CN1126840A - Testing method and equipment of contact drop - Google Patents
Testing method and equipment of contact drop Download PDFInfo
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- CN1126840A CN1126840A CN 95100133 CN95100133A CN1126840A CN 1126840 A CN1126840 A CN 1126840A CN 95100133 CN95100133 CN 95100133 CN 95100133 A CN95100133 A CN 95100133A CN 1126840 A CN1126840 A CN 1126840A
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- circuit
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- pressure drop
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Abstract
The present invention features that main test circuit with choking transductor and silicon rectifier provides the tested contacts with great DC current of required rising curve, and through the use of V/F conversion techn, the digital control circuit with its sampling freq equal to power freq measures the current and contact voltage drop dynamically. When current reaches preset value, the voltage drop value is locked automatically for record. Without large-power resistor in the main test circuit, the current rises rapidly and the current ripple has less effect on test result. Therefore, the present invention has the merits of high accuracy, high speed and low power consumption.
Description
The present invention relates to the D.C. high-current fall-of potential test method and the device of a kind of electric switch contact.
Large-current electric device switch all has clear and definite pressure fall-off test standard to the contact in the switch module, busbar and Electricity Federation contact etc., requires measuring process short as far as possible, produces error to avoid the test product heating.Existing method of testing mainly contains two kinds, and the one, to regulate the big electric current silicon of output voltage with pressure regulator and put in order device, its output string one high-power resistance is received on the measured piece.Pressure regulator is adjusted to certain position, makes output current on a certain required value, measure the pressure drop at two ends, measured point then; The 2nd, with the big controlled current silicon rectifier that has constant-current stabilizer, its output string one high-power resistance is connected on the measured piece.Regulate electric current to required value, measure then.Preceding method is owing to the fluctuation of power supply, and its output current can not be stabilized on the required value, and therefore very big measuring error is arranged.Back method is because the controllable silicon precision of steady current generally can only reach 5%, even improve precision of steady current to 2%, its fluctuation also can reach positive and negative 60A when output 3000A, maximum error just may have about 120A, such error adds the inherent error of measuring system, and total error is just bigger.And preceding owned by France in voltage regulating device, back rule controllable silicon is not because of being operated under the situation that is bordering on zero conduction angle, and all necessary series connection one high-power resistance of output has increased unnecessary energy loss.Above in addition two kinds of methods are long and uncertain lasting to making a copy of the pressure drop reading at required value from current stabilization, make test result bring the extra error that produces because of the measured piece heating, and the repetition consistance is also poor.
The objective of the invention is pressure drop for the contact and provide that a kind of precision height, speed are fast, the method for testing and the device of less energy consumption.
This method of testing is:
1, be concatenated into the contact in the test main circuit that adopts the pressure regulation of chokes formula saturable reactor, five stem stem formula double reverse-stars type rectification circuit rectifications, the filtering of output loop tandem electric inductance with short-circuit condition;
2, two covers are adopted the V/F converter techniques, sample frequency equals supply frequency, and respectively the digital control circuit of measuring is immediately fallen in measuring current and touch point and be attached in the test main circuit;
3, the comparator circuit that meets that will adopt dial to carry out current settings is arranged in the current digital control circuit, when the electric current instantaneous value reaches current setting value, provide the pressure drop instantaneous value that locking signal locking number of pressure drops word control circuit shows by meeting comparator circuit, provide shutoff signal simultaneously and cut off the test main circuit.
The device of realizing above-mentioned method of testing comprises five cover circuit:
1, the test main circuit of forming by input switch, chokes formula saturable reactor, five stem stem rectifier transformers, double reverse-stars type rectification circuit, filter inductance;
2, the chokes formula saturable reactor control circuit of forming by small thyristor half-bridge rectification circuit and thyristor gating circuit;
3, latch driving circuit, display circuit and sequential control circuit and meet the current digital control circuit that comparator circuit is formed by signal amplification circuit, V/F translation circuit, counting circuit, decoding, wherein meet and be provided with the dial that carries out current settings in the comparator circuit and provide the pressure drop locking signal and two signal generators of failure of current signal;
4, latch the number of pressure drops word control circuit that driving circuit, display circuit and sequential control circuit and range automatic conversioning controling circuit are formed by signal programmable amplifying circuit, V/F translation circuit, counting circuit, decoding, wherein decoding is latched driving circuit and is provided with pressure drop locking signal receiver;
5, the input switch control circuit of being made up of A.C. contactor, auxiliary reclay and the time relay wherein is provided with the failure of current signal receiver in the auxiliary reclay circuit.
The advantage of foregoing invention thought is:
1, adjust trigger circuit in the chokes formula saturable reactor control circuit, the output current curve on request of test main circuit is risen, beginning to rise to the time that rises to setting value from electric current can finish in 10 seconds at 5 seconds, and test speed is fast.
