CN112698099A - Equipment for detecting optical device - Google Patents
Equipment for detecting optical device Download PDFInfo
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- CN112698099A CN112698099A CN202011303370.4A CN202011303370A CN112698099A CN 112698099 A CN112698099 A CN 112698099A CN 202011303370 A CN202011303370 A CN 202011303370A CN 112698099 A CN112698099 A CN 112698099A
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- optical device
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
An apparatus for optical device inspection, the apparatus comprising: a support for positioning an optical device, the support moving in a first direction; the detection mechanism comprises a first detection piece and a second detection piece which are arranged oppositely, the supporting piece is arranged between the first detection piece and the second detection piece, the first detection piece and the second detection piece move oppositely, and the moving directions of the first detection piece and the second detection piece are perpendicular to each other. The Kelvin test system realizes automatic Kelvin test of the optical device, replaces manual operation, and improves detection efficiency and detection stability.
Description
Technical Field
The present application relates to the field of optical device technology, and more particularly, to an apparatus for optical device detection.
Background
Kelvin testing is an electrical impedance measurement technique, and the equipment for kelvin testing generally has four test probes, which are connected to the optical device to be tested.
The temperature measuring gun comprises several optical devices, such as a photoelectric sensor TO 46. In the related art, the kelvin test of TO46 is implemented by a manual test. The testing mode has the advantages of low speed, low efficiency and unstable testing result.
Disclosure of Invention
The present invention therefore provides an apparatus for optical device detection that at least partially addresses the above-mentioned problems.
The present invention provides an apparatus for optical device inspection, comprising: a support for positioning an optical device, the support moving in a first direction;
the detection mechanism comprises a first detection piece and a second detection piece which are arranged oppositely, the supporting piece is arranged between the first detection piece and the second detection piece, the first detection piece and the second detection piece move oppositely, and the moving directions of the first detection piece and the second detection piece are perpendicular to each other.
As an optimal way to achieve this, the support is intermittently moved.
As an optimal way to achieve, several optical devices are arranged at equal intervals on the support.
As an optimal way to achieve this, the optical device is plug-fit with the support. As an optimal mode for realization, the supporting member is provided with a plurality of clamping portions at equal intervals along the length direction of the supporting member, the optical device comprises a plurality of pins arranged side by side, the interval between two pins at the outermost side is a first distance, and the first interval is equal to the interval between any two adjacent clamping portions.
As an optimum way to achieve this, the first detection member comprises first conductive contacts arranged side by side, the first conductive contacts comprising a first inclined section; the second detection piece comprises second conductive contact pieces arranged side by side, each second conductive contact piece comprises a second inclined section, and the intersection point of the first inclined section and the second inclined section is located on the support piece.
As an achievable optimum, the first and second inclined sections are at an acute angle, and the intersection point of the first and second inclined sections is located above the first and second inclined sections.
Most preferably, said first sensing element comprises two rows of said first conductive contacts and said second sensing element comprises two rows of said second conductive contacts, said first angled section adjacent said support being at a first acute angle to said second angled section adjacent said support; the first angled section distal from the support makes a second acute angle with the second angled section distal from the support, the second acute angle being greater than the first acute angle.
And the device also comprises a first pushing member and a second pushing member which move towards each other, and the first detection member and the second detection member are positioned between the first pushing member and the second pushing member.
As an implementable optimum, the first urging member is provided with a first insulating portion, which is abuttable with the first detection member; the second pushing piece is provided with a second insulating part, and the second insulating part and the second detecting piece can abut against each other.
In the embodiment, the supporting piece moves along the first direction, the first detection piece and the second detection piece move oppositely, and the movement directions of the first detection piece and the second detection piece are perpendicular to the first direction, so that the Kelvin test of the optical device is automatically realized, manual operation is replaced, and the detection efficiency and the detection stability are improved; first conductive contact includes first slope section, and the second conductive contact includes the second slope section, and the nodical of first slope section and second slope section can be located support piece, shortens first detection piece and second and detects a relative movement distance, is favorable to improving detection efficiency.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the following detailed description of non-limiting embodiments thereof, made with reference to the accompanying drawings in which:
FIG. 1 is a schematic block diagram of an apparatus for optics detection according to an embodiment of the present application;
FIG. 2 is a schematic structural view of a support according to an embodiment of the present application;
FIG. 3 is a schematic structural view of a support member coupled to an optical device according to an embodiment of the present application;
FIG. 4 is a first schematic diagram of a detection state according to an embodiment of the present application;
FIG. 5 is a diagram illustrating a second detection state according to an embodiment of the present application;
fig. 6 is a third schematic diagram of a detection state according to an embodiment of the present application.
Detailed Description
The present application will be described in further detail with reference to the following drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant application and are not limiting of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. It should be noted that, for the convenience of description, only the portions relevant to the application are shown in the drawings.
In the description of the present application, it is to be understood that the terms "radial," axial, "" upper "inner," "outer," and the like refer to an orientation or positional relationship based on that shown in the drawings, which is for convenience in describing the present application and simplifying the description, and does not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present application. In the description of the present application, "a plurality" means two or more unless otherwise specified.
In the description of the present application, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted", "disposed" and "connected" are to be understood in a broad sense, e.g. either fixedly or detachably or integrally connected: may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
Fig. 1 shows a schematic diagram of a structure for optical device detection.
An apparatus for optical device inspection includes a support 100, a sensor, an inspection mechanism 500, a control module, a sensor holder, a base 600, a linear rail 200, and a slider 300.
The linear rail 200, the sensor holder and the detecting mechanism 500 are disposed on the base 600. The slider 300 is slidably engaged with the linear rail 200, and the slider 300 slides along the linear rail 200. The slider 300 has a plate shape, and two mounting portions are protruded in a horizontal direction in a longitudinal direction of the slider 300 and spaced apart from each other, and the support member 100 can be suspended between the two mounting portions, wherein a gap is formed between the support member 100 and a long side of the slider 300. The support 100 is carried by the slider 300 to slide with respect to the linear rail 200. A plurality of optical devices 700 are disposed on the support 100, and the optical devices 700 are arranged along the length direction of the support 100. It should be noted that the direction in which the support 100 moves along the linear track 200 is the first direction.
The sensor comprises a signal transmitting end and a signal receiving end. The inductor support comprises a receiving support 41 and a transmitting support 42 which are arranged oppositely, a receiving end is arranged on the receiving support 41, and a transmitting end is arranged on the transmitting support 42. The receiving bracket 41 is positioned at one side of the sliding member 300, the transmitting bracket 42 is positioned at the other side of the sliding member 300, and the arrangement direction of the receiving bracket 41 and the transmitting bracket 42 is perpendicular to the first direction. When the photoelectric signal between the transmitting end and the receiving end is blocked by the optical device 700, it indicates that the sensor detects that the optical device 700 is present at the predetermined position, and generates a detection instruction.
The detection mechanism 500 includes a first detection member 51 and a second detection member 52 which are oppositely arranged, the first detection member 51 and the second detection member 52 are respectively arranged at two sides of the support member 100, the first detection member 51 and the second detection member 52 move towards each other in response to a detection command of the sensor, and the first detection member 51 and the second detection member 52 simultaneously abut against the optical device 700 to perform kelvin test. It should be noted that the moving direction of the first detecting member 51 is perpendicular to the first direction, and the moving direction of the second detecting member 52 is perpendicular to the first direction.
When the apparatus for detecting the optical device 700 is operated, the slider 300 slides along the linear rail 200, and then the support 100 slides with respect to the linear rail 200, so that the optical device 700 disposed on the support 100 passes between the signal emitting end and the signal receiving end. When the sensor detects that the optical device 700 exists at the preset position, a detection instruction is generated and sent to the control system. The control system receives the detection command, feeds back the control command to the detection mechanism 500, the detection mechanism 500 receives the control command, and the first detection piece 51 and the second detection piece 52 move towards each other to abut against the optical device 700 for Kelvin test.
In the embodiment, the supporting member 100 moves along the first direction, the first detecting member 51 and the second detecting member 52 move oppositely, and the moving directions of the first detecting member 51 and the second detecting member 52 are perpendicular to the first direction, so that the kelvin test of the optical device 700 is automatically performed, manual operation is replaced, and the detection efficiency and the detection stability are improved.
In some preferred embodiments, the support 100 moves intermittently.
Referring to fig. 1 to 3, the supporting member 100 is in a long shape, a plurality of optical devices 700 are arranged at equal intervals along the length direction of the supporting member 100, and the interval between any two adjacent supporting members 100 is D. The slider 300 is slidably engaged with the linear rail 200, and the slider 300 intermittently linearly moves. The slider 300 moves a distance D for a dead time T and then the slider 300 continues to move the distance D and the above steps are repeated.
During operation, the sensor sequentially detects the first optical device 700, the second optical device 700, the third optical device 700 and the like at a preset position, correspondingly, the first detecting piece 51 and the second detecting piece 52 sequentially perform kelvin tests on the first optical device 700, the second optical device 700, the third optical device 700 and the like, and stably and continuously perform kelvin tests on the plurality of optical devices 700, which is beneficial to improving the automation degree and the detection efficiency.
In some preferred embodiments, the optical device 700 is a plug fit with the support 100.
Referring TO fig. 2 and 3, in the present embodiment, the optical device 700 may be a photo sensor TO46, which includes two rows of pins 71, each row having two pins 71. The pitch of the two leads 71 in each row is a first distance d1, and the pitch of the two rows of leads 71 is a second distance d 2. The supporting member 100 is long, and the thickness of the supporting member 100 is equal to the second distance d2, so that the optical device 700 can be plugged onto the supporting member 100, and the plugging fit of the optical device 700 and the supporting member 100 is realized.
Further, the supporting member 100 is provided with a plurality of clamping portions 11 at equal intervals along the length direction thereof, the optical device includes a plurality of pins 71 arranged side by side, the interval between two outermost pins 71 is a first distance d1, and the interval between any two adjacent clamping portions 11 is equal to the first interval.
In the present embodiment, the supporting member 100 includes a first surface and a second surface opposite to each other. A plurality of first clamping portions 11a are arranged on the first surface at equal intervals along the length direction of the support member 100, and the interval between any two adjacent first clamping portions 11a is equal to the first distance d 1. A plurality of second clamping portions 11b (not shown) are arranged on the second surface at equal intervals along the length direction of the support member 100, and the interval between any two adjacent second clamping portions 11b is equal to the first distance d 1. Wherein each first snap-in portion 11a is aligned with one second snap-in portion 11 b.
The optical device 700 is matched with the supporting piece 100 in an inserting mode, the two pins 71 of the optical device 700 are arranged between the two adjacent first clamping portions 11, the other two pins 71 of the optical device 700 are arranged between the two adjacent second clamping portions 11, the optical device 700 is limited to play along the first direction, the distance between any two adjacent optical devices 700 is guaranteed to be D constantly, and Kelvin testing can be conducted on the equipment stably.
In some preferred embodiments, the first detecting member 51 includes first conductive contacts 511 arranged side by side, the first conductive contacts 511 including a first inclined section 5111; the second sensing member 52 includes second conductive contacts 521 arranged side by side, the second conductive contacts 521 include second inclined sections 5211, and an intersection of the first inclined section 5111 and the second inclined section 5211 can be located on the support member 100.
Referring to fig. 4 to 6, in the present embodiment, the first and second sensing members 51 and 52 are symmetrically disposed about the support member 100. The first detecting member 51 comprises two rows of first conductive contacts 511, each row comprising 5 first conductive contacts 511, the first conductive contacts 511 being elongated. The first conductive contact piece 511 includes a first inclined section 5111 and a first supporting section 5112, the first supporting section 5112 is disposed in a vertical direction, and an extension line of the first inclined section 5111 can intersect on the supporting member 100.
The second detection member 52 comprises two rows of second conductive contacts 521, each row comprising 5 second conductive contacts 521, the second conductive contacts 521 being elongated. The second conductive contact 521 includes a second inclined section 5211 and a second supporting section 5212, the second supporting section 5212 is disposed in a vertical direction, and an extension line of the second inclined section 5211 can intersect on the support 100.
When the kelvin test is performed, each pin 71 of the photosensor TO46 abuts against the two first conductive contact pieces 511 or the two second conductive contact pieces 521, so that the kelvin test is realized. The arrangement mode of the first detection piece 51 and the second detection piece 52 shortens the opposite movement distance of the first detection piece 51 and the second detection piece 52, and is favorable for improving the detection efficiency.
Further, the first inclined section 5111 of the first conductive contact 511 close to the support 100 forms an obtuse angle β with the first support section 5112, and the first inclined section 5111 of the first conductive contact 511 far from the support 100 forms an obtuse angle α with the first support section 5112. Meanwhile, the second inclined section 5211 of the second conductive contact 521 close to the support 100 forms an obtuse angle β with the second support section 5212, and the second inclined section 5211 of the second conductive contact 521 remote from the support 100 forms an obtuse angle α with the second support section 5212. Wherein, the intersection point of the first inclined section 5111 and the second inclined section 5211 is located above the first inclined section 5111 and the second inclined section 5211.
The first inclined section 5111 close to the support 100 makes a first acute angle δ with the second inclined section 5211 close to the support 100; the first inclined section 5111 far from the support 100 and the second inclined section 5211 far from the support 100 form a second acute angle γ, and the second acute angle γ is larger than the first acute angle δ, so that the first inclined section 5111 near to the support 100 and the first inclined section 5111 far from the support 100 simultaneously abut against the same pin 71, and the second inclined section 5211 near to the support 100 and the second inclined section 5211 far from the support 100 simultaneously abut against the same pin 71, which is beneficial for the first detection piece 51 and the second detection piece 52 to perform kelvin test on the optical device 700.
In addition, the first inclined section 5111 forms an obtuse angle α or β with the first support section 5112, and the second inclined section 5211 forms an obtuse angle α or β with the second support section 5212, so that the distance of the first detection piece 51 and the second detection piece 52 moving in opposite directions can be further shortened, and the detection efficiency can be further improved.
In some preferred embodiments, the detecting mechanism 500 further includes a first pushing member 53 and a second pushing member 54 moving toward each other, and the first detecting member 51 and the second detecting member 52 are located between the first pushing member 53 and the second pushing member 54.
Referring to fig. 4 to 6, in the present embodiment, the apparatus for optical device detection further includes a first pushing member 53 and a second pushing member 54 that move toward each other. The first and second detectors 51 and 52 are located between the first and second pushing members 53 and 54, and the first and second pushing members 53 and 54 are symmetrically disposed about the support member 100. The inner side surface of the first pressing member 53 abuts against the first detecting member 51, and the first pressing member 53 moves toward the support member 100 to bend and deform the first conductive contact pieces 511 toward the support member 100. The inner side surface of the second pressing member 54 abuts against the second detecting member 52, and the second pressing member 54 moves toward the support member 100 to bend and deform the second conductive contact 521 toward the support member 100. Further, the first and second detecting members 51 and 52 can perform kelvin testing on the optical device 700.
The first detecting member 51 further includes first transmitting members 512 disposed on the first conductive contacts 511, one first transmitting member 512 is disposed near the first supporting section 5112 of the supporting member 100, and the other first transmitting member 512 is disposed far from the first supporting section 5112 of the supporting member 100, wherein the two first transmitting members 512 are located at different heights. The first transmission element 512 is used for transmitting the acting force of the first pressing element 53, when the first pressing element 53 pushes the first support section 5112 far away from the support 100 to bend, the first transmission element 512 enables the first support section 5112 close to the support 100 to also bend, thereby enabling the first inclined section 5111 close to the support 100 and the first inclined section 5111 far away from the support 100 to abut against the same pin 71.
The second detecting member 52 further includes a second transmission member 522 disposed on the second conductive contact 521, and the second transmission member 522 has the same function as the first transmission member 512, so that the second inclined section 5211 close to the supporting member 100 and the second inclined section 5211 far from the supporting member 100 can abut against the same pin 71.
Further, the first pressing member 53 is provided with a first insulating portion 531, and when the first pressing member 53 contacts the first detecting member 51, the first insulating portion 531 abuts against the first detecting member 51, which is beneficial to avoiding influencing the test result. The second pressing member 54 is provided with a second insulating portion 541, and when the second pressing member 54 contacts the second detecting member 52, the second insulating portion 541 abuts against the second detecting member 52, which is beneficial to avoiding affecting the test result.
The above embodiments are merely illustrative of the technical solutions of the application and not restrictive, and although the present application is described in detail with reference to the embodiments, those of ordinary skill in the art should understand that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (10)
1. An apparatus for optical device inspection, comprising:
a support for positioning an optical device, the support moving in a first direction;
the detection mechanism comprises a first detection piece and a second detection piece which are arranged oppositely, the supporting piece is arranged between the first detection piece and the second detection piece, the first detection piece and the second detection piece move oppositely, and the moving directions of the first detection piece and the second detection piece are perpendicular to each other.
2. The apparatus for optics detection of claim 1, wherein the support is intermittently moved.
3. An apparatus for optics inspection according to claim 2, characterized in that several optics are arranged at equal intervals on the support.
4. The apparatus of claim 3, wherein the optics are in a snap fit with the support.
5. The apparatus of claim 4, wherein the supporting member has a plurality of engaging portions at equal intervals along a length direction thereof, the optical device includes a plurality of pins arranged side by side, an interval between two outermost pins is a first distance, and the first distance is equal to an interval between any two adjacent engaging portions.
6. The apparatus of claim 1, wherein the first detection member comprises first conductive contacts arranged side-by-side, the first conductive contacts comprising a first angled section; the second detection piece comprises second conductive contact pieces arranged side by side, each second conductive contact piece comprises a second inclined section, and the intersection point of the first inclined section and the second inclined section is located on the support piece.
7. The apparatus of claim 6, wherein the first angled section and the second angled section are at an acute angle, and an intersection of the first angled section and the second angled section is located above the first angled section and the second angled section.
8. The apparatus of claim 7, wherein said first detector comprises two rows of said first conductive contacts and said second detector comprises two rows of said second conductive contacts, said first angled section proximate said support being at a first acute angle to said second angled section proximate said support; the first angled section distal from the support makes a second acute angle with the second angled section distal from the support, the second acute angle being greater than the first acute angle.
9. The apparatus of claim 1, further comprising a first pusher and a second pusher that move toward each other, the first detector and the second detector being located between the first pusher and the second pusher.
10. The apparatus for optical device inspection of claim 9 wherein the first pusher is provided with a first insulating portion against which the first inspection piece can abut; the second pushing piece is provided with a second insulating part, and the second insulating part and the second detecting piece can abut against each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011303370.4A CN112698099B (en) | 2020-11-19 | 2020-11-19 | Equipment for detecting optical device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011303370.4A CN112698099B (en) | 2020-11-19 | 2020-11-19 | Equipment for detecting optical device |
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| Publication Number | Publication Date |
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| CN112698099A true CN112698099A (en) | 2021-04-23 |
| CN112698099B CN112698099B (en) | 2023-07-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202011303370.4A Active CN112698099B (en) | 2020-11-19 | 2020-11-19 | Equipment for detecting optical device |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020008875A1 (en) * | 2000-05-17 | 2002-01-24 | Yakov Kogan | Two stage optical alignment device and method of aligning optical components |
| US20040118000A1 (en) * | 2001-02-23 | 2004-06-24 | Roland Roth | Coordinate measuring apparatus for contacting a workpiece, touch probe for a coordinate measuring apparatus and method of operating a coordinate measuring apparatus |
| TWM304664U (en) * | 2006-06-30 | 2007-01-11 | Gtb Ind Co Ltd | Testing jig for electronic component |
| CN203658409U (en) * | 2013-11-25 | 2014-06-18 | 中国电子科技集团公司第四十一研究所 | Solar cell front side main gate line current and voltage test contact device |
| CN108241009A (en) * | 2018-01-12 | 2018-07-03 | 陈彪 | A kind of pad welding quality detection method and its detection device |
-
2020
- 2020-11-19 CN CN202011303370.4A patent/CN112698099B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020008875A1 (en) * | 2000-05-17 | 2002-01-24 | Yakov Kogan | Two stage optical alignment device and method of aligning optical components |
| US20040118000A1 (en) * | 2001-02-23 | 2004-06-24 | Roland Roth | Coordinate measuring apparatus for contacting a workpiece, touch probe for a coordinate measuring apparatus and method of operating a coordinate measuring apparatus |
| TWM304664U (en) * | 2006-06-30 | 2007-01-11 | Gtb Ind Co Ltd | Testing jig for electronic component |
| CN203658409U (en) * | 2013-11-25 | 2014-06-18 | 中国电子科技集团公司第四十一研究所 | Solar cell front side main gate line current and voltage test contact device |
| CN108241009A (en) * | 2018-01-12 | 2018-07-03 | 陈彪 | A kind of pad welding quality detection method and its detection device |
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| CN112698099B (en) | 2023-07-25 |
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