CN112945090B - Calibration device and calibration method of three-dimensional measurement system - Google Patents
Calibration device and calibration method of three-dimensional measurement system Download PDFInfo
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- CN112945090B CN112945090B CN202011441512.3A CN202011441512A CN112945090B CN 112945090 B CN112945090 B CN 112945090B CN 202011441512 A CN202011441512 A CN 202011441512A CN 112945090 B CN112945090 B CN 112945090B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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Abstract
The invention discloses a calibration device and a calibration method of a three-dimensional measurement system, wherein the calibration device comprises: the electronic translation platform and mark target panel, electronic translation platform is including driving its first drive assembly of translation in first direction, mark target panel perpendicular to first direction set up in on the electronic translation platform, mark target panel has the pattern display face towards three-dimensional measurement system, the pattern display face is used for showing the demarcation pattern. The invention can obtain the space three-dimensional coordinate more accurately and stably. The method is more suitable for the application of three-dimensional measurement systems of various scenes, can assist in realizing higher-precision, more stable and more automatic calibration, and is more rapid, efficient and convenient.
Description
Technical Field
The invention relates to the technical field of three-dimensional measurement, in particular to a calibration device and a calibration method of a three-dimensional measurement system.
Background
With the rapid development of micro-light, mechanical and electrical technologies, high-precision and high-efficiency detection of fine structures of objects has become a big research hot spot in the field of global scientific research, and how to obtain three-dimensional point cloud data of objects more accurately is a hot spot in the field of three-dimensional measurement. Three-dimensional measurement systems are widely used in the fields of medicine, industry and the like, and a key factor affecting the reconstruction accuracy of the three-dimensional measurement systems is the accuracy of a calibration model of the established object features in which two-dimensional coordinates are mapped with the actual three-dimensional coordinates of the object (one or more cameras or projectors or both). The establishment of an accurate mapping model requires the acquisition of a set of very accurate two-to three-dimensional standard calibration data by means of a high-precision calibration device. Whether the calibration model can accurately describe the real mapping relation from two-dimensional data to three-dimensional data is characterized by three factors: firstly, calibrating the accuracy of the two-dimensional coordinate extraction of the characteristics of a target panel on a device on a detector CCD plane; secondly, calibrating the accuracy of the spatial three-dimensional coordinates of the features of the target panel on the device; thirdly, whether the established mathematical calibration model can accurately describe and establish the mapping relation from the two-dimensional data to the three-dimensional data.
The method is not high in stability, is easily influenced by the number of the arrangement positions and postures of the calibration targets, is inconvenient to stably acquire the space three-dimensional coordinates of the characteristics of the target panel, and requires the side sway and pitching arrangement of the calibration targets to influence the accuracy of extracting the two-dimensional coordinate information of the characteristics of the calibration targets on the camera image.
Disclosure of Invention
The present invention aims to solve the above-mentioned technical problems.
Aiming at the technical problems, the invention provides a calibration device of a three-dimensional measurement system, which comprises: the electronic translation platform and mark target panel, electronic translation platform is including driving its first drive assembly of translation in first direction, mark target panel perpendicular to first direction set up in on the electronic translation platform, mark target panel has the pattern display face towards three-dimensional measurement system, the pattern display face is used for showing the demarcation pattern.
Preferably, the pattern display surface is a non-luminous calibration plate, and the calibration plate is provided with a calibration pattern.
Preferably, the pattern display surface is a display screen, and the calibration pattern is displayed by the display screen in a luminous manner.
Preferably, the pattern display surface is a light-emitting display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration device further comprises an auxiliary calibration three-dimensional measurement device or a projection device for projecting the calibration pattern onto the projection display panel, wherein the display panel with the semi-transparent and semi-reflective property can penetrate the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement device or the projection device.
Preferably, the electric translation stage further comprises a second driving component for driving the electric translation stage to translate along a second direction and a third driving component for driving the electric translation stage to translate along a third direction, the second direction and the third direction are respectively perpendicular to the first direction, and a plane intersecting the second direction and the third direction is parallel to the pattern display surface.
