CN112433110A - Automatic detection system and detection method for digital tester - Google Patents

Automatic detection system and detection method for digital tester Download PDF

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Publication number
CN112433110A
CN112433110A CN202011156596.6A CN202011156596A CN112433110A CN 112433110 A CN112433110 A CN 112433110A CN 202011156596 A CN202011156596 A CN 202011156596A CN 112433110 A CN112433110 A CN 112433110A
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tester
test
control block
digital
detection
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CN112433110B (en
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周宏军
李俊庆
钱晶
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PONOVO POWER Co.,Ltd.
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Nanjing Nengyun Electric Power Technology Co ltd
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    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Abstract

The invention discloses an automatic detection system and a method for a digital tester, wherein the system comprises a PC end provided with automatic detection system software, the PC end is connected with a switch through a network cable, and the digital tester and a detection device are respectively connected to the switch through the network cable; the standard clock source is connected with the detection device through an optical fiber line and used for timing the detection device; the detection device is connected to the digital tester through an optical fiber line to time the digital tester; the digital tester 9-2/GOOSE input/output optical port is connected to the digital tester 9-2/GOOSE output/input optical port through an optical fiber line; the digital tester hard-contact input/output port is connected to the hard-contact output/input port of the detection device through a cable. The system can realize the automatic detection of the digital tester, and improves the detection efficiency of the digital tester.

Description

Automatic detection system and detection method for digital tester
Technical Field
The invention relates to the technical field of automatic testing of intelligent substations, in particular to an automatic detection system and a detection method for a digital tester.
Background
With the development of the intelligent substation, the digital protection device using the IEC61850-9-2 message and the GOOSE message is widely applied to the intelligent substation, and a digital tester is required to be adopted for testing the digital protection device. The detection standard of the traditional analog quantity tester is relatively perfect at present, the detection standard of a digital tester is just released in recent years, the detection method of the digital tester mostly adopts a mode of manual detection by a detector, a message output by the tester needs to be recorded by a digital network message analyzer, and data such as amplitude, phase, frequency and the like of actual voltage and current in the message are searched manually for comparison, so that the working efficiency is low, the whole detection process is lack of unified working standard and specification, the time required by arranging detection reports is long, and meanwhile, the risk of error and omission is caused.
Disclosure of Invention
The invention aims to solve the technical problem of how to provide an automatic detection system for a digital tester, which can realize the automatic detection of the digital tester.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows: an automatic detection system for a digital tester is characterized in that:
the system comprises a PC end provided with automatic detection system software, wherein the PC end is connected with a switch through a network cable, and a digital tester and a detection device are respectively connected to the switch through the network cable; the standard clock source is connected with the detection device through an optical fiber line and used for timing the detection device; the detection device is connected to the digital tester through an optical fiber line to time the digital tester; the digital tester 9-2/GOOSE input/output optical port is connected to the digital tester 9-2/GOOSE output/input optical port through an optical fiber line; the digital tester hard-contact input/output port is connected to the hard-contact output/input port of the detection device through a cable.
The invention also discloses an automatic detection method for the digital tester, which uses the automatic detection system and comprises the following steps:
the method comprises the following steps that firstly, an SCD file is imported, and a tester configuration file and a standard model file are generated intelligently;
secondly, developing a calibration template of the digital tester;
and thirdly, establishing an automatic detection task and carrying out automatic detection.
Adopt the produced beneficial effect of above-mentioned technical scheme to lie in: the system solves the automatic detection of the functions of the digital tester such as sampling value accuracy test, synchronization difference test, time accuracy test, hard contact time test and the like, and has the following advantages on the basis of solving the automatic detection problem of the digital tester: when the SCD file is imported to generate a tester configuration file, an equipment data model of the detection device is generated, so that a test template can be quickly generated; the test messages are automatically stored according to the test items, the test results are traceable, and the authority of the detection method is ensured; the automatic detection of the sampling value message and the GOOSE message is supported, and the automatic detection of the hard contact opening and closing functions is also supported; the automatic detection method can greatly improve the detection efficiency of the digital tester.
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The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is a hardware schematic block diagram of a system according to an embodiment of the invention;
FIG. 2 is an architecture diagram of an automatic inspection system according to an embodiment of the present invention;
fig. 3 is a flowchart of an automatic detection method according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, but the present invention may be practiced in other ways than those specifically described and will be readily apparent to those of ordinary skill in the art without departing from the spirit of the present invention, and therefore the present invention is not limited to the specific embodiments disclosed below.
As shown in fig. 1, the embodiment of the present invention discloses an automatic detection system for a digital tester:
the system comprises a PC end provided with automatic detection system software, wherein the PC end is connected with a switch through a network cable, and a digital tester and a detection device are respectively connected to the switch through the network cable; the standard clock source is connected with the detection device through an optical fiber line and used for timing the detection device; the detection device is connected to the digital tester through an optical fiber line to time the digital tester; the digital tester 9-2/GOOSE input/output optical port is connected to the digital tester 9-2/GOOSE output/input optical port through an optical fiber line; the digital tester hard-contact input/output port is connected to the hard-contact output/input port of the detection device through a cable.
As shown in fig. 2, the automatic detection system software includes a configuration and model intelligent generation module, a test board editing module, an automatic detection module, a detection device interface module, and a tester interface module.
The configuration and model intelligent generation module has the following functions:
and (3) a function execution process:
the first step is as follows: importing and analyzing an SCD file, extracting a sampling value input control block (SVin), a GOOSE input control block (Gin) and a GOOSE output control block (Gout) from the SCD file, and putting the extracted sampling value input control block, the GOOSE input control block and the GOOSE output control block into 3 different linked lists;
the second step is that: extracting SVin, Gin and Gout control blocks meeting the test requirements from the 3 linked lists according to the test requirements, and intelligently generating a tester configuration file;
the third step: verifying the effectiveness of the extracted SVin, Gin and Gout control blocks, such as whether the channel type and the channel number of each control block meet requirements, whether the total control block number meets requirements, whether the control block target MAC address and the AppID are repeated, and the like, wherein if the requirements are not met, the SCD file needs to be selected again;
intelligently generated tester configuration files:
A) rule for generating file: the channel data of the intelligently generated tester configuration file contains an independent ID attribute, and the ID command rule is as follows:
SVin control block: SV [ control block number ] _ U/I [ channel number ] _ tester channel ID;
gin control Block: gin [ control block number ] _ [ channel number ];
gout control block: gout [ control block number ] _ [ channel number ];
B) intelligently generated tester profile content: the configuration file comprises a set of a plurality of sub configuration objects, each sub configuration object can be used for testing a test item of a specific function, each test function corresponds to one sub configuration object and comprises a corresponding test function name and a function ID;
intelligently generating an equipment data model file: intelligently generating an equipment data model file meeting different test function requirements according to a tester configuration file, wherein the model file comprises:
A) SV, goose out dataset: the data objects in the data set correspond to the channel data objects of the control blocks in the configuration file one by one and have the same ID; for the voltage and current channel data object, the sub-objects comprise amplitude, phase, frequency and each harmonic data object; for a GOOSE channel data object, its sub-objects include channel value, quality, time, etc.;
B) the state sequence data set can set the total number of the state sequences, the duration of each state, the triggering mode of each state and the initial state of the output of each state;
C) and the SV dispersion, GOOSE synchronization difference, GOOSE message consistency, SV delay, SV synchronization difference, sampling value message consistency and other data sets are used for transmitting the test result generated by the detection device interface module according to the detection standard requirement to the automatic detection module.
Digital tester function configuration file:
the digital tester function configuration file describes standard test functions of the digital tester interface module, such as manual experiments, state sequences, harmonic waves and the like, and the standard test functions comprise various test function parameters and content of result data;
the digital tester detection communication command configuration file describes standard interface data of the detection device interface module and the automatic detection module for communication.
The test template editing module functions as follows:
loading a tester configuration file, a tester detection standard model file, a digital tester detection communication command configuration file and a digital tester function configuration file;
the system comprises a digital tester interface module, a digital tester calibration template, a communication command test module and a test module, wherein the digital tester calibration template is used for developing the digital tester calibration template, and comprises an electrical quantity test item for controlling the output of the tester and a communication command test item for interacting with the detection device interface module;
the test parameter configuration basis of the electrical quantity test item is a digital tester function configuration file and is used for selecting the test function of the digital tester, setting the test function parameters, obtaining the test result parameters and carrying out script calculation on the test result;
the test parameter configuration basis of the communication command test item is a communication command configuration file detected by the digital tester, and is used for selecting and setting various communication commands interacted with the interface module of the detection device, completing the commands of loading, starting wave recording, stopping wave recording and downloading state sequences of the configuration file of the detection device, reading the data of each data set result, and the like;
selecting each sub-configuration download object in the configuration file of the tester according to the test requirements of different test items;
and developing a digital tester check template according to the digital tester detection standard.
The tester interface module functions as follows:
a standard communication interface is adopted between the automatic detection module and the automatic detection module, and a standard Sokcet communication mode is adopted;
the tester interface module tests fault parameters and test result parameters according to the function type of the tester, and packages independent tester function configuration files, wherein the function type, the fault parameters and the result parameters have independent IDs;
during testing, the tester interface module receives the testing function ID, the testing parameter data ID and the corresponding value sent by the automatic detection module, and controls the digital tester to complete the output of the corresponding function and the parameter data;
after the test is finished, the tester interface module feeds back the test result parameters to the automatic detection module;
the tester interface module develops different tester interface modules according to tester hardware driving programs of different manufacturers, and calling rules between the tester interface modules and the automatic detection module are kept consistent;
for a tester which has not developed a tester interface, a semi-automatic tester interface module is adopted, a standardized interface is adopted between the semi-automatic tester interface module and an automatic detection module, when the tester is controlled to output, an interface is popped up to prompt a detector to manually control the tester to output, after the output is finished, a detection result is manually input, and a self-checking detection program is informed to continue to execute.
The detection device interface module functions as follows:
the interface module imports a tester configuration file and a tester detection standard model file;
a standardized interface is adopted between the automatic detection module and the automatic detection module;
the interactive mode between the digital tester and the automatic detection module is consistent with the configuration file of the communication command detected by the digital tester;
the communication command includes: downloading configuration data, starting packet capturing, stopping packet capturing, resetting, reading a data set, outputting a state sequence, loading SV reading delay of a tester configuration file, reading a synchronization difference and the like;
the detection device interface module stores the message in the detection process according to the test item and the test time for later source tracing viewing;
when the detection device interface module downloads the configuration for the detection device, a Gin control block in the configuration file of the tester is modified into a Gout control block, the Gout control block is modified into the Gin control block, and the configuration of the detection device is regenerated and downloaded.
The automatic detection module has the following functions:
loading a calibration template of a digital tester and a test standard model file of the tester;
according to the test flow in the verification template, control commands such as starting test, stopping test, obtaining reports and the like are issued to a tester interface module, and the command content comprises a test function ID, test parameter data, test result data and the like;
sending communication commands such as loading configuration files, starting wave recording, stopping wave recording, outputting state sequences, reading data sets and the like to the interface module of the detection device according to the test flow;
and according to the detection template of the tester, the obtained test result data, the test report data and the like, judging the test result through script calculation, and automatically generating a detection report.
As shown in fig. 3, the general embodiment of the present invention also discloses an automatic detection method for a digital tester, which uses the automatic detection system, and the method includes the following steps:
s101: importing an SCD file, and intelligently generating a tester configuration file and a standard model file;
s102: developing a calibration template of the digital tester;
s103: and establishing an automatic detection task and carrying out automatic detection.
The method comprises the following specific steps:
s101: importing an SCD file, and intelligently generating a tester configuration file and a standard model file;
the tester profile may be generated by two methods:
method one (manual editing):
manually adding SVin control blocks, Gin control blocks and Gout control blocks used for testing according to testing requirements, editing parameters such as corresponding MAC target addresses, AppID, ASDU numbers and the like, manually adding channel numbers and channel types of the control blocks, and manually mapping the control blocks;
the test instrument IEC61850 configuration file is a set of a plurality of sub-configuration files, and the sub-configuration files for specific functions are configured according to the test function requirements;
method two (intelligent generation):
1) after the SCD file is imported, intelligently extracting SVin, Gin and Gout control blocks from the SCD file and placing the SVin, Gin and Gout control blocks in3 different linked lists;
2) verifying the validity of the control blocks in each linked list, such as whether the MAC target address, the AppID and the like are valid or not and whether the MAC target address, the AppID and the like are repeated or not, whether the channel type and the channel number of the control blocks meet the test requirements or not, and deleting the control blocks which do not meet the test requirements;
3) if the number of the current various types of master control blocks is lower than the maximum number of the test requirements, the intelligent generation requirements cannot be met, and the fact that the SCD is imported again is prompted;
4) in the intelligent generation algorithm, according to different test requirements, SV control blocks, Gin control blocks and Gout control blocks which meet the test requirements are extracted from corresponding control block linked lists;
5) for the SV control block, automatically testing a corresponding sampling delay channel value and a voltage and current channel mapping group according to the test requirement;
6) and for the GOOSE control block, mapping the relationship of Gin channels and Gout channels according to the test requirement.
When the configuration file of the tester is stored, uniform numbering mapping needs to be carried out on the channels of the control blocks so as to ensure the universality of the test template after the SCD file is replaced:
1) the control block channel ID command rules are as follows:
SVin control block: SV [ control block number ] _ U/I [ channel number ] _ tester channel ID;
gin control Block: gin [ control block number ] _ [ channel number ] _ maps the channel ID;
gout control block: gout [ control block number ] _ [ channel number ] __ maps the channel ID;
the number of the control blocks is started from 1, and the SVin, Gin and Gout control blocks are independently numbered; the channel number is the sequential number of the channel under the control block and starts from 1; tester channel ID, for the SVin control block, the delay channel is named DelayTRtg, and the voltage current channel ID corresponds to Ia1, Ib1, Ic1, Ua1, Ub1, Uc1, Ia2, Ib2, Ic2, Ua2, Ub2, Uc2, Ia3, Ib3, Ic3, Ua3, Ub3, Uc3, Ia4, Ib4, Ic4, Ua4, Ub4, Uc 4; gin control block channel IDs correspond to Bin1, Bin2, Bin3, Bin4, Bin5, Bin6, Bin7, Bin8, respectively; the Gout control block channel IDs correspond to Bout1, Bout2, Bout3, Bout4, Bout5, Bout6, Bout7, and Bout8, respectively.
The intelligent generation process of the standard model file is as follows:
the model file name is the same as the configuration file name, the extension name is different, the test software can conveniently search, different test functions correspond to different test function data sets, and the generation of the data sets in the standard model file is mainly divided into 3 types:
1) for a data set irrelevant to a control block in actual tester configuration, a fixed generation mode is adopted, and after a tester configuration file is modified, the content in the data set is not influenced, such as: a GOOSE synchronization difference data set, a state sequence data set, an SV synchronization difference data set and the like;
2) for a data set related to the actual tester configuration control block part, a semi-dynamic generation mode is adopted, a fixed generation mode is adopted for part of data in the data set, and a dynamic generation mode is adopted for the part related to the control block; taking a sampling value message abnormal simulation data set as an example: the Data set comprises Data objects such as total out-of-step control block number, total packet loss number, total sampling error number and the like, and a fixed generation mode is adopted; dynamically generating a data object of each sampling value control block according to the sampling value control block contained in the actual configuration file, wherein the Name attribute of the data object is AppID of the corresponding control block, the ID naming rule of the data object is SV [ control block number ], numbering is started from 1, all SVin control blocks in all the sub-configuration files are contained, and AppID duplicate control blocks are removed;
3) the Data set completely related to the actual tester configuration control block is generated in a full-automatic generation mode, for example, by using an actual SVin control block, the Name attribute naming rule of the Data set is AppID _ dsSV [ control block number ], the AppID corresponds to an actual AppID, the ID naming rule is dsSV [ channel number ], a Data object under the Data set corresponds to a channel Data object of the actual control block, the ID of the Data object is consistent with the actual channel ID, so that the channel ID in the actual control block can be found through the ID, and the Data set is used for transmitting test result Data by the automatic detection module and the detection device interface module.
S102: development digital tester check template
The method comprises the following steps that the same set of calibration templates is adopted for all testers of tester generation manufacturers, and after calibration standards are revised, the calibration templates need to be updated again when test functions need to be modified or newly added;
the following example is developed by using a sampling value precision check template:
1) adding a communication command test item for downloading a configuration file of the detection device, wherein the communication command parameter is a sub-configuration file ID in the configuration file of the tester;
2) adding a testing functional electric quantity testing item of 'tester configuration' for setting the voltage-current transformation ratio output by the tester;
3) adding an 'IEC 61850 configuration' test function electric quantity test item for setting download of a configuration file of the digital tester;
4) adding a 'start recording' communication command test item, and recording by using a start detection device;
5) adding a 'voltage current test' test function electric quantity test item for controlling the digital tester to output voltage and current with fixed values according to test requirements, wherein a 'read measurement value' communication command sub item is added to the test item for acquiring the currently measured voltage and current values output by the digital tester;
6) adding a 'stop recording' communication command test item to stop the recording of the detection device.
Other test functions develop corresponding test templates according to test requirements;
s103: creating automatic detection task for automatic detection
1) Loading a calibration template of a digital tester and testing and compiling a model file of the tester;
2) selecting different tester interface modules according to tester manufacturers, and selecting a semi-automatic test interface for a digital tester which is not developed and corresponds to a tester interface;
3) and starting an automatic detection process, and controlling the tester interface module and the detection device interface module to finish automatic detection by the automatic detection module according to the detection process in the verification template, and automatically generating a detection report.

Claims (10)

1. An automatic detection system for a digital tester is characterized in that:
the system comprises a PC end provided with automatic detection system software, wherein the PC end is connected with a switch through a network cable, and a digital tester and a detection device are respectively connected to the switch through the network cable; the standard clock source is connected with the detection device through an optical fiber line and used for timing the detection device; the detection device is connected to the digital tester through an optical fiber line to time the digital tester; the digital tester 9-2/GOOSE input/output optical port is connected to the detection device 9-2/GOOSE output/input optical port through an optical fiber line; the digital tester hard-contact input/output port is connected to the hard-contact output/input port of the detection device through a cable.
2. The automated inspection system for a digital tester as recited in claim 1, wherein: the automatic detection system software comprises a configuration and model intelligent generation module, a test template editing module, an automatic detection module, a detection device interface module and a tester interface module, wherein the configuration and model intelligent generation module is used for intelligently generating a tester configuration file and a tester detection standard model file; the test template editing module is used for loading a tester configuration file, a tester detection standard model file, a digital tester detection communication command configuration file and a digital tester function configuration file and generating a digital tester check template; the automatic detection module is used for loading a digital tester calibration template and a tester detection standard model file and automatically testing according to a test flow in the calibration template; the detection device interface module is connected with the automatic detection module and the detection device and used for importing a tester configuration file and a tester detection standard model file, storing messages in the detection process according to test items and test time and allowing the messages to be traced and checked in the later period; the tester interface module is respectively connected with the automatic detection module and the digital tester and is used for receiving the test function ID, the test parameter data ID and the corresponding value sent by the automatic detection module and controlling the digital tester to complete the output of the corresponding function and the parameter data.
3. The automated inspection system for a digital tester as recited in claim 2, wherein: the configuration and model intelligent generation module executes the following processes:
the first step is as follows: importing and analyzing an SCD file, extracting a sampling value input control block SVin, a GOOSE input control block Gin and a GOOSE output control block Gout from the SCD file, and putting the sampling value input control block SVin, the GOOSE input control block Gin and the GOOSE output control block Gout into 3 different linked lists;
the second step is that: extracting SVin, Gin and Gout control blocks meeting the test requirements from the 3 linked lists according to the test requirements, and intelligently generating a tester configuration file;
the third step: verifying the validity of the extracted SVin, Gin and Gout control blocks, such as whether the channel type and the channel number of each control block meet the requirements, whether the total control block number meets the requirements, whether the target MAC address and the AppID of the control block are repeated, and the like, wherein if the requirements are not met, the SCD file needs to be reselected.
4. The automated inspection system for a digital tester as claimed in claim 3, wherein: the generation rule of the tester configuration file generated by the configuration and model intelligent generation module is as follows:
the channel data of the intelligently generated tester configuration file contains an independent ID attribute, and the ID command rule is as follows:
SVin control block: SV [ control block number ] _ U/I [ channel number ] _ tester channel ID;
gin control Block: gin [ control block number ] _ [ channel number ];
gout control block: gout [ control block number ] _ [ channel number ];
the intelligently generated tester configuration file content comprises a set of a plurality of sub configuration objects, each sub configuration object can be used for testing a test item of a specific function, and each test function corresponds to one sub configuration object and comprises a corresponding test function name and a function ID.
5. The automated inspection system for a digital tester as recited in claim 2, wherein: the data model file is used for intelligently generating equipment data model files meeting different test function requirements according to the configuration files of the tester, and the model files comprise:
A) SV dataset, goose dataset: the data objects in the data set correspond to the channel data objects of the control blocks in the configuration file one by one and have the same ID; for the voltage and current channel data object, the sub-objects comprise amplitude, phase, frequency and each harmonic data object; for a GOOSE channel data object, its sub-objects include channel value, quality, time;
B) the state sequence data set can set the total number of the state sequences, the duration of each state, the triggering mode of each state and the initial state of the output of each state;
C) and the SV dispersion, GOOSE synchronization difference, GOOSE message consistency, SV delay, SV synchronization difference, sampling value message consistency and other data sets are used for transmitting the test result generated by the detection device interface module according to the detection standard requirement to the automatic detection module.
6. The automated inspection system for a digital tester as recited in claim 2, wherein: the test module editing module loads a tester configuration file, a tester detection standard model file, a digital tester detection communication command configuration file and a digital tester function configuration file;
the system comprises a digital tester interface module, a digital tester calibration template, a communication command test module and a test module, wherein the digital tester calibration template is used for developing the digital tester calibration template, and comprises an electrical quantity test item for controlling the output of the tester and a communication command test item for interacting with the detection device interface module;
the test parameter configuration basis of the electrical quantity test item is a digital tester function configuration file and is used for selecting the test function of the digital tester, setting the test function parameters, obtaining the test result parameters and carrying out script calculation on the test result;
the test parameter configuration basis of the communication command test item is a communication command configuration file detected by the digital tester, and is used for selecting and setting various communication commands interacted with the interface module of the detection device, completing the commands of loading, starting wave recording, stopping wave recording and downloading state sequences of the configuration file of the detection device, reading the data of each data set result, and the like;
selecting each sub-configuration download object in the configuration file of the tester according to the test requirements of different test items;
and developing a digital tester check template according to the digital tester detection standard.
7. The automated inspection system for a digital tester as recited in claim 2, wherein: a standard communication interface is adopted between the tester interface module and the automatic detection module, and a standard Sokcet communication mode is adopted;
the tester interface module is used for testing fault parameters and test result parameters according to the function type of the tester and packaging independent tester function configuration files, and the function type, the fault parameters and the result parameters have independent IDs;
during testing, the tester interface module receives the testing function ID, the testing parameter data ID and the corresponding value sent by the automatic detection module, and controls the digital tester to complete the output of the corresponding function and the parameter data;
after the test is finished, the tester interface module feeds back the test result parameters to the automatic detection module;
the tester interface module develops different tester interface modules according to tester hardware driving programs of different manufacturers, and calling rules between the tester interface modules and the automatic detection module are kept consistent;
for a tester which has not developed a tester interface, a semi-automatic tester interface module is adopted, a standardized interface is adopted between the semi-automatic tester interface module and an automatic detection module, when the tester is controlled to output, an interface is popped up to prompt a detector to manually control the tester to output, and after the output is finished, a detection result is input and a self-checking detection program is informed to continue to execute.
8. The automated inspection system for a digital tester as recited in claim 2, wherein: the detection device interface module is used for importing a tester configuration file and a tester detection standard model file, and adopts a standardized interface with the automatic detection module;
the interactive mode between the digital tester and the automatic detection module is consistent with the configuration file of the communication command detected by the digital tester;
the communication command includes: downloading configuration data, starting packet capturing, stopping packet capturing, resetting, reading a data set, outputting a state sequence, loading a tester configuration file, reading SV delay and reading synchronization difference;
the detection device interface module stores the message in the detection process according to the test item and the test time for later source tracing viewing;
when the detection device interface module downloads the configuration for the detection device, a Gin control block in the configuration file of the tester is modified into a Gout control block, the Gout control block is modified into the Gin control block, and the configuration of the detection device is regenerated and downloaded.
9. The automated inspection system for a digital tester as recited in claim 2, wherein: the automatic detection module is used for loading a digital tester calibration template and a tester detection standard model file;
according to the test flow in the verification template, control commands such as starting test, stopping test, obtaining reports and the like are issued to a tester interface module, and the command content comprises a test function ID, test parameter data, test result data and the like;
sending a loading configuration file, starting wave recording, stopping wave recording, state sequence output and data set reading communication command to the detection device interface module according to the test flow;
and according to the detection template of the tester, the obtained test result data and the test report data, completing the judgment of the test result through script calculation, and automatically generating a detection report.
10. An automatic inspection method for a digital tester, the method using the automatic inspection system according to any one of claims 1 to 9, the method comprising the steps of:
step one, importing an SCD file, and intelligently generating a tester configuration file and a standard model file:
the tester profile may be generated by two methods:
the method comprises the following steps:
1) adding an SVin control block, a Gin control block and a Gout control block used for testing according to the testing requirement, editing corresponding MAC target address, AppID and ASDU number parameters, manually adding the number and the type of channels of each control block, and manually mapping each control block;
2) the test instrument IEC61850 configuration file is a set of a plurality of sub-configuration files, and the sub-configuration files for specific functions are configured according to the test function requirements;
the second method comprises the following steps:
1) after the SCD file is imported, SVin, Gin and Gout control blocks are automatically extracted and placed in3 different linked lists;
2) verifying the validity of the control blocks in each linked list;
3) if the number of the current various types of master control blocks is lower than the maximum number of the test requirements, the intelligent generation requirements cannot be met, and the fact that the SCD is imported again is prompted;
4) according to different test requirements, SV control blocks, Gin control blocks and Gout control blocks meeting the test requirements are extracted from corresponding control block linked lists;
5) for the SV control block, automatically testing a corresponding sampling delay channel value and a voltage and current channel mapping group according to the test requirement;
6) for the GOOSE control block, mapping the relationship between Gin channels and Gout channels according to the test requirement;
when the configuration file of the tester is stored, uniform numbering mapping needs to be carried out on the channels of the control blocks so as to ensure the universality of the test template after the SCD file is replaced:
the control block channel ID command rules are as follows:
SVin control block: SV [ control block number ] _ U/I [ channel number ] _ tester channel ID;
gin control Block: gin [ control block number ] _ [ channel number ] _ maps the channel ID;
gout control block: gout [ control block number ] _ [ channel number ] __ maps the channel ID;
the number of the control blocks is started from 1, and the SVin, Gin and Gout control blocks are independently numbered; the channel number is the sequential number of the channel under the control block and starts from 1; tester channel ID, for the SVin control block, the delay channel is named DelayTRtg, and the voltage current channel ID corresponds to Ia1, Ib1, Ic1, Ua1, Ub1, Uc1, Ia2, Ib2, Ic2, Ua2, Ub2, Uc2, Ia3, Ib3, Ic3, Ua3, Ub3, Uc3, Ia4, Ib4, Ic4, Ua4, Ub4, Uc 4; gin control block channel IDs correspond to Bin1, Bin2, Bin3, Bin4, Bin5, Bin6, Bin7, Bin8, respectively; the Gout control block channel IDs correspond to Bout1, Bout2, Bout3, Bout4, Bout5, Bout6, Bout7, and Bout8, respectively.
The intelligent generation process of the standard model file is as follows:
the model file name is the same as the configuration file name, the extension names are different, different test functions correspond to different test function data sets, and the generation of the data sets in the standard model file is mainly divided into 3 types:
1) for a data set irrelevant to a control block in actual tester configuration, a fixed generation mode is adopted;
2) for a data set related to the actual tester configuration control block part, a semi-dynamic generation mode is adopted, a fixed generation mode is adopted for part of data in the data set, and a dynamic generation mode is adopted for the part related to the control block;
3) a full-automatic generation mode is adopted for a data set completely related to the actual tester configuration control block;
the second step is that: development digital tester check template
1) Adding a communication command test item for downloading a configuration file of the detection device, wherein the communication command parameter is a sub-configuration file ID in the configuration file of the tester;
2) adding a testing functional electric quantity testing item of 'tester configuration' for setting the voltage-current transformation ratio output by the tester;
3) adding an 'IEC 61850 configuration' test function electric quantity test item for setting download of a configuration file of the digital tester;
4) adding a 'start recording' communication command test item, and recording by using a start detection device;
5) adding a 'voltage current test' test function electric quantity test item for controlling the digital tester to output voltage and current with fixed values according to test requirements, wherein a 'read measurement value' communication command sub item is added to the test item for acquiring the currently measured voltage and current values output by the digital tester;
6) adding a 'stop recording' communication command test item to stop the recording of the detection device;
the third step: creating automatic detection task for automatic detection
1) Loading a calibration template of a digital tester and testing and compiling a model file of the tester;
2) selecting different tester interface modules according to tester manufacturers, and selecting a semi-automatic test interface for a digital tester which is not developed and corresponds to a tester interface;
and starting an automatic detection process, and controlling the tester interface module and the detection device interface module to finish automatic detection by the automatic detection module according to the detection process in the verification template, and automatically generating a detection report.
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3885935D1 (en) * 1987-05-29 1994-01-13 Teradyne Inc Digital in-circuit tester with channel memory erasure protection.
CN101923126A (en) * 2009-12-30 2010-12-22 华北电网有限公司 Digital protecting tester, automatic closed loop test system and method
CN103323714A (en) * 2013-06-20 2013-09-25 国家电网公司 Automatic test method based on report template technology in intelligent substation test system
CN103529377A (en) * 2013-10-11 2014-01-22 国家电网公司 Automatic testing system and method for intelligent transformer substation digital protection device
CN104391247A (en) * 2014-11-26 2015-03-04 许继电气股份有限公司 Relay protection test method and system based on IEC61850 digital tester
CN111751776A (en) * 2020-07-03 2020-10-09 国网四川省电力公司电力科学研究院 Time verification system and method for digital relay protection tester

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3885935D1 (en) * 1987-05-29 1994-01-13 Teradyne Inc Digital in-circuit tester with channel memory erasure protection.
CN101923126A (en) * 2009-12-30 2010-12-22 华北电网有限公司 Digital protecting tester, automatic closed loop test system and method
CN103323714A (en) * 2013-06-20 2013-09-25 国家电网公司 Automatic test method based on report template technology in intelligent substation test system
CN103529377A (en) * 2013-10-11 2014-01-22 国家电网公司 Automatic testing system and method for intelligent transformer substation digital protection device
CN104391247A (en) * 2014-11-26 2015-03-04 许继电气股份有限公司 Relay protection test method and system based on IEC61850 digital tester
CN111751776A (en) * 2020-07-03 2020-10-09 国网四川省电力公司电力科学研究院 Time verification system and method for digital relay protection tester

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
KEITH A: "A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for Supply Voltage Droop Tolerance Across a Wide Operating Range", 《2015 IEEE INTERNATIONAL-SOLID-STATE-CIRCUITS-CONFERENCE》 *
钱浩: "一种继电保护自动测试方案实现方法", 《自动化仪表》 *
韩国栋: "一种全数字化多功能自动测试仪", 《信息工程学院学报》 *

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