CN112834480A - Confocal Raman system for high-pressure normal-temperature and low-temperature experiments and measurement method thereof - Google Patents
Confocal Raman system for high-pressure normal-temperature and low-temperature experiments and measurement method thereof Download PDFInfo
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Abstract
The invention discloses a confocal Raman system for high-pressure normal-temperature and low-temperature experiments and a measurement method thereof, wherein the system comprises an excitation module, a normal-temperature imaging module, a low-temperature imaging module and a signal collection module; the excitation module mainly comprises a Raman excitation light source, a narrow band filter, a beam expanding lens group and a plane reflector; the normal temperature imaging module mainly comprises a normal temperature microscopic imaging CCD, a normal temperature imaging light source, a half-reflecting and half-transmitting lens and a normal temperature microscope objective lens; the low-temperature imaging module mainly comprises a low-temperature imaging light source, a low-temperature imaging CCD, a low-temperature microscope objective lens and a half-reflecting and half-transmitting mirror; the signal collection module mainly comprises a Bragg diffraction grating, a plano-convex lens, a pinhole baffle and a Raman spectrometer. The invention integrates the low-temperature Raman measurement system and the normal-temperature Raman system together, realizes the sharing of most light paths, thereby greatly simplifying the complexity of the system, reducing the cost and improving the stability and reliability of the system.
Description
Technical Field
The invention belongs to the field of optical instruments, and particularly relates to a confocal Raman system for high-pressure normal-temperature and low-temperature experiments and a measurement method thereof.
Background
Raman spectroscopy (Raman spectra) is a scattering spectrum, the Raman effect was first discovered by indian scientist c.v. Raman (Raman), and thus received the 1930 nobel prize for physics. Information in the aspects of molecular vibration and rotation can be obtained based on Raman spectrum, and the method is a convenient and efficient technical means in the field of molecular structure research. The development of various related hardware and software, particularly the emergence of lasers with high-quality and high-strength monochromatic light, greatly promotes the research and application of Raman spectra, and then the Raman spectra are widely applied to multiple fields of chemistry, biology, physics, medicine and the like, and have great value for qualitative detection, semi-quantitative analysis and molecular structure information research.
The basic principle of raman spectroscopy is as follows: stabilized incident laser frequency v0The molecules in the sample interact with the laser, in the photoelectric field E, the molecules generate an induced dipole moment rho ═ alpha E, and the molecular absorption frequency is v0At photon of (E)0The ground state molecule first transitions to the virtual energy level and then back to E0Ground state with release frequency v0The process only changes the photon direction and does not change the frequency, which is called Rayleigh scattering; from E0The ground state is excited to a virtual energy level and then returns to E1Excited state of vibration and release frequency v0Photons of Δ ν, corresponding to what is called the stokes line in raman spectroscopy; from E1The absorption frequency of the vibration excited state is v0The molecular energy level is transited to the virtual energy level and then returned to E0Ground state with release frequency v0The + Δ ν photons correspond to what is known in the raman spectrum as the anti-stokes line. In view of being at E0Molecular ratio of ground state at E1The excited states are vibrated much so the intensity of the stokes lines will be stronger than the anti-stokes lines, which may be collectively referred to as raman scattering. Rayleigh scattering intensity is only 10 of excitation laser intensity-4—10-3Of order, while Raman scattering is only 10 of Rayleigh scattering-4—10-3Magnitude. Stokes and anti-Stokes lines of different molecular structures can be used for researching internal information such as molecular vibration, molecular rotation and the like fingerprints of substances.
At present, a general Raman system mainly comprises a laser, a beam expander, an optical filter, a microscope, a monochromator and other components, and can realize a plurality of functions based on the Raman effect. However, the high-voltage physical experiment has high requirements on loading of a sample, the sample needs to be loaded in a Diamond Anvil Cell (DAC), and a common Raman system does not meet Raman measurement in the high-voltage physical experiment due to short focal length of an objective lens, poor signal quality and the like, and is more inconvenient for Raman measurement in a Diamond Anvil Cell (DAC) pressurizing process. The normal temperature Raman measurement system can only measure Raman under the room temperature condition, and the measurable temperature range is narrow; or the normal temperature Raman system and the low temperature Raman system are separately designed, so that the space is occupied, the cost is high, and the problems of poor stability and the like are caused by a complex optical path.
Disclosure of Invention
The invention aims to overcome the defects in the prior art, and provides a confocal Raman system for high-pressure normal-temperature and low-temperature experiments and a measurement method thereof, so that a low-temperature Raman measurement system and a normal-temperature Raman system can be integrated together to realize the sharing of most optical paths, thereby greatly simplifying the complexity of the system, reducing the cost and improving the stability and reliability of the system.
