CN112859172A

CN112859172A - Longitudinal and transverse wave micro-logging data processing method and device

Info

Publication number: CN112859172A
Application number: CN202110244099.XA
Authority: CN
Inventors: 苏德仁; 周志才; 李天树; 刘绍新; 刘占杰; 张国富
Original assignee: China National Petroleum Corp; BGP Inc
Current assignee: China National Petroleum Corp; BGP Inc
Priority date: 2021-03-05
Filing date: 2021-03-05
Publication date: 2021-05-28

Abstract

The invention provides a method and a device for processing longitudinal and transverse wave micro-logging data, wherein the method comprises the following steps: performing band-pass filtering on the transverse wave micro-logging data of the target area, and performing first arrival pickup on the transverse wave micro-logging data; processing longitudinal wave first arrival time data by using a linear fitting method to obtain a longitudinal wave velocity hierarchy; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy; according to the longitudinal wave velocity layering and the transverse wave velocity layering, performing longitudinal and transverse wave joint interpretation to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters; and establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and the SPS result data of the target area. The band-pass filtering can remove interference wave information in the transverse waves and improve the precision and efficiency of the first arrival pick-up of the transverse waves; the condition of contradiction between the longitudinal wave interpretation result and the transverse wave interpretation result can be eliminated, and the accuracy of the data processing result is improved.

Description

Longitudinal and transverse wave micro-logging data processing method and device

Technical Field

The invention relates to the technical field of petroleum seismic exploration near-surface stratum parameter investigation, in particular to a method and a device for processing longitudinal and transverse wave micro-logging data.

Background

Lithologic oil and gas reservoirs and complex fracture type oil and gas reservoirs are main objects of onshore oil and gas exploration in China at present. These complex reservoirs are difficult to solve with conventional longitudinal wave (P-wave) exploration methods relative to previously constructed reservoirs. In theory, multi-component seismic exploration techniques have unique advantages in addressing complex structures and anisotropy, and thus have been increasingly studied and applied. In the three-component seismic data acquisition work, the longitudinal wave data and the transverse wave data of the surface layer are acquired by a micro-logging method, and basic data are provided for eliminating or weakening the adverse effect of the near-surface on the quality of the seismic data. The method aims to further improve the survey precision of the surface structure, more effectively guide seismic data acquisition construction and provide more reliable static correction value data for multi-component seismic data processing, and finally achieve the purpose of improving the quality of seismic data.

However, the existing links for processing and explaining longitudinal and transverse wave data of the micro-logging have some problems:

in the past, longitudinal wave information and transverse wave information are separately carried out, including data loading, class report definition, layered interpretation and the like, the process is complicated, interpretation results often exist in contradictory places, and fusion and unification are difficult to carry out, so that the processing result of longitudinal wave and transverse wave micro-logging data is not accurate enough, and the effect of multi-component seismic exploration is influenced.

Disclosure of Invention

The embodiment of the invention provides a method for processing longitudinal and transverse wave micro-logging data, which is used for improving the accuracy of a longitudinal and transverse wave micro-logging data processing result and comprises the following steps:

performing band-pass filtering on the transverse wave micro-logging data of a target area, and performing first arrival pickup on the transverse wave micro-logging data to obtain longitudinal wave first arrival time data and transverse wave first arrival time data;

carrying out layering processing on longitudinal wave first arrival time data by using a linear fitting method to obtain longitudinal wave speed layering; carrying out layering processing on the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave speed layering;

according to the longitudinal wave velocity layering and the transverse wave velocity layering, performing longitudinal and transverse wave joint interpretation to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters;

and establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area.

During specific implementation, the following formula is utilized, and according to shear wave first arrival time data, piecewise nonlinear fitting is carried out on the shear wave time-depth relation, so that the shear wave layering speed is determined:

Vs＝a_i+b_i×H

wherein Vs represents shear wave layered velocity; a is_iRepresents the ith segment fitting intercept; b_iRepresenting the velocity change gradient of the fitted shear wave of the ith section; h represents depth.

In a specific embodiment, the building a longitudinal-transverse wave surface structure model of the target area according to the longitudinal-transverse wave surface structure parameters, the transverse-wave surface structure parameters, and SPS result data of the target area includes:

when the transverse wave surface structure is established, the interlayer speed is filled in a variable speed mode in a nonlinear interpolation function mode in the longitudinal direction, the longitudinal wave surface structure is layered as a reference in the transverse direction, and the interlayer transverse wave speed is interpolated in a nonlinear mode.

In an embodiment of the present invention, to improve the accuracy of the transversal and longitudinal wave micro-logging data of the target area, the band-pass filtering the transversal wave micro-logging data of the target area further includes:

classifying receiving channels of the three-component detector in the target area according to the channel types of the receiving channels;

and classifying and displaying the longitudinal waves and the transverse waves received by the receiving channels of the same type, filtering interference data of the longitudinal waves and the transverse waves under the same component window, and determining longitudinal and transverse wave micro-logging information of a target area.

