Disclosure of Invention
In view of this, the present application provides a testing apparatus for a C interface of a transponder, which is used to test the C interface of the transponder, so as to improve testing efficiency.
In order to achieve the above object, the following solutions are proposed:
the utility model provides a testing arrangement of transponder C interface, includes host computer and next machine, the host computer is provided with first information interaction interface, the next machine is provided with second information interaction interface and third information interaction interface, wherein:
the first information interaction interface is used for sending a control command and a message to the lower computer and receiving feedback information returned by the lower computer, and the upper computer is also provided with a display module which is used for displaying the feedback information;
the second information interaction interface is connected with the first information interaction interface and is used for receiving the control command and/or the message and sending the feedback information to the first information interaction interface;
the third information interaction interface is connected with a C interface of a responder to be tested and is used for sending a C interface signal to the responder and receiving the feedback information returned by the responder.
Optionally, the feedback information includes a command execution condition and/or a C4 signal detection condition.
Optionally, the control command includes a single-sending message command, a cyclic-sending message command, an uninterrupted-sending message command, a sequential-message-sending command, a turn-off/turn-on C1 signal command, and a turn-off and turn-on C6 signal command.
Optionally, the lower computer includes a communication module, a logic processing module, a C1 signal digital potentiometer module, a C1 signal amplification module, a C6 signal generation module, a C6 signal digital potentiometer module, a C6 signal amplification module, and a C interface signal coupling module, wherein:
the communication module is provided with a first communication port, the communication port is used as the second information interaction interface, and the communication module is further in signal connection with the logic processing module;
the logic processing module is also respectively connected with the C1 signal digital potentiometer module, the C1 signal amplifying module, the C6 signal generating module and the C6 signal digital potentiometer module;
the C1 signal digital potentiometer module is also connected with the C1 signal amplification module;
the C1 signal amplification module is also connected with the C interface signal coupling module and the logic processing module respectively;
the C6 signal generating module is also connected with the C6 signal amplifying module;
the C6 signal digital potentiometer module is also connected with the C6 signal amplification module;
the C6 signal amplification module is also connected with the C interface signal coupling module and the logic processing module respectively;
the C interface signal coupling module is provided with a second communication port, and the second communication port is used as the third information interaction interface.
Optionally, the communication module is used for interacting with information of an upper computer and receiving the control command and the message;
the logic processing module is configured to, after receiving the control command and the message forwarded by the communication module, perform DBPL encoding on the message according to a DBPL encoding rule, send the obtained DBPL code to the C1 signal amplification module, further be configured to send an enable signal to the C6 signal generation module, further be configured to control the DBPL code to output and output a C6 signal enable signal according to the control command, implement turning off or turning on of a C1 signal and a C6 signal, further be configured to perform a back detection on the C1 signal and the C6 signal, be configured to obtain states of C1 and C6 signals, and further be configured to adjust levels of a C1 signal digital potentiometer module and/or a C6 signal digital potentiometer module according to the C1 signal and the C6 signal back detection, and change amplitudes of C1 signals and C6 signals.
The C1 signal digital potentiometer module is used for outputting a direct current bias voltage to the C1 signal amplification module;
the C1 signal amplification module is used for performing power amplification on the DBPL code after receiving the DBPL code and the direct-current bias voltage, and outputting the DBPL code to the C interface signal coupling module;
the C6 signal generating module is configured to generate the C6 signal through a DDS chip after receiving the C6 enable signal, and output the C6 signal to the C6 signal digital potentiometer module;
the C6 signal digital potentiometer module is used for outputting bias voltage to the C6 signal amplification module;
the C6 signal amplifying module is configured to, after receiving the C6 interface signal, perform power amplification on the C6 interface signal through a triode amplifying circuit, and output the power amplified signal to the C interface signal coupling module;
the C interface signal coupling module is used for coupling the C1 signal and the C6 signal in a transformer coupling mode to form a C interface signal and outputting the C interface signal to the outside;
optionally, the lower computer further comprises a C4 signal detection module, wherein:
the C4 signal detection module is respectively connected with the logic processing module and the second communication port by signals.
Optionally, the C4 signal detecting module is configured to collect the C4 signal from the transponder and transmit the signal to the logic processing module.
Optionally, the logic processing module is further configured to receive the C4 signal and feed back the signal to the upper computer.
