CN112770443A - Method for solving abnormal dark and bright of light emitting diode during scanning - Google Patents
Method for solving abnormal dark and bright of light emitting diode during scanning Download PDFInfo
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- CN112770443A CN112770443A CN202110116805.2A CN202110116805A CN112770443A CN 112770443 A CN112770443 A CN 112770443A CN 202110116805 A CN202110116805 A CN 202110116805A CN 112770443 A CN112770443 A CN 112770443A
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- 238000000034 method Methods 0.000 title claims abstract description 15
- 230000002159 abnormal effect Effects 0.000 title claims abstract description 13
- 238000010586 diagram Methods 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 239000013589 supplement Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/30—Driver circuits
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Abstract
The invention discloses a method for solving abnormal darkness and brightness of a light-emitting diode during scanning, which comprises the following steps: (1) a 3 x 8 lattice circuit is adopted; (2) scanning a Com every 4 ms; (3) when the Com1 is scanned, the Com1 is at low level, the triode is conducted, the DCom1 is at high level, the corresponding seg is pulled down according to the section of the nixie tube needing to be lightened, and the corresponding seg is put high according to the section which does not need to be lightened; (4) when scanning Com2 and Com3, pulling down the corresponding seg when the corresponding seg needs to be lightened as in the step (3), and setting up the corresponding seg when the corresponding seg does not need to be lightened; the invention has the advantages of solving the problem that the light-emitting diode is not normally dark and bright during scanning, reducing potential safety hazard and facilitating the use of people.
Description
Technical Field
The invention relates to the technical field of light emitting diodes, in particular to a method for solving abnormal dark and bright of a light emitting diode during scanning.
Background
Under the less condition of LED quantity, for reduce cost, can directly go to drive LED with main singlechip, in order to save singlechip IO mouth, use the hardware architecture of dot matrix usually, scan in proper order and light, there is certain problem when the dot matrix circuit that uses at present, the condition that LED normally can appear abnormal dark bright (being short time light) when normal use promptly, give other people and cause the illusion, there is certain potential safety hazard, inconvenient people use.
In view of the above, there is a need to improve the operation of the existing led so that it can meet the current requirement of normally dimming the led during scanning.
Disclosure of Invention
Because the existing light-emitting diode has the condition of abnormal darkness and brightness when in normal use, certain potential safety hazards exist when people use the light-emitting diode in a daily circuit, people can easily feel illusion, and people can not use the light-emitting diode conveniently, so that a method for solving the problem of abnormal darkness and brightness when the light-emitting diode is scanned is designed on the basis of the defects of the prior art, and the light-emitting diode is convenient to use by people.
The technical scheme of the invention is that the method for solving abnormal dark and bright problems during the scanning of the light emitting diode comprises the following steps:
(1) a 3 x 8 lattice circuit is adopted;
(2) scanning a Com every 4 ms;
(3) when the Com1 is scanned, the Com1 is at low level, the triode is conducted, the DCom1 is at high level, the corresponding seg is pulled down according to the section of the nixie tube needing to be lightened, and the corresponding seg is put high according to the section which does not need to be lightened;
(4) when scanning Com2 and Com3, as in step (3), the corresponding seg is pulled low when lighting is required and the corresponding seg is set high when lighting is not required.
In addition to the technical solution, the Com1 includes a resistor R1, a resistor R2 connected to the resistor R1, a transistor Q1 connected to the resistor R2, and a Dcom1 connected to the transistor.
To further supplement the technical scheme, the Dcom1 comprises 5 Light Emitting Diodes (LEDs) 1-5 connected in parallel, a resistor R3-7 and a two-bit nixie tube.
In addition to the technical solution, the structures of Com2, Com3 and Com1 are the same.
In a further addition to the present disclosure, the Com3 further includes a diode D6 and a resistor R8.
To further supplement the technical scheme, the DCom waveform is high level, the Seg waveform is low level, and the lamps connected to the two ends of the DCom waveform are lighted.
