CN112485472A - Voltage test auxiliary device and test method - Google Patents

Voltage test auxiliary device and test method Download PDF

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Publication number
CN112485472A
CN112485472A CN202011186614.5A CN202011186614A CN112485472A CN 112485472 A CN112485472 A CN 112485472A CN 202011186614 A CN202011186614 A CN 202011186614A CN 112485472 A CN112485472 A CN 112485472A
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voltage
top plate
long arm
pcb
conductive rod
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CN112485472B (en
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杨凯
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Suzhou Inspur Intelligent Technology Co Ltd
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Suzhou Inspur Intelligent Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention provides a voltage test auxiliary device and a test method, wherein the device comprises a top plate, two long arms and at least one pair of conducting rods; each long arm comprises a transverse groove, one end of each long arm is connected to the lower side of the top plate in a pivoting mode through a fixing shaft and is parallel to the top plate, and a gap is formed between each long arm and the top plate; each pair of conducting rods is respectively provided with two measuring points for contacting the voltage to be measured of the PCB, each conducting rod can be arranged in the transverse groove in a transverse sliding mode along the long arm and can telescope and retract along the vertical direction, and each conducting rod is connected with a lead used for being connected to voltage testing equipment. The invention can flexibly contact the measuring point of the voltage to be measured by adjusting the angle of the long arm and the height of the conducting rod; the invention has simple structure and simple and convenient operation, and can well assist the voltage test equipment to test.

Description

Voltage test auxiliary device and test method
Technical Field
The invention relates to the technical field of electronic device testing, in particular to a voltage testing auxiliary device and a testing method.
Background
At present, voltage testing equipment such as a direct-current power supply, an electronic load, an oscilloscope, a universal meter and the like realizes automatic control, and input of a specified instruction can realize automatic parameter setting, automatic data reading, automatic report generation and the like of the equipment, so that the efficiency is greatly improved compared with the traditional mode of arranging reports after manual testing, the reports do not need to be arranged in a complicated way, and the probability of low-level error is reduced; however, in the testing process, the testing points need to be welded, the testing probe needs to be pricked manually, or an auxiliary welding device needs to be welded to install the probe, and the auxiliary device is reserved in advance when the PCB is designed, so that waste is caused, and the testing probe and the load point of the voltage testing equipment are connected to form a main bottleneck which restricts the automatic testing efficiency.
When the conventional voltage test equipment is used for testing, a load line needs to be welded to an output voltage end and a GND end of a voltage regulator of a PCB to be tested; when testing items such as VDS (bypass access mode), Jitter and the like, a high-voltage differential probe needs to be manually pricked to a fixed test point, which not only causes manpower waste and low efficiency, but also easily damages a voltage regulator to be tested. Therefore, a device capable of assisting the voltage testing equipment to carry out pulling load and fixing the probe is needed so as to test the voltage of the voltage regulator or other electronic devices.
Disclosure of Invention
In view of the above, the present invention is directed to a voltage test auxiliary device and a test method thereof, so as to solve the problem of auxiliary test of the voltage test equipment in the prior art without an auxiliary device for pulling and fixing a probe.
In view of the above object, an aspect of the present invention provides a voltage test assisting apparatus, including:
a top plate;
each long arm comprises a transverse groove, is respectively and pivotally connected to the lower side of the top plate at one end through a fixing shaft and is parallel to the top plate, and a gap is formed between each long arm and the top plate;
each pair of conducting rods is respectively used for contacting two measuring points of the voltage to be measured of the PCB, each conducting rod can be transversely arranged in the transverse groove in a sliding mode along the long arm and can be telescopically extended and retracted along the vertical direction, and each conducting rod is connected with a lead used for being connected to voltage testing equipment.
In some embodiments, each of the long arms includes two sliding grooves extending along a length direction thereof, the two sliding grooves being oppositely disposed on inner side walls of the transverse grooves and being parallel to each other.
In some embodiments, the device further comprises a runner, the runner being slidably disposed between the two runners; the conductive rod is vertically movably arranged in the sliding ring.
In some embodiments, the inner surface of the runner has a first thread and the outer surface of the conductor bar has a second thread that engages the first thread.
In some embodiments, the top of the conductive rod has a removable insulating sleeve.
In some embodiments, the conductive rod is a copper rod.
In some embodiments, the top plate has a hollow structure in the shape of a Chinese character 'hui'.
In some embodiments, the device further comprises a bottom plate for securing the PCB, the bottom plate being disposed below the top plate and removably connected to the top plate.
In some embodiments, the bottom plate has two oppositely arranged clamping pieces for clamping the PCB; the clamping surface of each clamping piece for contacting the PCB is provided with a rubber pad.
In another aspect of the present invention, a voltage testing method is further provided, where the voltage testing method includes the following steps performed based on any one of the voltage testing auxiliary devices:
fixing the PCB of the voltage to be measured relative to the top plate;
the two conductive rods are respectively contacted with two measuring points of the voltage to be measured of the PCB by adjusting the rotation angle of the long arm and the telescopic heights of the pair of conductive rods;
connecting two leads respectively connected with the two conductive rods to corresponding voltage testing equipment;
and performing voltage test by adjusting the voltage test equipment.
The invention has at least the following beneficial technical effects:
1. by arranging the pivotable long arm, the rotation angle of the long arm can be flexibly adjusted according to different distances between two measuring points to be measured under different conditions, so that the voltage test auxiliary device can be compatible with PCBs (printed circuit boards) with various voltages to be measured;
2. the conductive rods which can horizontally move and vertically move in the transverse grooves of the long arms are arranged, so that the positions of a pair of conductive rods can be conveniently adjusted according to the position difference of two measuring points to be measured under different conditions, and then the heights of the conductive rods are adjusted to enable the conductive rods to contact the measuring points;
3. the voltage test auxiliary device can be provided with a plurality of pairs of conducting rods with different lengths or different thicknesses so as to flexibly adapt to different test conditions; the invention has simple structure and simple and convenient operation, and can well assist the voltage test equipment to test.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained by using the drawings without creative efforts.
FIG. 1 is a schematic diagram of a top plate and its related structure of a voltage test assistant device according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a top plate and associated structures provided in accordance with an embodiment of the present invention from a front perspective;
FIG. 3 is a schematic diagram of a backplane and associated structures provided in accordance with an embodiment of the present invention;
FIG. 4 is a diagram illustrating an embodiment of a voltage testing method according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two non-identical entities with the same name or different parameters, and it is understood that "first" and "second" are only used for convenience of expression and should not be construed as limiting the embodiments of the present invention. Furthermore, the terms "comprises" and "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements does not include all of the other steps or elements inherent in the list.
It should be noted that the PCB in the embodiment of the present invention is referred to as a Printed circuit board (Printed circuit boards).
In view of the above object, a first aspect of an embodiment of the present invention provides a voltage test assisting apparatus. FIG. 1 is a schematic diagram of a top plate and its associated structure of a voltage test aid provided in accordance with an embodiment of the present invention; fig. 2 shows a schematic view of a top plate and its associated structures provided in accordance with an embodiment of the present invention from a front perspective. As shown in fig. 1 and 2, the voltage test assisting apparatus according to the embodiment of the present invention includes: a top plate 1, a long arm 11 and a conductive rod 12; the long arms 11 are provided with a pair and arranged side by side, each long arm 11 comprises a transverse groove 16 and is respectively and pivotally connected to the lower side of the top plate 1 at one end through a fixing shaft 10 and is parallel to the top plate 1, and a gap is formed between each long arm 11 and the top plate 1; at least one pair of conducting rods 12 is provided, each pair of conducting rods 12 is respectively provided with two measuring points for contacting the voltage to be measured of the PCB, each conducting rod 12 can be transversely arranged in the transverse groove 16 in a sliding manner along the long arm 11 and can be telescopically extended and contracted along the vertical direction; each conducting rod 12 is connected with a lead 13 for connecting to a voltage testing device; the invention has simple structure and simple and convenient operation, and can well assist the voltage test equipment to test.
According to the embodiment of the invention, by arranging the pivotable long arm 11, the rotation angle of the long arm 11 can be flexibly adjusted according to different distances between two measuring points to be measured under different conditions, so that the voltage test auxiliary device can be compatible with PCBs (printed circuit boards) with various voltages to be measured; by arranging the conductive rods 12 which can horizontally move and vertically move in the transverse grooves 16 of the long arms 11, the positions of a pair of conductive rods 12 can be conveniently adjusted according to the position difference of two measuring points to be measured under different conditions, and then the heights of the conductive rods 12 are adjusted to enable the conductive rods 12 to be in contact with the measuring points; the voltage test auxiliary device of the embodiment of the invention can be provided with a plurality of pairs of conducting rods 12 with different lengths or different thicknesses so as to be flexibly suitable for different test conditions.
In some embodiments, each long arm 11 includes two sliding slots 111 extending along the length direction thereof, and the two sliding slots 111 are oppositely disposed on the inner side wall of the transverse slot 16 of the long arm 11 and are parallel to each other. As shown in fig. 1, two oppositely disposed slide slots 111 are spaced to accommodate the conductive rod 12 and the like associated with the probe.
In some embodiments, the voltage test aid further comprises a runner 14, the runner 14 being slidably disposed between the two sliding grooves 111; the collector bar 12 is vertically movably disposed in the runner 14. In this embodiment, the sliding ring 14 is matched with the conductive rod 12 to slide horizontally, and then is matched with the rotation of the long arm 11, so that the conductive rod 12 moves above the point to be measured. In order to meet different test conditions, a plurality of matched sliding rings 14 and conductive rods 12 can be arranged; for example, when the area of the measuring point is large, a conductive rod 12 with a large diameter can be used; when the area of the measuring point is small, the conducting rod 12 with a small diameter can be used flexibly and conveniently, and the test efficiency is improved.
In some embodiments, the inner surface of the runner 14 has a first thread and the outer surface of the conductor bar 12 has a second thread that engages the first thread. In this embodiment, in order to make the conductive rod 12 stably vertically movable in the slide ring 14, the inner surface of the slide ring 14 and the outer surface of the conductive rod 12 are provided with a thread structure which is engaged with each other, and the conductive rod 12 can be made to vertically rotate and move in the slide ring 14 by rotating the conductive rod 12. In another embodiment, the inner surface of the sliding ring 14 is made of rubber, and the outer surface of the conductive rod 12 is smooth; the friction force of the inner surface of the sliding ring 14 prevents the conductive rod 12 from falling in a natural state, and when the conductive rod 12 is rotated or vertically pushed by applying an external force, the conductive rod 12 can move up and down to contact a measuring point.
In some embodiments, the conductive rod 12 has a removable insulating sleeve on top. Since the external force of the vertical movement of the conductive rod 12 can be directly applied by manual touch, in order to protect the conductive rod 12 and to make it more convenient to manually move the conductive rod 12, an insulating sleeve can be sleeved on the top of the conductive rod 12. When it is desired to move the collector bar 12 with a tool, the insulating sleeve can be removed to more quickly move the collector bar 12.
In some embodiments, the conductive rods 12 are copper rods. Since most of the test points on the PCB in this embodiment are bright copper areas, copper bars can be selected as the conductive bars 12.
In some embodiments, the top plate 1 has a hollow structure in a shape of a Chinese character 'hui'. In order to drive the conducting rod 12 to vertically move, the top plate 1 is arranged to be a hollow structure in a shape like a Chinese character 'hui', and the conducting rod 12 can pass through the hollow part and be moved manually or by a tool; and the material of the top plate 1 can be saved, and the cost of the voltage test auxiliary device is further saved.
In some embodiments, the voltage test assistant device further includes a bottom plate 2, the bottom plate 2 is used for fixing the PCB, and the bottom plate 2 is disposed under the top plate 1 and detachably connected with the top plate 1. Fig. 3 is a schematic diagram of a backplane and associated structures provided in accordance with an embodiment of the present invention. As shown in fig. 3 and fig. 1, the top plate 1 and the bottom plate 2 in the embodiment may be rectangular, four corners of the bottom plate 2 are respectively provided with a base 22 having a hollow cylindrical structure, four corners of the top plate 1 are respectively provided with fixing posts 15 having a cylindrical structure, and the four fixing posts 15 may be respectively and stably inserted into the corresponding bases 22, so that the auxiliary device for voltage testing is stable.
In some embodiments, the base plate 2 has two oppositely disposed clamping members 21 for clamping the PCB; the clamping surface of each clamp 21 for contacting the PCB is provided with a rubber pad 211. In this embodiment, by providing the elastic clip 21, it is possible to be compatible with PCBs of various specifications. In order to protect the PCB to be tested from damage, the clamping surface of the clamping member 21 is provided with a rubber pad 211. In this embodiment, the fixing manner of the PCB to be tested is not limited to this, and other structures for fixing the PCB may be provided according to actual situations.
In a second aspect of the embodiments of the present invention, a voltage testing method is also provided. Fig. 4 is a schematic diagram illustrating an embodiment of a voltage testing method provided by the present invention. As shown in fig. 4, the voltage testing method according to the embodiment of the present invention includes the following steps performed based on any one of the voltage testing auxiliary devices:
step S10, fixing the PCB of the voltage to be measured relative to the top plate 1;
step S20, the two conducting rods 12 are respectively contacted with two measuring points of the voltage to be measured of the PCB by adjusting the rotation angle of the long arm 11 and the telescopic heights of the pair of conducting rods 12;
step S30, connecting two leads 13 respectively connected with the two conductive rods 12 to corresponding voltage testing equipment;
and step S40, performing voltage test by adjusting the voltage test equipment.
According to the voltage testing method, the voltage testing auxiliary device is used, the testing point can be simply, conveniently and rapidly pressed and connected through the movable long arm and the conductive rod, the voltage testing method is convenient to remove, and the testing stability and the testing efficiency are improved.
The foregoing is an exemplary embodiment of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the present disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments of the invention may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
It should be understood that, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly supports the exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items. The numbers of the embodiments disclosed in the embodiments of the present invention are merely for description, and do not represent the merits of the embodiments.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, of embodiments of the invention is limited to these examples; within the idea of an embodiment of the invention, also technical features in the above embodiment or in different embodiments may be combined and there are many other variations of the different aspects of the embodiments of the invention as described above, which are not provided in detail for the sake of brevity. Therefore, any omissions, modifications, substitutions, improvements, and the like that may be made without departing from the spirit and principles of the embodiments of the present invention are intended to be included within the scope of the embodiments of the present invention.

Claims (10)

1. A voltage test aid, comprising:
a top plate;
each long arm comprises a transverse groove, one end of each long arm is connected to the lower side of the top plate in a pivoting mode through a fixing shaft and is parallel to the top plate, and a gap is formed between each long arm and the top plate;
the conductive rods are respectively used for contacting two measuring points of a voltage to be measured of the PCB, each conductive rod can be transversely and slidably arranged in the transverse groove along the long arm and can be telescopically and telescopically extended along the vertical direction, and each conductive rod is respectively connected with a lead used for being connected to voltage testing equipment.
2. The device of claim 1, wherein each of said elongated arms includes two runners extending along a length thereof, said two runners being disposed in opposed relation on an inner side wall of said transverse slot and parallel to each other.
3. The apparatus of claim 2, further comprising:
the sliding ring is arranged between the two sliding grooves in a sliding manner; the conductive rod is vertically movably disposed in the runner.
4. The apparatus of claim 3, wherein the inner surface of the runner has a first thread and the outer surface of the conductive rod has a second thread that engages the first thread.
5. The apparatus of claim 1, wherein the top of the conductive rod has a removable insulating sleeve.
6. The apparatus of claim 1, wherein the conductive rod is a copper rod.
7. The apparatus of claim 1, wherein the top plate has a hollow structure in the shape of a Chinese character 'hui'.
8. The apparatus of claim 1, further comprising:
the bottom plate is used for fixing the PCB, and the bottom plate is arranged below the top plate and detachably connected with the top plate.
9. The apparatus of claim 8, wherein the base plate has two oppositely disposed clamping members for clamping the PCB; and a rubber pad is arranged on the clamping surface of each clamping piece for contacting the PCB.
10. A voltage testing method, characterized in that it comprises performing the following steps based on the voltage testing assistance device of any one of claims 1 to 9:
fixing the PCB of the voltage to be measured relative to the top plate;
the two conducting rods are respectively contacted with two measuring points of the voltage to be measured of the PCB by adjusting the rotation angle of the long arm and the telescopic heights of the pair of conducting rods;
connecting two leads respectively connected with the two conductive rods to corresponding voltage testing equipment;
and performing voltage test by adjusting the voltage test equipment.
CN202011186614.5A 2020-10-29 2020-10-29 Voltage test auxiliary device and test method Active CN112485472B (en)

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CN112485472A true CN112485472A (en) 2021-03-12
CN112485472B CN112485472B (en) 2022-05-13

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201600393U (en) * 2010-01-22 2010-10-06 深圳市牧泰莱电路技术有限公司 Voltage-withstanding auxiliary test rack
CN205786902U (en) * 2016-05-25 2016-12-07 深圳市中兴微电子技术有限公司 Voltage ripple testing auxiliary device and voltage ripple test device
WO2017008265A1 (en) * 2015-07-15 2017-01-19 Abb Technology Ag Conductive bar with annular portion to accommodate test plug
CN209878860U (en) * 2019-03-19 2019-12-31 上海阳申石化设备安装有限公司 High-efficient accurate pressure drop testing arrangement
CN211086431U (en) * 2019-10-11 2020-07-24 胡姝媛 Power detection test pencil for power equipment

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201600393U (en) * 2010-01-22 2010-10-06 深圳市牧泰莱电路技术有限公司 Voltage-withstanding auxiliary test rack
WO2017008265A1 (en) * 2015-07-15 2017-01-19 Abb Technology Ag Conductive bar with annular portion to accommodate test plug
CN205786902U (en) * 2016-05-25 2016-12-07 深圳市中兴微电子技术有限公司 Voltage ripple testing auxiliary device and voltage ripple test device
CN209878860U (en) * 2019-03-19 2019-12-31 上海阳申石化设备安装有限公司 High-efficient accurate pressure drop testing arrangement
CN211086431U (en) * 2019-10-11 2020-07-24 胡姝媛 Power detection test pencil for power equipment

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