CN112668270B - Josephson junction array quantum step determination method, apparatus, device and storage medium - Google Patents
Josephson junction array quantum step determination method, apparatus, device and storage medium Download PDFInfo
- Publication number
- CN112668270B CN112668270B CN202011618425.0A CN202011618425A CN112668270B CN 112668270 B CN112668270 B CN 112668270B CN 202011618425 A CN202011618425 A CN 202011618425A CN 112668270 B CN112668270 B CN 112668270B
- Authority
- CN
- China
- Prior art keywords
- target
- josephson junction
- voltage
- junction array
- determining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Abstract
The application relates to a method, a device, equipment and a storage medium for determining a quantum step of a Josephson junction array. The method comprises the following steps: acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array; determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the quantum steps of the Josephson junction array; scanning within a preset range taking the target step as the center to obtain a target voltage value and a corresponding target current value; and determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value. Therefore, the step position and the step width of the quantum step of the Josephson junction array can be determined without determining whether the Josephson junction in the superconducting short circuit state exists in the Josephson junction array or determining the exact number of the Josephson junctions.
Description
Technical Field
The present application relates to the field of electronic information technology, and in particular, to a method, an apparatus, a device, and a storage medium for determining a quantum step of a josephson junction array.
Background
The josephson voltage reference is a metric that reproduces the magnitude of the voltage based on the josephson effect. In general, the step positions and step widths of the josephson junction array quantum voltage platforms are related to the corresponding microwave irradiation frequencies and the corresponding junction numbers of the josephson junction array, so that different microwave irradiation frequencies and different junction numbers generally correspond to different step positions and step widths. The traditional method for determining the step position and the step width of the Josephson junction array is to calculate the step position and the step width according to the determined microwave irradiation frequency and the Josephson junction number.
However, when a josephson junction in a superconducting short-circuit state exists in the josephson junction array, the josephson junction can be regarded as not existing, so that the number of useful josephson junctions cannot be determined, and the step position and the step width of a quantum step of the josephson junction array cannot be determined by adopting a traditional method.
Disclosure of Invention
In view of the foregoing, it is necessary to provide a josephson junction quantum step determination method, apparatus, device and storage medium capable of determining a step position and a step width of a josephson junction quantum step.
A method of josephson junction array quantum step determination, the method comprising:
acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array;
determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the quantum steps of the Josephson junction array;
scanning within a preset range taking the target step as a center to obtain a target voltage value and a corresponding target current value;
and determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value.
In one embodiment, the acquiring a sequence of voltage values of the josephson junction array at a target frequency comprises:
irradiating the Josephson junction array with microwaves of the target frequency;
applying a voltage to the Josephson junction array, and measuring and obtaining the voltage value sequence.
In one embodiment, the determining the three voltage values with the highest frequency of occurrence in the voltage value sequence as the three target steps corresponding to the josephson junction array quantum steps comprises:
acquiring the frequency of occurrence of different voltage values in the voltage value sequence;
selecting three appearance frequency numbers with the highest numerical values from the appearance frequency numbers to obtain three target appearance frequency numbers;
and determining a voltage value corresponding to each target occurrence frequency as one target step.
In one embodiment, a current-voltage correspondence exists between the voltage values and the current values in the voltage value sequence;
the scanning within a preset range with the target step as the center to obtain a target voltage value and a corresponding target current value comprises the following steps:
scanning a voltage value within a preset range with the target step as a center, and determining the scanned voltage value as the target voltage value;
and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value.
In one embodiment, the scanning the voltage value within a preset range centered on the target step and determining the scanned voltage value as the target voltage value includes:
and scanning voltage values in a preset range taking the target step as the center, and determining the scanned voltage values as the target voltage values if the number of the scanned voltage values is greater than a preset threshold value.
In one embodiment, the scanning the voltage values within a preset range with the target step as the center, and if the number of the scanned voltage values is greater than a preset threshold, determining the scanned voltage values as the target voltage values includes:
scanning a voltage value within a preset range with the target step as a center according to a preset window;
and if the number of the scanned voltage values in the preset window is larger than a preset threshold value, determining the scanned voltage values as the target voltage values.
In one embodiment, the determining the step position of the josephson junction array quantum step according to the target voltage value and the determining the step width of the josephson junction array quantum step according to the target current value includes:
obtaining a current difference value between a maximum target current value and a minimum target current value in the target current values, and determining the current difference value as the step width of the Josephson junction array quantum step;
and acquiring the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step.
A josephson junction array quantum step determination apparatus, the apparatus comprising:
the data acquisition module is used for acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the josephson junction array;
the target step determining module is used for determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the Josephson junction array quantum steps;
the data scanning module is used for scanning within a preset range taking the target step as the center to obtain a target voltage value and a corresponding target current value;
and the quantum step determining module is used for determining the step position of the Josephson junction array quantum step according to the target voltage value and determining the step width of the Josephson junction array quantum step according to the target current value.
A computer device comprising a memory storing a computer program and a processor implementing the steps of the method of any preceding claim when the processor executes the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method of any of the above.
According to the method, the device, the equipment and the storage medium for determining the quantum step of the Josephson junction array, the current value and the voltage value of the Josephson junction array under the target frequency are obtained; and the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array. Determining three voltage values with the highest occurrence frequency as three target steps corresponding to the quantum steps of the Josephson junction array; scanning within a preset range taking the target step as the center to obtain a target voltage value and a target current value; and determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value. Therefore, the step position and the step width of the quantum step of the Josephson junction array can be determined without determining whether the Josephson junction in the superconducting short circuit state exists in the Josephson junction array or determining the exact number of the Josephson junctions.
Drawings
FIG. 1 is a schematic flow chart of a method for determining quantum step of a Josephson junction array in one embodiment;
FIG. 2 is a schematic flow chart diagram illustrating one possible implementation of step S200 in one embodiment;
FIG. 3 is a graph of voltage magnitude appearance at a target frequency for a Josephson junction array in one embodiment;
FIG. 4 is a schematic flow chart diagram illustrating one possible implementation of step S300 in one embodiment;
FIG. 5 is a flowchart illustrating an example implementation of step S310;
FIG. 6 is a schematic flow chart diagram illustrating one possible implementation of step S400 in one embodiment;
FIG. 7 is a block diagram of a Josephson junction array quantum step determination apparatus according to an embodiment;
FIG. 8 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In one embodiment, as shown in fig. 1, a method for determining a josephson junction array quantum step is provided, and this embodiment is illustrated by applying the method to a terminal, it is to be understood that the method may also be applied to a server, and may also be applied to a system including the terminal and the server, and is implemented by interaction between the terminal and the server. In this embodiment, the method includes the steps of:
step S100, acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array.
And step S200, determining the three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the quantum steps of the Josephson junction array.
And step S300, scanning within a preset range taking the target step as the center to obtain a target voltage value and a corresponding target current value.
And S400, determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value.
The Josephson junction array is an array formed by a plurality of Josephson junctions (Josephson junctions), wherein the Josephson junctions, also called as superconducting tunnel junctions, are generally a structure formed by two superconductor clamps with a thin barrier layer (thickness is less than or equal to coherence length of a Cooper electron pair).
Specifically, the Josephson junction array is irradiated by microwaves of a target frequency, and a plurality of voltage values of the Josephson junction array at the target frequency are measured to obtain a voltage value sequence. And counting the occurrence frequency of different voltage values in the voltage value sequence, and determining the three voltage values with the highest occurrence frequency as three target steps corresponding to the Josephson junction array quantum steps. Next, the voltage values are scanned within a preset range centered on the target step, one or more of the scanned voltage values are determined as target voltage values, and the current value corresponding to the target voltage value is determined as a target current value. And finally, determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value.
The method for determining the quantum step of the Josephson junction array comprises the steps of obtaining the current value and the voltage value of the Josephson junction array under the target frequency; and the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array. Determining three voltage values with the highest occurrence frequency as three target steps corresponding to the quantum steps of the Josephson junction array; scanning within a preset range taking the target step as the center to obtain a target voltage value and a target current value; and determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value. Therefore, the step position and the step width of the quantum step of the Josephson junction array can be determined without determining whether the Josephson junction in the superconducting short circuit state exists in the Josephson junction array or determining the exact number of the Josephson junctions.
In one embodiment, the method of step S100 includes:
irradiating the Josephson junction array by adopting microwaves with target frequency; voltages are applied to the josephson junction array and a sequence of voltage values is measured and obtained.
Specifically, the Josephson junction array is irradiated by microwaves with target frequency, voltage is applied to the Josephson junction array, and a plurality of voltage values on the Josephson junction array are measured to obtain a voltage value sequence formed by the plurality of voltage values.
In the above embodiment, the josephson junction array is irradiated by microwaves of a target frequency, a voltage is applied to the josephson junction array, and a voltage value sequence is measured and obtained, so that a data basis can be provided for the subsequent determination of the quantum step of the josephson junction array, the determination of the quantum step of the josephson junction array by using the number of the josephson junctions is avoided, and the accuracy of the step position and the step width of the quantum step of the josephson junction array is improved.
In one embodiment, as shown in fig. 2, a schematic flow chart of an implementation manner of step S200 includes:
step S210, obtaining the frequency of occurrence of different voltage values in the voltage value sequence.
In step S220, three appearance frequencies with the highest values are selected from the appearance frequencies to obtain three target appearance frequencies.
In step S230, the voltage value corresponding to each target occurrence frequency is determined as a target step.
The frequency of occurrence refers to the number of occurrences of each voltage value in the voltage value sequence.
Specifically, the frequency of occurrence of different voltage values in the voltage value sequence is counted, and as shown in fig. 3, the frequency of occurrence of voltage values of the josephson junction array at the target frequency is shown. Wherein the josephson junction array is formed by 8748 josephson junctions, the target frequency is 19GHz, and fig. 3 is a voltage value appearance frequency diagram under 19GHz microwave irradiation. And then, determining three appearance frequency numbers with the highest numerical values as target appearance frequency numbers, and determining voltage values corresponding to the target frequency numbers as target steps to obtain three target steps which are respectively a positive step, a negative step and a 0 step of the Josephson junction array.
In the above embodiment, the frequency of occurrence of different voltage values in the voltage value sequence is obtained, three frequency of occurrence with the highest numerical value are selected from the frequency of occurrence, three target frequency of occurrence are obtained, and the voltage value corresponding to each target frequency of occurrence is determined as a target step. Therefore, the approximate position corresponding to the quantum step of the Josephson junction array can be determined, and a data basis is provided for further accurately determining the step position and the step width of the quantum step of the Josephson junction array in the follow-up process.
In one embodiment, as shown in fig. 4, a schematic flow chart of an implementation manner of step S300 includes:
in step S310, a voltage value is scanned within a preset range centered on the target step, and the scanned voltage value is determined as a target voltage value.
Step S320, obtaining a current value corresponding to the target voltage value according to the current-voltage correspondence, and obtaining a target current value.
And a current-voltage corresponding relation exists between the voltage value and the current value in the voltage value sequence. The preset range refers to a preset voltage scanning range, and optionally, the preset range may be an area with the center of the target step and the range being unequal to plus or minus 100 microvolts, 150 microvolts and 200 microvolts.
Specifically, the voltage value existing in the region is scanned within a preset range centered on the target step, and the scanned voltage value is determined as one or more target voltage values corresponding to the target step. And then, determining one or more current values corresponding to one or more target voltage values according to the current-voltage corresponding relation to obtain a target current value.
Optionally, the voltage value is scanned within a preset range centered on the target step, and if the number of scanned voltage values is greater than a preset threshold, the scanned voltage value is determined as the target voltage value.
The preset threshold refers to a preset numerical value for limiting the number of voltage values in the specific region, and optionally, the preset threshold may be 3, 4, or 5.
Specifically, voltage values existing in the region are scanned in a preset range with the target step as the center, and if the number of the voltage values scanned in the region is larger than a preset threshold value, which indicates that the preset range is on the josephson junction quantum step, the scanned voltage values are determined as the target voltage values.
In the above embodiment, the voltage value is scanned within a preset range centered on the target step, and the scanned voltage value is determined as the target voltage value; and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value. Therefore, under the condition that the number of the Josephson junctions is not needed, the target voltage value and the target current value corresponding to the quantum step of the Josephson junction array can be obtained, and a data basis is provided for further determining the step position and the step width.
In one embodiment, as shown in fig. 5, a schematic flow chart of an implementable method of step S310 includes:
step S311, according to a preset window, scanning the voltage value within a preset range centered on the target step.
In step S312, if the number of the scanned voltage values in the preset window is greater than the preset threshold, the scanned voltage values are determined as the target voltage values.
