CN112379186B - Capacitance testing device - Google Patents
Capacitance testing device Download PDFInfo
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- CN112379186B CN112379186B CN201910687602.1A CN201910687602A CN112379186B CN 112379186 B CN112379186 B CN 112379186B CN 201910687602 A CN201910687602 A CN 201910687602A CN 112379186 B CN112379186 B CN 112379186B
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- 238000012360 testing method Methods 0.000 title claims abstract description 146
- 238000005259 measurement Methods 0.000 claims abstract description 86
- 239000003990 capacitor Substances 0.000 claims abstract description 50
- 230000002159 abnormal effect Effects 0.000 claims abstract description 42
- 238000012545 processing Methods 0.000 claims abstract description 39
- 230000005540 biological transmission Effects 0.000 claims abstract description 18
- 238000005516 engineering process Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000008439 repair process Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C23/00—Non-electrical signal transmission systems, e.g. optical systems
- G08C23/04—Non-electrical signal transmission systems, e.g. optical systems using light waves, e.g. infrared
Abstract
The application provides a capacitance testing device, which comprises a plurality of bent frames, a wireless receiving module and a processing module. Each bent comprises a plurality of test channels, a measuring unit and a wireless transmission unit. Each test channel is used for electrically connecting with the capacitor to be tested. The measuring unit is electrically connected with the plurality of test channels and used for obtaining the measuring value of each test channel and generating a measuring data signal. The wireless transmission unit is electrically connected with the measurement unit and is used for outputting measurement data signals wirelessly. The wireless receiving module sequentially receives the measurement data signals of each bent. The processing module is electrically connected with the wireless receiving module and judges whether the measured value of each test channel in the corresponding bent frame is abnormal or not according to the measured data signals.
Description
Technical Field
The present invention relates to a capacitance testing device, and more particularly, to a capacitance testing device for wirelessly reading measurement data.
Background
With the progress of technology, electronic products are increasingly popular. Because different numbers of capacitors are required to be used in each electronic product, the capacitors are inevitably required to be more and more in the market. High capacity capacitors, such as supercapacitors (electrostatic double-layer capacitors, EDLCs or double layer capacitors), have been proposed in the market today for various discharge times and current levels.
When the super capacitor leaves the factory, the reliability of the super capacitor can be inspected through repeated testing. Taking the super capacitor for aging test as an example, a plurality of super capacitors can be put into a high-temperature oven in batches by utilizing bent frames, and the aging state of the super capacitors can be simulated after baking for a period of time. And then placing the capacitor to be measured into a device bent at normal temperature to measure the leakage current of the aged super capacitor. In practice, a plurality of test channels can be designed on the bent frame, and each test channel can be electrically connected with one super capacitor, so that the super capacitor can be charged or discharged in the baking process. However, if a test channel in a certain bent is defective or damaged, it cannot be found in time, and it cannot be determined which bent or which test channel has a problem. For example, the bent frames can be inspected one by one only when all the detection ends or the machine is stopped for maintenance.
Obviously, shutdown maintenance can lengthen the overall inspection time, and also requires manual inspection of the bent by an engineer, with the spirit of an automated test violation. Even if an engineer detects that an abnormality occurs in a certain test channel, a large number of supercapacitors are tested by the unreliable test channel during the period from the damage of the test channel to the shutdown maintenance, and the reliability of detection is definitely greatly reduced.
Therefore, there is a need for a new capacitance testing device that can automatically determine the status of a test channel without stopping the device, and send out a warning signal when the test channel is determined to be abnormal.
Disclosure of Invention
In view of this, the present application provides a capacitance testing device having a plurality of racks and capable of wirelessly transmitting measurement data signals of each test channel, and a processing module for recording the measurement data signals to determine whether there is an excessive deviation of measurement values of the test channels. Therefore, the test channel is not required to be checked by a manual mode after the machine is stopped, and the state of the test channel is automatically judged.