When 2, current value reaches setting value, voltage drop value genlocing, this not only makes the mensuration of voltage drop value accurate, and is convenient to make a copy of.
3, measurement result is the mean value in the sampling period, and sample frequency equals supply frequency, so the ripple of output current is very little to the measurement result influence, adds the sample frequency height, the sampling interval difference between current is little, with regard to the raising that makes measuring accuracy basic assurance has been arranged.
4, do not establish high-power resistance because of testing in the main circuit, and test speed is fast, so less energy consumption in the measuring process.
Drawings and Examples below in conjunction with device of the present invention are further illustrated detailed content of the present invention.
Fig. 1: the frame principle figure of device of the present invention;
Fig. 2: the circuit theory diagrams of the test main circuit of device and chokes formula saturable reactor control circuit;
Fig. 3: the circuit theory diagrams of the input switch control circuit of device;
Fig. 4: the circuit theory diagrams of the current digital control circuit of device;
Fig. 5: the circuit theory diagrams of the number of pressure drops word control circuit of device.
The method of testing of switch contact pressure drop described in the invention, coming down to a kind of measuring current rises by setting curve, measuring current value and contact voltage drop value synchronization dynamic measurement show, and when rising to setting value, electric current locks the method for testing of contact voltage drop value immediately, the key of implementing this method has three, at first be to have a cover to adopt the pressure regulation of chokes formula saturable reactor, five stem stem formula double reverse-stars type rectification circuit rectifications, the test main circuit of output loop tandem electric inductance filtering, and the contact is serially connected in the output loop with short-circuit condition, for chokes formula saturable reactor, must dispose the small thyristor half-bridge rectification circuit and the thyristor gating circuit of control chokes formula saturable reactor work; It two is that the current digital control circuit and the number of pressure drops word control circuit that will adopt V/F converter technique, sample frequency to equal supply frequency is arranged in the test main circuit, and implements the synchronization dynamic measurement of measuring current and contact voltage drop is shown; It three is to be arranged in the current digital control circuit meeting comparator circuit, this meets comparator circuit and adopts dial to set current value, and when electric current rises to setting value, provide pressure drop locking signal and failure of current signal, the contact voltage drop value that locking number of pressure drops word control circuit shows, cut off the test main circuit simultaneously, thereby can make a copy of voltage drop value calmly.
What accompanying drawing was described is the isolated plant of implementing above-mentioned method of testing, this device is the combination of five cover circuit such as test main circuit, chokes formula saturable reactor control circuit, current digital control circuit, number of pressure drops word control circuit and input switch control circuit, wherein tests main circuit by input switch JC
1-8, chokes formula saturable reactor ZDK, five stem stem rectifier transformer ZB, double reverse-stars type rectification circuit ZP
4-9, filter inductance DK forms; Chokes formula saturable reactor control circuit is by small thyristor half-bridge rectification circuit KP
1-2, ZP
1-2With controllable silicon KP
1-2Trigger circuit are formed, the shared cover power transformer KB of this two covers circuit
1, trigger circuit also have full-wave rectifying circuit ZP
10-13, these trigger circuit can be selected unijunction transistor trigger circuit as shown in Figure 3 for use; The current digital control circuit is latched driving circuit, display circuit and sequential control circuit and met comparator circuit by signal amplification circuit, V/F translation circuit, counting circuit, decoding to be formed, wherein meet and be provided with the dial BP that carries out current settings in the comparator circuit and provide the pressure drop locking signal and two signal generator T1 of failure of current signal and J, in the present embodiment, select triode to make pressure drop lock signal generator T1, selective relay is made failure of current signal generator J; The number of pressure drops word control circuit latchs driving circuit, display circuit and sequential control circuit by signal programmable amplifying circuit, V/F translation circuit, counting circuit, decoding and the range automatic conversioning controling circuit is formed, wherein decoding is latched driving circuit and is provided with pressure drop locking signal receiver T3, and present embodiment selects the infrared emission receiving tube to make pressure drop locking signal receiver T3; The input switch control circuit is made up of A.C. contactor JC, intermediate relay ZJ and time relay sj, wherein be provided with failure of current signal receiver J1 in the auxiliary reclay circuit, present embodiment directly adopts the switch J1 of relay J to make failure of current signal receiver J
1Above-mentioned two cover digital control circuit structural similarities, in the present embodiment, all adopt chip LM331 and broadband operational amplifier LF411 to form the V/F translation circuit, form counting circuit for two 4518, form decoding for four 4513 and latch driving circuit, four display L form display circuit, and chip 4060 and 4538 is formed sequential control circuit; In addition, adopt two operational amplifier OP07 to form signal amplification circuit in the current digital control circuit, adopt shift register 4194 and double D trigger 4013 and dial BP to form and meet comparator circuit; Adopt in the number of pressure drops word control circuit to simulate switch 4066 and operational amplifier OP07 composition signal programmable amplifying circuit, adopt shift register 4194, double D trigger 4013 and diode ZP