The preset window is a preset scanning range of a voltage value, and optionally, the size of the preset window may be 1.01 microvolts, 2.01 microvolts, or 3.01 microvolts.
Specifically, all voltage values in the window are scanned within a preset range with the target step as the center according to a preset window, and if the number of the voltage values scanned in the preset window is larger than a preset threshold value, which indicates that the preset window is on the josephson junction array quantum step, the scanned voltage values are determined as the target voltage values.
Illustratively, the preset area is taken as an area of plus or minus 100 microvolts of the target step, the preset window is 1.01 microvolts, and the preset value is 3. Setting a 1.01 microvolt window for accurate scanning calculation in an area of plus or minus 100 microvolts of a target step, if the number of voltage values in the 1.01 microvolt window is more than 3, indicating that the window is on the target step, and circularly scanning to find out all voltage values on the step to obtain a target voltage value.
In the above embodiment, the voltage value is scanned within a preset range centered on the target step according to a preset window; and if the number of the scanned voltage values in the preset window is larger than a preset threshold value, determining the scanned voltage values as target voltage values. Therefore, all voltage values in a preset range of the target step can be found out, and a foundation is provided for accurately determining the step position and the step width of the Josephson junction array quantum step.
In one embodiment, as shown in fig. 6, a schematic flow chart of an implementation manner of step S400 includes:
step S410, obtaining a current difference value between the maximum target current value and the minimum target current value in the target current values, and determining the current difference value as the step width of the Josephson junction array quantum step.
Step S420, obtaining the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step.
Specifically, a maximum target current value and a minimum target current value are found from the target currents, and a current difference value between the maximum target current value and the minimum target current value is obtained, wherein the current difference value is the step width of the josephson junction array quantum step. And calculating the average value of the target voltage value, wherein the average value is the step position of the Josephson junction array quantum step.
In the above embodiment, a current difference between a maximum target current value and a minimum target current value among the target current values is obtained, and the current difference is determined as a step width of a josephson junction array quantum step; and acquiring the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step. Therefore, the step position and the step width of the quantum step of the Josephson junction array can be determined without determining whether the Josephson junction in the superconducting short circuit state exists in the Josephson junction array or determining the step position and the step width of the quantum step of the Josephson junction array according to the exact number of the Josephson junctions.
It should be understood that although the various steps of the flow diagrams in fig. 1-6 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-6 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps.
In one embodiment, as shown in fig. 7, there is provided a josephson junction array quantum step determination apparatus, including: a data acquisition module 701, a target step determination module 702, a data scanning module 703, and a quantum step determination module 704, wherein:
a data acquisition module 701, configured to acquire a voltage value sequence of the josephson junction array at a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array;
a target step determining module 702, configured to determine three voltage values with the highest occurrence frequency in the voltage value sequence as three target steps corresponding to josephson junction array quantum steps;
the data scanning module 703 is configured to scan within a preset range with the target step as a center to obtain a target voltage value and a corresponding target current value;
and the quantum step determining module 704 is configured to determine a step position of a josephson junction array quantum step according to the target voltage value, and determine a step width of the josephson junction array quantum step according to the target current value.
In one embodiment, the data acquisition module 701 is further configured to irradiate the josephson junction array with microwaves of a target frequency; voltages are applied to the josephson junction array and a sequence of voltage values is measured and obtained.
In one embodiment, the target step determining module 702 is further configured to obtain the frequency of occurrence of different voltage values in the voltage value sequence; selecting three appearance frequency numbers with the highest numerical value from the appearance frequency numbers to obtain three target appearance frequency numbers; and determining the voltage value corresponding to the occurrence frequency of each target as a target step.
In one embodiment, the data scanning module 703 is further configured to scan a voltage value within a preset range centered on the target step, and determine the scanned voltage value as a target voltage value; and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value.
In one embodiment, the data scanning module 703 is further configured to scan voltage values within a preset range centered on the target step, and determine the scanned voltage values as the target voltage values if the number of the scanned voltage values is greater than a preset threshold.
In one embodiment, the data scanning module 703 is further configured to scan a voltage value within a preset range centered on the target step according to a preset window; and if the number of the scanned voltage values in the preset window is larger than a preset threshold value, determining the scanned voltage values as target voltage values.
