CN112858850B - High-voltage module testing method for three-phase direct-current motor driving chip - Google Patents
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention relates to the technical field of semiconductor testing, in particular to a high-voltage module testing method of a three-phase direct current motor driving chip. The specific test method is as follows: s1: inserting and connecting a boosting module on the test carrier plate; s2: when the tested chip needs to be subjected to high-voltage impact tolerance test, transmitting a signal for starting the test to the boosting module; s3: the control chip controls the boosting module to perform high-voltage impact tolerance test; s4: when the high-voltage impact tolerance test is finished, the main control module transmits a signal for finishing the test to a control chip of the boosting module; s5: the control chip of the boosting module controls the relay in the boosting module to be connected with 5V voltage, and the boosting module stops working. Compared with the prior art, a boosting module circuit is inserted into a test carrier board of the existing logic automatic tester, and a +15V and-15V power supply differential feeding boosting module provided by the automatic tester is utilized to generate a 100V voltage source so as to finish high-voltage impact tolerance test of a chip.
Description
Technical Field
The invention relates to the technical field of semiconductor testing, in particular to a high-voltage module testing method of a three-phase direct current motor driving chip.
Background
The test of the three-phase direct current motor driving chip generally comprises two parts. The first part is a test of logic and timing: providing a 30kHz square wave by a digital test channel of an automatic tester, sending the square wave to three phase input pins of a tested chip, and simultaneously testing the square wave at a driving output end of the tested chip by using the digital test channel; the second part is the high pressure impact pressure test: because the tested chip is used for driving a direct current motor, three output ports need to examine the high voltage impact resistance of induced electromotive force caused by inductance effect which can occur when a coil load is loaded. High pressures of 100v,50ma are required to be provided by the automatic tester for a tolerance period of more than 20 mS. After power-down, the logic and the time sequence of the first part are repeatedly tested, so that the tested chip is ensured not to be broken down and damaged after high-voltage impact, and the tested chip can be regarded as qualified.
However, it is currently the case that the first part of the test is done on a logic-like automatic tester capable of providing logic and timing test resources; the second part of the test is performed on a power class automatic tester capable of high voltage impact tolerance test resources. And finally, transferring the tested chip subjected to the second part of test to a logic automatic testing machine again, and performing logic and time sequence test again to ensure whether the tested chip is broken down by high voltage or not, wherein the tested chip passes and is qualified after the three rounds of test, and otherwise, the tested chip is unqualified.
However, the general automatic logic test machine cannot provide high voltage impact tolerance test, and when testing the three-phase dc motor driving chip, the automatic logic test machine and the automatic power supply test machine must be equipped, which increases the testing complexity and the testing cost.
Disclosure of Invention
The invention provides a high-voltage module testing method for a three-phase direct current motor driving chip, which aims to overcome the defects of the prior art, a boosting module circuit is inserted into a testing carrier board of the prior logic automatic testing machine, and a +15V and-15V two-way application power differential feeding boosting module provided by the automatic testing machine is utilized to generate a voltage source of 100V so as to complete the high-voltage impact tolerance test of the chip, thereby realizing the logic and time sequence testing machine high-voltage impact tolerance test of the three-phase direct current motor driving chip completed by one automatic testing machine.
In order to achieve the above purpose, a high-voltage module testing method for a three-phase direct current motor driving chip is designed, which comprises a test carrier plate and is characterized in that: the specific test method is as follows:
S1: inserting and connecting a boosting module on a test carrier board of an automatic tester;
s2: when the tested chip needs to be subjected to high-voltage impact tolerance test, a main control module of the automatic testing machine transmits a signal for starting the test to a control chip of the boosting module;
S3: the control chip of the boosting module controls the relay in the boosting module to be connected with 0V voltage, and the boosting module outputs 100V voltage for the automatic tester to perform high-voltage impact tolerance test on the tested chip;
s4: when the high-voltage impact tolerance test is finished, the main control module of the automatic tester transmits a signal for finishing the test to the control chip of the boosting module;
S5: the control chip of the boosting module controls the relay in the boosting module to be connected with 5V voltage, and the boosting module stops working.
The booster module is internally provided with a booster circuit, the booster circuit comprises a control chip, a three-winding transformer, a relay, a transistor, a first wiring terminal and a second wiring terminal, a number 1 port of the control chip is divided into two paths, one path is respectively connected with one end of a fuse, one end of a capacitor I, one end of a capacitor II, one end of a resistor I and one end of a capacitor III, the other end of the fuse is respectively connected with one end of a TP2, one end of the resistor II and one end of the resistor III, the other end of the resistor III is connected with +15V voltage, the other end of the resistor II is grounded, the other ends of the capacitor I and the capacitor II are combined and connected with PT1 end and-15V voltage, and the other end of the capacitor III is connected with-15V voltage; the other path is respectively connected with an E1 end, a cathode of a voltage stabilizing diode I, one ends of a resistor IV and a resistor V, a port No. 3 of a three-winding transformer, one end of a capacitor IV and a port No. 5 of a control chip, the other end of the capacitor IV is connected with-15V voltage, the other ends of the resistor IV and the resistor V are combined and connected with one end of the capacitor V, and an anode of the voltage stabilizing diode I is connected with a port No. 2 of the three-winding transformer; the port No. 1 of the three-winding transformer is connected with the voltage of minus 15V, the port No. 5 of the three-winding transformer is respectively connected with the other end of the capacitor No. five, one end of the sliding resistor and the end D of the transistor, the other end of the sliding resistor is connected with one end of the resistor No. six, and the other end of the resistor No. six is connected with the port No. 16 of the control chip; the G end of the transistor is connected with one end of a resistor seven, and the other end of the resistor seven is connected with a No. 6 port of the control chip; the S1 end of the transistor is respectively connected with one end of a resistor eight, one end of a capacitor six and a No. 7 port of the control chip, and the other ends of the resistor eight and the capacitor six are respectively connected with-15V voltage; the No. 6 port of the three-winding transformer is connected with the anode of the second voltage stabilizing diode, and the cathode of the second voltage stabilizing diode is respectively connected with the No. 5 port and the No. 6 port of the seventh end of the capacitor, the eighth end of the capacitor, the ninth end of the resistor, the tenth end of the resistor, the eleventh end of the resistor, the twelfth end of the resistor, the thirteenth end of the resistor, +100V voltage, the TP3 port and the first connecting terminal; the port 10 of the three-winding transformer is respectively connected with the other end of the capacitor seven, the other end of the capacitor eight, the other end of the capacitor nine, the other end of the resistor ten, the other end of the resistor eleven, the other end of the resistor twelve, the other end of the resistor thirteen, +100V voltage, the port TP4 and the port 11 and the port 12 of the connecting terminal I; the port No. 3 of the control chip is respectively connected with the other end of the resistor I, the port No. 2 of the relay and one end of the resistor fourteen, and the other end of the resistor fourteen is respectively connected with-15V voltage; the port 1 of the relay is connected with +5V voltage, the port 3 of the relay is connected with-15V voltage, the port 8 of the relay is respectively connected with the port E2 and the port 3 of the wiring terminal II, the port 1 of the wiring terminal II is connected with +5V voltage, the ports 2, 4, 6 and 8 of the wiring terminal II are connected with ground, the ports 5 and 7 of the wiring terminal II are connected with +12V voltage, the ports 11 and 13 of the wiring terminal II are connected with +15V voltage, the ports 17 and 19 of the wiring terminal II are connected with-15V voltage in a combined manner, and the ports 12, 14, 16, 18 and 20 of the wiring terminal II are connected with ground; the No. 10 port of the control chip is connected with one end of a capacitor ten, and the other end of the capacitor ten is connected with-15V voltage; the No. 12 port of the control chip is connected with one end of a resistor fifteen, and the other end of the resistor fifteen is connected with-15V voltage; the 11 # port of the control chip is respectively connected with one end of a capacitor eleven and one end of a resistor sixteen, the other end of the capacitor eleven is connected with-15V voltage, the other end of the resistor sixteen is connected with one end of a capacitor twelve, and the other end of the capacitor twelve is connected with-15V voltage; the 8 # and 9 # ports of the control chip are combined and connected with-15V voltage.
The type of the relay is G6K-2G5VDC.
The model of the chip is LT3748.
The model of the transistor is FDMC2674.
The first connecting terminal is ZSS-108-01-F-D-540-LL.
The second connecting terminal is ZSS-110-01-F-D-540-LL.
Compared with the prior art, the invention provides a high-voltage module testing method of a three-phase direct current motor driving chip, which is characterized in that a boosting module circuit is inserted into a testing carrier board of the existing logic automatic testing machine, and a +15V and-15V power supply differential feeding boosting module provided by the automatic testing machine is utilized to generate a 100V voltage source so as to finish the high-voltage impact tolerance test of the chip, so that one automatic testing machine can finish the logic and time sequence testing machine high-voltage impact tolerance test of the three-phase direct current motor driving chip, and the testing flow and the testing cost are simplified.
Drawings
Fig. 1 is a schematic diagram of a three-phase dc motor driving chip.
Fig. 2 is a test flow chart of a three-phase dc motor driving chip.
FIG. 3 is a flow chart of the test of the present invention.
FIG. 4 is a schematic diagram of a test carrier board.
Fig. 5 is a circuit diagram of the boost module.
Detailed Description
The invention is further described below with reference to the accompanying drawings.
As shown in fig. 1, the test of the three-phase dc motor driving chip generally includes two parts. The first part is a test of logic and timing: providing a 30kHz square wave by a digital test channel of an automatic tester, sending the square wave to three phase input pins of a tested chip, and simultaneously testing the square wave at a driving output end of the tested chip by using the digital test channel; the second part is the high pressure impact pressure test: because the tested chip is used for driving a direct current motor, three output ports need to examine the high voltage impact resistance of induced electromotive force caused by inductance effect which can occur when a coil load is loaded. High pressures of 100v,50ma are required to be provided by the automatic tester for a tolerance period of more than 20 mS. After power-down, the logic and the time sequence of the first part are repeatedly tested, so that the tested chip is ensured not to be broken down and damaged after high-voltage impact, and the tested chip can be regarded as qualified.
As shown in fig. 2, in the test process of a general three-phase dc motor driving chip, the test of the first part is completed on a logic-type automatic test machine capable of providing logic and time sequence test resources; the second part of the test is performed on a power class automatic tester capable of high voltage impact tolerance test resources. And finally, transferring the tested chip subjected to the second part of test to a logic automatic testing machine again, and performing logic and time sequence test again to ensure whether the tested chip is broken down by high voltage or not, wherein the tested chip passes and is qualified after the three rounds of test, and otherwise, the tested chip is unqualified.
As shown in fig. 3 and 4, the test carrier board and the automatic tester adopted in the invention are independently developed by the semiconductor technology (Shanghai) limited company of shengk. A high-voltage module test method of a three-phase direct current motor driving chip comprises the following steps:
S1: inserting and connecting a boosting module on a test carrier board of an automatic tester;
s2: when the tested chip needs to be subjected to high-voltage impact tolerance test, a main control module of the automatic testing machine transmits a signal for starting the test to a control chip of the boosting module;
S3: the control chip of the boosting module controls the relay in the boosting module to be connected with 0V voltage, and the boosting module outputs 100V voltage for the automatic tester to perform high-voltage impact tolerance test on the tested chip;
s4: when the high-voltage impact tolerance test is finished, the main control module of the automatic tester transmits a signal for finishing the test to the control chip of the boosting module;
S5: the control chip of the boosting module controls the relay in the boosting module to be connected with 5V voltage, and the boosting module stops working.
As shown in FIG. 5, a boost circuit is arranged in the boost module, the boost circuit comprises a control chip U1, a three-winding transformer, a relay K1, a transistor Q1, a first connecting terminal J1 and a second connecting terminal J2, the number 1 port of the control chip U1 is divided into two paths, one path is respectively connected with one end of a fuse F1, one end of a capacitor C2, one end of a resistor R3 and one end of a capacitor C12, the other end of the fuse F1 is respectively connected with one end of TP2, one end of a resistor R19 and one end of a resistor R26, the other end of the resistor R26 is connected with +15V voltage, the other end of the resistor R19 is grounded, the other ends of the capacitor C1 and the capacitor C2 are combined and connected with PT1 end and-15V voltage, the other end of the capacitor three C12 is connected with-15V voltage; the other path is respectively connected with the E1 end, the cathode of a voltage stabilizing diode D3, one end of a resistor IV R24 and a resistor V R25, the No. 3 port of the three-winding transformer, one end of a capacitor IV C16 and the No. 5 port of a control chip U1, the other end of the capacitor IV C16 is connected with-15V voltage, the other ends of the resistor IV R24 and the resistor V R25 are combined and connected with one end of a capacitor V C17, and the anode of the voltage stabilizing diode D3 is connected with the No. 2 port of the three-winding transformer; the port 1 of the three-winding transformer is connected with the voltage of minus 15V, the port 5 of the three-winding transformer is respectively connected with the other end of the capacitor five C17, one end of the sliding resistor R18 and the D end of the transistor Q1, the other end of the sliding resistor R18 is connected with one end of the resistor six R7, and the other end of the resistor six R7 is connected with the port 16 of the control chip U1; the G end of the transistor Q1 is connected with one end of a resistor seven R12, and the other end of the resistor seven R12 is connected with a No. 6 port of the control chip U1; the S1 end of the transistor Q1 is respectively connected with one end of the resistor eight R10, one end of the capacitor six C15 and the No. 7 port of the control chip U1, and the other ends of the resistor eight R10 and the capacitor six C15 are respectively connected with-15V voltage; the port No. 6 of the three-winding transformer is connected with the anode of a voltage stabilizing diode II D1, and the cathode of the voltage stabilizing diode II D1 is respectively connected with one end of a capacitor seven C4, one end of a capacitor eight C3, one end of a capacitor nine C18, one end of a resistor nine R23, one end of a resistor ten R4, one end of a resistor eleven R20, one end of a resistor twelve R21, one end of a resistor thirteen R22, +100V voltage, a TP3 port and the ports No. 5 and No. 6 of a connecting terminal J1; the port 10 of the three-winding transformer is respectively connected with the other end of a capacitor seven C4, the other end of a capacitor eight C3, the other end of a capacitor nine C18, the other end of a resistor nine R23, the other end of a resistor ten R4, the other end of a resistor eleven R20, the other end of a resistor twelve R21, the other end of a resistor thirteen R22, +100V voltage, the port TP4 and the port 11 and the port 12 of a connecting terminal J1; the port No. 3 of the control chip U1 is respectively connected with the other end of the resistor R3, the port No. 2 of the relay K1 and one end of the resistor fourteen R6, and the other end of the resistor fourteen R6 is respectively connected with-15V voltage; the port 1 of the relay K1 is connected with +5V voltage, the port 3 of the relay K1 is connected with-15V voltage, the port 8 of the relay K1 is respectively connected with the port E2 and the port 3 of the wiring terminal II J2, the port 1 of the wiring terminal II J2 is connected with +5V voltage, the ports 2, 4, 6 and 8 of the wiring terminal II J2 are connected with ground, the ports 5 and 7 of the wiring terminal II J2 are connected with +12V voltage, the ports 11 and 13 of the wiring terminal II J2 are connected with +15V voltage, the ports 17 and 19 of the wiring terminal II J2 are connected with-15V voltage, the port 12 of the wiring terminal II J2, 14. Ports 16, 18 and 20 are connected with ground; the No. 10 port of the control chip U1 is connected with one end of a capacitor ten C7, and the other end of the capacitor ten C7 is connected with-15V voltage; the No. 12 port of the control chip U1 is connected with one end of a resistor fifteenR 9, and the other end of the resistor fifteenR 9 is connected with-15V voltage; the 11 # port of the control chip U1 is respectively connected with one end of a capacitor eleven C8 and one end of a resistor sixteen R1, the other end of the capacitor eleven C8 is connected with-15V voltage, the other end of the resistor sixteen R1 is connected with one end of a capacitor twelve C11, and the other end of the capacitor twelve C11 is connected with-15V voltage; the port No. 8 and the port No. 9 of the control chip U1 are combined and connected with the voltage of-15V.
The TP1 end, the TP2 end, the TP3 end, the TP4 end, the E1 end and the E2 end are observation points of the circuit, which is a common method for circuit design, and the test points are prevented at the needed signal nodes, so that the later debugging is convenient. For example, TP2, the test point, the voltmeter should be able to see a +15V voltage reading during circuit debug.
The type of the relay K1 is G6K-2G5VDC.
The model of the chip U1 is LT3748.
The transistor Q1 is of the type FDMC2674.
The type of the wiring terminal J1 is ZSS-108-01-F-D-540-LL.
The type of the wiring terminal II J2 is ZSS-110-01-F-D-540-LL.
The relay here functions to control the switching of the 100V boost circuit. The power supply terminal (pin 1) of the control coil of the relay is connected to +5v. When the control end (pin 8) of the relay is 0V, the control coil of the relay has current to generate electromagnetic field to pull the blades of the pin 3 and the pin 6 and disconnect the pin 3 from the pin 2, so that the voltage of-15V is disconnected from the control pin 3 (EN/UVLO) of the boost chip U1, and the work of the U1 is started. When the control end (pin 8) of the relay is in a suspended high-resistance state (which is equivalent to that no voltage difference exists between two ends of the control coil of the relay), the control coil of the relay does not pass through current, and cannot generate an electromagnetic field, so that a knife switch in the relay can be reset, the pin 3 is connected to the pin 2, and accordingly-15V is loaded to the control pin 3 of the boost chip U1, and the boost circuit is closed.
The invention can replace the test scheme of various machine combinations of the traditional scheme by utilizing +/-15V of an application power supply provided by an automatic test machine independently researched and developed by Shengdak and adding a group of controllable boosting modules.
Claims (6)
1. The high-voltage module testing method of the three-phase direct current motor driving chip comprises a testing carrier plate and is characterized in that: the specific test method is as follows:
S1: inserting and connecting a boosting module on a test carrier board of an automatic tester;
s2: when the tested chip needs to be subjected to high-voltage impact tolerance test, a main control module of the automatic testing machine transmits a signal for starting the test to a control chip of the boosting module;
S3: the control chip of the boosting module controls the relay in the boosting module to be connected with 0V voltage, and the boosting module outputs 100V voltage for the automatic tester to perform high-voltage impact tolerance test on the tested chip;
s4: when the high-voltage impact tolerance test is finished, the main control module of the automatic tester transmits a signal for finishing the test to the control chip of the boosting module;
S5: the control chip of the boosting module controls the relay in the boosting module to be connected with 5V voltage, and the boosting module stops working;
The boost module is internally provided with a boost circuit, the boost circuit comprises a control chip (U1), a three-winding transformer, a relay (K1), a transistor (Q1), a first connecting terminal (J1) and a second connecting terminal (J2), the No. 1 port of the control chip (U1) is divided into two paths, one path is respectively connected with one end of a fuse (F1), one end of a capacitor I (C1), one end of a capacitor II (C2), one end of a resistor I (R3) and one end of a capacitor III (C12), the other end of the fuse (F1) is respectively connected with one end of a TP2, one end of a resistor II (R19) and one end of a resistor III (R26), the other end of the resistor III (R26) is connected with +15V voltage, the other end of the resistor II (R19) is grounded, the other ends of the capacitor I (C1) and the capacitor II (C2) are connected with the TP1 end and the-15V voltage in a combined mode, and the other end of the capacitor III (C12) is connected with the-15V voltage; the other path is respectively connected with an E1 end, a cathode of a voltage stabilizing diode I (D3), one end of a resistor IV (R24) and one end of a resistor V (R25), a port No. 3 of a three-winding transformer, one end of a capacitor IV (C16) and a port No. 5 of a control chip (U1), the other end of the capacitor IV (C16) is connected with-15V voltage, the other ends of the resistor IV (R24) and the resistor V (R25) are combined and connected with one end of the capacitor V (C17), and an anode of the voltage stabilizing diode I (D3) is connected with a port No. 2 of the three-winding transformer; the port 1 of the three-winding transformer is connected with the voltage of minus 15V, the port 5 of the three-winding transformer is respectively connected with the other end of a capacitor five (C17), one end of a sliding resistor (R18) and the D end of a transistor (Q1), the other end of the sliding resistor (R18) is connected with one end of a resistor six (R7), and the other end of the resistor six (R7) is connected with the port 16 of a control chip (U1); the G end of the transistor (Q1) is connected with one end of a resistor seven (R12), and the other end of the resistor seven (R12) is connected with a No. 6 port of the control chip (U1); the S1 end of the transistor (Q1) is respectively connected with one end of a resistor eight (R10), one end of a capacitor six (C15) and a No. 7 port of the control chip (U1), and the other ends of the resistor eight (R10) and the capacitor six (C15) are respectively connected with-15V voltage; the port 6 of the three-winding transformer is connected with the anode of a voltage stabilizing diode II (D1), and the cathode of the voltage stabilizing diode II (D1) is respectively connected with one end of a capacitor seven (C4), one end of a capacitor eight (C3), one end of a capacitor nine (C18), one end of a resistor nine (R23), one end of a resistor ten (R4), one end of a resistor eleven (R20), one end of a resistor twelve (R21), one end of a resistor thirteen (R22), +100deg.V voltage, a TP3 port and the ports 5 and 6 of a connecting terminal I (J1); the port 10 of the three-winding transformer is respectively connected with the other end of a capacitor seven (C4), the other end of a capacitor eight (C3), the other end of a capacitor nine (C18), the other end of a resistor nine (R23), the other end of a resistor ten (R4), the other end of a resistor eleven (R20), the other end of a resistor twelve (R21), the other end of a resistor thirteen (R22), +100deg.V voltage, a TP4 port and 11 and 12 ports of a connecting terminal one (J1); the port No. 3 of the control chip (U1) is respectively connected with the other end of the resistor I (R3), the port No. 2 of the relay (K1) and one end of the resistor fourteen (R6), and the other end of the resistor fourteen (R6) is respectively connected with-15V voltage; the port 1 of the relay (K1) is connected with +5V voltage, the port 3 of the relay (K1) is connected with-15V voltage, the port 8 of the relay (K1) is respectively connected with the port E2 and the port 3 of the wiring terminal II (J2), the port 1 of the wiring terminal II (J2) is connected with +5V voltage, the ports 2, 4, 6 and 8 of the wiring terminal II (J2) are connected with ground, the ports 5 and 7 of the wiring terminal II (J2) are connected with +12V voltage in a combined way, the ports 11 and 13 of the wiring terminal II (J2) are connected with +15V voltage in a combined way, the ports 17 and 19 of the wiring terminal II (J2) are connected with-15V voltage in a combined way, ports 12, 14, 16, 18 and 20 of the wiring terminal II (J2) are connected with the ground; the 10 # port of the control chip (U1) is connected with one end of a capacitor ten (C7), and the other end of the capacitor ten (C7) is connected with-15V voltage; the 12 # port of the control chip (U1) is connected with one end of a resistor fifteen (R9), and the other end of the resistor fifteen (R9) is connected with-15V voltage; the 11 # port of the control chip (U1) is respectively connected with one end of a capacitor eleven (C8) and one end of a resistor sixteen (R1), the other end of the capacitor eleven (C8) is connected with-15V voltage, the other end of the resistor sixteen (R1) is connected with one end of a capacitor twelve (C11), and the other end of the capacitor twelve (C11) is connected with-15V voltage; the port No. 8 and the port No. 9 of the control chip (U1) are combined and connected with the voltage of-15V.
2. The method for testing a high-voltage module of a three-phase direct current motor driving chip according to claim 1, wherein the method comprises the following steps: the type of the relay (K1) is G6K-2G5VDC.
3. The method for testing a high-voltage module of a three-phase direct current motor driving chip according to claim 1, wherein the method comprises the following steps: the model of the chip (U1) is LT3748.
4. The method for testing a high-voltage module of a three-phase direct current motor driving chip according to claim 1, wherein the method comprises the following steps: the type of the transistor (Q1) is FDMC2674.
5. The method for testing a high-voltage module of a three-phase direct current motor driving chip according to claim 1, wherein the method comprises the following steps: the type of the wiring terminal I (J1) is ZSS-108-01-F-D-540-LL.
6. The method for testing a high-voltage module of a three-phase direct current motor driving chip according to claim 1, wherein the method comprises the following steps: the type of the wiring terminal II (J2) is ZSS-110-01-F-D-540-LL.
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| CN202110026577.XA CN112858850B (en) | 2021-01-08 | 2021-01-08 | High-voltage module testing method for three-phase direct-current motor driving chip |
| TW110130142A TWI799947B (en) | 2021-01-08 | 2021-08-16 | High-voltage module test method for three-phase dc motor drive chips |
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| CN202110026577.XA CN112858850B (en) | 2021-01-08 | 2021-01-08 | High-voltage module testing method for three-phase direct-current motor driving chip |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN112858850A (en) | 2021-05-28 |
| TWI799947B (en) | 2023-04-21 |
| TW202227845A (en) | 2022-07-16 |
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