CN112397603A - Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof - Google Patents

Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof Download PDF

Info

Publication number
CN112397603A
CN112397603A CN202011277737.XA CN202011277737A CN112397603A CN 112397603 A CN112397603 A CN 112397603A CN 202011277737 A CN202011277737 A CN 202011277737A CN 112397603 A CN112397603 A CN 112397603A
Authority
CN
China
Prior art keywords
doped tio
tio
nano
substrate
interdigital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202011277737.XA
Other languages
Chinese (zh)
Other versions
CN112397603B (en
Inventor
阮圣平
颜路明
周敬然
刘彩霞
李昕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jilin University
Original Assignee
Jilin University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jilin University filed Critical Jilin University
Priority to CN202011277737.XA priority Critical patent/CN112397603B/en
Publication of CN112397603A publication Critical patent/CN112397603A/en
Application granted granted Critical
Publication of CN112397603B publication Critical patent/CN112397603B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier
    • H01L31/108Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the Schottky type
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022408Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264Inorganic materials
    • H01L31/032Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
    • H01L31/0321Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 characterised by the doping material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Abstract

Yb-based doped TiO2A nano-material ultraviolet photoelectric detector and a preparation method thereof belong to the technical field of semiconductor ultraviolet photoelectric detection. From bottom to top, sequentially preparing Yb doped TiO on a quartz plate substrate by a sol-gel method2A nano-material photosensitive layer, Yb doped TiO2The surface of the nano material photosensitive layer is composed of Au interdigital electrodes prepared by a magnetron sputtering method; wherein the quartzThe thickness of the chip substrate is 1-2 mm, and the thickness of the photosensitive layer is 200-300 nm; the invention is realized by adding the titanium oxide into TiO2The nano film is doped with Yb, so that the whole Fermi level of the semiconductor is improved, the Schottky barrier between the metal and the semiconductor is increased, and the dark current can be effectively reduced in a dark state. And with the increase of the doping concentration, the overall absorption wavelength of the device can generate blue shift, thereby providing a new idea for the practical application of the solar blind ultraviolet detector.

Description

Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof
Technical Field
The invention belongs to the technical field of ultraviolet photoelectric detection, and particularly relates to a Yb-doped TiO-based probe2A nano-material ultraviolet photoelectric detector and a preparation method thereof.
Background
The high-sensitivity ultraviolet photoelectric detector has important application in the fields of cell detection, remote control, environmental monitoring, photoelectric integrated circuits and the like. With the continuous progress of semiconductor materials and device preparation processes, a new generation of wide bandgap semiconductor ultraviolet detector overcomes the defects of complex structure, large volume, high energy consumption and the like of the traditional photomultiplier, and becomes a focus of attention in the technical field of ultraviolet detection at present. Meanwhile, the wide bandgap material has the visible blindness, so that the disadvantage that a silicon-based device cannot shield visible light by itself is effectively overcome, and the wide bandgap material has a plurality of varieties, particularly comprises a plurality of oxide materials such as ZnO and TiO2And the like, the materials have stable properties, various preparation methods and low cost, and have important application value.
In recent years, ultraviolet detection technology has been studied with a great deal of attention, and among them, titanium dioxide-based ultraviolet detectors have been developed most rapidly, and the research is directed to various aspects. However, due to inherent defects of wide bandgap materials, such as low carrier mobility, short exciton lifetime, and many traps and defects in oxide materials, the device based on a single material gradually fails to meet the requirements of various fields for higher ultraviolet detection performance, and the device needs to break through in dark current, absorption wavelength, and other aspects. Therefore, proper energy band engineering transformation is carried out on the material on the basis of the prior art so as to improve the comprehensive performance of the device, and the method becomes an effective method for the practical application of the ultraviolet detection technology.
Disclosure of Invention
The invention aims to provide a Yb-doped TiO-based material2A nano-material ultraviolet photoelectric detector and a preparation method thereof.
The invention is realized by adding TiO into a photosensitive layer2The nano-film is doped with Yb to make Yb in it2O3And Yb and Ti composite oxides exist, and an Au interdigital electrode is prepared on the surface of the device by adopting a magnetron sputtering method to form the device, so that the performance of the ultraviolet detector can be effectively improved, the blue shift of an absorption edge can be realized while the dark current of the device is reduced, and the performance of the device is comprehensively improved. Doping TiO with Yb2As a brand new method, the method provides a new solution for manufacturing the solar blind ultraviolet detector.
The Yb-based doped TiO of the invention2The ultraviolet photoelectric detector of nano-material is characterized in that: from bottom to top, sequentially preparing Yb doped TiO on a quartz plate substrate by a sol-gel method2A nano-material photosensitive layer, Yb doped TiO2The surface of the nano material photosensitive layer is composed of Au interdigital electrodes prepared by a magnetron sputtering method; wherein the thickness of the quartz plate substrate is 1-2 mm, and the photosensitive layer is Yb-doped TiO2The thickness of the photosensitive layer is 200-300 nm, the thickness of the Au interdigital electrode is 100-150 nm, and the electrode length, the electrode distance and the electrode width are respectively 0.8-1.2 mm, 10-30 mu m and 10-30 mu m; the structure of the device is shown in fig. 1.
The Yb-based doped TiO of the invention2The ultraviolet photoelectric detector of the nanometer material, its main theory of operation is: TiO 22The absorption wavelength of (A) is below 400nm, and the forbidden band width is 3.2 eV; yb of2O3The material is a wide-gap semiconductor material, has a gap width of 4.9eV, and has absorption in the ultraviolet range. The whole forbidden band can be adjusted by changing the doping amount in the process of preparing the deviceThe width of the device is changed, so that the whole absorption wavelength of the device is changed, the absorption wavelength of the doped device is subjected to blue shift compared with the absorption wavelength of pure titanium dioxide, and the solar blind type ultraviolet detector is further prepared. And the Fermi level of the whole semiconductor is also improved along with the Yb doping, so that the Schottky barrier formed by the semiconductor and the metal electrode is increased, and the dark current of the device is reduced.
The Yb-based doped TiO of the invention2The preparation method of the ultraviolet photoelectric detector of the nano material comprises the following steps:
(1) cleaning a substrate
Sequentially placing the quartz plate substrate in acetone, ethanol and deionized water, ultrasonically cleaning for 10-20 minutes, and then drying;
(2) preparation of Yb-doped TiO2Nanomaterial photo-sensitive layer
Firstly preparing Yb doped TiO2Sol: adding 0.3-1.8 g of ytterbium pentahydrate nitrate, 5-10 mL of tetrabutyl titanate, 5-10 mL of glacial acetic acid and 5-10 mL of acetylacetone into 50mL of ethanol, fully stirring for 30-45 minutes after each material is added, then adding 5-10 mL of deionized water, and continuously stirring for 12-14 hours; finally, standing the solution in a dark place for 12-14 hours to obtain Yb-doped TiO2Sol;
preparing Yb-doped TiO on the surface of the quartz plate substrate cleaned in the step (1)2Nano-material photosensitive layer: spin coating Yb-doped TiO on the surface of quartz plate substrate2Dissolving the sol and forming a film, wherein the spin coating speed is 2000-3500 rpm, and the spin coating time is 20-30 seconds; then drying the substrate for 10-15 minutes at the temperature of 100-120 ℃, and cooling the substrate to room temperature; repeating the steps of spin coating, drying and substrate cooling for 5-7 times, and finally doping Yb into TiO2Sintering the sol film and the quartz plate substrate at 400-500 ℃ for 2-3 hours to obtain Yb-doped TiO on the surface of the quartz plate substrate2The nano material photosensitive layer is 200-300 nm thick;
(3) preparation of Au interdigital electrode
The main process comprises the steps of spin coating photoresist, photoetching interdigital patterns, developing and sputtering;
firstly doping Yb with TiO2Spin-coating a positive photoresist film with the thickness of 0.5-1 mu m on the surface of the nano material photosensitive layer, wherein the spin-coating rotation speed is 800-1500 rpm, the spin-coating time is 20-30 seconds, and then pre-drying for 10-20 minutes at the temperature of 80-100 ℃; then, placing a photoetching mask plate which is complementary with the Au interdigital electrode structure on the photoresist, carrying out ultraviolet exposure for 60-90 seconds, and removing the exposed photoresist after development for 30-40 seconds; finally, carrying out postbaking treatment at 100-120 ℃ for 10-20 minutes to obtain the photoresist film with the hollowed-out interdigital windows;
preparing Au interdigital electrode by magnetron sputtering technology with vacuum degree of 4.0 × 10-3~8.0×10-3Pa, introducing argon at a flow rate of 20-30 sccm; then adjusting the pressure of the vacuum chamber to be 1-3 Pa, applying bias voltage, sputtering power of 60-120W and sputtering time of 10-15 minutes; after sputtering is finished, obtaining Au interdigital electrodes in the hollow interdigital windows, putting the substrate into acetone for ultrasonic treatment for 10-30 seconds, stripping unexposed photoresist and an Au layer on the unexposed photoresist, washing off the acetone, and drying by blowing to obtain the Yb-doped TiO-based substrate2Ultraviolet photoelectric detector of nanometer material.
Drawings
FIG. 1: the structure of the device is shown schematically;
FIG. 2: the invention relates to a current-voltage characteristic curve of a device (the molar doping concentration of Yb is 5%).
FIG. 3: the invention relates to a current-voltage characteristic curve of a device (the molar doping concentration of Yb is 10%).
FIG. 4: the current-voltage characteristic curve of the device (the molar doping concentration of Yb is 15%) related to the invention.
FIG. 5: the invention relates to a current-voltage characteristic curve of a device (the molar doping concentration of Yb is 20%).
As shown in FIG. 1, the names of the parts are Au interdigital electrode 1 and Yb doped TiO2Nanometer film 2, quartz plate substrate 3, incident ultraviolet 4.
As shown in fig. 2, at a Yb molar doping concentration of 5% in the device, at a bias of 5V,the photocurrent of the device was 0.51 μ A, the dark current was 0.14nA, and the ratio of the dark current to the light was 3.64X 103
As shown in FIG. 3, when the molar doping concentration of Yb in the device is 10%, the photocurrent of the device is 0.22 μ A, the dark current is 0.61nA, and the ratio of the photocurrent to the dark current is 3.61X 10 at a bias voltage of 5V2
As shown in FIG. 4, when the Yb molar doping concentration in the device is 15%, the photocurrent of the device is 7.34X 10 under the bias of 5V-2μ A, dark current 0.29nA, light-to-dark current ratio 2.56X 102
As shown in fig. 5, when the molar doping concentration of Yb in the device was 20%, the photocurrent of the device was 1.48nA, the dark current was 0.24nA, and the ratio of the photodark current was 6.17 under a bias of 5V.
Detailed Description
Example 1:
and (3) sequentially placing the quartz plate substrate with the size of 15mm multiplied by 1mm into acetone, ethanol and deionized water for ultrasonic cleaning for 10 minutes, and then drying.
Preparing Yb-doped TiO on quartz plate substrate by sol-gel method2And (3) a nano film. Firstly preparing Yb doped TiO2Sol: 50mL of ethanol was poured into a conical flask with a volume of 150mL, 0.3459g of ytterbium pentahydrate nitrate, 5mL of tetrabutyl titanate, 5mL of glacial acetic acid, and 5mL of acetylacetone were sequentially poured, and after each material was poured, stirring was performed for 30 minutes, respectively, and then 5mL of deionized water was added, and stirring was continued for 12 hours. Finally, the precursor solution is placed in a dark place and stands for more than 12 hours; spin coating Yb-doped TiO on the surface of quartz plate substrate by spin coating method2Sol and form a film, the spin coating speed is 3000 r/min, and the spin coating time is 30 seconds; then drying at 100 deg.C for 10 min, cooling the substrate to room temperature, repeating the above steps of spin coating and drying for 5 times, and finally doping Yb into TiO2Sintering the sol film and the quartz plate substrate at 450 ℃ for 2 hours to obtain Yb-doped TiO on the surface of the quartz plate substrate2A nano-film with a thickness of 200-300 nm;
by spin-coating photoresist, photoetching interdigital pattern, developing andand sputtering and the like to prepare the Au interdigital electrode. Firstly TiO doped with Yb2Spin-coating a layer of positive photoresist with the thickness of 0.8 mu m on the surface of the film, wherein the spin-coating rotation speed is 1200 rpm, the spin-coating time is 20 seconds, and then pre-baking is carried out for 15 minutes at the temperature of 80 ℃; then, a photoetching mask plate which is complementary with the interdigital electrode structure is placed on the photoresist, ultraviolet exposure is carried out for 80 seconds, and the exposed photoresist is removed after development for 30 seconds; and finally, carrying out postbaking treatment at 120 ℃ for 15 minutes to obtain the photoresist film with the hollow interdigital window. Preparing Au interdigital electrode by magnetron sputtering technology with vacuum degree of 6 multiplied by 10-3Pa, introducing argon at a flow rate of 25 sccm; then adjusting the pressure of the vacuum chamber to 1.5Pa, applying bias voltage, sputtering power of 90W and sputtering time of 12 minutes; and after sputtering is finished, obtaining the Au interdigital electrode in the hollow interdigital window, putting the substrate into acetone for ultrasonic treatment for 15 seconds, stripping the unexposed photoresist and the Au layer on the unexposed photoresist, washing off the acetone, drying by blowing, and finishing the preparation of the device.
And after the device with the Yb molar doping concentration of 5% is prepared, testing the light and dark current-voltage characteristics of the device. In a dark state, the dark current of the device under the bias voltage of 5V is 0.14 nA; at a wavelength of 325nm, the light intensity is 30 muW/cm2Under the irradiation of ultraviolet light, the photocurrent of the device under the bias of 5V is 0.51 muA, and the dark current ratio of the device is 3.64 multiplied by 103
Example 2:
and (3) sequentially placing the quartz plate substrate with the size of 15mm multiplied by 1mm into acetone, ethanol and deionized water for ultrasonic cleaning for 10 minutes, and then drying.
Preparing Yb-doped TiO on quartz plate substrate by sol-gel method2And (3) a nano film. Firstly preparing Yb doped TiO2Sol: 50mL of ethanol was poured into a conical flask with a volume of 150mL, 0.7303g of ytterbium pentahydrate nitrate, 5mL of tetrabutyl titanate, 5mL of glacial acetic acid, and 5mL of acetylacetone were sequentially poured, and after each material was poured, stirring was performed for 30 minutes, respectively, and then 5mL of deionized water was added, and stirring was continued for 12 hours. Finally, the precursor solution is placed in a dark place and stands for more than 12 hours; spin coating Yb-doped TiO on the surface of quartz plate substrate by spin coating method2Sol and form thinThe spin coating speed of the film is 3000 r/min, and the spin coating time is 30 seconds; then drying at 100 deg.C for 10 min, cooling the substrate to room temperature, repeating the above steps of spin coating and drying for 5 times, and finally doping Yb into TiO2Sintering the sol film and the quartz plate substrate at 450 ℃ for 2 hours to obtain Yb-doped TiO on the surface of the quartz plate substrate2A nano-film with a thickness of 200-300 nm;
the Au interdigital electrode is prepared by the steps of spin coating of photoresist, photoetching of interdigital patterns, development, sputtering and the like. Firstly TiO doped with Yb2Spin-coating a layer of positive photoresist with the thickness of 0.8 mu m on the surface of the film, wherein the spin-coating rotation speed is 1200 rpm, the spin-coating time is 20 seconds, and then pre-baking is carried out for 15 minutes at the temperature of 80 ℃; then, a photoetching mask plate which is complementary with the interdigital electrode structure is placed on the photoresist, ultraviolet exposure is carried out for 80 seconds, and the exposed photoresist is removed after development for 30 seconds; and finally, carrying out postbaking treatment at 120 ℃ for 15 minutes to obtain the photoresist film with the hollow interdigital window. Preparing Au interdigital electrode by magnetron sputtering technology with vacuum degree of 6 multiplied by 10-3Pa, introducing argon at a flow rate of 25 sccm; then adjusting the pressure of the vacuum chamber to 1.5Pa, applying bias voltage, sputtering power of 90W and sputtering time of 12 minutes; and after sputtering is finished, obtaining the Au interdigital electrode in the hollow interdigital window, putting the substrate into acetone for ultrasonic treatment for 15 seconds, stripping the unexposed photoresist and the Au layer on the unexposed photoresist, washing off the acetone, drying by blowing, and finishing the preparation of the device.
And after the device with the Yb molar doping concentration of 10% is prepared, testing the light and dark current-voltage characteristics of the device. In a dark state, the dark current of the device under the bias voltage of 5V is 0.14 nA; at a wavelength of 325nm, the light intensity is 30 muW/cm2Under the irradiation of ultraviolet light, the photocurrent of the device under the bias of 5V is 0.51 muA, and the dark current ratio of the device is 3.61 multiplied by 102
Example 3:
and (3) sequentially placing the quartz plate substrate with the size of 15mm multiplied by 1mm into acetone, ethanol and deionized water for ultrasonic cleaning for 10 minutes, and then drying.
Preparing Yb-doped TiO on quartz plate substrate by sol-gel method2And (3) a nano film. Firstly preparing Yb doped TiO2Sol: 50mL of ethanol was poured into a conical flask with a volume of 150mL, 1.1598g of ytterbium pentahydrate nitrate, 5mL of tetrabutyl titanate, 5mL of glacial acetic acid, and 5mL of acetylacetone were sequentially poured, and after each material was poured, stirring was performed for 30 minutes, respectively, and then 5mL of deionized water was added, and stirring was continued for 12 hours. Finally, the precursor solution is placed in a dark place and stands for more than 12 hours; spin coating Yb-doped TiO on the surface of quartz plate substrate by spin coating method2Sol and form a film, the spin coating speed is 3000 r/min, and the spin coating time is 30 seconds; then drying at 100 deg.C for 10 min, cooling the substrate to room temperature, repeating the above steps of spin coating and drying for 5 times, and finally doping Yb into TiO2Sintering the sol film and the quartz plate substrate at 450 ℃ for 2 hours to obtain Yb-doped TiO on the surface of the quartz plate substrate2A nano-film with a thickness of 200-300 nm;