In one embodiment, the quantum step determining module 704 is further configured to obtain a current difference value between a maximum target current value and a minimum target current value of the target current values, and determine the current difference value as a step width of a josephson junction array quantum step; and acquiring the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step.
For specific definition of the josephson junction array quantum step determining apparatus, reference may be made to the above definition of the josephson junction array quantum step determining method, which is not described herein again. The modules in the josephson junction quantum step determination device can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 8. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, an operator network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a method of josephson junction array quantum step determination. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 8 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having a computer program stored therein, the processor implementing the following steps when executing the computer program:
acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array;
determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the quantum steps of the Josephson junction array;
scanning within a preset range taking the target step as the center to obtain a target voltage value and a corresponding target current value;
and determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value.
In one embodiment, the processor, when executing the computer program, further performs the steps of: irradiating the Josephson junction array by adopting microwaves with target frequency; voltages are applied to the josephson junction array and a sequence of voltage values is measured and obtained.
In one embodiment, the processor, when executing the computer program, further performs the steps of: acquiring the frequency of occurrence of different voltage values in the voltage value sequence; selecting three appearance frequency numbers with the highest numerical value from the appearance frequency numbers to obtain three target appearance frequency numbers; and determining the voltage value corresponding to the occurrence frequency of each target as a target step.
In one embodiment, the processor, when executing the computer program, further performs the steps of: scanning a voltage value within a preset range taking the target step as a center, and determining the scanned voltage value as a target voltage value; and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value.
In one embodiment, the processor, when executing the computer program, further performs the steps of: and scanning the voltage values within a preset range taking the target step as the center, and determining the scanned voltage values as the target voltage values if the number of the scanned voltage values is greater than a preset threshold value.
In one embodiment, the processor, when executing the computer program, further performs the steps of: scanning a voltage value within a preset range with the target step as the center according to a preset window; and if the number of the scanned voltage values in the preset window is larger than a preset threshold value, determining the scanned voltage values as target voltage values.
In one embodiment, the processor, when executing the computer program, further performs the steps of: obtaining a current difference value between a maximum target current value and a minimum target current value in the target current values, and determining the current difference value as the step width of the Josephson junction array quantum step; and acquiring the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:
acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array;
determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the quantum steps of the Josephson junction array;
scanning within a preset range taking the target step as the center to obtain a target voltage value and a corresponding target current value;
and determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value.
In one embodiment, the computer program when executed by the processor further performs the steps of: irradiating the Josephson junction array by adopting microwaves with target frequency; voltages are applied to the josephson junction array and a sequence of voltage values is measured and obtained.
In one embodiment, the computer program when executed by the processor further performs the steps of: acquiring the frequency of occurrence of different voltage values in the voltage value sequence; selecting three appearance frequency numbers with the highest numerical value from the appearance frequency numbers to obtain three target appearance frequency numbers; and determining the voltage value corresponding to the occurrence frequency of each target as a target step.
In one embodiment, the computer program when executed by the processor further performs the steps of: scanning a voltage value within a preset range taking the target step as a center, and determining the scanned voltage value as a target voltage value; and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value.
In one embodiment, the computer program when executed by the processor further performs the steps of: and scanning the voltage values within a preset range taking the target step as the center, and determining the scanned voltage values as the target voltage values if the number of the scanned voltage values is greater than a preset threshold value.
In one embodiment, the computer program when executed by the processor further performs the steps of: scanning a voltage value within a preset range with the target step as the center according to a preset window; and if the number of the scanned voltage values in the preset window is larger than a preset threshold value, determining the scanned voltage values as target voltage values.
In one embodiment, the computer program when executed by the processor further performs the steps of: obtaining a current difference value between a maximum target current value and a minimum target current value in the target current values, and determining the current difference value as the step width of the Josephson junction array quantum step; and acquiring the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (8)
1. A method of josephson junction array quantum step determination, the method comprising:
acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the Josephson junction array;
determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the quantum steps of the Josephson junction array;
scanning within a preset range taking the target step as a center to obtain a target voltage value and a corresponding target current value, wherein a current-voltage corresponding relation exists between the voltage value and the current value in the voltage value sequence;
determining the step position of the Josephson junction array quantum step according to the target voltage value, and determining the step width of the Josephson junction array quantum step according to the target current value;
the scanning within a preset range with the target step as the center to obtain a target voltage value and a corresponding target current value, wherein a current-voltage corresponding relation exists between the voltage value and the current value in the voltage value sequence, and the method comprises the following steps:
scanning voltage values in a preset range with the target step as the center, and determining the scanned voltage values as the target voltage values if the number of the scanned voltage values is greater than a preset threshold value;
and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value.
