CN112697656A - Ferrographic substrate, ferrographic analysis method and electron microscope energy spectrum analysis method - Google Patents

Ferrographic substrate, ferrographic analysis method and electron microscope energy spectrum analysis method Download PDF

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Publication number
CN112697656A
CN112697656A CN202011463214.4A CN202011463214A CN112697656A CN 112697656 A CN112697656 A CN 112697656A CN 202011463214 A CN202011463214 A CN 202011463214A CN 112697656 A CN112697656 A CN 112697656A
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substrate
ferrographic
conductive film
electron microscope
limiting groove
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贺石中
杨智宏
李秋秋
关浩坚
石新发
冯伟
钟龙风
周娜
赵畅畅
何伟楚
覃楚东
许少凡
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Guangzhou Mechanical Engineering Research Institute Co Ltd
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Guangzhou Mechanical Engineering Research Institute Co Ltd
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Abstract

The invention discloses a ferrographic substrate, a ferrographic analysis method and an electron microscope energy spectrum analysis method, and relates to the technical field of fault diagnosis and wear mechanism research of a mechanical equipment lubricating system. According to the invention, the conductive film is arranged on the surface of the ferrographic substrate, and the electron beam can form a passage through the arrangement of the conductive film, so that the accumulation of charges on the surface of the ferrographic substrate is avoided. The ferrographic substrate provided by the invention can be directly bonded on an electron microscope objective table to realize accurate detection of abrasive material and clear imaging of morphology, and is favorable for accurate fault diagnosis and wear research of mechanical equipment. Meanwhile, the method does not need to carry out gold spraying/carbon spraying treatment on the ferrographic substrate, so that the conductive effect is realized, and the treatment time and the detection cost are greatly shortened. The novel ferrogram substrate provided by the invention can be used for making spectrums by using an analysis ferrogram or a rotating ferrogram.

Description

Ferrographic substrate, ferrographic analysis method and electron microscope energy spectrum analysis method
Technical Field
The invention relates to the technical field of fault diagnosis and wear mechanism research of a lubricating system of mechanical equipment, in particular to an iron spectrum substrate, an iron spectrum analysis method and an electron microscope energy spectrum analysis method.
Background
Statistically, 70% -80% of machine equipment failures are due to frictional wear. Different wear mechanisms produce different abrasive particles, which are mainly characterized by differences in abrasive particle size, color, shape, and number. The friction parts of the equipment are usually lubricated with a lubricating oil/grease into which the resulting abrasive particles also penetrate. Therefore, the wear particles in the lubricating oil/grease of the equipment can be extracted for observation and analysis, so that the fault can be predicted and diagnosed, and further maintenance decisions can be guided, and the technology is called as a wear particle analysis technology and is an important state monitoring and analyzing method. Currently, the abrasive particle analysis technology can be subdivided into three major categories, namely, ferrography, filtered spectrum analysis and electron microscope energy spectrum analysis, wherein the ferrography and the electron microscope energy spectrum analysis are specifically distinguished as follows:
(1) ferrographic analysis technique:
the ferrographic analysis technology is a technology developed in the seventies of the last century for monitoring the wear condition of equipment and diagnosing faults, and is characterized in that wear particles (abrasive particles or abrasive dust for short) in a mechanical lubricant or a working medium are sequentially separated and observed by using a high-strength gradient magnetic field, and the separated particles are evaluated for characteristics such as shape, size, appearance, components, distribution and the like, so that the wear state, fault reasons and parts of the equipment are judged. The increase of the abrasive particle concentration indicates the increase of the wear rate of the system, the occurrence of a large number of large-size abrasive particles indicates the occurrence of severe abnormal wear, and ferrographic analysis is considered to be one of the most effective working condition monitoring and fault diagnosis technologies.