18-22And Sheffer stroke gate IC
18-4Form the range automatic conversioning controling circuit; The power supply of this two covers digital control circuit all adopts the three-terminal voltage-stabilizing power supply.In order to improve the interference free performance that meets comparator circuit, make the voltage drop value of locking true and reliable, present embodiment is after the voltage drop value locking, in next count cycle, continue immediately electric current is met comparison, if the electric current instantaneous value does not reach setting value, the voltage drop value of locking will be disengaged, illustrate that this voltage drop value is untrue, if the electric current instantaneous value meets or exceeds setting value, voltage drop value will continue locked, illustrate that this voltage drop value is true, simultaneously, send shutoff signal by failure of current signal generator J and cut off the test main circuit, at this moment, in order to prevent that locking signal from disappearing because of the disappearance of electric current, present embodiment is provided with in this circuit by a Sheffer stroke gate IC
17-1With two diode ZP
14-15The latching circuit of the shift register of forming 4194, its effect is the state self-locking that makes shift register 4194, like this, locking signal just can not disappear yet; And will unlock, only press return-to-zero button RJ.Equally, concerning the number of pressure drops word control circuit, after preventing to receive the pressure drop locking signal, the situation that scaling position is got back to the original position occurs under the situation that the test main circuit has cut off, present embodiment is provided with by a Sheffer stroke gate IC on shift register 4194 circuit of range automatic switching circuit
18-1With two diode ZP
16-17The latching circuit of forming like this, can make the state self-locking of shift register 4194, and radix point just can not be shifted yet.To pay close attention to blocked voltage drop value in order reminding, a cover can be set by Sheffer stroke gate IC
18-2, the flashing circuit formed of triode T2 and scintillater P2.The input switch control circuit has adopted the technology of the little failure of current test main circuit of delaying time.
Claims (6)
1, a kind of method of testing of switch contact pressure drop is characterized in that: be made up of following steps:
One, the contact is concatenated into the pressure regulation of employing chokes formula saturable reactor with short-circuit condition, five stem stem formula double reverse-stars type rectification circuit rectifications are in the test main circuit of output loop tandem electric inductance filtering;
Two, two covers are adopted the V/F converter techniques, sample frequency equals supply frequency, and the number of respectively measuring current and contact voltage drop being measured immediately decide control circuit and is attached to and tests in the main circuit;
Three, will adopt dial to carry out meeting in the digital control circuit that comparator circuit is arranged on electric current of current settings, when the electric current instantaneous value reaches current setting value, provide the pressure drop instantaneous value that locking signal locking number of pressure drops word control circuit shows by meeting comparator circuit, provide shutoff signal test main circuit simultaneously.
2, a kind of device of realizing the described method of testing of claim 1 is characterized in that: comprise five cover circuit:
One, by input switch (JC
1-3), chokes formula saturable reactor (ZDK), five stem stem rectifier transformers (ZB), double reverse-stars type rectification circuit (ZP
4-9), the test main circuit formed of filter inductance (DK);
Two, by small thyristor half-bridge rectification circuit (KP
1-2, ZP
1-2) and the chokes formula saturable reactor control circuit formed of thyristor gating circuit;
Three, latch driving circuit, display circuit and sequential control circuit and meet the current digital control circuit that comparator circuit is formed by signal amplification circuit, V/F translation circuit, counting circuit, decoding, wherein meet and be provided with the dial (BP) that carries out current settings in the comparator circuit and provide the pressure drop locking signal and failure of current signal and two signal generator (T
1And J);
Four, latch the number of pressure drops word control circuit that driving circuit, display circuit and sequential control circuit and range automatic conversioning controling circuit are formed by signal programmable amplifying circuit, V/F translation circuit, counting circuit, decoding, wherein decoding is latched driving circuit and is provided with pressure drop locking signal receiver (T
3);
Five, the input switch control circuit of forming by A.C. contactor (JC), auxiliary reclay (ZJ) and the time relay (SJ).Wherein be provided with failure of current signal receiver (J in the auxiliary reclay circuit
1).
3, device according to claim 2 is characterized in that: described pressure drop lock signal generator and failure of current signal generator are respectively triode (T
1) and relay (J) described pressure drop locking signal receiver and failure of current signal receiver be respectively infrared emission receiving tube (T
3) and the switch (J of relay (J)
1).
4. according to claim 2 or 3 described devices, it is characterized in that: meet comparator circuit and form, and shift register 4194 is provided with by a Sheffer stroke gate (IC by shift register 4194, double D trigger 4013 and dial (BP)
17-1) and two diode (ZP
14-15) latching circuit formed.
5, according to claim 2 or 3 described devices, it is characterized in that: the range automatic conversioning controling circuit is by shift register 4194, double D trigger 4013, diode (ZP
18-22) and Sheffer stroke gate (IC
18-4) form and shift register 4194 is provided with by a Sheffer stroke gate (IC
18-1) and two diode (ZP
16-17) latching circuit formed.
6, device according to claim 4 is characterized in that: the range automatic conversioning controling circuit is by shift register 4194, double D trigger 4013, diode (ZP
18-22) and Sheffer stroke gate (IC
18-4) form, and shift register 4194 is provided with by a Sheffer stroke gate (IC
18-1) and two diode (ZP
16-17) latching circuit formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 95100133 CN1126840A (en) | 1995-01-10 | 1995-01-10 | Testing method and equipment of contact drop |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 95100133 CN1126840A (en) | 1995-01-10 | 1995-01-10 | Testing method and equipment of contact drop |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1126840A true CN1126840A (en) | 1996-07-17 |
Family
ID=5073269
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 95100133 Pending CN1126840A (en) | 1995-01-10 | 1995-01-10 | Testing method and equipment of contact drop |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1126840A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102193017A (en) * | 2010-03-18 | 2011-09-21 | 中国科学院电子学研究所 | Indirect test method for voltage drops on relay contacts |
| CN102709942A (en) * | 2012-05-23 | 2012-10-03 | 中国电力科学研究院 | Wind power station LVRT (low voltage ride through) device and control method thereof |
| CN106093531A (en) * | 2016-07-25 | 2016-11-09 | 华为技术有限公司 | A kind of chip dynamic voltage down detection circuit and detection method |
| CN106405397A (en) * | 2016-08-30 | 2017-02-15 | 贵州贵航汽车零部件股份有限公司华阳电器公司 | Method for judging failure life of rotary ignition switch through voltage drop |
| CN107003354A (en) * | 2014-09-30 | 2017-08-01 | 赛峰电子与防务公司 | Suitable for identification failure presence, faulty relay, the method for fault type and its related electric power system |
| CN107912059A (en) * | 2015-06-15 | 2018-04-13 | 欧米克朗电子有限公司 | The switching device operating method of switching device, test device and transformer measuring device |
| CN112154340A (en) * | 2018-05-30 | 2020-12-29 | 三菱电机株式会社 | Characteristic test system for protective relay device |
-
1995
- 1995-01-10 CN CN 95100133 patent/CN1126840A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102193017A (en) * | 2010-03-18 | 2011-09-21 | 中国科学院电子学研究所 | Indirect test method for voltage drops on relay contacts |
| CN102709942A (en) * | 2012-05-23 | 2012-10-03 | 中国电力科学研究院 | Wind power station LVRT (low voltage ride through) device and control method thereof |
| CN107003354A (en) * | 2014-09-30 | 2017-08-01 | 赛峰电子与防务公司 | Suitable for identification failure presence, faulty relay, the method for fault type and its related electric power system |
| CN107003354B (en) * | 2014-09-30 | 2020-10-30 | 赛峰电子与防务公司 | Method for identifying existence of fault, relay device with fault, fault type and related power supply system |
| CN107912059A (en) * | 2015-06-15 | 2018-04-13 | 欧米克朗电子有限公司 | The switching device operating method of switching device, test device and transformer measuring device |
| US10746810B2 (en) | 2015-06-15 | 2020-08-18 | Omicron Electronics Gmbh | Switch apparatus, test apparatus and method for operating a switch apparatus for a measuring device for a transformer |
| CN106093531A (en) * | 2016-07-25 | 2016-11-09 | 华为技术有限公司 | A kind of chip dynamic voltage down detection circuit and detection method |
| CN106093531B (en) * | 2016-07-25 | 2019-02-26 | 华为技术有限公司 | A kind of chip dynamic voltage down detection circuit and detection method |
| CN106405397A (en) * | 2016-08-30 | 2017-02-15 | 贵州贵航汽车零部件股份有限公司华阳电器公司 | Method for judging failure life of rotary ignition switch through voltage drop |
| CN106405397B (en) * | 2016-08-30 | 2019-03-26 | 贵州贵航汽车零部件股份有限公司华阳电器公司 | The method in rotary defective ignition switch service life is determined with voltage drop |
| CN112154340A (en) * | 2018-05-30 | 2020-12-29 | 三菱电机株式会社 | Characteristic test system for protective relay device |
| CN112154340B (en) * | 2018-05-30 | 2024-03-19 | 三菱电机株式会社 | Characteristic test system of protective relay device |
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| WD01 | Invention patent application deemed withdrawn after publication |