CN112945090A - Calibration device and calibration method of three-dimensional measurement system - Google Patents
Calibration device and calibration method of three-dimensional measurement system Download PDFInfo
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- CN112945090A CN112945090A CN202011441512.3A CN202011441512A CN112945090A CN 112945090 A CN112945090 A CN 112945090A CN 202011441512 A CN202011441512 A CN 202011441512A CN 112945090 A CN112945090 A CN 112945090A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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Abstract
The invention discloses a calibration device and a calibration method of a three-dimensional measurement system, wherein the calibration device comprises: the electric translation table comprises a first driving assembly for driving the electric translation table to translate in a first direction, the calibration target panel is perpendicular to the first direction and arranged on the electric translation table, the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system, and the pattern display surface is used for displaying calibration patterns. The invention can acquire the space three-dimensional coordinate more precisely and stably. The method is more suitable for the application of three-dimensional measurement systems in various scenes, can assist in realizing higher precision, more stable and more automatic calibration, and is quicker, more efficient and more convenient.
Description
Technical Field
The invention relates to the technical field of three-dimensional measurement, in particular to a calibration device and a calibration method of a three-dimensional measurement system.
Background
With the rapid development of micro-light, mechanical and electrical technologies, the detection of fine structures of objects with high precision and high efficiency has become a large research hotspot in the global scientific research field, and how to more accurately acquire three-dimensional point cloud data of the objects is a hotspot in the three-dimensional measurement field. Three-dimensional measurement systems are widely used in the fields of medicine, industry and the like, and the key factor influencing the reconstruction accuracy is the accuracy of a calibration model which is formed by mapping two-dimensional coordinates of object features (one or more cameras or projectors or both) with actual three-dimensional coordinates of an object. Establishing an accurate mapping model requires acquiring a set of very accurate two-dimensional to three-dimensional standard calibration data by means of a high-precision calibration device. Whether the calibration model can accurately describe the real mapping relation from the two-dimensional data to the three-dimensional data or not is characterized by three factors: firstly, the accuracy of extracting the two-dimensional coordinates of the characteristics of a target panel on a calibration device on a detector CCD plane; secondly, calibrating the accuracy of the spatial three-dimensional coordinates of the features of the target panel on the device; and thirdly, whether the established mathematical calibration model can accurately describe and establish the mapping relation from the two-dimensional data to the three-dimensional data or not.
The traditional method, such as a two-dimensional plane target method, places a calibration target at a plurality of positions in a space to be reconstructed, extracts two-dimensional coordinate information of the features on the calibration target on a camera image, and fits and calculates the spatial three-dimensional coordinates of the feature points of the calibration target in a model.
Disclosure of Invention
The present invention is intended to solve the above-mentioned technical problems.
In view of the above technical problem, the present invention provides a calibration device for a three-dimensional measurement system, the calibration device comprising: the electric translation table comprises a first driving assembly for driving the electric translation table to translate in a first direction, the calibration target panel is perpendicular to the first direction and arranged on the electric translation table, the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system, and the pattern display surface is used for displaying calibration patterns.
Preferably, the pattern display surface is a calibration plate which does not emit light, and the calibration plate is provided with calibration patterns.
Preferably, the pattern display surface is a display screen, and the calibration pattern is displayed by the display screen in a light-emitting manner.
Preferably, the pattern display surface is a light-emitting display panel, the surface of the display panel is of a semi-transparent and semi-reflective property, and the calibration apparatus further includes an auxiliary calibration three-dimensional measurement device or a projection apparatus for projecting the calibration pattern onto the projection display panel, wherein the display panel of the semi-transparent and semi-reflective property can transmit the projection pattern and can reflect the pattern projected by the auxiliary calibration three-dimensional measurement device or the projection apparatus.
Preferably, the electric translation stage further comprises a second driving assembly for driving the electric translation stage to translate along a second direction, and a third driving assembly for driving the electric translation stage to translate along a third direction, the second direction and the third direction are respectively perpendicular to the first direction, and a plane intersecting the second direction and the third direction is parallel to the pattern display surface.
The invention also provides a calibration method of the three-dimensional measurement system, which comprises the following steps:
arranging a pattern display surface of a calibration target panel perpendicular to an optical path of the three-dimensional measurement system, wherein the calibration device comprises an electric translation stage and the calibration target panel, the electric translation stage comprises a first driving component for driving the electric translation stage to translate in a first direction parallel to the optical path, the calibration target panel is arranged on the electric translation stage perpendicular to the first direction, the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system, and the pattern display surface is used for displaying a calibration pattern;
obtaining calibration pattern information on the calibration target panel through a three-dimensional measurement system, and determining x coordinate information and y coordinate information of the calibration target panel according to the position relation of the calibration pattern;
acquiring z coordinate information of the calibration target panel according to the movement of the electric translation table;
and calibrating the detector of the three-dimensional measuring system according to the x coordinate information, the y coordinate information and the z coordinate information.
Preferably, the pattern display surface is a non-luminous calibration plate, and the calibration plate is provided with calibration patterns; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
acquiring dense x coordinate information and y coordinate information through an interpolation algorithm;
or the second driving assembly and the third driving assembly drive the electric translation table to translate in the second direction and the third direction, so that dense x-coordinate information and y-coordinate information are acquired.
Preferably, the pattern display surface is a display screen, and the calibration pattern is displayed in a light-emitting manner through the display screen; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
the display screen displays pattern information of the intersecting phases, wherein x coordinate information and y coordinate information of the calibration target panel are modulated in the phase information;
and demodulating according to the pattern information acquired by the three-dimensional measurement system to acquire the x coordinate information and the y coordinate information of the calibration target panel.
Preferably, the first and second liquid crystal materials are,
the pattern display surface is a luminous display panel, the surface of the display panel is semi-transparent and semi-reflective, the calibration device further comprises auxiliary calibration three-dimensional measurement equipment for projecting the calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can penetrate through the projection pattern and can reflect the pattern projected by the auxiliary calibration three-dimensional measurement equipment; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
acquiring actual position information on the calibration target panel through the pattern projected by the auxiliary calibration three-dimensional measuring equipment on the calibration target panel,
the three-dimensional measurement system obtains information of the same characteristic point of the calibration target panel, and the x coordinate information and the y coordinate information of the calibration target panel are obtained through calculation of the auxiliary calibration three-dimensional measurement equipment.
Preferably, the step of calibrating the detector of the three-dimensional measurement system according to the x-coordinate information, the y-coordinate information, and the z-coordinate information includes:
calibrating a ray equation of the detector;
or fitting and establishing a system projection fringe information-three-dimensional information mapping model.
Compared with the prior art, the invention has at least the following beneficial effects:
1. the spatial three-dimensional coordinates can be acquired with higher accuracy and stability. Because the three-dimensional measurement system is calibrated just opposite to the calibration device, the two-dimensional image coordinate information of the target surface characteristics on the CCD plane can be more accurately acquired.
2. The calibration target panel and the electric translation platform are designed in various structures, are more suitable for application of three-dimensional measurement systems in various scenes, can assist in realizing higher precision, more stably and more automatically calibration, and are quicker, more efficient and more convenient. Because the electric translation table can be controlled to automatically move, the moving track is stable, the acquired data is stable, and the instability of calibration effect caused by random placement is reduced.
Drawings
Fig. 1 is a schematic structural diagram of a calibration method and a calibration apparatus of a three-dimensional measurement system in an embodiment of the present invention.
FIG. 2 is a schematic diagram of a calibration pattern according to an embodiment of the present invention.
Fig. 3 is a flowchart of a calibration method according to an embodiment of the present invention.
Detailed Description
The invention is further illustrated with reference to the following figures and examples.
Example one
Fig. 1 is a schematic diagram of a calibration device and a measurement process of a three-dimensional measurement system provided by the present invention, wherein the calibration device includes: the three-dimensional measurement system comprises an electric translation table 1 and a calibration target panel 2, wherein the electric translation table 1 comprises a first driving assembly (not shown in the figure) for driving the electric translation table to translate in a first direction, the calibration target panel 2 is arranged on the electric translation table 1 perpendicularly to the first direction, the calibration target panel 2 is provided with a pattern display surface 21 facing the three-dimensional measurement system, and the pattern display surface 21 is used for displaying a calibration pattern.
