CN112650632A - Operation card testing method, system and medium - Google Patents
Operation card testing method, system and medium Download PDFInfo
- Publication number
- CN112650632A CN112650632A CN202011410483.4A CN202011410483A CN112650632A CN 112650632 A CN112650632 A CN 112650632A CN 202011410483 A CN202011410483 A CN 202011410483A CN 112650632 A CN112650632 A CN 112650632A
- Authority
- CN
- China
- Prior art keywords
- test
- operation card
- testing
- standard
- instruction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 375
- 238000009434 installation Methods 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 21
- 230000002159 abnormal effect Effects 0.000 claims description 6
- 230000002688 persistence Effects 0.000 claims description 6
- 230000017525 heat dissipation Effects 0.000 claims description 3
- 238000010998 test method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
Abstract
The invention discloses an operation card testing method, which comprises the following steps of S100, setting a test item, an error threshold value and a standard parameter for testing performance data of an operation card; s200, identifying whether a driver corresponding to the test operation card is installed or not; s300, testing the test operation card according to the test items, generating test parameters of the performance data of the test operation card, and storing the test parameters; s400, judging a test condition according to the test parameters, the standard parameters and the error threshold, outputting a test result according to the test condition, and judging the index level of the test operation card according to the test result; the index level is up to standard and not up to standard; s500, analyzing the unqualified reason of the unqualified test operation card; the invention can satisfy the test environment of the operation card under various conditions through multi-dimensional random test, so that the test result of the operation card is more accurate, the problem of omission of the operation card is avoided, and the safety and the usability of the operation card are improved.
Description
Technical Field
The invention relates to the field of hardware testing, in particular to an operation card testing method, system and medium.
Background
In the existing operation card pressure test, the operation card is subjected to pressure test in a mode of gradually pressurizing and long-time full load, wherein the mode of gradually pressurizing is to set a time period, and the operation card is gradually pressurized in the time period to be tested until the upper limit of pressurization is reached; setting a time period in a long-time full-load mode, and directly pressurizing the operation card to a full-load state in the time period for testing; the application scenes of the existing operation cards are more and more, the test is carried out through the two modes, the test requirements of the operation cards cannot be met, even the error test of the operation cards can be caused, the problem of omission of customers is caused, and the safety and the usability of the operation cards are reduced.
Disclosure of Invention
The invention mainly solves the technical problem of providing an operation card testing method, system and medium, which can solve the problem of reducing the safety and usability of the operation card caused by the traditional testing mode.
In order to solve the technical problems, the invention adopts a technical scheme that: an operation card test method comprises the following steps:
firstly, setting a test item, an error threshold value and a standard parameter of performance data of a test operation card;
secondly, identifying whether a driver corresponding to the test operation card is installed or not;
thirdly, testing the test operation card according to the test items, generating test parameters of the performance data of the test operation card, and storing the test parameters;
fourthly, judging the test condition according to the test parameters, the standard parameters and the error threshold, outputting the test result according to the test condition, and judging the index level of the test operation card according to the test result; the index level is up to standard and not up to standard;
and fifthly, analyzing the unqualified reason of the unqualified test operation card.
Further, in the second step, an identification instruction is input to identify whether a driver corresponding to the test operation card is installed, and if so, the third step is executed;
if not, inputting an installation instruction, installing a driver corresponding to the test operation card, and executing the third step after the driver is installed.
Further, the third step specifically comprises:
firstly, inputting an initialization instruction to initialize performance data of a test operation card;
inputting a test instruction corresponding to the test item, and executing a test step on the test operation card;
the test items include: the method comprises the following steps of testing duration, testing period, testing reference, testing load degree, testing core number and testing equipment number;
the testing steps are as follows:
within the testing time span, increasing the testing load degree of the cores of the testing operation cards corresponding to the number of the testing devices and the number of the testing cores every other testing period according to the testing standard;
and generating test parameters of the performance data of the test operation card every other test period, carrying out persistence processing on the test parameters to obtain a test log, and storing the test log into a database.
Further, the fourth step is specifically: calculating the absolute value of the difference between the standard parameter and the test parameter, comparing the absolute value with an error threshold, and judging the test condition according to the comparison result, wherein the method specifically comprises the following steps:
if the absolute value of the difference between any standard parameter and the test parameter is larger than the error threshold, judging that the test condition is that the test operation card is abnormal;
if the absolute values of the differences between the standard parameters and the test parameters are less than or equal to the error threshold, judging that the test condition is that the test operation card is normal;
the test parameters include: testing the test temperature, the test frequency and the test power consumption of the operation card;
the standard parameters include: and testing the standard temperature, the standard frequency and the standard power consumption of the operation card.
Further, in the fourth step, after the test duration, if the test condition is that the test operation card is normal all the time, outputting the test result as successful test, and judging that the test operation card is the standard operation card;
within the testing time, if the testing operation card is abnormal in the testing condition, the testing step is terminated, the testing result is output as the testing failure, and the testing operation card is judged to be the operation card which does not reach the standard;
and when the output test result is that the test fails, inputting a positioning instruction, positioning the operation card which does not reach the standard, and lighting the LED corresponding to the operation card which does not reach the standard.
Further, the fifth step specifically includes: analyzing the unqualified reason of the unqualified operation card according to the error threshold, the standard parameter and the test parameter of the unqualified operation card, and the method comprises the following specific steps:
if the absolute value of the difference between the test temperature of the operation card which does not reach the standard temperature is larger than the error threshold, the reason why the operation card does not reach the standard is the fault of the core of the operation card;
if the absolute value of the difference between the test frequency of the operation card which does not reach the standard frequency of the operation card is larger than the error threshold, judging whether the reason of the operation card which does not reach the standard is caused by the heat dissipation fault of the chassis, if not, judging that the reason of the operation card which does not reach the standard is the fault of the processing chip of the operation card;
and if the absolute value of the difference between the test power consumption of the operation card which does not reach the standard power consumption is larger than the error threshold, the reason why the operation card does not reach the standard power consumption is that the power supply of the operation card is insufficient.
Further, the fourth step further includes: and selecting the standard operation card from the test operation cards for redundancy backup according to the test result.
An arithmetic card testing system comprising:
the device comprises a control module, an instruction input module, a central processing module, an analysis module, a recording module and a test result output module;
the control module is used for setting a test item, an error threshold value and a standard parameter of performance data of the test operation card;
the instruction input module is used for inputting an identification instruction, an installation instruction, an initialization instruction, a test instruction and a positioning instruction, sending the identification instruction, the installation instruction, the initialization instruction and the test instruction to the central processing module and sending the positioning instruction to the test result output module;
the central processing module is used for receiving and processing the identification instruction, the installation instruction, the initialization instruction and the test instruction, executing the test step on the operation card and generating a test parameter for testing the performance data of the operation card;
the recording module is used for carrying out persistence processing on the test parameters to obtain a test log and storing the test log into a database;
the analysis module is used for judging the test condition and the index level of the test operation card according to the test parameters and the standard parameters, and executing an analysis step on the unqualified reasons of the unqualified operation card;
and the test result output module is used for outputting a test result according to the test condition.
As an improved scheme, the central processing module comprises an identification module, an installation module, an initialization module and a test module;
the identification module is used for identifying whether a driver corresponding to the test operation card is installed or not according to the identification instruction;
the installation module installs a driver corresponding to the test operation card according to the installation instruction;
the initialization module is used for initializing the performance data of the test operation card according to the initialization instruction;
the test module executes the test step on the test operation card according to the test instruction;
and the test result output module is provided with an LED corresponding to the type number of the operation card, and when the test result is output as a test failure, the test result output module lights the LED through the positioning instruction.
An operation card test medium is used for storing software instructions used by the operation card test method, wherein the software instructions comprise a program designed for the operation card test method.
The invention has the beneficial effects that: the invention can satisfy the test environment of the operation card under various conditions through multi-dimensional random test, so that the test result of the operation card is more accurate, the problem of omission of the operation card is avoided, and the safety and the usability of the operation card are improved.
Drawings
FIG. 1 is a flow chart of a method for testing an operation card according to the present invention;
fig. 2 is a schematic structural diagram of an operation card testing system provided in the present invention.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention easier to understand by those skilled in the art, and thus will clearly and clearly define the scope of the invention.
The embodiment of the invention comprises the following steps:
in a first aspect, referring to fig. 1, an operation card testing method includes:
in the embodiment, a GPU (graphics processing unit) (namely a display card) is selected as an operation card for description;
initializing, by the control module, test items, the test items including: testing time length, testing period, testing load degree, testing GPU core number and equipment number;
in this embodiment, the selected test duration is 48 hours, and the test duration can be set as required; selecting a test period of 15 minutes; selecting a test load degree of 5%, and increasing the load degree by one every other test period, namely increasing the load degree by 10% after testing for 15 minutes; selecting a GPU core number of 6, and when the GPU core number is selected, selecting according to the type of the GPU, wherein the selected core number is within the total core number of the GPU; the number of the selected devices is 3, and the number is also specifically set according to the requirement;
installing and testing the GPU according to the test items, configuring a plurality of drivers of the GPU in the system, before testing, firstly identifying the driver corresponding to the GPU by an identification module, sending an identification signal to an instruction input module by the identification module, automatically inputting an identification instruction 'rpm-qa | grep-i GPU model' by the instruction input module to identify whether the driver is installed or not, and if the driver corresponding to the GPU exists, continuing testing; if the driver corresponding to the GPU does not exist, the instruction input module automatically inputs an installation instruction ". multidot.GPU model-driver … run", and the installation module continues to test after installing the driver corresponding to the GPU;
inputting an initialization instruction 'GPUsmi-device 0-reset', initializing various performance data of the GPU by an initialization module, and enabling the test result of the GPU to be more accurate through initialization;
after the initialization is completed, the instruction input module automatically inputs a test instruction 'GPUstress-d 3-t 15-5% C1C 2C 3C 4C 5C 6', the test module executes a test step on the test GPU according to the test instruction, and the test step is as follows: testing 1-6 cores of 3 GPUs for 15 minutes at a test cycle and a test load degree of 5%;
the instruction corresponds to a test item initialized at the beginning of the embodiment, the test instruction is randomly selected, and the selection of the test item is not limited;
in the testing process, obtaining corresponding testing parameters which are parameters of various performance data after the GPU is tested, wherein the parameters comprise parameters such as power consumption, temperature, frequency and the like of the GPU; setting corresponding standard parameters for each performance data of the GPU;
after the duration to be tested is finished, the test is automatically stopped, the recording module carries out persistence processing on the test parameters to obtain a test log, the test log is stored in a database, and the analysis module compares the test parameters with the standard parameters;
when comparing each test parameter and standard parameter of the GPU, the comparison rule is as follows: setting an error threshold, calculating the absolute value of the difference between the standard parameter and the test parameter, and if the absolute value of the difference between the standard parameter and the test parameter is greater than the error threshold, determining that the GPU is abnormal; if the absolute value of the difference between the standard parameter and the test parameter is smaller than the error threshold value, the GPU is normal; because the test parameters of the GPU are different from the characteristics of the GPU, the error threshold value is used for testing the GPU more accurately and uniformly;
in the testing process, if the GPU is normal until the testing is finished, the GPU is up to the standard, and the testing result output module displays a PASS character (namely the output testing is successful); if the GPU is abnormal once, the GPU is not up to the standard, and the test result output module displays a FAIL word (namely the output test FAILs); at the moment, the instruction input module inputs a positioning instruction 'gpusci-device 0-thermal off', the test result output module positions the GPU which does not reach the standard, an LED lamp corresponding to the GPU model is on, and the GPU of the model is represented as the GPU which does not reach the standard;
analyzing the test parameters of the GPU which does not reach the standard in the test logs of the database, if the error threshold is 5, the test temperature in the test parameters is 75 ℃, the standard temperature is 85 ℃, and the absolute value of the difference between the standard temperature and the test temperature is greater than 5, the GPU does not reach the standard, and the reason of not reaching the standard is GPU core fault; if the test frequency in the test parameters is 1350MHZ, the standard frequency is 1360MHZ and the absolute value of the difference between the standard frequency and the test frequency is greater than 5 of an error threshold, analyzing that the GPU does not reach the standard, judging whether the reason of the non-standard is caused by the heat dissipation of the chassis, and if not, judging that the reason of the non-standard of the GPU is the fault of a GPU processing chip; if the test power consumption in the test parameters is 500W, the standard power consumption is 490W, and the absolute value of the difference between the standard power consumption and the test power consumption is greater than the error threshold value 5, the GPU does not reach the standard, and the reason for not reaching the standard is insufficient power supply.
In this embodiment, the standard operation cards obtained according to the test result may be subjected to redundancy backup, for example, the number of the test equipment is 5, 4 operation cards are obtained according to the test as the standard operation cards, 3 operation cards are selected as redundancy backup, 1 operation card is selected, and when the operation card in operation fails, one of the three operation cards in the redundancy backup may be used for replacement.
In a second aspect, referring to fig. 2, based on the same inventive concept as the method for testing the operation card in the foregoing embodiment, an embodiment of the present specification further provides an operation card testing system, including: the device comprises a control module, an instruction input module, a central processing module, an analysis module, a recording module and a test result output module;
the control module is used for setting a test item, an error threshold value and a standard parameter for testing performance data of the GPU;
the instruction input module is used for inputting an identification instruction, an installation instruction, an initialization instruction, a test instruction and a positioning instruction, sending the identification instruction, the installation instruction, the initialization instruction and the test instruction to the central processing module and sending the positioning instruction to the test result output module;
the central processing module is used for receiving and processing the identification instruction, the installation instruction, the initialization instruction and the test instruction, executing the test step on the GPU and generating test parameters for testing the performance data of the GPU;
the recording module is used for carrying out persistence processing on the test parameters to obtain a test log and storing the test log into a database;
the analysis module is used for judging the test condition and the index level of the test GPU according to the test parameters and the standard parameters, and executing an analysis step on the unqualified reasons of the unqualified GPU;
and the test result output module is used for outputting a test result according to the test condition.
The central processing module comprises an identification module, an installation module, an initialization module and a test module;
the identification module is used for identifying whether a driver corresponding to the test GPU is installed or not according to the identification instruction;
the installation module installs a driver corresponding to the test GPU according to the installation instruction;
the initialization module is used for initializing the performance data of the test GPU according to the initialization instruction;
the test module executes the test step on the test GPU according to the test instruction;
and the test result output module is provided with an LED corresponding to the GPU model, and when the test result output is test failure, the test result output module lights the LED through the positioning instruction.
In a third aspect, based on the same inventive concept as the method for testing the operation card in the foregoing embodiments, an embodiment of the present disclosure further provides an operation card testing medium for storing software instructions for the method for testing the operation card, wherein the operation card testing medium includes a program designed for the method for testing the operation card.
Different from the prior art, the operation card testing method, the operation card testing system and the operation card testing medium can randomly set the testing items of the operation card through the control module, so that various states of the operation card in the practical application process are met, the usability and the safety of the operation card are further improved, and the testing result of the operation card is more accurate.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. An operation card testing method is characterized by comprising the following steps:
s100, setting a test item, an error threshold and a standard parameter for testing performance data of the operation card;
s200, identifying whether a driver corresponding to the test operation card is installed or not;
s300, testing the test operation card according to the test items, generating test parameters of the performance data of the test operation card, and storing the test parameters;
s400, judging a test condition according to the test parameters, the standard parameters and the error threshold, outputting a test result according to the test condition, and judging the index level of the test operation card according to the test result; the index level is up to standard and not up to standard;
and S500, analyzing the unqualified reason of the unqualified test operation card.
2. The method according to claim 1, wherein in step S200, the identification command is input to identify whether the driver corresponding to the test operation card is installed, and if yes, step S300 is executed;
if not, inputting an installation instruction, installing a driver corresponding to the test operation card, and executing the step S300 after the driver is installed.
3. The method for testing an operation card according to claim 1, wherein the step S300 specifically comprises:
s301, inputting an initialization instruction, and initializing performance data of the test operation card;
s302, inputting a test instruction corresponding to the test item, and executing a test step on the test operation card;
the test items include: the method comprises the following steps of testing duration, testing period, testing reference, testing load degree, testing core number and testing equipment number;
the testing steps are as follows:
within the testing time span, increasing the testing load degree of the cores of the testing operation cards corresponding to the number of the testing devices and the number of the testing cores every other testing period according to the testing standard;
and generating test parameters of the performance data of the test operation card every other test period, carrying out persistence processing on the test parameters to obtain a test log, and storing the test log into a database.
4. The method for testing an operation card according to claim 3, wherein the step S400 specifically comprises: calculating the absolute value of the difference between the standard parameter and the test parameter, comparing the absolute value with an error threshold, and judging the test condition according to the comparison result, wherein the method specifically comprises the following steps:
if the absolute value of the difference between any standard parameter and the test parameter is larger than the error threshold, judging that the test condition is that the test operation card is abnormal;
if the absolute values of the differences between the standard parameters and the test parameters are less than or equal to the error threshold, judging that the test condition is that the test operation card is normal;
the test parameters include: testing the test temperature, the test frequency and the test power consumption of the operation card;
the standard parameters include: and testing the standard temperature, the standard frequency and the standard power consumption of the operation card.
5. The method according to claim 4, wherein in step S400, after the test duration, if the test condition is always normal, the test result is output as a successful test, and the test operation card is determined to be a standard operation card;
within the testing time, if the testing operation card is abnormal in the testing condition, the testing step is terminated, the testing result is output as the testing failure, and the testing operation card is judged to be the operation card which does not reach the standard;
and when the output test result is that the test fails, inputting a positioning instruction, positioning the operation card which does not reach the standard, and lighting the LED corresponding to the operation card which does not reach the standard.
6. The method for testing an operation card according to claim 5, wherein the step S500 is specifically as follows: analyzing the unqualified reason of the unqualified operation card according to the error threshold, the standard parameter and the test parameter of the unqualified operation card, and the method comprises the following specific steps:
if the absolute value of the difference between the test temperature of the operation card which does not reach the standard temperature is larger than the error threshold, the reason why the operation card does not reach the standard is the fault of the core of the operation card;
if the absolute value of the difference between the test frequency of the operation card which does not reach the standard frequency of the operation card is larger than the error threshold, judging whether the reason of the operation card which does not reach the standard is caused by the heat dissipation fault of the chassis, if not, judging that the reason of the operation card which does not reach the standard is the fault of the processing chip of the operation card;
and if the absolute value of the difference between the test power consumption of the operation card which does not reach the standard power consumption is larger than the error threshold, the reason why the operation card does not reach the standard power consumption is that the power supply of the operation card is insufficient.
7. The method for testing an operation card according to claim 5, wherein the step S400 further comprises: and selecting the standard operation card from the test operation cards for redundancy backup according to the test result.
8. An operation card test system, comprising: the device comprises a control module, an instruction input module, a central processing module, an analysis module, a recording module and a test result output module;
the control module is used for setting a test item, an error threshold value and a standard parameter of performance data of the test operation card;
the instruction input module is used for inputting an identification instruction, an installation instruction, an initialization instruction, a test instruction and a positioning instruction, sending the identification instruction, the installation instruction, the initialization instruction and the test instruction to the central processing module and sending the positioning instruction to the test result output module;
the central processing module is used for receiving and processing the identification instruction, the installation instruction, the initialization instruction and the test instruction, executing the test step on the operation card and generating a test parameter for testing the performance data of the operation card;
the recording module is used for carrying out persistence processing on the test parameters to obtain a test log and storing the test log into a database;
the analysis module is used for judging the test condition and the index level of the test operation card according to the test parameters and the standard parameters, and executing an analysis step on the unqualified reasons of the unqualified operation card;
and the test result output module is used for outputting a test result according to the test condition.
9. The system according to claim 8, wherein the central processing module comprises an identification module, an installation module, an initialization module and a test module;
the identification module is used for identifying whether a driver corresponding to the test operation card is installed or not according to the identification instruction;
the installation module installs a driver corresponding to the test operation card according to the installation instruction;
the initialization module is used for initializing the performance data of the test operation card according to the initialization instruction;
the test module executes the test step on the test operation card according to the test instruction;
and the test result output module is provided with an LED corresponding to the type number of the operation card, and when the test result is output as a test failure, the test result output module lights the LED through the positioning instruction.
10. An operation card testing medium for storing the software instructions for the operation card testing method according to claims 1 to 7, wherein the software instructions comprise a program designed for the operation card testing method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011410483.4A CN112650632A (en) | 2020-12-04 | 2020-12-04 | Operation card testing method, system and medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011410483.4A CN112650632A (en) | 2020-12-04 | 2020-12-04 | Operation card testing method, system and medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112650632A true CN112650632A (en) | 2021-04-13 |
Family
ID=75350534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011410483.4A Withdrawn CN112650632A (en) | 2020-12-04 | 2020-12-04 | Operation card testing method, system and medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112650632A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106815110A (en) * | 2017-01-22 | 2017-06-09 | 郑州云海信息技术有限公司 | One kind accelerates card test method and device |
| CN108958999A (en) * | 2018-06-13 | 2018-12-07 | 郑州云海信息技术有限公司 | A kind of method and system for testing GPU floating-point operation performance |
| CN110413462A (en) * | 2019-06-29 | 2019-11-05 | 苏州浪潮智能科技有限公司 | A kind of server stress test method and device |
-
2020
- 2020-12-04 CN CN202011410483.4A patent/CN112650632A/en not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106815110A (en) * | 2017-01-22 | 2017-06-09 | 郑州云海信息技术有限公司 | One kind accelerates card test method and device |
| CN108958999A (en) * | 2018-06-13 | 2018-12-07 | 郑州云海信息技术有限公司 | A kind of method and system for testing GPU floating-point operation performance |
| CN110413462A (en) * | 2019-06-29 | 2019-11-05 | 苏州浪潮智能科技有限公司 | A kind of server stress test method and device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6542841B1 (en) | Method for managing test measurements | |
| US20130317780A1 (en) | Probability of failure on demand calculation using fault tree approach for safety integrity level analysis | |
| CN107797928B (en) | Instrument control system platform logic algorithm block testing device and method | |
| CN101388254B (en) | Storage device test method | |
| US20090018793A1 (en) | Method and system for reducing device test time | |
| US7917809B2 (en) | BIOS test system and test method thereof | |
| CN112216340A (en) | Hard disk test method and device, storage medium and electronic equipment | |
| CN111831495A (en) | Production automation test method and system | |
| CN115437336A (en) | Test method and device for test case, electronic equipment and storage medium | |
| CN112650632A (en) | Operation card testing method, system and medium | |
| US8102180B2 (en) | CPU voltage testing system and method thereof | |
| US20230366927A1 (en) | Dice testing method | |
| CN115374619A (en) | Equipment reliability determination method and system considering chip influence | |
| CN115840707A (en) | Flash test method, device and medium | |
| CN109656764B (en) | Method and system for automatically verifying independent power-on and power-off control of hard disk | |
| CN114138579A (en) | Prometous-based GPU (graphics processing Unit) interactive test method, device, equipment and readable medium | |
| US20050075824A1 (en) | Auto-test system for testing the stability of a computer device | |
| CN111367731A (en) | Method and equipment for testing low delay of storage performance | |
| CN110688299A (en) | Automatic test platform for application software of nuclear power plant | |
| KR102253549B1 (en) | A method and apparatus for inspecting firing control system usinf failure categorization | |
| CN109859794B (en) | Solid state disk storage unit repair system | |
| CN115065628B (en) | Automatic test method and test system for fault code self-clearing of controller without sleep strategy | |
| CN108874605A (en) | Display screen test method, device, electronic equipment and storage medium | |
| CN100418204C (en) | Process flow for mfg. chip capable of pretesting efficiency, and testing method thereof | |
| CN111896824B (en) | Unattended reliability testing device and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20210413 |
|
| WW01 | Invention patent application withdrawn after publication |