CN112748371B - General test structure for multiple test items of transformer test and logic control method - Google Patents
General test structure for multiple test items of transformer test and logic control method Download PDFInfo
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- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The invention relates to a general test structure and a logic control method for multiple test items of transformer tests. Comprising the following steps: the controllable power supply unit is used for providing a direct current source and an alternating current voltage source for output; the switch switching unit comprises a high-voltage switch switching module and a low-voltage switch switching module and is used for realizing the selection of test items of high-voltage and low-voltage transformer tests and the switching of different transformer test items; and the indicator lamp unit is used for indicating the access condition of the transformer test item. The invention can realize the automatic switching of different phases in the similar test projects, and greatly improves the working efficiency of the testers.
Description
Technical Field
The invention relates to the technical field of transformer test and power detection equipment, in particular to a general test structure and a logic control method for multiple test items of a transformer test.
Background
The traditional DC resistance test, short-circuit impedance test, on-load beat wave test, transformation ratio test, degaussing and degaussing verification test are all independent test instruments, namely, each test item generally corresponds to one test instrument. And the wiring or test items are replaced every time the test is completed, and the state of the related test wiring is changed if necessary.
In this work, change wiring or change the in-process of instrument, receive the injury of induced electricity easily, it is laborious consuming time, work efficiency is low.
Therefore, the application provides a general test structure and a logic control method for realizing automatic switching of different phases in the same kind of test items aiming at the 6 kinds of test items.
Disclosure of Invention
The invention aims to provide a general test structure and a logic control method for multiple test projects of transformer tests, which can realize automatic switching of different phases in the same type of test projects and greatly improve the working efficiency of testers.
In order to achieve the above purpose, the technical scheme of the invention is as follows: a universal test structure for testing multiple test items of a transformer, comprising:
the controllable power supply unit is used for providing a direct current source and an alternating current voltage source for output;
the switch switching unit comprises a high-voltage switch switching module and a low-voltage switch switching module and is used for realizing the selection of test items of high-voltage and low-voltage transformer tests and the switching of different transformer test items;
and the indicator lamp unit is used for indicating the access condition of the transformer test item.
In an embodiment of the present invention, the controllable power supply unit includes a (0 to ±5v) dc output module and a (0 to 220V) ac output module.
In an embodiment of the present invention, the high voltage switch switching module includes a first high voltage main switch, a second high voltage main switch, a first high voltage switch, a second high voltage switch, a third high voltage switch, and a fourth high voltage switch, where the first high voltage main switch and the second high voltage main switch are single-pole four-throw switches, the first high voltage switch to the fourth high voltage switch are single-pole four-throw switches, the fixed end of the first high voltage main switch and the fixed end of the second high voltage main switch are connected with a high voltage output positive end and a high voltage output negative end of the controllable power supply unit, the four switch ends of the first high voltage main switch/the second high voltage main switch are respectively connected with the second switch ends of the first high voltage switch to the fourth high voltage switch, the first switch ends of the first high voltage switch to the fourth high voltage switch are respectively connected to GND through an LR circuit, the third switch ends of the first high voltage switch to the fourth high voltage switch are all set ends, and the fourth switch ends of the first high voltage switch to the fourth high voltage switch are respectively as high voltage output test ends of the universal test structures; the connection structure of the low-voltage switch switching module is the same as that of the high-voltage switch switching module, and the difference is that the fixed ends of the two low-voltage main switches of the low-voltage switch switching module are connected with the low-voltage output positive end and the low-voltage output negative end of the controllable power supply unit.
In an embodiment of the present invention, the high voltage switch switching module further includes first to sixth high voltage interconnection switches for interconnecting the first to third switching terminals and the fourth switching terminal of the first/second high voltage main switch, and the fourth to sixth high voltage interconnection switches for interconnecting the fixed ends of the first to third high voltage switching switches; the low voltage switch switching module further includes first to sixth low voltage interconnection switches for interconnecting the first to third switching terminals and the fourth switching terminal of the first/second low voltage main switch, and the fourth to sixth low voltage interconnection switches for interconnecting the fixed ends of the first to third low voltage switching switches.