In this embodiment, the first driving assembly may be driven by a stepping motor, or may be driven by other forms such as a screw rod.
In this embodiment, as shown in fig. 2, the calibration pattern may be a sine stripe pattern, a cross-hair pattern, a checkerboard pattern, or a circular pattern, a circular ring pattern, or the like. The color of the pattern can be black and white or colored, the same calibration target pattern is not limited to one, and can be combined and matched with a plurality of patterns, and is not limited to a fixed pattern, and the actual distance between each line or color block in the pattern is known. Thus, the x-coordinate information and the y-coordinate information of the calibration target surface can be obtained by the positional relationship of the calibration pattern, and the z-coordinate information can be obtained by the movement information of the electric translation stage 1.
As an alternative embodiment, the pattern display surface 21 may be a non-luminous calibration plate having a calibration pattern thereon. The pattern display surface 21 may be made of a material having a good diffuse reflection, such as a white ceramic plate. The x-coordinate information and the y-coordinate information of the calibration target panel can be obtained by the position relationship (actual distance) of the calibration pattern, and if the dense x-coordinate information and the dense y-coordinate information need to be obtained, the dense x-coordinate information and the dense y-coordinate information can be obtained by combining an interpolation algorithm. Or, the image is obtained by translating the electric translation stage 1 in the x coordinate direction and the y coordinate direction, and therefore, further, the electric translation stage 1 further includes a second driving component (not shown in the figure) for driving the electric translation stage to translate along a second direction, and a third driving component (not shown in the figure) for driving the electric translation stage to translate along a third direction, the second direction and the third direction are respectively perpendicular to the first direction, and a plane intersecting the second direction and the third direction is parallel to the pattern display surface 21.
As an alternative embodiment, the pattern display surface 21 may be a display screen, the calibration pattern is displayed by emitting light through the display screen, and the display screen surface may be designed as a panel with a semi-transparent and semi-reflective property or a fully transparent property. For example, the display screen may display intersecting sinusoidal stripe patterns of intersecting phases, x-coordinate information and y-coordinate information of the calibration target panel are modulated in the phase information, the electric translation stage 1 moves to acquire accurate z-coordinate information, and the three-dimensional measurement system acquires the sinusoidal stripe information (calibration pattern) and then performs phase demodulation to acquire the x-coordinate information and y-coordinate information of the calibration target panel.
As an alternative embodiment, the pattern display surface 21 may be a light-emitting display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration apparatus further includes an auxiliary calibration three-dimensional measurement device 4 for projecting a calibration pattern onto the projection display panel; the display panel with the semi-transparent and semi-reflective properties can penetrate through a projection pattern and can reflect a pattern projected by the auxiliary calibration three-dimensional measuring equipment or the projection device.
Example two
Based on the first embodiment, with reference to fig. 1 and fig. 2, the invention also provides a calibration method of a three-dimensional measurement system, which includes the following steps:
s1, disposing the pattern display surface of the calibration target panel 2 perpendicular to the optical path of the three-dimensional measurement system 3, wherein the calibration apparatus includes a motorized translation stage 1 and the calibration target panel 2, the motorized translation stage 1 includes a first driving component (not shown in the figure) for driving the motorized translation stage to translate in a first direction (Z-axis direction) parallel to the optical path, the calibration target panel 2 is disposed on the motorized translation stage 1 perpendicular to the first direction, the calibration target panel 2 has a pattern display surface 21 facing the three-dimensional measurement system, and the pattern display surface 21 is used for displaying the calibration pattern;
s2, obtaining the information of the calibration pattern on the calibration target panel 2 through the three-dimensional measurement system 3, and determining the x coordinate information and the y coordinate information of the calibration target panel 2 according to the position relationship of the calibration pattern (the position relationship of the calibration pattern is preset, and is known information);
s3, acquiring z coordinate information of the calibration target panel according to the movement of the electric translation table 1;
and S4, calibrating the detector of the three-dimensional measurement system 3 according to the x coordinate information, the y coordinate information and the z coordinate information.
In an alternative embodiment, the pattern display surface 21 is a non-luminous calibration board, and the calibration board has a calibration pattern thereon; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
acquiring dense x coordinate information and y coordinate information through an interpolation algorithm;
or the second driving assembly and the third driving assembly drive the electric translation table to translate in the second direction and the third direction, so that dense x-coordinate information and y-coordinate information are acquired.
As an alternative embodiment, the pattern display surface 21 is a display screen, and the calibration pattern is displayed by the display screen in a light-emitting manner; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
the display screen displays pattern information of the intersecting phases, wherein x coordinate information and y coordinate information of the calibration target panel are modulated in the phase information;
and demodulating according to the pattern information acquired by the three-dimensional measurement system to acquire the x coordinate information and the y coordinate information of the calibration target panel.
As an alternative embodiment, the pattern display surface 21 is a light-emitting display panel, the surface of the display panel is semi-transparent and semi-reflective, and the calibration apparatus further includes an auxiliary calibration three-dimensional measurement device 4 for projecting a calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can transmit the projection pattern and can reflect the pattern projected by the auxiliary calibration three-dimensional measurement device; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
acquiring actual position information on a calibration target panel through the pattern projected by the auxiliary calibration three-dimensional measuring equipment on the calibration target surface,
the three-dimensional measurement system obtains information of the same characteristic point of the calibration target panel, and the x coordinate information and the y coordinate information of the calibration target panel are obtained through calculation of the auxiliary calibration three-dimensional measurement equipment.
Preferably, the step of calibrating the detector of the three-dimensional measurement system according to the x-coordinate information, the y-coordinate information, and the z-coordinate information includes:
calibrating a ray equation of the detector;
or fitting and establishing a system projection fringe information-three-dimensional information mapping model.
Based on the first embodiment and the second embodiment, the method can acquire the space three-dimensional coordinates more accurately and stably. Because the three-dimensional measurement system is calibrated just opposite to the calibration device, the two-dimensional image coordinate information of the target surface characteristics on the CCD plane can be more accurately acquired. Meanwhile, various design structures of the target panel and the electric translation platform are calibrated, the method is more suitable for application of three-dimensional measurement systems in various scenes, and can assist in realizing higher precision, more stable and more automatic calibration, and rapidness, high efficiency and convenience are realized. Because the electric translation table can be controlled to automatically move, the moving track is stable, the acquired data is stable, and the instability of calibration effect caused by random placement is reduced.
The above examples are intended only to illustrate specific embodiments of the present invention. It should be noted that those skilled in the art should also realize that they fall within the scope of the present invention without departing from the spirit of the invention.
Claims (10)
1. A calibration apparatus for a three-dimensional measurement system, the calibration apparatus comprising: the electric translation table comprises a first driving assembly for driving the electric translation table to translate in a first direction, the calibration target panel is perpendicular to the first direction and arranged on the electric translation table, the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system, and the pattern display surface is used for displaying calibration patterns.
2. The calibration device according to claim 1, wherein the pattern display surface is a non-luminous calibration plate having a calibration pattern thereon.
3. The calibration device according to claim 1, wherein the pattern display surface is a display screen, and the calibration pattern is displayed by the display screen in a light-emitting manner.
4. The calibration apparatus according to claim 1, wherein the pattern display surface is a light-emitting display panel, the display panel surface is semi-transparent and semi-reflective, and the calibration apparatus further comprises an auxiliary calibration three-dimensional measurement device for projecting the calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can transmit the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement device or the projection apparatus.
5. The calibration device according to claim 1, wherein the motorized translation stage further comprises a second driving assembly for driving the motorized translation stage to translate along a second direction and a third driving assembly for driving the motorized translation stage to translate along a third direction, the second direction and the third direction are respectively perpendicular to the first direction, and a plane intersecting the second direction and the third direction is parallel to the pattern display surface.
6. A calibration method of a three-dimensional measurement system is characterized by comprising the following steps:
arranging a pattern display surface of a calibration target panel perpendicular to an optical path of the three-dimensional measurement system, wherein the calibration device comprises an electric translation stage and the calibration target panel, the electric translation stage comprises a first driving component for driving the electric translation stage to translate in a first direction parallel to the optical path, the calibration target panel is arranged on the electric translation stage perpendicular to the first direction, the calibration target panel is provided with a pattern display surface facing the three-dimensional measurement system, and the pattern display surface is used for displaying a calibration pattern;
obtaining calibration pattern information on the calibration target panel through a three-dimensional measurement system, and determining x coordinate information and y coordinate information of the calibration target panel according to the position relation of the calibration pattern;
acquiring z coordinate information of the calibration target panel according to the movement of the electric translation table;
and calibrating the detector of the three-dimensional measuring system according to the x coordinate information, the y coordinate information and the z coordinate information.
7. The method for calibrating a three-dimensional measuring system according to claim 6, wherein the pattern display surface is a non-luminous calibration plate having a calibration pattern thereon; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
acquiring dense x coordinate information and y coordinate information through an interpolation algorithm;
or the second driving assembly and the third driving assembly drive the electric translation table to translate in the second direction and the third direction, so that dense x-coordinate information and y-coordinate information are acquired.
8. The method for calibrating a three-dimensional measurement system according to claim 6, wherein the pattern display surface is a display screen, and the calibration pattern is displayed by emitting light through the display screen; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
the display screen displays pattern information of the intersecting phases, wherein x coordinate information and y coordinate information of the calibration target panel are modulated in the phase information;
and demodulating according to the pattern information acquired by the three-dimensional measurement system to acquire the x coordinate information and the y coordinate information of the calibration target panel.
9. The calibration method of the three-dimensional measurement system according to claim 6, wherein the pattern display surface is a light-emitting display panel, the display panel surface is semi-transparent and semi-reflective, and the calibration apparatus further comprises an auxiliary calibration three-dimensional measurement device for projecting the calibration pattern onto the projection display panel, wherein the semi-transparent and semi-reflective display panel can transmit the projection pattern and reflect the pattern projected by the auxiliary calibration three-dimensional measurement device; the process of obtaining the x coordinate information and the y coordinate information of the calibration target panel comprises the following steps:
acquiring actual position information on the calibration target panel through the pattern projected by the auxiliary calibration three-dimensional measuring equipment on the calibration target panel,
the three-dimensional measurement system obtains information of the same characteristic point of the calibration target panel, and the x coordinate information and the y coordinate information of the calibration target panel are obtained through calculation of the auxiliary calibration three-dimensional measurement equipment.
10. The method for calibrating a three-dimensional measurement system according to claim 7, wherein the step of calibrating the detector of the three-dimensional measurement system based on the x-coordinate information, the y-coordinate information, and the z-coordinate information comprises:
calibrating a ray equation of the detector;
or fitting and establishing a system projection fringe information-three-dimensional information mapping model.
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Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101561251A (en) * | 2009-04-03 | 2009-10-21 | 四川大学 | Phase target-based optical three-coordinate measuring method |
| CN103884271A (en) * | 2012-12-20 | 2014-06-25 | 中国科学院沈阳自动化研究所 | Direct calibration method for line structured light vision sensor |
| CN105387819A (en) * | 2015-12-27 | 2016-03-09 | 河北工业大学 | Reflecting object three-dimensional shape measuring method and device based on fringe reflection method |
| CN105844686A (en) * | 2016-03-31 | 2016-08-10 | 深圳市菲森科技有限公司 | Image 3D effect display method and system |
| CN106210697A (en) * | 2016-09-09 | 2016-12-07 | 江苏科沁光电科技有限公司 | Electrosurgical sub-3D microscope |
| CN106949851A (en) * | 2017-03-29 | 2017-07-14 | 沈阳建筑大学 | A kind of line structured light vision sensor calibration method based on SVMs |
| CN107462184A (en) * | 2017-08-15 | 2017-12-12 | 东南大学 | The parameter recalibration method and its equipment of a kind of structured light three-dimensional measurement system |
| CN107560563A (en) * | 2017-07-28 | 2018-01-09 | 华南理工大学 | A kind of line laser three-dimensional measuring apparatus demarcation and error compensating method |
| CN108873363A (en) * | 2018-09-06 | 2018-11-23 | 深圳技术大学（筹） | 3 d light fields imaging system and method based on structure signal |
| CN108982067A (en) * | 2018-08-01 | 2018-12-11 | 张家港康得新光电材料有限公司 | A kind of detection device and method of 3D head-up-display system |
| EP3418681A1 (en) * | 2017-06-22 | 2018-12-26 | Hexagon Technology Center GmbH | Calibration of a triangulation sensor |
| CN110260821A (en) * | 2019-05-28 | 2019-09-20 | 深圳市菲森科技有限公司 | Optics module and three dimensional analysis system based on fringe projection |
| CN110625936A (en) * | 2019-09-17 | 2019-12-31 | 上海联泰科技股份有限公司 | Optical calibration tool, 3D printing equipment and 3D printing optical calibration method |
| CN110782499A (en) * | 2019-10-23 | 2020-02-11 | Oppo广东移动通信有限公司 | Calibration method and calibration device for augmented reality equipment and terminal equipment |
| CN111652946A (en) * | 2020-06-17 | 2020-09-11 | Oppo广东移动通信有限公司 | Display calibration method and device, equipment and storage medium |
-
2020
- 2020-12-11 CN CN202011441512.3A patent/CN112945090B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101561251A (en) * | 2009-04-03 | 2009-10-21 | 四川大学 | Phase target-based optical three-coordinate measuring method |
| CN103884271A (en) * | 2012-12-20 | 2014-06-25 | 中国科学院沈阳自动化研究所 | Direct calibration method for line structured light vision sensor |
| CN105387819A (en) * | 2015-12-27 | 2016-03-09 | 河北工业大学 | Reflecting object three-dimensional shape measuring method and device based on fringe reflection method |
| CN105844686A (en) * | 2016-03-31 | 2016-08-10 | 深圳市菲森科技有限公司 | Image 3D effect display method and system |
| CN106210697A (en) * | 2016-09-09 | 2016-12-07 | 江苏科沁光电科技有限公司 | Electrosurgical sub-3D microscope |
| CN106949851A (en) * | 2017-03-29 | 2017-07-14 | 沈阳建筑大学 | A kind of line structured light vision sensor calibration method based on SVMs |
| EP3418681A1 (en) * | 2017-06-22 | 2018-12-26 | Hexagon Technology Center GmbH | Calibration of a triangulation sensor |
| CN107560563A (en) * | 2017-07-28 | 2018-01-09 | 华南理工大学 | A kind of line laser three-dimensional measuring apparatus demarcation and error compensating method |
| CN107462184A (en) * | 2017-08-15 | 2017-12-12 | 东南大学 | The parameter recalibration method and its equipment of a kind of structured light three-dimensional measurement system |
| CN108982067A (en) * | 2018-08-01 | 2018-12-11 | 张家港康得新光电材料有限公司 | A kind of detection device and method of 3D head-up-display system |
| CN108873363A (en) * | 2018-09-06 | 2018-11-23 | 深圳技术大学（筹） | 3 d light fields imaging system and method based on structure signal |
| CN110260821A (en) * | 2019-05-28 | 2019-09-20 | 深圳市菲森科技有限公司 | Optics module and three dimensional analysis system based on fringe projection |
| CN110625936A (en) * | 2019-09-17 | 2019-12-31 | 上海联泰科技股份有限公司 | Optical calibration tool, 3D printing equipment and 3D printing optical calibration method |
| CN110782499A (en) * | 2019-10-23 | 2020-02-11 | Oppo广东移动通信有限公司 | Calibration method and calibration device for augmented reality equipment and terminal equipment |
| CN111652946A (en) * | 2020-06-17 | 2020-09-11 | Oppo广东移动通信有限公司 | Display calibration method and device, equipment and storage medium |
Non-Patent Citations (2)
| Title |
|---|
| 邓小婷: "镜面物体光学三维测量系统标定方法的研究" * |
| 邓小婷;高楠;张宗华;: "基于直接相位测量术的系统参数标定方法" * |
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