CN112485671B - HIL test system and method for testing daisy chain master and slave plates of battery management system - Google Patents
HIL test system and method for testing daisy chain master and slave plates of battery management system Download PDFInfo
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- CN112485671B CN112485671B CN202011412936.7A CN202011412936A CN112485671B CN 112485671 B CN112485671 B CN 112485671B CN 202011412936 A CN202011412936 A CN 202011412936A CN 112485671 B CN112485671 B CN 112485671B
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Abstract
The invention relates to an HIL test system and method for testing daisy-chain master and slave plates of a battery management system. The HIL tester system comprises a PC upper computer, a test model system and a BMS test board; a test management system is arranged in the PC upper computer; the test model system comprises a test environment model and a battery model which are in communication connection with the test management system; the simulation test mechanism comprises a simulation test host connected with the test management system in a communication manner, a test mainboard connected with the simulation test host in a communication manner, and a single battery simulation board card, a resistor board card and a daisy chain board card which are respectively connected with the test mainboard in a communication manner; the BMS test board comprises a BMS main board and at least two BMS slave boards which are sequentially in communication connection, and the daisy chain board card is in communication connection with the BMS main board or the BMS slave boards. The invention aims at the master plate BMS _ HIL of the CAN communication, and the battery simulation board card is not enough to simulate the HIL of the sufficient battery cell state, so that a novel HIL test scheme of the daisy chain BMS master plate and the slave plate is realized.
Description
Technical Field
The invention relates to the technical field of battery management systems, in particular to an HIL (hardware-in-the-loop) test system and method for testing daisy-chain master and slave plates of a battery management system.
Background
The battery management system is an important ring on the whole vehicle and is directly related to the dynamic property and the safety of the whole vehicle. Currently, to accommodate the safety requirements of battery management systems, a fourth generation high voltage battery monitor MAX17823 is being introduced for testing lithium ion batteries and fuel cells in demanding automotive and industrial applications. The MAX17823 provides a whole set of special ISO-26262 integrated diagnostic functions, so as to improve the running distance of the electric automobile and the hybrid electric automobile to the maximum extent and ensure the safety and reliability of the battery and the fuel cell. The new application of the high-voltage Battery monitor MAX17823 also puts new requirements on BMS (Battery management System) _ HIL (Hardware-in-the-Loop), and a set of daisy chain communication mode suitable for the fourth-generation high-voltage Battery monitor MAX17823 is required to perform BMS _ HIL test.
However, the existing BMS _ HIL is designed for the existing BMS master-slave board test in the CAN communication mode and is not adapted to the new requirements of the chrysanthemum chain plate BMS master-slave board test. Particularly for the existing BMS _ HIL, the number of the battery monomer simulation board cards is not enough to simulate the requirement of the number of the battery monomers in the existing whole vehicle, and a part of lacking electric cores must be simulated by a technical means.
Disclosure of Invention
The invention provides an HIL test system and method for testing a daisy chain master plate and a daisy chain slave plate of a battery management system, aiming at master plate BMS _ HIL of CAN communication and HIL of a battery simulation board card which is not enough to simulate a sufficient battery cell state, and realizing a new HIL test scheme of the daisy chain BMS master plate and the slave plate.
In a first aspect, the present invention provides an HIL test system for testing daisy-chain masters and slaves of a battery management system, including the following steps:
the PC upper computer is internally provided with a test management system;
the test model system comprises a test environment model and a battery model which are in communication connection with the test management system;
the simulation test mechanism comprises a simulation test host which is in communication connection with the test management system, a test mainboard which is in communication connection with the simulation test host, and a single battery simulation board card, a resistor board card and a daisy chain board card which are in communication connection with the test mainboard respectively, wherein the daisy chain board card is in communication connection with the battery model, and the single battery simulation board card and the resistor board card are in communication connection with the test environment model; and the number of the first and second groups,
the BMS test board comprises a BMS main board and at least two BMS slave boards which are sequentially in communication connection, the daisy chain board is in communication connection with the BMS main board or the BMS slave boards through a daisy chain channel, and the BMS main board and the BMS slave boards are in communication connection with the single battery simulation board, the resistor board and the test environment model.
In some embodiments, the daisy chain board card is connected between the BMS board and one of the BMS boards by a daisy chain channel; alternatively, the first and second electrodes may be,
the daisy chain board card is connected between the two BMS slave boards through a daisy chain channel.
In some embodiments, the battery cell simulation board card, the resistor board card and the daisy chain board card are all plugged on the test mainboard through a pcie interface;
the daisy chain board card is connected with the BMS main board or the BMS slave board through a daisy chain channel by adopting an RJ45 port.
In a second aspect, the present invention further provides a HIL testing method for daisy chain master-slave board testing of a battery management system, including the following steps:
building the HIL test system for testing the daisy chain master and slave plates of the battery management system;
performing hardware configuration, software link configuration and communication protocol configuration on a daisy chain board card in the HIL test system;
and starting the HIL test of the BMS mainboard or the BMS slave board through a test management system arranged in the PC upper computer.
In some embodiments, the step of "performing hardware configuration on a daisy chain board card in the HIL test system" specifically includes the following steps:
hardware identification is carried out on the daisy chain board card in the HIL test system through the test management system, and the identified daisy chain board card is placed into a hardware library of the test management system;
and setting various state values of the battery managed by the BMS slave board simulated by the daisy chain board card through a test management system.
In some embodiments, the step of "performing software link configuration on a daisy chain board card in the HIL test system" specifically includes the following steps:
and matching the input/output of the daisy chain board card, the battery monomer simulation board card, the resistance board card, the battery model and the energy distribution model to form a closed loop.
In some embodiments, the step of matching input/output of the daisy chain board card, the battery cell simulation board card, the resistor board card, the battery model, and the energy distribution model to form a closed loop includes the following steps:
inputting a battery voltage value sent by a battery monomer simulation board card into a battery model, and inputting a corrected battery voltage value into a daisy chain board card;
linking the temperature output by the resistor board card with the temperature of the daisy chain board card;
linking a hot shutdown occurrence/non-occurrence signal in the energy distribution model with the daisy chain board card;
linking an overvoltage mark, an undervoltage mark, battery charging control, battery discharging control and the SOC sum of the battery in the battery model with the daisy chain board card;
and forming a test closed loop after the software connection is completed.
In some embodiments, the step of "performing communication protocol configuration on a daisy chain board card in the HIL test system" specifically includes the following steps:
the daisy chain communication protocol is directly embedded in the daisy chain board card, and the daisy chain communication between the BMS slave boards is realized.
In some embodiments, the step of "directly embedding the daisy chain communication protocol in the daisy chain board card to realize the daisy chain communication between the BMS slave boards" specifically includes the following steps:
directly embedding a daisy chain communication protocol into a daisy chain board card;
when the daisy chain board card is positioned between the two BMS slave boards, the daisy chain board card simulates one BMS slave board according to the daisy chain communication protocol and communicates with the two BMS slave boards.
In some embodiments, the step of "directly embedding the daisy chain communication protocol in the daisy chain board card to realize the daisy chain communication between the BMS slave boards" specifically includes the following steps:
directly embedding a daisy chain communication protocol into a daisy chain board card;
when the daisy chain integrated circuit board is located between BMS mainboard and BMS slave plate, the daisy chain integrated circuit board simulates many BMS slave plates according to the daisy chain communication protocol, and communicates with BMS mainboard, BMS slave plate.
The technical scheme provided by the invention has the beneficial effects that: in order to adapt to the application of the new high-voltage battery monitor MAX17823, the function test of the BMS master slave plate of the daisy-chain communication mode is realized in the BMS _ HIL in the lowest cost and the simplest mode.
The embodiment of the invention provides an HIL test system and method for testing a daisy chain master plate and a daisy chain slave plate of a battery management system, and provides a technical method for realizing the HIL test of a novel daisy chain BMS master plate and a novel daisy chain BMS slave plate aiming at a master plate BMS _ HIL and a slave plate BMS _ HIL of CAN communication and a HIL of a battery simulation board card which is not enough to simulate a sufficient battery cell state. On BMS _ HIL basis promptly, add a daisy chain integrated circuit board, after configuring software, hardware, communication protocol, simulate one or polylith BMS slave plate with the daisy chain integrated circuit board, realize the HIL test of the daisy chain mainboard of BMS, labour saving and time saving practices thrift the cost.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic block diagram of an HIL test system for testing daisy-chained masters and slaves of a battery management system according to an embodiment of the present invention;
fig. 2 is a schematic hardware configuration diagram of an HIL test system for testing a daisy-chain master/slave board of a battery management system according to an embodiment of the present invention;
fig. 3 is a schematic flowchart illustrating steps of an HIL testing method for testing daisy chains of battery management systems according to an embodiment of the present invention;
fig. 4 is a detailed flowchart illustrating a step S200 of the HIL testing method for testing the daisy chain master/slave board of the battery management system according to the embodiment of the present invention;
fig. 5 is a schematic diagram of a software connection configuration of the HIL testing method for testing the daisy chain master-slave board of the battery management system according to the embodiment of the present invention.
Detailed Description
Reference will now be made in detail to the present embodiments of the invention, examples of which are illustrated in the accompanying drawings. While the invention will be described in conjunction with the specific embodiments, it will be understood that they are not intended to limit the invention to the embodiments described. On the contrary, it is intended to cover alternatives, modifications, and equivalents as may be included within the spirit and scope of the invention as defined by the appended claims. It should be noted that the method steps described herein may be implemented by any functional block or functional arrangement, and that any functional block or functional arrangement may be implemented as a physical entity or a logical entity, or a combination of both.
In order that those skilled in the art will better understand the present invention, the following detailed description of the invention is provided in conjunction with the accompanying drawings and the detailed description of the invention.
Note that: the example to be described next is only a specific example, and does not limit the embodiments of the present invention necessarily to the following specific steps, values, conditions, data, orders, and the like. Those skilled in the art can, upon reading this specification, utilize the concepts of the present invention to construct more embodiments than those specifically described herein.
At present, BMS _ HIL in the related art is used for testing the existing BMS master and slave boards in a CAN communication mode and is not suitable for the testing requirements of the new chrysanthemum chain plate BMS master and slave boards. Particularly for the existing BMS _ HIL, the number of the battery monomer simulation board cards is not enough to simulate the requirement of the number of the battery monomers in the existing whole vehicle, and a part of lacking electric cores must be simulated by a technical means. The invention provides an HIL test system and method for testing a daisy chain master plate and a daisy chain slave plate of a battery management system, aiming at master plate BMS _ HIL of CAN communication and HIL of a battery simulation board card which is not enough to simulate a sufficient battery cell state, and realizing a new HIL test scheme of the daisy chain BMS master plate and the slave plate.
Specifically, as shown in fig. 1, the invention provides an HIL test system for testing a daisy chain master and slave board of a battery management system, which comprises a PC upper computer, a test model system, a simulation test mechanism and a BMS test board, and is used for performing HIL test on the BMS test board.
Furthermore, a test management system is arranged in the PC upper computer. Furthermore, the test model system may include a test environment model and a battery model communicatively coupled to a test management system. Moreover, the simulation test mechanism may include a simulation test host communicatively connected to the test management system, a test motherboard communicatively connected to the simulation test host, and a cell simulation board, a resistor board, and a daisy chain board communicatively connected to the test motherboard, respectively, where the daisy chain board is communicatively connected to the battery model, and both the cell simulation board and the resistor board are communicatively connected to the test environment model. Moreover, above-mentioned BMS survey test panel can include communication connection's BMS mainboard and two at least BMS slave plates in proper order, and above-mentioned daisy chain integrated circuit board passes through daisy chain passageway and BMS mainboard or BMS slave plate communication connection, and BMS mainboard and BMS slave plate all with battery monomer emulation integrated circuit board, resistance integrated circuit board and test environment model communication connection. And the test management system of the PC upper computer is responsible for coordination of software and hardware. The software is a testing software and a testing model, and the hardware comprises a board card and a wiring harness.
Also, in some embodiments, as shown in fig. 2, the daisy chain board card is connected between the BMS board and one BMS board through daisy chain channels; alternatively, the daisy chain board is connected between the two BMS slave boards through a daisy chain channel. For example, when the daisy chain board card is connected with the BMS slave board 2 by using the daisy chain channel 1, or the daisy chain board card is connected with the BMS slave board 1 by using the daisy chain channel 2, the daisy chain board card only simulates one slave board; when the daisy chain board card is connected with the BMS main board by the daisy chain channel 3, a plurality of BMS main boards can be simulated to participate in the test.
In some embodiments, the single battery simulation board card, the resistor board card and the daisy chain board card are all plugged into the test motherboard through a pcie interface; the daisy chain board card is connected with the BMS main board or the BMS slave board through a daisy chain channel by adopting an RJ45 port. The connection mode is simple and convenient.
The operation principle of the HIL test system for testing the daisy chain master and slave plates of the battery management system is as follows:
confirming the physical position of the daisy chain board card, namely linking the daisy chain board card between the BMS main board and the BMS slave board or between the BMS slave boards through a daisy chain channel according to the test requirement, wherein the link of hardware is realized;
according to the actual modeling conditions of the test environment model and the battery model, linking the hardware interface of the daisy chain board card with the input/output of the model: inputting a battery voltage value sent by a battery monomer simulation board card into a PC upper computer through a simulation test host (such as RPTC, an industrial tablet personal computer), and correcting a signal through the PC upper computer to obtain a battery model; linking the temperature output by the resistor board card with the temperature of the daisy chain board card; connecting a hot shutdown occurrence/non-occurrence signal in an energy distribution model in a test model with a daisy chain board card; linking overvoltage, undervoltage, charging, discharging and SOC values in the battery model with the daisy chain board card to form a closed loop link for testing;
the test management system starts a test key, the daisy chain board card simulates one or more BMS slave boards, receives a temperature signal from the resistance board card, a battery voltage signal of the battery monomer simulation board card, and receives conditioned battery monomer voltage signals, overvoltage, undervoltage and charge-discharge signals from the test environment model to form a closed loop. And when the battery monomer simulation board card is not enough to simulate the current required battery, the battery model in the test model is linked with the daisy chain board card to complete the battery entity simulation of the tested board card. The BMS main board, the BMS slave board and the daisy chain board card are communicated with each other according to a daisy chain protocol embedded in the daisy chain board card. The test mainboard exchanges all information with the simulation test host, and the CAN protocol is also followed.
Aiming at master and slave boards BMS _ HIL of CAN communication, and the HIL of a battery cell state which is not enough to be simulated by a battery simulation board card, a technical method is provided for realizing the HIL test of a new daisy chain BMS master and slave boards. On BMS _ HIL basis promptly, add a daisy chain integrated circuit board, after configuring software, hardware, communication protocol, simulate one or polylith BMS slave plate with the daisy chain integrated circuit board, realize the HIL test of the daisy chain mainboard of BMS, labour saving and time saving practices thrift the cost.
In addition, as shown in fig. 3, for the HIL test system for testing the daisy chain master and slave boards of the battery management system, the present invention further provides an HIL test method for testing the daisy chain master and slave boards of the battery management system, including the following steps:
s100, building an HIL test system for testing a daisy chain master plate and a daisy chain slave plate of a battery management system;
s200, performing hardware configuration, software link configuration and communication protocol configuration on a daisy chain board card in the HIL test system;
s300, starting the HIL test of the BMS mainboard or the BMS slave board through a test management system arranged in the PC upper computer.
Furthermore, in some embodiments, as shown in fig. 4, the step of "performing hardware configuration on the daisy chain board card in the HIL test system" in the step S200 specifically includes the following steps:
s210, performing hardware identification on the daisy chain board card in the HIL test system through the test management system, and putting the identified daisy chain board card into a hardware library of the test management system;
and S220, setting various state values of the battery managed by the BMS slave board simulated by the daisy chain board card through the test management system.
After the daisy chain board card is connected with the test mainboard, the BMS mainboard or the BMS slave board, the hardware configuration needs to be carried out through a test management system of the PC upper computer.
In some embodiments, the step S220 of setting the state values of the batteries managed by the BMS slave board simulated by the daisy chain board card through the test management system specifically includes the following steps:
and setting a default value BatteryVoltage of a battery voltage value obtained by the BMS slave board to be simulated by the daisy chain board card from the battery monomer simulation board card through a test management system. If one BMS slave board simulated by one daisy chain board card manages 12 batteries, the default value of the 12 batteries is set;
and setting an overvoltage mark CxOV of the battery voltage obtained by the BMS slave board to be simulated by the daisy chain board card from the single battery simulation board card through a test management system. I.e. the overpressure signature of each cell simulated;
and setting an under-voltage mark CxUV of the battery voltage obtained by the BMS slave board to be simulated by the daisy chain board card from the single battery simulation board card through a test management system. The under-voltage signature of each cell being simulated;
setting battery charge and discharge control of BMS slave board management to be simulated by the daisy chain board card through a test management system;
setting the on/off of a GPIO pin pull-down circuit of a battery managed by a BMS slave board to be simulated by a daisy chain board card through a test management system;
setting a GPIO voltage value of a battery managed by a BMS slave board to be simulated by the daisy chain board card through a test management system;
setting an ADC mode option ADCOPT of a battery managed by a BMS slave board to be simulated by the daisy chain board card through a test management system;
setting the discharge time DCTO of the battery managed by the BMS slave board to be simulated by the daisy chain board card by a test management system to be 120min at most;
setting the temperature ITMP of the daisy chain board card through a test management system;
setting an automatic test result MUXFAIL of the multiplexer of the daisy chain board card through a test management system;
setting the SOC sum of the battery managed by the BMS slave board to be simulated by the daisy chain board card through a test management system;
through a test management system, setting that the hot parking machine of the BMS to be simulated by the daisy chain board card does not occur/has occurred THSD;
setting an overvoltage limit value VOV (voltage-voltage) of a battery managed by the BMS to be simulated by the daisy chain board card through a test management system;
and setting the voltage shortage limit VUV of the battery managed by the BMS to be simulated by the daisy chain board card through the test management system.
In addition, in some embodiments, as shown in fig. 5, the step of "performing software link configuration on the daisy chain board card in the HIL test system" in step S200 specifically includes the following steps:
and S230, matching input/output of the daisy chain board card, the battery monomer simulation board card, the resistor board card, the battery model and the energy distribution model to form a closed loop.
In the test model in the PC level, the matching of the daisy chain board card and the input/output of the test model is performed. The daisy chain hardware, the board card required by the test and the input/output of the test model are matched to form a closed loop.
In some embodiments, the step S230 of matching the input/output of the daisy chain board, the battery cell simulation board, the resistor board, the battery model, and the energy distribution model to form a closed loop includes the following steps:
s232, inputting a battery voltage value sent by the battery monomer simulation board card into a battery model, and inputting the corrected battery voltage value into the daisy chain board card;
s234, linking the temperature output by the resistor board card with the temperature of the daisy chain board card;
s236, linking a hot shutdown occurrence/non-occurrence signal in the energy distribution model with the daisy chain board card;
s238, linking an overvoltage mark, an undervoltage mark, battery charging control, battery discharging control and the SOC sum of the battery in the battery model with the daisy chain board card;
and S239, forming a test closed loop after the software connection is completed.
In addition, in some embodiments, the step of "performing communication protocol configuration on the daisy chain board card in the HIL test system" in the step S200 includes the following steps:
and S240, directly embedding the daisy chain communication protocol into the daisy chain board card to realize the daisy chain communication between the BMS slave boards.
In some embodiments, the step S240 of directly embedding the daisy chain communication protocol in the daisy chain board card to implement the daisy chain communication between the BMS slave boards includes the following steps:
s242, directly embedding the daisy chain communication protocol into the daisy chain board card;
and S244, when the daisy chain board card is positioned between the two BMS slave boards, simulating one BMS slave board by the daisy chain board card according to the daisy chain communication protocol, and communicating with the two BMS slave boards.
The daisy chain board card is placed between the BMS slave board 1 and the BMS slave board 2, the daisy chain board card simulates the information of one BMS slave board, and according to the communication protocol in the daisy chain board card, the daisy chain board card simulates one board card to communicate with the BMS slave board 1 and the BMS slave board 2.
In some embodiments, the step S240 of directly embedding the daisy chain communication protocol in the daisy chain board card to implement the daisy chain communication between the BMS slave boards includes the following steps:
s242, directly embedding the daisy chain communication protocol into the daisy chain board card;
and S246, when the daisy chain board card is positioned between the BMS main board and the BMS slave boards, simulating the plurality of BMS slave boards by the daisy chain board card according to the daisy chain communication protocol, and communicating with the BMS main board and the BMS slave boards.
The daisy chain board is located between the BMS motherboard and the BMS slave board, and then in the daisy chain board, the communication protocol is also embedded. At this moment, the daisy chain integrated circuit board can simulate polylith integrated circuit board, communicates with BMS mainboard, BMS slave plate. And analyzing the information of the BMS slave plate 1, the BMS slave plate 2 and the BMS slave plate 3 through a protocol in the daisy chain board card, and transmitting the information to the test mainboard.
According to the technical scheme provided by the invention, in order to adapt to the application of a new high-voltage battery monitor MAX17823, the function test of the BMS master plate and the BMS slave plate in a daisy-chain communication mode is realized in the BMS _ HIL in the lowest cost and the simplest mode.
According to the HIL test system and method for testing the daisy chain master and slave boards of the battery management system, the original BMS _ HIL CAN only test master and slave board tests in a CAN communication mode, and the battery monomer simulation board card is not enough for effectively expanding all battery cell parameters of a cabinet. Let it can adapt to new high voltage battery monitor MAX17823 and test on BMS _ HIL, and can simulate more electric core parameters to let a daisy chain integrated circuit board simulate one or more BMS slave plates. Adopt this kind of chrysanthemum link joint to practice thrift the cost, the communication is reliable, and the advantage lies in: the cost is saved, an original BMS _ HIL cabinet test object is a master plate and a slave plate of a CAN communication protocol, only one TB3891 daisy chain board card needs to be linked, the defect of simulating the battery monomer simulation board card of the original cabinet CAN be overcome, and a new battery monomer simulation board card does not need to be added; the test is more flexible, and one or more battery BMS slave boards are simulated by the daisy chain board card through a dynamic daisy chain board card access mode, so that a new HIL test of the master and slave boards of the BMS daisy chain communication is completed; the improvement and the configuration are convenient, the test environment configuration mode of the daisy chain board card is managed together with the hardware board card of the original cabinet, and only the input and output pins of the newly added daisy chain board card are needed to be configured. The daisy chain communication mode is embedded into the daisy chain board card, so that the communication mode between the BMS master board and the BMS slave board is realized, and the communication protocol before the cabinet is not required to be changed; the daisy chain position is convenient to change, the input and output pins of the added daisy chain board card are led to an external wire harness interface of the cabinet, and the physical position of the daisy chain board card is determined by changing the wire harness of the master board and the slave board of the BMS to be tested.
The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (9)
1. An HIL test system for testing daisy-chained masters and slaves of a battery management system, comprising:
the PC upper computer is internally provided with a test management system;
the test model system comprises a test environment model and a battery model which are in communication connection with the test management system;
the simulation test mechanism comprises a simulation test host which is in communication connection with the test management system, a test mainboard which is in communication connection with the simulation test host, and a single battery simulation board card, a resistor board card and a daisy chain board card which are in communication connection with the test mainboard respectively, wherein the daisy chain board card is in communication connection with the battery model, and the single battery simulation board card and the resistor board card are in communication connection with the test environment model; and the number of the first and second groups,
the BMS test board comprises a BMS main board and at least two BMS slave boards which are sequentially in communication connection, the daisy chain board is in communication connection with the BMS main board or the BMS slave boards through a daisy chain channel, and the BMS main board and the BMS slave boards are in communication connection with the single battery simulation board, the resistor board and the test environment model;
the daisy chain board card is connected between the BMS main board and one BMS slave board through a daisy chain channel; alternatively, the first and second electrodes may be,
the daisy chain board card is connected between the two BMS slave boards through a daisy chain channel.
2. The HIL test system for testing the daisy chain master and slave plates of the battery management system according to claim 1,
the battery monomer simulation board card, the resistor board card and the daisy chain board card are all plugged on the test mainboard through cPCIe interfaces;
the daisy chain board card is connected with the BMS main board or the BMS slave board through a daisy chain channel by adopting an RJ45 port.
3. A HIL test method for testing a daisy chain master-slave board of a battery management system is characterized by comprising the following steps:
building a HIL test system for testing a daisy chain master-slave plate of a battery management system according to any one of claims 1 to 2;
performing hardware configuration, software link configuration and communication protocol configuration on a daisy chain board card in the HIL test system;
and starting the HIL test of the BMS mainboard or the BMS slave board through a test management system arranged in the PC upper computer.
4. The HIL test method for testing the daisy chain master-slave board of the battery management system according to claim 3, wherein the step of configuring the hardware of the daisy chain board card in the HIL test system includes the following steps:
hardware identification is carried out on the daisy chain board card in the HIL test system through the test management system, and the identified daisy chain board card is placed into a hardware library of the test management system;
and setting various state values of the battery managed by the BMS slave board simulated by the daisy chain board card through a test management system.
5. The HIL test method for testing daisy chains of battery management systems according to claim 3, wherein the step of configuring software links to daisy chain boards in the HIL test system comprises the following steps:
and matching the input/output of the daisy chain board card, the battery monomer simulation board card, the resistance board card, the battery model and the energy distribution model to form a closed loop.
6. The HIL test method for testing the daisy chain master-slave board of the battery management system according to claim 5, wherein the step of matching the input/output of the daisy chain board card, the battery cell simulation board card, the resistor board card, the battery model and the energy distribution model to form a closed loop comprises the following steps:
inputting a battery voltage value sent by a battery monomer simulation board card into a battery model, and inputting a corrected battery voltage value into a daisy chain board card;
linking the temperature output by the resistor board card with the temperature of the daisy chain board card;
linking a hot shutdown occurrence/non-occurrence signal in the energy distribution model with the daisy chain board card;
linking an overvoltage mark, an undervoltage mark, battery charging control, battery discharging control and the SOC sum of the battery in the battery model with the daisy chain board card;
and forming a test closed loop after the software connection is completed.
7. The HIL test method for testing a daisy chain master-slave board of a battery management system according to claim 3, wherein the step of configuring the communication protocol for the daisy chain board card in the HIL test system includes the following steps:
the daisy chain communication protocol is directly embedded in the daisy chain board card, and the daisy chain communication between the BMS slave boards is realized.
8. The HIL test method for testing daisy chains of master and slave boards of a battery management system according to claim 7, wherein the step of "directly embedding daisy chain communication protocols in daisy chain boards to realize daisy chain communication between BMS slave boards" comprises the following steps:
directly embedding a daisy chain communication protocol into a daisy chain board card;
when the daisy chain board card is positioned between the two BMS slave boards, the daisy chain board card simulates one BMS slave board according to the daisy chain communication protocol and communicates with the two BMS slave boards.
9. The HIL test method for testing daisy chains of master and slave boards of a battery management system according to claim 7, wherein the step of "directly embedding daisy chain communication protocols in daisy chain boards to realize daisy chain communication between BMS slave boards" comprises the following steps:
directly embedding a daisy chain communication protocol into a daisy chain board card;
when the daisy chain integrated circuit board is located between BMS mainboard and BMS slave plate, the daisy chain integrated circuit board simulates many BMS slave plates according to the daisy chain communication protocol, and communicates with BMS mainboard, BMS slave plate.
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