In an embodiment of the present invention, the first/second high-voltage main switch may be replaced by a single-pole five-throw switch, and four switching ends of the first/second high-voltage main switch are connected in the same manner as four switching ends when the first/second high-voltage main switch is a single-pole four-throw switch, and the fifth switching ends of the first/second high-voltage main switch are all empty ends.
In an embodiment of the invention, the indicator light unit includes 16 indicator lights, on the high-voltage switch switching module, 4 indicator lights are respectively arranged between four switching ends of the first high-voltage main switch and second switching ends of the first high-voltage switch to the fourth high-voltage switch, and 4 indicator lights are respectively arranged between fixed ends of the first high-voltage switch to the fourth high-voltage switch and output ends of a general test structure of a transformer test multi-test item; the setting mode of the indicator lamp on the low-voltage switch switching module is the same as the setting mode of the indicator lamp on the high-voltage switch switching module.
In an embodiment of the present invention, the fixed ends of the first to fourth high voltage switches of the high voltage switch module all lead out a voltage output end and a current output end, that is, the high voltage output ends of the general test structure of the transformer test multiple test items are 4 high voltage output ends and 4 high voltage current output ends, the high voltage output ends and the high voltage current output ends are paired in pairs, the low voltage output ends of the general test structure of the transformer test multiple test items are 4 low voltage output ends and 4 low voltage current output ends, and the low voltage output ends and the low voltage current output ends are paired in pairs.
In an embodiment of the present invention, the high voltage grounding terminal and the low voltage grounding terminal are further included.
The invention also provides a logic control method of the universal test structure based on the transformer test multiple test items, which is realized as follows:
the method comprises the steps that a first high-voltage main switch, a second high-voltage main switch, a first low-voltage main switch and a second low-voltage main switch are respectively K1, K2, K3 and K4, the first high-voltage switch, the second high-voltage switch, the third high-voltage switch and the fourth high-voltage switch are respectively KA1, KB1, KC1 and KN1, the first low-voltage switch, the second low-voltage switch, the third low-voltage switch and the fourth low-voltage switch are respectively Ka1, kb1, kc1 and Kn1, the second switching end of the first high-voltage switch, the second switching end of the second high-voltage switch, the second switching end of the third high-voltage switch and the second switching end of the fourth high-voltage switch are respectively DA, DB, DC, DN, and the second switching end of the first low-voltage switch, the second switching end of the second low-voltage switch, the second switching end of the third low-voltage switch and the second switching end of the fourth low-voltage switch are respectively Da, db, dc, dn;
s represents a short-circuit switch between the phases, S represents the phases A, B, C, N, a, b, c, n, two cannot represent the same phase, S represents closure of s=1, s=0 represents opening, default is opening, maximum high and low voltages have 4 phases, and a short-circuit switch exists between the fixed end or the second switch end of the high/low voltage switch of any two phases;
when in test, all the winding outgoing lines of the double-winding transformer are connected in one-to-one correspondence according to high voltage A, B, C, N and low voltage a, b, c, n, and all the winding outgoing lines are connected with no more than 8 winding outgoing line terminals, whether the winding outgoing lines are three-phase transformers or single-phase transformers or delta-connection or Y-connection at the high voltage side or the low voltage side; if the transformer is a three-winding transformer, the three-winding transformer is used as 2 different double-winding transformers to be connected;
(1) Direct current resistance test:
for the high-voltage side, connecting two ends of a direct-current resistor with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment to form a direct-current resistor test path; (according to the logic relationship, switching between K1 and K2 to any two terminals in the corresponding DA, DB, DC, DN, at this time KA1, KB1, KC1 and KN1 are switched to the corresponding second corresponding switching terminal, for example, testing AB resistance, K1 is switched to D1, K2 is switched to DB, KA1 and KB1 are respectively switched to two terminals, other high-voltage sides KC1 and KN1 are all switched to a fourth terminal and are in a vacant state; the low-voltage sides K3 and K4 are disconnected, the corresponding switching ends of KA1, KB1, KC1 and KN1 are all arranged in a hanging space (4), and the short-circuit switches S are all in an disconnection state);
(2) Short circuit impedance test:
connecting two ends of a test high-voltage winding side with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are closed to form a short-circuit impedance path;
(3) And (3) testing the transition resistance of the on-load tap-changer:
connecting two ends of the test high-voltage winding with any two high-voltage output ends of a general test structure of a plurality of test items of the transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are all arranged in a suspension space (1) to form a transformation ratio passage;
(4) Transformation ratio test:
connecting two ends of a transformation ratio high-voltage side with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are closed to form a transformation ratio channel;
(5) Demagnetizing and verifying demagnetizing:
for the low-voltage side, connecting two ends of the demagnetizing low-voltage winding with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K3 and K4 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the high-voltage sides, K1 and K2 are disconnected, two corresponding ends of the high-voltage sides are connected with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, and corresponding switching ends of KA1, KB1, KC1 and KN1 are arranged in a suspension space;
for the high-voltage side, connecting two ends of a direct-current resistor with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment to form a direct-current resistor test path; the low-voltage sides, K3 and K4 are disconnected, two corresponding ends of the low-voltage sides are connected to any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and corresponding switching ends of ka1, kb1, kc1 and kn1 are all arranged in a suspension space (1) to form verification demagnetizing flux.
Compared with the prior art, the invention has the following beneficial effects: the invention can realize the automatic switching of different phases in the similar test projects, and greatly improves the working efficiency of the testers.
Drawings
FIG. 1 is a schematic diagram of a general test structure of a transformer test of the present invention.
Fig. 2 is a waveform of the forward and reverse interaction reduction of the output of the controllable power supply unit of the present invention.
Fig. 3 is a waveform of a dc constant voltage source output from the controllable power supply unit of the present invention.
Fig. 4 is a waveform of a dc constant current source output from the controllable power supply unit of the present invention.
Fig. 5 is a waveform of an ac current source or an ac voltage source output from the controllable power supply unit of the present invention.
Fig. 6 is a waveform of the alternating current source or the alternating voltage source of the present invention with alternating current and alternating current being reduced by the output of the controllable power unit.
Detailed Description
The technical scheme of the invention is specifically described below with reference to the accompanying drawings.
The invention provides a general test structure for multiple test items of transformer test, which comprises:
the controllable power supply unit is used for providing a direct current source and an alternating current voltage source for output;
the switch switching unit comprises a high-voltage switch switching module and a low-voltage switch switching module and is used for realizing the selection of test items of high-voltage and low-voltage transformer tests and the switching of different transformer test items;
and the indicator lamp unit is used for indicating the access condition of the transformer test item.
The controllable power supply unit comprises a (0 to +/-5V) direct current output module and a (0 to 220V) alternating current output module, and adopts a current source or a voltage source with special waveforms of voltage and current waveforms, and is not a constant voltage source or a current source. As shown in fig. 2-6.
For example, direct current is respectively supplied in the forward direction and the reverse direction, and direct current is continuously reduced in the forward direction and the reverse direction, as shown in fig. 2. The amplitude can be set or selected, the voltage is (0-220 VAC) in the normal condition, and the current is adjustable between 1A and 10A. The frequency of the ac current source or voltage source is about 50 Hz.
The high-voltage switch switching module comprises a first high-voltage main switch, a second high-voltage main switch, a first high-voltage switch, a second high-voltage switch, a third high-voltage switch and a fourth high-voltage switch, wherein the first high-voltage main switch and the second high-voltage main switch are single-pole four-throw switches, the first high-voltage switch and the fourth high-voltage switch are single-pole four-throw switches, the fixed end of the first high-voltage main switch and the fixed end of the second high-voltage main switch are connected with a high-voltage output positive end and a high-voltage output negative end of the controllable power supply unit, the four switch ends of the first high-voltage main switch/the second high-voltage main switch are respectively connected with a second switch end of the first high-voltage switch to the fourth high-voltage switch, the first switch ends of the first high-voltage switch to the fourth high-voltage switch are respectively connected to GND through an LR circuit, the third switch ends of the first high-voltage switch to the fourth high-voltage switch are respectively arranged ends, and the fixed ends of the first high-voltage switch to the fourth high-voltage switch are respectively used as universal test structures for testing the high-voltage test items of the high-voltage test structures; the connection structure of the low-voltage switch switching module is the same as that of the high-voltage switch switching module, and the difference is that the fixed ends of the two low-voltage main switches of the low-voltage switch switching module are connected with the low-voltage output positive end and the low-voltage output negative end of the controllable power supply unit.
The high-voltage switch switching module further comprises first to sixth high-voltage interconnection switches, the first to third high-voltage interconnection switches are used for realizing interconnection between first to third switching ends and a fourth switching end of the first/second high-voltage main switch, and the fourth to sixth high-voltage interconnection switches are used for realizing interconnection between fixed ends of the first to third high-voltage switching switches; the low voltage switch switching module further includes first to sixth low voltage interconnection switches for interconnecting the first to third switching terminals and the fourth switching terminal of the first/second low voltage main switch, and the fourth to sixth low voltage interconnection switches for interconnecting the fixed ends of the first to third low voltage switching switches.
The first/second high-voltage main switch can be replaced by a single-pole five-throw switch, four switching ends of the first/second high-voltage main switch are connected in the same mode as the four switching ends when the first/second high-voltage main switch is a single-pole four-throw switch, and the fifth switching ends of the first/second high-voltage main switch are empty ends.
The indicator light unit comprises 16 indicator lights, 4 indicator lights are respectively arranged between four switching ends of the first high-voltage main switch and second switching ends of the first high-voltage main switch to the fourth high-voltage main switch on the high-voltage switch switching module, and 4 indicator lights are respectively arranged between fixed ends of the first high-voltage main switch to the fourth high-voltage main switch and output ends of a general test structure of a transformer test multi-test item; the setting mode of the indicator lamp on the low-voltage switch switching module is the same as the setting mode of the indicator lamp on the high-voltage switch switching module.
The high voltage output ends of the general test structure of the transformer test multiple test items are 4 high voltage output ends and 4 high voltage current output ends, the high voltage output ends and the high voltage current output ends are paired in pairs, the low voltage output ends of the general test structure of the transformer test multiple test items are 4 low voltage output ends and 4 low voltage current output ends, and the low voltage output ends and the low voltage current output ends are paired in pairs.
In an embodiment of the present invention, the high voltage grounding terminal and the low voltage grounding terminal are further included.
The invention also provides a logic control method of the universal test structure based on the transformer test multiple test items, which is realized as follows:
the method comprises the steps that a first high-voltage main switch, a second high-voltage main switch, a first low-voltage main switch and a second low-voltage main switch are respectively K1, K2, K3 and K4, the first high-voltage switch, the second high-voltage switch, the third high-voltage switch and the fourth high-voltage switch are respectively KA1, KB1, KC1 and KN1, the first low-voltage switch, the second low-voltage switch, the third low-voltage switch and the fourth low-voltage switch are respectively Ka1, kb1, kc1 and Kn1, the second switching end of the first high-voltage switch, the second switching end of the second high-voltage switch, the second switching end of the third high-voltage switch and the second switching end of the fourth high-voltage switch are respectively DA, DB, DC, DN, and the second switching end of the first low-voltage switch, the second switching end of the second low-voltage switch, the second switching end of the third low-voltage switch and the second switching end of the fourth low-voltage switch are respectively Da, db, dc, dn;
when in test, all the winding outgoing lines of the double-winding transformer are connected in one-to-one correspondence according to high voltage A, B, C, N and low voltage a, b, c, n, and all the winding outgoing lines are connected with no more than 8 winding outgoing line terminals, whether the winding outgoing lines are three-phase transformers or single-phase transformers or delta-connection or Y-connection at the high voltage side or the low voltage side; if the transformer is a three-winding transformer, the three-winding transformer is used as 2 different double-winding transformers to be connected; this is one-time access for all connections at a time. The switching is performed internally.
The following set-up of the present application is based on the setting of three-phase or single-phase double windings.
(1) Direct current resistance test:
for the high-voltage side of the transformer, connecting two ends of a direct-current resistor with any two high-voltage output ends of a general test structure of a plurality of test items of the transformer, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment to form a direct-current resistor test path; the same applies to the low-voltage side of the transformer; see in particular table 1.
When the direct current resistance test is carried out on the high-voltage side winding of the transformer, the controllable power supply unit outputs direct current, the waveform is similar to that shown in fig. 4, the amplitude of the controllable direct current source is 0-10A, the high-voltage main switches K1 and K2 are respectively closed at the second switching ends of the high-voltage switching switches corresponding to the tested winding, the corresponding high-voltage switching switches are closed at the second switching ends, and the other testing is carried out, so that the high-voltage switching switches are switched to the fourth switching ends and suspended.
The low-voltage main switches K3 and K4 are suspended, the first, second, third and fourth low-voltage change-over switches are all arranged to be empty (switched to the fourth change-over end), a direct-current resistance test path of the high-voltage winding of the transformer is formed, and the loop of the low-voltage winding is in an open circuit.
The DC resistance test of the low-voltage side of the transformer is the same.
Table 1 action switching diagram of DC resistance function tester
(2) Short circuit impedance test:
connecting two ends of a test high-voltage winding side with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are closed to form a short-circuit impedance path; see table 2.
Short-circuit impedance test is similar to the high-side DC resistance test of the transformer in (1), except that the first, second, third and fourth low-voltage switches are set to the ground position (switched to the third switching terminal). The power supply outputs AC voltage with amplitude of 0-220 VAC, similar to the waveform of figure 5.
Table 2 action switching diagram of short circuit impedance function tester
To ensure the accuracy of the test, the short-circuit switches Sab, sbc, sca, san, sbn, scn on the low voltage side may be set to 1, closed.
(3) On-load tap-changer transition resistance test (commonly referred to as on-load tap-changer beat test):
connecting two ends of the test high-voltage winding with any two high-voltage output ends of a general test structure of a plurality of test items of the transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are all arranged in a suspension space (1) to form a transformation ratio passage; see table 3.
The high-voltage wiring of the on-load beat wave test, such as a high-voltage direct current resistance test, is provided, and the power supply part outputs direct current, and the waveform is similar to that shown in figure 4. Except that the first, second, third and fourth low voltage switches are all set to the ground position (switched to the third switch terminal).
The instrument sets up the trigger level by oneself according to the size of transformer transition resistance, and the direct current resistance of winding, when personnel's operation on-load tap-changer, automatic beat ripples. Furthermore, the control signal of the on-load tap-changer can be added into the instrument to realize one-time access, and the direct current resistors of all gears of the transformer and the transition resistor of the on-load tap-changer can be completely tested.
Table 3 action switching diagram of on-load beat wave function tester
To ensure the accuracy of the test, the short-circuit switches Sab, sbc, sca, san, sbn, scn on the low voltage side may be set to 1, closed.
Wherein the short-circuit impedance of the three-phase circuit breaker is calculated by a conventional method.
(4) Transformation ratio test:
connecting two ends of a transformation ratio high-voltage side with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are closed to form a transformation ratio channel; see table 4.
The waveform of the partial output alternating voltage of the high-voltage power supply is similar to that of fig. 5, the amplitude is 0-220 VAC, the low-voltage main switches K3 and K4 are suspended, the first, second, third and fourth low-voltage change-over switches are all arranged (switched to the second change-over end), the output voltage of the high-voltage winding of the transformer is formed to be connected into a test channel, and the low-voltage winding loop is positioned in the channel and connected into the test loop.
Table 4 action switching diagram of transformation ratio function tester
The test principle is the same as the conventional test method.
(5) Demagnetizing and verifying demagnetizing:
for the low-voltage side, connecting two ends of the demagnetizing low-voltage winding with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K3 and K4 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the high-voltage sides, K1 and K2 are disconnected, two corresponding ends of the high-voltage sides are connected with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, and corresponding switching ends of KA1, KB1, KC1 and KN1 are arranged in a suspension space;
for the high-voltage side, connecting two ends of a direct-current resistor with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment to form a direct-current resistor test path; the low-voltage sides, K3 and K4 are disconnected, two corresponding ends of the low-voltage sides are connected to any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and corresponding switching ends of ka1, kb1, kc1 and kn1 are all arranged in a suspension space (1) to form verification demagnetizing flux. See table 5.