the Au interdigital electrode is prepared by the steps of spin coating of photoresist, photoetching of interdigital patterns, development, sputtering and the like. Firstly TiO doped with Yb2Spin-coating a layer of positive photoresist with the thickness of 0.8 mu m on the surface of the film, wherein the spin-coating rotation speed is 1200 rpm, the spin-coating time is 20 seconds, and then pre-baking is carried out for 15 minutes at the temperature of 80 ℃; then, a photoetching mask plate which is complementary with the interdigital electrode structure is placed on the photoresist, ultraviolet exposure is carried out for 80 seconds, and the exposed photoresist is removed after development for 30 seconds; and finally, carrying out postbaking treatment at 120 ℃ for 15 minutes to obtain the photoresist film with the hollow interdigital window. Preparing Au interdigital electrode by magnetron sputtering technology with vacuum degree of 6 multiplied by 10-3Pa, introducing argon at a flow rate of 25 sccm; then adjusting the pressure of the vacuum chamber to 1.5Pa, applying bias voltage, sputtering power of 90W and sputtering time of 12 minutes; and after sputtering is finished, obtaining the Au interdigital electrode in the hollow interdigital window, putting the substrate into acetone for ultrasonic treatment for 15 seconds, stripping the unexposed photoresist and the Au layer on the unexposed photoresist, washing off the acetone, drying by blowing, and finishing the preparation of the device.
And after the device with the Yb molar doping concentration of 15% is prepared, testing the light and dark current-voltage characteristics of the device. In a dark state, the dark current of the device under the bias voltage of 5V is 0.29 nA; at wavelength 325nm, light intensity of 30 μ W/cm2Under the irradiation of ultraviolet light, the photocurrent of the device under the bias of 5V is 7.34 multiplied by 10-2μ A, the dark current ratio of the device is 2.56 × 102
Example 4:
and (3) sequentially placing the quartz plate substrate with the size of 15mm multiplied by 1mm into acetone, ethanol and deionized water for ultrasonic cleaning for 10 minutes, and then drying.
Preparing Yb-doped TiO on quartz plate substrate by sol-gel method2And (3) a nano film. Firstly preparing Yb doped TiO2Sol: 50mL of ethanol was poured into a conical flask with a volume of 150mL, 1.6431g of ytterbium pentahydrate nitrate, 5mL of tetrabutyl titanate, 5mL of glacial acetic acid, and 5mL of acetylacetone were sequentially poured, and after each material was poured, stirring was performed for 30 minutes, respectively, and then 5mL of deionized water was added, and stirring was continued for 12 hours. Finally, the precursor solution is placed in a dark place and stands for more than 12 hours; spin coating Yb-doped TiO on the surface of quartz plate substrate by spin coating method2Sol and form a film, the spin coating speed is 3000 r/min, and the spin coating time is 30 seconds; then drying at 100 deg.C for 10 min, cooling the substrate to room temperature, repeating the above steps of spin coating and drying for 5 times, and finally doping Yb into TiO2Sintering the sol film and the quartz plate substrate at 450 ℃ for 2 hours to obtain Yb-doped TiO on the surface of the quartz plate substrate2A nano-film with a thickness of 200-300 nm;
the Au interdigital electrode is prepared by the steps of spin coating of photoresist, photoetching of interdigital patterns, development, sputtering and the like. Firstly TiO doped with Yb2Spin-coating a layer of positive photoresist with the thickness of 0.8 mu m on the surface of the film, wherein the spin-coating rotation speed is 1200 rpm, the spin-coating time is 20 seconds, and then pre-baking is carried out for 15 minutes at the temperature of 80 ℃; then, a photoetching mask plate which is complementary with the interdigital electrode structure is placed on the photoresist, ultraviolet exposure is carried out for 80 seconds, and the exposed photoresist is removed after development for 30 seconds; and finally, carrying out postbaking treatment at 120 ℃ for 15 minutes to obtain the photoresist film with the hollow interdigital window. Preparing Au interdigital electrode by magnetron sputtering technology with vacuum degree of 6 multiplied by 10-3Pa, introducing argon at a flow rate of 25 sccm; then the pressure of the vacuum chamber was adjusted to 1.5Pa, applying bias voltage, wherein the sputtering power is 90W, and the sputtering time is 12 minutes; and after sputtering is finished, obtaining the Au interdigital electrode in the hollow interdigital window, putting the substrate into acetone for ultrasonic treatment for 15 seconds, stripping the unexposed photoresist and the Au layer on the unexposed photoresist, washing off the acetone, drying by blowing, and finishing the preparation of the device.
And after the device with the Yb molar doping concentration of 20% is prepared, testing the light and dark current-voltage characteristics of the device. In a dark state, the dark current of the device under the bias voltage of 5V is 0.24 nA; at a wavelength of 325nm, the light intensity is 30 muW/cm2Under the irradiation of ultraviolet light, the photocurrent of the device under the bias voltage of 5V is 1.48nA, and the ratio of the dark current of the device is 6.17.

