CN112649452A - Industrial X-ray system imaging method and device - Google Patents
Industrial X-ray system imaging method and device Download PDFInfo
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Abstract
The application discloses an imaging method and device of an industrial X-ray system, which relate to the technical field of imaging of the X-ray system, and the method comprises the following steps: loading physical parameters and scanning parameters of an industrial X-ray imaging system; forming an accurate optical path, and calculating a ray equation of the boundary of the ray source and the boundaries of all the detector units under a given angle; calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position; pre-correcting the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the direction of a horizontal channel to obtain filtered projection data; and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object. The problem of relatively poor spatial resolution of the reconstructed image in the prior art is solved.
Description
Technical Field
The invention relates to an imaging method and device of an industrial X-ray system, belonging to the technical field of imaging of X-ray systems.
Background
An industrial X-ray Computed Tomography (CT) technology has the advantages of strong penetrating power, no damage and the like, and is widely applied to the field of industrial nondestructive testing. The cone beam filtering back projection algorithm is a mainstream reconstruction algorithm of the current commercial X-ray machine due to small calculated amount, good reconstructed image quality and high algorithm efficiency.
However, in the conventional cone-beam filtered back projection algorithm, in the process of deriving back projection reconstruction, an X-ray imaging system is idealized, that is, the X-ray light source, the detector unit and the pixel are abstracted to an ideal point by ignoring the focal point of the X-ray light source and the physical size of the detector. The method has the advantages that the pixel index of the detector unit in the back projection step can be rapidly calculated through the point coordinate of the X-ray light source and the point coordinate of the pixel, so that the back projection operation is rapidly realized. However, in a real X-ray system, the X-ray source focus and the detector unit have fixed physical dimensions, and the idealized assumption results in significant mismatch between the back-projection reconstruction model and the real data acquisition model, so that the detector unit cannot truly reflect back-projection contributions to spatial pixels, and spatial resolution of the reconstructed image is degraded.
Disclosure of Invention
The invention aims to provide an imaging method and an imaging device of an industrial X-ray system, which are used for solving the problems in the prior art.
In order to achieve the purpose, the invention provides the following technical scheme:
according to a first aspect, an embodiment of the present invention provides an industrial X-ray system imaging method, the method including:
loading physical parameters and scanning parameters of an industrial X-ray imaging system;
according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, positioning the accurate optical path formed by the X-ray light source and all the detector units, and calculating the ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle;
calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position;
reading in original scanning data of an industrial X-ray system on a scanned object, and performing pre-correction processing on the original scanning data;
carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data;
and constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object.
Optionally, the physical parameters and scanning parameters of the X-ray imaging system include a focal size of the X-ray light source, a size of the detector, a detector offset, a rotation geometry parameter, an initial exposure positioning offset, an exposure position of the X-ray light source, and a physical grid parameter of the scanned object.
Optionally, the focal spot size of the light source includes focal spot sizes in horizontal and vertical directions, the detector offset includes physical offsets of detectors in horizontal and vertical channel directions, the detector size includes physical unit sizes in horizontal and vertical directions, the rotation geometric parameter includes information of exposure positions of all radiation sources, initial angle offset and acquisition angle information of the radiation sources, and the physical grid parameter of the object to be scanned includes grid coordinate index, unit size and pixel physical offset.
Optionally, the positioning the precise optical path formed by the X-ray light source and all the detector units according to the physical parameter and the position parameter of the X-ray light source and the physical parameter and the position parameter of the detector, and calculating a ray equation of the boundary of the radiation source and the boundary of all the detector units at a given angle, including:
the ray equation is:
(A1/Z1)x+(B1/Z1)y+(C1/Z1)z=0
(A2/Z2)x+(B2/Z2)y+(C2/Z2)z=0
Vsrcrepresenting 2D source coordinate position, VdetRepresenting 2D detector coordinate position, Vsrc1And Vsrc2Is the coordinate, V, of the boundary of the X-ray source in the horizontal planedet1And Vdet2Coordinates of the boundary of the ith detector in the horizontal plane;
the plane equation of the upper and lower intersection of the plane defined by the focal point boundary of the X-ray light source on the axis and the boundaries of all the detector units on the axis is as follows:
A1x+B1y+C1z+D1=0
A2x+B2y+C2z+D2=0
wherein A is2+B2+C2=1,Raxis(. cndot.) is a 3 × 3 rotation matrix with respect to coordinate axes, T is a transpose operator, and D is determined by the perpendicular distance of the rotation center from the plane.
Optionally, the performing pre-correction processing on the original scanning data includes:
and sequentially carrying out air correction, shooting hardening correction and scattering correction on the original scanning data.
Optionally, the convolution filter function uses a high-frequency enhancement kernel, a low-frequency enhancement kernel or a standard kernel.
Optionally, the back projection function is:
wherein the content of the first and second substances,representing the normalized intersection volume weight of the jth pixel and the ray i; sbaseRepresenting the intersection area of the exact ray path and the pixel in the cross section, by the ray equationAnd the boundary of the pixel in the cross section is determined; h iseffThe expression represents the intersection effective height of the accurate ray path and the pixel in the axial direction, is determined by the intersection situation of a plane equation enclosed by the focal point boundary of the X-ray source on the axis and the boundary of all the detector units in the axial direction and the coordinate of the pixel in the axial direction, and Vol represents the volume of the unit pixel. M denotes the total number of exposures, Δ β 2 pi/M, L denotes the filtered backprojection weight, S denotes the detector subset that intersects the pixel, β denotes the total number of exposures, andmrepresenting the angular position of the X-ray source exposure and Q' representing the filtered projection data.
In a second aspect, there is provided an industrial X-ray system imaging apparatus, the apparatus comprising:
the system parameter loading module is used for loading physical parameters and scanning parameters of the industrial X-ray imaging system;
the accurate optical path positioning module is used for positioning an accurate optical path formed by the X-ray light source and all the detector units according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, and calculating a ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle;
the volume weight calculation module is used for calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and the grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position;
the system comprises an original data preprocessing module, a data processing module and a data processing module, wherein the original data preprocessing module is used for reading in original scanning data of an object to be scanned by an industrial X-ray system and performing pre-correction processing on the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data;
and the back projection reconstruction module is used for constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object.
Loading physical parameters and scanning parameters of an industrial X-ray imaging system; according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, positioning the accurate optical path formed by the X-ray light source and all the detector units, and calculating the ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle; calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position; reading in original scanning data of an industrial X-ray system on a scanned object, and performing pre-correction processing on the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data; and constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object. The problem of relatively poor spatial resolution of the reconstructed image in the prior art is solved, and the effect of improving the spatial resolution of the reconstructed image is achieved.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical solutions of the present invention more clearly understood and to implement them in accordance with the contents of the description, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
Drawings
FIG. 1 is a flow chart of a method of imaging an industrial X-ray system according to one embodiment of the present invention;
fig. 2 is a schematic device diagram of an imaging device of an industrial X-ray system according to an embodiment of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
Referring to fig. 1, a flowchart of a method of imaging in an X-ray system according to an embodiment of the present application is shown, where the method includes:
optionally, the physical parameters and scanning parameters of the X-ray imaging system include a focal size of the X-ray light source, a size of the detector, a detector offset, a rotation geometry parameter, an initial exposure positioning offset, an exposure position of the X-ray light source, and a physical grid parameter of the scanned object. Optionally, the focal spot size of the light source includes focal spot sizes in horizontal and vertical directions, the detector offset includes physical offsets of detectors in horizontal and vertical channel directions, the detector size includes physical unit sizes in horizontal and vertical directions, the rotation geometric parameter includes information of exposure positions of all radiation sources, initial angle offset and acquisition angle information of the radiation sources, and the physical grid parameter of the object to be scanned includes grid coordinate index, unit size and pixel physical offset.
102, positioning an accurate optical path formed by the X-ray light source and all detector units according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, and calculating a ray equation of the boundary of the X-ray source and the boundary of all the detector units under a given angle;
optionally, the positioning the precise optical path formed by the X-ray light source and all the detector units according to the physical parameter and the position parameter of the X-ray light source and the physical parameter and the position parameter of the detector, and calculating a ray equation of the boundary of the radiation source and the boundary of all the detector units at a given angle, including:
the ray equation is:
(A1/Z1)x+(B1/Z1)y+(C1/Z1)z=0
(A2/Z2)x+(B2/Z2)y+(C2/Z2)z=0
Vsrcrepresenting 2D source coordinate position, VdetRepresenting 2D detector coordinate position, Vsrc1And Vsrc2Is the coordinate, V, of the boundary of the X-ray source in the horizontal planedet1And Vdet2Coordinates of the boundary of the ith detector in the horizontal plane;
the plane equation of the upper and lower intersection of the plane defined by the focal point boundary of the X-ray light source on the axis and the boundaries of all the detector units on the axis is as follows:
A1x+B1y+C1z+D1=0
A2x+B2y+C2z+D2=0
wherein A is2+B2+C2=1,Raxis(. cndot.) is a 3 × 3 rotation matrix with respect to coordinate axes, T is a transpose operator, and D is determined by the perpendicular distance of the rotation center from the plane.
103, calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position;
the weights of the X-ray source and all the detector units and all the pixels are determined by adopting the intersection volume under the accurate path, and meanwhile, in order to ensure the consistency of the back projection result and the result of the traditional analytic method, the intersection weight is normalized by using the unit pixel volume, so that the normalized weight function of all the pixels at the given scanning position is obtained.
optionally, the performing pre-correction processing on the original scanning data includes:
and sequentially carrying out air correction, shooting hardening correction and scattering correction on the original scanning data.
105, carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data;
optionally, the convolution filter function uses a high-frequency enhancement kernel, a low-frequency enhancement kernel or a standard kernel.
And 106, constructing a back projection function according to the normalized weight function, and performing view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object.
Optionally, the back projection function is:
wherein the content of the first and second substances,representing the normalized intersection volume weight of the jth pixel and the ray i; sbaseRepresenting the intersection area of the accurate ray path and the pixel in the cross section, and determining the intersection area through the ray equation and the boundary of the pixel in the cross section; h iseffThe expression represents the intersection effective height of the accurate ray path and the pixel in the axial direction, is determined by the intersection situation of a plane equation enclosed by the focal point boundary of the X-ray source on the axis and the boundary of all the detector units in the axial direction and the coordinate of the pixel in the axial direction, and Vol represents the volume of the unit pixel. M denotes the total number of exposures, Δ β 2 pi/M, L denotes the filtered backprojection weight, S denotes the detector subset that intersects the pixel, β denotes the total number of exposures, andmrepresenting the angular position of the X-ray source exposure and Q' representing the filtered projection data.
In conclusion, by loading the physical parameters and the scanning parameters of the industrial X-ray imaging system; according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, positioning the accurate optical path formed by the X-ray light source and all the detector units, and calculating the ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle; calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position; reading in original scanning data of an industrial X-ray system on a scanned object, and performing pre-correction processing on the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data; and constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object. The problem of relatively poor spatial resolution of the reconstructed image in the prior art is solved, and the effect of improving the spatial resolution of the reconstructed image is achieved.
Referring to fig. 2, the present application further provides a schematic diagram of an apparatus of an imaging apparatus of an industrial X-ray system, as shown in fig. 2, the apparatus includes:
the system parameter loading module is used for loading physical parameters and scanning parameters of the industrial X-ray imaging system;
the accurate optical path positioning module is used for positioning an accurate optical path formed by the X-ray light source and all the detector units according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, and calculating a ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle;
the volume weight calculation module is used for calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and the grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position;
the system comprises an original data preprocessing module, a data processing module and a data processing module, wherein the original data preprocessing module is used for reading in original scanning data of an object to be scanned by an industrial X-ray system and performing pre-correction processing on the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data;
and the back projection reconstruction module is used for constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object.
In conclusion, by loading the physical parameters and the scanning parameters of the industrial X-ray imaging system; according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, positioning the accurate optical path formed by the X-ray light source and all the detector units, and calculating the ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle; calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position; reading in original scanning data of an industrial X-ray system on a scanned object, and performing pre-correction processing on the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data; and constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object. The problem of relatively poor spatial resolution of the reconstructed image in the prior art is solved, and the effect of improving the spatial resolution of the reconstructed image is achieved.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (8)
1. An industrial X-ray system imaging method, characterized in that the method comprises:
loading physical parameters and scanning parameters of an industrial X-ray imaging system;
according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, positioning the accurate optical path formed by the X-ray light source and all the detector units, and calculating the ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle;
calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position;
reading in original scanning data of an industrial X-ray system on a scanned object, and performing pre-correction processing on the original scanning data;
carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data;
and constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object.
2. The method of claim 1, wherein the physical parameters and scanning parameters of the X-ray imaging system include focal spot size of the X-ray light source, detector size, detector offset, rotation geometry, initial exposure positioning offset, X-ray light source exposure position, physical grid parameters of the scanned object.
3. The method of claim 2, wherein the focal spot size of the light source comprises horizontal and vertical focal spot sizes, the detector offset comprises physical offsets of the detector in the horizontal and vertical channel directions, the detector size comprises horizontal and vertical physical cell sizes, the rotation geometry parameters comprise information of exposure positions of all the radiation sources, initial angle offset of the radiation sources and acquisition angle information, and the physical grid parameters of the scanned object comprise grid coordinate index, cell size and pixel physical offset.
4. The method of claim 1, wherein the step of locating the precise optical path formed by the X-ray source and all the detector units according to the physical parameters and the position parameters of the X-ray source and the physical parameters and the position parameters of the detector and calculating the ray equation of the boundary of the source and the boundary of all the detector units at a given angle comprises:
the ray equation is:
(A1/Z1)x+(B1/Z1)y+(C1/Z1)z=0
(A2/Z2)x+(B2/Z2)y+(C2/Z2)z=0
wherein the content of the first and second substances,
Vsrcrepresenting 2D source coordinate position, VdetRepresenting 2D detector coordinate position, Vsrc1And Vsrc2Is the coordinate, V, of the boundary of the X-ray source in the horizontal planedet1And Vdet2Coordinates of the boundary of the ith detector in the horizontal plane;
the plane equation of the upper and lower intersection of the plane defined by the focal point boundary of the X-ray light source on the axis and the boundaries of all the detector units on the axis is as follows:
A1x+B1y+C1z+D1=0
A2x+B2y+C2z+D2=0
5. The method of claim 1, wherein the pre-correcting the raw scan data comprises:
and sequentially carrying out air correction, shooting hardening correction and scattering correction on the original scanning data.
6. The method of claim 1, wherein the convolution filter function employs a high frequency enhancement kernel, a low frequency enhancement kernel, or a standard kernel.
7. The method of claim 1, wherein the back-projection function is:
wherein the content of the first and second substances,representing the normalized intersection volume weight of the jth pixel and the ray i; sbaseRepresenting the intersection area of the accurate ray path and the pixel in the cross section, and determining the intersection area through the ray equation and the boundary of the pixel in the cross section; h iseffThe expression represents the intersection effective height of the accurate ray path and the pixel in the axial direction, is determined by the intersection situation of a plane equation enclosed by the focal point boundary of the X-ray source on the axis and the boundary of all the detector units in the axial direction and the coordinate of the pixel in the axial direction, and Vol represents the volume of the unit pixel. M represents the total exposure number, and Δ β ═ 2 πwhere/M, L represents the filtered backprojection weights, S represents the subset of detectors that intersect the pixel, βmRepresenting the angular position of the X-ray source exposure and Q' representing the filtered projection data.
8. An industrial X-ray system imaging apparatus, characterized in that the apparatus comprises:
the system parameter loading module is used for loading physical parameters and scanning parameters of the industrial X-ray imaging system;
the accurate optical path positioning module is used for positioning an accurate optical path formed by the X-ray light source and all the detector units according to the physical parameters and the position parameters of the X-ray light source and the physical parameters and the position parameters of the detector, and calculating a ray equation of the boundary of the ray source and the boundary of all the detector units under a given angle;
the volume weight calculation module is used for calculating the intersection volume weight of the X-ray light source and all the detector units and all the pixels under the accurate optical path according to the defined physical coordinate and the grid size of the scanning object space, and performing normalization processing on the intersection weight by using the unit pixel volume to obtain a normalization weight function of all the pixels at the given scanning position;
the system comprises an original data preprocessing module, a data processing module and a data processing module, wherein the original data preprocessing module is used for reading in original scanning data of an object to be scanned by an industrial X-ray system and performing pre-correction processing on the original scanning data; carrying out convolution filtering processing on the pre-corrected projection data according to the horizontal channel direction through a convolution filtering function to obtain filtered projection data;
and the back projection reconstruction module is used for constructing a back projection function according to the normalized weight function, and carrying out view-angle-by-view weighted back projection operation on the filtered projection data to realize accurate reconstruction of the scanned object.
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