CN112596257B - Optical axis calibration method of off-axis reflective optical lens - Google Patents
Optical axis calibration method of off-axis reflective optical lens Download PDFInfo
- Publication number
- CN112596257B CN112596257B CN202011628207.5A CN202011628207A CN112596257B CN 112596257 B CN112596257 B CN 112596257B CN 202011628207 A CN202011628207 A CN 202011628207A CN 112596257 B CN112596257 B CN 112596257B
- Authority
- CN
- China
- Prior art keywords
- axis
- mirror
- adjusting
- tested
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/30—Collimators
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0668—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror having non-imaging properties
- G02B17/0684—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror having non-imaging properties for light collecting, e.g. for use with a detector
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The invention discloses an optical axis calibration method of an off-axis reflective optical lens, which is characterized in that a calibration laser transmitter is placed in a parallel light path, and the optical axis of a test system and the optical axis of a tested system can be respectively calibrated by utilizing the collimation characteristic of a laser emergent beamlet to realize the rough alignment of the test optical axis; and finally, the accurate calibration of the optical axis during the MTF test of the off-axis reflective optical system is realized by combining the paraxial approximate equal image height principle. Compared with the prior art, the technical method and the device provided by the invention have the following advantages: the optical axis calibration method can quickly and accurately adjust the test state of the off-axis reflective optical system, and is a necessary means for accurately testing the MTF of the off-axis reflective optical system.
Description
Technical Field
The invention belongs to the technical field of photoelectric test instrument assembly and adjustment, and particularly relates to an optical axis calibration method of an off-axis reflective optical lens.
Background
In recent years, along with the development of aerospace industry and airborne and shipborne weaponry in China, the performance requirements of the off-axis reflective optical system are increasingly increased, and the high-precision test requirement on the MTF of the off-axis reflective optical system is provided. How to accurately and efficiently calibrate the optical axis of the off-axis reflective optical system, determine the optimal focal plane position and ensure the test precision becomes an important process of MTF test calibration and inspection of the off-axis reflective optical system.
The design of the off-axis reflective optical system can ensure the advantages of long focal length, large light-passing aperture and high resolution, and simultaneously can realize the advantages of light path deflection, small system volume, no central blocking and light weight, so that the space-to-ground observation system can be in the development stage from a refractive type to a reflective type, and from a coaxial optical system to an off-axis optical system. The refraction type optical system is limited by optical materials, so that the large-caliber and light-weight design is difficult to achieve, the reflection type optical system is less limited by materials, the light-weight design is convenient, chromatic aberration is completely avoided, and the system transmittance is high. The center of the off-axis reflective optical system is not blocked, the optimizable variables are more, the size of the field of view of the optical system can be increased, and the imaging quality of the system can be greatly improved.
The optical modulation Transfer function mtf (module Transfer function) is an internationally recognized core evaluation index for the imaging performance of an optical system. The MTF level is directly related to the imaging quality of the optical system. The method can comprehensively reflect various factors influencing the imaging quality such as diffraction, aberration, stray light and the like, and objectively evaluate the image quality of the optical system. The method is suitable for the design stage of an optical system, the assembly, adjustment and inspection stage of an optical instrument, and has universal applicability.
Due to the fact that the main mirror rotational symmetry optical axis of the off-axis reflective optical system is lost, incident light beams are refracted for two times or multiple times, and the main optical axis at the focal plane is deviated from the main optical axis of the detection system. Aiming at the problem of optical axis calibration in the MTF test process of the optical system, an effective calibration method is provided.
Disclosure of Invention
The invention provides an adjusting method and device for MTF test calibration of an off-axis reflective optical system, aiming at solving the problems that a main mirror rotational symmetry optical axis of the off-axis reflective optical system is lost and cannot be calibrated with an MTF test system optical axis. The invention provides an adjusting method for optical axis calibration of an off-axis reflective optical system, which comprises the following steps: the calibration laser emitter system is placed in a parallel light path, and the optical axis of the test system and the optical axis of the tested off-axis reflective optical system can be calibrated respectively by utilizing the collimation characteristic of the laser emergent beamlets, so that the rough alignment of the test optical axis is realized; and finally, the accurate calibration of the optical axis during the MTF test of the off-axis reflective optical system is realized by combining the paraxial approximate equal image height principle.
