CN112698464A - Degumming mechanism analysis and processing method for low-light-level image intensifier of coupling lens - Google Patents
Degumming mechanism analysis and processing method for low-light-level image intensifier of coupling lens Download PDFInfo
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Abstract
The invention discloses a degumming mechanism analysis and processing method for a low-light-level image intensifier of a coupling lens, which comprises the steps of calculating shrinkage after coupling glue is solidified, calculating the supply range of the coupling glue, analyzing the degumming mechanism of the coupling lens and supplementing the coupling glue required by a vacant area. The application proves that when the anode glass of the image intensifier is polished by polishing powder before coupling, if polishing powder or dirt is not thoroughly left at the chamfer of the anode glass by cleaning, the shrinkage effect generated during curing can cause the polishing agent or the dirt to migrate into the edge area of the coupling surface, and the coupling surface of the area is not fully bonded with the coupling adhesive after curing, so that the bonding strength is reduced. In the subsequent circulation, test and use processes of the image intensifier, due to the expansion with heat and contraction with cold effects generated by temperature changes, multiple stress effects are caused to the area, the area is slowly stripped due to continuous excitation and stress accumulation, and finally the degumming phenomenon of the low-light image intensifier occurs.
Description
Technical Field
The invention relates to the technical field of assembly of low-light-level image intensifiers, in particular to a degumming mechanism analysis and treatment method of a low-light-level image intensifier of a coupling lens, which is mainly used for mechanism analysis of degumming phenomenon after the coupling lens of the low-light-level image intensifier is coupled and supplementing coupling glue required by a vacant area.
Background
The low-light level night vision device plays an important role in various aspects of society and economy, and has increasingly wide application requirements in the fields of fixed point monitoring, customs enforcement, ocean operation, medical treatment and the like. The low-light image intensifier is a core device of the low-light night vision device, and performance parameters of the low-light image intensifier directly determine performance indexes of the low-light night vision device.
The glimmer image intensifier is divided into a plurality of types according to the using place and performance index, wherein the glimmer image intensifier of the coupling lens is widely applied to a glimmer pilot, and has good application prospect.
However, the low-light-level image intensifier after the coupling lens is easy to be degummed in the later use process, which seriously affects the service life of the image intensifier.
The analysis of the degumming mechanism is the fundamental point for overcoming and solving the degumming problem, so that a method for analyzing the degumming mechanism of the low-light-level image intensifier of the coupling lens and supplementing the coupling glue required by the vacant area is required.
Disclosure of Invention
The invention aims to provide a method for analyzing a degumming mechanism of a low-light-level image intensifier based on a coupling lens and supplementing coupling glue required by a vacant area by checking and analyzing a fault image intensifier.
In the method, if the edge area of the chamfer angle of the coupling surface is not cleaned completely in the process of coupling the lens, residual polishing agent or dirt exists, and the area is just in the range of the coupling glue of the area needing to be supplemented, the coupling surface and the coupling glue in the area are not fully bonded together after curing and shrinking, so that the bonding strength of the coupling glue is reduced. When the image intensifier of the coupling lens is in the subsequent circulation, test and use processes, multiple stress actions are caused to the area due to the expansion and contraction effect caused by multiple temperature changes, stress is continuously excited and accumulated, the area is slowly stripped, and finally the degumming phenomenon of the coupling lens occurs.
The technical problem to be solved by the invention is as follows: the low-light-level image intensifier of the coupling lens has a degumming phenomenon in the later use process, and the assembly of the whole machine is seriously influenced.
The invention aims to provide a degumming mechanism analysis and treatment method for a low-light-level image intensifier of a coupling lens, which is characterized in that the degumming reason analysis quality problem of the low-light-level image intensifier of the coupling lens is controlled, and the degumming problem of the low-light-level image intensifier after the coupling lens is effectively controlled, and the method specifically comprises the following steps:
a) the radius R of the output surface of the anode glass of the image intensifier and the radius R' of the coupling surface of the lens are measured by a vernier caliper.
b) And measuring the shrinkage rate alpha of the coupling adhesive after curing by using a drainage method.
c) And measuring the thickness h of the coupling surface glue layer by using a dial indicator.
d) Setting the volume of the coupling surface glue layer before curing as V0The radius of the coupling surface circle is equal to the radius of the output surface of the image intensifier anode glass, then V0＝πR2h。
e) Setting the volume of the coupling surface glue layer after curing as V1The radius of the coupling surface is R1If the thickness of the coupling surface adhesive layer is consistent with that before curing, V1＝πR1 2h。
f) Calculating the shrinkage range delta R-R of the radius of the coupling surface glue layer after the coupling glue is cured1。
g) Determining coupling glue curePost-contraction volume V2＝α×V0The resulting coupling area is free of glue.
h) Vacant region V caused by shrinkage effect in curing process of coupling surface glue layer2The coupling glue which overflows the coupling surface to the edge of the lens chamfer in the coupling process and has the same volume is migrated into the coupling layer for compensation.
i) Measuring the edge chamfer value omega of the anode glass of the image intensifier by using a light refraction angle measuring device1Chamfer value omega of edge of coupling surface with lens2。
j) Setting V to supplement the vacant region2The distance between the coupling glue and the coupling surface glue layer is X.
k) Applying the approximation effect, the cross-sectional area S of the coupling glue required for supplementing the vacant area is equal to the edge vacant cross-sectional area A caused by the shrinkage effect.
l) calculating the coupling glue range needed for supplementing the vacant area.
m) coupling glue needed to replenish the vacant areas.
Preferably, the radius R of the output surface of the anode glass of the image intensifier and the radius R' of the lens coupling surface are both 17.78 mm.
Preferably, the coupling glue used in the invention is M62 lens glue, and the shrinkage rate alpha is 4-6%.
Preferably, the thickness h of the coupling surface glue layer is 0.1-0.12 mm.
Preferably, after the coupling adhesive is cured, the shrinkage range delta R of the radius of the adhesive layer of the coupling surface is 0.3592-0.5417 mm.
Preferably, the vacant region V caused by the curing of the coupling adhesive in the present invention23.9726-7.1507 mm3。
Preferably, the edge chamfer value omega of the anode glass of the image intensifier1Chamfer value omega of edge of coupling surface with lens2Are all 45 degrees.
Preferably, V in the present invention is needed to supplement the vacant region2The distance X between the coupling glue and the coupling surface glue layer is 0.1388-0.1881 mm.
Preferably, the cross-sectional area A of the edge vacancy caused by the contraction effect in the present invention is0.03592～0.065mm3。
Preferably, the coupling glue range required by the supplementing vacant area is a trapezoidal area clinging to the glue layer of the coupling surface, the height X is 0.1388-0.1881 mm, the upper bottom h is 0.1-0.12 mm, the lower bottom F is 2X + h and is 0.3776-0.4962 mm, and the waist length is long
0.1963-0.266 mm, and 45 degrees of bottom angle.
Preferably, the invention proposes that if the chamfered edge area of the coupling surface is not cleaned completely in the coupling process, the coupling glue in the uncleaned area enters the coupling surface due to the shrinkage effect generated during curing, so that the bonding strength of the coupling glue on the coupling surface after curing is reduced, and the coupling lens is easy to be degummed from the image intensifier in the subsequent recycling process.
The invention has the beneficial effects that:
(1) the degumming mechanism of the low-light-level image intensifier cemented lens provided by the invention is simple and visual, is easy to understand, and can be applied to other devices of coupling lenses.
(2) By analyzing the degumming mechanism of the coupling lens, the invention can reasonably control the dosage of the coupling glue in the subsequent coupling process.
(3) The invention provides a method for manufacturing a lens, which is characterized in that the coupling glue overflowing from a coupling surface to the edge of a lens chamfer in the coupling process is transferred to a coupling layer due to the shrinkage effect caused by the curing of the coupling glue and finally combined with the coupling layer into a whole.
(4) According to the invention, if the edge area of the coupling surface chamfer is not clean in the coupling process, dirt can be migrated into the coupling surface vacant area due to the shrinkage effect generated in the curing process, the coupling surface in the area is not fully bonded with the coupling adhesive after the curing process, and the bonding strength of the product is reduced due to the repeated expansion and contraction effect in the subsequent circulation process, so that the lens is degummed in the subsequent process.
(5) The degumming mechanism of the cemented lens of the image intensifier provided by the invention improves the qualification rate of the image intensifier and reduces the economic cost on the whole.
Drawings
Fig. 1 is a schematic view illustrating curing shrinkage of coupling glue.
Fig. 2 is a schematic diagram of the range of supplementary M62 glue.
Fig. 3 is a schematic view of a trapezoid.
In the figure: x represents: the height of the trapezoid; h represents: the upper bottom of the trapezoid; f represents: the bottom of the trapezoid; l represents: the waist length of the trapezoid.
Detailed Description
The invention is described in more detail below with reference to the figures and examples, but the scope of the invention is not limited to the description.
A degumming mechanism analysis and processing method for a low-light-level image intensifier of a coupling lens specifically comprises the following steps:
(1) the radius of the anode glass output surface of the image intensifier is measured by a vernier caliper to be 17.78mm, and the radius of the lens coupling surface is measured to be 17.78 mm.
(2) The shrinkage of the coupling gel after curing was measured by draining to be 5%.
(3) The thickness of the coupling surface adhesive layer measured by a dial indicator is 0.1 mm.
(4) Setting the volume of the coupling surface glue layer before curing as V0The radius of the coupling surface circle is equal to the radius of the output surface of the image intensifier anode glass, then V0＝πR2h。
(5) Setting the volume of the coupling surface glue layer after curing as V1The radius of the coupling surface is R1If the thickness of the coupling surface adhesive layer is consistent with that before curing, V1＝πR1 2h＝(1-5％)V1＝0.95πR2h, i.e. R1＝(0.95)1/2R。
(6) After the coupling adhesive is cured, the shrinkage range delta R of the radius of the adhesive layer of the coupling surface is R-R1＝0.4502mm。
(7) V is formed on the coupling surface after the coupling adhesive is cured2＝5％×V0＝4.97mm3The void region, therefore, due to the contraction effect, an equal volume of coupling glue will enter the coupling surface to replenish it.
(8) The chamfer value of the edge of the anode glass of the image intensifier is measured to be 0.5 multiplied by 45 degrees by a light refraction angle measuring device, and the chamfer value of the edge of the lens coupling surface is measured to be 0.4 multiplied by 45 degrees.
(9) 4.97mm of vacant area is needed to be supplemented3The distance between the coupling glue and the coupling surface glue layer is X.
(10) Applying the approximation effect, the cross-sectional area S of the coupling glue required for supplementing the vacant region is equal to the cross-sectional area a of the edge vacancy caused by the shrinkage effect, i.e. S is 0.1X + 2X 1/2X2＝X2+0.1X＝A＝ΔR×h＝0.04502mm2And X is 0.168 mm.
(11) The coupling glue needed for supplementing the vacant area is isosceles trapezoid, the length of the upper bottom is h equal to 0.1mm, and the length of the lower bottom is L equal to 21/2X is 0.2375mm, waist length L is 0.463mm, and base angle is 45 deg. trapezoid.
(12) It can be known through calculation that if the edge area of the coupling surface chamfer is not clean in the coupling process, the contraction effect generated by curing can cause dirt to migrate into the coupling surface vacant area, and the coupling surface and the coupling glue are slightly and sufficiently bonded together after curing, so that the bonding strength of the coupling glue is reduced.
(13) In the subsequent circulation, test and use processes of the product, due to the expansion and contraction effect generated by multiple temperature changes, multiple stress action is caused on the area, stress is continuously excited and accumulated, so that the position is slowly stripped, and finally, the degumming phenomenon of the low-light-level image intensifier of the coupling lens occurs, so that the coupling lens of the low-light-level image intensifier needs to be cleanly cleaned in the chamfered edge area of the coupling surface and then coupled.
Claims (11)
1. A degumming mechanism analysis and processing method for a low-light-level image intensifier of a coupling lens is characterized by comprising the following steps of:
step 1, calculating the shrinkage of the coupling adhesive after curing;
step 2, calculating the supply range of the coupling glue;
step 3, analyzing a lens degumming mechanism;
and 4, supplementing coupling glue required by the vacant area.
2. The analysis and processing method of claim 1, further comprising:
a) measuring the radius R of the output surface of the anode glass of the image intensifier and the radius R' of the coupling surface of the lens by using a vernier caliper;
b) measuring the shrinkage rate alpha of the coupling adhesive after curing by using a drainage method;
c) measuring the thickness h of the coupling surface glue layer by using a dial indicator;
d) calculating the volume of the coupling surface glue layer before curing according to the following formula
V0＝πR2h
In the formula: v0The volume of the coupling surface glue layer before curing is shown, and R is the radius of the coupling surface circle and the radius of the output surface of the image intensifier anode glass;
e) calculating the volume of the coupling surface glue layer after curing according to the following formula
V1＝πR1 2h
In the formula: v1Is the volume of the coupling surface glue layer after curing, R1Is the coupling surface circle radius;
f) calculating the shrinkage range delta R-R of the radius of the coupling surface glue layer after the coupling glue is cured1；
g) Determining the shrinkage volume V of the coupling glue after curing2＝α×V0The resulting coupling face glue layer void area;
h) vacant region V caused by shrinkage effect in curing process of coupling surface glue layer2Coupling glue which overflows from a coupling surface to the edge of the lens chamfer in the coupling process and has the same volume is migrated into the coupling layer for supplementation;
i) measuring the edge chamfer value omega of the anode glass of the image intensifier by using a light refraction angle measuring device1Chamfer value omega of edge of coupling surface with lens2；
j) Setting V to supplement the vacant region2The distance between the coupling glue and the coupling surface glue layer is X;
k) applying an approximation effect, wherein the sectional area S of the coupling glue required by supplementing the vacancy area is equal to the edge vacancy sectional area A caused by the shrinkage effect;
l) calculating the coupling glue range required by supplementing the vacant area;
m) coupling glue needed to replenish the vacant areas.
3. The analysis and processing method of claim 2, wherein:
the radius R of the anode glass output surface of the image intensifier and the radius R' of the lens coupling surface are both 17.78 mm.
4. The analysis and processing method of claim 2, wherein:
the coupling adhesive is M62 lens adhesive, and the shrinkage rate alpha is 4-6%.
5. The analysis and processing method of claim 2, wherein:
the thickness of the coupling surface glue layer is 0.1-0.12 mm.
6. The analysis and processing method of claim 2, wherein:
after the coupling adhesive is cured, the shrinkage range delta R of the radius of the adhesive layer of the coupling surface is 0.3592-0.5417 mm.
7. The method of claim 2, wherein:
the shrinkage volume V of the coupling adhesive after curing23.9726-7.1507 mm3。
8. The analysis and processing method according to claim 3, characterized in that:
the edge chamfer value omega of the anode glass of the image intensifier1Chamfer value omega of edge of coupling surface with lens2Are all 45 degrees.
9. The analysis and processing method of claim 2, wherein:
v for supplementing the vacant region2The distance X between the coupling glue and the coupling surface glue layer is 0.1388-0.1881 mm.
10. The analysis and processing method of claim 2, wherein:
the cross section area A of the edge vacancy caused by the shrinkage effect is 0.03592-0.065 mm3。
11. The analysis and processing method according to any one of claims 1 to 10, wherein said analyzing the lens debonding mechanism further comprises:
if the chamfered edge area of the coupling surface is not cleaned in the coupling process, the coupling glue in the uncleaned area enters the coupling surface by the shrinkage effect generated in the curing process, so that the bonding strength of the coupling glue on the coupling surface after curing is reduced, and the coupling lens is easy to come off from the image intensifier in the subsequent recycling process.
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| US5554702A (en) * | 1994-12-08 | 1996-09-10 | The University Of Connecticut | Coated polycarbonate and method for making the same |
| CN202651116U (en) * | 2012-06-19 | 2013-01-02 | 北方夜视技术股份有限公司 | Micro optical image intensifying CCD |
| CN206924085U (en) * | 2017-02-08 | 2018-01-26 | 青岛大学附属医院 | A kind of Novel convex battle array Ultrasonic-B probe |
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