CN112463631A - Chip driver testing method, device and equipment and readable storage medium - Google Patents
Chip driver testing method, device and equipment and readable storage medium Download PDFInfo
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- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
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- G06F11/3668—Software testing
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- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
Abstract
The invention discloses a method for testing a chip driver, which comprises the following steps: analyzing the received test request to obtain a target chip driver to be tested; generating an environment configuration list corresponding to a target chip driver; creating a target virtual machine according to the environment configuration list; acquiring target test cases corresponding to a target chip driver, and sending the target test cases to a target virtual machine; and executing each target test case by using the target virtual machine to test the target chip driver. By applying the chip driver testing method provided by the invention, the driver issuing period is shortened, the hardware resources are saved, the accuracy of testing environment configuration is improved, and the labor is saved. The invention also discloses a device, equipment and a storage medium for testing the chip driving program, and the device, the equipment and the storage medium have corresponding technical effects.
Description
Technical Field
The present invention relates to the field of software development technologies, and in particular, to a method, an apparatus, a device, and a computer readable storage medium for testing a chip driver.
Background
With the development of modern information technology, the requirements of users on the function and performance integration of chips are continuously increased, and the updating speed of chip drivers is also required to be faster and faster. The driver is a bridge for work between the chip and the operating system, and the test work of the driver becomes an important link for research and development of the chip driver.
At present, a conventional driver tester adopts a main server (Jenkins master server) and a plurality of test servers to execute an automation case, each test server needs to be provided with a physical chip to be tested, the test servers are configured into different types according to the scene type of the test case, for example, some servers are provided with a centros operating system, some servers are provided with a ubuntu operating system, and the like, then, each test server is registered on the main server, and the main server manages a plurality of test servers to test the chip drivers.
Firstly, the driver test work is to verify whether the chip hardware can pass the transfer of the driver, so the driver highly depends on the chip hardware resources and requires the test environment to install the hardware chip to be tested. The manufacturing period of the chip is long, the technical difficulty is high, and the chip hardware needs to be installed and configured to a corresponding test server manually, so that the issuing period of the driving program is prolonged, and the time cost is consumed. Secondly, test cases have a plurality of test scenarios, and after the test cases are executed, the previously deployed hardware environment is in an idle state, which causes hardware resource waste. If the previous hardware environment is dismantled, the hardware environment is reconfigured into a new hardware environment, and repeated manual configuration is easy to make mistakes, and is time-consuming and labor-consuming.
In summary, how to effectively solve the problems of long release period of the driver, hardware resource waste, time and labor consumption, and the like in the conventional driver test mode is a problem that needs to be solved urgently by a person skilled in the art at present.
Disclosure of Invention
The invention aims to provide a chip driver testing method, which greatly shortens the driver issuing period, saves hardware resources, improves the accuracy of testing environment configuration and saves manpower; another object of the present invention is to provide a device, an apparatus and a computer readable storage medium for testing a chip driver.
In order to solve the technical problems, the invention provides the following technical scheme:
a chip driver testing method comprises the following steps:
analyzing the received test request to obtain a target chip driver to be tested;
generating an environment configuration list corresponding to the target chip driver;
creating a target virtual machine according to the environment configuration list;
acquiring target test cases corresponding to the target chip driver, and sending the target test cases to the target virtual machine;
and executing each target test case by using the target virtual machine to test the target chip driver.
In a specific embodiment of the present invention, parsing a received test request to obtain a target chip driver to be tested includes:
analyzing the received test request to obtain the target chip driving program and each test case mark;
acquiring each target test case corresponding to the target chip driver, including:
and acquiring target test cases respectively corresponding to the test case identifications.
In a specific embodiment of the present invention, acquiring target test cases corresponding to the test case identifications respectively includes:
and searching target test cases respectively corresponding to the test case identifications in parallel from a test case library through a standard application program interface.
In a specific embodiment of the present invention, executing each target test case by using the target virtual machine to perform a test operation on the target chip driver includes:
searching a use case execution sequence, a failure retry number and use case execution overtime from a use case environment execution table;
and executing each target test case to test the target chip driver by using the target virtual machine according to the case execution sequence, the retry failure times and the case execution overtime.
In a specific embodiment of the present invention, after executing each of the target test cases to perform a test operation on the target chip driver, the method further includes:
obtaining a driver test result;
and feeding back the test result of the driver program to a request sending end corresponding to the test request.
In one embodiment of the present invention, obtaining a driver test result includes:
acquiring an execution result of each target test case from a test case result table;
feeding back the test result of the driver to a request sending end, comprising:
and feeding back the execution result of each target test case to the request sending terminal.
In a specific embodiment of the present invention, after the executing, by the target virtual machine, each of the target test cases to perform a test operation on the target chip driver, the method further includes:
and when the target chip driver is detected to be tested, performing virtual machine resource recovery operation.
A chip driver test apparatus, comprising:
the request analysis module is used for analyzing the received test request to obtain a target chip driver to be tested;
the list generating module is used for generating an environment configuration list corresponding to the target chip driver;
the virtual machine creating module is used for creating a target virtual machine according to the environment configuration list;
the case obtaining and sending module is used for obtaining each target test case corresponding to the target chip driver and sending each target test case to the target virtual machine;
and the program testing module is used for executing each target test case by using the target virtual machine to test the target chip driver.
A chip driver test apparatus, comprising:
a memory for storing a computer program;
and the processor is used for realizing the steps of the chip driver testing method when executing the computer program.
A computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the chip driver testing method as described above.
The chip driver testing method provided by the invention analyzes the received testing request to obtain a target chip driver to be tested; generating an environment configuration list corresponding to a target chip driver; creating a target virtual machine according to the environment configuration list; acquiring target test cases corresponding to a target chip driver, and sending the target test cases to a target virtual machine; and executing each target test case by using the target virtual machine to test the target chip driver.
According to the technical scheme, the environment configuration list is automatically generated according to the target chip driver to be tested, the target virtual machine capable of simulating chip hardware is created according to the environment configuration list by using the virtualization technology, a plurality of test cases are created in advance, each target test case corresponding to the target chip driver is directly called, and the driver is tested. Compared with a mode of manually configuring hardware resources to build a hardware test environment, the method has the advantages that the driver issuing period is greatly shortened through a virtualization technology, the hardware resources are saved, the accuracy of test environment configuration is improved, and manpower is saved.
Correspondingly, the invention also provides a chip driver testing device, equipment and a computer readable storage medium corresponding to the chip driver testing method, which have the technical effects and are not described herein again.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a flowchart illustrating an embodiment of a method for testing a chip driver;
FIG. 2 is a flowchart illustrating another embodiment of a method for testing a chip driver according to the present invention;
fig. 3 is a block diagram of a device for testing a chip driver according to an embodiment of the present invention;
fig. 4 is a block diagram of a device for testing a chip driver according to an embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The first embodiment is as follows:
referring to fig. 1, fig. 1 is a flowchart illustrating an implementation of a method for testing a chip driver according to an embodiment of the present invention, where the method may include the following steps:
s101: and analyzing the received test request to obtain the target chip driver to be tested.
When the chip driver needs to be tested, the request sending end generates a test request and sends the test request to the test management center, wherein the test request comprises a target chip driver to be tested. And the test management center receives the test request and analyzes the received test request to obtain the target chip driver to be tested.
The test management center mainly functions as a task scheduler and a resource manager.
S102: and generating an environment configuration list corresponding to the target chip driver.
After the target chip driver to be tested is obtained through analysis, the test management center generates an environment configuration list corresponding to the target chip driver. The environment configuration list comprises information of the architecture type, the bit number, the cpu core number, the memory size, the operating system type and the like of the target virtual machine which needs to be created by the target chip driver. Referring to table 1, table 1 is a list of environment configurations.
TABLE 1
The second row of table 1 indicates the configuration of virtual machine 1 that needs to be created: x86 architecture, 32 bits, 4 core cpu, 16G memory, 100G hard disk size, CentOS 7 operating system.
S103: and creating the target virtual machine according to the environment configuration list.
After generating the environment configuration list corresponding to the target chip driver, the test management center creates a target virtual machine according to the environment configuration list, that is, a virtualization environment for testing the target chip driver is generated through a virtualization technology.
S104: and acquiring each target test case corresponding to the target chip driver, and sending each target test case to the target virtual machine.
The method comprises the steps of creating a plurality of test cases in advance, storing each test case in a test case library in advance, obtaining each target test case corresponding to a target chip driver from the test case library after creation of a target virtual machine is completed, and sending each target test case to the target virtual machine.
S105: and executing each target test case by using the target virtual machine to test the target chip driver.
And after each target test case is sent to the target virtual machine, each target test case is executed by the target virtual machine to test the target chip driver. The invention introduces hardware virtualization technology in chip drive test, greatly saves hardware cost, and can utilize virtualization to simulate hardware environment and start drive program automatic test debugging and development work as early as possible under the condition of no real hardware environment. The virtualization technology decouples the test system from a concrete hardware environment, and can easily abstract the functions and components of the test system to form a test framework. A series of virtual environments can be dynamically and rapidly generated according to user configuration requirements, and the efficiency of test environment configuration is greatly improved.
According to the technical scheme, the environment configuration list is automatically generated according to the target chip driver to be tested, the target virtual machine is created according to the environment configuration list by using the virtualization technology, the plurality of test cases are created in advance, and each target test case corresponding to the target chip driver is directly called to test the driver. Compared with a mode of manually configuring hardware resources to build a hardware test environment, the method has the advantages that the driver issuing period is greatly shortened through a virtualization technology, the hardware resources are saved, the accuracy of test environment configuration is improved, and manpower is saved.
It should be noted that, based on the first embodiment, the embodiment of the present invention further provides a corresponding improvement scheme. In the following embodiments, steps that are the same as or correspond to those in the first embodiment may be referred to each other, and corresponding advantageous effects may also be referred to each other, which are not described in detail in the following modified embodiments.
Example two:
referring to fig. 2, fig. 2 is a flowchart of another implementation of the method for testing a chip driver according to an embodiment of the present invention, where the method may include the following steps:
s201: and analyzing the received test request to obtain a target chip driving program and each test case identifier.
After a plurality of test cases are created, specific test case identifications are set for the test cases respectively. The test request may include, in addition to the target chip driver, each test case identifier. And the test management center analyzes the received test request to obtain a target chip driving program and each test case identifier.
S202: and generating an environment configuration list corresponding to the target chip driver.
S203: and searching target test cases respectively corresponding to the test case identifications in parallel from the test case library through a standard application program interface, and sending the target test cases to the target virtual machine.
Presetting a test case library, and storing a plurality of created test cases in the test case library, wherein the test case library stores the corresponding relation between each test case identification and each test case. And presetting a standard application program interface, after analyzing to obtain each test case identification, parallelly searching target test cases corresponding to each test case identification from the test case library through the standard application program interface, forming a test suite by each test case, and sending each target test case to the target virtual machine. By searching all target test cases in parallel, the test case searching efficiency is greatly improved. Referring to table 2, table 2 is a test kit table.
TABLE 2
| Test suite ID | Test case ID |
| External member A | 1-100 |
| External member B | 101-200 |
| External member C | 201-300 |
And inquiring each target test case required for testing the target chip driver from the test case library through the test case identification, and naming a suite name, for example, a user wants to execute the item A, and screening the test case with the test case ID of 1-100, so that the inquiry result can be named with a suite name such as the suite A, which indicates that the suite A contains the test cases with the test case IDs of 1-100. As shown in the second row of Table 2, the user wants to execute test suite A, which contains the test case numbers 1-100.
S204: and searching the use case execution sequence, the number of failed retries and the use case execution timeout from the use case environment execution table.
And a use case environment execution table is created in advance, and the use case environment execution table comprises a use case execution sequence, a failure retry frequency and use case execution overtime. Referring to table 3, table 3 is a use case environment execution table.
TABLE 3
Table 3 shows which test cases are executed by which virtual machine, and the execution policy, for example, the second row of table 3, indicates that the test suite a is used to execute in the virtual machine 1 in the virtualized environment, the test cases in the suite a are executed sequentially, and if a certain test case fails, the test case is retried only once, and if one case is not executed within 300s, the current case is exited after time out, and the next case is executed.
S205: and executing each target test case to test the target chip driver by using the target virtual machine according to the case execution sequence, the failure retry times and the case execution overtime.
After the case execution sequence, the failure retry times and the case execution overtime are found, the target virtual machine is used for executing each target test case to test the target chip driver according to the case execution sequence, the failure retry times and the case execution overtime.
S206: and acquiring the execution result of each target test case from the test case result table.
The execution result of each target test case is written back to the test case result table in real time, after the target chip driver is tested, the execution result of each target test case is obtained from the test case result table, and the test case result table can be used for inquiring about which virtual environments of a certain test case are tested successfully or failed. Referring to table 4, table 4 is a test case results table.
TABLE 4
| Test case ID | Test results | Test environment | Time consuming | Performing timestamp |
| 001 | By passing | Virtual machine 1 | 1s | 2020-01-01:09:10:30 |
| 002 | Failure of | Virtual machine 2 | 2s | 2020-01-01:09:10:31 |
| 003 | Time-out | Virtual machine 3 | 1s | 2020-01-01:09:10:32 |
| … | … | … | … | … |
The user can use the main key foreign key dependency among the tables to inquire the detailed test result, such as the joint environment configuration table 1, the case environment execution table 3 and the test case result table 4.
S207: and feeding back the execution result of each target test case to the request sending end.
And after the execution result of each target test case is obtained, feeding back the execution result of each target test case to the request sending terminal. The request sending end can clearly obtain the specific test result of the target chip driver test.
S208: and when the target chip driver is detected to be tested, performing resource recovery operation on the virtual machine.
The testing progress of the target chip driver program testing is detected in the process of testing the target chip driver program, and when the target chip driver program testing is detected to be completed, the virtual machine resource recycling operation is carried out, so that idle resources are released.
The present embodiment is different from the first embodiment corresponding to the technical solution claimed in independent claim 1, and the technical solutions claimed in the dependent claims 2 to 7 are added, and of course, according to different practical situations and requirements, the technical solutions claimed in the dependent claims can be flexibly combined on the basis of not affecting the completeness of the solutions, so as to better meet the requirements of different use scenarios.
Corresponding to the above method embodiment, the present invention further provides a device for testing a chip driver, and the device for testing a chip driver described below and the method for testing a chip driver described above may be referred to in correspondence.
Referring to fig. 3, fig. 3 is a block diagram of a chip driver testing apparatus according to an embodiment of the present invention, where the apparatus may include:
a request analysis module 31, configured to analyze the received test request to obtain a target chip driver to be tested;
a list generation module 32, configured to generate an environment configuration list corresponding to the target chip driver;
a virtual machine creation module 33, configured to create a target virtual machine according to the environment configuration list;
a case obtaining and sending module 34, configured to obtain each target test case corresponding to the target chip driver, and send each target test case to the target virtual machine;
and the program testing module 35 is configured to execute each target test case by using the target virtual machine to perform a testing operation on the target chip driver.
According to the technical scheme, the environment configuration list is automatically generated according to the target chip driver to be tested, the target virtual machine is created according to the environment configuration list by using the virtualization technology, the plurality of test cases are created in advance, and each target test case corresponding to the target chip driver is directly called to test the driver. Compared with a mode of manually configuring hardware resources to build a hardware test environment, the method has the advantages that the driver issuing period is greatly shortened through a virtualization technology, the hardware resources are saved, the accuracy of test environment configuration is improved, and manpower is saved.
In a specific embodiment of the present invention, the request parsing module 31 is specifically a module that parses a received test request to obtain a target chip driver and identifiers of test cases;
the case obtaining and sending module 34 is specifically a module for obtaining target test cases corresponding to the test case identifications respectively.
In an embodiment of the present invention, the case obtaining and sending module 34 is a module for searching, in parallel, target test cases corresponding to the test case identifiers from the test case library through the standard application program interface.
In one embodiment of the present invention, the program test module 35 includes:
the searching submodule is used for searching a use case execution sequence, a failure retry frequency and use case execution overtime from the use case environment execution table;
and the program test submodule is used for executing each target test case to test the target chip driver by using the target virtual machine according to the case execution sequence, the failure retry times and the case execution overtime.
In one embodiment of the present invention, the apparatus may further include:
the test result acquisition module is used for acquiring the test result of the driver after executing each target test case to test the driver of the target chip;
and the test result feedback module is used for feeding back the test result of the driving program to the request sending end corresponding to the test request.
In a specific embodiment of the present invention, the test result obtaining module is specifically a module for obtaining the execution result of each target test case from the test case result table;
the test result feedback module is specifically a module for feeding back the execution result of each target test case to the request sending end.
In one embodiment of the present invention, the apparatus may further include:
and the resource recovery module is used for performing virtual machine resource recovery operation when the target chip driver is detected to be tested and finished after the target chip driver is tested by using the target virtual machine to execute each target test case.
Corresponding to the above method embodiment, referring to fig. 4, fig. 4 is a schematic diagram of a chip driver test device provided in the present invention, where the device may include:
a memory 41 for storing a computer program;
the processor 42, when executing the computer program stored in the memory 41, may implement the following steps:
analyzing the received test request to obtain a target chip driver to be tested; generating an environment configuration list corresponding to a target chip driver; creating a target virtual machine according to the environment configuration list; acquiring target test cases corresponding to a target chip driver, and sending the target test cases to a target virtual machine; utilizing the target virtual machine to execute each target test case to test the target chip driver
For the introduction of the device provided by the present invention, please refer to the above method embodiment, which is not described herein again.
Corresponding to the above method embodiment, the present invention further provides a computer-readable storage medium having a computer program stored thereon, the computer program, when executed by a processor, implementing the steps of:
analyzing the received test request to obtain a target chip driver to be tested; generating an environment configuration list corresponding to a target chip driver; creating a target virtual machine according to the environment configuration list; acquiring target test cases corresponding to a target chip driver, and sending the target test cases to a target virtual machine; utilizing the target virtual machine to execute each target test case to test the target chip driver
The computer-readable storage medium may include: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
For the introduction of the computer-readable storage medium provided by the present invention, please refer to the above method embodiments, which are not described herein again.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device, the apparatus and the computer-readable storage medium disclosed in the embodiments correspond to the method disclosed in the embodiments, so that the description is simple, and the relevant points can be referred to the description of the method.
The principle and the implementation of the present invention are explained in the present application by using specific examples, and the above description of the embodiments is only used to help understanding the technical solution and the core idea of the present invention. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (10)
1. A method for testing a chip driver, comprising:
analyzing the received test request to obtain a target chip driver to be tested;
generating an environment configuration list corresponding to the target chip driver;
creating a target virtual machine according to the environment configuration list;
acquiring target test cases corresponding to the target chip driver, and sending the target test cases to the target virtual machine;
and executing each target test case by using the target virtual machine to test the target chip driver.
2. The method of claim 1, wherein parsing the received test request to obtain a target chip driver to be tested comprises:
analyzing the received test request to obtain the target chip driving program and each test case mark;
acquiring each target test case corresponding to the target chip driver, including:
and acquiring target test cases respectively corresponding to the test case identifications.
3. The method for testing the chip driver according to claim 2, wherein obtaining the target test cases respectively corresponding to the test case identifications comprises:
and searching target test cases respectively corresponding to the test case identifications in parallel from a test case library through a standard application program interface.
4. The method for testing the chip driver according to any one of claims 1 to 3, wherein executing each target test case by using the target virtual machine to perform a test operation on the target chip driver includes:
searching a use case execution sequence, a failure retry number and use case execution overtime from a use case environment execution table;
and executing each target test case to test the target chip driver by using the target virtual machine according to the case execution sequence, the retry failure times and the case execution overtime.
5. The method according to claim 4, further comprising, after the performing of the test operation on the target chip driver by each of the target test cases, the steps of:
obtaining a driver test result;
and feeding back the test result of the driver program to a request sending end corresponding to the test request.
6. The method for testing the chip driver according to claim 5, wherein obtaining the driver test result comprises:
acquiring an execution result of each target test case from a test case result table;
feeding back the test result of the driver to a request sending end, comprising:
and feeding back the execution result of each target test case to the request sending terminal.
7. The method for testing the chip driver according to claim 1, after the target virtual machine executes each of the target test cases to perform a test operation on the target chip driver, further comprising:
and when the target chip driver is detected to be tested, performing virtual machine resource recovery operation.
8. A chip driver test apparatus, comprising:
the request analysis module is used for analyzing the received test request to obtain a target chip driver to be tested;
the list generating module is used for generating an environment configuration list corresponding to the target chip driver;
the virtual machine creating module is used for creating a target virtual machine according to the environment configuration list;
the case obtaining and sending module is used for obtaining each target test case corresponding to the target chip driver and sending each target test case to the target virtual machine;
and the program testing module is used for executing each target test case by using the target virtual machine to test the target chip driver.
9. A chip driver test apparatus, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the chip driver testing method according to any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, having stored thereon a computer program which, when being executed by a processor, carries out the steps of the chip driver testing method according to any one of claims 1 to 7.
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| CN116298825A (en) * | 2023-05-08 | 2023-06-23 | 杭州长川科技股份有限公司 | Chip test system and method, device, drive access device and method |
| CN117294783A (en) * | 2023-11-24 | 2023-12-26 | 南京华芯科晟技术有限公司 | Chip verification method, device and equipment |
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2020
- 2020-12-11 CN CN202011445390.5A patent/CN112463631A/en not_active Withdrawn
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