In order to achieve the aim, the invention designs a calibration laser emitter system and an adjusting mechanism thereof, and aims to achieve rough alignment of an optical axis of a test system and an optical axis of a tested off-axis reflective optical system. The method specifically comprises the following steps:
an optical axis calibration method of an off-axis reflective optical lens comprises the following steps:
s1, installing and adjusting a test system and a system to be tested of the off-axis reflection type optical path;
s2, roughly adjusting the test system and the system to be tested, enabling the light beam emitted by the target generator to sequentially pass through the first off-axis paraboloid main mirror, the laser emitter, the second off-axis paraboloid main mirror, the turn-back mirror and the secondary focusing system for focusing, and enabling the focused light beam to return to the emitting surface of the target generator according to the original path through the plane reflector arranged at the rear end of the secondary focusing system;
s3, adjusting the size of the exit hole of the system target generator according to the size of the focal length of the system to be measured;
s4, adjusting the detector of the test system to make the cross in the eye lens of the detector coincide with the imaging point of the tested system, and make the light beam focus on the maximum value of the transfer function of the tested system, and marking the position as zero point;
s5 rotating a rotary table arranged between the first off-axis paraboloidal primary mirror and the detector, placing an object to be observed on the rotary table, rotating the rotary table by + theta angle, translating the X axis of the rotary table to enable the deviated image point to be adjusted back to the cross-hair position, and recording the data translation distance X1；
S6 rotating the turntable by the angle theta again to adjust the deviated image point back to the cross hair position and record data x2；
S7 calculates the paraxial distortion alpha,
when alpha is larger than 1%, the turntable of the tested system and the translation mechanism of the detector in the test system are adjusted, the optical axis of the tested system is finely adjusted, then the operations of the step S4 and the step S5 are carried out until alpha is smaller than or equal to 1%, and the fine adjustment is finished.
Preferably, the test system comprises a target generator, a detector, a first off-axis paraboloid primary mirror and a laser emitter; the light rays emitted by the target generator form a certain angle with the horizontal plane and are spherical light, and the first off-axis paraboloid main mirror receives the light rays emitted by the target generator and converts the light rays into parallel light beams.
Preferably, the system to be tested comprises a second off-axis paraboloidal main mirror, a turning mirror and a secondary focusing system, and further comprises a plane reflecting mirror used as an auxiliary reflecting tool of the testing system;
the second off-axis parabolic main mirror reflects the parallel light beams emitted by the first off-axis parabolic main mirror to the turn-back mirror, the light beams emitted by the second off-axis parabolic main mirror form a certain angle with the horizontal plane and incline downwards, and the secondary focusing system focuses the emitted light beams of the turn-back mirror on the focal plane of the system to be measured.
Preferably, the step S2 includes the following operations:
s201, placing the calibration laser emitter in a parallel light beam emitted by a first off-axis parabolic primary mirror to a second off-axis parabolic primary mirror;
s202, adjusting a three-dimensional adjusting mechanism of the laser emitter to enable the emergent light beam of the laser emitter to pass through the first off-axis paraboloid primary mirror and coincide with the emergent light beam route of the target generator;
s203, rotating the laser emitter by 180 degrees, so that the light beam emitted by the calibration laser emitter is transmitted to a turn-back mirror through a second off-axis paraboloid main mirror, and is focused on a focal plane of a system to be measured through a secondary focusing system through the turn-back mirror;
s204, a plane reflector is arranged at the rear end of the secondary focusing system machine, and the plane reflector returns the focused light beam to the calibration laser emitter according to the original path.
Preferably, the first off-axis parabolic main mirror and the second off-axis parabolic main mirror are arranged opposite to each other.
Preferably, the included angle between the folding mirror and the vertical plane is an acute angle.
Preferably, the detector is arranged at the rearmost of a light path formed by the test system and the system to be tested.
Preferably, the value of θ ranges from 0.5 ° to 1 °.
Has the advantages that: the calibration laser transmitter is placed in a parallel light path, and the optical axis of the test system and the optical axis of the system to be tested can be calibrated respectively by utilizing the collimation characteristic of the laser emergent beamlets, so that the rough alignment of the test optical axis is realized; and finally, the accurate calibration of the optical axis during the MTF test of the off-axis reflective optical system is realized by combining the paraxial approximate equal image height principle. Compared with the prior art, the technical method and the device provided by the invention have the following advantages: the optical axis calibration method can quickly and accurately adjust the test state of the off-axis reflective optical system, and is a necessary means for accurately testing the MTF of the off-axis reflective optical system.
Drawings
FIG. 1 is a schematic structural diagram of an embodiment of the present invention;
FIG. 2 is a test system according to an embodiment of the present invention;
FIG. 3 is a system under test according to an embodiment of the invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It is noted that the terms first, second, third, etc. are used herein to describe various components or features, but these components or features are not limited by these terms. These terms are only used to distinguish one element or part from another element or part. Terms such as "first," "second," and other numerical terms when used herein do not imply a sequence or order unless clearly indicated by the context. For convenience of description, spatially relative terms such as "inner", "outer", "upper", "lower", "left", "right", "upper", "left", "right", and the like are used herein to describe the orientation relation of the components or parts in the present embodiment, but these spatially relative terms do not limit the orientation of the technical features in practical use.
As shown in fig. 1 to fig. 3, an optical axis calibration method for an off-axis reflective optical lens includes the following steps:
s1, installing and adjusting a test system and a system to be tested of the off-axis reflection type optical path;
s2, roughly adjusting the test system and the system to be tested, enabling the light beam emitted by the target generator 1 to sequentially pass through the first off-axis paraboloid main mirror 2, the laser emitter 3, the second off-axis paraboloid main mirror 4, the turning mirror 5 and the secondary focusing system to be focused 6, and enabling the focused light beam to return to the emitting surface of the target generator 1 according to the original path through the plane reflector 7 arranged at the rear end of the secondary focusing system;
s3, adjusting the size of the emergent hole of the system target generator 1 according to the size of the focal length of the system to be measured;
s4, adjusting the detector of the test system to make the cross in the eye lens of the detector coincide with the imaging point of the tested system, and make the light beam focus on the maximum value of the transfer function of the tested system, and marking the position as zero point;
s5, rotating a turntable arranged between the first off-axis parabolic main mirror 2 and the detector, wherein the turntable and the detector are arranged on the same guide rail;
the turntable is used for placing an object to be observed, the turntable is rotated by + theta angle, the X axis of the turntable is translated to adjust the deviated image point back to the cross-hair position, and the data translation distance X is recorded1；
S6 rotating the turntable by the angle theta again to adjust the deviated image point back to the cross hair position and record data x2；
S7 calculates the paraxial distortion α:
when alpha is larger than 1%, the turntable of the tested system and the translation mechanism of the detector in the test system are adjusted, the optical axis of the tested system is finely adjusted, then the operations of the step S4 and the step S5 are carried out until alpha is smaller than or equal to 1%, and the fine adjustment is finished.
The invention mainly finds out the real optical axis through the rough adjustment of the mechanical axis and the fine adjustment according to the theory that the paraxial distortion is approximate to 0.
The invention mainly comprises a coarse adjustment device link and a fine adjustment device link, wherein the optical system in the invention has the following specific structure: the main ray of the target generator 1 in the test system is reflected by the first off-axis paraboloid main mirror 2 of the test system to form a parallel light beam, the laser emitter 3 is placed in the parallel light path, and the three-dimensional adjusting mechanism of the laser emitter 3 is adjusted to enable the calibration laser beam emitted by the laser emitter 3 to coincide with the emitting point of the target generator in the target of the test system, namely the main ray of the test system and the laser beam emitted by the calibration laser emitter 3 coincide, so that the optical axis of the test system is determined.
Then, the optical axis of the off-axis system to be measured is calibrated, the laser emitter 3 is rotated by 180 degrees, so that the emitted calibration laser beam is incident on the mirror surface of a second off-axis paraboloid main mirror 4 of the system to be measured, then reflected on a turning mirror 5 of the system to be measured, and finally focused on the focal plane of the off-axis system to be measured by a secondary focusing system. At the moment, a plane reflector 7 is placed at the last mechanical end face of the imaging side of the system to be measured, so that the emitted calibration laser beam is returned to the system emitting face of the calibration laser emitter 3 in the original way; the position of the calibration laser emitter 3 system is ensured to be unchanged, and the three-dimensional adjusting mechanism of the tested system is adjusted, so that the calibration laser beam reflected by the plane reflector 7 can be completely coincided with the emergent direction of the calibration laser beam, namely, the optical axis of the tested system is roughly aligned with the optical axis of the test system.