In order to achieve the purpose, the invention adopts the following technical scheme:
the invention relates to a confocal Raman system for high-pressure normal-temperature and low-temperature experiments, which is characterized by comprising the following components in parts by weight: the device comprises an excitation module, a normal temperature imaging module, a low temperature imaging module and a signal collection module;
the excitation module is provided with a laser intensity attenuation sheet and a narrow-band filter in sequence in front of a Raman excitation light source; a first plane reflector is arranged on a reflection light path of the narrow-band filter; a beam expanding lens group and a second plane reflector are sequentially arranged in front of the plane reflector; a first Bragg diffraction grating is arranged on a reflection light path of the second plane reflector, and a third plane reflector and a fourth plane reflector are sequentially arranged on the reflection light path of the first Bragg diffraction grating; a first semi-reflecting semi-transmitting mirror is arranged in front of the fourth plane reflector; a normal-temperature microscope objective lens is arranged in front of the first semi-reflecting semi-transmitting lens, a normal-temperature three-dimensional displacement table is arranged near the focus of the normal-temperature microscope objective lens, and a sample is placed on the normal-temperature three-dimensional displacement table;
the signal collection module is provided with a second Bragg diffraction grating on the transmission light path of the first Bragg diffraction grating; a fourth plano-convex lens, a pinhole baffle and a fifth convex lens are sequentially arranged on a transmission light path of the second Bragg diffraction grating; a Raman focusing lens is arranged in front of the fifth convex lens, and a Raman spectrometer is arranged at the focus of the Raman focusing lens;
the normal temperature imaging module is characterized in that a second semi-reflecting and semi-transmitting mirror is arranged on a reflection light path of the first semi-reflecting and semi-transmitting mirror; a third convex lens and a normal-temperature microscopic imaging CCD are sequentially arranged on a reflection light path of the second semi-reflecting and semi-transmitting lens; a fifth plane reflector is arranged on a transmission light path of the second semi-reflecting and semi-transmitting mirror; a normal temperature microscope imaging light source is arranged on a reflection light path of the fifth plane reflector;
the low-temperature imaging module is characterized in that a sixth plane reflector and a seventh plane reflector are sequentially arranged on a reflection light path of the fourth plane reflector; a third half-reflecting and half-transmitting mirror and a low-temperature microscope objective are sequentially arranged on a reflection light path of the seventh plane reflector; a low-temperature three-dimensional displacement table is arranged in front of the low-temperature microscope objective, and a low-temperature cavity is arranged on the low-temperature three-dimensional displacement table; a fourth semi-reflecting and semi-transmitting mirror is arranged on a reflection light path of the third semi-reflecting and semi-transmitting mirror, a low-temperature microscopic imaging CCD is arranged on a transmission light path of the fourth semi-reflecting and semi-transmitting mirror, and a low-temperature microscopic imaging light source is arranged on a reflection light path of the fourth semi-reflecting and semi-transmitting mirror.
The normal temperature measurement method of the confocal Raman system for the high-pressure normal temperature and low-temperature experiment is characterized by comprising the following steps of:
2, after passing through the normal-temperature microscope objective, reflected light of the sample is reflected by the first semi-reflecting semi-transparent mirror and the second semi-reflecting semi-transparent mirror in sequence, and is focused by a third convex lens with the focal length of 250mm to obtain a sample light spot, and the sample light spot irradiates the normal-temperature microscopic imaging CCD and is processed by a computer to obtain a normal-temperature sample image;
the purified laser sequentially passes through the reflection of the first plane reflector and the beam expanding lens group to obtain broadened laser, and then passes through the reflection of the second plane reflector, the first Bragg diffraction grating, the third plane reflector and the fourth plane reflector to reach the first semi-reflecting semi-transmitting mirror;
the first Bragg diffraction grating and the second Bragg diffraction grating sequentially filter part of Rayleigh scattering in the Raman scattering light and transmit Raman scattering light with other wavelengths, so that normal-temperature low-Rayleigh Raman scattering light is obtained;
The low-temperature measurement method of the confocal Raman system for the high-pressure normal-temperature and low-temperature experiment is characterized by comprising the following steps of:
step I, visible parallel light is emitted by the low-temperature microscope imaging light source, and enters the low-temperature microscope objective lens and irradiates a sample in a low-temperature cavity of the low-temperature three-dimensional displacement table after being reflected by the fourth semi-reflecting and semi-transmitting lens and the third semi-reflecting and semi-transmitting lens in sequence;
step II, after the reflected light of the sample in the low-temperature cavity passes through the low-temperature microscope objective, the reflected light sequentially passes through the reflection of the third semi-reflecting and semi-transmitting lens and the transmission of the fourth semi-reflecting and semi-transmitting lens, enters the low-temperature microscopic imaging CCD, and is processed by a computer to obtain a sample image;
step III, adjusting the required laser intensity of the original laser emitted by the Raman excitation light source through the laser intensity attenuation sheet, and then performing the action of the narrow-band filter to obtain purified laser;
the purified laser sequentially passes through the reflection of a first plane reflector and the beam expanding lens group to obtain broadened laser, and then sequentially passes through the reflection of a second plane reflector, the reflection of a first Bragg diffraction grating, the reflection of a third plane reflector and the reflection of a fourth plane reflector, the reflection of a sixth plane reflector and the reflection of a seventh plane reflector, and the permeation of the third semi-reflecting and semi-transmitting lens into the low-temperature microscope objective lens, and then is focused on a sample in the low-temperature cavity;
laser on the sample is reflected to the low-temperature microscope objective lens, and enters the low-temperature microscopic imaging CCD after being reflected by the third semi-reflecting and semi-transmitting lens and transmitted by the fourth semi-reflecting and semi-transmitting lens in sequence, and a low-temperature sample image is obtained after being processed by a computer;
step IV, after the third half-reflecting and half-transmitting mirror is moved away, the Raman scattering light of the sample in the low-temperature cavity passes through the low-temperature microscope objective lens and then sequentially passes through the seventh plane reflector, the sixth plane reflector, the fourth plane reflector and the third plane reflector for reflection, and irradiates the first Bragg diffraction grating;
the first Bragg diffraction grating and the second Bragg diffraction grating sequentially filter Rayleigh scattering of Raman scattering light and transmit Raman scattering light with other wavelengths, so that low-temperature low-Rayleigh Raman scattering light is obtained;
v, the low-temperature low-Rayleigh Raman scattering light is focused by a fourth plano-convex lens with the focal length of 150mm, and stray light and non-parallel light are filtered under the action of spatial filtering of the pinhole baffle plate, so that low-temperature noise-reduction divergent Raman scattering light is obtained;
step VI, the low-temperature noise-reduction divergent Raman scattering light passes through a fifth convex lens with the focal length of 100mm to obtain low-temperature noise-reduction parallel Raman scattering light; and the low-temperature noise-reduced parallel Raman scattering light enters the Raman spectrometer after being focused by a Raman focusing lens with the focal length of 200mm, and is processed by a computer to obtain low-temperature Raman data.
Compared with the prior art, the invention has the beneficial effects that:
1. according to the Raman measurement system, the normal-temperature Raman measurement subsystem I and the low-temperature Raman measurement subsystem II are integrated through light path design, normal-temperature Raman measurement and low-temperature Raman measurement of a sample are facilitated, and the two subsystems share most of light paths, so that space and instrument cost are saved, the system is simplified, and the stability of an optical system is improved.
2. The invention selects the microscope objective with proper numerical aperture and focal length, and is matched with the high-precision three-dimensional displacement table, thereby realizing wide tuning of the measurement space range, not only meeting the measurement of common samples, but also being suitable for the Raman characterization of samples in special devices such as Diamond Anvil Cell (DAC).
3. According to the noise reduction assembly, two plano-convex lenses with proper focal lengths are selected, and the pinhole baffle with the aperture of 30 mu m is arranged at the confocal point of the two plano-convex lenses, so that most of stray light can be blocked, a diamond signal in a high-voltage experiment is particularly greatly weakened, and the signal-to-noise ratio is improved. The two Bragg diffraction gratings are arranged in a splayed angle, and the angle is finely adjusted, so that the low wave number measurement performance is improved, and the minimum energy can be lower than 10cm-1. In addition, one of the Bragg diffraction gratings is used for reflecting laser on a Raman excitation light path and filtering on the signal collection light path, so that the light path is simplified, and the performance of the Bragg diffraction grating is fully utilized.
4. The invention selects the spectrometer slit width of 10um, based on the principle that the narrower the slit width is qualitatively and the higher the resolution of the Raman system, compared with the slit width of usually dozens of micrometers (such as 30um), the invention improves the system resolution, and the 10um slit width can basically ignore the diffraction effect, thus being an ideal size collocation.
Drawings
FIG. 1 is a schematic diagram of a normal temperature Raman measurement subsystem I in the present invention;
FIG. 2 is a schematic diagram of a low temperature Raman measurement subsystem II of the present invention;
FIG. 3 is a schematic diagram of the basic principle of the noise reduction assembly of the present invention;
reference numbers in the figures: i is a normal temperature Raman measurement subsystem; II, a low-temperature Raman measurement subsystem; 1 is a Raman excitation light source; 2 is a laser intensity attenuation sheet; 3 is a narrow-band filter; 4 is a first plane mirror; 5 is the first plano-convex lens with 100mm focal length; 6 is a second plano-convex lens with a focal length of 200 mm; 7 is a second plane mirror; 8 is a first Bragg diffraction grating; 9 is a third plane mirror; 10 is a fourth plane mirror; 11 is a first half-reflecting half-transmitting mirror; 12 is a normal temperature microscope objective; 13 is a normal temperature three-dimensional displacement table; 14 is a sample; 15 is a second half-reflecting half-transmitting mirror; 16 is a third plano-convex lens with a focal length of 250 mm; 17 is a normal temperature microscopic imaging CCD; 18 is a normal temperature microscope visible light source; 19 is a fifth plane mirror; 20 is a second bragg diffraction grating; 21 is a fourth plano-convex lens with a focal length of 150 mm; 22 is a pinhole baffle; 23 is a fifth plano-convex lens with a focal length of 100 mm; 24 is a Raman focusing lens with a focal length of 200 mm; 25 is Raman spectrometer; 26 is a sixth plane mirror; 27 is a seventh plane mirror; 28 is a third half-reflecting and half-transmitting mirror; 29 is a low temperature microscope objective; 30 is a low-temperature cavity; 31 is a low-temperature three-dimensional displacement table; 32 is a fourth half-reflecting and half-transmitting mirror; 33 is a low temperature microscopic imaging CCD; and 34 is a low-temperature microscopic imaging light source.
Detailed Description
In this embodiment, a confocal raman system for high-pressure normal-temperature and low-temperature experiments includes: a normal temperature Raman measurement subsystem I shown in figure 1; a low-temperature Raman measurement subsystem II shown in figure 2. Normal atmospheric temperature raman measurement subsystem I includes: the device comprises an excitation module, a signal collection module and a normal temperature imaging module. The low-temperature Raman measurement subsystem II shares the excitation module and the signal collection module of the normal-temperature Raman measurement subsystem I, and is also provided with a low-temperature imaging module of the low-temperature Raman measurement subsystem II.
The excitation module is provided with a laser intensity attenuation sheet 2 and a narrow-band filter 3 in sequence in front of a Raman excitation light source 1; a first plane reflector 4 is arranged on a reflection light path of the narrow-band filter 3; a beam expanding lens group and a second plane reflector 7 are sequentially arranged in front of the plane reflector 4; a first Bragg diffraction grating 8 is arranged on a reflection light path of the second plane mirror 7, and a third plane mirror 9 and a fourth plane mirror 10 are sequentially arranged on the reflection light path of the first Bragg diffraction grating 8; a first half-reflecting and half-transmitting mirror 11 is arranged in front of the fourth plane mirror 10; a room temperature microscope objective lens 12 is disposed in front of the first half mirror 11, a room temperature three-dimensional displacement stage 13 is disposed near the focal point of the room temperature microscope objective lens 12, and a sample 14 is placed on the room temperature three-dimensional displacement stage 13. The laser from the raman excitation light source 1 is adjusted by hand through the laser intensity attenuation sheet 2 to obtain the required laser intensity, and the laser can reflect the laser with the wavelength of 532nm under the action of the narrow band filter 3, and can transmit the light which deviates from the central wavelength of 532nm and contains harmonic waves, thereby playing the role of purifying the laser. The purified laser light passes through a beam expanding lens group, namely a first plano-convex lens 5 (focal)Distance f1100mm) and a second plano-convex lens 6 (focal length f)2200mm), the width D of the laser line will widen and the laser beam widening ratio is equal to the focal length ratio of the two lenses. The beam expanding lens group not only plays a role of collimating laser, the width D of the laser beam is widened, the laser beam changes direction through the plane reflector, and finally the laser beam enters the microscope objective to be focused to obtain smaller spots with more concentrated light beams, and the size of the spots is changed according to a Airy spot formula
(where λ is the wavelength, F is the microscope objective focal length, and D is the ray broadening in the objective).
The signal collection module is provided with a second Bragg diffraction grating 20 on the transmission light path of the first Bragg diffraction grating 8; a fourth plano-convex lens 21, a pinhole baffle 22 and a fifth convex lens 23 are sequentially arranged on a transmission light path of the second Bragg diffraction grating 20; a raman focusing lens 24 is provided in front of the fifth convex lens 23, and a raman spectrometer 25 is provided at the focal point of the raman focusing lens 24. The Raman scattering light of the sample is mixed with a large amount of Rayleigh scattering light and other stray light, and finally irradiates the first Bragg diffraction grating 8 and the second Bragg diffraction grating 20 after being refracted by the microscope objective and reflected by the plane mirror, wherein the Bragg diffraction grating can reflect more than 95 percent of the Rayleigh scattering light (with the wavelength of 532nm) and transmits light with the wavelength of not 532. The central wavelength of the transmitted light of the bragg diffraction grating slightly deviates along with the change of the angle of the incident light, the angles of the first bragg diffraction grating 8 and the second bragg diffraction grating 20 are finely adjusted, the central wavelength of the transmitted light is close to the rayleigh scattering wavelength as far as possible, and the ultra-low wave number measurement capability can be improved. In the embodiment, the lowest height of the groove is lower than 10cm-1Ultra low wavenumber raman signal measurement of (a). Raman scattered light in a wide band range is focused through the fourth plano-convex lens 21, a tiny light spot is formed at the position of the small hole of the pinhole baffle 22, and the Raman scattered light can penetrate through the small hole of the pinhole baffle. In the high-voltage experiment, the diamond Raman signal light mainly appears as non-parallel light from the microscope objective lens, and the diamond Raman non-parallel light and other stray light can be more obviously generated through the fourth plano-convex lens 21The stray light can not pass through the small holes of the pinhole baffle 22, but can be absorbed by the black coating at the periphery of the small holes of the pinhole baffle 22 due to too many deviation from the small holes, so that the function of filtering stray light is realized, and the principle schematic diagram of the filtering function is shown in fig. 3. The focal length of the fourth plano-convex lens 21 is generally greater than that of the fifth plano-convex lens 23, and a thinner light cone is formed at the focal point of the large-focal-length convex lens, so that the raman scattered light can pass through the large-focal-length convex lens, and a stronger raman signal can be obtained. The raman scattering light is focused on an entrance slit of the raman spectrometer 25 through the raman focusing lens 24, the entrance slit of the raman spectrometer 25 blocks external stray light, the width of the entrance slit is reduced qualitatively, the resolution of the raman signal is improved, in the embodiment, the width of the entrance slit is 10um, the raman scattering light enters the raman spectrometer 25 in the form of a tiny light spot, namely similar to a point light source, and a raman signal with good signal-to-noise ratio and high resolution can be obtained.
The normal temperature imaging module is provided with a second half-reflecting and half-transmitting mirror 15 on the reflection light path of the first half-reflecting and half-transmitting mirror 11; a third convex lens 16 and a normal temperature microscopic imaging CCD17 are sequentially arranged on a reflection light path of the second half-reflecting and half-transmitting mirror 15; a fifth plane reflector 19 is arranged on a transmission light path of the second half-reflecting and half-transmitting mirror 15; a normal temperature microscope visible light source 18 is arranged on the reflection light path of the fifth plane reflector 19. Prior to raman testing, a clear sample image and laser spot need to be found. The first half mirror 11 and the second half mirror 15 function to transmit light while reflecting light. The visible light emitted by the microscopic imaging light source 18 is parallel light, and is reflected by the fifth plane reflector 19, part of the light passes through the second semi-reflecting and semi-transmitting mirror 15 and is reflected by the first semi-reflecting and semi-transmitting mirror 11 into the normal temperature microscope objective 12, and the reflected light of the normal temperature sample enters the normal temperature microscopic imaging CCD17 through the reflection of the first semi-reflecting and semi-transmitting mirror 11 and the second semi-reflecting and semi-transmitting mirror 15. And a normal-temperature three-dimensional displacement table 13 under the sample 14 is adjusted, so that clear normal-temperature sample images and normal-temperature laser spots can be obtained. After obtaining the normal temperature sample image and the normal temperature laser spot, the first half-reflecting half-transmitting mirror 11 is moved.
The low-temperature imaging module is characterized in that a sixth plane reflector 26 and a seventh plane reflector 27 are sequentially arranged on a reflection light path of the fourth plane reflector 10; a third half-reflecting and half-transmitting mirror 28 and a low-temperature microscope objective 29 are sequentially arranged on a reflection light path of the seventh plane reflector 27; a low-temperature three-dimensional displacement table 30 is arranged in front of the low-temperature microscope objective 29, and a low-temperature cavity 31 is arranged on the low-temperature three-dimensional displacement table 30; a fourth half-reflecting and half-transmitting mirror 32 is arranged on a reflection light path of the third half-reflecting and half-transmitting mirror 28, a low-temperature microscopic imaging CCD33 is arranged on a transmission light path of the fourth half-reflecting and half-transmitting mirror 32, and a low-temperature microscopic imaging light source 34 is arranged on a reflection light path of the fourth half-reflecting and half-transmitting mirror 32. The low-temperature microscope imaging light source 34 emits visible parallel light, part of the visible parallel light is reflected by the fourth half-reflecting and half-transmitting mirror 32 and the third half-reflecting and half-transmitting mirror 28, enters the low-temperature microscope objective lens 29 and irradiates on a low-temperature sample in the low-temperature cavity 30, reflected light of the low-temperature sample in the low-temperature cavity 30 passes through the low-temperature microscope objective lens 29, sequentially passes through reflection of the third half-reflecting and half-transmitting mirror 28 and transmission of the fourth half-reflecting and half-transmitting mirror 32, enters the low-temperature microscopic imaging CCD33, a low-temperature sample image is obtained through computer processing, and the low-temperature three-dimensional displacement table 31 below the low-temperature cavity 30 is finely. After obtaining clear low-temperature sample images and low-temperature laser spots, the third half-reflecting and half-transmitting mirror 28 is moved.
In this embodiment, as shown in fig. 1, a normal temperature measurement method of a confocal raman system for high-pressure normal temperature and low-temperature experiments is performed according to the following steps:
2, after passing through a normal temperature microscope objective 12, reflected light of a sample 14 is reflected by a first semi-reflecting and semi-transmitting lens 11 and a second semi-reflecting and semi-transmitting lens 15 in sequence, and is focused by a third convex lens 16 with the focal length of 250mm to obtain a sample light spot, the sample light spot irradiates on a normal temperature microscopic imaging CCD17, and a normal temperature sample image is obtained through computer processing;
the purified laser sequentially passes through the reflection of the first plane reflector 4 and the beam expanding lens group to obtain broadened laser, and then reaches the first semi-reflecting and semi-transmitting lens 11 after being reflected by the second plane reflector 7, the first Bragg diffraction grating 8, the third plane reflector 9 and the fourth plane reflector 10;
the first Bragg diffraction grating 8 and the second Bragg diffraction grating 20 sequentially filter part of Rayleigh scattering in the Raman scattering light and transmit Raman scattering light with other wavelengths, so that normal-temperature low-Rayleigh scattering light is obtained;
In this embodiment, as shown in fig. 2, a low-temperature measurement method of a confocal raman system for high-pressure normal-temperature and low-temperature experiments is performed according to the following steps:
step I, visible parallel light is emitted by a low-temperature microscope imaging light source 34, and enters a low-temperature microscope objective lens 29 and irradiates a sample in a low-temperature cavity 30 of a low-temperature three-dimensional displacement table 31 after being reflected by a fourth semi-reflecting and semi-transmitting lens 32 and a third semi-reflecting and semi-transmitting lens 28 in sequence;
step II, after the reflected light of the sample in the low-temperature cavity 30 passes through a low-temperature microscope objective lens 29, the reflected light sequentially passes through the reflection of a third semi-reflecting and semi-transmitting lens 28 and the transmission of a fourth semi-reflecting and semi-transmitting lens 32, enters a low-temperature microscopic imaging CCD33, and is processed by a computer to obtain a sample image;
III, adjusting the required laser intensity of the original laser emitted by the Raman excitation light source 1 through a laser intensity attenuation sheet 2, and then performing the action of a narrow-band filter 3 to obtain purified laser;
the purified laser sequentially passes through the reflection of the first plane reflector 4 and the beam expanding lens group to obtain broadened laser, and then sequentially passes through the reflection of the second plane reflector 7, the first Bragg diffraction grating 8, the third plane reflector 9 and the fourth plane reflector 10, the reflection of the sixth plane reflector 26 and the seventh plane reflector 27, and the third semi-reflecting and semi-transmitting lens 28 to enter a low-temperature microscope objective 29, and then is focused on a sample in a low-temperature cavity 30;
the laser on the sample is reflected to the low-temperature microscope objective lens 29, and enters the low-temperature microscopic imaging CCD33 after being reflected by the third half-reflecting and half-transmitting lens 28 and transmitted by the fourth half-reflecting and half-transmitting lens 32 in sequence, and a low-temperature sample image is obtained after the processing of a computer;
step IV, after the third half-reflecting and half-transmitting mirror 28 is moved away, the Raman scattering light of the sample in the low-temperature cavity 30 passes through the low-temperature microscope objective 29, and then sequentially passes through the seventh plane mirror 27, the sixth plane mirror 26, the fourth plane mirror 10 and the third plane mirror 9 for reflection, and irradiates the first Bragg diffraction grating 8;
the first Bragg diffraction grating 8 and the second Bragg diffraction grating 20 sequentially filter the Rayleigh scattering of the Raman scattering light and transmit the Raman scattering light with other wavelengths, so that low-temperature low-Rayleigh Raman scattering light is obtained;
v, focusing the low-temperature low-Rayleigh Raman scattered light through a fourth plano-convex lens 21 with the focal length of 150mm, and filtering stray light and non-parallel light through the spatial filtering effect of a pinhole baffle 22, so as to obtain low-temperature noise-reduction divergent Raman scattered light;
step VI, the low-temperature noise-reduction divergent Raman scattering light passes through the action of a fifth convex lens 23 with the focal length of 100mm to obtain low-temperature noise-reduction parallel Raman scattering light; the low-temperature noise-reduced parallel Raman scattering light enters a Raman spectrometer 25 after being focused by a Raman focusing lens 24 with the focal length of 200mm, and is processed by a computer to obtain low-temperature Raman data.
In summary, the confocal raman system for high-pressure normal-temperature and low-temperature experiments and the measurement method thereof not only facilitate the measurement of normal-temperature and low-temperature raman under normal pressure, but also are suitable for the measurement of high-quality raman signals of samples in a Diamond Anvil Cell (DAC), and the tunable range of the positions and depths of the samples is wide, so that the lowest tunable range of the positions and the depths of the samples can be lower than 10cm-1The measurement of low wave number Raman signals, the system is stable, the signal-to-noise ratio is high, the resolution ratio is high, and the application of the Raman spectrum system is greatly widened.
Claims (3)
1. A confocal Raman system for high-pressure normal-temperature and low-temperature experiments is characterized by comprising: the device comprises an excitation module, a normal temperature imaging module, a low temperature imaging module and a signal collection module;
the excitation module is characterized in that a laser intensity attenuation sheet (2) and a narrow-band filter (3) are sequentially arranged in front of a Raman excitation light source (1); a first plane reflector (4) is arranged on a reflection light path of the narrow-band filter (3); a beam expanding lens group and a second plane reflector (7) are sequentially arranged in front of the plane reflector (4); a first Bragg diffraction grating (8) is arranged on a reflection light path of the second plane mirror (7), and a third plane mirror (9) and a fourth plane mirror (10) are sequentially arranged on the reflection light path of the first Bragg diffraction grating (8); a first semi-reflecting semi-permeable mirror (11) is arranged in front of the fourth plane reflector (10); a normal temperature microscope objective (12) is arranged in front of the first semi-reflecting semi-transparent mirror (11), a normal temperature three-dimensional displacement table (13) is arranged near the focus of the normal temperature microscope objective (12), and a sample (14) is placed on the normal temperature three-dimensional displacement table (13);
the signal collection module is characterized in that a second Bragg diffraction grating (20) is arranged on a transmission light path of the first Bragg diffraction grating (8); a fourth plano-convex lens (21), a pinhole baffle (22) and a fifth convex lens (23) are sequentially arranged on a transmission light path of the second Bragg diffraction grating (20); a Raman focusing lens (24) is arranged in front of the fifth convex lens (23), and a Raman spectrometer (25) is arranged at the focus of the Raman focusing lens (24);
the normal temperature imaging module is characterized in that a second semi-reflecting and semi-transmitting mirror (15) is arranged on a reflection light path of the first semi-reflecting and semi-transmitting mirror (11); a third convex lens (16) and a normal-temperature microscopic imaging CCD (17) are sequentially arranged on a reflection light path of the second half-reflecting and half-transmitting mirror (15); a fifth plane reflector (19) is arranged on a transmission light path of the second semi-reflecting and semi-transmitting mirror (15); a normal temperature microscope imaging light source (18) is arranged on a reflection light path of the fifth plane reflector (19);
the low-temperature imaging module is characterized in that a sixth plane reflector (26) and a seventh plane reflector (27) are sequentially arranged on a reflection light path of a fourth plane reflector (10); a third half-reflecting and half-transmitting mirror (28) and a low-temperature microscope objective (29) are sequentially arranged on a reflection light path of the seventh plane reflector (27); a low-temperature three-dimensional displacement table (30) is arranged in front of the low-temperature microscope objective (29), and a low-temperature cavity (31) is arranged on the low-temperature three-dimensional displacement table (30); a fourth semi-reflecting and semi-transmitting mirror (32) is arranged on a reflection light path of the third semi-reflecting and semi-transmitting mirror (28), a low-temperature microscopic imaging CCD (33) is arranged on a transmission light path of the fourth semi-reflecting and semi-transmitting mirror (32), and a low-temperature microscopic imaging light source (34) is arranged on the reflection light path of the fourth semi-reflecting and semi-transmitting mirror (32).
2. The normal temperature measurement method of the confocal raman system based on the high pressure normal temperature and low temperature experiment of claim 1, which is characterized by comprising the following steps:
step 1, a visible parallel light is emitted by a visible light source (18) of the normal-temperature microscope, and the visible parallel light is reflected by a fifth plane reflector (19) and a first semi-reflecting semi-transparent mirror (11) in sequence, passes through an objective lens (12) of the normal-temperature microscope and irradiates on a sample (14) of a normal-temperature three-dimensional displacement table (13);
step 2, after the reflected light of the sample (14) passes through the normal-temperature microscope objective lens (12), the reflected light sequentially passes through the first semi-reflecting and semi-transmitting lens (11) and the second semi-reflecting and semi-transmitting lens (15) for reflection, and is focused through a third convex lens (16) with the focal length of 250mm to obtain a sample light spot, the sample light spot irradiates the normal-temperature microscopic imaging CCD (17), and a normal-temperature sample image is obtained through computer processing;
step 3, adjusting the required laser intensity of the original laser emitted by the Raman excitation light source (1) through the laser intensity attenuation sheet (2), and then performing the action of the narrow-band filter (3) to obtain purified laser;
the purified laser sequentially passes through the reflection of a first plane reflector (4) and the beam expanding lens group to obtain broadened laser, and then passes through the reflection of a second plane reflector (7), a first Bragg diffraction grating (8), a third plane reflector (9) and a fourth plane reflector (10) to reach a first semi-reflecting semi-transmitting mirror (11);
step 4, the broadened laser is transmitted by the first semi-reflecting semi-transparent mirror (11), and then is irradiated onto the sample (14) through the normal-temperature microscope objective (12), the laser reflection light on the sample (14) passes through the normal-temperature microscope objective (12), then sequentially passes through the first semi-reflecting semi-transparent mirror (11) and the second semi-reflecting semi-transparent mirror (15) for reflection, and is focused by a third convex lens (16) with the focal length of 250mm to obtain an imaging laser spot, and the imaging laser spot is irradiated onto the normal-temperature microscopic imaging CCD (17) and is processed by a computer to obtain a laser spot image on the normal-temperature sample;
step 5, after the first half-reflecting and half-transmitting lens (11) is moved away, the Raman scattering light in the sample (14) passes through the normal-temperature microscope objective lens (12), and then is irradiated onto the first Bragg diffraction grating (8) after being reflected by a fourth plane reflector (10) and a third plane reflector (9) in sequence;
the first Bragg diffraction grating (8) and the second Bragg diffraction grating (20) sequentially filter part of Rayleigh scattering in the Raman scattering light and transmit Raman scattering light with other wavelengths, so that normal-temperature low-Rayleigh Raman scattering light is obtained;
step 6, the normal-temperature low-Rayleigh Raman scattering light is focused by a fourth plano-convex lens (21) with the focal length of 150mm, and stray light and non-parallel light are filtered under the action of spatial filtering of a pinhole baffle (22), so that normal-temperature noise-reduction divergent Raman scattering light is obtained;
step 7, the normal-temperature noise-reduction divergent Raman scattering light passes through a fifth convex lens (23) with the focal length of 100mm to obtain normal-temperature noise-reduction parallel Raman scattering light; the normal-temperature noise-reduction parallel Raman scattering light enters the Raman spectrometer (25) after being focused by a Raman focusing lens (24) with the focal length of 200mm, and normal-temperature Raman data are obtained after being processed by a computer.
3. The cryo-measurement method of confocal raman system based on the high-pressure normal-temperature and low-temperature experiment of claim 1, which is characterized by comprising the following steps:
step I, the low-temperature microscope imaging light source (34) emits visible parallel light, and the visible parallel light enters the low-temperature microscope objective lens (29) and irradiates a sample in a low-temperature cavity (30) of the low-temperature three-dimensional displacement table (31) after being reflected by the fourth half-reflecting and half-transmitting mirror (32) and the third half-reflecting and half-transmitting mirror (28) in sequence;
step II, after the reflected light of the sample in the low-temperature cavity (30) passes through the low-temperature microscope objective lens (29), the reflected light sequentially passes through the reflection of the third semi-reflecting and semi-transmitting lens (28) and the transmission of the fourth semi-reflecting and semi-transmitting lens (32), enters the low-temperature microscopic imaging CCD (33), and is processed by a computer to obtain a sample image;
III, adjusting the required laser intensity of the original laser emitted by the Raman excitation light source (1) through the laser intensity attenuation sheet (2), and then performing the action of the narrow-band filter (3) to obtain purified laser;
the purified laser sequentially passes through the reflection of a first plane reflector (4) and the beam expanding lens group to obtain broadened laser, and then sequentially passes through the reflection of a second plane reflector (7), a first Bragg diffraction grating (8), a third plane reflector (9) and a fourth plane reflector (10), the reflection of a sixth plane reflector (26) and a seventh plane reflector (27), and the broadened laser is focused on a sample in a low-temperature cavity (30) after entering a low-temperature microscope objective (29) through a third semi-reflecting and semi-transparent mirror (28);
laser on the sample is reflected to the low-temperature microscope objective lens (29), and enters the low-temperature microscopic imaging CCD (33) after being reflected by the third semi-reflecting and semi-transmitting lens (28) and transmitted by the fourth semi-reflecting and semi-transmitting lens (32) in sequence, and a low-temperature sample image is obtained after being processed by a computer;
step IV, after the third half-reflecting and half-transmitting mirror (28) is moved away, the Raman scattering light of the sample in the low-temperature cavity (30) passes through the low-temperature microscope objective (29), then sequentially passes through the seventh plane reflector (27), the sixth plane reflector (26), the fourth plane reflector (10) and the third plane reflector (9) for reflection, and irradiates on the first Bragg diffraction grating (8);
the first Bragg diffraction grating (8) and the second Bragg diffraction grating (20) sequentially filter Rayleigh scattering of Raman scattering light and transmit Raman scattering light with other wavelengths, so that low-temperature low-Rayleigh Raman scattering light is obtained;
v, the low-temperature low-Rayleigh Raman scattering light is focused by a fourth plano-convex lens (21) with the focal length of 150mm, and stray light and non-parallel light are filtered under the action of spatial filtering of a pinhole baffle (22), so that low-temperature noise-reduction divergent Raman scattering light is obtained;
step VI, the low-temperature noise-reduction divergent Raman scattering light passes through a fifth convex lens (23) with the focal length of 100mm to obtain low-temperature noise-reduction parallel Raman scattering light; the low-temperature noise-reduction parallel Raman scattering light enters the Raman spectrometer (25) after being focused by a Raman focusing lens (24) with the focal length of 200mm, and is processed by a computer to obtain low-temperature Raman data.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114141115A (en) * | 2021-11-03 | 2022-03-04 | 西安石油大学 | Experimental device based on transmission of space light in free space |
| CN118129899A (en) * | 2024-03-13 | 2024-06-04 | 西安交通大学 | Narrow-band wavelength filtering spectrometer device based on tri-grating structure |
Citations (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07225186A (en) * | 1994-02-10 | 1995-08-22 | Hitachi Ltd | Fluorescence/raman spectrophotometer |
| JPH1090064A (en) * | 1996-09-12 | 1998-04-10 | Fujitsu Ltd | Microscopic raman system |
| US20070021586A1 (en) * | 2005-07-22 | 2007-01-25 | Marrow David G | On-line raman analysis and control of a high pressure reaction system |
| US20080100835A1 (en) * | 2006-10-24 | 2008-05-01 | Pd-Ld, Inc. | Compact, Low Cost Raman Monitor For Single Substances |
| CN101614879A (en) * | 2009-07-24 | 2009-12-30 | 北京工业大学 | Narrow-band optical filter |
| JP2010054368A (en) * | 2008-08-28 | 2010-03-11 | Nano Photon Kk | Optical microscope and observation method |
| JP2010054391A (en) * | 2008-08-29 | 2010-03-11 | Nano Photon Kk | Optical microscope, and method of displaying color image |
| CN102162793A (en) * | 2011-01-06 | 2011-08-24 | 中国科学院高能物理研究所 | Raman system for high-pressure in situ measurement |
| US20110292376A1 (en) * | 2010-05-26 | 2011-12-01 | Kukushkin Igor V | Apparatus and method for detecting raman and photoluminescence spectra of a substance |
| WO2012087138A1 (en) * | 2010-12-24 | 2012-06-28 | Hybriscan Technologies Holding Bv | System for electron microscopy and raman spectroscopy |
| CN104597598A (en) * | 2014-12-31 | 2015-05-06 | 苏州优谱德精密仪器科技有限公司 | Confocal device for Raman probe |
| CN104749162A (en) * | 2015-04-17 | 2015-07-01 | 江苏天瑞仪器股份有限公司 | Confocal Raman spectrometer and light path device thereof |
| US20150346101A1 (en) * | 2013-01-21 | 2015-12-03 | Beijing Institute Of Technology | Laser Differential Confocal Mapping-Spectrum Microscopic Imaging Method and Device |
| CN107561059A (en) * | 2017-09-28 | 2018-01-09 | 中国科学院苏州生物医学工程技术研究所 | Multi-wavelength line scans Raman spectrometer |
| CN107643275A (en) * | 2016-08-19 | 2018-01-30 | 北京杏林睿光科技有限公司 | A kind of integral type Raman optical-mechanical system |
| CN108181294A (en) * | 2018-01-05 | 2018-06-19 | 厦门大学 | Raman spectrometer light path system |
| CN110793954A (en) * | 2019-11-05 | 2020-02-14 | 中国科学院苏州生物医学工程技术研究所 | Portable Raman blood identification system based on echelle grating |
| WO2020037175A1 (en) * | 2018-08-17 | 2020-02-20 | Ning Fang | Integration system of raman spectroscopy with advanced light microscopy and applications of same |
| US20200116568A1 (en) * | 2017-06-06 | 2020-04-16 | University Of Maryland Baltimore County | Systems and methods using multi-wavelength single-pulse raman spectroscopy |
| CN111693508A (en) * | 2020-06-16 | 2020-09-22 | 浙江工业大学 | Quartz reaction kettle device for in-situ online monitoring of low-temperature high-pressure reaction |
| US20200326238A1 (en) * | 2017-10-05 | 2020-10-15 | Case Western Reserve University | Digital micromirror device and kinematically tunable wavelength filter-based imaging systems |
-
2020
- 2020-12-31 CN CN202011629386.4A patent/CN112834480B/en active Active
Patent Citations (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07225186A (en) * | 1994-02-10 | 1995-08-22 | Hitachi Ltd | Fluorescence/raman spectrophotometer |
| JPH1090064A (en) * | 1996-09-12 | 1998-04-10 | Fujitsu Ltd | Microscopic raman system |
| US20070021586A1 (en) * | 2005-07-22 | 2007-01-25 | Marrow David G | On-line raman analysis and control of a high pressure reaction system |
| US20080100835A1 (en) * | 2006-10-24 | 2008-05-01 | Pd-Ld, Inc. | Compact, Low Cost Raman Monitor For Single Substances |
| JP2010054368A (en) * | 2008-08-28 | 2010-03-11 | Nano Photon Kk | Optical microscope and observation method |
| JP2010054391A (en) * | 2008-08-29 | 2010-03-11 | Nano Photon Kk | Optical microscope, and method of displaying color image |
| CN101614879A (en) * | 2009-07-24 | 2009-12-30 | 北京工业大学 | Narrow-band optical filter |
| US20110292376A1 (en) * | 2010-05-26 | 2011-12-01 | Kukushkin Igor V | Apparatus and method for detecting raman and photoluminescence spectra of a substance |
| WO2012087138A1 (en) * | 2010-12-24 | 2012-06-28 | Hybriscan Technologies Holding Bv | System for electron microscopy and raman spectroscopy |
| CN102162793A (en) * | 2011-01-06 | 2011-08-24 | 中国科学院高能物理研究所 | Raman system for high-pressure in situ measurement |
| US20150346101A1 (en) * | 2013-01-21 | 2015-12-03 | Beijing Institute Of Technology | Laser Differential Confocal Mapping-Spectrum Microscopic Imaging Method and Device |
| CN104597598A (en) * | 2014-12-31 | 2015-05-06 | 苏州优谱德精密仪器科技有限公司 | Confocal device for Raman probe |
| CN104749162A (en) * | 2015-04-17 | 2015-07-01 | 江苏天瑞仪器股份有限公司 | Confocal Raman spectrometer and light path device thereof |
| CN107643275A (en) * | 2016-08-19 | 2018-01-30 | 北京杏林睿光科技有限公司 | A kind of integral type Raman optical-mechanical system |
| US20200116568A1 (en) * | 2017-06-06 | 2020-04-16 | University Of Maryland Baltimore County | Systems and methods using multi-wavelength single-pulse raman spectroscopy |
| CN107561059A (en) * | 2017-09-28 | 2018-01-09 | 中国科学院苏州生物医学工程技术研究所 | Multi-wavelength line scans Raman spectrometer |
| US20200326238A1 (en) * | 2017-10-05 | 2020-10-15 | Case Western Reserve University | Digital micromirror device and kinematically tunable wavelength filter-based imaging systems |
| CN108181294A (en) * | 2018-01-05 | 2018-06-19 | 厦门大学 | Raman spectrometer light path system |
| WO2020037175A1 (en) * | 2018-08-17 | 2020-02-20 | Ning Fang | Integration system of raman spectroscopy with advanced light microscopy and applications of same |
| CN110793954A (en) * | 2019-11-05 | 2020-02-14 | 中国科学院苏州生物医学工程技术研究所 | Portable Raman blood identification system based on echelle grating |
| CN111693508A (en) * | 2020-06-16 | 2020-09-22 | 浙江工业大学 | Quartz reaction kettle device for in-situ online monitoring of low-temperature high-pressure reaction |
Non-Patent Citations (2)
| Title |
|---|
| ZHANG LI ET AL.: "Unique laser-scanning optical microscope for low-temperature imaging and spectroscopy", 《REVIEW OF SCIENTIFIC INSTRUMENTS》 * |
| 彭佳丽等: "激光显微拉曼光谱仪的设计与性能参数测定", 《仪表技术与传感器》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114141115A (en) * | 2021-11-03 | 2022-03-04 | 西安石油大学 | Experimental device based on transmission of space light in free space |
| CN118129899A (en) * | 2024-03-13 | 2024-06-04 | 西安交通大学 | Narrow-band wavelength filtering spectrometer device based on tri-grating structure |
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