CN112485696A - Power supply testing device and method and server - Google Patents
Power supply testing device and method and server Download PDFInfo
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- CN112485696A CN112485696A CN202011181737.XA CN202011181737A CN112485696A CN 112485696 A CN112485696 A CN 112485696A CN 202011181737 A CN202011181737 A CN 202011181737A CN 112485696 A CN112485696 A CN 112485696A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Abstract
The invention provides a power supply testing device, a power supply testing method and a server, belongs to the technical field of network equipment, and solves the technical problem that an operation mode is complicated in the existing SSD power supply testing process. A power supply testing device comprises a GPIO converter, an overcurrent protector, a DC/DC converter and a feedback circuit; the input end of the GPIO converter is connected with the server back plate, and the over-current output end of the GPIO converter is connected with the enabling end of the over-current protector; the input end of the over-current protector is connected with the server back plate, and the output end of the over-current protector is connected with the power supply input end of the DC/DC converter; the output end of the DC/DC converter is connected with the SSD, and the feedback end of the DC/DC converter is connected with the input end of the feedback circuit; the feedback output end of the GPIO converter is connected with the enabling end of the feedback circuit; the GPIO converter outputs a feedback enabling signal to the feedback circuit, the feedback circuit inputs a feedback signal to the DC/DC converter, and the DC/DC converter adjusts output voltage according to the feedback signal.
Description
Technical Field
The invention relates to the technical field of network equipment, in particular to a power supply testing device and method and electronic equipment.
Background
With the development of network technology, the usage rate of various storage devices is higher and higher. As is well known, Solid State Disks (SSD) have great advantages in performance such as speed, power consumption, capacity, noise, reliability, and the like, compared with Hard Disk Drives (HDD). At present, although the HDD has a certain advantage in price, with the appearance of Flash Memory particles of a high-capacity Flash Memory chip (Flash EEPROM Memory, abbreviated as Flash), the SSD has a lower and lower price, and the SSD is widely applied to servers and storage devices.
Currently, to ensure that an SSD can operate reliably, the stability of the SSD power supply is ensured first. Generally, for NVMe (Non-Volatile Memory host controller interface specification) SSD, different manufacturers have different operating voltage ranges, for example: 12V plus or minus 10 percent and 12V-20 to 12V plus 10 percent; generally speaking, during the SSD power supply test, the power supply output of the dc voltage regulator needs to be manually adjusted to supply power to the SSD, or the power supply output of the server backplane is directly adjusted to supply power to the SSD.
Therefore, the technical problem that the operation mode is complicated exists in the existing SSD power supply testing process.
Disclosure of Invention
The invention aims to provide a power supply testing device, a power supply testing method and a server, and solves the technical problem that an operation mode is complicated in the existing SSD power supply testing process.
In a first aspect, the present invention provides a power test apparatus, which includes a GPIO (General-purpose input/output) Converter, an overcurrent protector, a DC/DC (Direct-Direct Current Converter) Converter, and a feedback circuit;
the input end of the GPIO converter is connected with the server back plate, and the over-current output end of the GPIO converter is connected with the enabling end of the over-current protector;
the input end of the over-current protector is connected with the server back plate, and the output end of the over-current protector is connected with the power supply input end of the DC/DC converter;
the output end of the DC/DC converter is connected with the SSD, and the feedback end of the DC/DC converter is connected with the input end of the feedback circuit;
the feedback output end of the GPIO converter is connected with the enabling end of the feedback circuit;
the GPIO converter outputs a feedback enabling signal to the feedback circuit, the feedback circuit inputs a feedback signal to the DC/DC converter, and the DC/DC converter adjusts output voltage according to the feedback signal.
Further, the feedback circuit comprises a first main circuit resistor, a second main circuit resistor, a first branch circuit resistor and a second branch circuit resistor;
the first main circuit resistor and the second main circuit resistor are connected between the output end of the DC/DC converter and the ground wire in series, and the output end of the feedback circuit is connected between the first main circuit resistor and the second main circuit resistor;
the first branch circuit resistor is connected in parallel with the first main circuit resistor, and the second branch circuit resistor is connected in parallel with the second main circuit resistor.
Furthermore, the first branch resistor is connected in series with a first MOS transistor, and the second branch resistor is connected in series with a second MOS transistor.
Further, the feedback output end of the GPIO converter includes a first switching signal line and a second switching signal line;
the first switch signal line is connected with the grid electrode of the first MOS tube, and the second switch signal line is connected with the grid electrode of the second MOS tube.
Further, the input end of the GPIO converter is connected with the server backplane through an I2C bus.
In a second aspect, the present invention further provides a server, including a server backplane, an SSD, and the power testing apparatus according to the first aspect;
the input end of the GPIO converter of the power supply testing device and the input end of the overcurrent protector of the power supply testing device are respectively connected with the server backboard, and the output end of the DC/DC converter of the power supply testing device is connected with the SSD.
Further, the SSD includes U.2 connectors, and the server backplane connects to the U.2 connectors of the SSD via PCIe.
In a third aspect, the present invention further provides a power testing method applied to the server according to the second aspect, where the method includes:
outputting a power supply enabling signal to a power supply testing device to enable the DC/DC converter to output power supply voltage to the SSD;
and outputting a voltage regulating enable signal to the power supply testing device to regulate a feedback signal output by the feedback circuit, so that the DC/DC converter regulates the output voltage according to the feedback signal.
In a fourth aspect, the invention also provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, carries out the steps of the method according to the third aspect.
The invention provides a power supply testing device which comprises a GPIO (general purpose input/output) converter, an overcurrent protector, a DC/DC converter and a feedback circuit. The input end of the GPIO converter is connected with the server backboard, the overcurrent output end of the GPIO converter is connected with the enabling end of the overcurrent protector, the input end of the overcurrent protector is connected with the server backboard, and the output end of the overcurrent protector is connected with the power input end of the DC/DC converter. The voltage of the server is output to the input end of the overcurrent protector, whether the overcurrent protector is enabled or not can be controlled through the server, and whether the voltage can be output to the DC/DC converter through the overcurrent protector or not is further controlled. The output end of the DC/DC converter is connected with the SSD, the feedback end of the DC/DC converter is connected with the input end of the feedback circuit, and the feedback output end of the GPIO converter is connected with the enabling end of the feedback circuit. The GPIO converter outputs a feedback enabling signal to the feedback circuit, the feedback circuit inputs a feedback signal to the DC/DC converter, and the DC/DC converter adjusts output voltage according to the feedback signal. Namely, through the server, the switching of the overcurrent output end of the GPIO converter can control whether the overcurrent protector is enabled or not, and further control whether the voltage can be output to the DC/DC converter or not, so that the purpose of the power-on and power-off cycle test can be realized by outputting the voltage to the SSD through the DC/DC converter. The server can control whether the feedback circuit is enabled or not by means of the feedback output end of the GPIO converter, so that the DC/DC converter can receive different feedback information, and the DC/DC converter outputs different voltages to the SSD corresponding to the feedback information, thereby achieving the purpose of testing the bias of the SSD power supply.
By adopting the power supply testing device provided by the invention, the server can respectively control the enabling of the overcurrent protector and the feedback circuit through the switching of different output ends of the GPIO converter, so as to control whether the DC/DC converter can output voltage to the SSD and the size of the voltage value output to the SSD, and not only can the SSD be subjected to power-up and power-down cycle test, but also the SSD power supply can be subjected to a pull bias test. The problem of in the power test, the loaded down with trivial details operation of manual adjustment direct current steady voltage source has been solved, has realized the automation mechanized operation to SSD power test, has improved the power development test efficiency of SSD product, has shortened research and development cycle.
Accordingly, the server, the power supply testing method and the computer readable storage medium provided by the embodiment of the invention also have the technical effects.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a schematic diagram of a power testing apparatus according to an embodiment of the present invention;
fig. 2 is a flowchart of a power testing method according to an embodiment of the invention.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terms "comprising" and "having," and any variations thereof, as referred to in embodiments of the present invention, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements but may alternatively include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Currently, to ensure that an SSD can operate reliably, the stability of the SSD power supply is ensured first. Generally, for NVMe (Non-Volatile Memory host controller interface specification) SSD, different manufacturers have different operating voltage ranges, for example: 12V plus or minus 10 percent and 12V-20 to 12V plus 10 percent; generally speaking, during the SSD power supply test, the power supply output of the dc voltage regulator needs to be manually adjusted to supply power to the SSD, or the power supply output of the server backplane is directly adjusted to supply power to the SSD.