During degaussing, the waveform input by the low-voltage side is direct current, the waveform is similar to that shown in fig. 2 or fig. 6, the wiring is similar to that of the low-voltage side test direct current resistor, the high-voltage sides K1 and K2 are disconnected, and the high-voltage side is suspended.
When the demagnetization is verified, the wiring is the demagnetization wiring as shown in (5), the voltage output by the low-voltage side is alternating-current voltage, and the waveform is shown in figure 5. The high pressure side is suspended.
Table 5 action switching diagram of demagnetizing and verifying demagnetizing function tester
In order to ensure the smooth proceeding of the items (1) - (5), the pre-control induction electricity, the initial state after the instrument is started or not started is as follows: and directly setting K1, K2, K3 and K4 to be in a disconnection state, wherein KA1, KB1, KC1 and KN1 are directly arranged at the 1 st switching end, and Ka1, kb1, kc1 and Kn1 are directly arranged at the 1 st switching end. When the relevant test is completed, the initial state is restored immediately. The switching logic of tables 1 to 5 was used in a single test.
The related SAB, SBC, SCA, SAN, SBN, SCN short-circuit change-over switch is applied as redundancy and used for testing channel damage or special purposes.
The control code is unique, and is used as internal debugging no matter according to binary calculation or other codes, so that the internal message of the instrument is ensured to be readable.
As shown in fig. 1, a general test structure for testing multiple test items of a transformer according to the present invention includes:
the controllable power supply unit is used for providing a direct current source and an alternating current voltage source for output;
the switch switching unit comprises a high-voltage switch switching module and a low-voltage switch switching module and is used for realizing the selection of test items of high-voltage and low-voltage transformer tests and the switching of different transformer test items;
and the indicator lamp unit is used for indicating the access condition of the transformer test item.
The high-voltage sides K1, K2, KA1, KB1, KC1 and KN1 are single-pole four-throw switches. The 6 switches have interlocking logic relations and the like, so that the instrument is prevented from being burnt. The controllable power supply part should detect the abnormal condition of the external loop and automatically lock out the output and prompt the internal fault function. Wherein K1 and K2 can adopt single-pole five-throw, and when guaranteeing that the internal change-over switch is unusual, automatic strong the setting is empty. The control part can also be adopted to directly intercept the controllable power supply. The low pressure side and the high pressure side are arranged in unison. The logic is consistent, the functions are not described, and the configuration of each phase is consistent
If the high-voltage side or low-voltage side switch adopts a solid relay or an electronic relay, the high-voltage side or low-voltage side switch is arranged on the circuit board in a concentrated manner, so that the high-voltage side or low-voltage side switch is convenient to be replaced or maintained in a plugging manner.
And after the LA-D, LB-D, LC-D, LN-D outgoing lines are internally shorted, the high-voltage side and the low-voltage side are independently led to the outside of the instrument, and an independent binding post is arranged. The double-grounding safety function is achieved.
The external grounding terminal of UA, UB, UC, UN, IA, IB, IC, IN, ua, ub, uc, ud, ia, ib, ic, in instrument is independently arranged. The binding post should be provided with a banana plug and a U-shaped fork which can be connected
S (e.g. SAB indicates a connection switch between A, B), indicates a connection switch between items, 1 indicates a closed, 0 indicates an open, and defaults to open, wherein the items are A, B, C, N, a, b, c, n, respectively. A total of 8 groups.
Indicator lamps of variable colors such as LA1, LB1, LC1, LN1, LA2, LB2, LC2, LN2, etc. are provided.
According to the state of the switch, the data of different control codes are calculated according to the logic calculation of the codes, and can be seen from tables 1 to 5. The working switching conditions of the universal test structure tester for testing multiple test items of the transformer can be customized, under the default condition, the switching modes from table 1 to table 5 are adopted, the test conditions under the rest modes are ensured to be carried out under the safety angle, the instrument is provided with a related protection circuit, the safety of the instrument under the abnormal condition is ensured, and the customization is finished under the guidance of manufacturers or under the guidance of the deep expert of electric tests.
The above is a preferred embodiment of the present invention, and all changes made according to the technical solution of the present invention belong to the protection scope of the present invention when the generated functional effects do not exceed the scope of the technical solution of the present invention.
Claims (7)
1. A universal test structure for testing multiple test items of a transformer, comprising:
the controllable power supply unit is used for providing a direct current source and an alternating current voltage source for output;
the switch switching unit comprises a high-voltage switch switching module and a low-voltage switch switching module and is used for realizing the selection of test items of high-voltage and low-voltage transformer tests and the switching of different transformer test items;
the indicator light unit is used for indicating the condition of the passage of the transformer test item;
the high-voltage switch switching module comprises a first high-voltage main switch, a second high-voltage main switch, a first high-voltage switch, a second high-voltage switch, a third high-voltage switch and a fourth high-voltage switch, wherein the first high-voltage main switch and the second high-voltage main switch are single-pole four-throw switches, the first high-voltage switch and the fourth high-voltage switch are single-pole four-throw switches, the fixed end of the first high-voltage main switch and the fixed end of the second high-voltage main switch are connected with a high-voltage output positive end and a high-voltage output negative end of the controllable power supply unit, the four switch ends of the first high-voltage main switch/the second high-voltage main switch are respectively connected with a second switch end of the first high-voltage switch to the fourth high-voltage switch, the first switch ends of the first high-voltage switch to the fourth high-voltage switch are respectively connected to GND through an LR circuit, the third switch ends of the first high-voltage switch to the fourth high-voltage switch are respectively arranged ends, and the fixed ends of the first high-voltage switch to the fourth high-voltage switch are respectively used as universal test structures for testing the high-voltage test items of the high-voltage test structures; the connection structure of the low-voltage switch switching module is the same as that of the high-voltage switch switching module, and the difference is that the fixed ends of the two low-voltage main switches of the low-voltage switch switching module are connected with the low-voltage input positive end and the low-voltage input negative end of the controllable power supply unit; the two high-voltage main switches and the two low-voltage main switches can be provided with voltage or current measuring loops corresponding to the loops; the high-voltage switch switching module further comprises first to sixth high-voltage interconnection switches, the first to third high-voltage interconnection switches are used for realizing interconnection between first to third switching ends and a fourth switching end of the first/second high-voltage main switch, and the fourth to sixth high-voltage interconnection switches are used for realizing interconnection between fixed ends of the first to third high-voltage switching switches; the low voltage switch switching module further includes first to sixth low voltage interconnection switches for interconnecting the first to third switching terminals and the fourth switching terminal of the first/second low voltage main switch, and the fourth to sixth low voltage interconnection switches for interconnecting the fixed ends of the first to third low voltage switching switches.
2. The universal test structure for multiple test items of transformer test according to claim 1, wherein the controllable power supply unit comprises a 0 to + -5V direct current output module and a 0 to 220V alternating current output module.
3. The universal test structure for multiple test items of transformer test according to claim 1, wherein the first/second high voltage main switch is replaced by a single pole, five throw switch, four of the switching ends of the first/second high voltage main switch are connected in the same manner as the four switching ends of the first/second high voltage main switch when the first/second high voltage main switch is a single pole, four throw switch, and the fifth switching ends of the first/second high voltage main switch are empty ends.
4. The universal test structure for multiple test items of the transformer test according to claim 1, wherein the indicator lamp unit comprises 16 indicator lamps, 4 indicator lamps are respectively arranged between four switching ends of the first high-voltage main switch and the second switching ends of the first to fourth high-voltage switching switches on the high-voltage switch switching module, and 4 indicator lamps are respectively arranged between the fixed ends of the first to fourth high-voltage switching switches and the output ends of the universal test structure for multiple test items of the transformer test; the setting mode of the indicator lamp on the low-voltage switch switching module is the same as the setting mode of the indicator lamp on the high-voltage switch switching module.
5. The universal test structure for testing multiple test items of the transformer according to claim 1, wherein the voltage output ends and the current output ends are led out from the fixed ends of the first to fourth high-voltage switches of the high-voltage switch switching module, namely, the high-voltage output ends of the universal test structure for testing multiple test items of the transformer are 4 high-voltage output ends and 4 high-voltage current output ends, the high-voltage output ends and the high-voltage current output ends are paired in pairs, and the low-voltage output ends of the universal test structure for testing multiple test items of the transformer are 4 low-voltage output ends and 4 low-voltage current output ends, and the low-voltage output ends and the low-voltage current output ends are paired in pairs.
6. The universal test architecture for multiple test items of a transformer test as recited in claim 1, further comprising a high voltage ground terminal and a low voltage ground terminal.
7. A logic control method of a universal test structure based on the transformer test multiple test items of any one of claims 1, 3, and 4, characterized by realizing the following:
the method comprises the steps that a first high-voltage main switch, a second high-voltage main switch, a first low-voltage main switch and a second low-voltage main switch are respectively K1, K2, K3 and K4, the first high-voltage switch, the second high-voltage switch, the third high-voltage switch and the fourth high-voltage switch are respectively KA1, KB1, KC1 and KN1, the first low-voltage switch, the second low-voltage switch, the third low-voltage switch and the fourth low-voltage switch are respectively Ka1, kb1, kc1 and Kn1, the second switching end of the first high-voltage switch, the second switching end of the second high-voltage switch, the second switching end of the third high-voltage switch and the second switching end of the fourth high-voltage switch are respectively DA, DB, DC, DN, and the second switching end of the first low-voltage switch, the second switching end of the second low-voltage switch, the second switching end of the third low-voltage switch and the second switching end of the fourth low-voltage switch are respectively Da, db, dc, dn;
s represents a short-circuit switch between the phases, S represents the phases A, B, C, N, a, b, c, n, two cannot represent the same phase, S represents closure of s=1, s=0 represents opening, default is opening, maximum high and low voltages have 4 phases, and a short-circuit switch exists between the fixed end or the second switch end of the high/low voltage switch of any two phases;
when in test, all the winding outgoing lines of the double-winding transformer are connected in one-to-one correspondence according to high voltage A, B, C, N and low voltage a, b, c, n, and all the winding outgoing lines are connected with no more than 8 winding outgoing line terminals, whether the winding outgoing lines are three-phase transformers or single-phase transformers or delta-connection or Y-connection at the high voltage side or the low voltage side; if the transformer is a three-winding transformer, the three-winding transformer is used as 2 different double-winding transformers to be connected;
(1) Direct current resistance test:
for the high-voltage side of the transformer, connecting two ends of a direct-current resistor with any two high-voltage output ends of a general test structure of a plurality of test items of the transformer, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment to form a direct-current resistor test path; the same applies to the low-voltage side of the transformer;
(2) Short circuit impedance test:
connecting two ends of a test high-voltage winding side with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are closed to form a short-circuit impedance path;
(3) And (3) testing the transition resistance of the on-load tap-changer:
connecting two ends of a test high-voltage winding with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are all arranged in a suspension space to form a transformation ratio passage;
(4) Transformation ratio test:
connecting two ends of a transformation ratio high-voltage side with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the switching ends of the low-voltage sides K3 and K4 are disconnected, the corresponding two ends of the low-voltage sides are connected with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, and the corresponding switching ends of ka1, kb1, kc1 and kn1 are closed to form a transformation ratio channel;
(5) Demagnetizing and verifying demagnetizing:
for the low-voltage side, connecting two ends of the demagnetizing low-voltage winding with any two low-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K3 and K4 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment; the high-voltage sides, K1 and K2 are disconnected, two corresponding ends of the high-voltage sides are connected with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, and corresponding switching ends of KA1, KB1, KC1 and KN1 are arranged in a suspension space;
for the high-voltage side, connecting two ends of a direct-current resistor with any two high-voltage output ends of a general test structure of a plurality of test items of a transformer test, closing corresponding switching ends of K1 and K2 and closing corresponding switching ends of KA1, KB1, KC1 and KN1 at the moment to form a direct-current resistor test path; the low-voltage sides, K3 and K4 are disconnected, two corresponding ends of the low-voltage sides are connected to any two low-voltage output ends of a general test structure of multiple test items of the transformer test, and corresponding switching ends of ka1, kb1, kc1 and kn1 are all arranged in the suspension gaps to form verification demagnetizing flux.
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