CN112833781A - Double light source line structure light sensor - Google Patents

Double light source line structure light sensor Download PDF

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Publication number
CN112833781A
CN112833781A CN202011627997.5A CN202011627997A CN112833781A CN 112833781 A CN112833781 A CN 112833781A CN 202011627997 A CN202011627997 A CN 202011627997A CN 112833781 A CN112833781 A CN 112833781A
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CN
China
Prior art keywords
laser
light
beam combining
light source
combining mirror
Prior art date
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Pending
Application number
CN202011627997.5A
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Chinese (zh)
Inventor
郑恩松
臧同乐
王艳辉
李保阳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Foshan Yingzhilai Technology Co ltd
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Foshan Yingzhilai Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Foshan Yingzhilai Technology Co ltd filed Critical Foshan Yingzhilai Technology Co ltd
Priority to CN202011627997.5A priority Critical patent/CN112833781A/en
Publication of CN112833781A publication Critical patent/CN112833781A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Studio Devices (AREA)

Abstract

The invention discloses a double light source line structure light sensor which comprises an image sensor, wherein a lens is arranged below the image sensor, a first laser is arranged below the left side of the lens, a beam combining mirror is arranged below the first laser, a second laser is arranged on one side of the beam combining mirror, which is close to the lens, an included angle between a laser emitting end of the first laser and the beam combining mirror is 45 degrees, and an included angle between a laser emitting end of the second laser and the beam combining mirror is 45 degrees; the invention enables the light planes of the two line-structured light with different wavelengths to coincide through the beam combining mirror, can switch the light source at will in the use process without recalibrating the light plane of the sensor, can simultaneously use two lasers with different colors as the line-structured light source for detection, and can switch and use the light sources with different wavelengths if necessary.

Description

Double light source line structure light sensor
Technical Field
The invention relates to the technical field of line structured light source detection, in particular to a double light source line structured light sensor.
Background
The wavelength of the line laser that current line structure light sensor on the market launches is single, but because the material that is detected the thing is various, the laser irradiation of different wavelength is on the object surface of different materials, and detection effect is different, to above-mentioned condition, this patent has designed a neotype two light source line structure light sensor, can use the laser of two different colours simultaneously to detect as the line structure light source, can switch the light source of using different wavelengths when necessary.
Disclosure of Invention
The present invention is directed to a dual light source line structure light sensor to solve the above problems.
In order to achieve the purpose, the invention provides the following technical scheme: the utility model provides a two light source line structure light sensor, includes image sensor, image sensor's below is equipped with the camera lens, the left side below of camera lens is equipped with laser instrument one, the below of laser instrument one is equipped with beam combining mirror, beam combining mirror is close to one side of camera lens is equipped with laser instrument two, the laser emission end of laser instrument one with contained angle between the beam combining mirror is 45, the laser emission end of laser instrument two with contained angle between the beam combining mirror is 45, laser instrument one with two light waves of laser instrument form the light plane.
Preferably: the laser is located between the first laser and the lens.
Compared with the prior art, the invention has the beneficial effects that: the invention enables the light planes of the two line-structured light with different wavelengths to coincide through the beam combining mirror, can switch the light source at will in the use process without recalibrating the light plane of the sensor, can simultaneously use two lasers with different colors as the line-structured light source for detection, and can switch and use the light sources with different wavelengths if necessary.
Drawings
FIG. 1 is a schematic structural diagram of the present invention.
In the figure: 1. an image sensor; 2. a lens; 3. a first laser; 4. a beam combining mirror; 5. a second laser; 6. a plane of light.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Examples
Referring to fig. 1, the present invention provides a technical solution: the utility model provides a double light source line structure light sensor, includes image sensor 1, image sensor 1's below is equipped with camera lens 2, camera lens 2's left side below is equipped with laser instrument one 3, laser instrument one 3's below is equipped with beam combiner 4, beam combiner 4 is close to one side of camera lens 2 and is equipped with laser instrument two 5, the contained angle between laser emission end of laser instrument one 3 and beam combiner 4 is 45, the contained angle between laser emission end of laser instrument two 5 and beam combiner 4 is 45, laser instrument one 3 and two 5 light waves of laser instrument form light plane 6.
In this embodiment, specifically: the second laser 5 is located between the first laser 3 and the lens 2.
Working principle or structure principle, when in use, the first laser 3 and the second laser 5 are two linear laser light sources with different wavelengths, the beam combining mirror 4 is used for combining light beams from the first laser 3 and the second laser 5 into a beam, the first laser 3 transmits when irradiating the beam combining mirror 4, the second laser 5 totally reflects when irradiating the beam combining mirror 4, so that light planes 6 of the two beams of light coincide, the reflected light of any beam of light is irradiated onto the image sensor 1 through the lens 2 to be imaged, thereby realizing the detection by using the structural light with different wavelengths and keeping the light path unchanged, the light planes 6 of the two linear structure light with different wavelengths coincide through the beam combining mirror 4, in the use process, the light sources can be switched at will without recalibrating the light plane 6 of the sensor, the detection can be carried out by using the two lasers with different colors as the linear structure light sources at the same time, the light sources may be switched to use different wavelengths if necessary.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (2)

1. A dual light source line structure light sensor comprising an image sensor (1), characterized in that: the below of image sensor (1) is equipped with camera lens (2), the left side below of camera lens (2) is equipped with laser instrument (3), the below of laser instrument (3) is equipped with beam combining mirror (4), beam combining mirror (4) are close to one side of camera lens (2) is equipped with laser instrument two (5), the laser emission end of laser instrument (3) with contained angle between beam combining mirror (4) is 45, the laser emission end of laser instrument two (5) with contained angle between beam combining mirror (4) is 45, laser instrument one (3) with laser instrument two (5) light wave forms light plane (6).
2. The dual light source line structure light sensor of claim 1, wherein: the second laser (5) is positioned between the first laser (3) and the lens (2).
CN202011627997.5A 2020-12-31 2020-12-31 Double light source line structure light sensor Pending CN112833781A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011627997.5A CN112833781A (en) 2020-12-31 2020-12-31 Double light source line structure light sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011627997.5A CN112833781A (en) 2020-12-31 2020-12-31 Double light source line structure light sensor

Publications (1)

Publication Number Publication Date
CN112833781A true CN112833781A (en) 2021-05-25

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011627997.5A Pending CN112833781A (en) 2020-12-31 2020-12-31 Double light source line structure light sensor

Country Status (1)

Country Link
CN (1) CN112833781A (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06222295A (en) * 1993-01-28 1994-08-12 Ricoh Opt Ind Co Ltd Light source device and optical scanning device
CN201862583U (en) * 2010-10-15 2011-06-15 合肥美亚光电技术有限责任公司 Linear light source for producing multi-wavelength combined type laser by means of scanning
CN103885065A (en) * 2014-03-21 2014-06-25 中国科学院上海光学精密机械研究所 Dual-wavelength dipulse non-fuzzy laser ranging device
CN104457611A (en) * 2014-12-11 2015-03-25 南京师范大学 Dual-wavelength shearing interference digital holography microscope measuring device and method thereof
CN105043946A (en) * 2015-07-08 2015-11-11 浙江大学 Dual-wavelength based scattering angle self-calibration full-field rainbow measurement method and device
CN107449361A (en) * 2017-07-25 2017-12-08 西安工业大学 A kind of dual wavelength of stabilization interferes microscope equipment and its application method in real time
CN107797214A (en) * 2016-09-07 2018-03-13 海信集团有限公司 Dichroscope detects adjustment system
CN109283186A (en) * 2018-10-12 2019-01-29 成都精工华耀科技有限公司 A kind of double spectrum two-dimensionals of track visualization inspection and three-dimensional fusion imaging system
CN109579778A (en) * 2019-01-11 2019-04-05 哈尔滨工业大学 One kind being based on dual wave length spectrophotometry auto-collimation three-dimensional perspective measuring device and method
CN111761205A (en) * 2020-07-10 2020-10-13 上海嘉强自动化技术有限公司 Dual-waveband laser swing welding optical system

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06222295A (en) * 1993-01-28 1994-08-12 Ricoh Opt Ind Co Ltd Light source device and optical scanning device
CN201862583U (en) * 2010-10-15 2011-06-15 合肥美亚光电技术有限责任公司 Linear light source for producing multi-wavelength combined type laser by means of scanning
CN103885065A (en) * 2014-03-21 2014-06-25 中国科学院上海光学精密机械研究所 Dual-wavelength dipulse non-fuzzy laser ranging device
CN104457611A (en) * 2014-12-11 2015-03-25 南京师范大学 Dual-wavelength shearing interference digital holography microscope measuring device and method thereof
CN105043946A (en) * 2015-07-08 2015-11-11 浙江大学 Dual-wavelength based scattering angle self-calibration full-field rainbow measurement method and device
CN107797214A (en) * 2016-09-07 2018-03-13 海信集团有限公司 Dichroscope detects adjustment system
CN107449361A (en) * 2017-07-25 2017-12-08 西安工业大学 A kind of dual wavelength of stabilization interferes microscope equipment and its application method in real time
CN109283186A (en) * 2018-10-12 2019-01-29 成都精工华耀科技有限公司 A kind of double spectrum two-dimensionals of track visualization inspection and three-dimensional fusion imaging system
CN109579778A (en) * 2019-01-11 2019-04-05 哈尔滨工业大学 One kind being based on dual wave length spectrophotometry auto-collimation three-dimensional perspective measuring device and method
CN111761205A (en) * 2020-07-10 2020-10-13 上海嘉强自动化技术有限公司 Dual-waveband laser swing welding optical system

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