The invention has the advantages that the invention comprises a 3 x 8 dot matrix circuit, and a diode and a resistor are additionally designed on one Com, which can provide a discharge point loop when DCom is switched from high level to low level, so that DCom is also discharged to low level when Seg is low level, thereby solving the problem of abnormal darkness and brightness of the LED during scanning, reducing potential safety hazard and facilitating the use of people.
Drawings
FIG. 1 is a schematic circuit diagram of Com1, Com2 and Com3 according to the present invention;
FIG. 2 is a schematic diagram of the connection structure of Com1 and Com 2;
FIG. 3 is a schematic circuit diagram of DCom 1;
FIG. 4 is a schematic circuit diagram of DCom 3;
Detailed Description
Because the prior dot-matrix circuit has certain problems when processing the light-emitting diode, namely the light-emitting diode has abnormal dark and bright conditions when being used normally, certain potential safety hazards exist when people use the conventional circuit, people are easy to feel illusion, and people are inconvenient to use, so that a method for solving the abnormal dark and bright conditions when the light-emitting diode is scanned is designed on the basis of the defects of the prior art, and the light-emitting diode scanning method is convenient for people to use.
In order to make the technical solution more clear to those skilled in the art, the technical solution of the present invention will be described in detail below with reference to fig. 1 to 4:
a method for solving abnormal dark and bright problems during light emitting diode scanning comprises the following steps:
(1) a 3 x 8 lattice circuit is adopted;
(2) scanning a Com every 4 ms;
(3) when the Com1 is scanned, the Com1 is at low level, the triode is conducted, the DCom1 is at high level, the corresponding seg is pulled down according to the section of the nixie tube needing to be lightened, and the corresponding seg is put high according to the section which does not need to be lightened;
(4) when scanning Com2 and Com3, as in step (3), the corresponding seg is pulled low when lighting is required and the corresponding seg is set high when lighting is not required.
Under normal operation, the steps can scan normally and control the light of the light emitting diode to be on, the effect is good, the use of people is convenient,
as will be explained in detail below with respect to Com1, Com1 includes a resistor R1, a resistor R2 connected to resistor R1, a transistor Q1 connected to resistor R2, and a transistor Dcom1 connected to the transistor, where the structure of Dcom1 includes 5 parallel light emitting diodes LED 1-5, resistors R3-7, and a two-bit nixie tube, when Com1 is scanned, Com1 is at low level, the transistor is turned on, Dcom1 is at high level, a segment that needs to be lit according to one bit of the nixie tube pulls down a corresponding Seg, and a segment that does not need to be lit up sets up a corresponding Seg.
To further supplement the technical scheme, the DCom waveform is high level, the Seg waveform is low level, and the lamps connected to the two ends of the DCom waveform are lighted.
Furthermore, Com2, Com3 have the same structure as Com1, the transistor designed in Com2 is Q2, and the transistor designed in Com3 is Q3, except that Com3 further includes a diode D6 and a resistor R8, so as to provide a discharging point loop for DCom3 to switch from high level to low level, so that DCom3 is also discharged to low level when Seg1 is low level.
The technical solutions described above only represent the preferred technical solutions of the present invention, and some possible modifications to some parts of the technical solutions by those skilled in the art all represent the principles of the present invention, and fall within the protection scope of the present invention.
Claims (6)
1. A method for solving abnormal dark and bright problems during light emitting diode scanning is characterized by comprising the following steps:
(1) a 3 x 8 lattice circuit is adopted;
(2) scanning a Com every 4 ms;
(3) when the Com1 is scanned, the Com1 is at low level, the triode is conducted, the DCom1 is at high level, the corresponding Seg is pulled down according to the section of the nixie tube needing to be lightened, the section which does not need to be lightened is put high;
(4) when scanning Com2 and Com3, as in step (3), the corresponding seg is pulled low when lighting is required and the corresponding seg is set high when lighting is not required.
2. The method as claimed in claim 1, wherein the Com1 comprises a resistor R1, a resistor R2 connected to a resistor R1, a transistor Q1 connected to the resistor R2, and a transistor Dcom1 connected to the transistor.
3. The method as claimed in claim 2, wherein the Dcom1 comprises 5 parallel LEDs 1-5, a resistor R3-7 and a two-digit nixie tube.
4. The method as claimed in claim 3, wherein the Com2, Com3 and Com1 are identical in structure.
5. The method as claimed in claim 4, wherein the Com3 further comprises a diode D6 and a resistor R8.
6. The method as claimed in claim 1, wherein the DCom waveform is high and the Seg waveform is low, and the lamps connected to both ends of the DCom waveform are turned on.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110116805.2A CN112770443A (en) | 2021-01-27 | 2021-01-27 | Method for solving abnormal dark and bright of light emitting diode during scanning |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110116805.2A CN112770443A (en) | 2021-01-27 | 2021-01-27 | Method for solving abnormal dark and bright of light emitting diode during scanning |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112770443A true CN112770443A (en) | 2021-05-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110116805.2A Pending CN112770443A (en) | 2021-01-27 | 2021-01-27 | Method for solving abnormal dark and bright of light emitting diode during scanning |
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009168897A (en) * | 2008-01-11 | 2009-07-30 | Sony Corp | Light emitting display apparatus and data writing method thereof |
| CN102175943A (en) * | 2011-02-12 | 2011-09-07 | 中兴通讯股份有限公司 | Load overcurrent protector state detection device and method |
| CN202310213U (en) * | 2011-10-24 | 2012-07-04 | 段四才 | Line blanking circuit for scanning light emitting diode (LED) module |
| CN202549245U (en) * | 2012-01-17 | 2012-11-21 | 深圳蓝普科技有限公司 | LED (Light Emitting Diode) scanning circuit |
| CN103871355A (en) * | 2012-12-17 | 2014-06-18 | 上海得倍电子技术有限公司 | LED (light emitting diode) display large-screen high-speed scanning controller |
| CN104992675A (en) * | 2015-07-30 | 2015-10-21 | 西安诺瓦电子科技有限公司 | Led lamp panel |
| CN108376530A (en) * | 2018-02-11 | 2018-08-07 | 厦门强力巨彩光电科技有限公司 | Light-emitting diode display panel |
| CN208112600U (en) * | 2018-04-28 | 2018-11-16 | 厦门芯阳科技股份有限公司 | A kind of digital display and key scan multiplex circuit |
-
2021
- 2021-01-27 CN CN202110116805.2A patent/CN112770443A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009168897A (en) * | 2008-01-11 | 2009-07-30 | Sony Corp | Light emitting display apparatus and data writing method thereof |
| CN102175943A (en) * | 2011-02-12 | 2011-09-07 | 中兴通讯股份有限公司 | Load overcurrent protector state detection device and method |
| CN202310213U (en) * | 2011-10-24 | 2012-07-04 | 段四才 | Line blanking circuit for scanning light emitting diode (LED) module |
| CN202549245U (en) * | 2012-01-17 | 2012-11-21 | 深圳蓝普科技有限公司 | LED (Light Emitting Diode) scanning circuit |
| CN103871355A (en) * | 2012-12-17 | 2014-06-18 | 上海得倍电子技术有限公司 | LED (light emitting diode) display large-screen high-speed scanning controller |
| CN104992675A (en) * | 2015-07-30 | 2015-10-21 | 西安诺瓦电子科技有限公司 | Led lamp panel |
| CN108376530A (en) * | 2018-02-11 | 2018-08-07 | 厦门强力巨彩光电科技有限公司 | Light-emitting diode display panel |
| CN208112600U (en) * | 2018-04-28 | 2018-11-16 | 厦门芯阳科技股份有限公司 | A kind of digital display and key scan multiplex circuit |
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