The application provides a capacitance testing device, which comprises a plurality of bent frames, a wireless receiving module and a processing module. Each bent comprises a plurality of test channels, a measuring unit and a wireless transmission unit. Each test channel is used for electrically connecting with the capacitor to be tested. The measuring unit is electrically connected with the plurality of test channels and used for obtaining the measuring value of each test channel and generating a measuring data signal. The wireless transmission unit is electrically connected with the measurement unit and is used for outputting measurement data signals wirelessly. The wireless receiving module sequentially receives the measurement data signals of each bent. The processing module is electrically connected with the wireless receiving module and judges whether the measured value of each test channel in the corresponding bent frame is abnormal or not according to the measured data signals.
In some embodiments, the processing module may maintain a table of measurement values that records the number of consecutive anomalies for each test channel in each rack. When the processing module judges that the measured value of the jth test channel in the ith bent is abnormal, the continuous abnormal times of the jth test channel associated with the ith bent in the measured value table can be increased. When the processing module judges that the measured value of the jth test channel in the ith bent is normal, the continuous abnormal times associated with the jth test channel in the ith bent in the measured value table can be zeroed, wherein i and j are natural numbers. In addition, when the processing module determines that the number of consecutive anomalies of the jth test channel in the ith bent is greater than the first threshold, the processing module may generate a consecutive anomaly signal. In addition, the continuous abnormal signal can be used for marking the jth test channel in the ith bent and classifying the capacitors to be tested in the jth test channel in the ith bent into an undetected group.
In some embodiments, the measurement data signal may be transmitted by infrared rays between the wireless transmission unit and the wireless receiving module of each bent. In addition, the plurality of bent frames can be arranged in the accommodating device, the wireless receiving module is arranged on the first side of the accommodating device, and the wireless transmission unit of each bent frame outputs measurement data signals towards the first side of the accommodating device. In addition, the wireless receiving module can be used for receiving the measurement data signals from the designated area, and when the accommodating device works, the wireless transmission units of the former bent and the latter bent pass through the designated area sequentially at intervals of a default time.
In summary, the capacitive test device provided by the present application has a plurality of racks, each of which can wirelessly transmit the measurement data signal of its own test channel, without obtaining the measurement value by using a wire connection manner. And the processing module can record the measured data signals and maintain a measured value table, and judge whether the test channel is abnormal or not by recording whether the measured value of the test channel is continuously disqualified or not. Therefore, the capacitance testing device provided by the application can automatically judge the state of the testing channel and can give out a warning when judging that the testing channel is abnormal.
Other details of the functions and embodiments of the present application are described below with reference to the accompanying drawings.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a functional block diagram of a capacitance testing apparatus according to an embodiment of the present application;
FIG. 2 is a functional block diagram of a bent and a wireless receiving module according to an embodiment of the present application;
FIG. 3A is a table of measurement values for a first time according to one embodiment of the present application;
FIG. 3B is a table of measured values for a second time according to one embodiment of the present application;
FIG. 3C is a table of measurement values for a third time according to one embodiment of the present application.
Symbol description
1 capacitance test device 10 a-10 e bent
101 measurement unit 102 wireless transmission unit
111-116 test channel 12 wireless receiving module
14 processing Module 16 housing device
Detailed Description
The foregoing and other technical aspects, features and advantages of the present application will become more apparent from the following detailed description of a preferred embodiment, which proceeds with reference to the accompanying drawings. The directional terms mentioned in the following embodiments are, for example: upper, lower, left, right, front or rear, etc., are merely references to the directions of the drawings. Thus, the directional terminology is used for purposes of illustration and is not intended to be limiting of the application.
Referring to fig. 1 and fig. 2 together, fig. 1 is a functional block diagram illustrating a capacitance testing device according to an embodiment of the present application, and fig. 2 is a functional block diagram illustrating a bent and a wireless receiving module according to an embodiment of the present application. As shown in the drawing, the capacitance testing device 1 includes a plurality of racks 10 a-10 e, a wireless receiving module 12 and a processing module 14 for electrically testing a plurality of capacitors (not shown). The capacitors to be tested may be disposed in the racks 10a to 10e, and may be removed from the racks 10a to 10e after the test is completed. The bent frames 10a to 10e may be identical to each other and arranged in order, and the functions are not affected even if the bent frames 10a to 10e are arbitrarily changed in order. In one example, the racks 10 a-10 e may be disposed in the receiving device 16, and the racks 10 a-10 e may be movable in the receiving device 16. In addition, the wireless receiving module 12 is configured to receive wireless signals from a designated area, which may be exactly the area in the receiving device 16. Thus, when the racks 10a to 10e are moved in the accommodating apparatus 16, the designated area may be sequentially passed. In addition, the processing module 14 may be electrically connected to the wireless receiving module 12, and is configured to calculate the wireless signal received by the wireless receiving module 12. The respective portions of the capacitance testing apparatus 1 of the present embodiment will be described below.
Although the racks 10a to 10e are shown in fig. 1, the present embodiment is not limited to the number of racks, and may have tens of racks or more, for example. Further, since the racks 10a to 10e may be identical to each other, one rack 10b of the racks 10a to 10e is taken as an example. The bent 10b includes a plurality of test channels 111-116, a measurement unit 101, and a wireless transmission unit 102. Each of the test channels 111 to 116 may correspond to a capacitor to be tested, where the capacitor to be tested is pluggable and connected to the corresponding test channel, and performs an electrical test, such as charging and discharging, through the test channel. The measurement unit 101 is electrically connected to the plurality of test channels 111-116, and is used for measuring the capacitance to be measured in each test channel to obtain a corresponding measurement value. For example, the test channels 111-116 are provided with electrodes for measuring the voltage of the capacitor to be measured at any time, and the measuring unit 101 may record the voltage recorded by each test channel 111-116, and the voltage may be a measured value. In addition, the measurement unit 101 may combine the measurement values of the test channels 111 to 116 into a measurement data signal after obtaining the measurement values, and send the measurement data signal to the wireless transmission unit 102.
By way of practical example, the receiving device 16 may be a multi-slot device. After the capacitor to be tested is baked and charged at high temperature, the capacitor to be tested can be sequentially moved into the bent frames 10a to 10e of the accommodating device 16 to perform normal-temperature leakage current test. In the normal temperature leakage current test, a period of time is needed to wait for the actual time to measure how much current is leaked from the capacitor to be tested in the period of time, so that when the capacitor to be tested sequentially enters the racks 10 a-10 e of the accommodating device 16 from the feed inlet, the mechanism in the accommodating device 16 drives the racks 10 a-10 e to move in the accommodating device 16, and the capacitor to be tested in the racks 10 a-10 e can gradually return to the normal temperature state. It should be understood by those of ordinary skill in the art that the bent frames 10 a-10 e move in the accommodating device 16 and do not leave the accommodating device 16, the capacitance to be tested exchanges the capacitance to be tested at the position of the discharging hole of the accommodating device 16, the non-tested capacitance to be tested is sent into the accommodating device 16, and the tested capacitance to be tested is sent out of the accommodating device 16; in addition, the racks 10a to 10e sequentially pass through the designated area inside the accommodating apparatus 16, and the time intervals are also substantially the same (the preset time intervals).
In one example, the measurement unit 101 does not have to measure the capacitance to be measured in each test channel at any time to obtain the corresponding measurement value. For example, if the capacitor to be measured on the bent 10b is not in the receiving device 16 for a long time, the leakage condition of the capacitor to be measured is not obvious, and it is not necessarily meaningful for the measuring unit 101 to obtain the corresponding measurement value. Therefore, the measurement unit 101 can measure the capacitance to be measured in each test channel just before the bent 10b reaches the exit position of the accommodating device 16, so as to generate the measurement data signal. Similarly, the wireless transmission unit 102 does not have to transmit the measurement data signal at any time, for example, the wireless transmission unit 102 may transmit the measurement data signal when the bent 10b passes through a designated area inside the accommodating device 16. In practice, the wireless transmission unit 102 may transmit the measurement data signal by using an infrared technology, so that the wireless receiving module 12 outside the accommodating device 16 may receive the measurement data signal. It should be apparent to those of ordinary skill in the art that the wireless transmission unit 102 may transmit the measurement data signal toward one side (first side) of the receiving device 16 as it passes through the designated area. Of course, in order for the wireless receiving module 12 to correctly and effectively receive the measurement data signal, the wireless receiving module 12 should also be disposed on the same side (first side) of the accommodating device 16 and adjacent to the designated area for receiving infrared rays.
It should be noted that the present embodiment is not limited to what kind of testing station is used for the accommodating apparatus 16, for example, the accommodating apparatus 16 may be used for not only normal temperature leakage current testing, but also the foregoing high temperature baking and charging procedure. For example, when the accommodating device 16 is used for testing the normal-temperature leakage current, the measuring unit 101 can be used for measuring the leakage condition of the capacitor to be tested, and when the accommodating device 16 is used for high-temperature baking and charging, the measuring unit 101 can also be used for measuring the charging condition of the capacitor to be tested. In other words, since the measuring unit 101 is used for obtaining the electrical parameters of the capacitor to be measured, it should be understood by those skilled in the art that the bent frame can be applied to various devices requiring measurement of the electrical parameters.
In view of the above, since the racks 10a to 10e sequentially pass through the designated area, the wireless receiving module 12 can sequentially receive the measurement data signals of the racks 10a to 10 e. For example, when the wireless receiving module 12 receives the measurement data signal of the bent 10b, the measurement data signal can be transmitted to the processing module 14. Then, the processing module 14 can determine whether the measured value of each of the test channels 111-116 is abnormal in the bent 10b according to the measured data signal. In one example, the measurement data signal may include information such as a number of bent frames, a number of each test channel, a measurement value of each test channel, a measurement time point, or a measurement condition (e.g., temperature, current, voltage), which is not limited in this embodiment. In addition, the processing module 14 can compare the measured value of each of the test channels 111-116 with a reference value range, and can be marked as abnormal when the measured value of any of the test channels 111-116 is not within the reference value range. In addition, the processing module 14 may maintain a measurement value table, and each time the processing module 14 receives the measurement data signal, the content of the measurement value table may be updated according to the content of the measurement data signal, such as the number of the bent, the number of each test channel, the measurement value of each test channel, whether the measurement value is abnormal, etc.
In one example, the measurement value table is further used to record the number of continuous anomalies of the test channels 111-116 in a test period, where the number of continuous anomalies is, for example, the processing module 14 continuously determines that the measured value of a certain test channel is abnormal. For example, when the racks 10a to 10e each have 6 test channels, the racks 10a to 10e can be filled with 6 capacitors to be tested (30 capacitors to be tested), and after the continuous testing of the racks 10a to 10e is finished, the processing module 14 can update the content of the measurement value table for the first time according to the number of the racks, the number of each test channel, the measurement value of each test channel, whether the measurement value is abnormal or not, and other information. Then, the racks 10a to 10e sequentially discharge the tested capacitors to be tested, and load the next batch of capacitors to be tested again. For example, the racks 10a to 10e sequentially discharge the tested capacitors, load the next batch of 6 capacitors, and then sequentially enter the accommodating device 16 again. The process is repeated several times, so that the measurement value table maintained by the processing module 14 can record the results of measuring the capacitance to be measured several times for each channel. It should be noted that, in the present embodiment, the probe is not required to connect the bent frames 10a to 10e one by one to read the measurement data signal, so that the accuracy of reading the measurement data signal is reduced due to the damage of the probe. In addition, because each bent and each test channel are provided with respective numbers, engineers can more quickly find out specific bent and test channels by the numbers when overhauling, and the detection efficiency is improved.
For convenience of description, please refer to fig. 3A to 3C together, fig. 3A is a table showing measurement values of a first time according to an embodiment of the present application, fig. 3B is a table showing measurement values of a second time according to an embodiment of the present application, and fig. 3C is a table showing measurement values of a third time according to an embodiment of the present application. Fig. 3A shows that when the first measurement of the capacitance to be measured is completed in all of the racks 10a to 10e, it can be seen that the measured value measured by the 3 rd test channel (113) of the rack 10a is abnormal, the measured value measured by the 5 th test channel (115) of the rack 10b is abnormal, and the measured value measured by the 1 st test channel (111) of the rack 10e is abnormal. That is, the processing module 14 may record 1 in the fields corresponding to the 3 rd test channel of the bent 10a, the 5 th test channel of the bent 10b, and the 1 st test channel of the bent 10e in the measurement value table.
Next, after the capacitor to be measured is replaced, when the racks 10a to 10e all complete the second measurement of the capacitor to be measured, the processing module 14 can update the measurement value table as shown in fig. 3B. As can be seen in fig. 3B, the measured value measured by the 5 th test channel (115) of the bent 10B is abnormal, and the measured value measured by the 1 st test channel (111) of the bent 10d is abnormal. Since the 3 rd test channel of the bent 10a and the 1 st test channel of the bent 10e, which were previously measured for abnormal measurement values, have been measured for normal measurement values, the processing module 14 may record zeroing in the corresponding fields of the 3 rd test channel of the bent 10a and the 1 st test channel of the bent 10e in the measurement value table. However, since the 5 th test channel of the bent 10b continuously measures the second anomaly, the processing module 14 records 2 in the field corresponding to the 5 th test channel of the bent 10b in the measurement value table.
After replacing the capacitor to be measured again, when the racks 10a to 10e all complete the measurement of the capacitor to be measured for the third time, the processing module 14 can update the measurement value table as shown in fig. 3C. As can be seen in fig. 3C, the measured value measured by the 5 th test channel (115) of the bent 10b is abnormal, and the measured value measured by the 3 rd test channel (113) of the bent 10C is abnormal. Similarly, since the 1 st test channel of the bent 10d that has previously measured the abnormal measurement value is measured to the normal measurement value, the processing module 14 may record the zeroing in the field corresponding to the 1 st test channel of the bent 10d in the measurement value table. However, since the 5 th test channel of the bent 10b continuously measures the abnormality for the third time, the processing module 14 records 3 in the field corresponding to the 5 th test channel of the bent 10b in the measurement value table.
Since the yield of the capacitor to be measured is generally stable and not too bad when leaving the factory, for example, the yield is above 95%, and it is obvious that the measured values measured continuously for 3 times or more are abnormal, and the probability is very difficult to occur. Therefore, for the example of fig. 3C, the measured values measured by the test channel 115 of the bent 10b are abnormal 3 times in succession, which is very likely to indicate that the test channel 115 of the bent 10b is problematic. At this time, the processing module 14 can generate a continuous abnormal signal to alert the test channel 115 of the bent 10b to an abnormal condition, and ask the engineer to go to the inspection or repair. Of course, the engineer may set how many consecutive anomalies are worth noting, that is, the engineer may dynamically set the threshold (first threshold) at which the processing module 14 triggers the consecutive anomalies depending on the capacitance to be measured. The value of the first threshold is not limited herein, for example, if the yield of the capacitance to be measured from the factory is about 99%, then the engineer may set the threshold to be 2, that is, the measured value measured by the measuring channel continuously 3 times or more is abnormal, that is, it is necessary to manually check the measuring channel or repair the measuring channel. If the yield of the capacitance to be measured from the factory is about 90%, the engineer can set the threshold to be 5, that is, the measured value measured by the measuring channel continuously for 6 times or more than 6 times has abnormal conditions, that is, the measuring channel needs to be checked manually or repaired.
In one example, when the processing module 14 marks that the test channel 115 of the bent 10b is abnormal, the capacitors tested through the test channel 115 of the bent 10b are classified as non-tested groups. That is, since the test channel 115 of the bent 10b is already unreliable, the capacitor to be tested once tested through the test channel 115 of the bent 10b needs to be detected again by other reliable test channels again, so as to correctly determine whether the capacitor to be tested is normal. In practice, the engineer does not need to examine the test channel 115 of the bent 10b immediately, but can discard the capacitor to be tested, which is tested by the test channel 115 of the bent 10b, back into the trough again, and wait to be placed in any of the test channels of the bent 10a to 10e again. When the processed module 14 marks more abnormal test channels, the engineer can complete the overhaul once again, so that frequent shutdown overhaul caused by few abnormal test channels is avoided. Of course, it is also possible for the engineer to set the option of not continuing to place the capacitor under test into the abnormal test channel, and the embodiment is not limited herein.
In summary, the capacitive test device provided by the present application has a plurality of racks, each of which can wirelessly transmit the measurement data signal of its own test channel, without obtaining the measurement value by using a wire connection manner. And the processing module can record the measured data signals and maintain a measured value table, and judge whether the test channel is abnormal or not by recording whether the measured value of the test channel is continuously disqualified or not. Therefore, the capacitance testing device provided by the application can automatically judge the state of the testing channel and can give out a warning when judging that the testing channel is abnormal.
The above examples and/or embodiments are merely for illustrating the preferred examples and/or embodiments for implementing the technology of the present application, and are not limited in any way to the implementation of the technology of the present application, and any person skilled in the art should be able to make some changes or modifications to other equivalent examples without departing from the scope of the technical means disclosed in the present application, but should still consider the technology or examples substantially identical to the present application.
Claims (3)
1. A capacitance testing apparatus, comprising:
a plurality of bent, each of the bent comprising:
each test channel is used for being electrically connected with a capacitor to be tested;
the measuring unit is electrically connected with the test channels and used for obtaining a measuring value of each test channel and generating a measuring data signal; and
a wireless transmission unit, electrically connected to the measurement unit, for outputting the measurement data signal wirelessly; and
a wireless receiving module for receiving the measurement data signal of each bent frame in sequence;
the processing module is electrically connected with the wireless receiving module and used for judging whether the measured value of each test channel is abnormal in the corresponding bent according to the measured data signals;
wherein the infrared ray is used for transmitting the measurement data signal between the wireless transmission unit and the wireless receiving module of each bent;
the wireless receiving module is arranged on a first side of the accommodating equipment, and the wireless transmission unit of each bent outputs the measurement data signal towards the first side of the accommodating equipment;
the wireless receiving module is used for receiving the measurement data signal from a designated area, and when the accommodating equipment works, the wireless transmission units of the former bent and the latter bent sequentially pass through the designated area at a default time interval;
the processing module maintains a measurement value table, and the measurement value table records a continuous abnormal number of each test channel in each bent; when the processing module judges that the measured value of the jth test channel in the ith bent is abnormal, the continuous abnormal times of the jth test channel in the ith bent in the measured value table are increased, wherein i and j are natural numbers; when the processing module judges that the continuous abnormal times of the j-th test channel in the i-th bent is larger than a first threshold value, the processing module generates a continuous abnormal signal.
2. The capacitive testing device of claim 1, wherein when the processing module determines that the measured value of the jth test channel in the ith rack is normal, the consecutive abnormal times associated with the jth test channel in the ith rack in the measured value table are zeroed.
3. The device of claim 1, wherein the continuous anomaly signal is used to mark the jth test channel in the ith rack and to classify the capacitors to be tested in the jth test channel in the ith rack into an undetected group.
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| CN201910687602.1A CN112379186B (en) | 2019-07-29 | 2019-07-29 | Capacitance testing device |
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