The invention also provides a calibration method of the three-dimensional measurement system, which comprises the following steps:
setting a pattern display surface of a calibration target panel to be perpendicular to an optical path of the three-dimensional measurement system, wherein the calibration device comprises an electric translation table and the calibration target panel, the electric translation table comprises a first driving component for driving the electric translation table to translate in a first direction parallel to the optical path, the calibration target panel is perpendicular to the first direction and is arranged on the electric translation table, and the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system and is used for displaying a calibration pattern;
acquiring calibration pattern information on the calibration target panel through a three-dimensional measurement system, and determining x-coordinate information and y-coordinate information of the calibration target panel according to the position relation of the calibration pattern;
acquiring z coordinate information of the calibration target panel according to the movement of the electric translation stage;
and calibrating the detector of the three-dimensional measurement system according to the x-coordinate information, the y-coordinate information and the z-coordinate information.
Preferably, the pattern display surface is a non-luminous calibration plate, and the calibration plate is provided with calibration patterns; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
acquiring dense x-coordinate information and y-coordinate information through an interpolation algorithm;
or the second driving assembly and the third driving assembly drive the electric translation table to translate in the second direction and the third direction, so that dense x-coordinate information and y-coordinate information are obtained.
Preferably, the pattern display surface is a display screen, and the calibration pattern is displayed by the display screen in a luminous way; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
the display screen displays pattern information of the intersecting phases, wherein x-coordinate information and y-coordinate information of the calibration target panel are modulated in the phase information;
and demodulating according to the pattern information acquired by the three-dimensional measurement system to acquire the x-coordinate information and the y-coordinate information of the calibration target panel.
Preferably, the method comprises the steps of,
the pattern display surface is a luminous display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration device further comprises auxiliary calibration three-dimensional measurement equipment for projecting a calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can penetrate the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement equipment; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
the actual position information of the calibration target panel is obtained through the pattern projected by the auxiliary calibration three-dimensional measuring equipment on the calibration target panel,
and the three-dimensional measurement system acquires information of the same characteristic point of the calibration target panel, and calculates x-coordinate information and y-coordinate information of the calibration target panel through the auxiliary calibration three-dimensional measurement equipment.
Preferably, the step of calibrating the detector of the three-dimensional measurement system according to the x-coordinate information, the y-coordinate information, and the z-coordinate information includes:
calibrating a light ray equation of the detector;
or fitting and establishing a system projection stripe information-three-dimensional information mapping model.
Compared with the prior art, the invention has at least the following beneficial effects:
1. the space three-dimensional coordinates can be acquired more accurately and stably. Because the three-dimensional measurement system is calibrated against the calibration device, the two-dimensional image coordinate information of the target surface features on the CCD plane can be acquired more accurately.
2. The target panel and the electric translation table are calibrated through various design structures, the three-dimensional measurement system is more suitable for application of various scene three-dimensional measurement systems, higher-precision, more stable and more automatic calibration can be realized in an auxiliary mode, and the three-dimensional measurement system is rapid, efficient and convenient. Because we can control the automatic movement of the electric translation stage, the movement track is stable, the acquired data is stable, and the instability of the calibration effect caused by random placement is reduced.
Drawings
FIG. 1 is a schematic diagram of a calibration method and a calibration device of a three-dimensional measurement system according to an embodiment of the present invention.
FIG. 2 is a schematic diagram of a marked pattern according to an embodiment of the present invention.
FIG. 3 is a flowchart of a calibration method according to an embodiment of the present invention.
Detailed Description
The invention is further described below with reference to the drawings and examples.
Example 1
Fig. 1 is a schematic diagram of a calibration device and a measurement process of a three-dimensional measurement system according to the present invention, where the calibration device includes: the electronic translation stage 1 and mark target panel 2, electronic translation stage 1 includes the first drive assembly (not shown in the figure) that drives it in translation of first direction, mark target panel 2 perpendicular to first direction set up on electronic translation stage 1, mark target panel 2 has the pattern display surface 21 towards three-dimensional measurement system, pattern display surface 21 is used for showing the calibration pattern.
In this embodiment, the first driving component may be a stepper motor driving, or may be another form such as a screw driving.
In this embodiment, as shown in fig. 2, the calibration pattern may be a sinusoidal stripe pattern, a cross-hair pattern, a checkerboard pattern, or the like, or may be a circular pattern, a ring pattern, or the like. The color of the pattern can be black and white or can be colorful, the same calibration target pattern is not limited to one type, multiple patterns can be combined and matched, the pattern is not limited to a fixed pattern, and the actual spacing between various lines or color blocks in the pattern is known. Thus, the x-coordinate information and the y-coordinate information of the calibration target surface can be obtained through the position relation of the calibration pattern, and the z-coordinate information can be obtained through the movement information of the electric translation stage 1.