Claims (5)

1. Yb-based doped TiO2The ultraviolet photoelectric detector of nano-material is characterized in that: from bottom to top, sequentially preparing Yb doped TiO on a quartz plate substrate by a sol-gel method2A nano-material photosensitive layer, Yb doped TiO2The surface of the nano material photosensitive layer is composed of Au interdigital electrodes prepared by a magnetron sputtering method.
2. The Yb-doped TiO-based material of claim 12The ultraviolet photoelectric detector of nano-material is characterized in that: the thickness of the quartz plate substrate is 1-2 mm, the thickness of the photosensitive layer is 200-300 nm, the thickness of the Au interdigital electrode is 100-150 nm, and the electrode length, the electrode spacing and the electrode width are respectively 0.8-1.2 mm, 10-30 microns and 10-30 microns.
3. Yb-based doped TiO according to claim 1 or 22The preparation method of the ultraviolet photoelectric detector of the nano material comprises the following steps:
(1) cleaning a substrate
Sequentially placing the quartz plate substrate in acetone, ethanol and deionized water, ultrasonically cleaning for 10-20 minutes, and then drying;
(2) preparation of Yb-doped TiO2Nanomaterial photo-sensitive layer
0.3-1.8 g of ytterbium pentahydrate nitrate is added into 50mL of ethanol5-10 mL of tetrabutyl titanate, 5-10 mL of glacial acetic acid and 5-10 mL of acetylacetone, fully stirring for 30-45 minutes after each material is added, then adding 5-10 mL of deionized water, and continuously stirring for 12-14 hours; finally, standing the solution in a dark place for 12-14 hours to obtain Yb-doped TiO2Sol;
spin coating Yb-doped TiO on the surface of quartz plate substrate2Dissolving the sol and forming a film, wherein the spin coating speed is 2000-3500 rpm, and the spin coating time is 20-30 seconds; then drying the substrate for 10-15 minutes at the temperature of 100-120 ℃, and cooling the substrate to room temperature; repeating the steps of spin coating, drying and substrate cooling for 5-7 times, and finally doping Yb into TiO2Sintering the sol film and the quartz plate substrate at 400-500 ℃ for 2-3 hours to obtain Yb-doped TiO on the surface of the quartz plate substrate2The nano material photosensitive layer is 200-300 nm thick;
(3) preparation of Au interdigital electrode
The main process comprises the steps of spin coating photoresist, photoetching interdigital patterns, developing and sputtering;
firstly doping Yb with TiO2Spin-coating a positive photoresist film with the thickness of 0.5-1 mu m on the surface of the nano material photosensitive layer, wherein the spin-coating rotation speed is 800-1500 rpm, the spin-coating time is 20-30 seconds, and then pre-drying for 10-20 minutes at the temperature of 80-100 ℃; then, placing a photoetching mask plate which is complementary with the Au interdigital electrode structure on the photoresist, carrying out ultraviolet exposure for 60-90 seconds, and removing the exposed photoresist after development for 30-40 seconds; finally, carrying out postbaking treatment at 100-120 ℃ for 10-20 minutes to obtain the photoresist film with the hollowed-out interdigital windows;
preparing Au interdigital electrode by magnetron sputtering technology with vacuum degree of 4.0 × 10-3~8.0×10-3Pa, introducing argon at a flow rate of 20-30 sccm; then adjusting the pressure of the vacuum chamber to be 1-3 Pa, applying bias voltage, sputtering power of 60-120W and sputtering time of 10-15 minutes; after sputtering is finished, obtaining Au interdigital electrodes in the hollow interdigital windows, putting the substrate into acetone for ultrasonic treatment for 10-30 seconds, stripping unexposed photoresist and an Au layer on the unexposed photoresist, washing off the acetone, and drying by blowing to obtain the Yb-doped T-based substrateiO2Ultraviolet photoelectric detector of nanometer material.
4. The Yb-doped TiO of claim 32The preparation method of the nano material ultraviolet photoelectric detector is characterized by comprising the following steps: forming Yb doped TiO on quartz plate surface by spin coating method2The spin coating speed of the sol film is 2000-3500 rpm, and the spin coating time is 20-30 seconds.
5. The Yb-doped TiO of claim 42The preparation method of the nano material ultraviolet photoelectric detector is characterized by comprising the following steps: the vacuum degree of the Au interdigital electrode prepared by adopting the magnetron sputtering technology is 4.0 multiplied by 10-3~8.0×10-3Pa, introducing argon at a flow rate of 20-30 sccm; adjusting the pressure of the vacuum chamber to 1-3 Pa, applying bias voltage, sputtering power to 60-120W, and sputtering time to 10-15 minutes.
CN202011277737.XA 2020-11-16 2020-11-16 Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof Active CN112397603B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011277737.XA CN112397603B (en) 2020-11-16 2020-11-16 Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011277737.XA CN112397603B (en) 2020-11-16 2020-11-16 Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof

Publications (2)

Publication Number Publication Date
CN112397603A true CN112397603A (en) 2021-02-23
CN112397603B CN112397603B (en) 2022-04-01

Family

ID=74599774

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011277737.XA Active CN112397603B (en) 2020-11-16 2020-11-16 Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof

Country Status (1)

Country Link
CN (1) CN112397603B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114597268A (en) * 2022-03-07 2022-06-07 中国科学院半导体研究所 Photoelectric detector and preparation method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1828950A (en) * 2006-04-04 2006-09-06 吉林大学 Metal/semiconductor/metallic structure TiO2 ultraviolet photodetector and preparation
CN101562208A (en) * 2009-06-02 2009-10-21 吉林大学 Back incident-type TiO* UV detector and preparation method thereof
CN101820016A (en) * 2010-04-16 2010-09-01 厦门大学 Method for preparing titanium dioxide ultraviolet photoelectric detector
CN105810828A (en) * 2016-04-06 2016-07-27 吉林大学 PDHF/TiO2/PDHF dual-heterojunction based hole gain ultraviolet detector and preparation method thereof
CN106024966A (en) * 2016-05-27 2016-10-12 吉林大学 TiO2 thin film ultraviolet detector based on multi-crystal face Ir-Pd nano particle system doping and preparation method thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1828950A (en) * 2006-04-04 2006-09-06 吉林大学 Metal/semiconductor/metallic structure TiO2 ultraviolet photodetector and preparation
CN101562208A (en) * 2009-06-02 2009-10-21 吉林大学 Back incident-type TiO* UV detector and preparation method thereof
CN101820016A (en) * 2010-04-16 2010-09-01 厦门大学 Method for preparing titanium dioxide ultraviolet photoelectric detector
CN105810828A (en) * 2016-04-06 2016-07-27 吉林大学 PDHF/TiO2/PDHF dual-heterojunction based hole gain ultraviolet detector and preparation method thereof
CN106024966A (en) * 2016-05-27 2016-10-12 吉林大学 TiO2 thin film ultraviolet detector based on multi-crystal face Ir-Pd nano particle system doping and preparation method thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
J.A. BORREGO PEREZ等: ""Effect of ytterbium doping concentration on structural, optical and photocatalytic properties of TiO2 thin films"", 《CERAMICS INTERNATIONAL》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114597268A (en) * 2022-03-07 2022-06-07 中国科学院半导体研究所 Photoelectric detector and preparation method thereof

Also Published As

Publication number Publication date
CN112397603B (en) 2022-04-01

Similar Documents

Publication Publication Date Title
Basu et al. Highly stable photoelectrochemical cells for hydrogen production using a SnO 2–TiO 2/quantum dot heterostructured photoanode
CN105609641B (en) Perovskite type solar cell and preparation method thereof
KR101544317B1 (en) Planar perovskite solar cells containing semiconductor nanoparticles and the method for manufacturing thereof
Veerathangam et al. Size-dependent photovoltaic performance of cadmium sulfide (CdS) quantum dots for solar cell applications
CN113013278A (en) Silicon carbide-based full-spectrum response photoelectric detector and preparation method thereof
CN106745474B (en) Preparation method of visible light response tungsten trioxide-bismuth vanadate heterojunction thin film electrode
CN112397603B (en) Yb-based doped TiO2Ultraviolet photoelectric detector made of nano material and preparation method thereof
KR101540364B1 (en) ZSO-base perovskite solar cell and its preparation method
CN105810828B (en) Based on PDHF/TiO2/ PDHF double heterojunction type hole gain ultraviolet detectors and preparation method thereof
CN110556479B (en) Tin dioxide-based mesoporous perovskite solar cell and preparation method thereof
Yue et al. Effect of HCl etching on TiO 2 nanorod-based perovskite solar cells
Esakki et al. Influence on the efficiency of dye-sensitized solar cell using Cd doped ZnO via solvothermal method
Hu et al. Interfacing pristine BiI3 onto TiO2 for efficient and stable planar perovskite solar cells
Islavath et al. The performance enhancement of HTM-free ZnO nanowire-based perovskite solar cells via low-temperature TiCl4 treatment
CN107359217B (en) A kind of quick response ultraviolet light detector and preparation method
CN211295123U (en) GaN-MoO based on core-shell structure3Self-powered ultraviolet detector of nano-column
US8574948B2 (en) Method of improving power conversion efficiencies in dye-sensitized solar cells by facile surface treatment
CN111477699A (en) Based on α -Ga2O3/TiO2Heterojunction solar blind ultraviolet detector and preparation method thereof
CN113782684B (en) Perovskite thin film and preparation method thereof
Firoozi et al. Improvement photovoltaic performance of quantum dot-sensitized solar cells using deposition of metal-doped ZnS passivation layer on the TiO2 photoanode
Fang et al. CdSe/TiO2 nanocrystalline solar cells
CN111048604B (en) Ultraviolet detector based on MgZnO/ZnS II type heterojunction and preparation method thereof
CN115274906A (en) Amorphous In-doped Ga2O3Ultraviolet photoelectric detector made of nano material and preparation method thereof
Зейниденов et al. Influence of structural features of ZnO films on optical and photoelectric characteristics of inverted polymer solar elements
Mehrabian Optical and photovoltaic properties of ZnS nanocrystals fabricated on Al: ZnO films using the SILAR technique

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant