to the voltage output module and the model detection module, and the contact switch is arranged at one end, back to the feeding port of the DSP processing module, of the test tool; when the voltage of the DSP processing module is normal, the electromagnetic door is opened, the electromagnetic door is in an inclined state and contacts with the conveyor belt, the DSP processing module slides to the conveyor belt due to gravity, the conveyor belt continues to work at the moment, the DSP processing module which finishes the detection is driven to other positions, another worker can take the DSP processing module which finishes the detection, when the DSP processing module can not normally circulate the voltage, electromagnetic door is in the closed condition, and the conveyer belt that this application mentioned, for the common transport mechanism in this field, so this application is to its working method, the repetitive description is not done to the theory of operation, this application technical scheme still can set up model detection module into camera detection mode, set up in the inside top position that leans on of test fixture, be used for scanning the detection to DSP processing module, what need explain here, this application technical scheme still is provided with the PLC controller of being connected with this device electricity, be used for controlling the inside electrical apparatus of test fixture, the debugging, and can feed back test information through the PLC controller.
In this embodiment: the top of test fixture is provided with signal indicator 7 with model detection module communication connection, and when DSP processing module voltage detection was normal, signal indicator sent light to whether the information of effective circulation of DSP processing module 15 voltage is mastered to the user very first time.
In this embodiment: be provided with anti-skidding interlayer 8 on the frock conveyer belt, here is through anti-skidding interlayer, and when DSP processing module landing to the top of frock conveyer belt, the effect of usable anti-skidding interlayer avoids DSP processing module to slide out the top of frock conveyer belt.
In this embodiment: still including setting up in frock conveyer belt tip be convenient for carry out the supporting component 9 that draws to the DSP processing module that the test finishes, when DSP processing module moved to the tip of frock conveyer belt, supporting component can prop up DSP processing module to the user takes.
In this embodiment: the supporting assembly 9 comprises two electric push rods III901 symmetrically arranged on two sides of the end portion of the tool conveyor belt, a proximity sensor 902 and a microprocessor arranged in the proximity sensor, it should be noted here that the width of the DSP processing module is greater than that of the tool conveyor belt, the model of the microprocessor can be an AM3505AZCNA microprocessor, the model of the proximity sensor can be a TL-Q5MC1-Z proximity sensor, when the DSP processing module is in the moving process, the proximity sensor captures the signal, the signal can be sent to the microprocessor, at this moment, the microprocessor sends an indication command to the electric push rod III, the electric push rod III is lifted, the DSP processing module can be lifted, so that a user can take the DSP processing module, the lifting time of the electric push rod III is 5s, and then the electric push rod III is lowered to the original height.
In this embodiment: the proximity sensor is arranged at the top of the tool conveying belt in the interval area of the two electric push rods III, and the proximity sensor is arranged at the top of the tool conveying belt, so that the displacement information of the DSP processing module can be captured as soon as possible.
In this embodiment: the top of electric putter III is provided with supporting shoe 10, and the here is through the supporting shoe with the area of contact between increase and the DSP processing module, avoids DSP processing module stability relatively poor when rising, and the top layer of supporting shoe is the flexible glue material, and the here utilizes the flexible glue material, when can avoiding supporting shoe and DSP processing module to contact, causes the damage of scraping to it.
In this embodiment: the opening of one side of the test tool extends outwards to form a support extension part 11, and the support extension part is arranged at the position, so that a user can plug the DSP processing module into the test tool as accurately as possible.
In this embodiment: the support extension part is provided with an electric conveyor belt 16, and the electric conveyor belt is arranged at the position, so that the DSP processing module can be conveniently sent into the test tool.
In this embodiment: one side of the testing tool, which is internally provided with the voltage output module and the model detection module, is provided with an electric push rod I3 connected with the voltage output module and the model detection module respectively, when the contact switch senses that the DSP processing module is inserted into the testing tool, the electric push rod I can start to work, and the voltage output module and the model detection module are pushed to be connected with a voltage receiving port and a model detection port on the DSP processing module respectively, so that the DSP processing module can be detected conveniently.
In this embodiment: the roof pressure piece is including setting up in electric putter II501 of test fixture inner wall and the L type push pedal 502 that is connected with electric putter II output extension, when contact switch senses DSP processing module, electric putter II begins work, can promote DSP processing module via L type push pedal and be close to in voltage output module and model detection module, and make voltage output module be connected with the voltage receiving port on the DSP processing module, and be connected model detection port on the DSP processing module with model detection module, so that accomplish the test to DSP processing module, this department highly needs to set up the top height that is less than the supporting seat with L type push pedal, so that carry out the propelling movement to DSP processing module.
The working principle is as follows: according to the technical scheme, during operation, the DSP processing module is placed on the electric conveyor belt in advance, and the electric conveyor belt is controlled to drive the DSP processing module to be conveyed into the testing tool, so that the DSP processing module is abutted to the contact switch;
when the contact switch is touched, the top pressing piece is controlled to push the DSP processing module to move towards the direction of the voltage output module and the model detection module, so that the voltage output module and the model detection module are inserted into corresponding interfaces of the DSP processing module;
controlling the voltage output module and the model detection module to work, and detecting whether the DSP processing module can work normally or not;
when the detection is finished, the electromagnetic door is opened so that the DSP processing module slides to the tool conveyor belt, and the voltage output module sends the detection result to the microprocessor;
if the detection result is that the electric push rod III can not work normally, the microprocessor controls the electric push rod III not to be lifted when the DSP processing module passes through the proximity sensor, so that the DSP processing module continues to be conveyed along the tool conveyor belt and can enter a problem product collection library to be repaired;
if the detection result is normal work, when the proximity sensor scans that the DSP processing module passes through, the electric push rod III is controlled to start working, and the DSP processing module is lifted up, so that the normal DSP processing module is sent into the standard component library of the corresponding model according to the model detected by the model detection module.
The above is only a preferred embodiment of the present invention, and it should be noted that several modifications and improvements made by those skilled in the art without departing from the technical solution should also be considered as falling within the scope of the claims.
Claims (10)
1. The utility model provides a DSP processing module testing arrangement which characterized in that: the device comprises a test tool and a tool conveying belt arranged adjacent to the test tool;
the testing tool is a hollow structure with openings at one side and the bottom, a contact switch, a voltage output module and a model detection module are arranged in the testing tool, the opening at one side of the testing tool is a DSP processing module feeding port, an electromagnetic door is arranged at the opening at the bottom of the testing tool, and a supporting seat is arranged at the top of the electromagnetic door and used for forming a supporting surface for supporting the DSP processing module;
the testing tool is characterized in that a jacking part is correspondingly arranged on one side, adjacent to the feeding port, of the interior of the testing tool, the voltage output module and the model detection module are correspondingly arranged on the other side, adjacent to the feeding port, of the interior of the testing tool, the jacking part is arranged opposite to the voltage output module and the model detection module, and the contact switch is arranged at one end, back to the DSP processing module, of the feeding port.
2. The DSP processing module testing apparatus of claim 1, wherein: and a signal indicator lamp in communication connection with the model detection module is arranged at the top of the test tool.
3. The DSP processing module testing apparatus of claim 1, wherein: and an anti-slip interlayer is arranged on the tool conveying belt.
4. A DSP processing block testing arrangement according to any one of claims 1-3, wherein: the test device is characterized by further comprising a supporting component which is arranged at the end part of the tool conveying belt and is convenient for extracting the tested DSP processing module.
5. The DSP processing module testing device of claim 4, wherein: the supporting assembly comprises two electric push rods III symmetrically arranged on two sides of the end part of the tool conveying belt, a proximity sensor and a microprocessor arranged in the proximity sensor.
6. The DSP processing module testing device of claim 5, wherein: the proximity sensor is arranged at the top of the tool conveying belt of the interval area of the two electric push rods III.
7. The DSP processing module testing device according to claim 5 or 6, wherein: the top of the electric push rod III is provided with a supporting block, and the top layer of the supporting block is made of soft rubber.
8. The DSP processing module testing apparatus of claim 1, wherein: the test fixture is characterized in that a support extension part extends outwards from an opening in one side of the test fixture, and an electric conveyor belt is arranged on the support extension part.
9. The DSP processing module testing apparatus of claim 1, wherein: and an electric push rod I connected with the voltage output module and the model detection module is respectively arranged on one side of the test tool, which is internally provided with the voltage output module and the model detection module.
10. The DSP processing module testing apparatus of claim 1, wherein: the jacking part comprises an electric push rod II arranged on the inner wall of the test tool and an L-shaped push plate connected with an output extension part of the electric push rod II.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110093424.7A CN112946413A (en) | 2021-01-22 | 2021-01-22 | DSP processing module testing arrangement |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110093424.7A CN112946413A (en) | 2021-01-22 | 2021-01-22 | DSP processing module testing arrangement |
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| CN112946413A true CN112946413A (en) | 2021-06-11 |
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| CN202110093424.7A Pending CN112946413A (en) | 2021-01-22 | 2021-01-22 | DSP processing module testing arrangement |
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| CN110261777A (en) * | 2019-07-09 | 2019-09-20 | 安徽新动新能源科技有限公司 | A kind of test device in battery pack production process |
| CN211205578U (en) * | 2019-12-28 | 2020-08-07 | 重庆秦嵩科技有限公司 | Temperature testing device for signal processing board |
| CN111562532A (en) * | 2020-07-16 | 2020-08-21 | 宁波中车时代传感技术有限公司 | Online batch parallel testing device for current sensors |
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2021
- 2021-01-22 CN CN202110093424.7A patent/CN112946413A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205484709U (en) * | 2016-02-22 | 2016-08-17 | 东莞市苏迪罗电子科技有限公司 | Multistation electric current load test machine |
| CN106733682A (en) * | 2016-12-21 | 2017-05-31 | 重庆市顺华安全玻璃有限公司 | Bottle detection device |
| CN107744967A (en) * | 2017-08-26 | 2018-03-02 | 江苏爱可信电气有限公司 | The method of work of instrument semi-automatic test frock |
| CN108152704A (en) * | 2017-12-08 | 2018-06-12 | 宁波芯路通讯科技有限公司 | A kind of integrated circuit high/low temperature test device |
| CN208761639U (en) * | 2018-09-05 | 2019-04-19 | 深圳市金石泰科技有限公司 | A kind of electronic component fixture for processing |
| CN209310846U (en) * | 2018-12-03 | 2019-08-27 | 安徽机电职业技术学院 | Detection platform is used in a kind of production of hard circuit board |
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