As an alternative embodiment, the pattern display surface 21 may be a non-luminous calibration plate, and the calibration plate has a calibration pattern thereon. The pattern display surface 21 may be made of a material having good diffuse reflection, such as a white ceramic plate. The x-coordinate information and the y-coordinate information of the calibration target panel can be obtained through the position relation (actual distance) of the calibration patterns, and if dense x-coordinate information and y-coordinate information need to be obtained, the x-coordinate information and the y-coordinate information can be obtained by combining an interpolation algorithm. Or, the electric translation stage 1 translates in the x-coordinate direction and the y-coordinate direction, so that further, the electric translation stage 1 further comprises a second driving component (not shown in the figure) for driving the electric translation stage to translate along a second direction, and a third driving component (not shown in the figure) for driving the electric translation stage to translate along a third direction, wherein the second direction and the third direction are respectively perpendicular to the first direction, and a plane intersecting the second direction and the third direction is parallel to the pattern display surface 21.
As an alternative embodiment, the pattern display surface 21 may be a display screen, and the calibration pattern is displayed by light emission through the display screen, and the surface of the display screen may be designed as a panel with semi-transparent and semi-reflective properties or with full-transparent properties. For example, the display screen can display intersecting sinusoidal stripe patterns of intersecting phases, x-coordinate information and y-coordinate information of the calibration target panel are modulated in the phase information, the electric translation stage 1 moves to obtain accurate z-coordinate information, and the three-dimensional measurement system obtains the sinusoidal stripe information (calibration pattern) and then performs phase demodulation to obtain the x-coordinate information and the y-coordinate information of the calibration target panel.
As an alternative embodiment, the pattern display surface 21 may be a light-emitting display panel, the surface of which is semi-transparent and semi-reflective, and the calibration device further comprises an auxiliary calibration three-dimensional measurement device 4 for projecting a calibration pattern onto the projection display panel; the semi-transparent and semi-reflective display panel can transmit the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement device or the projection device.
Example two
Based on the first embodiment, referring to fig. 1 and 2, the present invention also provides a calibration method of a three-dimensional measurement system, which includes the following steps:
s1, setting a pattern display surface of a calibration target panel 2 to be perpendicular to an optical path of the three-dimensional measurement system 3, wherein the calibration device comprises an electric translation table 1 and the calibration target panel 2, the electric translation table 1 comprises a first driving component (not shown in the figure) for driving the electric translation table to translate in a first direction (Z-axis direction) parallel to the optical path, the calibration target panel 2 is arranged on the electric translation table 1 perpendicular to the first direction, the calibration target panel 2 is provided with a pattern display surface 21 facing the three-dimensional measurement system, and the pattern display surface 21 is used for displaying a calibration pattern;
s2, acquiring calibration pattern information on the calibration target panel 2 through a three-dimensional measurement system 3, and determining x-coordinate information and y-coordinate information of the calibration target panel 2 according to the position relation of the calibration patterns (the position relation of the calibration patterns is preset and known information);
s3, acquiring z coordinate information of the calibration target panel according to the movement of the electric translation table 1;
and S4, calibrating the detector of the three-dimensional measurement system 3 according to the x-coordinate information, the y-coordinate information and the z-coordinate information.
As an alternative embodiment, the pattern display surface 21 is a non-luminous calibration plate, and the calibration plate has a calibration pattern thereon; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
acquiring dense x-coordinate information and y-coordinate information through an interpolation algorithm;
or the second driving assembly and the third driving assembly drive the electric translation table to translate in the second direction and the third direction, so that dense x-coordinate information and y-coordinate information are obtained.
As an alternative embodiment, the pattern display surface 21 is a display screen, and the calibration pattern is displayed by the display screen in a luminous manner; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
the display screen displays pattern information of the intersecting phases, wherein x-coordinate information and y-coordinate information of the calibration target panel are modulated in the phase information;
and demodulating according to the pattern information acquired by the three-dimensional measurement system to acquire the x-coordinate information and the y-coordinate information of the calibration target panel.
As an alternative embodiment, the pattern display surface 21 is a light-emitting display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration device further includes an auxiliary calibration three-dimensional measurement device 4 for projecting a calibration pattern onto the projection display panel, where the semi-transparent and semi-reflective display panel can transmit the projection pattern and reflect the projected pattern of the auxiliary calibration three-dimensional measurement device; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
the actual position information of the calibration target panel is obtained through the pattern projected by the auxiliary calibration three-dimensional measuring equipment on the calibration target surface,
and the three-dimensional measurement system acquires information of the same characteristic point of the calibration target panel, and the x-coordinate information and the y-coordinate information of the calibration target panel are calculated through the auxiliary calibration three-dimensional measurement equipment.
Preferably, the step of calibrating the detector of the three-dimensional measurement system according to the x-coordinate information, the y-coordinate information, and the z-coordinate information includes:
calibrating a light ray equation of the detector;
or fitting and establishing a system projection stripe information-three-dimensional information mapping model.
Based on the first embodiment and the second embodiment, the method can obtain the space three-dimensional coordinates more accurately and stably. Because the three-dimensional measurement system is calibrated against the calibration device, the two-dimensional image coordinate information of the target surface features on the CCD plane can be acquired more accurately. Meanwhile, the target panel and the electric translation table are calibrated through various design structures, the three-dimensional measurement system is more suitable for application of various scenes, higher-precision, more stable and more automatic calibration can be realized in an auxiliary mode, and the three-dimensional measurement system is more rapid, efficient and convenient. Because we can control the automatic movement of the electric translation stage, the movement track is stable, the acquired data is stable, and the instability of the calibration effect caused by random placement is reduced.
The above examples are only for illustrating specific embodiments of the present invention. It should be noted that it would be within the scope of the present invention to those skilled in the art without departing from the spirit of the present invention.
Claims (4)
1. A calibration device for a three-dimensional measurement system, the calibration device comprising: the device comprises an electric translation table and a calibration target panel, wherein the electric translation table comprises a first driving assembly for driving the electric translation table to translate in a first direction, the calibration target panel is perpendicular to the first direction and arranged on the electric translation table, and the calibration target panel is provided with a pattern display surface facing a three-dimensional measurement system and used for displaying calibration patterns;
the pattern display surface is a luminous display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration device further comprises an auxiliary calibration three-dimensional measurement device for projecting a calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can penetrate the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement device or the projection device.
2. The calibration device according to claim 1, wherein the motorized translation stage further comprises a second driving assembly for driving the motorized translation stage to translate in a second direction and a third driving assembly for driving the motorized translation stage to translate in a third direction, the second direction and the third direction being perpendicular to the first direction, respectively, and a plane where the second direction and the third direction intersect being parallel to the pattern display surface.
3. The calibration method of the three-dimensional measurement system is characterized by comprising the following steps of:
setting a pattern display surface of a calibration target panel to be perpendicular to an optical path of the three-dimensional measurement system, wherein the calibration device comprises an electric translation table and the calibration target panel, the electric translation table comprises a first driving component for driving the electric translation table to translate in a first direction parallel to the optical path, the calibration target panel is perpendicular to the first direction and is arranged on the electric translation table, and the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system and is used for displaying a calibration pattern;
acquiring calibration pattern information on the calibration target panel through a three-dimensional measurement system, and determining x-coordinate information and y-coordinate information of the calibration target panel according to the position relation of the calibration pattern;
acquiring z coordinate information of the calibration target panel according to the movement of the electric translation stage;
calibrating a detector of the three-dimensional measurement system according to the x-coordinate information, the y-coordinate information and the z-coordinate information;
the pattern display surface is a luminous display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration device further comprises auxiliary calibration three-dimensional measurement equipment for projecting a calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can penetrate the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement equipment; the process of obtaining the x-coordinate information and the y-coordinate information of the calibration target panel comprises the following steps:
the actual position information of the calibration target panel is obtained through the pattern projected by the auxiliary calibration three-dimensional measuring equipment on the calibration target panel,
and the three-dimensional measurement system acquires information of the same characteristic point of the calibration target panel, and calculates x-coordinate information and y-coordinate information of the calibration target panel through the auxiliary calibration three-dimensional measurement equipment.
4. A method of calibrating a three-dimensional measurement system according to claim 3, wherein calibrating the detector of the three-dimensional measurement system based on the x-coordinate information, the y-coordinate information, and the z-coordinate information comprises:
calibrating a light ray equation of the detector;
or fitting and establishing a system projection stripe information-three-dimensional information mapping model.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105387819A (en) * | 2015-12-27 | 2016-03-09 | 河北工业大学 | Reflecting object three-dimensional shape measuring method and device based on fringe reflection method |
| CN105844686A (en) * | 2016-03-31 | 2016-08-10 | 深圳市菲森科技有限公司 | Image 3D effect display method and system |
| CN106210697A (en) * | 2016-09-09 | 2016-12-07 | 江苏科沁光电科技有限公司 | Electrosurgical sub-3D microscope |
| CN108873363A (en) * | 2018-09-06 | 2018-11-23 | 深圳技术大学（筹） | 3 d light fields imaging system and method based on structure signal |
| CN108982067A (en) * | 2018-08-01 | 2018-12-11 | 张家港康得新光电材料有限公司 | A kind of detection device and method of 3D head-up-display system |
| CN110782499A (en) * | 2019-10-23 | 2020-02-11 | Oppo广东移动通信有限公司 | Calibration method and calibration device for augmented reality equipment and terminal equipment |
| CN111652946A (en) * | 2020-06-17 | 2020-09-11 | Oppo广东移动通信有限公司 | Display calibration method and device, equipment and storage medium |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101561251B (en) * | 2009-04-03 | 2011-01-12 | 四川大学 | Phase target-based optical three-coordinate measuring method |
| CN103884271B (en) * | 2012-12-20 | 2016-08-17 | 中国科学院沈阳自动化研究所 | A kind of line structured light vision sensor direct calibration method |
| CN106949851A (en) * | 2017-03-29 | 2017-07-14 | 沈阳建筑大学 | A kind of line structured light vision sensor calibration method based on SVMs |
| EP3783304B1 (en) * | 2017-06-22 | 2024-07-03 | Hexagon Technology Center GmbH | Calibration of a triangulation sensor |
| CN107560563B (en) * | 2017-07-28 | 2019-10-18 | 华南理工大学 | A kind of calibration of line laser three-dimensional measuring apparatus and error compensating method |
| CN107462184B (en) * | 2017-08-15 | 2019-01-22 | 东南大学 | A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system |
| CN110260821B (en) * | 2019-05-28 | 2021-11-23 | 深圳市菲森科技有限公司 | Optical module based on fringe projection and three-dimensional analysis system |
| CN110625936A (en) * | 2019-09-17 | 2019-12-31 | 上海联泰科技股份有限公司 | Optical calibration tool, 3D printing equipment and 3D printing optical calibration method |
-
2020
- 2020-12-11 CN CN202011441512.3A patent/CN112945090B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105387819A (en) * | 2015-12-27 | 2016-03-09 | 河北工业大学 | Reflecting object three-dimensional shape measuring method and device based on fringe reflection method |
| CN105844686A (en) * | 2016-03-31 | 2016-08-10 | 深圳市菲森科技有限公司 | Image 3D effect display method and system |
| CN106210697A (en) * | 2016-09-09 | 2016-12-07 | 江苏科沁光电科技有限公司 | Electrosurgical sub-3D microscope |
| CN108982067A (en) * | 2018-08-01 | 2018-12-11 | 张家港康得新光电材料有限公司 | A kind of detection device and method of 3D head-up-display system |
| CN108873363A (en) * | 2018-09-06 | 2018-11-23 | 深圳技术大学（筹） | 3 d light fields imaging system and method based on structure signal |
| CN110782499A (en) * | 2019-10-23 | 2020-02-11 | Oppo广东移动通信有限公司 | Calibration method and calibration device for augmented reality equipment and terminal equipment |
| CN111652946A (en) * | 2020-06-17 | 2020-09-11 | Oppo广东移动通信有限公司 | Display calibration method and device, equipment and storage medium |
Non-Patent Citations (2)
| Title |
|---|
| 邓小婷 ; 高楠 ; 张宗华 ; .基于直接相位测量术的系统参数标定方法.激光与光电子学进展.2018,(第06期),第230-237页. * |
| 邓小婷.镜面物体光学三维测量系统标定方法的研究.《中国优秀硕士学位论文全文数据库（电子期刊）》.2020,I138-939. * |
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