CN112769500A - Signal testing method, system, electronic device and storage medium - Google Patents
Signal testing method, system, electronic device and storage medium Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 187
- 238000000034 method Methods 0.000 claims description 27
- 238000004891 communication Methods 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 2
- 125000004122 cyclic group Chemical group 0.000 description 5
- 230000006870 function Effects 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
- H04W24/02—Arrangements for optimising operational condition
Abstract
The invention discloses a signal testing method, a signal testing system, electronic equipment and a storage medium. The signal testing method comprises the following steps: sending a test instruction and generating a parameter configuration instruction; entering a signal test state according to the test instruction and generating a test signal; processing the test signal according to the parameter configuration instruction and generating test data; and collecting and processing the test data to obtain a test result. The embodiment of the invention can ensure the test stability of the equipment to be tested, thereby improving the test efficiency of the equipment to be tested.
Description
Technical Field
The present invention relates to the field of signal testing, and in particular, to a signal testing method, a signal testing system, an electronic device, and a storage medium.
Background
At present, when testing radio frequency products such as 2.4G modules and 5G modules, the power harmonic jitter is frequent and unstable, so that the product testing is unstable, and the retest rate is high, thereby influencing the testing efficiency of the products.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art. Therefore, the invention provides a signal testing method, a signal testing system, electronic equipment and a storage medium, which can ensure the testing stability of a product and improve the testing efficiency of the product.
The signal testing method according to the embodiment of the first aspect of the invention comprises the following steps: the upper computer sends a test instruction and generates a parameter configuration instruction; the equipment to be tested enters a signal test state according to the test instruction and generates a test signal; the acquisition device processes the test signal according to the parameter configuration instruction and generates test data; and the upper computer collects and processes the test data to obtain a test result.
The signal testing method provided by the embodiment of the invention at least has the following beneficial effects: the display window of the acquisition device is adjusted through the parameter configuration instruction, so that the test signal is located in the two-thirds and centered range of the display window, and the acquisition precision of the test signal and the test stability are guaranteed. The upper computer processes the test data generated by the acquisition device to obtain a test result, so that the test efficiency of the equipment to be tested is improved.
According to some embodiments of the invention, the generating the parameter configuration instruction comprises: the upper computer generates a central frequency configuration instruction; and the upper computer generates a frequency width configuration instruction.
According to some embodiments of the invention, the collecting and processing the test data to obtain the test result comprises: the acquisition device circularly acquires the test data; the upper computer stores the test data acquired in each cycle in an array; the upper computer reads the array according to a preset value taking method; and the upper computer compares the reading result with a preset threshold value to obtain a test result.
According to some embodiments of the present invention, the preset value-taking method includes: any one of a minimum value, a maximum value, a first average value, and a second average value.
A signal testing system according to an embodiment of the second aspect of the present invention includes: the upper computer is used for sending the test instruction and generating a parameter configuration instruction; the shielding device is used for placing equipment to be tested, the equipment to be tested is in communication connection with the upper computer, and the equipment to be tested enters a signal test state according to the test instruction and generates a test signal; the acquisition device is connected with the shielding device and used for processing the test signal according to the parameter configuration instruction and generating test data; the upper computer is also used for collecting and processing the test data to obtain a test result.
According to some embodiments of the invention, the upper computer is configured to generate a center frequency configuration instruction and a frequency width configuration instruction.
According to some embodiments of the invention, the acquisition device performs cyclic acquisition on the test data; the upper computer stores the data acquired in each cycle in an array; the upper computer reads the array according to a preset value taking method and compares the reading result with a preset threshold value to obtain a test result; the preset value taking method comprises the following steps: any one of a minimum value, a maximum value, a first average value, and a second average value.
An electronic device according to an embodiment of the third aspect of the present invention includes: a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor when executing the program implementing: a method of signal testing as described in any one of the above embodiments.
A computer-readable storage medium according to an embodiment of the third aspect of the present invention stores computer-executable instructions for: performing the signal testing method as described in any of the above embodiments.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The invention is further described with reference to the following figures and examples, in which:
FIG. 1 is a flow chart of a signal testing method according to an embodiment of the present invention;
FIG. 2 is another flow chart of a signal testing method according to an embodiment of the present invention;
FIG. 3 is a block diagram of a signal testing system according to an embodiment of the present invention.
Reference numerals:
the device comprises an upper computer 100, a shielding device 200 and an acquisition device 300.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper, lower, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, the meaning of a plurality is one or more, the meaning of a plurality is two or more, and the above, below, exceeding, etc. are understood as excluding the present numbers, and the above, below, within, etc. are understood as including the present numbers. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
In the description of the present invention, reference to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Referring to fig. 1, an embodiment of the present application provides a signal testing method. The signal testing method comprises the following steps: s100, sending a test instruction and generating a parameter configuration instruction; s200, entering a signal test state according to the test instruction, and generating a test signal; s300, processing the test signal according to the parameter configuration instruction and generating test data; and S400, collecting and processing the test data to obtain a test result.
In step S100, a specific implementation manner of sending the test instruction and generating the parameter configuration instruction is as follows: the upper computer is in communication connection with the equipment to be tested, and sends a test instruction to the equipment to be tested and generates a parameter configuration instruction. The parameter configuration instruction is used for configuring parameters of the acquisition device of the equipment to be tested.
Step S200, entering a signal testing state according to the test instruction, and generating a test signal according to a specific embodiment of the method includes: the device to be tested enters a signal test state according to the test instruction, for example: and the wireless earphone enters a power test state according to the test instruction and generates transmitting power.
S300, processing the test signal according to the parameter configuration instruction, and generating test data according to the specific implementation manner of: the acquisition device is in communication connection with the upper computer through a GPIB interface and is in signal transmission with the equipment to be tested through a radio frequency connecting line. The acquisition device adjusts its own display mode according to the parameter configuration instruction, for example: the frequency spectrograph adjusts the mode of the display window according to the parameter configuration so as to enable the test signal to be located in the two-thirds and centered range of the display window, and enable the effective value of the test signal to be in the display window, so that the acquisition precision is guaranteed. And the acquisition device generates corresponding test data according to the test signal and sends the test data to the upper computer.
According to the signal testing method, the display window of the acquisition device is adjusted through the parameter configuration instruction, so that the test signal is located in the two-thirds and central range of the display window, and the acquisition precision and the testing stability of the test signal are guaranteed. The upper computer processes the test data generated by the acquisition device to obtain a test result, so that the test efficiency of the equipment to be tested is improved.
In some examples, the upper computer generates parameter configuration instructions, including: generating a central frequency configuration instruction; a frequency width configuration instruction is generated. Specifically, the upper computer sends a parameter configuration instruction to configure the center frequency and Span (setting display window display frequency width) of the acquisition device. For example: and configuring the center frequency and Span of the frequency spectrograph during channel test. During configuration, the bandwidth range of a channel of the device to be tested needs to be determined in a debugging mode, and under the condition that a power grabbing point of the device to be tested is normal, the center frequency and the Span can be adjusted to ensure that a test signal of the device to be tested is located in the range which is two thirds of the display window and is located in the center.
In some embodiments, a specific implementation manner of step S400 is: s410, circularly collecting the test data; s420, storing the test data acquired in each circulation in an array; s430, reading the array according to a preset value taking method; and S440, comparing the reading result with a preset threshold value to obtain a test result.
In step S410, a specific implementation of the cyclic collection of the test data is as follows: the equipment to be tested keeps sending the test signal, and the upper computer controls the acquisition device to perform cyclic acquisition. It can be understood that the collection times and the collection period of the collection device can be adaptively adjusted according to actual needs or characteristics of the test signal.
One embodiment of steps S420 to S440 is as follows: in the test process, the frequency offset value of the test signal of the device to be tested is in an up-and-down fluctuation state, the upper computer stores the test data acquired by the acquisition device in each cycle or each period in an array mode, and reads the test data in the array mode according to a preset value taking method. When the read test data is within the range of the preset threshold value, indicating that the emission signal function of the product to be tested is normal; and when the read test data is not in the preset threshold range, indicating that the false detection occurs or the emission signal of the product to be detected is abnormal in function.
In some embodiments, the preset value taking method includes: any one of a minimum value, a maximum value, a first average value, and a second average value. Specifically, any one of the minimum value, the maximum value or the first average value of the test data is selected from the array according to the actual test requirement or the harmonic characteristics of the test signal of the device to be tested; or selecting the average value (second average value) of all the test data in the array which is larger than the preset lower limit value. It can be understood that the specific value of the preset lower limit value may be set according to actual needs, and the embodiment of the present application is not particularly limited.
Referring to fig. 3, an embodiment of the present application provides a signal testing system. The signal testing system includes: host computer 100, shield assembly 200 and collection system 300. The upper computer 100 is used for sending a test instruction and generating a parameter configuration instruction; the shielding device 200 is used for placing equipment to be tested, the equipment to be tested is in communication connection with the upper computer 100, and the equipment to be tested enters a signal test state according to a test instruction and generates a test signal; the acquisition device 300 is connected to the shielding device 200, and is configured to process the test signal according to the parameter configuration instruction and generate test data. In particular, the shielding device 200 is used to place a device under test to provide a non-interfering test environment for the device under test. The upper computer 100 is in communication connection with the equipment to be tested, and the upper computer 100 sends a test instruction to the equipment to be tested and generates a parameter configuration instruction. The parameter configuration instruction is used to configure parameters of the acquisition apparatus 300. The device to be tested enters a signal test state according to the test instruction, for example: and the wireless earphone enters a power test state according to the test instruction and generates transmitting power. The acquisition device 300 is in communication connection with the upper computer 100 through a GPIB interface, and is connected with the shielding device 200 through a radio frequency connecting wire so as to realize signal transmission with the equipment to be tested. The acquisition device 300 adjusts its display mode according to the parameter configuration command, for example: the frequency spectrograph adjusts the mode of the display window according to the parameter configuration instruction so as to enable the test signal to be located in the two-thirds and centered range of the display window, and enable the effective value of the test signal to be in the display window, so that the acquisition precision is guaranteed. The acquisition device 300 generates corresponding test data according to the test signal and transmits the test data to the upper computer 100, and the upper computer 100 processes the received test data to obtain a test result.
In some embodiments, the upper computer 100 is configured to generate a center frequency configuration instruction and a frequency width configuration instruction. Specifically, the upper computer 100 sends a parameter configuration instruction to configure the center frequency and Span (setting the display frequency width of the display window) of the acquisition device 300. For example: and configuring the center frequency and Span of the frequency spectrograph during channel test. During configuration, the bandwidth range of a channel of the device to be tested needs to be determined in a debugging mode, and under the condition that a power grabbing point of the device to be tested is normal, the center frequency and the Span can be adjusted to ensure that a test signal of the device to be tested is located in the range which is two thirds of the display window and is located in the center.
In some embodiments, the acquisition device 300 performs a cyclic acquisition of test data. The upper computer 100 is used for storing the data acquired in each cycle in an array, reading the array according to a preset value taking method, and comparing the reading result with a preset threshold value to obtain a test result. The preset value taking method comprises the following steps: any one of a minimum value, a maximum value, a first average value, and a second average value.
Specifically, the device under test keeps sending the test signal, and the upper computer 100 controls the collection device 300 to perform cyclic collection. It is understood that the number of times of acquisition and the acquisition period of the acquisition apparatus 300 can be adaptively adjusted according to actual needs or characteristics of the test signal. In the testing process, the frequency offset value of the test signal of the device to be tested is in an up-and-down fluctuation state, the upper computer 100 stores the array of the test data acquired by the acquisition device 300 in each cycle or each period, and reads the test data in the array according to a preset value taking method. When the test data read by the upper computer 100 is within the range of the preset threshold, it indicates that the emission signal function of the product to be tested is normal; and when the read test data is not in the preset threshold range, indicating that the false detection occurs or the emission signal of the product to be detected is abnormal in function. The preset value taking method comprises the following steps: selecting any value of the minimum value, the maximum value or the first average value of the test data from the array according to the actual test requirement or the harmonic characteristics of the test signal of the device to be tested; or selecting the average value (second average value) of all the test data in the array which is larger than the preset lower limit value. It can be understood that the specific value of the lower limit value and the range of the preset threshold may be set according to actual needs, and the embodiment of the present application is not particularly limited.
The application also provides the electronic equipment. The electronic device includes: the system includes at least one processor, and a memory communicatively coupled to the at least one processor. The memory stores instructions that are executed by the at least one processor to cause the at least one processor to implement the signal testing method as described in any of the above implementations when executing the instructions.
An embodiment of the present application provides a computer-readable storage medium storing computer-executable instructions for: the signal testing method as described in any of the above implementations is performed.
The above-described embodiments of the apparatus are merely illustrative, wherein the units illustrated as separate components may or may not be physically separate, i.e. may be located in one place, or may also be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment.
One of ordinary skill in the art will appreciate that all or some of the steps, systems, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as is well known to those of ordinary skill in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can accessed by a computer. In addition, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media as known to those skilled in the art.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of those skilled in the art without departing from the gist of the present invention. Furthermore, the embodiments of the present invention and the features of the embodiments may be combined with each other without conflict.
Claims (9)
1. A signal testing method, comprising:
sending a test instruction and generating a parameter configuration instruction;
entering a signal test state according to the test instruction and generating a test signal;
processing the test signal according to the parameter configuration instruction and generating test data;
and collecting and processing the test data to obtain a test result.
2. The signal testing method of claim 1, wherein the generating a parameter configuration instruction comprises:
generating a central frequency configuration instruction;
a frequency width configuration instruction is generated.
3. The signal testing method of claim 2, wherein said collecting and processing said test data to obtain a test result comprises:
circularly collecting the test data;
storing the test data acquired in each cycle in an array;
reading the array according to a preset value taking method;
and comparing the reading result with a preset threshold value to obtain a test result.
4. The signal testing method according to claim 3, wherein the preset value-taking method comprises: any one of a minimum value, a maximum value, a first average value, and a second average value.
5. A signal testing system, comprising:
the upper computer is used for sending the test instruction and generating a parameter configuration instruction;
the shielding device is used for placing equipment to be tested, the equipment to be tested is in communication connection with the upper computer, and the equipment to be tested enters a signal test state according to the test instruction and generates a test signal;
the acquisition device is connected with the shielding device and used for processing the test signal according to the parameter configuration instruction and generating test data;
the upper computer is also used for collecting and processing the test data to obtain a test result.
6. The signal testing system of claim 5, wherein the upper computer is configured to generate a center frequency configuration command and a frequency width configuration command.
7. The signal testing system of claim 6, wherein the acquisition device cyclically acquires the test data;
the upper computer stores the data acquired in each cycle in an array;
the upper computer reads the array according to a preset value taking method and compares the reading result with a preset threshold value to obtain a test result;
the preset value taking method comprises the following steps: any one of a minimum value, a maximum value, a first average value, and a second average value.
8. An electronic device, comprising: a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor when executing the program implementing:
the signal testing method according to any one of claims 1 to 4.
9. A computer-readable storage medium storing computer-executable instructions for: performing the signal testing method of any one of claims 1 to 4.
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