CN112729558B - Test adjustment system and method for infrared thermal imaging device - Google Patents
Test adjustment system and method for infrared thermal imaging device Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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Abstract
A test adjustment system and method of an infrared thermal imaging device are provided, the system comprises a heat source module, a large-area array target, a fixed adjustment device and a software discrimination system: the heat source module is used for providing a heat radiation background source for the large-area array target; the large-area array target is used for providing a target pattern for the infrared thermal imaging device; the fixing and adjusting device is used for fixing the infrared thermal imaging device and adjusting the position and the angle of the infrared thermal imaging device, so that a target image acquired by the infrared thermal imaging device is calibrated; the software discrimination system is used for calculating the image quality based on the target image collected by the infrared thermal imaging device. The invention has the advantages of low hardware and maintenance cost, objective test result, good consistency and high detection efficiency, and is suitable for large-batch production detection.
Description
Technical Field
The invention relates to the field of infrared thermal imaging, in particular to a test adjusting system and method of an infrared thermal imaging device.
Background
With the rapid advance of technology, the further evolution of infrared thermal imaging detectors and the change of consumer demands have also led the development of infrared thermal imaging devices toward miniaturization, miniaturization and high imaging quality, and therefore, it is becoming the direction of technical research that the volume of the infrared thermal imaging devices is continuously compressed and simultaneously the imaging quality with high quality is high. The thermal imaging device itself is a very sophisticated and complex device that mainly comprises an infrared lens and an infrared detector. In the manufacturing process of the infrared thermal imaging device, the most important process is to be able to detect the image quality of the thermal imaging device.
At present, most infrared thermal imaging devices only use detection personnel to observe an actual scene or a simple four-bar target through human eyes to carry out subjective judgment, a professional CI test system is proposed or adopted to carry out MRTD test, and finally, the target image on a display is watched by the detection personnel to carry out subjective judgment, so that the test result is not objective enough, and the consistency is poor. Some mechanisms or units have professional letter detection equipment, but the equipment is expensive, has low detection efficiency, is suitable for research and development stages, and is not suitable for large-batch detection.
Disclosure of Invention
In view of the technical defects and technical drawbacks in the prior art, embodiments of the present invention provide a system and a method for testing and adjusting an infrared thermal imaging apparatus, which overcome or at least partially solve the above problems, and the specific solution is as follows:
as a first aspect of the present invention, there is provided a test adjustment system for an infrared thermal imaging apparatus, the system including a heat source module, a large-area array target, a fixing adjustment device, and a software discrimination system:
the heat source module is used for providing a heat radiation background source for the large-area array target;
the large-area array target is used for providing a target pattern for the infrared thermal imaging device;
the fixing and adjusting device is used for fixing the infrared thermal imaging device and adjusting the position and the angle of the infrared thermal imaging device, so that a target image acquired by the infrared thermal imaging device is calibrated;
the software discrimination system is used for calculating the image quality based on the target image collected by the infrared thermal imaging device.
Furthermore, the heat source module comprises an integrated large-area-array metal plate with the surface coating radiance of epsilon and a temperature control unit for controlling the surface temperature of the large-area-array metal plate, and a heat radiation background source is provided for the large-area-array target through the large-area-array metal plate.
Further, the large-area array target comprises a plurality of cross targets positioned at the edge, a plurality of inclined blocks positioned at the edge and one inclined block positioned at the center, wherein the slit width b of the cross target satisfies the following conditions: b is the requirement of 2dL/f, and the length of the cross target meets the requirement of 5b pixel points; each inclined square inclines for a certain angle, and the width h of each inclined square meets the following requirements: h is more than 40 dL/f; the software calculates the area p by the edge diffusion function so as to satisfy the following conditions: p is more than 20dL/f, wherein b is the seam width of the cross target, d is the pixel size of a detector in the infrared thermal imaging device to be detected, L is the distance from a lens in the infrared thermal imaging device to be detected to the large-area array target, and f is the focal length of the lens in the infrared thermal imaging device to be detected.
Further, the large-area array target is also used for providing information characteristics of positioning, discrimination and distortion testing;
the method comprises the steps that the large-area array target is positioned and judged according to whether the center positions of a plurality of cross targets in a target image and the slopes of center inclined squares meet preset values or not, and the information characteristics of the discrimination rate are calculated according to the contrast of edge images of the inclined squares in the target image; and calculating the information characteristics of the distortion test through the fitting center of the central area of the target image and the centers of a plurality of cross targets at the same edge.
Further, the fixed adjusting device adjusts the position and the angle of the infrared thermal imaging device by using a 5-axis (x, y, theta, alpha, beta) moving platform, including adjusting the x-axis position, the y-axis position, the pitch angle theta rotating around the x-axis, the rotation angle alpha rotating around the z-axis and the rotation angle beta rotating around the y-axis of the infrared thermal imaging device.
Further, calibrating the target image collected by the infrared thermal imaging device specifically comprises: fixing the infrared thermal imaging device on the Z axis, and enabling the front surface of the infrared thermal imaging device to be a bearing position; the method comprises the steps of identifying image characteristic targets of large-area array targets according to an algorithm, wherein the image characteristic targets comprise center positions of a plurality of cross targets and slopes of sloping sides of center sloping squares, determining pixel differences in the horizontal direction and the vertical direction based on the center positions of the cross targets and the slopes of the sloping sides of the center sloping squares, and adjusting and compensating an infrared thermal imaging device based on the pixel differences so as to calibrate target images collected by the infrared thermal imaging device.
Further, the software discrimination system is specifically configured to: acquiring the central positions of a plurality of cross targets and the slopes of central inclined squares in the target images, judging whether the central positions of the plurality of cross targets and the slopes of the central inclined squares meet preset values or not, and if not, controlling a fixed adjusting device to adjust the position and the angle of an infrared thermal imaging device until the central positions of the plurality of cross targets and the slopes of the central inclined squares meet the preset values; the method comprises the steps of obtaining contrast of a plurality of inclined square edge images in a target image, determining an edge diffusion function based on the contrast of the inclined square edge images, obtaining a line diffusion function by differentiating the edge diffusion function, then carrying out Fourier transform on the line diffusion function to obtain a definition value M, and calculating image quality based on the definition value M.
As a second aspect of the present invention, there is provided a test adjustment method of an infrared thermal imaging apparatus, the method including:
providing a heat radiation background source for the large-area array target through a heat source module;
providing a target pattern for an infrared thermal imaging device through a large-area array target;
fixing the infrared thermal imaging device through the fixing and adjusting device, and adjusting the position and the angle of the infrared thermal imaging device, so as to calibrate the target image collected by the infrared thermal imaging device;
and calculating the image quality based on the target image acquired by the infrared thermal imaging device through a software discrimination system.
Further, the large-area array target comprises a plurality of cross targets positioned at the edge, a plurality of inclined blocks positioned at the edge and one inclined block positioned at the center, wherein the slit width b of the cross target satisfies the following conditions: b is the requirement of 2dL/f, and the length of the cross target meets the requirement of 5b pixel points; each inclined square inclines for a certain angle, and the width h of each inclined square meets the following requirements: h is more than 40 dL/f; the software calculates the area p by the edge diffusion function so as to satisfy the following conditions: p is more than 20dL/f, wherein b is the seam width of the cross target, d is the pixel size of a detector in the infrared thermal imaging device to be detected, L is the distance from a lens in the infrared thermal imaging device to be detected to the large-area array target, and f is the focal length of the lens in the infrared thermal imaging device to be detected.
Further, the fixed adjusting device adopts a 5-axis moving platform to adjust the position and the angle of the infrared thermal imaging device, and comprises an x-axis position, a y-axis position, a pitch angle theta rotating around the x-axis, a rotation angle alpha rotating around the z-axis and a rotation angle beta rotating around the y-axis of the infrared thermal imaging device; the target image collected by the infrared thermal imaging device is calibrated specifically as follows: fixing the infrared thermal imaging device on the Z axis, and enabling the front surface of the infrared thermal imaging device to be a bearing position; the method comprises the steps of identifying image characteristic targets of large-area array targets according to an algorithm, wherein the image characteristic targets comprise center positions of a plurality of cross targets and slopes of sloping sides of center sloping squares, determining pixel differences in the horizontal direction and the vertical direction based on the center positions of the cross targets and the slopes of the sloping sides of the center sloping squares, and adjusting and compensating an infrared thermal imaging device based on the pixel differences so as to calibrate target images collected by the infrared thermal imaging device.
Further, the image quality is calculated by the software discrimination system based on the target image collected by the infrared thermal imaging device, specifically:
acquiring the central positions of a plurality of cross targets and the slopes of central inclined squares in the target images, judging whether the central positions of the plurality of cross targets and the slopes of the central inclined squares meet preset values or not, and if not, controlling a fixed adjusting device to adjust the position and the angle of an infrared thermal imaging device until the central positions of the plurality of cross targets and the slopes of the central inclined squares meet the preset values;
the method comprises the steps of obtaining contrast of a plurality of inclined square edge images in a target image, determining an edge diffusion function based on the contrast of the inclined square edge images, obtaining a line diffusion function by differentiating the edge diffusion function, then carrying out Fourier transform on the line diffusion function to obtain a definition value M, and calculating image quality based on the definition value M.
The invention has the following beneficial effects:
the invention has the advantages of low hardware and maintenance cost, objective test result, good consistency and high detection efficiency, and is suitable for large-batch production detection.
Drawings
FIG. 1 is a block diagram of a test adjustment system of an infrared thermal imaging apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram of an integrated large-area array target according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a target image according to an embodiment of the present invention;
fig. 4 is a schematic diagram of position adjustment according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, as a first embodiment of the present invention, a testing adjustment system for an infrared thermal imaging apparatus is provided, which includes a heat source module, an integrated large-area array target, a fixed adjustment device, and a software determination system.
The heat source module is used for providing a stable heat radiation background source.
The heat source module adopts a plurality of semiconductor refrigerators, and the semiconductor refrigerators are reasonably arranged and matched with a radiator, a temperature sensor and an integrated large-area array metal plate with the surface coating radiance of epsilon to form a heating body with uniform surface temperature and stable and controllable temperature.
The large-area array target is used for providing a target pattern for the infrared thermal imaging device to calculate imaging quality.
The large-area array target comprises a plurality of patterns and has information characteristics of providing positioning/distinguishing rate/distortion test and the like.
The various patterns are for the convenience of algorithm identification and calculation, and the large area target of the present embodiment includes 4 cross targets located at the edge, 4 inclined squares located at the edge, and 1 inclined square located at the center, as shown in fig. 2-3, wherein C1-C4 are hollowed cross targets for positioning and distortion calculation: the target seam width b is 2dL/f, and the length c is 5 b; A1-B8 are calculated definition M values, wherein: a1& A2 is calculating near-center field target calculation area; B1-B8 are edge view field target calculation areas; the inclination angle of each inclined square block is 11.3 degrees, h is the width of the inclined square block and satisfies h more than 40 dL/f; and p is an edge diffusion function calculation region carried out by software, and satisfies p >20 dL/f.
Adopting the centers of 4 cross targets on the edge and identifying the slope of two edges of the central inclined square block to accord with the design value; positioning;
the width of the cross target meets the requirement that b is 2dL/f, and the length meets the requirement of 5b pixel points;
and b is the seam width of the cross target, d is the pixel size of a detector in the infrared thermal imaging device to be detected, L is the distance from a lens in the infrared thermal imaging device to be detected to the large-area array target, and f is the focal length of the lens in the infrared thermal imaging device to be detected. The discrimination is realized by calculating the contrast of the image of the edge of the inclined square through an algorithm; the distortion is calculated by calculating the fitting center of the central area and the centers of 4 cross targets at the periphery; the test consistency of different products to be tested is improved through positioning; the image is used to calculate the discrimination and distortion.
The fixed adjusting device is used for calibrating the image so as to ensure the consistency of the test process;
the fixed adjusting device adopts a 5-axis (x, y, theta, alpha, beta) moving platform to adjust the horizontal x-axis position, the vertical y-axis position, the pitch angle theta rotating around the horizontal x-axis, the rotation angle alpha rotating around the Z-axis and the rotation angle beta rotating around the y-axis of the infrared thermal imaging device, as shown in fig. 4, the infrared thermal imaging device is fixed on the Z-axis, and the front surface of the infrared thermal imaging device is assumed to be a bearing position; according to the image characteristic target identified by the algorithm, based on the centers of the 4 cross targets and the slope of the inclined edge of the inclined block of the center, the number of pixels with horizontal and vertical differences is fed back to adjust and compensate, the difference is required to be within 2 pixels, and if the difference does not meet the requirement, performance test calculation cannot be executed.
The software discrimination system is used for calculating the image quality based on the target image collected by the infrared thermal imaging device; the central position of the peripheral cross target and the slope of the bevel edge image of the central inclined block need to be obtained, whether the positioning meets the requirement is judged, and if not, the positioning needs to be adjusted; based on the contrast of the edges of the five internal inclined squares, an edge diffusion function is obtained, the edge diffusion function is derived to obtain a line diffusion function, then Fourier transform is carried out on the line diffusion function to obtain a definition value M, and a proper value can be determined according to the correlation between the M value and the definition of the real shooting scene to be used as a standard for management and control.
As a second embodiment of the present invention, there is also provided a test adjustment method of an infrared thermal imaging apparatus, the method including:
providing a heat radiation background source for the large-area array target through a heat source module;
providing a target pattern for an infrared thermal imaging device through a large-area array target;
fixing the infrared thermal imaging device through the fixing and adjusting device, and adjusting the position and the angle of the infrared thermal imaging device, so as to calibrate the target image collected by the infrared thermal imaging device;
and calculating the image quality based on the target image acquired by the infrared thermal imaging device through a software discrimination system.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (8)
1. The system is characterized by comprising a heat source module, a large-area array target, a fixed adjusting device and a software judging system:
the heat source module is used for providing a heat radiation background source for the large-area array target;
the large-area array target is used for providing a target pattern for the infrared thermal imaging device;
the fixing and adjusting device is used for fixing the infrared thermal imaging device and adjusting the position and the angle of the infrared thermal imaging device, so that a target image acquired by the infrared thermal imaging device is calibrated;
the software discrimination system is used for calculating the image quality based on the target image collected by the infrared thermal imaging device;
wherein the large area array target comprises a plurality of cross targets positioned at the edge, a plurality of inclined blocks positioned at the edge and an inclined block positioned at the center;
the software discrimination system is specifically configured to: acquiring the central positions of a plurality of cross targets and the slopes of central inclined squares in the target images, judging whether the central positions of the plurality of cross targets and the slopes of the central inclined squares meet preset values or not, and if not, controlling a fixed adjusting device to adjust the position and the angle of an infrared thermal imaging device until the central positions of the plurality of cross targets and the slopes of the central inclined squares meet the preset values; the method comprises the steps of obtaining contrast of a plurality of inclined square edge images in a target image, determining an edge diffusion function based on the contrast of the inclined square edge images, obtaining a line diffusion function by differentiating the edge diffusion function, then carrying out Fourier transform on the line diffusion function to obtain a definition value M, and calculating image quality based on the definition value M.
2. The system of claim 1, wherein the heat source module comprises an integral large-area array metal plate with a surface coating emissivity epsilon and a temperature control unit for controlling the surface temperature of the large-area array metal plate, and the large-area array metal plate is used for providing a heat radiation background source for the large-area array target.
3. The system for testing and adjusting an infrared thermal imaging device according to claim 1, wherein the slit width b of the cross target satisfies: b is the requirement of 2dL/f, and the length of the cross target meets the requirement of 5b pixel points; each inclined square inclines for a certain angle, and the width h of each inclined square meets the following requirements: h is more than 40 dL/f; the software calculates the area p by the edge diffusion function so as to satisfy the following conditions: p is more than 20dL/f, wherein b is the seam width of the cross target, d is the pixel size of a detector in the infrared thermal imaging device to be detected, L is the distance from a lens in the infrared thermal imaging device to be detected to the large-area array target, and f is the focal length of the lens in the infrared thermal imaging device to be detected.
4. The test conditioning system for an infrared thermal imaging device of claim 3, wherein the large area array target is further configured to provide information characteristic of positioning, discrimination and distortion testing;
the method comprises the steps that the large-area array target is positioned and judged according to whether the center positions of a plurality of cross targets in a target image and the slopes of center inclined squares meet preset values or not, and the information characteristics of the discrimination rate are calculated according to the contrast of edge images of the inclined squares in the target image; and calculating the information characteristics of the distortion test through the fitting center of the central area of the target image and the centers of a plurality of cross targets at the same edge.
5. The system of claim 3, wherein the fixed adjustment device adjusts the position and angle of the infrared thermal imaging device using a 5-axis moving platform, including adjusting the x-axis position, the y-axis position, the tilt angle θ of the infrared thermal imaging device about the x-axis, the rotation angle α about the z-axis, and the rotation angle β about the y-axis.
6. The system for testing and adjusting an infrared thermal imaging device according to claim 3, wherein the calibration of the target image acquired by the infrared thermal imaging device is specifically: fixing the infrared thermal imaging device on the Z axis, and enabling the front surface of the infrared thermal imaging device to be a bearing position; the method comprises the steps of identifying image characteristic targets of large-area array targets according to an algorithm, wherein the image characteristic targets comprise center positions of a plurality of cross targets and slopes of sloping sides of center sloping squares, determining pixel differences in the horizontal direction and the vertical direction based on the center positions of the cross targets and the slopes of the sloping sides of the center sloping squares, and adjusting and compensating an infrared thermal imaging device based on the pixel differences so as to calibrate target images collected by the infrared thermal imaging device.
7. A test adjustment method of an infrared thermal imaging device is characterized by comprising the following steps:
providing a heat radiation background source for the large-area array target through a heat source module;
providing a target pattern for an infrared thermal imaging device through a large-area array target;
fixing the infrared thermal imaging device through the fixing and adjusting device, and adjusting the position and the angle of the infrared thermal imaging device, so as to calibrate the target image collected by the infrared thermal imaging device;
calculating the image quality based on the target image collected by the infrared thermal imaging device through a software discrimination system;
wherein the large area array target comprises a plurality of cross targets positioned at the edge, a plurality of inclined blocks positioned at the edge and an inclined block positioned at the center;
the method specifically comprises the following steps of calculating the image quality based on a target image acquired by an infrared thermal imaging device through a software discrimination system:
acquiring the central positions of a plurality of cross targets and the slopes of central inclined squares in the target images, judging whether the central positions of the plurality of cross targets and the slopes of the central inclined squares meet preset values or not, and if not, controlling a fixed adjusting device to adjust the position and the angle of an infrared thermal imaging device until the central positions of the plurality of cross targets and the slopes of the central inclined squares meet the preset values;
the method comprises the steps of obtaining contrast of a plurality of inclined square edge images in a target image, determining an edge diffusion function based on the contrast of the inclined square edge images, obtaining a line diffusion function by differentiating the edge diffusion function, then carrying out Fourier transform on the line diffusion function to obtain a definition value M, and calculating image quality based on the definition value M.
8. The method for testing and adjusting an infrared thermal imaging device according to claim 7, wherein the slit width b of the cross target satisfies: b is the requirement of 2dL/f, and the length of the cross target meets the requirement of 5b pixel points; each inclined square inclines for a certain angle, and the width h of each inclined square meets the following requirements: h is more than 40 dL/f; the software calculates the area p by the edge diffusion function so as to satisfy the following conditions: p is more than 20dL/f, wherein b is the seam width of the cross target, d is the pixel size of a detector in the infrared thermal imaging device to be detected, L is the distance from a lens in the infrared thermal imaging device to be detected to the large-area array target, and f is the focal length of the lens in the infrared thermal imaging device to be detected.
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