After coarse adjustment, the system needs to perform fine adjustment to improve the measurement precision of the device, and the method specifically comprises the following steps:
firstly, adjusting the hole site size of an emergent ray bundle of a target generator 1 of a test system according to the focal length of the tested system;
then, adjusting a detector of the test system to make the cross hairs in the eye lens of the detector coincide with an imaging point of the tested system, wherein the imaging point is the best focused image surface position, namely, the position of the maximum value of the transfer function of the tested system when the light beam is focused, and then marking the position as a zero point;
next, the three-dimensional adjustment mechanism of the system under test, i.e., the turntable, is rotated by + θ for clockwise rotation, and the X-axis of the support system is translated to adjust the deviated image point back to the cross-hair position, recording the data X1(ii) a Rotating a rotary table-theta and-theta of a support system of the off-axis reflective optical system to be measured at an anticlockwise angle, adjusting the deviated image point back to the cross-hair position, and recording data x2；
Finally, according to the formula | x1-x2|/|x1+x2I, calculating to obtain a ratio alpha, and when the ratio is less than alpha>And (4) adjusting the rotary support of the system to be tested and the translation mechanism of the detector of the test system when the alpha is 1%, and slightly adjusting the optical axis of the system to be tested at a small angle, otherwise, repeating the related steps until the alpha is less than or equal to 1%, and finishing fine adjustment.
In a preferred embodiment, the test system comprises an object generator invention 1, a detector, a first off-axis parabolic primary mirror invention 2, a laser emitter invention 3; the light rays emitted by the target generator invention 1 form a certain angle with the horizontal plane and are spherical light, and the first off-axis paraboloid main mirror invention 2 receives the light rays emitted by the target generator invention 1 and converts the light rays into parallel light beams.
In a preferred embodiment, the system under test comprises a second off-axis parabolic main mirror 4, a turning mirror, a secondary focusing system, and a plane mirror used as an auxiliary reflecting tool of the test system; the second off-axis parabolic main mirror 4 reflects the parallel light beams emitted by the first off-axis parabolic main mirror 2 to the turn-back mirror 5, the light beams emitted by the second off-axis parabolic main mirror 4 form a certain angle with the horizontal plane and incline downwards, and the secondary focusing system focuses the emitted light beams of the turn-back mirror 5 on the focal plane of the system to be measured.
In a preferred embodiment, the step S2 includes the following operations:
s201, placing the calibration laser emitter 3 in a parallel light beam emitted from the first off-axis parabolic main mirror 2 to the second off-axis parabolic main mirror 4;
s202, adjusting a three-dimensional adjusting mechanism of the laser emitter 3 to enable the light beam emitted by the laser emitter 3 to pass through the first off-axis parabolic main mirror 2 and coincide with the emitted light beam path of the target generator 1;
s203, rotating the laser emitter 3 by 180 degrees, so that the light beam emitted by the calibration laser emitter 3 is transmitted to a turn-back mirror 5 through a second off-axis paraboloid main mirror 4, and is focused 6 on the focal plane of the system to be measured through a secondary focusing system through the turn-back mirror 5;
s204, a plane reflector 7 is arranged at the rear end of the secondary focusing system machine, and the plane reflector 7 returns the focused light beam to the calibration laser emitter 3 according to the original path.
In a preferred embodiment, the first off-axis parabolic main mirror 2 is arranged opposite to the reflecting surface of the second off-axis parabolic main mirror 4. The light beam is conveniently received and returned according to the original light path.
In a preferred embodiment, the angle between the folding mirror 5 and the vertical plane is acute.
In a preferred embodiment, the detector is disposed at the rearmost of an optical path formed by the test system and the system under test.
In a preferred embodiment, θ is in a range of 0.5 ° to 1 °.
The above embodiments are not limited to the technical solutions of the embodiments themselves, and the embodiments may be combined with each other into a new embodiment. The above embodiments are only for illustrating the technical solutions of the present invention and are not limited thereto, and any modification or equivalent replacement without departing from the spirit and scope of the present invention should be covered within the technical solutions of the present invention.
Claims (5)
1. An optical axis calibration method of an off-axis reflective optical lens is characterized by comprising the following steps:
s1, installing and adjusting a test system and a system to be tested of the off-axis reflection type optical path;
the testing system comprises a target generator (1), a detector, a first off-axis paraboloid primary mirror (2) and a laser emitter (3); the light rays emitted by the target generator (1) form a certain angle with the horizontal plane and are spherical light, and the first off-axis paraboloid main mirror (2) receives the light rays emitted by the target generator (1) and converts the light rays into parallel light beams;
the system to be tested comprises a second off-axis paraboloid main mirror (4), a turning mirror (5), a secondary focusing system (6) and a plane reflecting mirror (7) used as an auxiliary reflecting tool of the testing system;
the second off-axis parabolic main mirror (4) reflects the parallel light beams emitted by the first off-axis parabolic main mirror (2) to the turn-back mirror (5), the light beams emitted by the second off-axis parabolic main mirror (4) form a certain angle with the horizontal plane and incline downwards, and the secondary focusing system (6) focuses the light beams emitted by the turn-back mirror (5) on the focal plane of the system to be measured;
s2 roughly adjusting the test system and the system to be tested;
step S2 specifically includes the following steps:
s201, placing the laser emitter (3) in a parallel light beam emitted by the first off-axis parabolic main mirror (2) to the second off-axis parabolic main mirror (4);
s202, adjusting a three-dimensional adjusting mechanism of the laser emitter (3) to enable an emergent beam of the laser emitter (3) to coincide with an emergent beam route of the target generator (1) through the first off-axis parabolic primary mirror (2);
s203, rotating the laser emitter (3) by 180 degrees, so that the light beam emitted by the laser emitter (3) is transmitted to the turn-back mirror (5) through the second off-axis parabolic main mirror (4), and is focused on the focal plane of the system to be measured by the secondary focusing system (6) through the turn-back mirror (5);
s204, placing a plane reflector (7) at the rear end of the secondary focusing system (6), adjusting the position of the system to be measured, and returning the focused light beam reflected by the plane reflector (7) to the laser emitter (3) according to the original path;
s3, adjusting the size of an emergent hole of the target generator (1) according to the size of the focal length of the system to be tested;
s4, adjusting the detector of the test system to make the cross in the eye lens of the detector coincide with the imaging point of the system to be tested, and the imaging point is the best image surface position of focusing, and the position is marked as a zero point;
s5 rotating a rotary table arranged between the first off-axis paraboloidal primary mirror (2) and the detector, placing an object to be observed on the rotary table, rotating the rotary table by + theta angle, translating the X axis of the rotary table to adjust the deviated image point back to the cross-hair position, and recording the data translation distance X1；
S6 rotating the turntable by the angle theta again to adjust the deviated image point back to the cross hair position and record data x2；
S7 calculates the paraxial distortion alpha,
when alpha is larger than 1%, adjusting a rotary table of the system to be tested and a translation mechanism of a detector in the test system, adjusting an optical axis of the system to be tested, performing the operations of the step S4 and the step S5 until alpha is smaller than or equal to 1%, and finishing fine adjustment.
2. A method for calibrating the optical axis of an off-axis reflective optical lens according to claim 1, wherein the first off-axis parabolic primary mirror (2) is disposed opposite to the reflective surface of the second off-axis parabolic primary mirror (4).
3. A method of calibrating an optical axis of an off-axis reflective optical lens according to claim 1, wherein the angle between the fold-back mirror (5) and a vertical plane is acute.
4. The method for calibrating the optical axis of an off-axis reflective optical lens as claimed in claim 1, wherein the detector is disposed at the rearmost of the optical path formed by the testing system and the system under test.
5. The method for calibrating the optical axis of an off-axis reflective optical lens of claim 1, wherein θ is in the range of 0.5 ° to 1 °.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011628207.5A CN112596257B (en) | 2020-12-30 | 2020-12-30 | Optical axis calibration method of off-axis reflective optical lens |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011628207.5A CN112596257B (en) | 2020-12-30 | 2020-12-30 | Optical axis calibration method of off-axis reflective optical lens |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112596257A CN112596257A (en) | 2021-04-02 |
| CN112596257B true CN112596257B (en) | 2021-09-10 |
Family
ID=75206557
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011628207.5A Active CN112596257B (en) | 2020-12-30 | 2020-12-30 | Optical axis calibration method of off-axis reflective optical lens |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112596257B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113607188B (en) * | 2021-08-02 | 2022-07-05 | 北京航空航天大学 | Theodolite cross-hair imaging-based multi-view-field star sensor calibration system and method |
| CN114978301B (en) * | 2022-03-28 | 2023-09-12 | 昂纳科技(深圳)集团股份有限公司 | Optical test system, calibration method thereof and calibration piece |
| CN115061289A (en) * | 2022-06-24 | 2022-09-16 | 青岛理工大学 | Rapid assembly system and method for off-axis parabolic mirror |
| CN116699864B (en) * | 2023-07-31 | 2023-10-20 | 中国科学院长春光学精密机械与物理研究所 | Reference-free adjustment method, device, equipment and medium for space-based large optical system |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009041307A1 (en) * | 2007-09-25 | 2009-04-02 | Nikon Corporation | Alignment device and method for optical system |
| CN204831220U (en) * | 2015-05-21 | 2015-12-02 | 秦皇岛本征晶体科技有限公司 | Calcirm -fluoride optical flat two sides depth of parallelism high accuracy testing arrangement |
| CN106371202B (en) * | 2016-09-23 | 2019-07-05 | 昆明物理研究所 | For long emergent pupil without burnt off-axis two anti-telescopic system solid debugging device and Method of Adjustment |
| CN108444410B (en) * | 2018-06-20 | 2020-08-14 | 湖北三江航天红峰控制有限公司 | Device and method for measuring parallelism of convergent laser emission optical axis and tracking visual axis |
| CN110146259A (en) * | 2019-06-18 | 2019-08-20 | 四川长九光电科技有限责任公司 | A kind of reflective multi-light axis consistency quantitative test of large-caliber off-axis and calibrating installation |
| CN210774617U (en) * | 2019-08-16 | 2020-06-16 | 深圳市捍卫者安全装备有限公司 | Optical axis consistency detection device |
-
2020
- 2020-12-30 CN CN202011628207.5A patent/CN112596257B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN112596257A (en) | 2021-04-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112596257B (en) | Optical axis calibration method of off-axis reflective optical lens | |
| US20210025697A1 (en) | Optical assembly, method for producing data in the same, and method for manufacturing structure | |
| CN103261962B (en) | For equipment, optical module, the method for object, and the method for manufacturing structure to be checked or measured | |
| JP4195292B2 (en) | Imaging system using catadioptric system and catadioptric system | |
| CN111650695A (en) | Space light-optical fiber coupling alignment method for optical fiber transmission characteristic measurement | |
| CN110554512B (en) | High-precision secondary off-axis ellipsoidal reflector optical axis leading-out method and optical system thereof | |
| US9823119B2 (en) | System and method for analyzing a light beam guided by a beam guiding optical unit | |
| CN114216659B (en) | System and method for measuring parallelism of large-caliber long-focal-length optical axis | |
| CN115166932B (en) | Optical axis adjusting method of large-caliber long-focus off-axis optical system | |
| CN105737759B (en) | A kind of long-range profile measuring device | |
| CN114279687B (en) | Measuring device and measuring method for relative deflection of primary mirror and secondary mirror | |
| CN113447119B (en) | Line spectrum confocal sensor | |
| CN110109262B (en) | Coaxiality debugging system and method for light source switching multiplexing unit | |
| CN116299979A (en) | Line scanning spectrum confocal dispersion objective lens | |
| CN115981023A (en) | Hyperboloid or ellipsoidal reflector optical axis precision calibration device and calibration method | |
| CN116430602A (en) | Optical axis consistency debugging method of clamping type folding axis telescopic objective lens | |
| CN217058699U (en) | Spectrum appearance and line spectrum confocal sensor | |
| CN113295386B (en) | Optical lens piece detection system and detection method | |
| CN110501142B (en) | Detection device and detection method for optical system | |
| US6653851B2 (en) | Refocusing wavelengths to a common focal plane for electrical trace testing | |
| JPH06508218A (en) | Deflection type optical device with wide measurement range | |
| Freudenthaler | Effects of spatially inhomogeneous photomultiplier sensitivity on lidar signals and remedies | |
| CN112213078B (en) | Portable optical axis detection module for dual-wavelength laser reconnaissance system | |
| CN114486198B (en) | Large-caliber reflector detection system | |
| CN110336932A (en) | A kind of laser/TV with real-time school s function is total to light path system and uses and school axis method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |