CN112379310A - Composite voltage test device for direct current support capacitor - Google Patents
Composite voltage test device for direct current support capacitor Download PDFInfo
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- CN112379310A CN112379310A CN202011574330.3A CN202011574330A CN112379310A CN 112379310 A CN112379310 A CN 112379310A CN 202011574330 A CN202011574330 A CN 202011574330A CN 112379310 A CN112379310 A CN 112379310A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
Abstract
The invention discloses a composite voltage test device for a direct current support capacitor, which mainly comprises a direct current test loop, a power frequency test loop, a high frequency test loop, a test loop and a control loop, wherein the output end of the direct current test loop is connected with one end of the test loop in parallel, the other end of the test loop is respectively connected with one end of the power frequency test loop and one end of the high frequency test loop in parallel, the control loop comprises a signal acquisition circuit, a control output circuit and a controller, the signal acquisition circuit of the control loop is from the test loop, and the control output circuit of the control loop is respectively connected with the direct current test loop, the power frequency test loop, the high frequency test loop and the test loop. The voltage test device is simple in structure and convenient to operate, and can meet the voltage test requirements of the direct-current support capacitor.
Description
Technical Field
The invention belongs to the technical field of capacitor tests, and particularly relates to a composite voltage test device for a direct-current support capacitor.
Background
The dc support capacitor is one of the important components of the converter, and its main role is to serve as an energy storage element on the dc side of the converter. The metallized film capacitor has advantages over the electrolytic capacitor in high voltage, high frequency, high temperature, large current, small volume and long life. Therefore, the metallized film direct-current support capacitor is widely applied to the field of high-performance converters such as rail transit, flexible direct-current transmission, wind power photovoltaic and the like, plays roles in stabilizing voltage, filtering and the like, provides instantaneous energy exchange, and exchanges reactive power with a load and a power supply.
When the direct current capacitor works in the traditional sense, the current is zero. The dc support capacitor is different from a conventional dc capacitor, and in actual operation, a dc voltage is applied to the dc support capacitor, and a ripple voltage is also applied to the dc support capacitor, thereby generating a ripple current.
The capacitors have different voltage breakdown and insulation characteristics under the conditions of direct current and alternating current voltage, and the working field intensity is also greatly different. The working field intensity of the alternating current capacitor is 40-60V/mum. The working field intensity of the direct current capacitor is more than 200V/mum.
Important voltage test items of the capacitor: thermal stability test, durability test, and inter-electrode withstand voltage test.
At present, most of capacitor test devices can only be single direct-current voltage sources, power-frequency voltage sources or variable-frequency power sources. Therefore, the test of the direct current support capacitor can only reflect the characteristics of the capacitor under single direct current voltage, power frequency voltage source or variable frequency voltage, and cannot reflect the working characteristics of the direct current support capacitor under the actual working condition.
In order to design a reasonable dc support capacitor better, the insulation characteristic and the service life characteristic of the actual working condition of the dc support capacitor need to be accurately mastered.
Therefore, a new voltage test device for the direct current support capacitor needs to be designed, which can solve the problem of the technology of superposition of different voltage sources so as to meet the test requirements of the direct current support capacitor.
Disclosure of Invention
The invention provides a composite voltage test device for a direct current support capacitor, aiming at overcoming the defect that most of the existing test devices can only be single direct current voltage source, power frequency voltage source or variable frequency power source.
The technical scheme adopted by the invention is as follows.
The invention provides a composite voltage test device for a direct current support capacitor.
The composite voltage test device mainly comprises a direct current test loop, a power frequency test loop, a high frequency test loop, a test loop and a control loop.
The output end of the direct current test loop is connected with one end of the test loop in parallel.
The other end of the test loop is respectively connected with the power frequency test loop and the high-frequency test loop in parallel.
The control loop comprises signal acquisition, control output and a controller. The signal acquisition of the control loop comes from the test loop. The control output of the control loop is respectively connected with the direct current test loop, the power frequency test loop, the high frequency test loop and the test loop. And the controller gives an instruction for controlling output according to signal acquisition and calculation.
The direct current test loop comprises a first power supply, a first switch, a first voltage regulator, a first boosting transformer, a high-voltage silicon stack, a current-limiting resistor, a direct current filter capacitor, a direct current filter resistor and an alternating current isolating inductor.
The power frequency test loop comprises a second power supply, a second switch, a second voltage regulator, a second step-up transformer, a power frequency compensation reactor, a third switch and a power frequency blocking capacitor.
The high-frequency test loop comprises a third power supply, a fourth switch, a high-frequency power supply, a filter, a high-frequency compensation reactor, a fifth switch and a high-frequency blocking capacitor.
The test loop comprises a sixth switch, a discharge resistor, a voltage measurement device, a current measurement device and a direct current support capacitor to be tested.
One end of the first power supply is connected with one end of the first switch. The other end of the first switch is connected with one end of the primary side of the first voltage regulator. The other end of the first power supply is connected with the other end of the primary side of the first voltage regulator. The secondary side of the first voltage regulator is connected in parallel with the primary side of the first step-up transformer. One end of the secondary side of the first boosting transformer is sequentially connected with the high-voltage silicon stack and the current-limiting resistor in series. One end of the current-limiting resistor is connected in parallel with the direct current filter capacitor and is connected in series with the direct current filter resistor and the alternating current isolating inductor. One end of the AC isolation inductor is connected with the high-voltage end of the test loop. The other end of the secondary side of the first boosting transformer is connected with the other end of the direct-current filter capacitor and the low-voltage end of the test loop in parallel and is grounded.
One end of the second power supply is connected with one end of the second switch. The other end of the second switch is connected with one end of the primary side of the second voltage regulator. The other end of the second power supply is connected with the other end of the primary side of the second voltage regulator. The secondary side of the second voltage regulator is connected in parallel with the primary side of the second step-up transformer. And the secondary side of the second boosting transformer is connected with the power frequency compensation reactor in parallel. And the high-voltage end of the power frequency compensation reactor is sequentially connected with the third switch and the power frequency blocking capacitor in series. The other end of the power frequency blocking capacitor is connected with the high-voltage end of the test loop. And the low-voltage end of the power frequency compensation reactor is connected with the low-voltage end of the test loop in parallel and is grounded.
The third power supply is connected with the fourth switch and the high-frequency power supply in sequence. The output end of the high-frequency power supply is connected with the input end of the filter. The output end of the filter is connected with the high-frequency compensation reactor in parallel. And the high-voltage end of the high-frequency compensation reactor is sequentially connected with the fifth switch and the high-frequency blocking capacitor in series. The other end of the high-frequency blocking capacitor is connected with the high-voltage end of the test loop. And the low-voltage end of the high-frequency compensation reactor is connected with the low-voltage end of the test loop in parallel and is grounded.
And the sixth switch is connected in series with the discharge resistor and then connected in parallel with the voltage measurement. The dc support capacitor to be tested is also connected in parallel with the voltage measurement after being connected in series with the current measurement.
The signal acquisition includes voltage signals, current signals, other signals including temperature, pressure, etc.
The control outputs include a first output, a second output, a third output, and a fourth output.
The DC filter capacitor and the DC filter resistor form an RC filter, and the DC voltage applied to the DC support capacitor to be tested can be stabilized.
When the first switch is in the closed state and the second switch and the fourth switch are in the open state, the output voltage of the composite voltage testing device is only direct current voltage at the moment, and a direct current withstand voltage test and a direct current durability test can be carried out.
When the second switch is in a closed state and the first switch and the fourth switch are in a separated state, the output voltage of the composite voltage testing device is only power frequency voltage at the moment, and a power frequency thermal stability test can be carried out.
When the fourth switch is in an on-off state, the first switch and the second switch are in a off state, the output voltage of the composite voltage testing device is only high-frequency voltage, and a high-frequency thermal stability test can be carried out.
When the first switch, the second switch and the third switch are all in a closed state and the fourth switch is in a separated state, the output voltage of the composite voltage testing device is direct-current voltage superposed power frequency voltage at the moment, and a thermal stability test and a durability test can be carried out.
When the first switch, the fourth switch and the fifth switch are all in the closed state and the second switch is in the open state, the composite voltage testing device outputs a voltage direct-current voltage superposed with a high-frequency voltage at the moment, and a thermal stability test and a durability test can be carried out.
When the second switch, the third switch, the fourth switch and the fifth switch are all in a closed state and the first switch is in a separated state, the composite voltage testing device outputs power frequency voltage superposition high-frequency voltage at the moment, and a thermal stability test can be carried out.
When the first switch, the second switch, the third switch, the fourth switch and the fifth switch are all in a closed state, the composite voltage testing device outputs direct-current voltage and power-frequency voltage superposed high-frequency voltage at the moment, and a thermal stability test and a durability test can be carried out.
The first output, the first output and the third output are respectively corresponding to the first switch, the second switch and the fourth switch. When the measuring signal is abnormal, the controller gives a corresponding instruction.
When the test is finished or the test is abnormal, the controller gives a fourth output instruction, and the energy on the direct current support capacitor to be tested is released through the discharging resistor after the sixth switch is switched on.
Further, the first power source is conventionally 220V AC, the second power source is conventionally 380V AC, and the third power source is conventionally 380V AC.
Furthermore, the capacity of the first boosting transformer is 30KVA, and the transformation ratio is 0.4/7 kV.
Furthermore, the capacity of the second boosting transformer is 100KVA, and the transformation ratio is 0.4/3 kV.
Furthermore, the frequency range of the variable frequency power supply is 100-2500 HZ, and the power is 100 KVA.
Further, the voltage measurement adopts a voltage measuring meter.
Further, other signals (temperature, pressure, etc.) place the relevant sensors on the DC support capacitors (Cx) of the test.
Further, the maximum current 10mF is selected as the power frequency blocking capacitor and the high-frequency blocking capacitor.
Furthermore, the inductive reactance of the power frequency compensation reactor is adjustable, the sum of the capacitive reactance of the power frequency blocking capacitor and the capacitive reactance of the direct current supporting capacitor to be tested is matched with the inductive reactance of the power frequency compensation reactor, and the output power of the second boosting transformer is the minimum at the moment.
Furthermore, the inductive reactance of the high-frequency compensation reactor is adjustable, the sum of the capacitive reactance of the high-frequency blocking capacitor and the capacitive reactance of the direct-current supporting capacitor to be tested is matched with the inductive reactance of the high-frequency compensation reactor (under the test frequency condition), and the output power output by the high-frequency power supply is the minimum at the moment.
The invention has the beneficial effects that: the direct current support capacitor testing device can realize various voltage forms, can realize alternating current and direct current withstand voltage tests, thermal stability tests and durability tests, accords with the actual working condition of the direct current support capacitor, and has the advantages of simple test operation, easiness in maintenance, high reliability and good safety.
The voltage test device is simple in structure and convenient to operate, and can meet the voltage test requirements of the direct-current support capacitor.
Drawings
FIG. 1 is a schematic structural view of an embodiment of the present invention;
FIG. 2 is a schematic illustration of a wiring in accordance with the practice of the present invention;
in the figure, 1-DC test loop; 2-power frequency test loop; 3-high frequency test loop; 4-a test loop; 5-a control loop;
51-signal acquisition; 52-control output; 52-a controller;
511-voltage signal; 512-current signal; 513 — other signals;
521-a first output; 522 — a second output; 523-third output; 523-fourth output;
Us1-a first power supply; s1-a first switch; BT (BT)1-a first voltage regulator; t is1-a first step-up transformer; d, a high-voltage silicon stack; r1-a current limiting resistor; c1-a dc filter capacitor; r2-a dc filter resistance; l-isolated AC inductor1；
Us2-a second power supply; s2-a second switch; BT (BT)2-a second voltage regulator; t is2-a second step-up transformer; l is2-a power frequency compensation reactor; s3-a third switch; c2-a power frequency blocking capacitor;
Us3-a third power supply; s4-a fourth switch; BP-high frequency power supply; an LB-filter; l is3-a high frequency compensation reactor; s5-a fifth switch; c3-a high frequency blocking capacitor; GND-ground;
S6-a sixth switch; r3-a discharge resistance; v-voltage measurement; TA-current measurement; cx-the DC support capacitor to be tested.
Detailed Description
The invention is further described with reference to the following figures and specific examples.
As can be seen in fig. 1, the present invention: the composite voltage test device mainly comprises a direct current test loop (1), a power frequency test loop (2), a high-frequency test loop (3), a test loop (4) and a control loop (5).
As can be seen from fig. 2:
the output end of the direct current test loop (1) is connected in parallel with one end of the test loop (4);
the other end of the test loop (4) is respectively connected with one end of the power frequency test loop (2) and one end of the high-frequency test loop (3) in parallel;
the control loop (5) comprises a signal acquisition unit (51), a control output unit (52) and a controller (53); the signal acquisition (51) of the control loop (5) comes from the test loop (4); the control output of the control loop (5) is respectively connected with the direct current test loop (1), the power frequency test loop (2), the high frequency test loop (3) and the test loop (4); a controller (53) computes an instruction to provide a control output (52) based on the signal acquisition (51);
the DC test circuit (1) comprises a first power supply (Us)1) A first switch (S)1) A first voltage regulator (BT)1) A first step-up transformer (T)1) A high-voltage silicon stack (D) and a current-limiting resistor (R)1) DC filter capacitor (C)1) DC filter resistance (R)2) Alternating inductance (L)1)；
The power frequency test circuit (2) comprises a second power supply (Us)2) A second switch (S)2) A second voltage regulator (BT)2) A second step-up transformer (T)2) Power frequency compensation reactor (L)2) And a third switch (S)3) Industrial frequency blocking capacitor (C)2)；
The high-frequency test loop (3) comprises a third power supply (Us)3) And a fourth switch (S)4) A high-frequency power supply (BP), a filter (LB), a high-frequency compensation reactor (L)3) And a fifth switch (S)5) High frequency blocking capacitor (C)3)；
The test circuit (4) comprises a sixth switch (S)6) Discharge resistance (R)3) Voltage measurement (V), current measurement (TA), dc support capacitor (Cx) to be tested;
a first power supply (Us)1) And a first switch (S)1) Is connected with one end of the connecting rod; a first switch (S)1) And the other end of the first voltage regulator (BT)1) One end of the primary side of the transformer is connected; a first power supply (Us)1) And the other end of the first voltage regulator (BT)1) The other end of the primary side of the transformer is connected with the other end of the primary side of the transformer; first voltage regulator (BT)1) And the first step-up transformer (T)1) The primary sides of the two primary sides are connected in parallel; first step-up transformer (T)1) One end of the secondary side is sequentially connected with a high-voltage silicon stack (D) and a current-limiting capacitor in seriesResistor (R)1) (ii) a Current limiting resistor (R)1) One end of (C) is connected in parallel with a DC filter capacitor (C)1) And a DC filter resistor (R) connected in series2) And alternating inductance (L)1) (ii) a Alternating inductance (L)1) One end of the test loop is connected with the high-voltage end of the test loop (4); of the first step-up transformer1) The other end of the secondary side and a DC filter capacitor (C)1) The other end of the test circuit is connected with the low-voltage end of the test circuit (4) in parallel and is Grounded (GND);
a second power supply (Us)2) And one end of the second switch (S)2) Is connected with one end of the connecting rod; a second switch (S)2) And the other end of the first voltage regulator (BT) and a second voltage regulator (BT)2) One end of the primary side of the transformer is connected; a second power supply (Us)2) And the other end of the first voltage regulator (BT) and a second voltage regulator (BT)2) The other end of the primary side of the transformer is connected with the other end of the primary side of the transformer; second voltage regulator (BT)2) And a second step-up transformer (T)2) The primary sides of the two primary sides are connected in parallel; second step-up transformer (T)2) Secondary side and power frequency compensation reactor (L)2) Are connected in parallel; power frequency compensation reactor (L)2) Is in turn connected to a third switch (S)3) Industrial frequency blocking capacitor (C)2) Are connected in series; industrial frequency blocking capacitor (C)2) The other end is connected with the high-voltage end of the test loop (4); power frequency compensation reactor (L)2) The low-voltage end of the testing circuit (4) is connected with the low-voltage end of the testing circuit in parallel and is Grounded (GND);
third power supply (Us)3) And a fourth switch (S)4) The high-frequency power supply (BP) is connected in sequence; the output end of the high-frequency power supply (BP) is connected with the input end of the filter (LB); filter (LB) output terminal and high frequency compensation reactor (L)3) Are connected in parallel; high frequency compensation reactor (L)3) Is in turn connected to a fifth switch (S)5) High frequency blocking capacitor (C)3) Are connected in series; high frequency blocking capacitor (C)3) The other end is connected with the high-voltage end of the test loop (4); high frequency compensation reactor (L)3) The low-voltage end of the testing circuit (4) is connected with the low-voltage end of the testing circuit in parallel and is Grounded (GND);
sixth switch (S)6) And a discharge resistor (R)3) Connected in parallel with the voltage measurement (V) after being connected in series; the DC support capacitor (Cx) to be tested is connected in series with the current measurement (TA)Then also connected in parallel with the voltage measurement (V);
the signal acquisition (51) comprises a voltage signal (511), a current signal (512) and other signals (513), wherein the other signals (513) comprise temperature, pressure and the like;
the control output (52) includes a first output (521), a second output (522), a third output (53), and a fourth output (524).
DC filter capacitor (C)1) DC filter resistance (R)1) An RC filter is formed so that a DC voltage applied to a DC support capacitor (Cx) to be tested can be stabilized.
When the first switch (S)1) In an on state, a second switch (S)2) And a fourth switch (S)4) When the voltage is in the sub-state, the output voltage of the composite voltage testing device is only direct current voltage at the moment, and a direct current withstand voltage test and a direct current durability test can be carried out.
When the second switch (S)2) In the closed state, the first switch (S)1) And a fourth switch (S)4) When the composite voltage test device is in a sub-state, the output voltage of the composite voltage test device is only power frequency voltage, and a power frequency thermal stability test can be carried out.
When the fourth switch (S)4) In the closed state, the first switch (S)1) A second switch (S)2) When the composite voltage test device is in a separate state, the output voltage of the composite voltage test device is only high-frequency voltage, and a high-frequency thermal stability test can be carried out.
When the first switch (S)1) A second switch (S)2) And a third switch (S)3) All are in an on state, a fourth switch (S)4) When the composite voltage test device is in a sub-state, the output voltage of the composite voltage test device is direct current voltage superposed power frequency voltage, and a thermal stability test and a durability test can be performed.
When the first switch (S)1) And a fourth switch (S)4) And a fifth switch (S)5) All are in an on state, a second switch (S)2) When the composite voltage test device is in a separate state, the composite voltage test device outputs direct-current voltage superposed with high-frequency voltage at the moment, and a thermal stability test and a durability test can be carried out.
When the second switch (S)2) And the third openingOff (S)3) And a fourth switch (S)4) And a fifth switch (S)5) All are in an on state, a first switch (S)1) When the composite voltage testing device is in a sub-state, the composite voltage testing device outputs power frequency voltage and high frequency voltage at the moment, and a thermal stability test can be carried out.
When the first switch (S)1) A second switch (S)2) And a third switch (S)3) And a fourth switch (S)4) And a fifth switch (S)5) The composite voltage testing device outputs direct current voltage superposed with power frequency voltage superposed with high frequency voltage at the moment, and can perform thermal stability test and durability test.
The commands of the first output (521), the first output (522) and the third output (523) correspond to the first switch (S)1) A second switch (S)2) And a fourth switch (S)3). When the measuring signal is abnormal, the controller (53) gives instructions to the first output (521), the first output (522) and the third output (523) correspondingly.
When the test is finished or the test is abnormal, the controller (53) gives an instruction of a fourth output (524), and a sixth switch (S) at the time6) Closing and discharging resistance (R)3) And the DC support capacitor (Cx) to be tested forms a discharge circuit, and the energy stored by the DC support capacitor (Cx) to be tested is released.
Further, a power frequency compensation reactor (L)2) Inductance value adjustable, power frequency blocking capacitor (C)2) And the sum of the capacitive reactance of the DC support capacitor (Cx) to be tested and the power frequency compensation reactor (L)2) Is matched, in this case the second step-up transformer (T)2) The output power of (a) is minimal.
Further, a high frequency compensation reactor (L)3) High frequency blocking capacitor (C) with adjustable inductance value3) And the sum of the capacitive reactance of the DC support capacitor (Cx) to be tested and the high-frequency compensation reactor (L)3) The inductive reactance of (b) is matched (under the test frequency condition), and the output power output by the high-frequency power supply (BP) is the minimum at the moment.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (5)
1. The utility model provides a compound voltage test device for direct current support capacitor which characterized by: the composite voltage test device mainly comprises a direct current test loop, a power frequency test loop, a high-frequency test loop, a test loop and a control loop, wherein the output end of the direct current test loop is connected with one end of the test loop in parallel, the other end of the test loop is connected with one end of the power frequency test loop and one end of the high-frequency test loop in parallel respectively, the control loop comprises signal acquisition, control output and a controller, the controller of the control loop gives an instruction for controlling the output according to a signal acquisition calculation result, the signal acquisition of the control loop is from the test loop, and the control output of the control loop is connected with the direct current test loop, the power frequency test loop, the high-frequency test loop and the test loop respectively.
2. The composite voltage test apparatus of claim 1, wherein: the direct current test loop comprises a first power supply, a first switch, a first voltage regulator, a first boosting transformer, a high-voltage silicon stack, a current-limiting resistor, a direct current filter capacitor, a direct current filter resistor and an alternating current isolating inductor;
one end of the first power supply is connected with one end of the first switch, the other end of the first switch is connected with one end of the primary side of the first voltage regulator, the other end of the first power supply is connected with the other end of the primary side of the first voltage regulator, the secondary side of the first voltage regulator is connected with the primary side of the first boosting transformer in parallel, one end of the secondary side of the first boosting transformer is sequentially connected with the high-voltage silicon stack and the current-limiting resistor in series, one end of the current-limiting resistor is connected with the direct-current filter capacitor in parallel and is simultaneously connected with the direct-current filter resistor in series and the alternating-current isolating inductor in series, and the other end of the secondary side of the first boosting transformer is connected with the other end.
3. The composite voltage test apparatus of claim 1, wherein: the power frequency test loop comprises a second power supply, a second switch, a second voltage regulator, a second step-up transformer, a power frequency compensation reactor, a third switch and a power frequency blocking capacitor;
one end of the second power supply is connected with one end of the second switch, the other end of the second switch is connected with one end of the primary side of the second voltage regulator, the other end of the second power supply is connected with the other end of the primary side of the second voltage regulator, the secondary side of the second voltage regulator is connected with the primary side of the second boosting transformer in parallel, the secondary side of the second boosting transformer is connected with the power frequency compensation reactor in parallel, and the high-voltage end of the power frequency compensation reactor is sequentially connected with the third switch and the power frequency blocking capacitor in series.
4. The composite voltage test apparatus of claim 1, wherein: the high-frequency test loop comprises a third power supply, a fourth switch, a high-frequency power supply, a filter, a high-frequency compensation reactor, a fifth switch and a high-frequency blocking capacitor;
the third power supply is sequentially connected with the fourth switch and the high-frequency power supply, the output end of the high-frequency power supply is connected with the input end of the filter, the output end of the filter is connected with the high-frequency compensation reactor in parallel, and the high-voltage end of the high-frequency compensation reactor is sequentially connected with the fifth switch and the high-frequency blocking capacitor in series.
5. The composite voltage test apparatus of claim 1, wherein: the test loop comprises a sixth switch, a discharge resistor, a voltage measurement device, a current measurement device and a direct current support capacitor to be tested;
the sixth switch is connected in series with the discharge resistor and then connected in parallel with the voltage measurement, and the direct current support capacitor to be tested is connected in series with the current measurement and then connected in parallel with the voltage measurement.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011574330.3A CN112379310A (en) | 2020-12-28 | 2020-12-28 | Composite voltage test device for direct current support capacitor |
| PCT/CN2021/133164 WO2022083788A1 (en) | 2020-12-28 | 2021-11-25 | Composite voltage test device for dc link capacitor |
| ZA2022/01243A ZA202201243B (en) | 2020-12-28 | 2022-01-26 | Composite voltage testing device for dc-link capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011574330.3A CN112379310A (en) | 2020-12-28 | 2020-12-28 | Composite voltage test device for direct current support capacitor |
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| CN112379310A true CN112379310A (en) | 2021-02-19 |
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| CN202011574330.3A Pending CN112379310A (en) | 2020-12-28 | 2020-12-28 | Composite voltage test device for direct current support capacitor |
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| CN (1) | CN112379310A (en) |
| WO (1) | WO2022083788A1 (en) |
| ZA (1) | ZA202201243B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113447779A (en) * | 2021-07-15 | 2021-09-28 | 桂林电力电容器有限责任公司 | Direct-current support capacitor aging accelerated tolerance test circuit and test method |
| CN113884781A (en) * | 2021-08-16 | 2022-01-04 | 中国电力科学研究院有限公司 | Durability test loop for direct current support capacitor |
| WO2022083788A1 (en) * | 2020-12-28 | 2022-04-28 | 无锡市电力滤波有限公司 | Composite voltage test device for dc link capacitor |
| CN117233556A (en) * | 2023-11-10 | 2023-12-15 | 西安高压电器研究院股份有限公司 | Overvoltage test system for high-voltage alternating-current capacitor |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5677148B2 (en) * | 2011-03-15 | 2015-02-25 | 株式会社東芝 | Capacitor bank switching performance test equipment |
| DE102012208036A1 (en) * | 2012-05-14 | 2013-11-14 | Robert Bosch Gmbh | electric energy supply |
| CN104569672A (en) * | 2014-12-31 | 2015-04-29 | 上海思源电力电容器有限公司 | Power frequency superposition harmonic wave testing device for capacitor |
| CN105242124B (en) * | 2015-11-04 | 2018-06-08 | 桂林电力电容器有限责任公司 | High voltage direct current filter capacitor audible noise hookup and test method |
| CN105676161B (en) * | 2016-03-30 | 2019-01-25 | 国网电力科学研究院武汉南瑞有限责任公司 | The temporary stable state of alternating current-direct current is detecting device integrated |
| CN108445311B (en) * | 2018-03-30 | 2020-10-09 | 中国西电电气股份有限公司 | Capacitor noise test loop and test method thereof |
| CN110161288A (en) * | 2019-05-17 | 2019-08-23 | 华中科技大学 | A kind of direct current support capacitor test device of output AC/DC composite voltage |
| CN112379310A (en) * | 2020-12-28 | 2021-02-19 | 无锡市电力滤波有限公司 | Composite voltage test device for direct current support capacitor |
-
2020
- 2020-12-28 CN CN202011574330.3A patent/CN112379310A/en active Pending
-
2021
- 2021-11-25 WO PCT/CN2021/133164 patent/WO2022083788A1/en active Application Filing
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2022
- 2022-01-26 ZA ZA2022/01243A patent/ZA202201243B/en unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022083788A1 (en) * | 2020-12-28 | 2022-04-28 | 无锡市电力滤波有限公司 | Composite voltage test device for dc link capacitor |
| CN113447779A (en) * | 2021-07-15 | 2021-09-28 | 桂林电力电容器有限责任公司 | Direct-current support capacitor aging accelerated tolerance test circuit and test method |
| CN113884781A (en) * | 2021-08-16 | 2022-01-04 | 中国电力科学研究院有限公司 | Durability test loop for direct current support capacitor |
| CN117233556A (en) * | 2023-11-10 | 2023-12-15 | 西安高压电器研究院股份有限公司 | Overvoltage test system for high-voltage alternating-current capacitor |
Also Published As
| Publication number | Publication date |
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| WO2022083788A1 (en) | 2022-04-28 |
| ZA202201243B (en) | 2022-08-31 |
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