CN112798149A - Multi-channel thermal resistance measuring device and redundant multi-channel thermal resistance measuring device - Google Patents
Multi-channel thermal resistance measuring device and redundant multi-channel thermal resistance measuring device Download PDFInfo
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Abstract
The invention discloses a multi-channel thermal resistance measuring device which comprises a test constant current source, a complementary constant current source, a mutual exclusion switch group and a plurality of channel circuits, wherein the test constant current source is connected with the test constant current source; the test constant current source and the complementary constant current source are mutually exclusive connected to the channel circuit through the mutual exclusion switch group; the channel circuit comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source, and the idle channel circuit is supplied with power through the position supplementing constant current source. This application passes through mutually exclusive switch block switches complement a constant current source with the test constant current source, the charge-discharge process of electric capacity in having avoided the circuit makes the electric current that flows through the thermal resistance that awaits measuring not jump, has improved measurement of efficiency greatly, has promoted the measurement accuracy simultaneously. The invention also provides a redundant multi-channel thermal resistance measuring device and temperature measuring equipment with the beneficial effects.
Description
Technical Field
The invention relates to the field of process automation, in particular to a multi-channel thermal resistance measuring device, a redundant multi-channel thermal resistance measuring device and temperature measuring equipment.
Background
In process automation field, RTD (thermal resistance) measuring efficiency and rate of accuracy are key in the field always, for guaranteeing efficiency and saving cost, often adopt multichannel thermal resistance measuring device in the field, include a plurality of passageway circuits on single thermal resistance measuring device promptly, every passageway circuit connection thermal resistance that awaits measuring, multichannel thermal resistance measuring device loops through the signal of telecommunication that different thermal resistance were obtained to different passageway circuits according to predetermined order. However, due to the coupling capacitor in the measured thermal resistor or connected to the measured thermal resistor, or the capacitance carried by the multi-channel thermal resistor measuring device, when the originally idle channel circuit starts to be powered on and enters a working state or powered off and enters an idle state, the current flowing through the thermal resistor jumps, the current cannot reach a balance state immediately when being used normally, certain charging and discharging time is needed, the measured data is significant, the efficiency of measuring the thermal resistor is greatly slowed, and the measurement accuracy is reduced.
Therefore, how to prevent the current flowing through the thermal resistor from jumping and reduce the charging and discharging time of the capacitor in the circuit, thereby improving the measurement efficiency and accuracy is a problem to be solved urgently by those skilled in the art.
Disclosure of Invention
The invention aims to provide a multi-channel thermal resistance measuring device, a redundant multi-channel thermal resistance measuring device and temperature measuring equipment, and aims to solve the problems that in the prior art, the current flowing through a thermal resistance jumps, the charging and discharging time of a capacitor in a circuit is too long, and the testing efficiency and accuracy are low.
In order to solve the technical problem, the invention provides a multi-channel thermal resistance measuring device, which comprises a test constant current source, a complementary constant current source, a mutual exclusion switch group and a plurality of channel circuits, wherein the test constant current source is connected with the complementary constant current source;
the test constant current source and the complementary constant current source are mutually exclusive connected to the channel circuit through the mutual exclusion switch group;
the channel circuit comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source, and the idle channel circuit is supplied with power through the position supplementing constant current source.
Optionally, in the multi-channel thermal resistance measuring device, the mutually-exclusive switch group comprises a plurality of bidirectional switches;
the bidirectional switch comprises two MOS tubes which are arranged in series.
Optionally, in the multi-channel thermal resistance measuring device, the multi-channel thermal resistance measuring device includes a plurality of the complementary constant current sources;
the bit-complementing constant current source corresponds to the channel circuit.
Optionally, in the multi-channel thermal resistance measuring device, the test constant current source is a voltage-current conversion circuit.
Optionally, in the multi-channel thermal resistance measuring device, the complementary constant current source is a voltage/resistance circuit;
the voltage/resistance circuit comprises a voltage supply and a current-limiting resistor connected in series with the voltage supply.
Alternatively, in the multi-channel thermal resistance measuring device, the channel circuit may be any one of a two-wire system wiring circuit, a three-wire system wiring circuit, and a four-wire system wiring circuit.
Optionally, in the multi-channel thermal resistance measurement device, the number of channel circuits included in the multi-channel thermal resistance measurement device is 2 to 16, inclusive.
A redundant multi-channel thermal resistance measurement device comprising a plurality of multi-channel thermal resistance measurement devices as described in any one of the above.
Optionally, in the redundant multi-channel thermal resistance measurement device, the thermal resistances to be measured corresponding to the working channel circuits of the multi-channel thermal resistance measurement device at the same time are different.
A thermometric apparatus comprising a multi-channel thermal resistance measurement device according to any one of the preceding claims.
The invention provides a multi-channel thermal resistance measuring device, which comprises a test constant current source, a complementary constant current source, a mutual exclusion switch group and a plurality of channel circuits; the test constant current source and the complementary constant current source are mutually exclusive connected to the channel circuit through the mutual exclusion switch group; the channel circuit comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source, and the idle channel circuit is supplied with power through the position supplementing constant current source.
The position supplementing constant current source is additionally arranged in the device, the testing constant current source and the position supplementing constant current source are mutually exclusive connected through the mutual exclusion switch group and supply power to the channel circuit, namely the measuring channel can be switched between two states of supplying power to the testing constant current source or supplying power to the position supplementing constant current source, and the testing constant current source is used for supplying power to a working channel circuit which is measuring the electrical parameters of the thermal resistor to be measured, so that a measuring result with high accuracy is obtained; for the idle channel circuit which is not measured, the low-precision constant current power supply is used for ensuring that various capacitors in the circuit are in the same electrical state as those in formal measurement, and when the idle channel circuit is converted into a working channel circuit, the complementary constant current source is directly switched to the testing constant current source through the mutual exclusion switch group, so that the charging and discharging processes of the capacitors in the circuit are avoided, the current flowing through the thermal resistor to be measured does not jump, the measurement efficiency is greatly improved, and the measurement accuracy is improved. The invention also provides a redundant multi-channel thermal resistance measuring device and temperature measuring equipment with the beneficial effects.
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In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic structural diagram of an embodiment of a multi-channel thermal resistance measuring device provided by the present invention;
FIG. 2 is a schematic circuit diagram of one embodiment of a multi-channel thermal resistance measurement device provided by the present invention;
FIG. 3 is a schematic diagram of a series MOS transistor of an embodiment of a multi-channel thermal resistance measurement apparatus provided by the present invention;
FIG. 4 is a schematic circuit diagram of one embodiment of a redundant multi-channel thermal resistance measurement device provided by the present invention;
fig. 5 is a schematic structural diagram of a mutually exclusive selector switch set control circuit according to an embodiment of the multi-channel thermal resistance measurement apparatus of the present invention.
Detailed Description
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The core of the invention is to provide a multi-channel thermal resistance measuring device, the structure schematic diagram of one specific implementation is shown in fig. 1, which is called as the first specific implementation, and comprises a test constant current source 1, a complementary constant current source 2, a mutual exclusion switch group 3 and a plurality of channel circuits 4;
the testing constant current source 1 and the complementary constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutual exclusion switch group 3;
the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source 1, and the idle channel circuit is supplied power through the position supplementing constant current source 2.
It is easy to find that the testing constant current source 1 in the invention needs to provide current for the electrical signal testing process of the thermal resistor, so the precision requirement is higher, and the observation of the bit-complementing constant current source 2 only needs to ensure that the charging and discharging state of the capacitor in the circuit is consistent with that in the formal measurement, so the requirement on the current precision is not high, namely the precision requirement of the bit-complementing constant current source 2 is low.
In addition, the multichannel thermal resistance measuring device comprises a plurality of complementary constant current sources 2; the bit-complementing constant current source 2 corresponds to the channel circuit 4; namely, each channel circuit 4 corresponds to one bit-compensating constant current source 2, the bit-compensating constant current source has low requirement and low cost, and each channel circuit 4 is provided with one bit-compensating constant current source, so that the circuit layout is more flexible, the wiring difficulty is lower, and the application range is wider. Furthermore, the multi-channel thermal resistance measuring device only comprises one test constant current source 1, the precision requirement of the test constant current source 1 is high, the cost is high, and only one test constant current source 1 is arranged, so that the production cost is low. In the example shown in fig. 1, each channel circuit 4 corresponds to one test constant current source 1 and one complementary constant current source 2, and the selection can be made according to specific situations in practical use.
Further, the test constant current source 1 is a voltage-current conversion circuit, and in the following specific example, the test constant current source 1 provides a constant current of 0.5mA for the voltage-current conversion circuit (the specific current source can be adjusted as required). The testing constant current source 1 selects an INA132 integrated differential operational amplifier chip of TI and a REF3212 reference source chip. The accuracy is 0.2% at most; low quiescent current, about 100 μ A.
Still further, the bit-complementing constant current source 2 is a voltage/resistance circuit; the voltage/resistance circuit comprises a voltage supply V3 and a current limiting resistor R3 connected in series with the voltage supply V3, and for cost, the current of the low-precision constant current source is obtained in a voltage/resistance mode, is not really constant current, and is obtained by connecting a large resistor (namely the current limiting resistor R3, the resistance of which is far higher than that of other components in the circuit) in series at the output end of a voltage source to obtain the current close to the constant current source. Continuing to connect to the above example, a common power supply (for example, 24V) in the board card is used to connect in series a resistor (for example, 40K) with a certain resistance value and then supply power to the external RTD, so that the current flowing through the RTD is about 0.5 mA.
In addition, the channel circuit 4 is any one of a two-wire system wiring circuit, a three-wire system wiring circuit and a four-wire system wiring circuit, and of course, other wiring methods may be selected according to actual conditions to connect the thermal resistor to be tested.
The multi-channel thermal resistance measuring device further comprises 2 to 16 channel circuits 4, including end points, such as 2.0, 5.0 or 16.0, which may be varied according to actual conditions.
It should be noted that, in fig. 1, the RTD1 refers to the thermal resistance to be tested in the first channel circuit 4, and the RTDn refers to the thermal resistance to be tested between the nth channel circuits 4, and it is obvious from fig. 1 that the mutex switch group 3 corresponding to the channel circuit 4 corresponding to the RTD1 points to the test constant current source 1, that is, the channel circuit 4 corresponding to the RTD1 is the working channel circuit, and correspondingly, the channel circuit 4 corresponding to the RTDn is an idle channel circuit.
Fig. 2 is a circuit structure diagram of an embodiment of the multi-channel thermal resistance measuring device provided in the present application, where I1 and I2 in the diagram are the testing constant current sources 1, I3 and I4 are the complementary constant current sources 2, it should be noted that in the embodiment shown in fig. 2, the testing constant current sources 1 corresponding to different channel circuits 4 are I1 and I2, but I3 and I4 are different complementary constant current sources 2 corresponding to different channel circuits 4, respectively.
The principle of thermal resistance measurement is illustrated by way of example in fig. 2:
1) in an acquisition cycle, the MOS switch (i.e., the exclusive selector switch group 3) is used for switching control, the N-path thermal resistance signals are sequentially connected to the rear-end acquisition circuit, and the current channel signal is acquired by the AD and transmitted to the subsequent processing (not shown in the figure).
2) I1 and I2 are two high-precision constant current sources, and S0_ A, S0_ B, S0_ C, S0_ D, S0_ E, S0_ F, S0_ G, S3 and S8 are MOS analog switches. When the two-wire system is connected, I1 and I2 are controlled by the analog switch to be switched simultaneously, and n-path thermal resistance signals are sequentially connected. The low-precision constant current I3 is controlled by a switch S3, and mutually exclusive with the switching of I1 and I2, and when I1 and I2 are not conducted, I3 is conducted, so that the current flowing through the thermal resistor does not jump, and the charging and discharging time of a channel filter circuit part is reduced.
3) When the four-wire system is connected, I2 is disconnected, and the constant current source I1 and the low-precision constant current I3 are switched to be connected with a two-wire system and a three-wire system.
4) The redundancy switching is realized by controlling the switch through the master-slave signal of the module. And when the module is a main module, the switch is switched normally, and n paths of thermal resistance signals are sequentially switched on. The switches are all disconnected when the slave module is used, so that the collection of the master module is not influenced.
5) The analog switch in the figure is formed by connecting two MOS tubes in series, so that a bidirectional switch can be realized, and the current is prevented from being uncontrollable reversely when the MOS tube switches are disconnected due to the influence of a parasitic diode. The switch S0_ C is used for preventing the current of the constant current source I1 of the main module from being shunted into the main module when the module redundantly uses the main module as a slave, and the accuracy of the main module is influenced.
6) Switching control of the channel switches as shown in fig. 5, the MCU controls the 3-8 decoders (138 devices in the figure) to gate 8 channels in turn. When the board is a master module, the master-slave signal of the board is at a low level, and is at a high level after passing through the not gate, so that the switching of the switches S3 (corresponding to S3 in fig. 2), S0 (corresponding to S0_ A, S0_ B, S0_ C, S0_ D, S0_ E, S0_ F, S0_ G in fig. 2) and S8 (corresponding to S8 in fig. 2) is not affected, and the switching principle controlled by the MCU is shown in steps 2) and 3, wherein the constant current source I2 is disconnected when the four-wire system is connected, so that the S8 (corresponding to S8 in fig. 2) is disconnected by outputting a low level through a wire system control signal. When the slave board is a slave module, the master-slave signal of the slave board is at a high level, and after passing through the not gate, the slave board is at a low level, so that S3 (corresponding to S3 in fig. 2), S0 (corresponding to S0_ A, S0_ B, S0_ C, S0_ D, S0_ E, S0_ F, S0_ G in fig. 2) and S8 (corresponding to S8 in fig. 2) are all turned off.
Taking a two-wire connection as an example, A, B wires of each channel are respectively connected with two ends of the thermal resistor during connection, and C and B are in short circuit at terminals. When the signal of the channel 1 corresponding to the RTD1 is collected, S0_ A, S0_ B, S0_ C, S0_ D, S0_ E, S0_ F, S0_ G, S8 is simultaneously turned on, and the corresponding switch of the channel 2 is turned off. Constant current source currents I1, I2 flow through the channel 1 signal acquisition conditioning section, and S0_ D, S0_ E, S0_ F, S0_ G of channel 2 is off, so the current of channel 1 does not flow to channel 2 through S0_ D, S0_ E, S0_ F, S0_ G of channel 2. The S3 of the channel 1 is disconnected, the low-precision constant current I3 is disconnected, the S3 of the channel 2 is conducted, and the low-precision constant current (namely the current of the position-complementing constant current source 2) flows through the diode and the thermal resistor in the figure to the current site in the board. Because the switch S0_ D, S0_ E of the channel 2 is turned off, the low-precision constant current does not flow to the channel 1 through the switch S0_ D, S0_ E of the channel 2, and the channels do not affect each other.
For short-circuit and over-range faults, the current flow direction is the same as that in the case of no fault, and the analysis shows that the short-circuit and over-range faults of the channel have no influence on other channels. The channel disconnection, grounding, channel power frequency and high-frequency interference analysis and non-redundant configuration do not affect other channel circuits 4.
The invention provides a multi-channel thermal resistance measuring device, which comprises a test constant current source 1, a complementary constant current source 2, a mutual exclusion switch group 3 and a plurality of channel circuits 4; the testing constant current source 1 and the complementary constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutual exclusion switch group 3; the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source 1, and the idle channel circuit is supplied power through the position supplementing constant current source 2. The position-complementing constant current source 2 is additionally arranged in the device, the testing constant current source 1 and the position-complementing constant current source 2 are mutually exclusive connected through the mutual exclusion switch group and supply power to the channel circuit 4, namely the measuring channel can be switched between two states of supplying power to the testing constant current source 1 or supplying power to the position-complementing constant current source 2, and the testing constant current source 1 is used for supplying power to a working channel circuit which is measuring the electrical parameters of the thermal resistor to be measured, so that a measuring result with high accuracy is obtained; for an idle channel circuit which is not measured, the low-precision constant current power supply is used for ensuring that various capacitors in the circuit are in the same electrical state as those in formal measurement, and when the idle channel circuit is converted into a working channel circuit, the complementary constant current source 2 is directly switched to the testing constant current source 1 through the mutual exclusion switch group, so that the charging and discharging processes of the capacitors in the circuit are avoided, the current flowing through the thermal resistor to be measured does not jump, the measurement efficiency is greatly improved, and the measurement accuracy is improved.
On the basis of the first embodiment, the mutex switch group 3 is further limited to obtain a second embodiment, which has the same structural schematic diagram as the first embodiment and comprises a test constant current source 1, a complementary constant current source 2, a mutex switch group 3 and a plurality of channel circuits 4;
the testing constant current source 1 and the complementary constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutual exclusion switch group 3;
the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutual exclusion switch group through the test constant current source 1, and the idle channel circuit is powered by the bit-complementing constant current source 2;
the mutually exclusive switch group comprises a plurality of bidirectional switches;
the bidirectional switch comprises two MOS tubes which are arranged in series.
For example, the MOSFET used as the analog switch is an N-channel fet mounted ON 2N7002K from ON Semiconductor corporation, which has ESD protection, HBM mode 2000V, low ON-resistance, Vgs of 4.5V, and Id of 200mA not exceeding 2.5 Ω.
In the circuit in the embodiment, two MOS tubes are connected in series to realize the bidirectional switch, so that the possibility that current can still flow at the DS end through the parasitic diode when the MOS switch is disconnected can be completely eliminated, the mutual influence among different channel circuits 4 is avoided, and the working stability and the measurement accuracy of the device are improved.
Fig. 3 is a schematic diagram of a connection mode of two MOS transistors connected in series to form a bidirectional switch, and Q9 and Q75 are two MOS transistors connected in series. Of course, fig. 3 is only one way, and other connection ways may be selected according to specific situations in practical use as long as the requirement of the bidirectional switch is met.
The invention also provides a redundant multi-channel thermal resistance measuring device, a structural schematic diagram of one specific embodiment of which is shown in fig. 4 and called as a third specific embodiment, and the redundant multi-channel thermal resistance measuring device comprises a plurality of multi-channel thermal resistance measuring devices as described in any one of the above.
In a preferred embodiment, in the redundant multi-channel thermal resistance measuring device, the thermal resistances to be measured corresponding to the working channel circuits of the multi-channel thermal resistance measuring device at the same time are different. Because the redundant multi-channel thermal resistance measuring device provided by the invention maintains the electric state of the capacitor for the idle channel circuit through the position-complementing constant current source 2, current jump does not occur, and waiting for electrification or discharge of the capacitor is not needed.
Furthermore, by using two MOS transistors connected in series to implement a bidirectional switch, it is further possible to avoid the interaction between different redundancies (i.e. between different multi-channel thermal resistance measuring devices).
The modules 1 and 2 in fig. 4 are two mutually redundant multi-channel thermal resistance measuring devices, and the number of the redundant multi-channel thermal resistance measuring devices can be set according to specific situations, taking fig. 4 as an example, taking the module 1 as a slave module and the module 2 as a master module as a representative analysis. The channel switches of the slave module 1 are all turned off, and the switches of the master module 1 are sequentially turned on and off. At the D terminal of each channel, S0_ A, S0_ B, S0_ C of the slave module 1 is disconnected, and the current of the master module does not flow from the D terminal into the slave module. Also, the current of the master does not flow from the a and B terminals into the slave. The current of the main module flows into the slave module from the C terminal and then flows to the field of the slave module through the resistor, the same resistor is connected in parallel to the C terminal of the main module and is connected to the field, and the acquisition precision of the module is not influenced because the C terminal is the acquisition public end. The modules do not influence each other when the redundancy is configured.
The invention also provides temperature measuring equipment which comprises the multi-channel thermal resistance measuring device as claimed in any one of the above claims. The invention provides a multi-channel thermal resistance measuring device, which comprises a test constant current source 1, a complementary constant current source 2, a mutual exclusion switch group 3 and a plurality of channel circuits 4; the testing constant current source 1 and the complementary constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutual exclusion switch group 3; the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source 1, and the idle channel circuit is supplied power through the position supplementing constant current source 2. The position-complementing constant current source 2 is additionally arranged in the device, the testing constant current source 1 and the position-complementing constant current source 2 are mutually exclusive connected through the mutual exclusion switch group and supply power to the channel circuit 4, namely the measuring channel can be switched between two states of supplying power to the testing constant current source 1 or supplying power to the position-complementing constant current source 2, and the testing constant current source 1 is used for supplying power to a working channel circuit which is measuring the electrical parameters of the thermal resistor to be measured, so that a measuring result with high accuracy is obtained; for an idle channel circuit which is not measured, the low-precision constant current power supply is used for ensuring that various capacitors in the circuit are in the same electrical state as those in formal measurement, and when the idle channel circuit is converted into a working channel circuit, the complementary constant current source 2 is directly switched to the testing constant current source 1 through the mutual exclusion switch group, so that the charging and discharging processes of the capacitors in the circuit are avoided, the current flowing through the thermal resistor to be measured does not jump, the measurement efficiency is greatly improved, and the measurement accuracy is improved.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
It is to be noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The multi-channel thermal resistance measuring device, the redundant multi-channel thermal resistance measuring device and the temperature measuring equipment provided by the invention are described in detail above. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (10)
1. A multi-channel thermal resistance measuring device is characterized by comprising a test constant current source, a complementary constant current source, a mutual exclusion switch group and a plurality of channel circuits;
the test constant current source and the complementary constant current source are mutually exclusive connected to the channel circuit through the mutual exclusion switch group;
the channel circuit comprises a working channel circuit and an idle channel circuit, the mutual exclusion changeover switch group is used for supplying power to the working channel circuit through the test constant current source, and the idle channel circuit is supplied with power through the position supplementing constant current source.
2. The multi-channel thermal resistance measurement device of claim 1, wherein the mutually exclusive switch bank comprises a plurality of bidirectional switches;
the bidirectional switch comprises two MOS tubes which are arranged in series.
3. A multi-channel thermal resistance measuring device as claimed in claim 1, wherein said multi-channel thermal resistance measuring device comprises a plurality of said complementary constant current sources;
the bit-complementing constant current source corresponds to the channel circuit.
4. The multi-channel thermal resistance measurement device of claim 1, wherein the test constant current source is a voltage-to-current conversion circuit.
5. The multi-channel thermal resistance measuring device of claim 1, wherein the complementary constant current source is a voltage/resistance circuit;
the voltage/resistance circuit comprises a voltage supply and a current-limiting resistor connected in series with the voltage supply.
6. The multi-channel thermal resistance measurement device of claim 1, wherein the channel circuit is any one of a two-wire wiring circuit, a three-wire wiring circuit, and a four-wire wiring circuit.
7. A multi-channel thermal resistance measurement device as claimed in claim 1 comprising a number of channel circuits from 2 to 16 inclusive.
8. A redundant multi-channel thermal resistance measurement device, comprising a plurality of multi-channel thermal resistance measurement devices according to any one of claims 1 to 7.
9. The redundant multi-channel thermal resistance measurement device of claim 8, wherein a plurality of the multi-channel thermal resistance measurement devices have different thermal resistances to be measured for the working channel circuits at the same time.
10. A thermometric apparatus comprising a multi-channel thermal resistance measurement device according to any one of claims 1 to 7.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024001924A1 (en) * | 2022-06-30 | 2024-01-04 | 深圳市中兴微电子技术有限公司 | Temperature sensor, temperature sensor packaging method, and temperature measurement method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0979918A (en) * | 1995-09-13 | 1997-03-28 | Tokimec Inc | Method and circuit for measuring temperature using resistance temperature detector |
| JPH1056796A (en) * | 1996-08-09 | 1998-02-24 | Denso Corp | Conduction path switching circuit for electric load |
| JP2007327809A (en) * | 2006-06-07 | 2007-12-20 | Hayashi Denko Kk | Multi-channel temperature measuring circuit |
| JP2008309762A (en) * | 2007-06-18 | 2008-12-25 | Mitsubishi Materials Corp | Detector of liquid level and temperature around thermistor periphery |
| WO2017147947A1 (en) * | 2016-03-04 | 2017-09-08 | 广州时艺音响科技有限公司 | High power field effect transistor complementary output circuit having no source resistance |
-
2020
- 2020-12-29 CN CN202011600577.8A patent/CN112798149B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0979918A (en) * | 1995-09-13 | 1997-03-28 | Tokimec Inc | Method and circuit for measuring temperature using resistance temperature detector |
| JPH1056796A (en) * | 1996-08-09 | 1998-02-24 | Denso Corp | Conduction path switching circuit for electric load |
| JP2007327809A (en) * | 2006-06-07 | 2007-12-20 | Hayashi Denko Kk | Multi-channel temperature measuring circuit |
| JP2008309762A (en) * | 2007-06-18 | 2008-12-25 | Mitsubishi Materials Corp | Detector of liquid level and temperature around thermistor periphery |
| WO2017147947A1 (en) * | 2016-03-04 | 2017-09-08 | 广州时艺音响科技有限公司 | High power field effect transistor complementary output circuit having no source resistance |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024001924A1 (en) * | 2022-06-30 | 2024-01-04 | 深圳市中兴微电子技术有限公司 | Temperature sensor, temperature sensor packaging method, and temperature measurement method |
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