CN112525930A - Defect measuring device and method based on X-ray real-time imaging - Google Patents
Defect measuring device and method based on X-ray real-time imaging Download PDFInfo
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- CN112525930A CN112525930A CN202011422829.2A CN202011422829A CN112525930A CN 112525930 A CN112525930 A CN 112525930A CN 202011422829 A CN202011422829 A CN 202011422829A CN 112525930 A CN112525930 A CN 112525930A
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- 230000007547 defect Effects 0.000 title claims abstract description 56
- 238000003384 imaging method Methods 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title claims abstract description 28
- 238000001514 detection method Methods 0.000 claims abstract description 58
- 238000007689 inspection Methods 0.000 claims description 4
- 238000004080 punching Methods 0.000 claims description 2
- 239000000919 ceramic Substances 0.000 abstract description 5
- 239000006260 foam Substances 0.000 abstract description 5
- 239000000463 material Substances 0.000 abstract description 5
- 229910052751 metal Inorganic materials 0.000 abstract description 5
- 239000002184 metal Substances 0.000 abstract description 5
- 238000012854 evaluation process Methods 0.000 abstract description 4
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
Abstract
The invention discloses a defect measuring device and method based on X-ray real-time imaging, which comprises a supporting base, wherein a height adjusting device is arranged on the supporting base, a ruler is rotationally fixed on the height adjusting device, and the ruler is arranged above a detected product; the ruler is provided with a plurality of detection holes with different diameters, the distance between the detection holes is unequal, and the axial direction of the detection holes is the same as the direction of a detected product. The X-ray real-time imaging detection evaluation process is simplified, the defect size is quickly obtained, the detection efficiency is improved, and the method is suitable for X-ray flaw detection materials such as foam, rubber, light ceramic and thin-walled metal.
Description
Technical Field
The invention relates to the field of X-ray real-time imaging detection, in particular to a defect measuring device and method based on X-ray real-time imaging.
Background
The X-ray nondestructive testing techniques can be classified into X-ray film photography and X-ray real-time imaging. The X-ray film photography method has long detection time and high cost, and the relative position of the defect and the ray source can greatly influence the judgment result, thus easily causing the missing judgment. The X-ray real-time imaging method can overcome the defects of the X-ray film photographic method, detect and evaluate the defects in real time, digitally store and manage the detection result, save the cost, and is efficient and environment-friendly.
At present, when the technical result of X-ray real-time imaging detection is judged, a projection image of a real object is obtained, the size of impurities collected by the image is not equal to the actual size of a defect, the actual size of the defect needs to be calculated according to four parameters of current, voltage, focal length and magnification and a corresponding principle formula, and the process is complicated. In the prior art, the automatic determination of the defect size is realized by combining the characteristics of gray level distribution of an airplane blade image and applying a gray level curved surface function and collective operation on the basis of digital ray real-time imaging, but the process also relates to a large amount of function calculation and is complex in the defect size calculation process. And the gas insulated switch is subjected to X-ray real-time imaging size calibration, although the experimental verification error is low, a large number of specific parameters need to be consulted, and the X-ray digital imaging efficiency is reduced. The actual size of the defect is calculated according to parameters such as transillumination parameters, corresponding magnification factors and the like of the X-ray real-time imaging equipment, the conversion process is complex, and the judgment efficiency is low. Therefore, there is a need for a defect measuring apparatus and method that can detect defects with high efficiency.
Disclosure of Invention
The invention aims to solve the technical problems and provides a defect measuring device and method based on X-ray real-time imaging, which simplify the X-ray real-time imaging detection and judgment process, quickly obtain the defect size, improve the detection efficiency and are suitable for X-ray flaw detection materials such as foam, rubber, light ceramics, thin-walled metal and the like.
The technical scheme adopted by the invention is as follows: a defect measuring device based on X-ray real-time imaging comprises a supporting base, wherein a height adjusting device is arranged on the supporting base, a ruler is rotationally fixed on the height adjusting device, and the ruler is arranged above a detected product; the ruler is provided with a plurality of detection holes with different diameters, the distance between the detection holes is unequal, and the axial direction of the detection holes is the same as the direction of a detected product. The X-ray real-time imaging detection evaluation process is simplified, the defect size is quickly obtained, the detection efficiency is improved, and the method is suitable for X-ray flaw detection materials such as foam, rubber, light ceramic and thin-walled metal.
Preferably, the height adjusting device comprises a double-hole pipe clamp, a single-hole pipe clamp, a first height adjusting pipe and a second height adjusting pipe, one end of the first height adjusting pipe is fixed to the supporting base, the other end of the first height adjusting pipe is fixed to the double-hole pipe clamp, one end of the second height adjusting pipe is fixed to the double-hole pipe clamp, the other end of the second height adjusting pipe is fixed to the single-hole pipe clamp, and the scale is further rotationally fixed to the single-hole pipe clamp. The height of the scale can be adjusted by clamping the first height adjusting pipe and the second height adjusting pipe through the double-hole pipe clamp or clamping the second height adjusting pipe through the single-hole pipe clamp.
Preferably, the first height adjusting pipe and the second height adjusting pipe are parallel to each other.
Preferably, the lower edge structure of the scale is matched with the upper edge structure of the detected product. The imaging size is convenient to measure.
Preferably, the thickness of the scale is the same as the contrast of the product to be detected. And errors caused by different contrast ratios and different imaging ratios are reduced.
Preferably, the number of the detection holes is 8, the hole diameters are respectively 0.2mm, 0.4mm, 0.6mm, 0.8mm, 1mm, 1.5mm, 2mm and 3mm, and the hole intervals are sequentially 1mm, 2mm, 3mm, 4mm, 5mm, 6mm and 7 mm.
Preferably, the ruler is of an arc-shaped structure, and the upper edge of the detected product is also of an arc-shaped structure.
The defect measuring method based on X-ray real-time imaging is further provided, the defect measuring device comprises the following steps:
s1: selecting a scale with the same contrast and the same shape and structure as the detected product;
s2: punching a plurality of detection holes on the scale, wherein the diameters and the intervals of the detection holes are different;
s3: a single-hole pipe clamp is adopted to connect the scale and the second height adjusting pipe, a double-hole pipe clamp is adopted to connect the first height adjusting pipe and the second height adjusting pipe, and then the first height adjusting pipe is fixed on the supporting base;
s4: adjusting the scale to be above the detected product to enable the scale to be close to the detected product and higher than the detected product;
s5: and carrying out X-ray real-time imaging detection on the detected product to obtain the proportion of the imaging size of the ruler to the actual size, and then obtaining the actual size of the defect according to the imaging size of the defect of the detected product. In the actual measurement process, the inspection hole with the proper size can be selected according to the actual defect.
Preferably, the detected product is in the shape of a circular arc, the scale is arranged in the shape of an arc, and in step S4, the position of the scale is adjusted so that the center of the scale coincides with the center of the detected product.
Preferably, the number of the detection holes in step S2 is 8, the diameter sizes of the detection holes are 0.2mm, 0.4mm, 0.6mm, 0.8mm, 1mm, 1.5mm, 2mm and 3mm in sequence, and the hole spacing between every two holes is 1mm, 2mm, 3mm, 4mm, 5mm, 6mm and 7mm in sequence.
Compared with the prior art, the beneficial effects of adopting the technical scheme are as follows: the invention relates to a defect measuring device and method based on X-ray real-time imaging, which comprises a supporting base, wherein a height adjusting device is arranged on the supporting base, a ruler is rotationally fixed on the height adjusting device, and the ruler is arranged above a detected product; the ruler is provided with a plurality of detection holes with different diameters, the distance between the detection holes is unequal, and the axial direction of the detection holes is the same as the direction of a detected product. The X-ray real-time imaging detection evaluation process is simplified, the defect size is quickly obtained, the detection efficiency is improved, and the method is suitable for X-ray flaw detection materials such as foam, rubber, light ceramic and thin-walled metal.
Drawings
FIG. 1 is a block diagram of the present invention;
FIG. 2 is an imaging view of a first filamentous defect of the present invention;
FIG. 3 is an imaging view of a first filamentous defect of the present invention;
FIG. 4 is a first point defect imaging diagram of the present invention;
FIG. 5 is a second image of a point defect of the present invention.
Description of the symbols of the main elements: 1. a support base; 2. a dual bore pipe clamp; 3. a single bore pipe clamp; 4. a second height adjusting pipe; 5. and (4) a scale.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings. In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Example 1: referring to fig. 1, the defect measuring apparatus based on X-ray real-time imaging of the present embodiment includes a supporting base 1, a height adjusting device is disposed on the supporting base 1, a ruler 5 is rotatably fixed on the height adjusting device, and the ruler 5 is disposed above a detected product; the scale 5 is provided with a plurality of detection holes with different diameters, the distance between the detection holes is different, and the axial direction of the detection holes is the same as the direction of a detected product. The X-ray real-time imaging detection evaluation process is simplified, the defect size is quickly obtained, the detection efficiency is improved, and the method is suitable for X-ray flaw detection materials such as foam, rubber, light ceramic and thin-walled metal. The scale 5 may be made of aluminium.
The height adjusting device of this embodiment includes diplopore pipe clamp 2, haplopore pipe clamp 3, first altitude mixture control pipe and second altitude mixture control pipe 4, and the one end of first altitude mixture control pipe is fixed on supporting base 1, and the other end is fixed on diplopore pipe clamp 2, and the one end of second altitude mixture control pipe 4 is fixed on diplopore pipe clamp 2, the other end is fixed on haplopore pipe clamp 3, still the swivelling joint has scale 5 on the haplopore pipe clamp 3. The height of the scale 5 can be adjusted by clamping the first and second height adjusting tubes 4 by the double-bore tube clamp 2, or by clamping the position of the second height adjusting tube 4 by the single-bore tube clamp 3. The first height adjusting pipe and the second height adjusting pipe 4 of the present embodiment are parallel to each other. The lower edge structure of the scale 5 of this embodiment coincides with the upper edge structure of the product to be inspected. The imaging size is convenient to measure. The thickness of the scale 5 of the present embodiment is the same as the contrast of the product to be inspected. And errors caused by different contrast ratios and different imaging ratios are reduced. The number of the detection holes is 8, the hole diameters are respectively 0.2mm, 0.4mm, 0.6mm, 0.8mm, 1mm, 1.5mm, 2mm and 3mm, and the hole intervals are sequentially 1mm, 2mm, 3mm, 4mm, 5mm, 6mm and 7 mm. The scale 5 of this embodiment is the arc structure, and the top edge that is detected the product also is the arc structure.
The embodiment also provides a defect measuring method based on X-ray real-time imaging, which comprises the measuring device and further comprises the following steps: s1: selecting a scale 5 with the same contrast and the same shape and structure as the detected product; s2: a plurality of detection holes are punched on the scale 5, and the diameters and the intervals of the detection holes are different; s3: a single-hole pipe clamp 3 is adopted to connect a scale 5 and a second height adjusting pipe 4, a double-hole pipe clamp 2 is adopted to connect a first height adjusting pipe and the second height adjusting pipe 4, and then the first height adjusting pipe is fixed on a supporting base 1; s4: adjusting the scale 5 to be above the detected product to enable the scale to be close to and higher than the detected product; s5: and carrying out X-ray real-time imaging detection on the detected product to obtain the proportion of the imaging size of the scale 5 to the actual size, and then obtaining the actual size of the defect according to the imaging size of the defect of the detected product. In the actual measurement process, the inspection hole with the proper size can be selected according to the actual defect.
In this embodiment, the detected product is in the shape of an arc, the scale 5 is set to be in the shape of an arc, and in step S4, the position of the scale 5 is adjusted so that the center of the scale 5 coincides with the center of the detected product. The number of the detection holes in step S2 of the present embodiment is 8, the diameter sizes of the detection holes are 0.2mm, 0.4mm, 0.6mm, 0.8mm, 1mm, 1.5mm, 2mm, 3mm in this order, and the hole pitch between every two holes is 1mm, 2mm, 3mm, 4mm, 5mm, 6mm, 7mm in this order.
Example 1: referring to fig. 2 and 3, fig. 2 and 3 are the same map, the defect in fig. 2 is filamentous, so the hole pitch is compared with the defect, the detected product is an annular object, in order to ensure that the contrast of the image of the detected product and the image of the aluminum plate in the real-time X-ray imaging process is consistent, the aluminum plate with the thickness of 2mm is selected, and the annular scale 5 with the outer diameter of 250mm and the inner diameter of 210mm is prepared according to the shape of the detected product. The height adjusting pipe and the annular scale 5 are connected through the single-hole pipe clamp 3, the height adjustable pipe and the supporting base 1 are connected through the double-hole pipe clamp 2, and therefore the height of the whole detection device is adjustable. The height of the annular scale 5 is adjusted to be slightly higher than the product to be measured. The annular scale 5 is adjusted in direction so that the diameter position thereof is in the direction of the maximum diameter of the product. The product is inspected by using the XYD-225 real-time imaging detection system, and the size of the defect is measured by using software of the system. In the detection result, the aperture of the scale 5 is 0.8mm, the imaging distance of the 1mm hole is 11.51mm, and the actual hole distance of the two holes on the scale 5 is known to be 4mm, so that when filiform inclusions with the size of 11.51mm appear in the product in the detection result, the actual size of the defect can be judged to be 4 mm.
Example 2: referring to fig. 4 and 5, fig. 4 and 5 are the same map, the defects are point-like, so the aperture is compared with the defects, the detected product is an annular object, in order to ensure that the contrast of the image of the detected product and the image of the aluminum plate in the real-time X-ray imaging process is consistent, the aluminum plate with the thickness of 2mm is selected, and the annular scale 5 with the outer diameter of 250mm and the inner diameter of 210mm is prepared according to the shape of the detected product. The height adjusting pipe and the annular scale 5 are connected through the single-hole pipe clamp 3, the height adjustable pipe and the supporting base 1 are connected through the double-hole pipe clamp 2, and therefore the height of the whole detection device is adjustable. The height of the annular scale 5 is adjusted to be slightly higher than the product to be measured. The annular scale 5 is adjusted in direction so that the diameter position thereof is in the direction of the maximum diameter of the product. The product is inspected by using the XYD-225 real-time imaging detection system, and the size of the defect is measured by using software of the system. In the detection result, the imaging diameter of the hole on the scale 5 is 4.57mm, while the actual corresponding hole diameter of the scale 5 is known to be 1.5mm, therefore, when the product in the detection result has punctiform inclusions with the size of 4.57mm, the actual size of the defect can be judged to be 1.5 mm.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included therein.
Claims (10)
1. A defect measuring device based on X-ray real-time imaging is characterized by comprising a supporting base, wherein a height adjusting device is arranged on the supporting base, a ruler is rotationally fixed on the height adjusting device, and the ruler is arranged above a detected product; the ruler is provided with a plurality of detection holes with different diameters, the distance between the detection holes is unequal, and the axial direction of the detection holes is the same as the direction of a detected product.
2. The X-ray real-time imaging-based defect measuring device as claimed in claim 1, wherein the height adjusting device comprises a double-hole pipe clamp, a single-hole pipe clamp, a first height adjusting pipe and a second height adjusting pipe, one end of the first height adjusting pipe is fixed on the supporting base, the other end of the first height adjusting pipe is fixed on the double-hole pipe clamp, one end of the second height adjusting pipe is fixed on the double-hole pipe clamp, the other end of the second height adjusting pipe is fixed on the single-hole pipe clamp, and the scale is further rotationally fixed on the single-hole pipe clamp.
3. The real-time X-ray imaging-based defect measuring device of claim 2, wherein the first height adjusting tube and the second height adjusting tube are parallel to each other.
4. The real-time X-ray imaging-based defect measuring device of claim 1, wherein the lower edge structure of the scale is coincident with the upper edge structure of the inspected product.
5. The X-ray real-time imaging-based defect measuring device as claimed in claim 1, wherein the thickness of the scale is the same as the contrast of the detected product.
6. The defect measuring device based on X-ray real-time imaging is characterized in that the number of the detection holes is 8, the hole diameters are respectively 0.2mm, 0.4mm, 0.6mm, 0.8mm, 1mm, 1.5mm, 2mm and 3mm, and the hole intervals are sequentially 1mm, 2mm, 3mm, 4mm, 5mm, 6mm and 7 mm.
7. The X-ray real-time imaging-based defect measuring device as claimed in claim 1, wherein the scale is an arc-shaped structure, and the upper edge of the detected product is also an arc-shaped structure.
8. A defect measuring method based on X-ray real-time imaging, characterized by comprising the measuring device of any one of claims 1-7, and further comprising the steps of:
s1: selecting a scale with the same contrast and the same shape and structure as the detected product;
s2: punching a plurality of detection holes on the scale, wherein the diameters and the intervals of the detection holes are different;
s3: a single-hole pipe clamp is adopted to connect the scale and the second height adjusting pipe, a double-hole pipe clamp is adopted to connect the first height adjusting pipe and the second height adjusting pipe, and then the first height adjusting pipe is fixed on the supporting base;
s4: adjusting the scale to be above the detected product to enable the scale to be close to the detected product and higher than the detected product;
s5: and carrying out X-ray real-time imaging detection on the detected product to obtain the proportion of the imaging size of the ruler to the actual size, and then obtaining the actual size of the defect according to the imaging size of the defect of the detected product.
9. The method for measuring defects based on X-ray real-time imaging of claim 8, wherein the inspected product is in a circular arc shape, the scale is set to be in an arc shape, and in step S4, the position of the scale is adjusted to make the scale coincide with the center of the inspected product.
10. The defect measuring method based on X-ray real-time imaging of claim 8, wherein the number of the inspection holes in step S2 is 8, and the diameter sizes of the inspection holes are 0.2mm, 0.4mm, 0.6mm, 0.8mm, 1mm, 1.5mm, 2mm and 3mm in sequence, and the hole spacing between every two holes is 1mm, 2mm, 3mm, 4mm, 5mm, 6mm and 7mm in sequence.
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| CN202011422829.2A CN112525930A (en) | 2020-12-08 | 2020-12-08 | Defect measuring device and method based on X-ray real-time imaging |
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| CN202011422829.2A CN112525930A (en) | 2020-12-08 | 2020-12-08 | Defect measuring device and method based on X-ray real-time imaging |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112945993A (en) * | 2021-02-08 | 2021-06-11 | 格力电器（芜湖）有限公司 | Detection method and system of electrical equipment and storage medium |
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Application publication date: 20210319 |