In another embodiment of the present invention, a method for processing vertical and horizontal wave micro-logging data is further provided, wherein after establishing a vertical and horizontal wave surface structure model of a target region, the method further includes:

determining the surface layer attribute information of longitudinal and transverse waves according to the surface layer structure model of the longitudinal and transverse waves of the target area;

and obtaining a near-surface structure model of the target area according to the longitudinal and transverse wave surface layer structure model of the target area, the longitudinal and transverse wave surface layer attribute information and surface lithology logging information of the target area, and determining the excitation well depth of the target area for seismic exploration.

selecting reference surface parameters of longitudinal waves and transverse waves, longitudinal wave replacement speed and transverse wave replacement speed according to a longitudinal wave and transverse wave surface structure model of a target area;

and extracting and calculating the longitudinal wave static correction value and the transverse wave static correction value by using the longitudinal wave and transverse wave reference surface parameters, the longitudinal wave replacing speed and the transverse wave replacing speed, and determining the longitudinal wave static correction value and the transverse wave static correction value of the target area.

The embodiment of the invention also provides a longitudinal and transverse wave micro-logging data processing device, which is used for improving the accuracy of the longitudinal and transverse wave micro-logging data processing result and comprises the following components:

the filtering and first arrival picking module is used for carrying out band-pass filtering on the transverse wave micro-logging data of the target area and then carrying out first arrival picking on the transverse wave micro-logging data to obtain longitudinal wave first arrival time data and transverse wave first arrival time data;

the velocity layering module is used for processing the longitudinal wave first arrival time data by utilizing a linear fitting method to obtain a longitudinal wave velocity layering; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy;

the combined interpretation module is used for carrying out longitudinal wave and transverse wave combined interpretation according to the longitudinal wave speed layering and the transverse wave speed layering to obtain longitudinal wave surface structure parameters and transverse wave surface structure parameters;

and the longitudinal and transverse wave surface structure model establishing module is used for establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area.

In a specific embodiment, the speed stratification module is specifically configured to:

and (3) carrying out piecewise nonlinear fitting on the shear wave time-depth relation according to shear wave first arrival time data by using the following formula to determine the shear wave layering speed:

Vs＝a_i+b_i×H

In a specific implementation process, the longitudinal and transverse wave surface layer structure model establishing module is specifically used for:

when a transverse wave surface structure model is established, the interlayer speed is filled in a variable speed mode in a nonlinear interpolation function mode in the longitudinal direction, the longitudinal wave surface structure layering is used as a reference in the transverse direction for a large-layer structure, and the interlayer transverse wave speed is interpolated in a nonlinear mode.

In an embodiment of the present invention, in order to improve the accuracy of the longitudinal and transverse wave micro-logging data of the target area, a longitudinal and transverse wave micro-logging data processing apparatus is further provided, further comprising:

a profile optimization module to:

before band-pass filtering is carried out on transverse wave micro-logging data of a target area, classifying receiving channels of a three-component detector in the target area according to channel types of the receiving channels;

In another embodiment of the present invention, there is provided a method for processing longitudinal and transverse wave micro-logging data, further comprising:

an excitation well depth determination module to:

a static correction amount calculation module to:

The embodiment of the invention also provides computer equipment which comprises a memory, a processor and a computer program which is stored on the memory and can run on the processor, wherein the processor realizes the method for processing the longitudinal and transverse wave micro-logging data when executing the computer program.

The embodiment of the invention also provides a computer readable storage medium, which stores a computer program for executing the method for processing the longitudinal and transverse wave micro-logging data.

In the embodiment of the invention, after band-pass filtering is carried out on transverse wave micro-logging data of a target area, first arrival pickup is carried out on the transverse wave micro-logging data to obtain longitudinal wave first arrival time data and transverse wave first arrival time data; processing longitudinal wave first arrival time data by using a linear fitting method to obtain a longitudinal wave velocity hierarchy; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy; according to the longitudinal wave velocity layering and the transverse wave velocity layering, performing longitudinal and transverse wave joint interpretation to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters; and establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area. By carrying out band-pass filtering on the transverse wave micro-logging data of the target area, interference wave information in the transverse wave can be removed, and the precision and efficiency of the transverse wave first arrival picking-up are improved; longitudinal wave velocity layering and transverse wave layering are obtained by synchronously processing longitudinal wave and transverse wave micro-logging information, and longitudinal wave and transverse wave joint interpretation is carried out according to the longitudinal wave velocity layering and the transverse wave velocity layering, so that compared with a method for respectively interpreting longitudinal waves and transverse waves in the prior art, the condition of mutual contradiction between longitudinal wave interpretation results and transverse wave interpretation results can be eliminated, and the interpretation results are more accurate; due to the improvement of the accuracy of the interpretation result of the longitudinal and transverse wave data and the accuracy of the first arrival pick-up of the transverse wave, a more accurate longitudinal and transverse wave surface layer structure model can be established, so that the accuracy of the processing result of the longitudinal and transverse wave micro-logging data is improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a schematic diagram of a longitudinal and transverse wave micro-logging data processing method according to an embodiment of the present invention.

FIG. 2 is a schematic diagram of a method for processing longitudinal and transverse wave micro-logging data according to an embodiment of the present invention.

FIG. 3 is a schematic diagram of a method for processing longitudinal and transverse wave micro-logging data according to another embodiment of the present invention.

FIG. 4 is a schematic diagram of a method for processing longitudinal and transverse wave micro-logging data according to another embodiment of the present invention.

Fig. 5 is a schematic flow chart of the longitudinal and transverse wave micro-logging combined investigation technique provided in the embodiment of the present invention.

FIG. 6 is a diagram of a completion of microlog sites for line 1701 designed in accordance with an embodiment of the present invention.

FIG. 7 is a graph showing the vertical relationship between the excitation point and the reception point in an embodiment of the present invention.

FIG. 8 is an exemplary diagram of longitudinal and transverse wave micro-logging data collected in the embodiment of the present invention.

FIG. 9 is a diagram illustrating a receive track type definition window in accordance with an embodiment of the present invention.

FIG. 10 is a diagram illustrating a trace type culling sort definition window in accordance with an embodiment of the present invention.

Fig. 11 is a diagram illustrating enhanced identification of the transverse-wave working channel in accordance with an embodiment of the present invention.

FIG. 12 shows first arrival picking and first arrival time display in accordance with an embodiment of the present invention.

FIG. 13 is a diagram of the processing result of the joint interpretation of longitudinal and transverse waves in the embodiment of the present invention.

FIG. 14 is a time plot of shear-wave micro-logging results as explained by the nonlinear fitting velocity stratification method in the embodiments of the present invention.

FIG. 15 is a schematic diagram of a model of the structure of a longitudinal-transverse wave table established in an embodiment of the present invention.

FIG. 16 is a comparison of static correction results calculated from shear wave micro-log data for a section of lines 1701 using linear layering and non-linear layering methods for interpretation in an embodiment of the present invention.

FIG. 17 is a comparison graph of single shot effect of static correction values calculated by the application of the embodiment of the present invention.

Fig. 18 is a diagram of the archive interpretation result of point 2221 in the embodiment of the present invention by applying the old method.

FIG. 19 is a chart of the results of applying the old method to point 2457 in the embodiment of the present invention.

FIG. 20 is a schematic diagram of a longitudinal and transverse wave micro-logging data processing device according to an embodiment of the present invention.

FIG. 21 is a schematic diagram of a longitudinal and transverse wave micro-logging data processing device according to an embodiment of the present invention.

FIG. 22 is a schematic diagram of a longitudinal and transverse wave micro-logging data processing device according to another embodiment of the present invention.

FIG. 23 is a schematic diagram of a longitudinal and transverse wave micro-logging data processing device according to another embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The embodiment of the invention provides a method for processing longitudinal and transverse wave micro-logging data, which is used for improving the accuracy of a longitudinal and transverse wave micro-logging data processing result, and as shown in figure 1, the method comprises the following steps:

step 101: performing band-pass filtering on the transverse wave micro-logging data of the target area, and performing first arrival pickup on the transverse wave micro-logging data to obtain longitudinal wave first arrival time data and transverse wave first arrival time data;

step 102: processing longitudinal wave first arrival time data by using a linear fitting method to obtain a longitudinal wave velocity hierarchy; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy;

step 103: according to the longitudinal wave velocity layering and the transverse wave velocity layering, performing longitudinal and transverse wave joint interpretation to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters;

step 104: and establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area.

As can be known from the process shown in fig. 1, in the embodiment of the present invention, after band-pass filtering is performed on the shear wave micro-logging data of the target area, first arrival pickup is performed on the shear wave micro-logging data to obtain longitudinal wave first arrival time data and shear wave first arrival time data; processing longitudinal wave first arrival time data by using a linear fitting method to obtain a longitudinal wave velocity hierarchy; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy; according to the longitudinal wave velocity layering and the transverse wave velocity layering, performing longitudinal and transverse wave joint interpretation to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters; and establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area. By carrying out band-pass filtering on the transverse wave micro-logging data of the target area, interference wave information in the transverse wave can be removed, and the precision and efficiency of the transverse wave first arrival picking-up are improved; longitudinal wave velocity layering and transverse wave layering are obtained by synchronously processing longitudinal wave and transverse wave micro-logging information, and longitudinal wave and transverse wave joint interpretation is carried out according to the longitudinal wave velocity layering and the transverse wave velocity layering, so that compared with a method for respectively interpreting longitudinal waves and transverse waves in the prior art, the condition of mutual contradiction between longitudinal wave interpretation results and transverse wave interpretation results can be eliminated, and the interpretation results are more accurate; due to the improvement of the accuracy of the interpretation result of the longitudinal and transverse wave data and the accuracy of the first arrival pick-up of the transverse wave, a more accurate longitudinal and transverse wave surface layer structure model can be established, so that the accuracy of the processing result of the longitudinal and transverse wave micro-logging data is improved.

During specific implementation, firstly, the transverse wave micro-logging data of a target area are obtained, band-pass filtering is carried out on the transverse wave micro-logging data of the target area, and after the transverse wave micro-logging data of the target area are subjected to band-pass filtering, first arrival picking is carried out on the longitudinal wave micro-logging data and the transverse wave micro-logging data of the target area, so that longitudinal wave first arrival time data and transverse wave first arrival time data are obtained.

Because the field acquisition environment is complex, and the coupling requirement on the three-component detector is high in the acquisition process of the three-component detector on the micro-logging information, under the same excitation condition, transverse waves are suppressed and interfered due to the interference on the acquired information caused by the influence of environmental noise, surface factors and construction factors. By adopting the band-pass filtering method, interference wave information can be removed, the accuracy of first arrival picking of transverse waves is improved, and the working efficiency is improved.

In a specific embodiment, in order to optimize the longitudinal and transverse wave micro-logging data directly received from the three-component detector in the target area before processing the longitudinal and transverse wave micro-logging data, for example, abnormal data or interference data such as error data may exist in the longitudinal and transverse wave micro-logging data directly received from the three-component detector, as shown in fig. 2, a method for processing the longitudinal and transverse wave micro-logging data is further provided in a specific embodiment of the present invention, and on the basis of fig. 1, the method further includes:

step 201: classifying receiving channels of the three-component detector in the target area according to the channel types of the receiving channels;

step 202: and classifying and displaying the longitudinal waves and the transverse waves received by the receiving channels of the same type, filtering interference data of the longitudinal waves and the transverse waves in the same component window, and determining longitudinal and transverse wave micro-logging information of a target area.

The channel type of a receiving channel of the three-component detector is divided into an X component, a Y component and a Z component, longitudinal waves and transverse waves received by the receiving channel of the same type are displayed in a classified mode and displayed under the same component window, optimization is carried out, on one hand, data optimization is facilitated, and the quality of transverse wave micro-logging data of a target area can be improved; on the other hand, the speed of data filtering can be improved by the same window display, and the working efficiency is improved.

Carrying out first arrival pickup on longitudinal and transverse wave micro-logging data of a target area to obtain longitudinal wave first arrival time data and transverse wave first arrival time data, and then processing the longitudinal wave first arrival time data by using a linear fitting method to obtain longitudinal wave velocity stratification; and processing the shear wave first arrival time data by using a nonlinear fitting method to obtain the shear wave velocity hierarchy.

In the prior art, the linear layering method is adopted in the shear wave surface structure speed layering interpretation method, and the following defects are caused when the shear wave speed layering is carried out: the layering node is not clear, the layering randomness is large, the multi-solution performance is achieved, the precision is low, the tracking of the transverse calibration horizon is not facilitated, and the physical property change and structure change characteristics of the near-surface sediment cannot be reflected.

In specific implementation, in view of the continuous characteristic of the shear wave velocity, the fitting layering method is directly related to the reasonability and the accuracy of the shear wave velocity calculation, so that a nonlinear fitting method is adopted, the layering accuracy is controlled by the fitting time-depth relation, the following formula is utilized, and the shear wave time-depth relation is subjected to piecewise nonlinear fitting according to shear wave first arrival time data to determine the shear wave layering velocity:

Vs＝a_i+b_i×H

And after the longitudinal wave velocity layering and the transverse wave velocity layering are obtained, performing longitudinal and transverse wave joint interpretation according to the longitudinal wave velocity layering and the transverse wave velocity layering to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters. In the embodiment, longitudinal and transverse wave first arrival data are loaded simultaneously in a left (longitudinal wave first arrival) and right (transverse wave first arrival) window under the longitudinal and transverse wave micro-logging data processing windows, so that the mode that the longitudinal wave and the transverse wave can only be loaded and processed separately in the past is changed, and the precision and the efficiency of data processing are greatly improved.

And after the longitudinal wave surface layer structure parameters and the transverse wave surface layer structure parameters are obtained, establishing a longitudinal and transverse wave surface layer structure model of the target area according to the longitudinal wave surface layer structure parameters, the transverse wave surface layer structure parameters and SPS result data of the target area. The SPS (Shell Processing support) result data is seismic exploration auxiliary data acquired by a seismic team, and is organized and stored in a recording format according to a receiving point file, a shot point file, a relation file and an annotation file. In specific implementation, when the transverse wave surface structure is established, the interlayer speed in the longitudinal direction is filled in a variable speed mode in a nonlinear interpolation function mode, in the transverse direction, the longitudinal wave surface structure is layered as a reference in the large-layer structure, and the interlayer transverse wave speed is interpolated in a nonlinear mode. The longitudinal wave surface structure is consistent with the existing model building mode, but the level division of the transverse wave needs to refer to the main layered interface of the longitudinal wave structure, namely, the relevance between the transverse wave structure and the layers of the longitudinal wave structure needs to be established on the level determination of the transverse wave structure, and finally the joint building of the longitudinal wave structure and the transverse wave structure model is realized.

After establishing the model of the surface structure of the longitudinal and transverse waves in the target area, the present embodiment further provides a method for processing the longitudinal and transverse wave micro-logging data, as shown in fig. 3, on the basis of fig. 1, further comprising:

step 301: determining the surface layer attribute information of longitudinal and transverse waves according to the surface layer structure model of the longitudinal and transverse waves of the target area;

step 302: and obtaining a near-surface structure model of the target area according to the longitudinal and transverse wave surface layer structure model of the target area, the longitudinal and transverse wave surface layer attribute information and surface lithology logging information of the target area, and determining the excitation well depth of the target area for seismic exploration.

After the model of the surface structure of the longitudinal and transverse waves in the target area is established, another embodiment further provides a method for processing the longitudinal and transverse wave micro-logging data, as shown in fig. 4, on the basis of fig. 1, further comprising:

step 401: selecting reference surface parameters of longitudinal waves and transverse waves, longitudinal wave replacement speed and transverse wave replacement speed according to a longitudinal wave and transverse wave surface structure model of a target area;

step 402: and extracting and calculating the longitudinal wave static correction value and the transverse wave static correction value by using the longitudinal wave and transverse wave reference surface parameters, the longitudinal wave replacing speed and the transverse wave replacing speed, and determining the longitudinal wave static correction value and the transverse wave static correction value of the target area.

When step 402 is implemented, the final calculation formula of the shear wave static correction amount is:

wherein, Δ t represents the propagation time of the transverse wave in a certain depth segment;

a represents intercept; b represents the velocity change gradient of the transverse wave;

h represents depth;

Δt_irepresenting the propagation time of the transverse wave in the ith velocity layer;

i represents the number of layers above the high-speed top of the transverse wave surface layer model;

h_drepresenting the elevation of the datum plane in m; h is_xRepresenting the elevation of a transverse wave high-speed top interface in a unit of m;

vs represents the speed of the displacement of the transverse wave in m/s;

and T represents the static correction value of the transverse wave detection point in m/s.

In the specific embodiment, in order to ensure reasonable and careful investigation of the target area, longitudinal and transverse wave micro-logging data which needs to be acquired can be comprehensive and refined, so that the position arrangement of the three-component detector is reasonable. Therefore, before processing the longitudinal and transverse wave micro-logging data, the surface structure of the target area preferably needs to be preliminarily investigated and designed and constructed, specifically including surface data acquisition and construction design, and the point location density of the three-component detector is adjusted and arranged according to the acquired surface data of the target area.

Meanwhile, when the three-component detector works, in order to ensure the quality of data acquisition, in the specific embodiment, the implementation situation of micro-logging longitudinal and transverse wave data acquisition of the three-component detector in a well is strictly monitored, and the quality problem in the data acquisition process needs to be timely processed, wherein the three-component detector works in a mode of synchronously exciting the ground three-component detector to synchronously receive.

An embodiment of the present invention is described below to illustrate how to perform the processing of longitudinal and transverse wave micro-logging data. This example applies to 1701 line from south of the well work area of beil depressed bei 39 in the helar basin. The measuring line is positioned on the south side of the work area, the horizontal relief of the terrain is large, the surface structure is complex, the line is designed and collected with 18 three-component micro-logging as example analysis, and the selected pile number range is 2047 and 2668 sections.

Fig. 5 is a flow chart of the technique for combined longitudinal and transverse wave micro-logging investigation provided in this embodiment. The method mainly comprises the following steps:

firstly, designing and adjusting longitudinal and transverse wave micro-logging survey point positions: control points are arranged according to terrain changes, the point location intervals cannot be greatly different, principles of convenience in construction operation and the like are also considered, longitudinal wave and transverse wave micro-logging survey point locations are designed, necessary adjustment is carried out on individual point locations, and finally the designed micro-logging point location of the 1701 logging line is completed as shown in fig. 6.

Acquiring longitudinal and transverse wave micro-logging data on a designed survey point, wherein as shown in fig. 7, a vertical relation graph of an excitation point and a receiving point in the embodiment is shown, the depth of a shaft is set to be 30-80 m (the well depth of micro-logging can be adjusted according to actual conditions in construction), and the density of the excitation point on a micro-logging excitation cable is 0.5-2 m from shallow to deep; the method is characterized in that 8 single-side three-component detectors are adopted, the arrangement mode is that 1 detector is one group and is arranged linearly, each three-component detector is connected according to the X, Z, Y sequence, the well detection distances are 2m, 4m, 6m, 8m, 10m, 12m, 14m and 16m respectively, and the X component direction points to the well head. The receiver receiving pattern, such as sector and L-shape, can also be changed as required, as shown in fig. 8, which is an exemplary diagram of the acquired longitudinal and transverse wave micro-logging data.

In order to better select the longitudinal and transverse wave working channels, each receiving channel is respectively defined according to the channel type (X, Y, Z component), thus the channels of each component can be classified, as shown in fig. 9, the definition types are divided into three categories, namely a Z-component longitudinal wave receiving channel 0, an X-component transverse wave receiving channel 2 and a working channel 1 needing to be eliminated, all the longitudinal and transverse waves are classified and displayed, the preference is carried out under the same component window, and the components can be very conveniently sorted through the arrangement. As shown in fig. 10, the trace sorting display window is used, and after the component type of each trace of the longitudinal and transverse wave micro-logging records is defined, the records of each component trace to be displayed can be selected in the window for displaying the waveform data, which provides great convenience for the centralized optimization of the longitudinal and transverse waves, and can ensure that the optimal working trace is used for data interpretation so as to ensure the data quality.

Specifically, for the observation system, there are defined: the receive track count of 24, 200200200200200200200200, is defined by first defining the number of receive tracks, followed by defining the offset, i.e., the planar distance of each receive track from the wellhead. Definition of track type: 210210210210210210210210, the number "0" represents the longitudinal wave component, the number "1" represents the transverse wave "Y" component, and the number "2" represents the transverse wave "X" component.

After the optimal working channel is selected, band-pass filtering is carried out on the transverse wave micro-logging data so as to eliminate the interference on the collected data caused by the influence of environmental noise, surface factors and construction factors. As shown in fig. 11, for the schematic diagram after enhanced identification of the transverse wave channel in this specific example, the upper half of the diagram is a wave train diagram without frequency division filtering, and the lower half of the diagram is a wave train diagram with frequency division filtering, so that the identification and first arrival picking effects on the transverse wave information are significant.

After band-pass filtering is carried out on transverse wave micro-logging data, longitudinal wave and transverse wave first arrival time pickup is carried out: firstly, estimating the frequency of a complete transverse wave waveform, reserving a certain range of effective frequency of the estimated value, and setting a pass-discharge frequency range: 0,10, 50, 60.

Because the transverse wave obtained by exciting the ground in the well and receiving is not a first arrival wave, but a continuous arrival wave, and the starting position of the wave form is not well distinguished, the wave crest or the wave trough is used as a standard position for picking up the first arrival. The longitudinal wave first arrival picking is to use the longitudinal wave first arrival position as the standard position for first arrival picking, and can be combined with manual intervention or editing to complete the first arrival picking, for example, fig. 12 shows the first arrival picking and the first arrival time display.

In specific implementation, after first arrival picking is completed, longitudinal wave and transverse wave preprocessing speed layering is firstly carried out under a same-scale display window, longitudinal waves are also subjected to a linear fitting method, transverse wave speed adopts a nonlinear function fitting layering method, then joint interpretation of longitudinal waves and transverse waves is completed through respective influence factors, the processing result is shown in fig. 13, the left longitudinal wave first arrival display window is arranged on the left side of the drawing, the right transverse wave first arrival display window is arranged on the right side of the drawing, and a lithology column is displayed in the middle of the drawing.

In view of the continuous characteristic of the shear wave velocity, the fitting layering method is directly related to the reasonability and the accuracy of the shear wave velocity calculation, a nonlinear fitting method is adopted for controlling the layering accuracy through the fitting depth relation, as shown in figure 14, the time distance graph of the shear wave micro-logging result explained by the nonlinear fitting velocity layering method is a time distance graph of the shear wave micro-logging result, and the lithologic medium change distinguishing rule can be clearly seen from the graph.

And (3) performing longitudinal and transverse wave joint interpretation to obtain a longitudinal wave time distance graph and a transverse wave time distance graph shown in fig. 13, and then loading surface lithology data according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area to establish a longitudinal and transverse wave surface structure model. The specific process comprises the following steps: when the transverse wave surface structure is established, the interlayer speed is filled in a variable speed mode in a nonlinear interpolation function mode in the longitudinal direction, the longitudinal wave surface structure is layered as a reference in the transverse direction, and the interlayer transverse wave speed is interpolated in a nonlinear mode. The longitudinal wave surface structure is consistent with the existing model building mode, but the level division of the transverse wave needs to refer to the main layered interface of the longitudinal wave structure, namely, the relevance between the transverse wave structure and the layers of the longitudinal wave structure needs to be established on the level determination of the transverse wave structure, and finally the joint building of the longitudinal wave structure and the transverse wave structure model is realized. The finally established surface structure model of the longitudinal wave and the transverse wave is shown in fig. 15, the upper half part of fig. 15 shows the established surface structure model of the longitudinal wave, and the lower half part of fig. 15 shows the established surface structure model of the transverse wave.

And after a longitudinal wave and transverse wave surface layer structure model is established, selecting the reference surface parameters and the respective replacing speeds to complete the extraction and calculation of the respective static correction values.

In the specific example, the practical application purpose of each link of longitudinal and transverse wave micro-logging point location design, data acquisition, data loading, transverse wave information enhancement identification, first arrival pickup, longitudinal and transverse wave speed fitting layering, longitudinal and transverse wave structure model construction, static correction value extraction and the like of the measuring line is clear, each link is connected smoothly, feedback is timely, the efficiency of the whole process is improved, and the precision of the final data processing result is obviously improved.

In order to verify the effect which can be achieved by the method for processing longitudinal and transverse wave micro-logging data provided by the invention, the method provided by the embodiment of the invention also utilizes the near-surface structure micro-logging longitudinal and transverse wave combined synchronous investigation technology provided by the embodiment in the Daqing exploration area to complete three-component seismic exploration three-dimensional acquisition engineering projects, the total processing of three-component micro-logging is 1237, the respective submitted physical point number of the static correction values of the longitudinal and transverse waves is 648063, and the method has very ideal application effect and specifically comprises the following steps:

(1) improvement of data interpretation efficiency and precision: by adopting a transverse wave speed fitting layering method and a novel longitudinal wave and transverse wave processing method, the working efficiency is improved by more than 4 times, the specific data are detailed in table 1, the data interpretation precision is improved by 16.9 percent on average, and the specific data are detailed in table 2.

TABLE 1 aging analysis table for old and new methods

TABLE 2 precision analysis table for old and new method interpretation

(2) Improvement of efficiency and accuracy of model construction and static correction amount calculation: on the basis of improving the accuracy and efficiency of an explanation result, a mode of jointly constructing a longitudinal wave and transverse wave surface structure model is applied, so that the accuracy of the surface model is improved by at least 16.9%, the accuracy of a static correction value is improved by at least 16.9%, as shown in FIGS. 16 and 17, FIG. 16 is a comparison between static correction values calculated by transverse wave micro-logging data explained by a linear layering method and a nonlinear layering method for a certain section of a line 1701 in the specific example, the uppermost part of the graph shows a surface elevation line, the middle part of the graph is a static correction value curve calculated by two layering methods, the lowest part of the graph shows corresponding error distribution, because the deepest inflection point in the explanation result is used as a high-speed top interface when the static correction value of the transverse wave is calculated, the position indicated by an arrow is an area with the largest difference, and the high-speed top interface determined by the two interpretation methods of the micro-logging in the area is nearly 40ms, the new method provided by the invention explains that the curve of the static correction value calculated by the result is similar to the change of the terrain and accords with the change rule of the static correction value of the demodulator probe, so that the new method provided by the invention is relatively credible. Part a in fig. 17 is an original single shot of shear wave of a certain block, part b is a static correction amount single shot calculated by adopting an old processing method, and part c is a static correction amount single shot calculated by adopting the new processing method provided by the invention.

As can be seen from fig. 16 and 17, the effectiveness of the early-stage results correspondingly reduces the number of comparison calculations for the structural model construction, and the efficiency is improved but is not obvious.

(3) By adopting the integrated technical process of micro-logging longitudinal and transverse wave combined investigation design, acquisition and processing, the precision and the effectiveness of data are obviously improved:

TABLE 3 comprehensive analysis table for longitudinal and transverse wave combined investigation and treatment technology application effect

Through application analysis of the two work areas, specific test result statistical data are shown in table 3. The technical process of the near-surface structure micro-logging longitudinal and transverse wave combined investigation integration successfully solves the problems of construction design, data acquisition and transverse wave speed fitting layering method and the efficiency and precision of micro-logging longitudinal and transverse wave combined interpretation, effective feedback is formed to the superior process through micro-logging longitudinal and transverse wave combined processing and near-surface micro-logging longitudinal and transverse wave structure model combined interpretation, single-point data quality and static correction value calculation precision are better controlled, the links and the feedback are smooth in each link of the near-surface structure micro-logging longitudinal and transverse wave investigation, and the efficiency improved in the whole link is more remarkable.

(4) Data effect comparison

According to the application technical process of longitudinal and transverse wave combined observation surface layer investigation, the application effect of the micro-logging longitudinal and transverse wave combined synchronous investigation technology is explained from the two aspects of calculation precision and working efficiency, the selected example data is 1701 measuring line on the south side of a Hailal basin Bell sunken Bei 39 well work area, the transverse topographic relief of the line is large, the surface layer structure is complex, the line is designed and collected with 18 three-component micro-logging as example analysis, the measuring line is positioned on the south side of the work area, the transverse topographic relief is large, the surface layer structure is complex, a section of pile number 2047 and 2668 of the 1701 measuring line is selected, static correction values are respectively calculated by a new and old method, and the comparison of two static correction value curves on the graph 16 shows that the difference of the static correction values is large in the 2147 and 2287 interval, and the difference between the change form from 2301 to the end is small, and the goodness of fit is good. To analyze the cause of the difference,

representative points

2221 and 2457 are selected from two different sections.

The time distance graph and the processing result of the new and old processing methods of 2221 and 2457 are compared and analyzed as follows:

for point 2221, fig. 18 is a graph of the result of the earlier-applied method archiving and interpretation of point 2221, the data layering is very simple, the law of change of the shear wave velocity is not described clearly, and the accuracy is low. The high-speed top position of the interactive interpretation data is lower than that of the archived data by about 16 meters and 40ms, and the difference is very obvious. Therefore, as can be seen from the comparative analysis of fig. 18 and table 4, the transverse wave using the old processing method is layered into two layers, the transverse wave using the new processing method is layered into 4 layers, and when calculating the transverse wave static correction value, the deepest inflection point in the interpretation result is used as the high-speed top interface, the time difference between the high-speed top interfaces determined by the two interpretation methods is approximately 40ms, and the curve of the static correction value calculated by the new processing method is similar to the change of the terrain, conforms to the change rule of the wave detection point static correction value, and is more reliable.

TABLE 4 comparison of data before and after the physical point adopts a new processing technique

For point 2457, time distance graphs for the new and old method explanations are given in fig. 19 and table 5. The transverse wave layering of the new processing method is 3 layers, the transverse wave layering of the old processing method shown in figure 19 is 2 layers, the layering is very simple, and the new processing method provided by the application is more detailed than the layering of the old processing method and has high processing precision. However, the inflection point time of the lowest high-speed layer only differs by less than 2ms, and the high-speed top interface determined by the two methods also differs slightly (new 23.1 m-old 23.98m is-0.88 m), so the static correction value curves calculated by the two methods do not differ greatly, are similar to the change of a terrain curve, and have high reliability.

TABLE 5 comparison of data before and after the physical point adopts a new processing technique

The final purpose of the three-component surface structure survey is to construct a fine and accurate shear wave surface structure model. The conditions for constructing the fine and accurate transverse wave surface structure model are as follows: the transverse wave surface structure model established by the invention is just established based on the above thought, so that a fine and accurate transverse wave surface structure model can be established, and the accurate static correction value can be calculated.

The implementation of the above specific application is only an example, and the rest of the embodiments are not described in detail.

Based on the same inventive concept, embodiments of the present invention further provide a device for processing vertical and horizontal wave micro-logging data, wherein the principle of the problem solved by the device for processing vertical and horizontal wave micro-logging data is similar to that of the method for processing vertical and horizontal wave micro-logging data, so that the implementation of the device for processing vertical and horizontal wave micro-logging data can refer to the implementation of the method for processing vertical and horizontal wave micro-logging data, and the repeated parts are not repeated, and the specific structure is shown in fig. 20:

a filtering and first arrival picking module 2001, configured to perform band-pass filtering on the transverse wave micro-logging data of the target area, and then perform first arrival picking on the transverse wave micro-logging data to obtain longitudinal wave first arrival time data and transverse wave first arrival time data;

a velocity stratification module 2002, configured to process the longitudinal wave first arrival time data by using a linear fitting method, so as to obtain a longitudinal wave velocity stratification; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy;

the combined interpretation module 2003 is used for performing longitudinal and transverse wave combined interpretation according to the longitudinal wave velocity layering and the transverse wave velocity layering to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters;

and a longitudinal and transverse wave surface structure model establishing module 2004, configured to establish a longitudinal and transverse wave surface structure model of the target region according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters, and SPS result data of the target region.

In a specific embodiment, the speed layering module 2002 is specifically configured to:

Vs＝a_i+b_i×H

In specific implementation, the longitudinal and transverse wave surface layer structure model building module 2004 is specifically configured to:

In an embodiment, there is further provided a vertical and horizontal wave micro-logging data processing apparatus, as shown in fig. 21, on the basis of fig. 20, further comprising:

a profile preference module 2101 to:

and classifying and displaying the longitudinal waves and the transverse waves received by the receiving channels of the same type, filtering interference data of the longitudinal waves and the transverse waves in the same component window, and determining longitudinal and transverse wave micro-logging information of a target area.

In practical implementation, the apparatus for processing longitudinal and transverse wave micro-logging data shown in fig. 22 further includes, on the basis of fig. 20:

an excitation well depth determination module 2201 for:

In an embodiment, as shown in fig. 23, another embodiment of a method for processing a longitudinal-transverse wave micro-logging data, based on fig. 20, further includes:

a static correction amount calculation module 2301 to:

The embodiment of the invention also provides a computer readable storage medium which stores a computer program for executing the method for processing the longitudinal and transverse wave micro-logging data.

In summary, the method and apparatus for processing longitudinal and transverse wave micro-logging data provided by the embodiments of the present invention have the following advantages:

performing band-pass filtering on the transverse wave micro-logging data of the target area, and performing first arrival pickup on the transverse wave micro-logging data to obtain longitudinal wave first arrival time data and transverse wave first arrival time data; processing longitudinal wave first arrival time data by using a linear fitting method to obtain a longitudinal wave velocity hierarchy; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy; according to the longitudinal wave velocity layering and the transverse wave velocity layering, performing longitudinal and transverse wave joint interpretation to obtain longitudinal wave surface layer structure parameters and transverse wave surface layer structure parameters; and establishing a longitudinal and transverse wave surface structure model of the target area according to the longitudinal wave surface structure parameters, the transverse wave surface structure parameters and SPS result data of the target area. By carrying out band-pass filtering on the transverse wave micro-logging data of the target area, interference wave information in the transverse wave can be removed, and the precision and efficiency of the transverse wave first arrival picking-up are improved; longitudinal wave velocity layering and transverse wave layering are obtained by synchronously processing longitudinal wave and transverse wave micro-logging information, and longitudinal wave and transverse wave joint interpretation is carried out according to the longitudinal wave velocity layering and the transverse wave velocity layering, so that compared with a method for respectively interpreting longitudinal waves and transverse waves in the prior art, the condition of mutual contradiction between longitudinal wave interpretation results and transverse wave interpretation results can be eliminated, and the interpretation results are more accurate; due to the improvement of the accuracy of the interpretation result of the longitudinal and transverse wave data and the accuracy of the first arrival pick-up of the transverse wave, a more accurate longitudinal and transverse wave surface layer structure model can be established, so that the accuracy of the processing result of the longitudinal and transverse wave micro-logging data is improved.

As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, apparatus, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.

The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes may be made to the embodiment of the present invention by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for processing longitudinal and transverse wave micro-logging data is characterized by comprising the following steps:

processing longitudinal wave first arrival time data by using a linear fitting method to obtain a longitudinal wave velocity hierarchy; processing the shear wave first arrival time data by using a nonlinear fitting method to obtain a shear wave velocity hierarchy;

2. The method of claim 1, wherein processing shear wave first arrival time data using a non-linear fitting method to obtain a shear wave velocity hierarchy comprises:

Vs＝a_i+b_i×H

3. The method of claim 1, wherein establishing a compressional-shear wave surface structure model of the target region based on the compressional-shear wave surface structure parameters, the shear wave surface structure parameters, and SPS outcome data for the target region comprises:

4. The method of claim 1, wherein band-pass filtering the shear micro-log data of the target area further comprises:

5. The method of claim 1, further comprising:

6. The method of claim 1, further comprising:

7. A longitudinal and transverse wave micro-logging data processing device is characterized by comprising:

8. The apparatus of claim 7, wherein the speed stratification module is specifically configured to:

Vs＝a_i+b_i×H

9. The apparatus according to claim 7, wherein the longitudinal-transverse-wave surface structure modeling module is specifically configured to:

10. The apparatus of claim 7, further comprising: a profile optimization module to:

11. The apparatus of claim 7, further comprising: an excitation well depth determination module to:

12. The apparatus of claim 7, further comprising: a static correction amount calculation module to:

13. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method of any one of claims 1 to 6 when executing the computer program.

14. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program for executing the method of any one of claims 1 to 6.