2. The method of claim 1, wherein said obtaining a sequence of voltage values of the josephson junction array at a target frequency comprises:
irradiating the Josephson junction array with microwaves of the target frequency;
applying a voltage to the Josephson junction array, and measuring and obtaining the voltage value sequence.
3. The method of claim 1, wherein said determining three voltage values of the sequence of voltage values having the highest frequency of occurrence as three target steps corresponding to quantum steps of the Josephson junction array comprises:
acquiring the frequency of occurrence of different voltage values in the voltage value sequence;
selecting three appearance frequency numbers with the highest numerical values from the appearance frequency numbers to obtain three target appearance frequency numbers;
and determining a voltage value corresponding to each target occurrence frequency as one target step.
4. The method of claim 1, wherein the scanning the voltage values within a preset range centered on the target step, and if the number of scanned voltage values is greater than a preset threshold, determining the scanned voltage values as the target voltage values comprises:
scanning a voltage value within a preset range with the target step as a center according to a preset window;
and if the number of the scanned voltage values in the preset window is larger than a preset threshold value, determining the scanned voltage values as the target voltage values.
5. The method of claim 1, wherein determining the step position of the Josephson junction array quantum step according to the target voltage value and determining the step width of the Josephson junction array quantum step according to the target current value comprises:
obtaining a current difference value between a maximum target current value and a minimum target current value in the target current values, and determining the current difference value as the step width of the Josephson junction array quantum step;
and acquiring the mean value of the target voltage values, and determining the mean value of the target voltage values as the step position of the Josephson junction array quantum step.
6. A josephson junction array quantum step determination apparatus, the apparatus comprising:
the data acquisition module is used for acquiring a voltage value sequence of the Josephson junction array under a target frequency; wherein the target frequency is the frequency of microwave irradiation corresponding to the josephson junction array;
the target step determining module is used for determining three voltage values with the highest frequency in the voltage value sequence as three target steps corresponding to the Josephson junction array quantum steps;
the data scanning module is used for scanning within a preset range taking the target step as the center to obtain a target voltage value and a corresponding target current value, and a current-voltage corresponding relation exists between the voltage value and the current value in the voltage value sequence;
the quantum step determining module is used for determining the step position of the Josephson junction array quantum step according to the target voltage value and determining the step width of the Josephson junction array quantum step according to the target current value;
the data scanning module is further configured to scan voltage values within a preset range with the target step as a center, and if the number of the scanned voltage values is greater than a preset threshold, determine the scanned voltage values as the target voltage values; and acquiring a current value corresponding to the target voltage value according to the current-voltage corresponding relation to obtain the target current value.
7. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 5.
8. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011618425.0A CN112668270B (en) | 2020-12-30 | 2020-12-30 | Josephson junction array quantum step determination method, apparatus, device and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011618425.0A CN112668270B (en) | 2020-12-30 | 2020-12-30 | Josephson junction array quantum step determination method, apparatus, device and storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112668270A CN112668270A (en) | 2021-04-16 |
| CN112668270B true CN112668270B (en) | 2021-11-23 |
Family
ID=75411505
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011618425.0A Active CN112668270B (en) | 2020-12-30 | 2020-12-30 | Josephson junction array quantum step determination method, apparatus, device and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112668270B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114153257B (en) * | 2021-11-18 | 2023-04-11 | 国网陕西省电力公司营销服务中心(计量中心) | Two-way programmable Josephson junction array driving method and device |
| CN114200282B (en) * | 2022-02-16 | 2022-05-31 | 阿里巴巴达摩院(杭州)科技有限公司 | Test device and test method for testing by using test device |
| CN117008668B (en) * | 2023-10-08 | 2024-02-13 | 国网江苏省电力有限公司营销服务中心 | Quantum voltage standard system temperature control device, method and system based on solid medium |
| CN118034639A (en) * | 2024-01-18 | 2024-05-14 | 中国计量科学研究院 | Segmentation method, device, equipment and medium of Josephson junction array |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5358928A (en) * | 1992-09-22 | 1994-10-25 | Sandia Corporation | High temperature superconductor step-edge Josephson junctions using Ti-Ca-Ba-Cu-O |
| CN108072820A (en) * | 2017-11-28 | 2018-05-25 | 北京无线电计量测试研究所 | A kind of superconductive device tests system and method |
| CN109660230A (en) * | 2018-12-07 | 2019-04-19 | 中国计量科学研究院 | The phase shifter configuration method and microwave circuit of voltage reference circuit |
| CN111367344A (en) * | 2020-04-09 | 2020-07-03 | 中国计量大学 | Direct current voltage characteristic simulation circuit and method for series connection Josephson junction |
| CN111600608A (en) * | 2020-04-17 | 2020-08-28 | 中国计量科学研究院 | Superconducting quantum digital-to-analog conversion circuit |
-
2020
- 2020-12-30 CN CN202011618425.0A patent/CN112668270B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5358928A (en) * | 1992-09-22 | 1994-10-25 | Sandia Corporation | High temperature superconductor step-edge Josephson junctions using Ti-Ca-Ba-Cu-O |
| CN108072820A (en) * | 2017-11-28 | 2018-05-25 | 北京无线电计量测试研究所 | A kind of superconductive device tests system and method |
| CN109660230A (en) * | 2018-12-07 | 2019-04-19 | 中国计量科学研究院 | The phase shifter configuration method and microwave circuit of voltage reference circuit |
| CN111367344A (en) * | 2020-04-09 | 2020-07-03 | 中国计量大学 | Direct current voltage characteristic simulation circuit and method for series connection Josephson junction |
| CN111600608A (en) * | 2020-04-17 | 2020-08-28 | 中国计量科学研究院 | Superconducting quantum digital-to-analog conversion circuit |
Non-Patent Citations (1)
| Title |
|---|
| Numerical Simulation of Quantized Voltage Steps;Akio Takada;《IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY》;20031230;全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112668270A (en) | 2021-04-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112668270B (en) | Josephson junction array quantum step determination method, apparatus, device and storage medium | |
| CN111028212B (en) | Key point detection method, device, computer equipment and storage medium | |
| CN110584698B (en) | Detector quality control validation method, detector quality control validation device, computer equipment and storage medium | |
| CN112052805B (en) | Face detection frame display method, image processing device, equipment and storage medium | |
| JPH09171521A (en) | Simulation method for semiconductor and device therefor | |
| CN112632894B (en) | Josephson junction array voltage output method, apparatus, device and storage medium | |
| CN111521859B (en) | Line current measuring method and device of power equipment and computer equipment | |
| CN111340788B (en) | Hardware Trojan horse layout detection method and device, electronic equipment and readable storage medium | |
| CN115238623A (en) | Affinity energy model correction method, affinity energy model correction device, TCAD simulation method, TCAD simulation system and TCAD simulation medium | |
| CN111614318A (en) | Method and device for detecting direct-current side current fault of photovoltaic system | |
| CN113160126A (en) | Hardware Trojan horse detection method and device, computer equipment and storage medium | |
| CN112217585A (en) | Signal path determination method and device, computer equipment and storage medium | |
| CN112233171A (en) | Target labeling quality inspection method and device, computer equipment and storage medium | |
| CN113625178B (en) | Method and device for detecting internal short circuit of lithium thionyl chloride battery and computer equipment | |
| CN111275347A (en) | Probability threshold calculation method, device, equipment and storage medium for game rough set | |
| US20240078367A1 (en) | Method of obtaining an initial guess for a semiconductor device simulation | |
| CN115808578B (en) | Method, device, equipment and storage medium for acquiring voltage of power equipment | |
| CN116442226B (en) | Pose correctness judging method, pose correctness judging device, robot and storage medium | |
| CN116227391B (en) | Fault-tolerant Josephson junction array, dynamic ternary design method and equipment | |
| CN117310452B (en) | Method, device, computer equipment and storage medium for determining electromagnetic signal leakage | |
| CN114975153A (en) | Semiconductor structure defect monitoring method and device, computer equipment and storage medium | |
| CN110660011B (en) | Image processing method and device, electronic device and storage medium | |
| CN113038357B (en) | Indoor positioning method and electronic equipment | |
| CN118731514A (en) | Chip radiation analysis system and method | |
| CN117078647A (en) | Space occupation detection method, device, equipment and storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |