CN112636826B

CN112636826B - Optical module testing system with OAM function and testing method

Info

Publication number: CN112636826B
Application number: CN202110274379.5A
Authority: CN
Inventors: 蒋昌明; 蓝海涛; 黄博强; 郑波; 过开甲; 魏志坚; 张伟; 孙鼎
Original assignee: Jiangxi Sont Communication Technology Co ltd; Shenzhen Xunte Communication Technology Co ltd
Current assignee: Jiangxi Sont Communication Technology Co ltd; Shenzhen Xunte Communication Technology Co ltd
Priority date: 2021-03-15
Filing date: 2021-03-15
Publication date: 2021-06-08
Anticipated expiration: 2041-03-15
Also published as: CN112636826A

Abstract

The invention relates to a test system and a test method of an optical module with OAM function, wherein the test system comprises: a reference light assembly for emitting a mixed light signal, the mixed light signal comprising: 25G main service optical signals and OAM optical signals which are sent according to the OAM modulation information and carry specified wavelength information; the optical module to be tested is used for receiving the mixed optical signal and identifying the wavelength information of the OAM optical signal; and the control component is used for determining whether the optical module to be detected is qualified according to the identification result, the OAM modulation information is information generated by the control component according to the corresponding relation between the number of the optical module to be detected and the wavelength information of the OAM optical signal, and the reference optical component receives the OAM modulation information to store the OAM modulation information in a specified bit position of a data exchange area of the reference optical component. The test system of the invention can effectively solve the problem that each manufacturer can not test the wavelength information of the OAM optical signal, realizes the effects of consistent judgment standard and interconnection and intercommunication, and can provide the production efficiency by times.

Description

Optical module testing system with OAM function and testing method

Technical Field

The invention relates to the technical field of optical communication testing, in particular to a testing system and a testing method of an optical module with an OAM function.

Background

At present, each major operator in China actively pushes a 12-wave color optical module based on a semi-active optical network architecture to become a hotspot, and according to the requirements of the existing protocol, the transmitting end (TX) of such an optical module comprises two major functional modules, namely a conventional 25G main service transmitting functional module, which undertakes 25G main service optical signal transmission, and the other one is an OAM signal transmitting functional module, which is used for transmitting a low-frequency OAM optical signal (OAM optical signal wavelength information is one of its components), and the two optical signals are superposed together to become a mixed optical signal and are output from the transmitting end of the optical module together, and an optical module receiving end (RX) is respectively designed with two corresponding functional modules to process the 25G main service optical signal and the OAM optical signal for the incoming mixed optical signal, the OAM signal processing function module needs to identify all information carried by the OAM optical signal in the incoming mixed optical signal one by one, that is, all wavelength information in the OAM signal needs to be identified, and these wavelength information are numbered 1, 2 … 12 in sequence according to the existing protocol requirements, as shown in fig. 1.

It can be understood that, in the 5G fronthaul WDM network, the AAU (Active Antenna Unit) side device, the transmission fiber, and the DU (Distributed Unit) side device (as shown in fig. 2) are included, the transmitting and receiving optical signals of the AAU side device optical module are connected to the common port of the WDM multiplexer/demultiplexer _2# via the common port of the WDM multiplexer/demultiplexer _1#, and then are interactively transmitted with the receiving and transmitting optical signals of the DU side device optical module, so as to complete the transmission of the information stream.

In the 5G semi-active scheme, the optical module AAU _1 #/the optical module DU _1#, the optical module AAU _2 #/the optical module DU _2#, the optical module AAU _3 #/the optical module DU _3#, the optical module AAU _4 #/the optical module DU _4#, the optical module AAU _5 #/the optical module DU _5#, and the optical module AAU _6 #/the optical module DU _6# are all paired for use. The 12-wavelength color light optical modules are configured into 6 pairs to form a set, and for the identification of the wavelength information component in the OAM signal, the 6 pairs are identical, so a pair of color light modules, i.e., an optical module AAU _1 #/an optical module DU _1#, is taken as an example for explanation.

According to the existing protocol, an OAM signal processing function module inside an optical module AAU _1# receiving end (RX) should be able to recognize:

1, the wavelength information is 1267.5nm, namely 1 is required to be identified;

2, the wavelength information is 1274.5nm, namely 2 is to be identified;

similarly, the OAM signal processing function module inside the optical module DU _1# receiving end (RX) also can recognize:

3, 1267.5nm wavelength information, namely 1 is to be identified;

4, wavelength information of 1274.5nm, namely 2 is to be identified;

this is done to the 2 nd, 3 rd, 4 th, 5 th, 6 th pairs as shown in fig. 3A and 3B.

According to the semi-active optical network architecture, according to the protocol requirement, when optical modules at an AAU side and a DU side are respectively used as receiving ends, OAM wavelength information needs to be identified, and two major problems exist at present aiming at the protocol requirement; in addition, it is also fatal that the judgment standards of various manufacturers are inconsistent, and interconnection and intercommunication between different manufacturers cannot be achieved.

In order to solve the above problems, a test method and system for optical module wavelength information identification with an OAM signal processing function module, which are reasonably compatible with optical modules of various manufacturers, are needed.

Disclosure of Invention

Technical problem to be solved

In view of the above drawbacks and deficiencies of the prior art, the present invention provides a system and a method for testing an optical module with an OAM function.

(II) technical scheme

In order to achieve the purpose, the invention adopts the main technical scheme that:

in a first aspect, an embodiment of the present invention provides a test system for an optical module having an OAM function, where the test system is configured to test an OAM function of the optical module identifying wavelength information in an OAM optical signal, and the test system includes:

a reference light assembly that emits a mixed light signal, the mixed light signal emitted by the reference light assembly comprising: 25G main service optical signals and OAM optical signals which are sent according to the OAM modulation information and carry specified wavelength information;

the attenuator is used for simulating the optical path loss of the mixed optical signal;

the optical module to be tested is used for receiving the mixed optical signal after passing through the attenuator and identifying the specified wavelength information of the OAM optical signal and the 25G main service optical signal;

the control assembly is used for determining whether the optical module to be tested is qualified or not according to the identification result of the optical module to be tested;

the control component is connected with the reference optical component, the OAM modulation information is generated by the control component according to the corresponding relation between the number of the optical module to be tested and the wavelength information of the OAM optical signal, and the reference optical component receives the OAM modulation information and stores the OAM modulation information in the appointed bit position of a data exchange area in the reference optical component;

the wavelength information of the OAM optical signal is the wavelength information that can be recognized by the optical module to be tested.

Optionally, the reference light assembly comprises: the first test board and the reference optical module;

the first test board provides a power supply for the reference optical module; and the first microcontroller in the first test board passes through I²The bus C is communicated with a microcontroller of the reference optical module;

the control assembly is connected with the optical module to be tested by means of a second test board;

the second test board provides a power supply for the optical module to be tested; and the second microcontroller in the second test board passes through I²And the C bus is communicated with a microcontroller of the optical module to be tested.

Optionally, the control assembly comprises: the system comprises an upper computer and a multi-channel error code device;

the multichannel error code instrument is connected with a first test board through a coaxial cable and sends 25Gbps electric signals corresponding to 25G main service optical signals to the first test board;

the upper computer is connected with a first test board through a USB communication line and sends the OAM modulation information to the first test board, so that a first microcontroller of the first test board stores the OAM modulation information in a specified bit position of a data exchange area A0 table polled by a microcontroller in the reference optical module;

and the upper computer is connected with the second test board through a USB communication line and receives the identification result of the optical module to be tested, which is sent by the second test board.

Optionally, the reference optical module is a color light optical module with a serial number inserted into the AUU side or the DU side of the first test board, and the optical module to be tested is a color light optical module with a serial number on any one of the AUU side or the DU side.

Optionally, the reference light module comprises:

a microcontroller, the microcontroller passing through I²The C bus is connected with the first test board; polling information of a specified bit position in a table of a data exchange area A0 after power-on and sending a first instruction, wherein the first instruction carries polling information;

the OAM signal transmitting circuit functional unit is used for generating an OAM optical signal used for referring to specified wavelength information sent by an optical module transmitting optical port according to the information of the first instruction;

the 25G emission main service circuit function unit is used for generating a 25G main service optical signal emitted by a reference optical module emission optical port according to the low level signal sent by the microcontroller;

the transmitting optical port is used for transmitting OAM optical signals and 25G main service optical signals;

and the 25G transmission main service circuit function unit, the OAM signal transmission circuit function unit and the transmission optical port are all connected with the microcontroller.

In a second aspect, an embodiment of the present invention further provides a test method based on any one of the test systems in the first aspect, including:

m1, the control component acquires the number of the optical module to be tested;

the method comprises the following steps that M2, a control assembly sends 25Gbps electric signals and OAM modulation information to a reference optical assembly according to the number of an optical module to be tested, so that the reference optical assembly sends out mixed optical signals according to the electric signals and the OAM modulation information;

the OAM modulation information is generated by the control component according to the corresponding relation between the number of the optical module to be tested and the wavelength information of the OAM optical signal;

m3, the control component receives the identification result information of the optical module to be detected, and judges whether the wavelength information of the OAM optical signal in the mixed optical signal is correctly identified;

and if so, determining that the optical module to be tested is qualified.

Optionally, before M1, the method further includes:

m0, selecting a color light module as a reference light module, connecting the color light module with a first test board, and accessing a test optical fiber at a light emitting port of the reference light module;

and connecting the optical module to be tested with the second test board, and accessing the test optical fiber passing through the attenuator at the receiving port of the optical module to be tested.

Optionally, the M2 comprises:

the upper computer sends OAM modulation information to the first test board through a USB communication line, the error code meter sends 25Gbps electric signals to the first test board through a cable, the first test board stores the OAM modulation information in a specified bit position of a data exchange area in the reference optical module, and the 25Gbps electric signals are transmitted to the reference optical module;

after being powered on, a microcontroller of the reference optical module polls information of a specified bit position of a data exchange area, and generates a first instruction of an OAM signal transmitting circuit functional unit according to the polled information, wherein the OAM signal transmitting circuit functional unit generates an OAM optical signal used for transmitting an optical port according to the first instruction; and

after the reference optical module is powered on, the microcontroller sends a low level signal to the 25G main service transmission circuit functional unit, so that the 25G main service transmission circuit functional unit generates a 25G main service optical signal;

the transmitting optical port sends out a mixed optical signal comprising an OAM optical signal and a 25G main service optical signal;

Optionally, the method further comprises:

m4, replacing the optical module to be tested connected with the second test board, and selecting another color light optical module with the number to be tested as the optical module to be tested;

and executing M1 to M3 again aiming at the replaced optical module to be tested.

(III) advantageous effects

The test system can realize the OAM function of identifying the wavelength information in the OAM optical signal in any optical module, can realize the test of other optical modules to be tested by adopting one reference optical module, can effectively solve the test cost of various manufacturers, and can improve the test efficiency by times.

Particularly, the test system of the invention can realize the unification of the test standards of various manufacturers and solve the problem of interconnection and intercommunication.

In addition, the testing method can effectively solve the problem of identification of wavelength information of OAM signals of the optical module in the 5G semi-active network, solves the problems that test judgment standards of manufacturers are inconsistent and interconnection and intercommunication cannot be realized, reduces the cost and improves the testing efficiency.

Drawings

Fig. 1 is a schematic diagram illustrating a relationship between wavelength information and a number in an OAM optical signal according to a conventional protocol;

fig. 2 is a schematic structural diagram of a 5G semi-active optical network architecture;

fig. 3A is a schematic diagram of a relationship between wavelength information and a number on the AAU side of an optical module;

fig. 3B is a schematic diagram of a relationship between wavelength information and serial numbers at the DU side of the optical module;

fig. 4 is a schematic structural diagram of a test system of an optical module with an OAM function in the embodiment of the present invention;

fig. 5 is a schematic structural diagram of a test system for an optical module with an OAM function according to another embodiment of the present invention.

Detailed Description

For the purpose of better explaining the present invention and to facilitate understanding, the present invention will be described in detail by way of specific embodiments with reference to the accompanying drawings.

In order to better understand the above technical solutions, exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

In combination with the semi-active optical network architecture in the prior art shown in fig. 2, according to the protocol requirement, both the AAU side and the DU side optical module receiving end need to identify OAM wavelength information, and for this protocol requirement, there are two major problems at present, the first is that no instrument manufacturer has developed a corresponding test instrument system in the industry, i.e., no standard instrument system can be used, and the second is a test system developed by the manufacturer who participates in the development of the optical module with OAM function, and there are two major problems below.

Firstly, the operation is complex and the production efficiency is low.

Before the scheme of the present application is not adopted, a first scheme adopted by an optical module manufacturer is to insert an optical module AAU _1# and an optical module DU _1# into two test boards, perform wavelength identification according to fig. 3A and 3B, after the test is completed, replace the test boards with AAU _2# and DU _2# respectively, insert test fibers, and so on until AAU _6# and DU _6#, after the test is completed, the AAU side and the DU side must be strictly paired and tested. Taking AAU _6# and DU _6# as cases, the

OAM wavelength information

11 or 12 transmitted by DU _6# is sent to the OAM signal demodulation processing circuit function module at the AAU _6# receiving end, the judgment logic is 11 or 12 is correct, other wavelength information is wrong, and then the optical module meets the protocol requirements. However, the disadvantage of this solution is lack of flexibility, if one of them is lacked, the other one of the pair cannot be tested, the optical module on the test board at the other two ends needs to be plugged and unplugged every time the test is performed, and meanwhile, the optical ports of the optical modules at the two ends also need to be plugged and unplugged every time the test is performed, which is inefficient, and the service life of the connector on the test board is reduced due to excessive plugging and unplugging of the optical modules from the test board.

Secondly, it is also fatal that the judgment standards of various manufacturers are inconsistent, and interconnection and intercommunication between different manufacturers cannot be achieved.

A second solution adopted by a manufacturer of an existing optical module is to fix an optical module, which is usually AAU _1# or DU _1#, no matter AAU _1# or DU _1#, since an OAM optical signal sent from a transmitting optical port can only carry wavelength information and is random 1 and 2, since optical modules to be tested are AAU _1# -AAU _6# and DU _1# -DU _6#, wherein AAU _2# -AAU _6# and DU _2# -DU _6#, these optical modules are described by taking AAU _6# as a case, according to fig. 3A and 3B, when an OAM signal demodulation processing circuit function module at a receiving end of the optical module to be tested receives

OAM wavelength information

11 or 12, the optical modules are determined to be correct, other wavelength information is determined to be wrong, but since the OAM signal transmission wavelength information of the reference optical module is 1 or 2, the OAM information can not always be received 11 or 12, therefore, the wavelength information is always determined to be an error, and in order to solve the problem, an optical module manufacturer adopts a method of changing the determination logic of an OAM signal demodulation processing circuit function module of an AAU _6# receiving end into a logic, wavelength information falling within 1 to 12 is counted as correct, and the wavelength information outside the interval of 1 to 12 is an error, which introduces two problems:

problem 1: the logic of the judgment is not strict and does not conform to the protocol, because the optical module AAU _6# receives the correct

OAM wavelength information

11 or 12 and the wrong OAM wavelength information according to the protocol (as shown in fig. 3A and fig. 3B), and in this scheme, as long as the OAM wavelength information falls within 1 to 12, the OAM wavelength information is correct, and therefore does not conform to the protocol;

problem 2: for OAM wavelength identification, some optical module manufacturers adopt a first scheme, and some optical module manufacturers adopt a second scheme, and because the logics of OAM wavelength information identification and judgment of the two schemes are inconsistent, different manufacturers always have errors during intercommunication test, and intercommunication and interconnection cannot be achieved.

Based on the above problems, the applicant has proposed the following technical solutions to effectively solve the above technical problems.

Example one

As shown in fig. 4, an embodiment of the present invention provides a test system for an optical module with an OAM function, where the test system of this embodiment may include:

the attenuator is used for simulating the optical path loss of the mixed optical signal; the method is mainly used for simulating the optical path loss in a commercial scene used by the optical module to be tested. That is to say, in the commercial scene of the optical module to be tested, there are various connectors, optical fiber jumpers, optical switches, optical splitters, and passive multiplexer/splitters in the optical network architecture between the AAU side and the DU side, and these different types of devices all cause optical power attenuation, and in addition, these different types of different individuals cause comprehensive optical power attenuation, which varies greatly.

And the optical module to be tested is used for receiving the mixed optical signal after passing through the attenuator and identifying the specified wavelength information of the OAM optical signal and the 25G main service optical signal. It should be noted that the optical module to be tested in the present invention may also identify other information of the OAM optical signal, and this embodiment mainly describes how to test the wavelength information, so the identification process of other information may refer to the prior art, and this embodiment does not limit this.

And the control component is used for determining whether the optical module to be tested is qualified according to the identification result of the optical module to be tested.

Referring to fig. 3A and 3B, fig. 3A and 3B show a corresponding relationship between the number of the optical module to be measured and the wavelength information of the OAM optical signal.

The control component of this embodiment is connected to the above-mentioned reference optical component, where the OAM modulation information is information generated by the control component according to a correspondence between a number of an optical module to be measured and wavelength information of an OAM optical signal, and the reference optical component receives the OAM modulation information and stores it in a specified bit position of a data exchange area in the reference optical component (for example, 128 bytes of an a0 table of the reference optical module);

The test system of the embodiment improves the software hardware structure, can better realize the identification of the wavelength information of the OAM signal in any optical module, can realize the test of other optical modules to be tested by adopting one reference optical module, can effectively solve the test cost of each manufacturer, and simultaneously improves the test efficiency.

For better understanding, fig. 5 shows a specific structural schematic diagram of a test system, and in fig. 5, the reference light assembly includes: the first test board and the reference optical module; the first test board provides a power/DC voltage (e.g., 3.3v +/-5%) to the reference optical module; and the first microcontroller in the first test board passes through I²The bus C is communicated with a microcontroller of the reference optical module;

meanwhile, the control assembly is connected with the optical module to be tested by means of a second test board; the second test board provides power/DC voltage (such as 3.3v +/-5%) for the optical module to be tested; and the second microcontroller in the second test board passes through I²And the C bus is communicated with a microcontroller of the optical module to be tested.

The control assembly of this embodiment includes: host computer and multichannel error code appearance.

The multi-channel error code device of the embodiment is connected with the first test board through the coaxial cable, and sends a 25Gbps electrical signal corresponding to the 25G main service optical signal to the first test board. Fig. 5 also shows that the error code device is connected to the second test board through a coaxial cable, and if the function of the second test board is changed to the first test board, the error code device can transmit a 25Gbps electrical signal to the second test board. The error code meter of the embodiment can provide 25Gbps electrical signal input for a transmitting end (TX) driving chip in a 25G color optical module with an OAM function, so as to prevent the transmitting end of the optical module of some manufacturers from working normally due to no 25Gbps electrical signal input, and further, the output of an OAM optical signal is influenced.

The upper computer is connected with the first test board through a USB communication line and sends the OAM modulation information to the first test board, so that the first microcontroller in the first test board stores the specified bit position (namely the 128 th byte of the A0 table) in the data exchange area A0 table polled by the microcontroller in the reference optical module according to the OAM modulation information;

Generally, the upper computer may be a control computer/electronic device or the like, and shown in fig. 5 is a control computer having upper computer software, which connects the first test board and the second test board by means of a USB communication line through a USB interface. The control computer of this embodiment is integrated with software/algorithm capable of generating OAM modulation information according to the numbers.

The reference optical module of the embodiment may include: a microcontroller (e.g., microcontroller _ B in fig. 5), a data viewing unit, an OAM signal transmission circuit functional unit (e.g., OAM signal transmission functional circuit in fig. 5), a 25G transmission main service circuit functional unit (e.g., 25G transmission main service functional circuit in fig. 5), and a transmission optical port (e.g., TX optical port in fig. 5).

Wherein, the 25G emission main service circuit function unit, the OAM signal emission circuit function unit and the emission optical port are all connected with the microcontroller, and the microcontroller is connected with the optical fiber through I²The C bus is connected to a first test board,

and the OAM signal transmitting circuit functional unit and the 25G transmitting main service circuit functional unit are both connected with a transmitting optical port.

Of course, in practical applications, each optical module further includes a receiving optical port (e.g., RX optical port in fig. 5), and this embodiment does not limit the structure of the optical module, and fig. 5 is only an exemplary structure.

The microcontroller mentioned above passes through I²The C bus is connected with the first test board; after power-onPolling information of a specified bit position in a data exchange area A0 table and sending a first instruction, wherein the first instruction carries polling information;

the 25G emission main service circuit function unit is used for generating a 25G main service optical signal emitted by a reference optical module emission optical port according to the low level signal transmitted by the microcontroller;

fig. 5 shows that an adjustable attenuator is arranged between the reference optical module and the optical module to be measured, and the adjustable attenuator is respectively connected with the reference optical module and the optical module to be measured through optical fibers. In fig. 5, the distance between the reference optical module and the optical module to be measured is 10km, which is used to simulate one of the actual commercial scenes, that is, the distance between the AAU side optical module and the DU side optical module reaches 10 km. In an actual commercial scenario, the distance between the AAU and the DU may be any other distance, such as 1km, 3km, 5km, 8km., etc., and the farthest distance does not exceed 10km, which is exemplified by the farthest distance of 10km in this embodiment.

Particularly, in the prior art, the reference optical module is a color optical module with a serial number on the AAU side, and the optical module to be measured must be a color optical module with a serial number corresponding to the DU side. Or, the reference optical module is a color optical module numbered on the DU side, and the optical module to be tested is a color optical module numbered correspondingly on the AAU side. In this embodiment, the reference optical module may be a color light optical module with any number on the AUU side or the DU side inserted into the first test board, and the optical module to be tested may also be a color light optical module with any number on the AUU side or the DU side. In this way, in the test process, all the optical modules to be tested can be tested only by selecting one reference optical module to be inserted into the first test board, and the reference optical module does not need to be replaced in the test process, so that the test efficiency can be improved exponentially.

For better understanding, the color optical module with OAM function is called a color optical module because the wavelength of the optical signal of the transmitting optical port (TX) is different no matter the AAU side 6 optical modules or the DU side 6 optical modules, the color optical module with OAM function means that the transmitting optical port (TX) of this type of optical module also transmits a low frequency OAM optical signal in addition to the conventional 25G main service optical signal, the two are superimposed and output from the transmitting optical port together, the optical module receiving optical port (RX) is designed with corresponding functional modules to process the 25G main service optical signal and the OAM optical signal respectively for the incoming optical signal. The OAM signal transmitting circuit functional unit needs to identify wavelength information in an OAM optical signal inside incident light (the wavelength information is one of the components of the OAM signal).

The reference optical module connected to the first test board shown in fig. 5 is the color optical module numbered 1 on the DU side, and the optical module to be tested is the color optical module numbered 6 on the AAU side.

To better understand the operation of the test system of FIG. 5 described above, the following description is provided.

In the first step, in fig. 5, an optical module DU _1# is selected as a reference optical module, the first test board is plugged, only a test optical fiber needs to be inserted into a light emitting port of the reference optical module DU _1#, the first test board provides a current source and modulation information for the reference optical module DU _1#, and in a subsequent OAM wavelength identification test, the reference optical module does not need to be replaced, and the test optical fiber does not need to be plugged and unplugged, so that the test efficiency is greatly improved.

Secondly, any one of AAU side AAU _1# -AAU _6# can be used as an optical module to be tested, and as an example of the optical module to be tested AAU _6# in fig. 5, a second test board is inserted into the optical module to be tested AAU _6#, a test optical fiber is inserted into a receiving optical port of the optical module to be tested AAU _6#, and a current source and modulation information are provided for the reference optical module AAU _6# through the first test board, so that the structural construction of the OAM wavelength information identification test system is completed.

Thirdly, according to the existing protocol, bytes 128-. In this embodiment, the byte 128 in the optical module a0 table is used as a register to store the OAM modulation information input to the reference optical module by the first testing board. That is, the byte 128 in the a0 table may be used as a register of numbers to send out OAM wavelength information during testing.

In fig. 5, the optical module to be tested AAU _6# is inserted into the second test board, and then, according to the corresponding relationship between the OAM wavelength information and the number shown in fig. 3A, the

numbers

11 and 12 of the OAM wavelength information need to be identified by AAU _6 #. By means of the control computer and the first test board, 11 or 12 are stored in the register of the reference light module DU _1 #.

The control computer of this embodiment stores upper computer software/upper computer algorithm, and the upper computer software/upper computer algorithm runs on the control computer, and a readable and writable OAM wavelength information input area is presented on the control computer interface.

Fourthly, when a user inputs the OAM wavelength information corresponding to the number 11 which can be identified by the optical module to be tested, the control computer follows the USB protocol and transmits the OAM wavelength information to a first microcontroller on a first test board through a USB data line, and the first microcontroller transmits the OAM wavelength information to a standard I²The interface C is passed to the reference optical module DU _1#, where the microcontroller stores it in the 128 th byte of the table of the data exchange area a 0.

Fifthly, when a test is started, when the microcontroller of the reference optical module DU _1# receives a 25Gbps electrical signal, the microcontroller of the reference optical module DU _1# calls firmware (i.e., an algorithm program) to poll 128 bytes of an a0 table of the reference optical module, and when the 128 bytes of the a0 table are detected to be 11, the microcontroller in the reference optical module sends a first instruction to the OAM signal transmitting circuit function unit to generate an OAM optical signal with wavelength information (e.g., 1367.5 nm) corresponding to the number 11, so that the optical signal sent by the transmitting optical port of the reference optical module includes a designated OAM optical signal, and the number of the wavelength information of the OAM optical signal is 11.

The improvement of the reference optical module in the step can overcome the defect that the reference optical module DU _1# in the prior art can only send the OAM wavelength information with the number of 1 or 2, so that the reference optical module at one DU side can test all the optical modules at the AAU side without plugging in and out in the test process. Similarly, the reference optical module on the AAU side can test all the optical modules on the DU side without plugging and unplugging.

It should be noted that, if the wavelength information carried by the OAM optical signal sent by the reference optical module is the wavelength information corresponding to the number of the reference optical module itself, at this time, the control computer may not send any OAM modulation information, at this time, the default value is stored in the 128 bytes of the a0 table of the data storage area, and at this time, the reference optical module may send the corresponding wavelength information according to the number information itself. Of course, in another embodiment, the control computer may also send out the corresponding OAM modulation information to be stored in the data storage area.

And sixthly, transmitting the OAM optical signal carrying the wavelength information number of 11 to a receiving optical port of the AAU _6#, identifying through an OAM signal demodulation processing function circuit, if the OAM optical signal can be identified normally, indicating that the current optical module to be tested is qualified, if the current optical module to be tested is not qualified, indicating that the identification is not passed, and terminating the test process, namely judging that the OAM wavelength identification function/OAM function of the AAU _6# is failed, and determining that the OAM optical signal is unqualified.

Seventhly, when the user inputs OAM wavelength information number 12 through the control computer, the control computer follows the USB protocol and transmits the OAM wavelength information number to the first microcontroller of the first test board through the USB data line, and the first microcontroller transmits the OAM wavelength information number to the first microcontroller through the standard I²The C interface passes to the 128 th byte (i.e. byte 128) of the table of the data exchange area a0 in the microcontroller inside the reference optical module DU _1 #.

When a test is started, a microcontroller of a reference optical module DU _1# polls and reads that byte 128 bytes in an a0 table are 12, the microcontroller in the reference optical module sends a first instruction to an OAM signal transmitting circuit function unit, so that an optical signal sent by a transmitting optical port of the reference optical module includes an OAM optical signal with specified wavelength information (1374.5 nm), the OAM optical signal carrying the specified wavelength information of 12 is transmitted to an OAM signal receiving and demodulating processing function circuit of a receiving optical port of the AAU _6# for judgment/identification, if the OAM optical signal can be normally identified, the OAM optical signal is judged to be a qualified product, if the OAM optical signal can not be normally identified, the identification is not passed, and the OAM wavelength identification function of the AAU _6# is judged to be a failed product.

In another embodiment, the optical module to be tested is replaced by any one of DU _1# -DU _6#, in the case of DU _1#, the second test board is plugged into the second test board, and the test optical fiber is plugged into the receiving optical port, so that the reference optical module can send an OAM optical signal of wavelength information specified by any one of AAU _1# -AAU _6# on the AAU side and can also send an OAM optical signal of wavelength information specified by any one of DU _1# -DU _6# on the DU side without being mechanically and rigidly identified according to pairing of AAU _1#/DU _1# -AAU _6#/DU _6 #.

Referring to fig. 3B, according to OAM wavelength identification, an OAM signal transmitting circuit function unit of a receiving optical port of an optical module DU _1# to be tested needs to identify

OAM wavelength information

1 and 2, by controlling upper computer software of a computer, byte 128 of a0 table of a reference optical module AAU _1# is set to 1, when a firmware of the reference optical module AAU _1# reads byte 128 of a0 table to 1, an OAM optical signal with specific wavelength information (1267.5 nm) is transmitted from a transmitting optical port of the reference optical module, a wavelength information component in the OAM optical signal is forcibly modified to 1, the OAM optical signal carrying wavelength information number 1 is transmitted to a receiving end of the optical module DU _1# to be tested for judgment, if it can be normally identified, the following steps are performed, if it cannot be identified, the identification is described to fail, a terminating program is described to determine that the OAM identification function of the optical module DU _1# to be tested is failed, the product is not qualified.

The A0 byte 128 of the reference optical module AAU _1# is set to be 2, when a microcontroller of the reference optical module AAU _1# reads that the A0 byte 128 byte is 2, a specific OAM optical signal is sent out from a transmitting optical port, the number component of wavelength information in the OAM optical signal is forcibly modified to be 2, the OAM optical signal carrying the wavelength information with the number of 2 is transmitted to a receiving optical port of the optical module DU _1# to be detected for judgment, if the OAM optical signal can be normally identified, the OAM optical signal is judged to be a qualified product, if the OAM optical signal cannot be normally identified, the identification is not passed, the OAM wavelength identification function of the optical module DU _1# to be detected is judged to be invalid, and the OAM optical signal is.

The test system of the embodiment can effectively identify the wavelength information of the OAM signal of the optical module in the 5G semi-active network, solves the problems that test judgment standards of manufacturers are inconsistent and interconnection and intercommunication cannot be achieved, reduces the cost and improves the test efficiency.

Example two

According to another aspect of the embodiments of the present invention, an embodiment of the present invention further provides a method for testing the test system, where the method for testing the test system of the present embodiment may include:

and if so, determining that the optical module to be tested is qualified.

In practical applications, before step M1, the testing method further includes:

Accordingly, the M2 includes:

after the reference optical module is powered on, the microcontroller sends a low level signal to the 25G main service transmitting circuit functional unit based on a set firmware program, so that the 25G main service transmitting circuit functional unit generates a 25G main service optical signal;

the transmitting optical port sends out a mixed optical signal comprising an OAM optical signal and a 25G main service optical signal; the wavelength information of the OAM optical signal is the wavelength information that can be recognized by the optical module to be tested.

That is, the number of the optical module to be tested is stored in the byte 128 byte of the optical module a0 table in advance, the microcontroller of the reference optical module polls and reads the byte 128 byte information of the a0 table, and then an OAM optical signal carrying the specified wavelength information is sent.

In another optional implementation manner, the testing method may further include the following step M4:

The testing method of the embodiment can effectively solve the problem of identification of wavelength information of OAM signals of the optical module in the 5G semi-active network, solves the problems that test judgment standards of manufacturers are inconsistent and interconnection and intercommunication cannot be achieved, reduces cost and improves testing efficiency.

It should be noted that in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the terms first, second, third and the like are for convenience only and do not denote any order. These words are to be understood as part of the name of the component.

Furthermore, it should be noted that in the description of the present specification, the description of the term "one embodiment", "some embodiments", "examples", "specific examples" or "some examples", etc., means that a specific feature, structure, material or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, the claims should be construed to include preferred embodiments and all changes and modifications that fall within the scope of the invention.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention should also include such modifications and variations.

Claims

1. A test system of an optical module having an OAM function, the test system comprising:

a reference light assembly that emits a mixed light signal, the mixed light signal emitted by the reference light assembly comprising: 25G main service optical signals and OAM optical signals which are sent out according to operation, maintenance and management (OAM) modulation information and carry specified wavelength information;

2. The test system of claim 1, wherein the reference light assembly comprises: the first test board and the reference optical module;

3. The test system of claim 2,

the control assembly includes: the system comprises an upper computer and a multi-channel error code device;

4. The test system of claim 2,

the reference optical module is a color light optical module with a serial number inserted into the AUU side or the DU side of the first test board, and the optical module to be tested is a color light optical module with a serial number of any one of the AUU side or the DU side.

5. The test system of claim 3, wherein the reference light module comprises:

6. A test method based on the test system of any one of claims 1 to 5, comprising:

and if so, determining that the optical module to be tested is qualified.

7. The test method of claim 6, wherein the reference light assembly comprises: when the first test board and the reference light module are used, before M1 of the test method, the method further includes:

8. The test method of claim 7, wherein the control assembly comprises: host computer and multichannel error code appearance, reference light module includes: the system comprises a microcontroller, an OAM signal transmitting circuit functional unit, a 25G transmitting main service circuit functional unit and a transmitting optical port; the 25G emission main service circuit function unit, the OAM signal emission circuit function unit and the emission optical port are all connected with the microcontroller;

the M2 includes:

9. The test method of claim 7, further comprising: