CN112834896A - Integrated circuit test system and test method thereof - Google Patents
Integrated circuit test system and test method thereof Download PDFInfo
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- CN112834896A CN112834896A CN202011543831.5A CN202011543831A CN112834896A CN 112834896 A CN112834896 A CN 112834896A CN 202011543831 A CN202011543831 A CN 202011543831A CN 112834896 A CN112834896 A CN 112834896A
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- 238000010998 test method Methods 0.000 title claims description 10
- 230000002159 abnormal effect Effects 0.000 claims abstract description 19
- 238000011056 performance test Methods 0.000 claims abstract description 5
- 238000007781 pre-processing Methods 0.000 claims description 35
- 230000006854 communication Effects 0.000 claims description 25
- 238000004891 communication Methods 0.000 claims description 25
- 238000012544 monitoring process Methods 0.000 claims description 22
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- 238000005516 engineering process Methods 0.000 claims description 3
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- 230000007547 defect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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Abstract
The invention belongs to the technical field of integrated circuit performance testing, and particularly relates to an integrated circuit testing system and a testing method thereof. The invention adopts two testing machines to carry out performance test on the single-function circuit of the same integrated circuit in sequence, and takes the average value of the test data of two groups of related single-function circuits according to the arithmetic average index so as to improve the accuracy of the test result, and judges whether the test data of the two testing machines are abnormal or not according to the standard reference model so as to ensure the reliability of the test data.
Description
Technical Field
The invention relates to the technical field of integrated circuit performance testing, in particular to an integrated circuit testing system and a testing method thereof.
Background
In the technical field of integrated circuits, almost all chips need to be strictly tested in many links before entering the market, and each link can generate massive information data, including chip complete set number test related information such as integration verification data, functional performance test data, test conditions, test environment information and the like.
The last step in the semiconductor integrated circuit fabrication process is to place the packaged chip in various environments to test its electrical properties, such as response time, power consumption, accuracy and noise, operating speed, voltage withstand, etc. In the existing testing method, various performances of an integrated circuit are tested by a testing machine, that is, a testing result obtained after the testing by the testing machine is used as a performance judgment basis, so that the performance of each functional circuit in the integrated circuit is judged to be good or bad, and then the yield is obtained according to the judgment result. The test system and the test method applied to the integrated circuit have the defects of insufficient accuracy and reliability, the method is easily influenced by the subjectivity of the tester when testing the functional circuit, when a certain test functional circuit of the tester has an error, the accuracy of the test result of the integrated circuit is influenced, and the test result obtained by the test of the tester also has an error.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides an integrated circuit test system and a test method thereof, which solve the problems of insufficient accuracy and reliability of the existing test system and test method applied to integrated circuit test.
(II) technical scheme
In order to achieve the purpose, the invention provides the following technical scheme: the integrated circuit testing system comprises a first testing machine, a second testing machine, an industrial personal computer, a monitoring station, a client and a cloud server, wherein the first testing machine and the second testing machine are used for sequentially testing the performance of a single-function circuit of the same integrated circuit respectively, the first testing machine and the second testing machine are connected with the industrial personal computer respectively, the industrial personal computer is in communication interaction with the monitoring station, the monitoring station is in communication interaction with the client and the cloud server respectively, the monitoring station comprises a main controller, a preprocessing server, a storage module, an alarm module, a communication module and a database storing a standard reference model, the main controller is in two-way communication interaction with the preprocessing server, the storage module, the alarm module and the communication module are electrically connected with the main controller respectively, and the preprocessing server is connected with the database.
As a preferred technical scheme of the invention, the industrial personal computer and the main controller are linked by RS 485-Ethernet, so that bidirectional transparent transmission between the RS 485/serial port and the Ethernet is realized.
As a preferred technical solution of the present invention, the communication module adopts a 4G communication technology.
As a preferred technical solution of the present invention, the preprocessing server is configured to receive front-end data received via the master controller, extract a standard reference model in the database as a reference, and preprocess the front-end data.
As a preferred technical solution of the present invention, when the first tester and the second tester test the single-function circuit of the integrated circuit, the test conditions and the test environments of the single-function circuit of the integrated circuit in the test link are consistent.
As a preferred technical solution of the present invention, the monitoring station further includes a display module, the display module is electrically connected to the main controller, and the display module is configured to display data information measured by the first testing machine and the second testing machine.
The invention also provides a test method of the integrated circuit test system, which comprises the following steps:
step S1: testing the relevant functional circuit of the integrated circuit according to the customer requirement of the client;
step S2: sequentially sending test starting signals to a first test machine and a second test machine through an industrial personal computer, sequentially testing the performance of a single functional circuit of the same integrated circuit, and sequentially testing a plurality of functional circuits to be tested to respectively test a data A signal and a data B signal;
step S3: the industrial personal computer receives the measured data A signal and data B signal, and realizes the two-way communication between the industrial personal computer and the monitoring station through RS 485-Ethernet link;
step S4: the main controller in the monitoring station receives and transmits the data A signal and the data B signal to the preprocessing server, the preprocessing server extracts a standard reference model in a database, and judges whether the test data of the first testing machine and the second testing machine are abnormal or not according to the standard reference model;
step S5: when the test data of the first test machine and the second test machine are normal, the preprocessing server respectively performs mean value calculation preprocessing on the test data of the related single-function circuit in the data A and the data B according to the arithmetic mean value index, and transmits the original data and the processed data to the main controller; after the main controller finishes storage through the storage module, the original data and the processed data are transmitted to the cloud server through the communication module, and the cloud server integrates and finally deploys the data;
step S6: when one of the test data of the first test machine and the second test machine is abnormal, the main controller receives an abnormal data alarm signal sent by the preprocessing server, and then sound and light alarm is carried out through the alarm module.
(III) advantageous effects
Compared with the prior art, the invention provides an integrated circuit test system and a test method thereof, which have the following beneficial effects:
the integrated circuit test system and the test method thereof adopt two test machines to carry out performance test on the single function circuit of the same integrated circuit in sequence, on one hand, the average value of the test data of two groups of relevant single function circuits is taken according to the index of the arithmetic average value to improve the accuracy of the test result, on the other hand, whether the test data of the two test machines are abnormal is judged according to the standard reference model, and the abnormal alarm is carried out when the test result of one test machine is abnormal, so that the deviation of the test result measured by adopting one test machine in the prior art is avoided, and the reliability of the test data is ensured.
Drawings
FIG. 1 is a system schematic block diagram of an integrated circuit test system according to the present invention;
FIG. 2 is a schematic block diagram of a system of a monitoring station of the present invention;
FIG. 3 is a schematic diagram of a testing method of an integrated circuit testing system according to the present invention.
In the figure: 1. a first tester; 2. a second testing machine; 3. an industrial personal computer; 4. a monitoring station; 401. a master controller; 402. a preprocessing server; 403. a storage module; 404. an alarm module; 405. a communication module; 406. a database; 5. a client; 6. and (4) a cloud server.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Examples
Referring to fig. 1-3, the present invention provides the following technical solutions: an integrated circuit testing system comprises a first testing machine 1, a second testing machine 2, an industrial personal computer 3, a monitoring station 4, a client 5 and a cloud server 6, wherein the first testing machine 1 and the second testing machine 2 are used for sequentially testing the performance of a single-function circuit of the same integrated circuit respectively, the first testing machine 1 and the second testing machine 2 are respectively connected with the industrial personal computer 3, the industrial personal computer 3 is in communication interaction with the monitoring station 4, the monitoring station 4 is in communication interaction with the client 5 and the cloud server 6 respectively, the monitoring station 4 comprises a main controller 401, a preprocessing server 402, a storage module 403, an alarm module 404, a communication module 405 and a database 406 storing a standard reference model, the main controller 401 and the preprocessing server 402 are in bidirectional communication interaction, the storage module 403, the alarm module 404 and the communication module 405 are respectively electrically connected with the main controller 401, and the preprocessing server 402 is connected with the database 406.
Specifically, the industrial personal computer 3 is linked with the main controller 401 through RS 485-Ethernet, and bidirectional transparent transmission between an RS232/485 serial port and the Ethernet is achieved.
In this embodiment, RS485 changes ethernet link and RS485 changes ethernet module promptly, and industrial computer 3 all possesses the RS485 serial ports with master controller 401, can transmit information to monitor station 4 through industrial computer 3, also can transmit instruction information for industrial computer 3 through monitor station 4, realizes the bidirectional transmission between industrial computer 3 and master controller 401.
Specifically, the communication module 405 adopts a 4G communication technology.
Specifically, the preprocessing server 402 is configured to receive front-end data received via the master 401, extract a standard reference model in the database 406 as a reference, and perform preprocessing on the front-end data.
In this embodiment, the database 406 mainly provides a standard reference model for the preprocessing server 402, and determines the received test data from the first test machine 1 and the second test machine 2 through the preprocessing server 402 according to the standard reference model to determine whether the test result of the single-function circuit speed measurement data of the same integrated circuit in the two sets of data is abnormal, and when the test result is normal, the preprocessing server 402 performs mean calculation preprocessing on the related single-function circuit test data in the data a and the data B respectively according to an arithmetic mean index; when the test result is abnormal, the main controller 401 receives an abnormal data alarm signal sent by the preprocessing server 402, and then the alarm module 404 performs sound and light alarm.
Specifically, when the first testing machine 1 and the second testing machine 2 test the single-function circuit of the integrated circuit, the test conditions and the test environments of the single-function circuit of the integrated circuit in the test link are consistent.
In this embodiment, when testing a single-function circuit of an integrated circuit, it is necessary to ensure that the test conditions and the test environments of the single-function circuit of the integrated circuit in the test link are consistent, so as to ensure the accuracy and reliability of the test results of the same function circuit by two testing machines.
Specifically, the monitoring station 4 further includes a display module, the display module is electrically connected to the main controller 401, and the display module is configured to display data information measured by the first testing machine 1 and the second testing machine 2.
In this embodiment, the display module is a display, and the display can be used for visually displaying the data obtained by the test on a screen so as to be convenient for a worker to look up.
The invention also provides a test method of the integrated circuit test system, which comprises the following steps:
step S1: testing the related functional circuit of the integrated circuit according to the customer requirements of the customer terminal 5;
step S2: the industrial personal computer 3 sequentially sends test starting signals to the first testing machine 1 and the second testing machine 2, sequentially performs performance testing on a single functional circuit of the same integrated circuit, and respectively measures a data A signal and a data B signal after sequentially completing the testing of a plurality of functional circuits to be tested;
step S3: the industrial personal computer 3 receives the measured data A signal and data B signal, and bidirectional communication between the industrial personal computer 3 and the monitoring station 4 is realized through RS 485-Ethernet link;
step S4: the main controller 401 in the monitoring station 4 receives and transmits the data a signal and the data B signal to the preprocessing server 402, the preprocessing server 402 extracts a standard reference model in the database 406, and judges whether the test data of the first testing machine 1 and the second testing machine 2 are abnormal or not by referring to the standard reference model;
step S5: when the test data of the first test machine 1 and the second test machine 2 are normal, the preprocessing server 402 respectively performs mean calculation preprocessing on the test data of the single-function circuit related to the data A and the data B according to the arithmetic mean index, and transmits the original data and the processed data to the main controller 401; after the main controller 401 finishes storing through the storage module 403, the original data and the processed data are transmitted to the cloud server 6 through the communication module 405, and the cloud server 6 integrates and finally deploys the data;
step S6: when one of the test data of the first test machine 1 and the second test machine 2 is abnormal, the main controller 401 receives an abnormal data alarm signal sent by the preprocessing server 402, and then the alarm module 404 performs sound and light alarm.
The invention adopts two testing machines to carry out performance test on the single function circuit of the same integrated circuit in sequence, on one hand, the average value of the test data of two groups of related single function circuits is taken according to the arithmetic average index to improve the accuracy of the test result, on the other hand, whether the test data of the two testing machines are abnormal is judged according to the standard reference model, and the abnormal alarm is carried out when the test result of one testing machine is abnormal, so that the deviation of the test result measured by adopting one testing machine in the prior art is avoided, and the reliability of the test data is ensured.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. The utility model provides an integrated circuit test system, includes first test machine (1), second test machine (2), industrial computer (3), control station (4), customer end (5) and cloud ware (6), its characterized in that: the first testing machine (1) and the second testing machine (2) are used for sequentially testing the performance of a single-function circuit of the same integrated circuit, the first testing machine (1) and the second testing machine (2) are respectively connected with an industrial personal computer (3), the industrial personal computer (3) is in communication interaction with a monitoring station (4), the monitoring station (4) is in communication interaction with a client (5) and a cloud server (6), the monitoring station (4) is composed of a main controller (401), a preprocessing server (402), a storage module (403), an alarm module (404), a communication module (405) and a database (406) storing a standard reference model, the main controller (401) is in bidirectional communication interaction with the preprocessing server (402), and the storage module (403), the alarm module (404) and the communication module (405) are respectively electrically connected with the main controller (401), the preprocessing server (402) is connected to a database (406).
2. The integrated circuit test system of claim 1, wherein: and the industrial personal computer (3) is linked with the main controller (401) by adopting RS 485-Ethernet to realize bidirectional transparent transmission between an RS232/485 serial port and the Ethernet.
3. The integrated circuit test system of claim 1, wherein: the communication module (405) adopts a 4G communication technology.
4. The integrated circuit test system of claim 1, wherein: the preprocessing server (402) is used for receiving the front-end data received by the master controller (401), extracting a standard reference model in the database (406) as a reference, and preprocessing the front-end data.
5. The integrated circuit test system of claim 1, wherein: when the first testing machine (1) and the second testing machine (2) test the single-function circuit of the integrated circuit, the test conditions and the test environments of the single-function circuit of the integrated circuit in the test link are consistent.
6. The integrated circuit test system of claim 1, wherein: the monitoring station (4) further comprises a display module, the display module is electrically connected with the main controller (401), and the display module is used for displaying data information measured by the first testing machine (1) and the second testing machine (2).
7. A method of testing an integrated circuit test system according to any of claims 1 to 6, characterized by: the method comprises the following steps:
step S1: testing the related functional circuit of the integrated circuit according to the customer requirements of the customer terminal (5);
step S2: sequentially sending a test starting signal to a first test machine (1) and a second test machine (2) through an industrial personal computer (3), sequentially carrying out performance test on a single functional circuit of the same integrated circuit, and respectively measuring a data A signal and a data B signal after sequentially completing the test of a plurality of functional circuits to be tested;
step S3: the industrial personal computer (3) receives the measured data A signal and data B signal, and the two-way communication between the industrial personal computer (3) and the monitoring station (4) is realized through RS 485-Ethernet link;
step S4: a master controller (401) in the monitoring station (4) receives and transmits the data A signal and the data B signal to a preprocessing server (402), the preprocessing server (402) extracts a standard reference model in a database (406), and judges whether the test data of the first test machine (1) and the second test machine (2) are abnormal or not by referring to the standard reference model;
step S5: when the test data of the first test machine (1) and the second test machine (2) are normal, the preprocessing server (402) respectively carries out mean value calculation preprocessing on the test data of the single-function circuit related to the data A and the data B according to the arithmetic mean value index, and transmits the original data and the processed data to the main controller (401); after the main controller (401) finishes storing through the storage module (403), the original data and the processed data are transmitted to the cloud server (6) through the communication module (405), and the cloud server (6) integrates and finally deploys the data;
step S6: when one of the test data of the first test machine (1) and the second test machine (2) is abnormal, the main controller (401) receives an abnormal data alarm signal sent by the preprocessing server (402), and then the alarm module (404) performs sound and light alarm.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011543831.5A CN112834896A (en) | 2020-12-23 | 2020-12-23 | Integrated circuit test system and test method thereof |
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| CN202011543831.5A CN112834896A (en) | 2020-12-23 | 2020-12-23 | Integrated circuit test system and test method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866595A (en) * | 2021-09-09 | 2021-12-31 | 安徽亿普拉斯科技有限公司 | Integrated circuit test equipment and test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866595A (en) * | 2021-09-09 | 2021-12-31 | 安徽亿普拉斯科技有限公司 | Integrated circuit test equipment and test system |
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Application publication date: 20210525 |