CN112817803A - Method for testing LED lamp of hard disk backboard - Google Patents
Method for testing LED lamp of hard disk backboard Download PDFInfo
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- CN112817803A CN112817803A CN202011611183.2A CN202011611183A CN112817803A CN 112817803 A CN112817803 A CN 112817803A CN 202011611183 A CN202011611183 A CN 202011611183A CN 112817803 A CN112817803 A CN 112817803A
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- power
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- back plate
- led lamp
- controller
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- 238000012360 testing method Methods 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 title claims abstract description 25
- 230000002159 abnormal effect Effects 0.000 description 3
- 238000006467 substitution reaction Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000007488 abnormal function Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
Abstract
The invention provides a method for testing an LED lamp of a hard disk backboard, which comprises the following steps: connecting the anode of the LED lamp to be tested with a first back plate power pin, and controlling the first back plate power pin to output constant voltage; connecting the negative electrode of the LED lamp to be tested with the controller through a second backboard power pin; and the controller controls the pin potential of the power supply of the second back plate to realize the on-off control of the LED lamp to be tested. The invention can reduce the hardware damage risk caused by repeated assembly and disassembly of the hard disk backplane of the whole server, and does not need to enter the Linux system for operation, thereby reducing the waiting time and improving the testing efficiency.
Description
Technical Field
The invention belongs to the technical field of servers, and particularly relates to a method for testing an LED lamp of a hard disk backboard.
Background
The problem that the server can not be lightened due to the abnormal function of the hard disk backboard LED can occur in the whole machine testing or maintaining process, the abnormal hard disk backboard needs to be maintained and then the corresponding hard disk backboard is assembled on the whole machine server to be powered on for LED testing, and the operation defects are as follows: 1, repeated assembly and complicated work; 2, the LED function is required to be tested in a Linux system, and the efficiency is low.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a method for testing an LED lamp of a hard disk backboard, which aims to solve the technical problems.
The invention provides a method for testing an LED lamp of a hard disk backboard, which comprises the following steps:
connecting the anode of the LED lamp to be tested with a first back plate power pin, and controlling the first back plate power pin to output constant voltage;
connecting the negative electrode of the LED lamp to be tested with the controller through a second backboard power pin;
and the controller controls the pin potential of the power supply of the second back plate to realize the on-off control of the LED lamp to be tested.
Further, the method further comprises:
the constant voltage was set to 3.3V.
Further, through the controller control second backplate power stitch electric potential, realize to the LED lamp that awaits measuring break-make electricity control includes:
configuring a test instruction combination at the controller, wherein the test instruction combination comprises a low potential control instruction, a low potential duration and a high potential control instruction;
and executing the test instruction combination.
Further, the method further comprises:
the controller collects the current information of the power pins of the second back plate in real time and stores the current information to a test log.
Further, the method further comprises:
and the controller judges whether the state change of the current information is matched with the change of the pin potential of the second backboard power supply.
Further, the method further comprises:
if the controller judges that the potential of the power pin of the second back plate is set to be a low potential and the current information comprises a current value not 0, judging that the power-on state is matched;
if the controller judges that the potential of the power pin of the second back plate is set to be high potential and the current information comprises a current value of 0, judging that the power-off state is matched;
and if the power-on state and the power-off state are matched, judging that the state change of the current information is matched with the change of the potential of the power pin of the second back plate.
Further, the method further comprises:
and if the state change of the current information is not matched with the change of the pin potential of the power supply of the second back plate, the controller controls a buzzer to start alarming.
Further, the method further comprises:
and the controller controls the buzzer to play a prompt tone after the test instruction combination is executed.
The beneficial effect of the invention is that,
according to the method for testing the LED lamp of the hard disk backboard, the controller is matched with the technology of the hard disk backboard components to directly test the LED of the hard disk backboard, and the LED is assembled on the whole machine after the test is passed, so that the hardware risk of the whole machine of the server caused by repeated assembly of the backboard is reduced, and the efficiency is improved. The invention can reduce the hardware damage risk caused by repeated assembly and disassembly of the hard disk backplane of the whole server, and does not need to enter the Linux system for operation, thereby reducing the waiting time and improving the testing efficiency.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
Drawings
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is an exemplary flow chart of a method of one embodiment of the present application;
FIG. 2 is a schematic diagram of an LED and controller connection configuration of a method according to an embodiment of the present application.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
In the description of the present invention, it is to be understood that the terms "first", "second", and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.
The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
Example 1
The embodiment provides a method for testing an LED lamp of a hard disk backboard, which comprises the following steps:
referring to fig. 1 and fig. 2, the LED voltage Pin on the hard disk backplane after maintenance is added with a corresponding voltage (normally, 3.3V) through the CONN (first power Pin) on the backplane, and the LED cathode is also connected to the controller through the CONN (second power Pin) on the backplane on the corresponding control IO port. The controller adopted in the embodiment is a single chip microcomputer.
After connection is finished, the corresponding control switch is pressed, the controller executes a preset test instruction combination (comprising a low-potential control instruction, low-potential duration and a high-potential control instruction), firstly, the low-potential control instruction is sent, the corresponding IO port of the LED is converted from high level to low level, at the moment, a voltage difference (about 1.7V) exists between two ends of the LED, 2-20mA current flows through the two ends of the LED, and the LED is lightened; after the duration time of the low potential reaches the preset time, the controller sends the high potential control instruction again to enable the corresponding IO port of the LED to be changed into a high level, at the moment, the two ends of the LED are both high levels, and the LED is turned off. At the moment, the controller sends an instruction to the buzzer to send out a dripping sound, and the PASS green lamp is turned on to prompt that the test is finished.
When the IO port of the controller corresponding to the LED is at a low level, the LED is not on, and the FAIL is tested, which may be due to an abnormal LED on the backplane or an abnormal circuit connected to the LED on the backplane.
In another embodiment of the present invention, the controller acquires the current information after the potential of the corresponding IO port is changed, and stores the current information in the test log. The controller judges whether the state change of the current information is matched with the change of the electric potential of the power pin of the second back plate. If the controller judges that the potential of the power pin of the second back plate is set to be a low potential and the current information comprises that the current value is not 0, judging that the power-on state is matched; if the controller judges that the potential of the power pin of the second back plate is set to be high potential and the current information comprises a current value of 0, judging that the power-off state is matched; and if the power-on state and the power-off state are matched, judging that the state change of the current information is matched with the change of the electric potential of the power pin of the second back plate. And if the state change of the current information is not matched with the change of the pin potential of the power supply of the second back plate, the controller controls the buzzer to start alarming.
The invention can realize the rapid test of the backboard LED and improve the efficiency.
Although the present invention has been described in detail by referring to the drawings in connection with the preferred embodiments, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. A method for testing an LED lamp of a hard disk backboard is characterized by comprising the following steps:
connecting the anode of the LED lamp to be tested with a first back plate power pin, and controlling the first back plate power pin to output constant voltage;
connecting the negative electrode of the LED lamp to be tested with the controller through a second backboard power pin;
and the controller controls the pin potential of the power supply of the second back plate to realize the on-off control of the LED lamp to be tested.
2. The method of claim 1, further comprising:
the constant voltage was set to 3.3V.
3. The method according to claim 1, wherein the controlling the second backplane power pin potential through the controller to realize the power on and power off control of the LED lamp to be tested comprises:
configuring a test instruction combination at the controller, wherein the test instruction combination comprises a low potential control instruction, a low potential duration and a high potential control instruction;
and executing the test instruction combination.
4. The method of claim 1, further comprising:
the controller collects the current information of the power pins of the second back plate in real time and stores the current information to a test log.
5. The method of claim 4, further comprising:
and the controller judges whether the state change of the current information is matched with the change of the pin potential of the second backboard power supply.
6. The method of claim 5, further comprising:
if the controller judges that the potential of the power pin of the second back plate is set to be a low potential and the current information comprises a current value not 0, judging that the power-on state is matched;
if the controller judges that the potential of the power pin of the second back plate is set to be high potential and the current information comprises a current value of 0, judging that the power-off state is matched;
and if the power-on state and the power-off state are matched, judging that the state change of the current information is matched with the change of the potential of the power pin of the second back plate.
7. The method of claim 6, further comprising:
and if the state change of the current information is not matched with the change of the pin potential of the power supply of the second back plate, the controller controls a buzzer to start alarming.
8. The method of claim 3, further comprising:
and the controller controls the buzzer to play a prompt tone after the test instruction combination is executed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011611183.2A CN112817803A (en) | 2020-12-30 | 2020-12-30 | Method for testing LED lamp of hard disk backboard |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011611183.2A CN112817803A (en) | 2020-12-30 | 2020-12-30 | Method for testing LED lamp of hard disk backboard |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112817803A true CN112817803A (en) | 2021-05-18 |
Family
ID=75855012
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011611183.2A Withdrawn CN112817803A (en) | 2020-12-30 | 2020-12-30 | Method for testing LED lamp of hard disk backboard |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112817803A (en) |
-
2020
- 2020-12-30 CN CN202011611183.2A patent/CN112817803A/en not_active Withdrawn
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| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20210518 |
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| WW01 | Invention patent application withdrawn after publication |