CN112525904B - 一种硅质岩中不同来源硅质含量的定量计算方法 - Google Patents
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Abstract
本发明提供了一种硅质岩中不同来源硅质含量的定量计算方法,流程简单,分析效率高,能够较为准确地定量区分硅质岩样品中碎屑硅、热液硅、生物硅等不同来源硅的含量,对于研究硅质矿物对页岩气生成的影响具有重要意义。
Description
技术领域
本发明属于地质领域,特别涉及一种硅质岩中不同来源硅质含量的定量计算方法。
背景技术
硅质岩是地质中的一套特殊岩性,也是石油地质中的一套重要的烃源岩和页岩气储集岩。四川盆地下古生界两套硅质页岩层系是其重要的页岩气产层,硅质含量与TOC及含气量呈正相关性,暗示硅质矿物对该地区页岩气的生成具有重要意义。但硅质来源复杂,包括生物来源(生物硅)、热液来源(热液硅)及碎屑来源(石英)。同一个样品中,混杂了多种来源组分。虽然有地化参数指标(例如Fe/Ti含量比)可判断岩石是否受热液影响,但是将岩石中不同来源硅质含量定量测试或计算,还是一个难题,据发明人所知现有技术中尚未见报道。
发明内容
有鉴于现有技术的上述缺陷,本发明的目的在于提供一种硅质岩中不同来源硅质含量的定量计算方法,流程简单,分析效率高,能够较为准确地定量区分硅质岩样品中碎屑硅、热液硅、生物硅等不同来源硅的含量,对于研究硅质矿物对页岩气生成的影响具有重要意义。
为实现上述目的,本发明提供了一种硅质岩中不同来源硅质含量的定量计算方法,包括以下步骤:
步骤一、样品制备:除掉硅质岩样品的表面风化物,将样品分成两份,第一份制成光薄片,第二份磨制成粉末样品。
进一步地,上述光薄片的制备方法如下:将硅质岩样品沿垂直层面方向切出一个平整面,抛光后用透明胶水粘至载玻片上;待胶水干后,将样品远离载玻片的一端进行切平,然后抛光直至表面见不到任何划痕,即制成硅质岩光薄片。上述光薄片的制备方法可参照发明人的中国专利申请202010519593.8中关于光薄片的制备方法。
进一步地,上述光薄片的岩石厚度≤3μm。一般来说,硅质岩中有机碳(TOC)含量越高,光薄片厚度要求越薄。当硅质岩中TOC≤2%时,岩石厚度以3μm为宜;当2%<TOC<5%时,岩石厚度以2.5~3μm为宜;当5%≤TOC<10%时,岩石厚度以1.5~2.5μm为宜;当TOC≥10%时,岩石厚度以1~1.5μm为宜。
进一步地,上述载玻片为玻璃或树脂载玻片。
进一步地,上述粉末样品的粒径为200目或更细,粉末样品的重量不低于1g。
步骤二、显微特征观察:将光薄片放置于显微镜下,利用透射光、正交偏光及反射光,分析样品中硅质主要的来源特征。
步骤三、元素含量分析:用XRF对粉末样品中Si、Al、Fe、Ti元素的含量进行测定。
步骤四、碎屑硅的计算:由于碎屑岩中Si含量与Al的相关性,因此碎屑硅(Siterrigenous)含量可通过微量元素Alsample含量来计算:
Siterrigenous=(Si/Al)background*Alsample
其中,(Si/Al)background为平均页岩中硅铝的含量比,值为3.11(Wedepohl,K.H.,Physics and Chemistry of the Earth,1971,vol.8,Pergamon,Oxford,pp.307–331)。
步骤五、过剩硅的计算:过剩硅(Siexcess)是指非碎屑来源的硅质总和,其包括了热液硅与生物硅。过剩硅可通过样品中总的硅含量(Sisample)扣除碎屑硅(Siterrigenous)来进行计算:
Siexcess=Sisample-Siterrigenous。
步骤六、生物硅与热液硅的计算:现有技术中,根据Fe/Ti含量比对样品是否受热液影响进行判识:若Fe/Ti≥40,则受热液影响;若Fe/Ti<40,则不受热液影响。然而,这种判识方法是十分粗略的,其无法准确地定量区分硅质岩样品中不同来源硅的含量,尤其是生物硅与热液硅的含量。本发明中,发明人设计的方法可以定量计算生物硅与热液硅的含量,具体步骤如下:
(1)按照Fe/Ti含量比对多个样品进行升序或降序排列;将Fe/Ti>80的样品设为A端元组(高值组),其主体为热液影响的过剩硅(即生物来源的过剩硅可忽略);将Fe/Ti<5的样品设为B端元组(低值组),其主体为生物来源的过剩硅(即热液影响的过剩硅可忽略);将5≤Fe/Ti≤80的样品设为C中间组,C中间组中需要定量计算生物硅与热液硅含量的样品设为待测组,其余设为模拟组;
(2)计算A端元组和B端元组样品的平均Fe/Ti和Siexcess的值,作为端元数值;设模拟组各样品中含有x含量的A组分(即热液硅的贡献度为x/(x+y))和y含量的B组分(即生物硅的贡献度为y/(x+y));通过方程Ax+By=C对端元数值和模拟组样品的Fe/Ti和Siexcess数值进行Metlab模拟计算,拟合得到不同Fe/Ti含量比之下的x值与y值;
(3)将待测组各样品的Fe/Ti和Siexcess的值代入拟合得到的方程Ax+By=C;计算得到待测组各样品中热液硅含量为[x/(x+y)]*Siexcess;生物硅的含量为[y/(x+y)]*Siexcess。
进一步地,步骤(1)中A端元组和B端元组的样品数量均不少于5个;C中间组中模拟组的样品数量不少于10个。
本发明的一种硅质岩中不同来源硅质含量的定量计算方法流程简单,分析效率高,能够较为准确地定量区分硅质岩样品中不同来源硅的含量,对于研究硅质矿物对页岩气生成的影响具有重要意义。
具体实施方式
下面对本发明的实施例作详细说明,下述的实施例在以本发明技术方案为前提下进行实施,给出了详细的实施方式和具体的操作过程,但本发明的保护范围不限于下述的实施例。
在一个优选实施例中,发明人在贵州麻江羊跳地区采集了寒武系底部牛蹄塘组样品81件,样品号标记为M-1~M-81。为了较为准确地定量区分硅质岩样品中碎屑硅、热液硅、生物硅等不同来源硅的含量,本发明的硅质岩中不同来源硅质含量的定量计算方法,包括以下步骤:
步骤一、样品制备:除掉各硅质岩样品的表面风化物,将样品分成两份,第一份制成光薄片,第二份磨制成粉末样品。
其中,光薄片的制备方法如下:将硅质岩样品沿垂直层面方向切出一个平整面,抛光后用透明胶水粘至载玻片上;待胶水干后,将样品远离载玻片的一端进行切平,然后抛光直至表面见不到任何划痕,即制成硅质岩光薄片。光薄片的岩石厚度≤3μm。一般来说,硅质岩中有机碳(TOC)含量越高,光薄片厚度要求越薄。当硅质岩中TOC≤2%时,岩石厚度以3μm为宜;当2%<TOC<5%时,岩石厚度以2.5~3μm为宜;当5%≤TOC<10%时,岩石厚度以1.5~2.5μm为宜;当TOC≥10%时,岩石厚度以1~1.5μm为宜。
其中,粉末样品的粒径为300目,粉末样品的重量不低于1g。
步骤二、显微特征观察:将光薄片放置于显微镜下,利用透射光、正交偏光及反射光,分析样品中硅质主要的来源特征。
步骤三、元素含量分析:用XRF对粉末样品中Si、Al、Fe、Ti元素的含量进行测定。
步骤四、碎屑硅的计算:由于碎屑岩中Si含量与Al的相关性,因此碎屑硅(Siterrigenous)含量可通过微量元素Alsample含量来计算:
Siterrigenous=(Si/Al)background*Alsample
其中,(Si/Al)background采用平均页岩中硅铝的含量比,值为3.11。因此,
Siterrigenous=3.11*Alsample
步骤五、过剩硅的计算:过剩硅(Siexcess)是指非碎屑来源的硅质总和,其包括了热液硅与生物硅。过剩硅可通过样品中总的硅含量(Sisample)扣除碎屑硅(Siterrigenous)来进行计算:
Siexcess=Sisample-Siterrigenous。
步骤六、生物硅与热液硅的计算:
(1)按照Fe/Ti含量比对81个样品进行升序排列;将Fe/Ti>80的样品设为A端元组(7个样品),其主体为热液影响的过剩硅(即生物来源的过剩硅可忽略);将Fe/Ti<5的样品设为B端元组(15个样品),其主体为生物来源的过剩硅(即热液影响的过剩硅可忽略);将5≤Fe/Ti≤80的样品设为C中间组(59个样品),C中间组中需要定量计算生物硅与热液硅含量的样品设为待测组(24个样品),其余设为模拟组(35个样品),用于提供模拟计算所需的数据。本实施例的81个样品按Fe/Ti含量比排列并分组后,A端元组、B端元组和模拟组的相关数据如下表所示:
(2)计算A端元组样品的Fe/Ti平均值为117.176,Siexcess平均值为96.126;B端元组样品的Fe/Ti平均值为2.545,Siexcess平均值为50.468。设模拟组各样品中含有x含量的A组分(即热液硅的贡献度为x/(x+y))和y含量的B组分(即生物硅的贡献度为y/(x+y));通过方程Ax+By=C对37组数值(2组端元数值+35组模拟组数值)进行Metlab模拟计算,拟合得到不同Fe/Ti含量比下的x值与y值;
(3)将待测组24个样品的Fe/Ti含量比和Siexcess的值代入拟合得到的方程Ax+By=C;计算得到样品中热液硅含量为[x/(x+y)]*Siexcess;样品中生物硅的含量为[y/(x+y)]*Siexcess。待测组24个样品的测量结果和计算结果如下表所示:
样品号 | SiO2 | Al2O3 | Fe/Ti | Siexcess | 碎屑硅 | 热液硅 | 生物硅 |
M-2 | 96.36 | 1.10 | 19.71 | 92.94 | 3.42 | 12.25 | 80.69 |
M-5 | 71.79 | 8.37 | 8.69 | 45.78 | 26.02 | 5.12 | 40.66 |
M-7 | 76.92 | 7.45 | 12.19 | 53.75 | 23.17 | 7.82 | 45.93 |
M-9 | 84.50 | 4.53 | 11.49 | 70.40 | 14.10 | 6.26 | 64.14 |
M-11 | 94.45 | 1.38 | 24.13 | 90.15 | 4.30 | 16.64 | 73.51 |
M-13 | 68.76 | 5.65 | 18.13 | 51.17 | 17.58 | 14.15 | 37.02 |
M-15 | 71.60 | 5.33 | 24.09 | 55.03 | 16.57 | 20.83 | 34.20 |
M-18 | 55.99 | 5.92 | 18.71 | 37.58 | 18.41 | 17.35 | 20.23 |
M-22 | 63.65 | 6.56 | 19.86 | 43.23 | 20.42 | 17.61 | 25.62 |
M-24 | 80.49 | 4.18 | 21.66 | 67.49 | 12.99 | 16.17 | 51.32 |
M-28 | 83.22 | 6.00 | 15.72 | 64.56 | 18.66 | 10.40 | 54.16 |
M-32 | 70.33 | 5.68 | 15.67 | 52.66 | 17.67 | 11.31 | 41.34 |
M-34 | 88.52 | 4.30 | 10.68 | 75.15 | 13.37 | 5.35 | 69.79 |
M-36 | 78.98 | 6.50 | 12.69 | 58.76 | 20.22 | 7.95 | 50.81 |
M-40 | 30.22 | 0.28 | 20.62 | 29.35 | 0.86 | 24.43 | 4.93 |
M-42 | 77.06 | 10.38 | 5.54 | 44.76 | 32.29 | 2.52 | 42.24 |
M-44 | 53.02 | 3.04 | 17.35 | 43.57 | 9.45 | 14.31 | 29.26 |
M-47 | 59.90 | 6.00 | 11.15 | 41.24 | 18.66 | 7.73 | 33.51 |
M-51 | 83.07 | 5.96 | 9.86 | 64.55 | 18.52 | 5.17 | 59.38 |
M-55 | 66.46 | 14.03 | 10.03 | 22.84 | 43.62 | 8.69 | 14.15 |
M-57 | 32.26 | 1.96 | 16.01 | 26.17 | 6.10 | 16.97 | 9.20 |
M-61 | 49.34 | 5.94 | 19.75 | 30.86 | 18.48 | 21.64 | 9.22 |
M-63 | 52.45 | 8.12 | 15.72 | 27.20 | 25.26 | 16.00 | 11.20 |
M-66 | 76.79 | 8.66 | 15.91 | 49.86 | 26.93 | 11.85 | 38.01 |
可见,本发明的一种硅质岩中不同来源硅质含量的定量计算方法流程简单,分析效率高,能够较为准确地定量区分硅质岩样品中碎屑硅、热液硅、生物硅等不同来源硅的含量,对于研究硅质矿物对页岩气生成的影响具有重要意义。
以上详细描述了本发明的较佳具体实施例。应当理解,本领域的普通技术无需创造性劳动就可以根据本发明的构思作出诸多修改和变化。因此,凡本技术领域中技术人员依本发明的构思在现有技术的基础上通过逻辑分析、推理或者有限的试验可以得到的技术方案,皆应在由权利要求书所确定的保护范围内。
Claims (7)
1.一种硅质岩中不同来源硅质含量的定量计算方法,其特征在于,包括以下步骤:
步骤一、样品制备:除掉硅质岩样品的表面风化物,将所述样品分成两份,第一份制成光薄片,第二份磨制成粉末样品;
步骤二、显微特征观察:将所述光薄片放置于显微镜下,利用透射光、正交偏光及反射光,分析所述样品中硅质主要的来源特征;
步骤三、元素含量分析:用XRF对所述粉末样品中Si、Al、Fe、Ti元素的含量进行测定;
步骤四、碎屑硅的计算:通过样品中的Al含量Alsample来计算样品中的碎屑硅含量Siterrigenous:
Siterrigenous=(Si/Al)background*Alsample
其中,(Si/Al)background为平均页岩中硅铝的含量比;
步骤五、过剩硅的计算:通过样品中总的硅含量Sisample扣除碎屑硅含量Siterrigenous来进行计算样品中的过剩硅含量Siexcess:
Siexcess=Sisample-Siterrigenous;
步骤六、生物硅与热液硅的计算:
(1)按照Fe/Ti含量比对多个样品进行升序或降序排列;将Fe/Ti>80的样品设为A端元组,其主体为热液硅;将Fe/Ti<5的样品设为B端元组,其主体为生物硅;将5≤Fe/Ti≤80的样品设为C中间组,C中间组中需要定量计算生物硅与热液硅含量的样品设为待测组,其余设为模拟组;其中,所述A端元组和所述B端元组的样品数量均不少于5个;所述C中间组中模拟组的样品数量不少于10个;
(2)计算A端元组和B端元组样品的平均Fe/Ti和Siexcess的值作为端元数值;设模拟组各样品中分别含有x含量的A组分和y含量的B组分;通过方程Ax+By=C对端元数值及模拟组样品的Fe/Ti和Siexcess数值进行Metlab模拟计算,拟合得到不同Fe/Ti含量比之下的x值与y值;
(3)将待测组各样品的Fe/Ti和Siexcess的值代入拟合得到的方程Ax+By=C;计算得到待测组各样品中热液硅的含量为[x/(x+y)]*Siexcess;生物硅的含量为[y/(x+y)]*Siexcess。
2.如权利要求1所述的硅质岩中不同来源硅质含量的定量计算方法,其特征在于,步骤一中所述光薄片的制备方法如下:将硅质岩样品沿垂直层面方向切出一个平整面,抛光后用透明胶水粘至载玻片上;待胶水干后,将样品远离载玻片的一端进行切平,然后抛光直至表面见不到任何划痕,即制成所述光薄片。
3.如权利要求2所述的硅质岩中不同来源硅质含量的定量计算方法,其特征在于,所述光薄片的岩石厚度≤3μm。
4.如权利要求2所述的硅质岩中不同来源硅质含量的定量计算方法,其特征在于,当所述硅质岩中TOC≤2%时,岩石厚度大致为3μm;当2%<TOC<5%时,岩石厚度为2.5~3μm;当5%≤TOC<10%时,岩石厚度为1.5~2.5μm;当TOC≥10%时,岩石厚度为1~1.5μm。
5.如权利要求2所述的硅质岩中不同来源硅质含量的定量计算方法,其特征在于,步骤一中所述载玻片为玻璃或树脂载玻片。
6.如权利要求1所述的硅质岩中不同来源硅质含量的定量计算方法,其特征在于,步骤一中所述粉末样品的粒径为200目或更细,所述粉末样品的重量不低于1g。
7.如权利要求1所述的硅质岩中不同来源硅质含量的定量计算方法,其特征在于,步骤四中(Si/Al)background的值为3.11。
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