CN112731288A - Non-parameter model calibration method and device for line structure laser surface - Google Patents
Non-parameter model calibration method and device for line structure laser surface Download PDFInfo
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Abstract
The invention discloses a line structure laser surface nonparametric model calibration device and a calibration method thereof suitable for a rotary laser measurement positioning system, comprising a precise two-axis turntable and a marble platform; a high-precision adjustable base and a laser emitting device are fixedly arranged on the precision two-axis turntable from bottom to top in sequence; the laser emitting device comprises a uniform-speed rotating platform and 1 or more line-structured lasers, and an optical-electrical signal receiving device and a signal processing device are fixed on the marble platform; and the height of the high-precision adjustable base is adjusted to enable the original point of the laser emitting device to be basically coincided with the original point of the precision two-axis turntable. The invention obtains the standard data mapping table of the laser surface to be calibrated by establishing the direct mapping of the laser surface rotation time and the space standard angle, overcomes the difficulty that the laser surface type is difficult to adopt an accurate parameter model for fitting, and has important significance for the development of a multi-base station space measurement positioning system.
Description
Technical Field
The invention relates to a multi-base-station space measurement positioning system, in particular to a nonparametric model calibration method and a calibration device of a linear structure laser surface of a rotary laser measurement positioning system.
Background
The rotary laser measuring and positioning system is a space three-dimensional coordinate measuring and positioning system which is mature, applied to the fields of aerospace, aviation, shipbuilding, virtual reality and the like and based on the light surface intersection principle. The measuring and positioning system mainly comprises a line structure laser surface emitting device, a photoelectric signal receiving device and a calculating and processing device, wherein the emitting device is arranged at a plurality of positions in a measuring and positioning space and is matched with the corresponding receiving device to perform positioning measurement on a point to be measured. A single transmitting device transmits two laser planes which rotate at a constant speed around a rotating shaft and have a certain inclination to scan a receiving device, the time interval of the rotating laser planes relative to a rotating starting point is obtained to carry out angle measurement and positioning, meanwhile, every time the transmitting device rotates to a fixed position, light pulses are transmitted to the periphery to serve as synchronous marks, scanning is achieved in a measured space, the space coordinate of the position of the receiving device is resolved by combining direction positioning parameters among multiple stations, and a positioning service signal is provided for the receiving device in the measured space. In such large-size measurement methods, CN102374847B discloses a device and a method for dynamically measuring a pose in a working space with six degrees of freedom, which use rotary laser scanning to perform spatial measurement positioning and use an ideal plane feature intersection mechanism of spatial multiple base stations to perform precise positioning. CN106227245B discloses an electrostrictive micromotion structure using two-axis turntable tracking accuracy and a control method thereof, which calculate pitch angle information and rotation angle information according to the angular position, and then calculate according to the relationship between the pitch angle and rotation angle and the amount of electrostriction of the electrostrictive element.
In practical application, the laser plane is deformed due to errors generated in the processing and assembling processes of the line structure laser in the emitting device, so that the laser plane no longer conforms to a plane model in the original measuring and positioning system. Because the laser surface is an information carrier for angle intersection in the rotary laser measurement positioning system, the angle measurement precision of a single transmitting device is directly influenced by the fit degree of the smooth surface model and the actual surface shape, and the integral positioning performance of the system is influenced. Moreover, the laser surface deformation is complex and irregular, and is difficult to fit by adopting a determined parameter model.
Therefore, establishing a non-parametric calibration model formed by the rotation time-space standard angle of the linear structure laser surface has important significance for improving the angle measurement precision of a single transmitting device and further improving the measurement and positioning performance of the system.
Disclosure of Invention
The invention aims to solve the problem that the laser surface parametric model and the calibration technology of the transmitting device of the existing rotating laser measuring and positioning system are not high in precision in application, get rid of the limitation of establishing a complex parameter model to fit the laser surface shape, and provide the non-parametric model calibration method and the calibration device of the linear structure laser surface.
In order to solve the technical problems, the invention is realized by the following technical scheme:
a linear structure laser surface nonparametric model calibration device suitable for a rotary laser measurement positioning system comprises a precise two-axis turntable and a marble platform; a high-precision adjustable base and a laser emitting device are fixedly arranged on the precision two-axis turntable from bottom to top in sequence;
the center of the high-precision adjustable base is provided with a vertically upward threaded column for being matched and connected with the laser emitting device, and is provided with a plurality of through holes for being matched and connected with the precision two-axis turntable;
the laser emission device comprises a constant-speed rotating platform, at least one line-structured laser is circumferentially arranged on the side wall of the constant-speed rotating platform, and the line-structured laser can rotate along with the rotating platform;
a photoelectric signal receiving device and a signal processing device are fixed on the marble platform, and the photoelectric signal receiving device is positioned right opposite to the laser emitting device; the signal processing device is connected with the receiving device and used for processing the received laser information to acquire the angle positioning information of the line-structured laser;
the original point of the laser emitting device is basically coincided with the original point of the precise two-axis turntable by adjusting the height of the high-precision adjustable base; the origin of the laser emitting device is an intersection point generated by the vertical intersection of the rotating shaft of the uniform-speed rotating platform and the emitting axis of the laser.
Furthermore, the bottom of the uniform-speed rotating platform is provided with a hole along the central axis thereof, and the inner wall of the hole is provided with a thread groove matched with the thread column for connecting the uniform-speed rotating platform with the high-precision adjustable base in a threaded manner.
Furthermore, four through holes are uniformly formed in the bottom of the high-precision adjustable base along the circumferential direction of the outer edge, and the high-precision adjustable base is fixed on the precision two-axis rotary table through screws.
The other technical scheme of the invention is a line structure laser surface calibration method using the non-parametric model calibration device of the line structure laser surface, which comprises the following steps:
step 1: fixing 1 or more line-structured lasers on a constant-speed rotating platform, fixedly mounting a high-precision adjustable base and the constant-speed rotating platform on the precise two-axis turntable from bottom to top in sequence, and adjusting the height of the high-precision adjustable base to ensure that the original point of a laser emitting device formed by the vertical intersection of a rotating shaft of the constant-speed rotating platform and the emitting axis of the laser to be calibrated is basically superposed with the original point of the precise two-axis turntable;
step 2: fixing a photoelectric signal receiving device corresponding to the laser emitting device on the marble platform and in the direction opposite to the initial position of the laser emitting device, wherein the receiving device is connected with a signal processing device;
and step 3: adjusting the horizontal angle and the pitch angle of the precise two-axis turntable to a preset initial position, and measuring the time interval from the starting point of the rotary platform to the scanning of the photoelectric signal receiving device of the laser surface of the line-structured laser by using the signal processing device;
and 4, step 4: adjusting the horizontal angle of the precision two-axis turntable within a certain range at certain angle intervals, and then adjusting the pitch angle of the precision two-axis turntable to ensure that the rotation time interval t of the laser surface is unchanged;
and 5: adjusting the initial position in the step 3 at a certain angle interval, repeating the step 3 and the step 4, recording a series of mapping relations between space angles and rotation time intervals, and establishing a laser surface calibration mapping table of the line structured light laser, which is called a nonparametric model;
step 6: if more than 1 line-structured laser exists, repeating the steps 3 to 5, establishing laser surface calibration mapping tables of other line-structured light lasers of the same laser emitting device, and completing non-parametric model calibration of the line-structured laser surface of the laser emitting device.
The calibration method of the invention measures the time interval t of the laser surface rotation of the line structured laser by using the signal processing device, and then adjusts the horizontal angle and then adjusts the pitch angle according to the time interval t to protect the time interval t from changing, thereby establishing a laser surface calibration mapping table by discrete horizontal angle and pitch angle values.
Compared with the prior art, the invention has the beneficial effects and remarkable progresses that:
the line structure laser surface calibration method and the calibration device avoid system errors caused by the deviation between the actual surface type and the ideal plane model of the laser surface of the line structure laser, and overcome the difficulty that the laser surface type is difficult to adopt an accurate parameter model for fitting. By establishing direct mapping of the laser surface rotation time and the space standard angle, a standard data mapping table of the laser surface to be calibrated is obtained, and the limitation of a parameter model on the smooth surface calibration precision is broken through; the spatial angle corresponding to any measured point in the space can be realized by interpolating and resolving the standard data mapping table.
The method gets rid of the limitation of establishing a complex parameter model to fit the line structure laser surface profile, establishes a nonparametric model consisting of the laser surface rotation time-space standard angle, has the advantages of intuitive principle, low cost, flexible construction, good feasibility and the like, can improve the measurement positioning precision of the rotary laser measurement positioning system, and has important significance for the development of a multi-base station space measurement positioning system.
Drawings
FIG. 1 is a schematic structural diagram of a non-parametric model calibration device for a line structure laser plane according to the present invention;
FIG. 2 is a top view of a pre-machined high precision adjustable base;
fig. 3 shows the laser surface fit of the 2 line structured lasers in the calibration arrangement shown in fig. 1.
In the figure:
1: a precision two-axis turntable; 2: a high-precision adjustable base; 3: a line structured laser;
4: rotating the platform at a constant speed; 5: a photoelectric signal receiving device; 6: a signal processing device;
7: a through hole; 8: a threaded post.
Detailed Description
In order to make the objects, technical solutions, advantages and significant progress of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings provided in the embodiments of the present invention, and it is obvious that all of the described embodiments are only some embodiments of the present invention, but not all embodiments; all other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the calibration device for the non-parametric model of the line-structured laser surface in the present embodiment is suitable for a rotary laser measurement positioning system, and the calibration device is composed of a precision two-axis turntable 1, a high-precision adjustable base 2, a line-structured laser 3, a uniform rotation platform 4, a photoelectric signal receiving device 5, and a signal processing device 6. The line structure laser 3 with the uniform rotating platform 4 forms a laser emitting device, 2 line structure lasers 3 are circumferentially installed on the side wall of the uniform rotating platform 4, and the included angle of the two line structure lasers 3 is close to 90 degrees. The photoelectric signal receiving device 5 is fixed on the marble platform through a matched target seat and is positioned in the direction opposite to the laser emitting device. The signal processing device 6 is connected to the receiving device 5, and is configured to process the received laser information to obtain angle positioning information of the line structured laser.
The high-precision adjustable base 2 is a precisely machined base, and a vertically upward threaded column which is integrally formed is arranged in the center; the high-precision adjustable base 2 is fixed on the precision two-axis rotary table 1 through four through holes 7 in the bottom through screws, a hole is formed in the bottom of the uniform-speed rotating platform 4 along the central axis of the uniform-speed rotating platform, a thread groove matched with the thread column of the high-precision adjustable base 2 is formed in the inner wall of the hole, and the uniform-speed rotating platform 4 is in threaded connection with the high-precision adjustable base 2 through the thread column 8 matched with the thread groove. The high-precision adjustable base 2 needs to be adjusted in advance to ensure that the origin of the laser emitting device is basically coincident with the origin of the precision two-axis turntable 1. In fig. 1, the rotation axis of the rotation platform 4 is defined as the Z-axis, a directed straight line perpendicular to the Z-axis and within the laser plane 1 is defined as the X-axis, and the Y-axis is determined according to the right-hand rule. The origin of the laser emitting device is an intersection point o generated by vertically intersecting a rotating shaft (Z axis) of the uniform-speed rotating platform 4 and an emitting axis (x axis) of the line-structured laser 3. The second line structured laser 3 is located close to the Y-axis.
The line structure laser surface calibration method applicable to the rotary laser measurement positioning system in the embodiment comprises the following steps:
step 1: fixing 2 line-structured lasers 3 on the uniform-speed rotating platform 4, fixedly mounting a high-precision adjustable base 2 and the uniform-speed rotating platform 4 on the precise two-axis turntable 1 from bottom to top in sequence, and adjusting the height of the high-precision adjustable base 2 to ensure that the original point of a laser emitting device formed by the vertical intersection of a rotating shaft of the uniform-speed rotating platform 4 and the emitting axis of a laser to be calibrated is basically superposed with the original point of the precise two-axis turntable;
step 2: fixing a photoelectric signal receiving device 5 on the marble platform and locating in the direction opposite to the initial position of the laser emitting device, wherein the photoelectric signal receiving device 5 is connected with a signal processing device 6;
and step 3: adjusting the horizontal angle and the pitch angle of the precise two-axis turntable 1 to enable the initial values to be 0 degrees, and recording the time interval t from the rotation starting point to the time when the laser surface in the line-structured laser transmitter 3 sweeps across the photoelectric signal receiving device 5;
and 4, step 4: the horizontal angle of the precision two-axis turntable 1 is adjusted from-45 degrees to 45 degrees at an angle interval of 1 degree, after the horizontal angle is adjusted once, the pitch angle of the precision two-axis turntable 1 is manually and precisely adjusted, the angle adjustment range of the pitch angle is from-20 degrees to 20 degrees, and the adjustment angle is to enable the rotation time interval t value of the laser plane to be unchanged, so that the time for the laser plane to sweep through the photoelectric signal receiving device 5 is ensured to be unchanged; recording the mapping relation of the horizontal angle and the pitch angle corresponding to the time interval; the angle adjustment interval and range are determined according to the system measurement precision and the measurement range;
and 5: repeating the step 4 for many times to establish a rotation time interval-space standard angle calibration mapping table of the laser surface in the line structured light laser 3;
step 6: aiming at the lasers 3 with other line structures of the laser emitting device, the operation of the precise two-axis turntable 1 in the steps 4 and 5 is repeated according to the measuring range and the measuring precision, and then the establishment of the laser surface calibration mapping table of the lasers 3 with other line structures can be completed;
and 7: and (5) combining the calibration mapping tables obtained in the steps 5 to 6 to obtain the calibration mapping tables of all the line structure lasers 3 in the rotary laser measurement positioning system.
In subsequent measurement and positioning, for the measured point at any position in the calibration range, only the measured laser surface rotation time needs to be subjected to interpolation calculation, and the angle positioning information of the measured point relative to the laser emitting device can be obtained.
Fig. 3 shows the fit of the laser planes of the 2 line structured lasers 3 in the calibration arrangement shown in fig. 1 in the range of horizontal angle from-15 ° to 15 ° and pitch angle from-12 ° to 12 °. The two direction calibration lines respectively represent calibration results of the two laser surfaces, the X axis represents the adjustment range of the horizontal angle, and the Y axis represents the adjustment range of the pitch angle; any one calibration line corresponds to a fixed rotation time interval of a certain laser surface and is formed by combining and fitting a plurality of groups of discrete horizontal angles and pitch angles.
Although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made on the technical solutions described in the foregoing embodiments, or some or all of the technical features of the embodiments can be replaced with equivalents, without departing from the scope of the embodiments of the present invention, and the technical solutions can not be modified or replaced by the modifications, the modifications and the substitutions in the non-essential scope of the present invention.
Claims (6)
1. A nonparametric model calibration device of a line structure laser surface comprises a precise two-axis turntable (1) and a marble platform; the device is characterized in that a high-precision adjustable base (2) and a laser emitting device are fixedly arranged on the precision two-axis turntable (1) from bottom to top in sequence;
the center of the high-precision adjustable base (2) is provided with a vertical upward threaded column (8) for being matched and connected with the laser emitting device, and is provided with a plurality of through holes (7) for being matched and connected with the precision two-axis turntable (1);
the laser emitting device comprises a uniform rotating platform (4), at least one line-structured laser (3) is circumferentially arranged on the side wall of the uniform rotating platform (4), and the line-structured laser (3) can rotate along with the uniform rotating platform (4);
a photoelectric signal receiving device (5) and a signal processing device (6) are fixed on the marble platform, and the photoelectric signal receiving device (5) is located at the position opposite to the laser emitting device; the signal processing device (6) is connected with the photoelectric signal receiving device (5) and is used for processing the received laser information to acquire angle positioning information of the line-structured laser (3);
the height of the high-precision adjustable base (2) is adjusted, so that the origin of the laser emitting device is basically coincided with the origin of the precision two-axis turntable (1); the origin of the laser emitting device is an intersection point generated by the vertical intersection of the rotating shaft of the uniform-speed rotating platform (4) and the emitting axis of the line-structured laser (3).
2. The calibration device according to claim 1, wherein a hole is formed in the bottom of the constant speed rotating platform (4) along the central axis thereof, and a thread groove adapted to the thread column is formed in the inner wall of the hole and used for connecting the constant speed rotating platform and the high-precision adjustable base in a threaded manner.
3. The calibration device according to claim 1, wherein four through holes are uniformly formed in the bottom of the high-precision adjustable base (2) along the circumferential direction of the outer edge, and are used for fixing the high-precision adjustable base (2) on the precision two-axis turntable (1) through screws.
4. A line structure laser surface calibration method using the calibration device as claimed in claim 1, characterized by comprising the following steps:
step 1: fixing 1 or more line-structured lasers (3) on a uniform-speed rotating platform (4), fixedly mounting a high-precision adjustable base (2) and the uniform-speed rotating platform (4) on the precise two-axis turntable (1) from bottom to top in sequence, and adjusting the height of the high-precision adjustable base (2) to ensure that the origin of a laser emitting device formed by the vertical intersection of a rotating shaft of the uniform-speed rotating platform (4) and the emitting axis of the line-structured laser (3) to be calibrated is basically superposed with the origin of the precise two-axis turntable (1);
step 2: fixing a photoelectric signal receiving device (5) corresponding to the laser emitting device on the marble platform and in the direction opposite to the initial position of the laser emitting device, wherein the photoelectric signal receiving device (5) is connected with a signal processing device (6);
and step 3: adjusting the horizontal angle and the pitch angle of the precise two-axis turntable (1) to a preset initial position, and measuring the time interval from the starting point of the rotary platform to the scanning of the photoelectric signal receiving device (5) of the laser surface of the linear structure laser (3) by using the photoelectric signal processing device (5);
and 4, step 4: adjusting the horizontal angle of the precision two-axis turntable within a certain angle range at a certain angle interval, and then adjusting the pitch angle of the precision two-axis turntable to ensure that the rotation time interval t of the laser surface is unchanged;
and 5: adjusting the initial position in the step 3 at a certain angle interval, repeating the step 3 and the step 4, recording a series of mapping relations between space angles and rotation time intervals, and establishing a laser surface calibration mapping table of the line structured light laser, which is called a nonparametric model;
step 6: if more than 1 line-structured laser exists, repeating the steps 3 to 5, establishing laser surface calibration mapping tables of other line-structured light lasers of the same laser emitting device, and completing non-parametric model calibration of the line-structured laser surface of the laser emitting device.
5. The calibration method according to claim 4, wherein the horizontal angle adjustment in step 4 is in the range of-45 ° to 45 °.
6. The calibration method according to claim 4, wherein the angle range of the pitch angle adjustment in step 4 is-20 ° to 20 °.
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