According to the technical scheme, the test device for the C interface of the responder comprises an upper computer and a lower computer, wherein the upper computer is provided with a first information interaction interface, and the lower computer + is provided with a second information interaction interface and a third information interaction interface. The first information interaction interface is used for sending control commands and message information to the lower computer and receiving feedback information returned by the lower computer, and the upper computer is also provided with a display module which is used for displaying the feedback information; the second information interaction interface is connected with the first information interaction interface and used for receiving the control command and/or the message information and sending feedback information to the first information interaction interface; the third information interaction interface is connected with a C interface of the responder to be tested and used for sending a C interface signal to the responder and receiving feedback information returned by the responder. Compared with the existing test system, the test system has the advantages that a user only needs to connect the upper computer with the lower computer during testing, and connects the C interface of the responder to be tested with the lower computer, so that the test purpose can be realized, the complexity of the system is obviously reduced, excessive operation steps are not needed, and the test efficiency is improved.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Examples
Fig. 2 is a block diagram of a testing apparatus for a C interface of a transponder according to an embodiment of the present application.
As shown in fig. 2, the testing apparatus provided in this embodiment is used for testing whether the C interface of the transponder to be tested can work normally, and the testing apparatus includes an upper computer 10 and a lower computer 20, which are connected by a data line to realize signal connection or data connection, so as to realize data interaction between the two.
The upper computer can be implemented by a computer, a workstation or a server, and includes at least a first information interaction interface 101 and a display module 102, which can be implemented by a display. The lower computer is provided with a second information interaction interface 201 and a third information interaction interface 202. The first information interaction interface is connected with the second information interaction interface, and the third information interaction interface is used for connecting a C interface of a responder to be tested.
The upper computer sends a control command and a message to the lower computer through a first information interaction interface of the upper computer automatically or manually based on the operation of a user or program control; and after receiving the control command and the message by using the second information interaction interface, the lower computer sends a corresponding message to the connected responder through the third information interaction interface based on the operation rule specified by the control command, and receives feedback information fed back by the responder through the C interface based on the message.
The control commands include single-send message commands, cyclic-send message commands, uninterrupted-send message commands, sequential message-send commands, partial or full of the command to turn off/on the C1 signal and the command to turn off and on the C6 signal, the amplitude level of the C1 signal, and the amplitude level of the C6 signal.
The lower computer sends the feedback information to the upper computer after receiving the feedback information, the upper computer displays the feedback information to a user by using a display module of the upper computer, the feedback information comprises a command execution condition and can represent whether the responder works normally, and therefore the user can test the C interface of the responder through the feedback information. In addition, the feedback information also includes the detection condition of the C4 signal.
According to the technical scheme, the test device for the C interface of the responder comprises an upper computer and a lower computer, wherein the upper computer is provided with a first information interaction interface, and the lower computer is provided with a second information interaction interface and a third information interaction interface. The first information interaction interface is used for sending control commands and message information to the lower computer and receiving feedback information returned by the lower computer, and the upper computer is also provided with a display module which is used for displaying the feedback information; the second information interaction interface is connected with the first information interaction interface and used for receiving the control command and/or the message information and sending feedback information to the first information interaction interface; the third information interaction interface is connected with a C interface of the responder to be tested and used for sending a C interface signal to the responder and receiving feedback information returned by the responder. Compared with the existing test system, the test system has the advantages that a user only needs to connect the upper computer with the lower computer during testing, and connects the C interface of the responder to be tested with the lower computer, so that the test purpose can be realized, the complexity of the system is obviously reduced, excessive operation steps are not needed, and the test efficiency is improved.
The method can simply simulate the conditions of sending various messages (single-time message sending, cyclic message sending, uninterrupted message sending and sequential message sending), the conditions that the C interface signal only has a C1 signal or only has a C6 signal, and the conditions that the C interface signals with different amplitudes are simply simulated.
In a specific implementation manner of this embodiment, the lower computer of the test apparatus includes a communication module 21, a logic processing module 22, a C1 signal digital potentiometer module 23, a C1 signal amplification module 24, a C6 signal generation module 25, a C6 signal digital potentiometer module 26, a C6 signal amplification module 27, and a C interface signal coupling module 28, as shown in fig. 3.
The communication module is provided with a first communication port 211, the communication port is used as a second information interaction interface, and the communication module is further in signal connection with the logic processing module respectively; the logic processing module is also respectively connected with the C1 signal digital potentiometer module, the C1 signal amplification module signal, the C6 signal generation module and the C6 signal digital potentiometer module; the C6 signal generating module is also in signal connection with the C6 signal amplifying module.
The C6 signal amplification module is also in signal connection with the C interface signal coupling module; the C1 signal amplification module is also in signal connection with the C interface signal coupling module; the C-interface signal coupling module is provided with a second communication port 281, and the second communication port is used as a third information interaction interface.
In addition, as shown in fig. 4, in order to implement the test for the transponder with the sub-interface of C4, the test apparatus in this embodiment further includes a C4 signal detection module 29, as shown in fig. 4. The C4 signal detection module is respectively connected with the logic processing module and the second communication port of the C interface signal coupling module.
The communication module is used for information interaction with the upper computer.
The logic processing module is a processing core of the lower computer and has the following functions:
a) receiving a control command and a message from a communication module, carrying out DBPL coding on the message according to a DBPL coding rule after receiving the message to obtain a DBPL code, and sending the DBPL code to a C1 signal amplification module;
b) sending an enable signal to a C6 signal generation module;
c) the DBPL code output and the C6 enable signal can be controlled according to the command of an upper computer, and the C1 signal and the C6 signal are turned off and on;
d) the C1 signal and the C6 signal are checked back to confirm the states of the C1 signal and the C6 signal;
e) and C4 signals are received and fed back to the upper computer through the communication module.
The C1 signal digital potentiometer module outputs a DC bias voltage to the C1 signal amplification module.
And after receiving the DBPL code and the DC bias voltage, the C1 signal amplification module performs power amplification on the DBPL code, meets the requirement of specific C1 signal amplitude after amplification, and outputs the signal to the C interface signal coupling module.
After receiving the C6 enable signal, the C6 signal generation module generates a C6 signal through the DDS chip and outputs the C6 signal to the digital potentiometer module.
The C6 signal digital potentiometer module outputs a bias voltage to the C6 signal amplification module.
After the C6 signal amplification module receives the C6 signal, the power amplification is carried out on the C6 signal through the triode amplification circuit, the amplitude requirement of the specific C6 signal is met after the C6 signal is amplified, and the C6 signal is output to the C interface signal coupling module.
The C interface signal coupling module couples the C1 signal and the C6 signal in a transformer coupling mode to form external output of the C interface signal.
The C4 signal detection module collects the C4 signal from the transponder and transmits the signal to the logic processing module.
In addition, the embodiment further includes a power module, the power module is configured to generate a dc voltage required by the other circuit modules when operating, the power module is powered by a battery, and simultaneously forms a power interface with the outside to charge the battery.
The test device realizes the transmission of the message through the following steps, as shown in fig. 5.
And S101, the upper computer sends commands, messages and C1/C6 signal amplitude levels.
The command comprises a single/circulation/uninterrupted/sequence sending message and the like;
s102, generating a C1 signal: outputting a DBPL code, setting a direct current bias voltage, and sending a large C1 signal;
s103, generating a C6 signal: outputting a C6 enable signal, generating a C6 signal, setting a direct current bias voltage, and amplifying a C6 signal;
s104, synthesizing the signals C1 and C6 and outputting the signals;
s105, carrying out recheck on the signals C1 and C6, and if the signals are abnormal, feeding back to an upper computer;
s106, completing message sending according to the command requirement, or sending the message all the time until a new command exists.
The test apparatus in this embodiment turns off the C1 signal by the following steps, as shown in fig. 6:
s201, the upper computer sends a C1 turn-off command;
s202, generating a C1 signal: stopping outputting the DBPL code;
s203, generating a C6 signal: outputting a C6 enable signal, generating a C6 signal, setting a direct current bias voltage, and amplifying a C6 signal;
s204, synthesizing the signals C1 and C6 and outputting the signals;
s205, carrying out recheck on the signals C1 and C6, and if the signals are abnormal, feeding back to an upper computer;
s206, completing message sending according to the command requirement, or sending the message all the time until a new command exists.
The test apparatus in this embodiment turns off the C6 signal by the following steps, as shown in fig. 7:
s301, the upper computer sends a command and a message, wherein the command is a single/cyclic/uninterrupted/sequential message;
s302, generating a C1 signal: outputting a DBPL code, setting a direct current bias voltage, and sending a large C1 signal;
s303, generating a C6 signal: turn off the C6 enable signal;
s304, synthesizing the signals of C1 and C6 and outputting the signals;
s305, carrying out recheck on the signals C1 and C6, and if the signals are abnormal, feeding back to an upper computer;
s306, completing message sending according to the command requirement, or sending the message all the time until a new command exists.
The test apparatus in this embodiment further implements sending a message by the following steps, as shown in fig. 8:
s401, detecting a C4 signal by the lower computer;
s402, if a C4 signal exists, feeding back the signal to an upper computer;
s403, displaying a C4 signal by the upper computer;
the embodiments in the present specification are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, apparatus, or computer program product. Accordingly, embodiments of the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
Embodiments of the present invention are described with reference to flowchart illustrations and/or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing terminal to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing terminal to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing terminal to cause a series of operational steps to be performed on the computer or other programmable terminal to produce a computer implemented process such that the instructions which execute on the computer or other programmable terminal provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications of these embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the embodiments of the invention.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or terminal that comprises the element.
The technical solutions provided by the present invention are described in detail above, and the principle and the implementation of the present invention are explained in this document by applying specific examples, and the descriptions of the above examples are only used to help understanding the method and the core idea of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.