Therefore, the technical problem that the operation mode is complicated exists in the existing SSD power supply testing process.
To solve the above problems, an embodiment of the present invention provides a power supply testing apparatus.
Example 1:
as shown in fig. 1, a power supply testing device provided in an embodiment of the present invention includes a GPIO converter, an overcurrent protector, a DC/DC converter, and a feedback circuit.
The input end of the GPIO converter is connected with the server backboard, the overcurrent output end of the GPIO converter is connected with the enabling end of the overcurrent protector, the input end of the overcurrent protector is connected with the server backboard, and the output end of the overcurrent protector is connected with the power input end of the DC/DC converter. The voltage of the server is output to the input end of the overcurrent protector, whether the overcurrent protector is enabled or not can be controlled through the server, and whether the voltage can be output to the DC/DC converter through the overcurrent protector or not is further controlled. The output end of the DC/DC converter is connected with the SSD, the feedback end of the DC/DC converter is connected with the input end of the feedback circuit, and the feedback output end of the GPIO converter is connected with the enabling end of the feedback circuit. The GPIO converter outputs a feedback enabling signal to the feedback circuit, the feedback circuit inputs a feedback signal to the DC/DC converter, and the DC/DC converter adjusts output voltage according to the feedback signal. Namely, through the server, the switching of the over-current output end of the GPIO converter can control whether the over-current protector is enabled or not, and further control whether the voltage can be output to the DC/DC converter or not, so that the purpose of performing power-on and power-off cycle test on the SSD can be realized by outputting the voltage to the SSD through the DC/DC converter. Through the server, whether the feedback circuit is enabled or not can be controlled by switching the feedback output end of the GPIO converter, the DC/DC converter can receive different feedback information, the DC/DC converter outputs different voltages to the SSD according to the feedback information, and the purpose of carrying out a bias test on the SSD power supply is achieved.
By adopting the power supply testing device provided by the invention, the server can respectively control the enabling of the overcurrent protector and the feedback circuit through the switching of different output ends of the GPIO converter, so as to control whether the DC/DC converter can output voltage to the SSD and the voltage value output to the SSD, thereby achieving the purpose of circularly testing the power supply and the power off of the SSD and carrying out the pull bias test on the SSD power supply. The problem of in the power test, the loaded down with trivial details operation of manual adjustment direct current steady voltage source has been solved, has realized the automation mechanized operation to SSD power test, has improved the power development test efficiency of SSD product, has shortened research and development cycle.
In one possible embodiment, the feedback circuit includes a first main circuit resistor, a second main circuit resistor, a first branch circuit resistor, and a second branch circuit resistor. The first main circuit resistor and the second main circuit resistor are connected in series between the output end of the DC/DC converter and the ground wire, the output end of the feedback circuit is connected between the first main circuit resistor and the second main circuit resistor, the first branch circuit resistor is connected with the first main circuit resistor in parallel, and the second branch circuit resistor is connected with the second main circuit resistor in parallel. By setting a plurality of main circuit resistors and branch circuit resistors, various combination modes of different resistors in series connection or parallel connection can be adjusted, the voltage of the feedback end of the DC/DC converter is unchanged, only the combination mode of the resistors in the circuit is changed, and then the voltage value of the output end of the DC/DC converter can be adjusted, so that adjustment and bias test of multiple groups of SSD wide-range power supply sources can be completed.
In a possible implementation, the first branch resistor is connected in series with a first MOS transistor, and the second branch resistor is connected in series with a second MOS transistor. The first MOS tube and the second MOS tube are respectively arranged on the two resistor branches, and the MOS tubes can be used for switching on or switching off the branch circuits where the MOS tubes are located according to needs to control whether the branch resistors are connected in parallel or not, so that the output end of the DC/DC converter can output different voltages to the SSD.
In one possible implementation, the feedback output terminal of the GPIO converter includes a first switching signal line and a second switching signal line. The first switch signal line is connected with the grid electrode of the first MOS tube, and the second switch signal line is connected with the grid electrode of the second MOS tube. The GPIO converter is connected with the grid electrode of the MOS tube through a switch signal wire, and the feedback output end of the GPIO converter can be used for respectively outputting high level or low level to the first MOS tube and the second MOS tube so as to control the on or off of the MOS tubes. At high level, the MOS transistor is in a conducting state, and at low level, the MOS transistor is in a stopping state.
For example: the first feedback enable signal and the second feedback enable signal of the feedback output end of the IIC extended GPIO converter output low levels by default, at the moment, the first MOS tube and the second MOS tube are turned off by default, at the moment, the voltage of the output end of the DC/DC converter is adjusted by the series connection form of (R1+ R2) and R7, for example, the feedback voltage of the Feedback (FB) end is 1.0V, R1 selects 110K-0402-1%, R2 selects 0R-0402-1%, R7 selects 10K-0402-1%, and at the moment, the output voltage is about 12V.
When the first feedback enable signal outputs high level and the second feedback enable signal outputs low level, the first MOS tube is opened, the second MOS tube is closed, and the output voltage is regulated by connecting (R1+ R2) and (R3+ R4) in parallel and then connecting R7 in series, which is suitable for the condition that the output voltage is less than 12.0V. Assuming that the voltage at the output of the DC/DC converter needs to be set to 10.8V, then R3 can be selected to be 887K-0402-1%, and R4 can be selected to be 11.3K-0402-1%.
When the first feedback enable signal outputs low level and the second feedback enable signal outputs high level, the first MOS tube is turned off, the second MOS tube is turned on, and the output voltage is regulated by connecting (R5+ R6) with R7 in parallel and connecting (R1+ R2) in series, which is suitable for the condition that the output voltage is less than 12.0V. Assuming that the voltage of the output end of the DC/DC converter to be set is 13.2V, 90.9K-0402-1% can be selected for R5, and 750R-0402-1% can be selected for R6.
For the situation of multiple power outputs, a plurality of groups of MOS tube control circuits can be expanded, the high/low level adjustment feedback circuit output by the GPIO is expanded through the IIC, the resistance values of the resistors are reasonably distributed, and the purpose of outputting voltages in multiple paths is achieved, so that multiple wide-range and multi-group wide-range power supplies can be output to the SSD.
In one possible implementation, the input terminal of the GPIO converter is connected to the server backplane through an I2C bus. The I2C bus has strong compatibility, is a widely used protocol, has simplicity, can complete wiring by only needing two wires, occupies less space, and is connected with the server backboard by the I2C bus.
Example 2:
the embodiment of the invention also provides a server, which comprises a server backboard, an SSD and the power supply testing device provided by the embodiment 1.
The input end of the GPIO converter of the power supply testing device and the input end of the overcurrent protector of the power supply testing device are respectively connected with the server backboard, and the output end of the DC/DC converter of the power supply testing device is connected with the SSD. The server backboard is connected with the input end of the flow protector, so that voltage can be output to the power supply testing device from the server end. The server backboard is connected with the input end of the GPIO converter, so that the server can control whether the power supply testing device outputs voltage to the SSD end or not and the size of the output voltage. Therefore, the power supply testing device can be used for carrying out power-on and power-off operations on the SSD and carrying out automatic operations of adjustment and bias test on a plurality of groups of wide-range power supply sources.
In this regard, the SSD includes an U.2 connector, and the server backplane connects to the U.2 connector of the SSD via PCIe. Information interaction is performed between the server and the SSD through a PCIE (peripheral component interconnect express) signal.
Example 3:
an embodiment of the present invention further provides a power testing method, which is applied to the server provided in embodiment 2, where the method shown in fig. 2 includes:
s1: and outputting a power supply enabling signal to the power supply testing device to enable the DC/DC converter to output the power supply voltage to the SSD.
S2: and outputting a voltage regulating enable signal to the power supply testing device to regulate a feedback signal output by the feedback circuit, so that the DC/DC converter regulates the output voltage according to the feedback signal.
Example 4:
an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the steps of the method provided in embodiment 3.
The power testing method, the server and the computer readable storage medium provided by the embodiment of the invention have the same technical characteristics as the power testing device provided by the embodiment, so the same technical problems can be solved, and the same technical effects can be achieved.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or the orientations or positional relationships that the products of the present invention are conventionally placed in use, and are only used for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The apparatus provided by the embodiment of the present invention may be specific hardware on the device, or software or firmware installed on the device, etc. The device provided by the embodiment of the present invention has the same implementation principle and technical effect as the method embodiments, and for the sake of brief description, reference may be made to the corresponding contents in the method embodiments without reference to the device embodiments. It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the foregoing systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus and method can be implemented in other ways. The apparatus embodiments described above are merely illustrative, and for example, the flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present invention, which are used for illustrating the technical solutions of the present invention and not for limiting the same, and the protection scope of the present invention is not limited thereto, although the present invention is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; and the modifications, changes or substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention. Are intended to be covered by the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (9)
1. A power supply testing device is characterized by comprising a GPIO converter, an overcurrent protector, a DC/DC converter and a feedback circuit;
the input end of the GPIO converter is connected with the server back plate, and the over-current output end of the GPIO converter is connected with the enabling end of the over-current protector;
the input end of the over-current protector is connected with the server back plate, and the output end of the over-current protector is connected with the power supply input end of the DC/DC converter;
the output end of the DC/DC converter is connected with the SSD, and the feedback end of the DC/DC converter is connected with the input end of the feedback circuit;
the feedback output end of the GPIO converter is connected with the enabling end of the feedback circuit;
the GPIO converter outputs a feedback enabling signal to the feedback circuit, the feedback circuit inputs a feedback signal to the DC/DC converter, and the DC/DC converter adjusts output voltage according to the feedback signal.
2. The power supply test device of claim 1, wherein the feedback circuit comprises a first main circuit resistor, a second main circuit resistor, a first branch circuit resistor, and a second branch circuit resistor;
the first main circuit resistor and the second main circuit resistor are connected between the output end of the DC/DC converter and the ground wire in series, and the output end of the feedback circuit is connected between the first main circuit resistor and the second main circuit resistor;
the first branch circuit resistor is connected in parallel with the first main circuit resistor, and the second branch circuit resistor is connected in parallel with the second main circuit resistor.
3. The power supply testing device according to claim 2, wherein the first branch resistor is connected in series with a first MOS transistor, and the second branch resistor is connected in series with a second MOS transistor.
4. The power supply testing device according to claim 3, wherein the feedback output terminal of the GPIO converter comprises a first switch signal line and a second switch signal line;
the first switch signal line is connected with the grid electrode of the first MOS tube, and the second switch signal line is connected with the grid electrode of the second MOS tube.
5. The power supply testing device of claim 1, wherein the input terminal of the GPIO converter is connected to the server backplane through an I2C bus.
6. A server comprising a server backplane, an SSD, and a power test apparatus according to any one of claims 1 to 5;
the input end of the GPIO converter of the power supply testing device and the input end of the overcurrent protector of the power supply testing device are respectively connected with the server backboard, and the output end of the DC/DC converter of the power supply testing device is connected with the SSD.
7. The server of claim 6, wherein the SSD comprises an U.2 connector, and wherein the server backplane is connected to the U.2 connector of the SSD by PCIe.
8. A power supply testing method applied to the server according to claim 6 or 7, the method comprising:
outputting a power supply enabling signal to a power supply testing device to enable the DC/DC converter to output power supply voltage to the SSD;
and outputting a voltage regulating enable signal to the power supply testing device to regulate a feedback signal output by the feedback circuit, so that the DC/DC converter regulates the output voltage according to the feedback signal.
9. A computer-readable storage medium, characterized in that a computer program is stored on the computer-readable storage medium, which computer program, when being executed by a processor, carries out the steps of the method as claimed in claim 8.
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