CN112859812A - Self-calibration system for satellite thermal control system - Google Patents
Self-calibration system for satellite thermal control system Download PDFInfo
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- CN112859812A CN112859812A CN202110053994.3A CN202110053994A CN112859812A CN 112859812 A CN112859812 A CN 112859812A CN 202110053994 A CN202110053994 A CN 202110053994A CN 112859812 A CN112859812 A CN 112859812A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
Abstract
The invention discloses a self-calibration system for a satellite thermal control system, which comprises N +1 channels, a reference voltage source, a programmable logic processing unit and a change-over switch, wherein the N +1 channels comprise N temperature measurement channels and a reference channel; the reference channel comprises a reference resistance unit, a signal conditioning circuit and an analog-to-digital conversion unit and is used for self calibration; the reference voltage source is used for calibrating the influence of temperature drift and radiation on the temperature measuring circuit; the change-over switch is used for controlling the reference voltage source to be connected with a temperature measuring channel to be measured; the programmable logic processing unit is used for acquiring and processing the voltage digital signals output by the N temperature measuring channels and the reference voltage digital signals output by the reference channel; the programmable logic processing unit is also used for outputting a control signal of a change-over switch and an output control signal of the reference voltage source.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a self-calibration system for a satellite thermal control system.
Background
Satellites in space are often in extremely hot or cold environments due to the fact that the satellites are separated from the atmosphere and are easily affected by solar radiation, earth and moon shielding and the like in the orbit running process. Since the working environments of the electronic, mechanical, glue paint, lubricating fluid and other materials forming the satellite are closely related to the temperature, the thermal control system becomes a necessary condition for ensuring that the thermal related parameters meet the requirement that the satellite reliably completes the preset function.
With the development of high-precision electronic instruments and devices (especially atomic clocks) and the use of high-precision optical devices in satellites, the satellites have raised higher requirements for temperature control. According to the available data, the working temperature of the Hubble telescope and some special cameras is always within the fluctuation range of 0.1 ℃ of the specified temperature; many spatial optical systems in the united states require even a specific temperature in the 0.001 c range. The clock is a precondition for the operation of a high-reliability circuit, a high-stability clock provider in the circuit is a crystal oscillator or even an atomic clock, and the devices are particularly sensitive to temperature, and the requirement of the atomic clock on the temperature can reach 0.1mK under certain conditions, so that a satellite thermal control system capable of self-calibrating is needed.
Disclosure of Invention
At present, the temperature control range of the domestic satellite temperature control system is generally over 0.2 ℃. The factors influencing the temperature control precision of the satellite thermal control system mainly include the following points: first, the temperature sensor, considering the weight effect, is mostly a thermistor for the sensor. Firstly, the temperature measurement error is caused by the fact that the thermistors are slightly different in the B value dispersion degree due to different materials; secondly, the nonlinear relation between the thermistor value and the temperature characteristic, the nonlinear error of the linear thermistor can be reduced but not eliminated along with the different temperature spans; moreover, the thermistor can be heated when current passes through, and the resistance value change of the thermistor can be influenced by temperature; finally, the thermistor is also susceptible to temperature drift and failure risks due to radiation and working time. Secondly, the temperature drift of the temperature measuring circuit is different, and the performance of internal electronic components is different along with the temperature and radiation. Thirdly, the inconsistency of the temperature control strategy, the PID algorithm, the adaptive algorithm, the fuzzy control or the neural network temperature control algorithm finally causes the difference of the temperature control stability. Fourthly, layout and pasting mode of the controlled object, etc.
To solve at least one of the technical problems set forth in the background, it is an object of the present invention to provide a self-calibration system for a satellite thermal control system,
the system comprises N +1 channels, a reference voltage source, a programmable logic processing unit and a change-over switch, wherein the N +1 channels comprise N temperature measuring channels and a reference channel;
the reference channel comprises a reference resistance unit, a signal conditioning circuit and an analog-to-digital conversion unit;
the reference voltage source is used for calibrating the influence of temperature drift and radiation on the temperature measuring circuit;
the change-over switch is used for controlling the reference voltage source to be connected with the signal input end of the temperature measuring channel to be measured;
the programmable logic processing unit is used for acquiring and processing the voltage digital signals output by the N temperature measuring channels and the reference voltage digital signals output by the reference channel; the programmable logic processing unit is also used for outputting a control signal of a change-over switch and an output control signal of the reference voltage source.
The system also comprises a core processor, an E2PROM and an on-board computer, wherein the core processor receives the reference voltage digital signal and the voltage digital signal output by the programmable logic processing unit, processes the reference voltage digital signal and the voltage digital signal into temperature values and submits the temperature values to the on-board computer and the E2 PROM.
The core processor is also used for reading the parameter value in the E2PROM, and the parameter value is used for realizing the compensation of the temperature value.
The on-board computer is used for controlling the core processor to carry out self calibration of the satellite temperature control system and receiving data transmitted by the core processor.
An nth temperature measuring channel in the temperature measuring channels comprises an nth temperature measuring unit, an nth signal conditioning circuit and an nth analog-to-digital conversion circuit, wherein a resistance value signal output by the nth temperature measuring unit changes according to the change of the temperature of a temperature measuring point, and the resistance value signal is converted into the voltage digital signal through the nth signal conditioning circuit and the nth analog-to-digital conversion circuit in sequence;
wherein N is a natural number and is less than or equal to N.
The nth signal conditioning circuit is used for adjusting an input resistance value signal to the allowed voltage signal of the nth digital-to-analog conversion circuit.
The reference resistance unit includes a reference resistance wrapped by a temperature fixing point, and a temperature fixing point for maintaining a constant temperature.
The reference resistance unit converts the temperature signal into a reference resistance signal, and the reference resistance signal is converted into the reference voltage digital signal through the signal conditioning circuit and the analog-to-digital conversion circuit in sequence and then is output to the programmable logic processing unit.
The reference voltage source comprises a digital-to-analog converter and a signal conditioning module, the programmable logic processor outputs output control signals and digital signals, and the digital signals sequentially pass through the digital-to-analog converter and the signal conditioning module to generate reference voltages and output the reference voltages to the signal conditioning circuits of the corresponding temperature measuring channels connected with the change-over switches.
The invention has the following beneficial effects:
the invention provides a self-calibration system for a satellite thermal control system aiming at the characteristics of a space cable assembly, breaks through the limitation that the satellite thermal control system cannot be calibrated and replaced during the orbital operation, and can calibrate the satellite thermal control system in real time.
Drawings
FIG. 1 shows a block diagram of a self-calibration system for a satellite thermal control system according to one embodiment of the present invention;
FIG. 2 is a schematic diagram of a reference resistance unit of a self-calibration system for a satellite thermal control system according to an embodiment of the present invention;
fig. 3 shows an operation principle diagram of temperature calibration of a self-calibration system for a satellite thermal control system according to an embodiment of the present invention.
Detailed Description
In order to more clearly illustrate the invention, the invention is further described below with reference to preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
One embodiment of the present invention provides a self-calibration system for a satellite thermal control system, as shown in fig. 1, the system comprising: the device comprises N temperature measuring channels, a reference channel, a change-over switch, a reference voltage source, a programmable logic processing unit, a core processor, an E2PROM and an on-board computer; and N is the set number of the required temperature measuring channels.
The N temperature measuring channels comprise N temperature measuring units, signal conditioning circuits 1 and 2 … … which are in one-to-one correspondence with the N temperature measuring units, and analog-to-digital conversion circuits and 2 … … which are in one-to-one correspondence with the N temperature measuring units; specifically, the temperature measurement unit N transmits the collected temperature information to a corresponding signal conditioning circuit N, the signal conditioning circuit N comprises an amplifying circuit and a filter circuit, the signal conditioning circuit N adjusts the input sensor voltage signal to a voltage range which can be received by an analog-to-digital conversion chip N, and the analog-to-digital conversion circuit converts the voltage signal into a voltage digital signal, wherein N is a natural number and is less than or equal to N.
The reference channel comprises a reference resistance unit, a signal conditioning circuit and an analog-to-digital conversion circuit, as shown in fig. 2, the reference resistance unit comprises a reference resistance and a temperature fixing point, the reference resistance is wrapped by the temperature fixing point, the reference resistance is actually a temperature measuring resistance, and the ambient temperature is constant, so that the transmitted resistance signal is a reference resistance signal, and the reference resistance signal is constant and is converted into a reference voltage digital signal sequentially through the signal conditioning circuit and the analog-to-digital conversion circuit;
as shown in fig. 3, the reference voltage source is connected to a separate temperature measuring circuit or reference circuit through a switch. The reference voltage source outputs corresponding digital signals through the FPGA, and the digital signals are converted into reference voltages through the digital-to-analog conversion circuit and the signal conditioning module. The reference resistance unit is realized by a fixed point of temperature and a reference resistance.
The programmable logic unit mainly has the following functions:
the first one is used for signal input of a change-over switch, so that channels among different temperature measuring units, a reference resistor and a reference voltage source can be switched conveniently; secondly, collecting temperature signals output by the N +1 channels, wherein the temperature signals comprise reference voltage digital signals and voltage digital signals; and a third: and outputting a digital signal generating a reference voltage.
The core processor mainly has the following functions: firstly, the temperature sensor is used for converting signals input by the programmable logic processing unit into temperature values and inputting the temperature values to a satellite-borne computer; secondly, the signal input by the satellite-borne computer is processed and then transmitted to the programmable logic processing unit; and thirdly, reading a specific parameter value in the E2PROM, wherein the specific parameter value in the E2PROM is used for calibrating the linearization error of the temperature measuring circuit, receiving the reference voltage digital signal, converting the reference voltage digital signal into a temperature value, and then comparing the temperature value with a standard temperature value, thereby realizing the error calibration of the temperature measuring unit sensor.
The self-calibration principle of the temperature sensor of the satellite thermal control system is as follows:
because the reference resistor and the temperature measuring unit of the key thermal control system are both positioned in the star body, the space environment is consistent, and the consistency exists due to the temperature drift and the nonlinear influence. Because the reference resistor is placed in the temperature fixed point, and the fixed point is used for determining the standard temperature value, the offset of the reference resistor relative to the standard temperature can be measured in real time, and the satellite can correspondingly compensate the offset value by receiving the remote control signal.
The temperature drift and radiation influence of the temperature measuring circuit can be calibrated through the input of the reference voltage source. The temperature measuring circuit of the thermistor accords with linear change; t ═ k × r (v) + b formula is satisfied, where T is the temperature value, r (v) is the resistance value after the voltage value is converted, k is the first order coefficient, i.e. slope, and b is a constant;
under the condition that the voltage value is determined to be input, the corresponding resistance value is a determined value, the temperature value obtained after the resistance value is sleeved and disclosed is a determined value, corresponding (k, b) values can be obtained through a plurality of groups of (R), (V) and T) values, the corresponding (k, b) values are stored as parameters of corresponding temperature conversion relational expressions and stored into the E2PROM, and the values are read when the satellite thermal control self-calibration system carries out temperature measurement.
The satellite-borne computer is used for controlling the operation of the satellite temperature control system, and specifically comprises the steps of calibrating the temperature measurement unit and eliminating the influence of temperature drift and radiation.
In conclusion, the satellite thermal control self-calibration system realizes real-time calibration of the temperature measurement sensor and real-time calibration of the temperature measurement circuit of the thermal control system. The thermal control efficiency of the satellite and the reliability of the system are improved.
In practical use, the satellite thermal control self-calibration system firstly uses the reference voltage source to calibrate errors caused by temperature drift and radiation in the N +1 channels, and then uses the reference resistance unit to calibrate errors of sensors of temperature measurement units in the N temperature measurement channels, so that the self-calibration of the satellite thermal control system is realized.
In one specific embodiment, the N temperature measurement units (sensors) use a conventional high precision linearized thermistor 44211 with a temperature range of-55 deg.C to 85 deg.C, an interchange precision of + -0.4 deg.C (0-85 deg.C)/+ -0.8 deg.C (-55-0 deg.C), and a linearization error of + -0.11 deg.C. The ready-made high-precision linearized thermistor has simple circuit, and the interchange precision and linearization error can be compensated by a calibration system;
the temperature fixed point can adopt a portable fixed point gallium point, and the temperature of the portable fixed point gallium point is 29.7646 ℃. In the international temperature scale, the fixed points are all realized based on the phase change process of the substance, and no error exists. For the melting point, the solidifying point of the same substance is the melting point of the same substance, but as the solidifying point is realized under the supercooling condition and a large supercooling phenomenon can occur in some substances before solidification, which is not beneficial to thermometer graduation, the melting point of gallium is the melting point of the real metal gallium;
the switch can adopt a 4052 chip which is provided with a multi-channel joint, and the connection of joint signals can be determined by performing chip control through an FPGA (field programmable gate array). Because the satellite thermal control system adopts a plurality of sensors to realize temperature measurement, a plurality of switch chips can be connected in parallel. The analog-to-digital conversion circuit is built based on an AD7606 chip of 16bit200 kSPS. The chip is a high-speed, low-power consumption and charge redistribution successive approximation type analog-to-digital converter and can synchronously sample 8 paths of analog input. An input amplifier, an overvoltage protection circuit, a second-order analog anti-aliasing filter, an analog multiplexer, a 2.5V reference voltage source and high-speed serial and parallel interfaces are integrated in a chip, the anti-aliasing suppression characteristic of 40dB under the sampling rate of 200kSPS is achieved, and the flexible digital filter can well improve the SNR and reduce the bandwidth. The method is commonly applied to high-speed data acquisition systems, instruments, control systems and the like at present;
the digital-to-analog conversion circuit is built by adopting an AD9708 chip provided by AD company. The chip is an 8bit, 125MSPS low-power-consumption digital-to-analog converter, a 1.2V reference voltage is arranged in the chip, and differential current is output. The digital-to-analog conversion circuit consists of a DA chip, a 7-order Butterworth filter, an amplitude adjusting circuit and an output interface. The bandwidth of the 7-order Butterworth filter is 40MHz, and after the filter, 2 AD8056 realize the functions of differential-to-single-ended conversion, amplitude regulation and the like, so that the performance of the whole circuit is improved to the maximum extent. The chip is commonly used for communication, signal acquisition and the like at present;
the programmable logic processing unit, namely the FPGA selects a Cyclone IV series chip of ALTERA company, the FPGA series is a low-price and low-power consumption programmable logic processing unit developed by the ALTERA company facing the market, and the logic resource is rich. There are about 30k logic units, 594kbits of embedded storage, 66 18 x 18 embedded multipliers, 4 PLLs with total utility, 20 full network clocks, 8I/O blocks and a maximum of 532 maximum user inputs and outputs. The practical requirements of the project are comprehensively considered, and the specific model of the FPGA is EP4CE30F23C 8. The chip is an SRAM type FPGA, and when the system is powered on, different configuration data can be loaded to the FPGA, so that the FPGA can complete different hardware functions.
The core processor, namely the CPU, adopts an STM32F407ZGT6 chip which is a 32-bit processor unit based on a high-performance ARM Cortex-M4 kernel. The ART accelerator optimized by an ARM Cortex-M4 processor specially used for STM32 industrial standard has the computing power of 1.25DMIPS/MHz and the highest working frequency of 168MHz, and can reduce the working frequency for saving energy. On-chip storage is 1MB of Flash and 192KB of SRAM. The processor is provided with 140 general I/O, and the working voltage is 1.8-3.6V.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.
Claims (9)
1. A self-calibration system for a satellite thermal control system,
the system comprises N +1 channels, a reference voltage source, a programmable logic processing unit and a change-over switch, wherein the N +1 channels comprise N temperature measuring channels and a reference channel;
the reference channel comprises a reference resistance unit, a signal conditioning circuit and an analog-to-digital conversion unit;
the reference voltage source is used for calibrating the influence of temperature drift and radiation on the temperature measuring circuit;
the change-over switch is used for controlling the reference voltage source to be connected with the signal input end of the temperature measuring channel to be measured;
the programmable logic processing unit is used for acquiring and processing the voltage digital signals output by the N temperature measuring channels and the reference voltage digital signals output by the reference channel; the programmable logic processing unit is also used for outputting a control signal of a change-over switch and an output control signal of the reference voltage source.
2. The system of claim 1,
the system also comprises a core processor, an E2PROM and an on-board computer, wherein the core processor receives the reference voltage digital signal and the voltage digital signal output by the programmable logic processing unit, processes the reference voltage digital signal and the voltage digital signal into temperature values and submits the temperature values to the on-board computer and the E2 PROM.
3. The system of claim 2,
the core processor is also used for reading the parameter value in the E2PROM, and the parameter value is used for realizing the compensation of the temperature value.
4. The system of claim 2,
the on-board computer is used for controlling the core processor to carry out self calibration of the satellite temperature control system and receiving data transmitted by the core processor.
5. The system of claim 1,
an nth temperature measuring channel in the temperature measuring channels comprises an nth temperature measuring unit, an nth signal conditioning circuit and an nth analog-to-digital conversion circuit, wherein a resistance value signal output by the nth temperature measuring unit changes according to the change of the temperature of a temperature measuring point, and the resistance value signal is converted into the voltage digital signal through the nth signal conditioning circuit and the nth analog-to-digital conversion circuit in sequence;
wherein N is a natural number and is less than or equal to N.
6. The system of claim 5,
the nth signal conditioning circuit is used for adjusting an input resistance value signal to the allowed voltage signal of the nth digital-to-analog conversion circuit.
7. The system of claim 1,
the reference resistance unit includes a reference resistance wrapped by a temperature fixing point, and a temperature fixing point for maintaining a constant temperature.
8. The system of claim 1, wherein the system is a mobile phone
The reference resistance unit converts the temperature signal into a reference resistance signal, and the reference resistance signal is converted into the reference voltage digital signal through the signal conditioning circuit and the analog-to-digital conversion circuit in sequence and then is output to the programmable logic processing unit.
9. The system of claim 1,
the reference voltage source comprises a digital-to-analog converter and a signal conditioning module, the programmable logic processor outputs output control signals and digital signals, and the digital signals sequentially pass through the digital-to-analog converter and the signal conditioning module to generate reference voltages and output the reference voltages to the signal conditioning circuits of the corresponding temperature measuring channels connected with the change-over switches.
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Cited By (1)
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| CN113900473A (en) * | 2021-10-27 | 2022-01-07 | 北京华芯微半导体有限公司 | High-precision reference generation method and system |
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