CN112710898A - New energy rapid frequency response test system and method - Google Patents
New energy rapid frequency response test system and method Download PDFInfo
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- CN112710898A CN112710898A CN202011550840.7A CN202011550840A CN112710898A CN 112710898 A CN112710898 A CN 112710898A CN 202011550840 A CN202011550840 A CN 202011550840A CN 112710898 A CN112710898 A CN 112710898A
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- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
The invention discloses a new energy rapid frequency response testing system and a new energy rapid frequency response testing method. The invention comprises a time test system, a micro-current test system, a data acquisition system and a data processing system, wherein the time test system analyzes and evaluates various performance indexes of time frequency, and then obtains a power parameter of frequency response by setting a frequency and active power broken line function; the micro-current testing system detects the weak current to complete the monitoring of the weak current; the data acquisition system acquires medium response signals under different frequency conditions, and establishes a state cyclic transfer process aiming at different frequency band processing; the data processing system modulates the data obtained by testing, and then calculates the real part and the imaginary part of the complex capacitance of the object to be tested through the test output voltage, the micro-current amplitude and the phase angle difference, so as to realize the automatic testing of the rapid frequency response of the new energy.
Description
Technical Field
The invention relates to the technical field of frequency testing, in particular to a new energy rapid frequency response testing system and a new energy rapid frequency response testing method.
Background
With the continuous increase of the new energy occupation ratio of the power grid, the ultrahigh voltage direct current transmission is gradually put into operation, the power grid operation and structure are increasingly complex, the frequency modulation difficulty of a power grid generation system is continuously increased, new energy is urgently needed to participate in the quick frequency response of the power grid, and the large power grid frequency risk prevention and control level is improved.
The rapid frequency response function of the new energy station is a function of automatically reducing or increasing the output of the generator set by automatically reacting and adjusting the process of reducing the frequency deviation of the active output when the frequency of the power system deviates from the target frequency. The rapid frequency response function of the new energy station has an extremely important influence on the safe and stable operation of the power grid, rapid frequency response is effectively carried out, and the safe and stable limit range of the power grid can be influenced.
At present, a plurality of network provinces have already developed the rapid frequency response work of new energy stations, and a plurality of manufacturers have also provided devices suitable for the rapid frequency response of the new energy stations, but the following problems mainly exist: 1. the product test of each manufacturer is basically carried out manually, the test time is long, and the efficiency is low; 2. the occurrence of high-power direct-current blocking seriously threatens the frequency safety of a power grid, and the frequency modulation pressure and the safe operation risk of the power grid are continuously increased; 3. and manual testing is adopted during field operation, so that the workload is large and the matching is complex.
Disclosure of Invention
The technical problem to be solved by the present invention is to overcome the defects existing in the prior art, and provide a system and a method for testing the fast frequency response of new energy, so as to realize the automatic test of the fast frequency response of new energy.
Therefore, the invention adopts the following technical scheme: a new energy fast frequency response test system, comprising:
the time testing system analyzes and evaluates various performance indexes of the time frequency of the new energy, and obtains power parameters of frequency response by setting a frequency and active power broken line function;
the micro-current testing system is used for detecting the weak current and completing the monitoring of the weak current;
the data acquisition system is used for acquiring medium response signals under different frequency conditions, and establishing a state cycle transfer process of the data acquisition system aiming at different frequency band processing;
and the data processing system modulates the acquired data, converts the data into a complex dielectric constant through geometric conversion, and calculates the real part and the imaginary part of the complex capacitance of the object to be tested through testing the output voltage, the amplitude value of the micro-current and the phase angle difference, so that the automatic test of the rapid frequency response of the new energy is realized.
Further, the time in the time test system includes a response lag time, a response time, and an adjustment time, and the response lag time is: the time required from the beginning of the frequency modulation dead zone to the beginning of the change of the generated output to the frequency modulation direction when the frequency crosses the new energy power station; the response time is as follows: starting from the time when the frequency exceeds the frequency modulation dead zone, and reaching the time required by the frequency modulation target value and the initial power by the active power regulating quantity; the adjusting time is as follows: and starting from the time when the frequency exceeds the frequency modulation dead zone to the time when the active power reaches a stable value.
Furthermore, the micro-current test system converts a current signal to be tested into a voltage signal through I-V conversion, and feeds back the performance of the current amplification type measurement circuit in the aspects of frequency response characteristics and conversion linearity.
Further, after the data acquisition system acquires the medium response signals under different frequency conditions, the data acquisition system acquires the data response rate to complete the data acquisition of the specified frequency.
Further, the time testing system analyzes various performance indexes of the time frequency of the new energy to obtain the following formula:
maxr∈Ω{B(R)-C(R)}
minr∈Ω{X(R)+C(R)}
wherein R represents a fast frequency response spare capacity; c (R) represents a spare provision cost at the spare capacity R; x (R) represents the reliability cost of the time test system; b (R) represents the reliability gain of the time testing system; maxr∈ΩRepresents a maximum function; minr∈ΩRepresenting a minimum function;
according to the droop characteristic of the active frequency of the frequency response, the following formula is obtained by setting a fold line function of the frequency and the active power:
in the formula (f)dRepresenting a fast frequency response dead zone; f. ofNRepresenting a time test system rated frequency; pNRepresents a rated power; delta% represents the response difference rate of new energy; p0Representing an initial value of active power, and P represents a function value of the active power; f denotes the frequency measurement.
The other technical scheme adopted by the invention is as follows: a new energy quick frequency response test method comprises the following steps:
step 1, analyzing and evaluating various performance indexes of time frequency of new energy, and obtaining power parameters of frequency response by setting a frequency and active power broken line function;
step 2, detecting the flowing weak current to complete the monitoring of the weak current;
step 3, collecting medium response signals under different frequency conditions, acquiring the data response rate, completing data adoption of specified frequency, and establishing a state cycle transfer process of the data collection system aiming at different frequency band processing;
and 4, modulating the acquired data, converting the data into a complex dielectric constant through geometric conversion, and calculating a real part and an imaginary part of a complex capacitor of the object to be tested through testing output voltage, a micro-current amplitude and a phase angle difference so as to realize automatic testing of the rapid frequency response of the new energy.
Further, in step 1, each performance index of the time frequency of the new energy is analyzed to obtain the following formula:
maxr∈Ω{B(R)-C(R)}
minr∈Ω{X(R)+C(R)}
wherein R represents a fast frequency response spare capacity; c (R) represents a spare provision cost at the spare capacity R; when X (R) representsReliability cost of the inter-test system; b (R) represents the reliability gain of the time testing system; maxr∈ΩRepresents a maximum function; minr∈ΩRepresenting a minimum function;
according to the droop characteristic of the active frequency of the frequency response, the following formula is obtained by setting a fold line function of the frequency and the active power:
in the formula (f)dRepresenting a fast frequency response dead zone; f. ofNRepresenting a time test system rated frequency; pNRepresents a rated power; delta% represents the response difference rate of new energy; p0Representing an initial value of active power, and P represents a function value of the active power; f denotes the frequency measurement.
Further, in the step 2, the weak current flowing through the micro-current testing system is detected by a maxwell equation, so as to obtain the following formula:
D(T)＝ε0E(T)P(T)
wherein D (P) represents the potential shift generated at two ends of the electrode; epsilon0Represents a dielectric constant; p (t) represents the polarization response; epsilon0E (T) represents a contribution value;
the following equation is derived from the polarization response:
P(ω)＝ε0[εx-1+x(ω)]Eω
in the formula, epsilonxRepresents a high-frequency dielectric constant; ω represents angular frequency; x (ω) represents a repolarization coefficient; p (ω) represents the electrolyte frequency function; e represents the inter-electrode distance;
the following formula is obtained by maxwell's equations:
in the formula, σ0Represents the direct current conductivity; j represents the density value of the current;
comparative values are indicated.
Further, step 3 establishes a state cycle transfer process of the data acquisition system for different frequency band processing, and calculates the state of the time test system to obtain an evaluation index function of the data acquisition system, where the expression formula is as follows:
in the formula, TmaxRepresents the total time length; xt represents the running state of the data acquisition system at the moment t; f (xt) represents an evaluation index function of the data acquisition system;
an estimated value representing an evaluation index;
the data acquisition method comprises the following specific steps:
step 31, setting the sampled data to complete the range of the sampling value;
step 32, multi-channel data acquisition, and data analysis capability is improved;
step 33, calculating the acquired parameters and displaying images;
step 34, counting the feedback times of the data, and if the feedback times do not reach the standard, feeding back to step 32;
and step 35, storing the data reaching the standard, and finishing setting, converting and storing the data.
Further, in the step 4, by the following formula:
in the formula, I (ω) represents a response current; u (ω) represents the excitation voltage; c represents a geometric capacitance;
representation complexThe real part of the capacitance C (ω);
represents the imaginary part of the complex capacitance C (ω);
and then the response current is converted into a complex dielectric constant, and the phase angle between the output voltage and the micro-current is obtained by a zero-crossing comparison method.
The invention has the following beneficial effects: the invention relates to a system and a method for testing the rapid frequency response of new energy, which analyze each performance index of the time frequency of the new energy to obtain a reliable gain function; obtaining a power function through the droop characteristic of the active frequency of the frequency response by setting a frequency and active power broken line function, and detecting weak current flowing through a micro-current test system through a Maxwell equation to obtain the electric potential shift generated at two ends of a new energy electrode; aiming at different frequency band processing, a state cycle transfer process of the system is established, the state of the time test system is calculated, a system evaluation index function is obtained, the complex dielectric constant is obtained through geometric conversion, the real part and the imaginary part of the complex capacitance of the object to be tested are calculated through testing the output voltage, the micro-current amplitude and the phase angle difference, and the automatic test of the new energy quick frequency response is realized.
Drawings
FIG. 1 is a block diagram of a fast frequency response test system for new energy in accordance with the present invention;
FIG. 2 is a flow chart of a new energy fast frequency response test method according to the present invention;
FIG. 3 is a flow chart of data acquisition according to the present invention.
Detailed Description
The invention is further described with reference to the drawings and the detailed description.
Example 1
As shown in fig. 1, in this embodiment, a new energy fast frequency response test system includes:
the time testing system analyzes and evaluates various performance indexes of the time frequency of the new energy, and obtains power parameters of frequency response by setting a frequency and active power broken line function;
the micro-current testing system detects the weak current flowing through the micro-current testing system through the Maxwell equation to complete the monitoring of the weak current;
the data acquisition system is used for acquiring medium response signals under different frequency conditions, and establishing a state cycle transfer process of the data acquisition system aiming at different frequency band processing;
and the data processing system modulates the acquired data, converts the data into a complex dielectric constant through geometric conversion, and calculates the real part and the imaginary part of the complex capacitance of the object to be tested through testing the output voltage, the amplitude value of the micro-current and the phase angle difference, so as to realize the automatic test of the rapid frequency response of the new energy.
The time of the time test system comprises response lag time, response time and adjusting time, wherein the response lag time is as follows: the time required from the beginning of the frequency modulation dead zone to the beginning of the change of the generated output to the frequency modulation direction when the frequency crosses the new energy power station; the response time is as follows: starting from the time when the frequency exceeds the frequency modulation dead zone, and reaching the time required by the frequency modulation target value and the initial power by the active power regulating quantity; the adjusting time is as follows: and starting from the time when the frequency exceeds the frequency modulation dead zone to the time when the active power reaches a stable value.
The micro-current test system converts a current signal to be tested into a voltage signal through I-V conversion, and feeds back the performance of the current amplification type measurement circuit in the aspects of frequency response characteristics and conversion linearity.
And the data acquisition system acquires the medium response signals under different frequency conditions to acquire the data response rate and finish the data acquisition of the specified frequency.
In the time testing system, various performance indexes of the time frequency of the new energy are analyzed to obtain the following formula:
maxr∈Ω{B(R)-C(R)}
minr∈Ω{X(R)+C(R)}
wherein R represents a fast frequency response spare capacity; c (R) represents a spare provision cost at the spare capacity R; x (R) represents the reliability cost of the time test system; b (R) watchShowing the reliability gain of the time testing system; maxr∈ΩRepresents a maximum function; minr∈ΩRepresenting a minimum function;
according to the droop characteristic of the active frequency of the frequency response, the following formula is obtained by setting a fold line function of the frequency and the active power:
in the formula (f)dRepresenting a fast frequency response dead zone; f. ofNRepresenting the nominal frequency of the time test system; pNRepresents a rated power; delta% represents the response difference rate of new energy; p0Representing an initial value of active power, and P represents a function value of the active power; f denotes the frequency measurement.
In the micro-current testing system, the weak current flowing through the micro-current testing system is detected by a Maxwell equation, and then the following formula is obtained:
D(T)＝ε0E(T)P(T)
wherein D (T) represents the potential shift generated at two ends of the electrode; epsilon0Represents a dielectric constant; p (t) represents the polarization response; epsilon0E (T) represents a contribution value;
the following equation is derived from the polarization response:
P(ω)＝ε0[εx-1+x(ω)]Eω
in the formula, epsilonxRepresents a high-frequency dielectric constant; ω represents angular frequency; x (ω) represents a repolarization coefficient; p (ω) represents the electrolyte frequency function; e represents the inter-electrode distance;
the following formula is obtained by maxwell's equations:
in the formula, σ0Represents the direct current conductivity; j represents the density value of the current;
comparative values are indicated.
In the data acquisition system, aiming at different frequency band processing, a state cycle transfer process of the data acquisition system is established, the state of the time test system is calculated, and an evaluation index function of the data acquisition system is obtained, wherein the expression formula is as follows:
in the formula, TmaxRepresents the total time length; xt represents the running state of the data acquisition system at the moment t; f (xt) represents an evaluation index function of the data acquisition system;
an estimated value representing an evaluation index;
the specific steps of data acquisition are as follows, as shown in fig. 3:
step 31, setting the sampled data to complete the range of the sampling value;
step 32, multi-channel data acquisition, and data analysis capability is improved;
step 33, calculating the acquired parameters and displaying images;
step 34, counting the feedback times of the data, and if the feedback times do not reach the standard, feeding back to step 32;
and step 35, storing the data reaching the standard, and finishing setting, converting and storing the data.
In the data processing system, the following formula is used:
in the formula, I (ω) represents a response current; u (ω) represents the excitation voltage; c represents a geometric capacitance;
represents the real part of the complex capacitance C (ω);
represents the imaginary part of the complex capacitance C (ω);
and then the response current is converted into a complex dielectric constant, and the phase angle between the output voltage and the micro-current is obtained by a zero-crossing comparison method.
Example 2
The embodiment provides a new energy fast frequency response testing method, as shown in fig. 2, which includes the following steps:
step 1, analyzing and evaluating various performance indexes of time frequency of new energy, and obtaining power parameters of frequency response by setting a frequency and active power broken line function;
step 2, detecting weak current flowing through the micro-current testing system through a Maxwell equation to complete monitoring of the weak current;
step 3, collecting medium response signals under different frequency conditions, acquiring the data response rate, completing data adoption of specified frequency, and establishing a state cycle transfer process of the data collection system aiming at different frequency band processing;
and 4, modulating the acquired data, converting the data into a complex dielectric constant through geometric conversion, and calculating a real part and an imaginary part of a complex capacitor of the object to be tested through testing output voltage, a micro-current amplitude and a phase angle difference so as to realize automatic testing of the rapid frequency response of the new energy.
In step 1, the time of the time frequency of the new energy includes response lag time, response time and adjustment time, where the response lag time is: the time required from the beginning of the frequency modulation dead zone to the beginning of the change of the generated output to the frequency modulation direction when the frequency crosses the new energy power station; the response time is as follows: starting from the time when the frequency exceeds the frequency modulation dead zone, and reaching the time required by the frequency modulation target value and the initial power by the active power regulating quantity; the adjusting time is as follows: and starting from the time when the frequency exceeds the frequency modulation dead zone to the time when the active power reaches a stable value.
In the step 1, various performance indexes of the time frequency of the new energy are analyzed to obtain the following formula:
maxr∈Ω{B(R)-C(R)}
minr∈Ω{X(R)+C(R)}
wherein R represents a fast frequency response spare capacity; c (R) represents a spare provision cost at the spare capacity R; x (R) represents the time test system reliability cost; b (R) represents the reliability gain of the time testing system; maxr∈ΩRepresents a maximum function; minr∈ΩRepresenting a minimum function;
according to the droop characteristic of the active frequency of the frequency response, the following formula is obtained by setting a fold line function of the frequency and the active power:
in the formula (f)dRepresenting a fast frequency response dead zone; f. ofNRepresenting a time test system rated frequency; pNRepresents a rated power; delta% represents the response difference rate of new energy; p0Representing an initial value of active power, and P represents a function value of the active power; f denotes the frequency measurement.
In the step 2, the weak current flowing through the micro-current test system is detected by a Maxwell equation, and then the following formula is obtained:
D(T)＝ε0E(T)P(T)
wherein D (T) represents the potential shift generated at two ends of the electrode; epsilon0Represents a dielectric constant; p (t) represents the polarization response; epsilon0E (T) represents a contribution value;
the following equation is derived from the polarization response:
P(ω)＝ε0[εx-1+x(ω)]Eω
in the formula, epsilonxRepresents a high-frequency dielectric constant; ω represents angular frequency; x (ω) represents a repolarization coefficient; p (ω) represents the electrolyte frequency function; e represents the inter-electrode distance;
the following formula is obtained by maxwell's equations:
in the formula, σ0Represents the direct current conductivity; j represents the density value of the current;
comparative values are indicated.
Step 3, aiming at different frequency band processing, establishing a state cycle transfer process of the data acquisition system, calculating the state of the time test system, and obtaining an evaluation index function of the data acquisition system, wherein the expression formula is as follows:
in the formula, TmaxRepresents the total time length; xt represents the running state of the data acquisition system at the moment t; f (xt) represents an evaluation index function of the data acquisition system;
an estimated value representing an evaluation index;
the data acquisition method comprises the following specific steps:
step 31, setting the sampled data to complete the range of the sampling value;
step 32, multi-channel data acquisition, and data analysis capability is improved;
step 33, calculating the acquired parameters and displaying images;
step 34, counting the feedback times of the data, and if the feedback times do not reach the standard, feeding back to step 32;
and step 35, storing the data reaching the standard, and finishing setting, converting and storing the data.
In the step 4, the following formula is used:
in the formula, I (ω) represents a response current; u (ω) represents the excitation voltage; c represents a geometric capacitance;
represents the real part of the complex capacitance C (ω);
represents the imaginary part of the complex capacitance C (ω);
and then the response current is converted into a complex dielectric constant, and the phase angle between the output voltage and the micro-current is obtained by a zero-crossing comparison method.
It should be noted that the various features described in the above embodiments may be combined in any suitable manner without departing from the scope of the invention. The invention is not described in detail in order to avoid unnecessary repetition.
Claims (10)
1. A new energy quick frequency response test system is characterized by comprising:
the time testing system analyzes and evaluates various performance indexes of the time frequency of the new energy, and obtains power parameters of frequency response by setting a frequency and active power broken line function;
the micro-current testing system is used for detecting the weak current and completing the monitoring of the weak current;
the data acquisition system is used for acquiring medium response signals under different frequency conditions, and establishing a state cycle transfer process of the data acquisition system aiming at different frequency band processing;
and the data processing system modulates the acquired data, converts the data into a complex dielectric constant through geometric conversion, and calculates the real part and the imaginary part of the complex capacitance of the object to be tested through testing the output voltage, the amplitude value of the micro-current and the phase angle difference.
2. The system according to claim 1, wherein the time of the time test system comprises a response lag time, a response time and an adjustment time, and the response lag time is: the time required from the beginning of the frequency modulation dead zone to the beginning of the change of the generated output to the frequency modulation direction when the frequency crosses the new energy power station; the response time is as follows: starting from the time when the frequency exceeds the frequency modulation dead zone, and reaching the time required by the frequency modulation target value and the initial power by the active power regulating quantity; the adjusting time is as follows: and starting from the time when the frequency exceeds the frequency modulation dead zone to the time when the active power reaches a stable value.
3. The system as claimed in claim 1, wherein the micro-current testing system converts the current signal to be tested into a voltage signal by I-V conversion, and feeds back the performance of the current amplification type measuring circuit in terms of frequency response characteristics and conversion linearity.
4. The system according to claim 1, wherein the data acquisition system acquires the medium response signals under different frequency conditions and completes data acquisition of the designated frequency at a rate of acquiring data response.
5. The system according to claim 1, wherein the time measurement system analyzes each performance index of the time frequency of the new energy to obtain the following formula:
maxr∈Ω{B(R)-C(R)}
minr∈Ω{X(R)+C(R)}
wherein R represents a fast frequency response spare capacity; c (R) represents a spare provision cost at the spare capacity R; x (R) represents the reliability cost of the time test system; b (R) represents the reliability gain of the time testing system; maxr∈ΩRepresents a maximum function; minr∈ΩRepresenting a minimum function;
according to the droop characteristic of the active frequency of the frequency response, the following formula is obtained by setting a fold line function of the frequency and the active power:
in the formula (f)dRepresenting a fast frequency response dead zone; f. ofNRepresenting the nominal frequency of the time test system; pNRepresents a rated power; delta% represents the response difference rate of new energy; p0Representing an initial value of active power, and P represents a function value of the active power; f denotes the frequency measurement.
6. A new energy quick frequency response test method is characterized by comprising the following steps:
step 1, analyzing and evaluating various performance indexes of time frequency of new energy, and obtaining power parameters of frequency response by setting a frequency and active power broken line function;
step 2, detecting the weak current to complete the monitoring of the weak current;
step 3, collecting medium response signals under different frequency conditions, acquiring the data response rate, completing data adoption of specified frequency, and establishing a state cycle transfer process of the data collection system aiming at different frequency band processing;
and 4, modulating the acquired data, converting the data into a complex dielectric constant through geometric conversion, and calculating a real part and an imaginary part of a complex capacitor of the object to be tested through testing output voltage, a micro-current amplitude and a phase angle difference.
7. The method as claimed in claim 6, wherein in the step 1, each performance index of the time frequency of the new energy is analyzed to obtain the following formula:
maxr∈Ω{B(R)-C(R)}
minr∈Ω{X(R)+C(R)}
wherein R represents a fast frequency response spare capacity; c (R) represents a spare provision cost at the spare capacity R; x (R) represents the reliability cost of the time test system; b (R) represents the reliability gain of the time testing system; maxr∈ΩRepresents a maximum function; minr∈ΩRepresenting a minimum function;
according to the droop characteristic of the active frequency of the frequency response, the following formula is obtained by setting a fold line function of the frequency and the active power:
in the formula (f)dRepresenting a fast frequency response dead zone; f. ofNRepresenting the nominal frequency of the time test system; pNRepresents a rated power; delta% represents the response difference rate of new energy; p0Representing an initial value of active power, and P represents a function value of the active power; f denotes the frequency measurement.
8. The new energy rapid frequency response testing method according to claim 6, wherein in the step 2, the weak current flowing through the micro-current testing system is detected through Maxwell's equation, and then the following formula is obtained:
D(T)＝ε0E(T)P(T)
wherein D (T) represents the potential shift generated at two ends of the electrode; epsilon0Represents a dielectric constant; p (t) represents the polarization response; epsilon0E (T) represents a contribution value;
the following equation is derived from the polarization response:
P(ω)＝ε0[εx-1+x(ω)]Eω
in the formula, epsilonxRepresents a high-frequency dielectric constant; ω represents angular frequency; x (ω) represents a repolarization coefficient; p (ω) represents the electrolyte frequency function; e represents the inter-electrode distance;
the following formula is obtained by maxwell's equations:
in the formula, σ0Represents the direct current conductivity; j represents the density value of the current;
comparative values are indicated.
9. The new energy fast frequency response testing method according to claim 6, wherein the step 3 is to establish a state cycle transfer process of the data acquisition system for different frequency band processing, and calculate the state of the time testing system to obtain an evaluation index function of the data acquisition system, and the expression formula is as follows:
in the formula, TmaxRepresents the total time length; xt represents the running state of the data acquisition system at the moment t; f (xt) represents an evaluation index function of the data acquisition system;
an estimated value representing an evaluation index;
the data acquisition method comprises the following specific steps:
step 31, setting the sampled data to complete the range of the sampling value;
step 32, multi-channel data acquisition, and data analysis capability is improved;
step 33, calculating the acquired parameters and displaying images;
step 34, counting the feedback times of the data, and if the feedback times do not reach the standard, feeding back to step 32;
and step 35, storing the data reaching the standard, and finishing setting, converting and storing the data.
10. The method as claimed in claim 6, wherein in the step 4, the following formula is used:
in the formula, I (ω) represents a response current; u (ω) represents the excitation voltage; c represents a geometric capacitance;
represents the real part of the complex capacitance C (ω);
represents the imaginary part of the complex capacitance C (ω);
and then the response current is converted into a complex dielectric constant, and the phase angle between the output voltage and the micro-current is obtained by a zero-crossing comparison method.
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