Currently, mainstream ferrography techniques include two analytical techniques:
analyzing an iron spectrometer: the analytical oil sample obtained from the lubricating system is diluted and sampled into a glass test tube, and is conveyed to the upper end of a glass substrate arranged above a magnetic field device through a micro pump, the glass substrate is arranged at a certain inclination angle with the horizontal plane so as to form a gradually enhanced high-strength magnetic field along the oil flow direction, and meanwhile, the oil liquid flows downwards along the inclined substrate and is discharged into a waste oil cup from the lower end of the glass substrate through a flow guide pipe. When magnetizable metal abrasive particles in an oil sample are analyzed to flow through a high-gradient strong magnetic field, the magnetizable metal abrasive particles are orderly deposited on a glass substrate according to the size of the abrasive particles under the combined action of high-gradient magnetic force, liquid viscous resistance and gravity, and form chain-shaped arrangement along the direction vertical to the flowing direction of the oil sample. After the analytical oil sample flows over the substrate, the substrate is washed with tetrachloroethylene solution to remove residual oil, so that the abrasive particles are fixed on the substrate, and the ferrographic film for observation and detection is produced.
Rotating the ferrograph: the core part of the rotary ferrograph is a strong magnet set which forms two annular slit magnetic fields. A square iron sheet is tightly attached to the upper surface of a cylindrical magnet by using an annular rubber sucker. The square iron sheet rotates at a relatively slow speed together with the cylindrical magnet under the driving of the motor. At this time, the oil sample to be analyzed is dropped along the axis onto the center positions of the square music sheet and the cylindrical magnet. Under the action of centrifugal force, the oil sample is "thrown" out of the square iron sheet in a spiral oil flow mode. And when the abrasive particles pass through the two annular magnetic gaps and the magnet boundary, the abrasive particles are adsorbed by a magnetic field to form a plurality of circular rings consisting of the abrasive particles. After all the oil samples are dripped, residual oil and fixed abrasive particles on the iron sheet are cleaned by dripping a fixing agent (tetrachloroethylene) in the same way. After natural volatilization, the iron sheet is prepared, and observation and analysis can be carried out.
When the ferrographic detection method is adopted for individual detection, the ferrographic deposited particles can be visually observed through optical imaging, and the particles are in primary colors and have clear detail textures; the method has the defects that the method completely relies on subjective experience for identifying the particle material, the accuracy is low, and the accuracy of wear analysis is influenced due to the lack of data support.
(2) Electron microscope energy spectrum technology
Electron microscope-energy spectrum analysis refers to an analysis technique for observing and detecting the surface appearance and chemical elements of an object by using a scanning electron microscope and an energy spectrometer. The principle is that the surface of a detected sample is irradiated by a focused and fine electron beam, and various information such as auger electrons, secondary electrons, backscattered electrons, X-rays and the like which can reflect the appearance, structure and components of a sample micro-area can be generated due to the interaction between electrons and the sample. The scanning electron microscope/energy spectrometer can acquire the information of the tissue structure and the appearance of the surface of the sample by collecting the signals.
In the process of testing the electron microscope energy spectrum, electrons continuously bombard a sample. At this time, when a sample (e.g., a semiconductor material or an insulator) having poor conductivity is subjected to electron microscope analysis, problems such as unclear electron microscope imaging and inaccurate energy spectrum element analysis may occur.
Therefore, in the electron microscope energy spectrum detection, the sample to be detected is required to be a conductive sample, and the conductive adhesive is required to be used for connecting the sample and the objective table. For a non-conducting sample, gold spraying/carbon spraying treatment is needed to achieve a conducting effect, but the gold spraying/carbon spraying treatment is time-consuming and high in cost.
In view of this, the invention is particularly proposed.
Disclosure of Invention
The invention aims to provide a ferrographic substrate, a ferrographic analysis method and an electron microscope energy spectrum analysis method to solve the technical problems.
The invention is realized by the following steps:
the inventor finds that when a sample with poor conductivity is used for electron microscope energy spectrum detection, a certain amount of negative charge accumulation is generated on the surface of the sample under the action of electron beams. Because the beam density of the electron beam is very high, the charge accumulation is very quick, and the accumulated charge generates voltage, thereby influencing the subsequent electron beam and interfering the detection of the sample. Namely, a charge effect is generated, so that the problems of unclear imaging of an electron microscope energy spectrum, inaccurate component analysis and the like are caused.
The existing ferrographic substrate consists of common glass sheets and is not conductive, and if the ferrographic substrate prepared from the common glass sheets is directly adhered to an objective table of an electron microscope, a charge effect can be generated, so that the problems of unclear imaging of the electron microscope energy spectrum, inaccurate component analysis and the like are caused.
If the electron microscope energy spectrum is used for independent detection, the method has the advantages that the electron microscope has a good detection effect on the material of the abrasive particles, but the appearance of the abrasive particles is imaged in black and white, partial detailed textures are lost, meanwhile, the method is generally used for detecting solid particles with larger sizes, and no good method for extracting fine particles in oil to an electron microscope objective table exists at present.
In view of this, the inventors provide a ferrographic substrate including a supporting substrate and a conductive film provided on a surface of the supporting substrate. The electron beam can form a passage through the conductive film: electron beam-sample surface-metal abrasive particles (conductive) -conductive layer of bearing substrate-conductive adhesive-metal sample stage-instrument body. This avoids charge build-up on the surface of the metal abrasive particles. The ferrographic substrate provided by the invention can be directly bonded on an electron microscope objective table to realize accurate detection of abrasive material and clear imaging of morphology, and is favorable for accurate fault diagnosis and wear research of mechanical equipment.
If the abrasive particles on the ferrographic substrate are directly adhered to the objective table of the electron microscope through the conductive adhesive, the following defects exist: on one hand, the deposition rule of the abrasive particles is destroyed; on the other hand, it is difficult to efficiently extract the desired target particles due to the small size of the abrasive particles. The inventor provides a brand new idea to avoid the adverse factors, and the conductive film is adopted to fundamentally solve the problems of unclear imaging and inaccurate energy spectrum element analysis.
In a preferred embodiment of the present invention, the supporting substrate is a glass plate, a polyester material or a thermoplastic resin;
preferably, the polyester-based material is PET (polyethylene terephthalate), PBT (polybutylene terephthalate), or PAR (polyarylate); the thermoplastic resin is PES (polyether sulfone resin), PC (polycarbonate), PP (polypropylene), NYLON (NYLON) or polyether ether ketone (PEEK).
In other embodiments, the carrier substrate may be a polyester material or other polymer material, such as polycarbonate, polyether sulfone (PES), and the like, and is not limited to the glass sheet defined in the present invention.
In a preferred embodiment of the present invention, the current limiting groove is disposed on the conductive film.
The flow-limiting groove is used for controlling the flow direction of the analyzed oil sample on the analysis ferrograph. The flow limiting groove is not applied to a rotating ferrograph, so that the flow limiting groove is only used for analyzing the ferrograph.
In a preferred embodiment of the present invention, the current limiting groove is formed by drawing a non-oil-soluble material on the conductive film.
The non-oil-soluble material is arranged to prevent an oil sample to be detected, such as lubricating oil, from being mutually soluble with the flow limiting groove, so that the detection accuracy is influenced. It should be noted that the current limiting groove is only a current limiting steric hindrance drawn on the surface of the conductive film by using an oil-insoluble material and having a certain thickness. One end of the flow-limiting groove is open, and the other end is closed. Specifically, the oil outlet close to the oil delivery conduit and the micro pump is closed, and the oil outlet far away from the oil delivery conduit and the micro pump is opened.
Preferably, the flow-restricting groove is U-shaped. In other embodiments, it may be M-shaped or V-shaped, as long as the current limiting is satisfied.
Preferably, the non-oil soluble material is selected from paraffin or a sealant. For example, the paraffin wax may be a fully refined paraffin wax, a semi-refined paraffin wax, or a crude paraffin wax.
The sealant is selected from silicone sealant, polyurethane sealant or polysulfide sealant.
In a preferred embodiment of the present invention, the conductive film is plated on the surface of the carrier substrate.
The conductive film may be a transparent or opaque conductive film. The conductive film arranged on the bearing substrate can be prepared by the following method: chemical vapor deposition, sputtering, sol-gel, spray pyrolysis, and the like.
The conductive film may be a metal film, an oxide film, another compound film, a polymer film, a composite film, or the like. The conductive film is a transparent conductive film or a semitransparent conductive film.
Preferably, the conductive film is selected from a transparent conductive film such as an ITO conductive film, an FTO/ITO composite conductive film, an FTO conductive film, an AZO conductive film, a PE conductive film, a Polyaniline (PAN) conductive film, a Polythiophene (PTH) conductive film, or a polypyrrole (PPY) conductive film.
The ITO conductive film is an Indium-Tin Oxide (ITO) transparent conductive film, and ITO conductive film glass may be used as it is in practical use.
The FTO/ITO composite conductive film is formed by plating an FTO film on a base material with an ITO conductive film.
The AZO conductive film is an aluminum-doped zinc oxide conductive film.
The FTO conductive film is the fluorine-doped tin oxide conductive film.
A method of ferrography analysis comprising the steps of: and (4) making a spectrum by using an iron spectrometer and an iron spectrum substrate.
In a preferred embodiment of the present invention, the method includes: when the spectrum is made by using an analytical ferrograph, a current limiting groove is arranged on the conductive film, and then the ferrograph substrate with the current limiting groove is used for making the spectrum.
When the ferrographic substrate is used, the ferrographic substrate is arranged on the magnetic field device and forms a certain inclination angle with the horizontal plane, so that a gradually enhanced magnetic field is formed along the flowing direction of oil.
In a preferred embodiment of the present invention, the method includes: when a rotating ferrograph is used for making the spectrum, the ferrograph substrate of an infinite launder is directly used for making the spectrum.
A method for electron microscope energy spectrum analysis comprises the following steps: and (3) placing the ferrographic substrate on an objective table, and observing and detecting by using an electron microscope and an energy spectrometer.
When in use, the ferrographic substrate is adhered on an electron microscope objective table through conductive glue.
In a preferred embodiment of the present invention, the electron microscope is a scanning electron microscope. In other embodiments, the type of electron microscope may also be selected as desired.
The invention has the following beneficial effects:
the invention provides a novel ferrographic substrate, wherein a conductive film is arranged on the surface of the ferrographic substrate, and an electron beam can form a passage through the arrangement of the conductive film, so that the charge accumulation on the surface of metal abrasive particles is avoided. The ferrographic substrate provided by the invention can be directly bonded on an electron microscope objective table to realize accurate detection of abrasive material and clear imaging of morphology, and is favorable for accurate fault diagnosis and wear research of mechanical equipment. Meanwhile, the ferrographic substrate does not need to be subjected to gold spraying/carbon spraying treatment to realize the conductive effect, so that the treatment time and the detection cost are greatly shortened. The novel ferrogram substrate provided by the invention can be used for making spectrums by using an analysis ferrogram or a rotating ferrogram.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a ferrogram-type ferrogram substrate for analyzing ferrograms provided by the present invention;
FIG. 2 is a schematic view of a rotating ferrographic substrate according to the present invention;
FIG. 3 is a spectroscopy process;
FIG. 4 is an appearance diagram of the prepared novel ferrographic substrate;
FIG. 5 is an appearance diagram of the conventional ferrographic substrate and the novel ferrographic substrate after the formation of the ferrographic substrate;
FIG. 6 is an optical micrograph of a conventional ferrographic substrate and a novel ferrographic substrate after being subjected to spectroscopy;
FIG. 7 is a schematic view of the connection between the novel ferrographic substrate and the electron microscope stage;
FIG. 8 is an electron micrograph at 50X-500X magnification after spectroscopy;
FIG. 9 is an electron micrograph at 1000X-10000X magnification after spectroscopy;
FIG. 10 shows the result of energy spectrum detection;
FIG. 11 is a schematic diagram of an analytical process using ferrography;
FIG. 12 shows the analysis process of rotating ferrography technique.
Reference numerals: 1-a conductive film; 2-a glass sheet; and 3-flow limiting groove.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below. The examples, in which specific conditions are not specified, were conducted under conventional conditions or conditions recommended by the manufacturer. The reagents or instruments used are not indicated by the manufacturer, and are all conventional products available commercially.
The features and properties of the present invention are described in further detail below with reference to examples.
Example 1
This example provides a ferrographic substrate, as shown in FIG. 1, for use in analyzing ferrographs. The glass sheet comprises a glass sheet 2, a conductive film 1 is plated on the surface of the glass sheet 2, and a limited flow groove 3 is drawn on the conductive film 1. The shape of the flow-limiting groove 3 is U-shaped in the present embodiment, and the shape of the flow-limiting groove 3 can be selected according to needs in other embodiments.
The material of the flow-limiting groove 3 in this embodiment is paraffin.
Example 2
This embodiment provides a ferrographic substrate, as shown in FIG. 2, which is used for a rotating ferrographic instrument. The device comprises a glass sheet 2, a conductive film 1 plated on the surface of the glass sheet 2, and an infinite flow groove.
Example 3
In this embodiment, commercially available ITO conductive glass is selected, the ITO conductive glass is cut into a conductive glass substrate of 60 × 24 × 0.3mm, then a flow-limiting groove is drawn on the surface of the ITO conductive glass by using a high-temperature-resistant silicone sealant, so as to obtain a ferrographic substrate (hereinafter referred to as a "novel ferrographic substrate"), the spectrum making process is as shown in fig. 3, and the spectrum making is performed according to the process shown in fig. 3. The prepared novel ferrographic substrate is shown in figure 4.
Specification of ITO conductive glass: the sheet resistance is less than or equal to 6 ohms; film thickness: 185 nanometers; the transmittance is more than or equal to 84 percent; film layer color: light blue.
Experimental example 1
The novel ferrographic substrate prepared in example 3 was used for the formation of spectra. The control group was a conventional ferrographic substrate (ordinary glass without conductive layer, flow-limiting groove drawn on the surface of ordinary glass with silicone sealant only, the shape and size of the flow-limiting groove being the same as those in example 3). The appearance of the conventional iron spectrum substrate and the appearance of the novel iron spectrum substrate after the spectrum manufacturing are shown in figure 5. In the control group, a commercially available ferrographic substrate was used, and the flow-limiting groove was a paraffin material and was translucent in fig. 5.
As can be seen from the appearance results, no significant difference was observed in the deposition of the abrasive particles.
The substrate after spectrum making is placed under an optical microscope and observed at a magnification of 200x, wherein the front end of the spectrum piece refers to the leftmost end of the U-shaped current limiting groove shown in fig. 5, the tail end of the spectrum piece refers to the rightmost end of the U-shaped current limiting groove shown in fig. 5, and the middle part of the spectrum piece refers to the middle part of the U-shaped current limiting groove shown in fig. 5.
Referring to fig. 6, the results of microscopic examination at each position of the spectral slice are shown in the optical microscope: compared with the traditional ferrographic substrate, the formation of the vertical deposition chain of the steel particles (white particles shown in the figure) at the front end of the sheet of the novel ferrographic substrate has no difference, and the result shows that the novel ferrographic substrate does not influence the deposition of the steel particles.
As can be seen from fig. 6, non-ferrous metals (such as bright white aluminum alloy, lead-tin alloy bearing alloy, yellow copper alloy) with substantially equal amounts can be found in both the middle and the tail of the sheet, which means that the deposition rule of non-ferrous metal particles on the novel iron sheet substrate is not different from that of the conventional iron sheet substrate, and the deposition of non-ferrous metal particles is not affected by using the novel iron sheet substrate;
in conclusion, the method for preparing the spectrum does not influence the deposition rule of steel particles, copper alloy, aluminum alloy and lead-tin alloy bearings, and shows that the spectrum preparation method does not influence the original iron spectrum analysis function.
Example 2
The novel ferrographic substrate and the conventional ferrographic substrate prepared in the experimental example 1 are subjected to electron microscope test. The method specifically comprises the following steps:
the novel ferrographic substrate and the traditional ferrographic substrate are arranged on an electron microscope objective table, and the surfaces of the novel ferrographic substrate and the traditional ferrographic substrate are respectively connected with the electron microscope objective table by conductive adhesive. The connection is shown with reference to fig. 7.
An experimental instrument: a zeiss EVO18 scanning electron microscope;
instrument experimental parameters: filament Agar A054-L; the accelerating voltage is 20.00 kV; heating current 3.510A; emission current 100 muA; the probe current was 500 pA.
Referring to fig. 8 and 9, when the ferrographic substrate prepared by the conventional method is used for electron microscope observation, horizontal "white stripes" are generated, which indicates that the charge phenomenon is serious, especially when the magnification is more than 200 × the "white stripes" are serious, and 3000 × even the substrate cannot be focused.
The novel ferrographic substrate prepared by the experimental example 1 has better imaging effect in 50X-10000X, that is, the ferrographic substrate adopting the conductive film can solve the problem of unclear imaging. The spectral analysis method is suitable for electron microscope analysis.
Experimental example 3
In the experimental example, 4 times of energy spectrum tests are carried out on the same region of the same particle after the spectrum manufacturing of the novel ferrographic substrate, and the measurement mode is high-precision.
The instrument comprises the following steps: bruker EDS XFlash Detector 630M, accelerating voltage, current and other parameters consistent with experimental example 2 electron microscope parameters.
Referring to fig. 10, it can be seen from fig. 10 that the quantitative results of the energy spectrum analysis still have high repeatability under high magnification, indicating that the spectrum preparation method shown in example 1 is suitable for energy spectrum analysis.
The novel ferrographic substrate prepared by the spectral preparation method provided by the invention does not have adverse effect on the existing ferrographic analysis, and can simultaneously meet the requirements of electron microscope-energy spectrum analysis, the electron microscope has clear imaging and accurate component analysis. In other embodiments, the novel ferrographic substrate may also be used for rotational ferrographic analysis.
Fig. 11 and 12 show a prior known analytical ferrography technique and a rotational ferrography technique, respectively.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. The ferrographic substrate is characterized by comprising a bearing substrate and a conductive film arranged on the surface of the bearing substrate.
2. The ferrographic substrate of claim 1, wherein the carrier substrate is a glass sheet, a polyester-based material, or a thermoplastic resin;
preferably, the polyester-based material is PET, PBT or PAR; the thermoplastic resin is PES, PC, PP, nylon or polyether ether ketone.
3. The ferrographic substrate of claim 1, wherein the conductive film is provided with a current limiting groove.
4. The ferrographic substrate of claim 3, wherein the current-limiting groove is a current-limiting groove formed by drawing an oil-insoluble material on a conductive film;
preferably, the flow-limiting groove is U-shaped;
preferably, the non-oil soluble material is selected from paraffin or a sealant;
preferably, the sealant is selected from a silicone sealant, a polyurethane sealant or a polysulfide sealant.
5. The ferrographic substrate of claim 1, wherein the conductive film is plated on a surface of the carrier substrate; preferably, the conductive film is a transparent conductive film or a translucent conductive film;
preferably, the conductive film is selected from an ITO conductive film, an FTO/ITO composite conductive film, an FTO conductive film, an AZO conductive film, a PE conductive film, a polyaniline conductive film, a polythiophene conductive film, or a polypyrrole conductive film.
6. A ferrography method is characterized by comprising the following steps: performing spectroscopy using a ferrograph and the ferrograph substrate of claim 1.
7. The ferrography analysis method of claim 6, further comprising: when the spectrum is made by using an analytical ferrograph, a current limiting groove is arranged on the conductive film, and then the ferrograph substrate with the current limiting groove is used for making the spectrum.
8. The ferrography analysis method of claim 6, further comprising: when a rotating ferrograph is used for making the spectrum, the ferrograph substrate of an infinite launder is directly used for making the spectrum.
9. A method for analyzing electron microscope energy spectrum is characterized by comprising the following steps: the ferrographic substrate of any one of claims 1-5 placed on a stage for visual inspection using an electron microscope and an energy spectrometer.
10. The method for electron microscopy energy spectrometry according to claim 9, characterized in that the electron microscope is a scanning electron microscope.
CN202011463214.4A 2020-12-09 2020-12-09 Ferrographic substrate, ferrographic analysis method and electron microscope energy spectrum analysis method Pending CN112697656A (en)

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