CN112327056A - Multi-package compatible and adjustable resistance test fixture - Google Patents
Multi-package compatible and adjustable resistance test fixture Download PDFInfo
- Publication number
- CN112327056A CN112327056A CN202011281030.6A CN202011281030A CN112327056A CN 112327056 A CN112327056 A CN 112327056A CN 202011281030 A CN202011281030 A CN 202011281030A CN 112327056 A CN112327056 A CN 112327056A
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- current loading
- loading end
- base
- adjustable resistance
- detected
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- 238000012360 testing method Methods 0.000 title claims abstract description 67
- 238000005538 encapsulation Methods 0.000 claims 1
- 238000009434 installation Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention relates to the technical field of resistance testing, and discloses a multi-package compatible and adjustable resistance testing jig, which comprises: the base is fixedly provided with an installation rod; the first current loading end is connected with the base in a sliding manner; the second current loading end is fixedly connected with the base; the first current loading end and the second current end are used for placing the chip resistor to be detected and providing current loading; the test frame is connected with the connecting strip in a sliding manner; and the voltage test needle end is used for carrying out voltage test on the to-be-detected chip resistors on the first current loading end and the second current loading end. The chip resistor to be detected is placed through the first current loading end and the second current loading end, current loading is provided, voltage testing is conducted on the chip resistor to be detected through the voltage testing pin, the first current loading end is connected with the base in a sliding mode, testing is conducted on the chip resistors packaged in different modes conveniently, compatibility of the resistance testing jig is improved, and cost is reduced.
Description
Technical Field
The invention relates to the technical field of resistance testing, in particular to a multi-package compatible and adjustable resistance testing jig.
Background
A chip type fixed Resistor, commonly known as a chip Resistor (SMD Resistor), is one of the metal glass glaze resistors. The chip resistor is a resistor manufactured by mixing metal powder and glass glaze powder and printing the mixture on a substrate by a screen printing method.
In the prior art, the test of direct current resistance all adopts a four-wire method. However, most of the chip resistors adopt a single-side four-pin type pin-down mode, and the requirement of small-size products on the pin-down is stricter due to certain limitations on the size of the pin-down and the testing position of the pin-down. In addition, most of the existing test jigs are one set of test jig corresponding to one package size, which results in low compatibility of the resistance test jig.
Therefore, how to improve the compatibility of the resistance testing jig and reduce the cost becomes a technical problem to be solved urgently.
Disclosure of Invention
The technical problem to be solved by the invention is how to improve the compatibility of the resistance test fixture and reduce the cost.
Therefore, according to a first aspect, an embodiment of the present invention discloses a multi-package compatible and adjustable resistance testing fixture, which includes: the base is fixedly provided with an installation rod; the first current loading end is arranged on the base and is in sliding connection with the base; the second current loading end is arranged on the base and is fixedly connected with the base; the first current loading end and the second current loading end are used for placing a chip resistor to be detected and providing current loading; the test frame is arranged on the mounting rod; the connecting strip is arranged on the test frame and is in sliding connection with the test frame; and the voltage test needle end is sleeved on the outer side of the connecting strip, is in sliding connection with the connecting strip and is used for performing voltage test on the to-be-detected chip resistor on the first current loading end and the second current loading end.
The invention is further arranged that a first accommodating groove for conveniently accommodating the chip resistor to be detected is arranged on the first current loading end, and a second accommodating groove corresponding to the first accommodating groove is arranged on the second current loading end.
The invention is further provided that the first current loading ends are arranged into a plurality of groups, and the plurality of groups of first current loading ends are sequentially distributed on the base at equal intervals.
The invention is further configured such that the mounting bar and the base are of an integrally formed structure.
The invention is further arranged in that the test jig is provided with a first scale mark for displaying the scale.
The invention is further arranged in that the connecting strip is provided with a second scale mark for displaying the scale.
The invention has the following beneficial effects: the chip resistor to be detected is placed through the first current loading end and the second current loading end, current loading is provided, voltage testing is conducted on the chip resistor to be detected through the voltage testing pin, the first current loading end is connected with the base in a sliding mode, testing is conducted on the chip resistors packaged in different modes conveniently, compatibility of the resistance testing jig is improved, and cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic perspective view of a multi-package compatible and adjustable resistance test fixture disclosed in this embodiment.
Reference numerals: 1. a base; 11. mounting a rod; 2. a first current loading terminal; 21. a first accommodating groove; 3. a second current loading terminal; 31. a second accommodating groove; 4. a test jig; 41. a first scale mark; 5. a connecting strip; 51. a second scale mark; 6. and a voltage test pin terminal.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; the two elements may be directly connected or indirectly connected through an intermediate medium, or may be communicated with each other inside the two elements, or may be wirelessly connected or wired connected. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The embodiment of the invention discloses a multi-package compatible and adjustable resistance test fixture, as shown in figure 1, comprising: the testing device comprises a base 1, a first current loading end 2, a second current loading end 3, a testing frame 4, a connecting strip 5 and a voltage testing needle end 6, wherein a mounting rod 11 is fixedly arranged on the base 1; the first current loading end 2 is arranged on the base 1, and the first current loading end 2 is connected with the base 1 in a sliding manner; the second current loading end 3 is arranged on the base 1, and the second current loading end 3 is fixedly connected with the base 1; the first current loading end 2 and the second current loading end 3 are used for placing a chip resistor to be detected and providing current loading; the test frame 4 is arranged on the mounting rod 11; the connecting strip 5 is arranged on the test frame 4, and the connecting strip 5 is connected with the test frame 4 in a sliding manner; the voltage testing needle end 6 is sleeved on the outer side of the connecting strip 5, the voltage testing needle end 6 is connected with the connecting strip 5 in a sliding mode, and the voltage testing needle end 6 is used for testing the voltage of the chip resistor to be tested on the first current loading end 2 and the second current loading end 3. In the specific implementation process, the base 1 is provided with a spring for conveniently abutting against the first current loading end 2 so as to fasten the chip resistor to be detected.
It should be noted that the chip resistor to be detected is placed through the first current loading end 2 and the second current loading end 3, current loading is provided, and then the voltage test is performed on the chip resistor to be detected through the voltage test pin end 6, because the first current loading end 2 is connected to the base 1 in a sliding manner, the chip resistors packaged in different ways can be conveniently tested, the compatibility of the resistor test fixture is further improved, and the cost is reduced.
As shown in fig. 1, a first receiving groove 21 for conveniently receiving the chip resistor to be detected is formed in the first current loading end 2, and a second receiving groove 31 corresponding to the first receiving groove 21 is formed in the second current loading end 3.
As shown in fig. 1, the first current loading terminals 2 are provided in a plurality of groups, and the plurality of groups of first current loading terminals 3 are sequentially distributed on the base 1 at equal intervals. In a specific implementation, each of the first receiving grooves 21 is different in size, and each of the second receiving grooves 31 is different in size.
As shown in fig. 1, the mounting rod 11 and the base 1 are integrally formed.
As shown in fig. 1, the test frame 4 is provided with a first scale mark 41 for displaying a scale.
As shown in fig. 1, the connecting bar 5 is provided with a second scale mark 51 for displaying a scale.
It should be noted that the position of the voltage test point is conveniently located by the display function of the first scale mark 41 and the second scale mark 51, and the location of the required scale can be adjusted by the sliding connection strip 5 and the voltage test pin end 6.
The working principle is as follows: the chip resistor to be detected is placed through the first current loading end 2 and the second current loading end 3, current loading is provided, voltage testing is conducted on the chip resistor to be detected through the voltage testing needle end 6, the first current loading end 2 is connected with the base 1 in a sliding mode, testing is conducted on the chip resistors packaged in different modes conveniently, compatibility of the resistance testing jig is improved, and cost is reduced.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.
Claims (6)
1. The utility model provides a compatible and adjustable resistance test fixture of many encapsulation which characterized in that includes:
the device comprises a base (1), wherein a mounting rod (11) is fixedly arranged on the base (1);
the first current loading end (2) is arranged on the base (1) and is in sliding connection with the base (1);
the second current loading end (3) is arranged on the base (1) and is fixedly connected with the base (1); the first current loading end (2) and the second current loading end (3) are used for placing a chip resistor to be detected and providing current loading;
the test frame (4) is arranged on the mounting rod (11);
the connecting strip (5) is arranged on the test frame (4) and is in sliding connection with the test frame (4);
and the voltage testing needle end (6) is sleeved on the outer side of the connecting strip (5), is in sliding connection with the connecting strip (5), and is used for performing voltage testing on the to-be-detected chip resistor on the first current loading end (2) and the second current loading end (3).
2. The multi-package compatible and adjustable resistor testing fixture according to claim 1, wherein a first receiving groove (21) for conveniently receiving the chip resistor to be tested is disposed on the first current loading end (2), and a second receiving groove (31) corresponding to the first receiving groove (21) is disposed on the second current loading end (3).
3. The multi-package compatible and adjustable resistance testing fixture according to claim 1, wherein the first current loading terminals (2) are arranged in a plurality of groups, and the plurality of groups of first current loading terminals (2) are sequentially distributed on the base (1) at equal intervals.
4. The multi-package compatible and adjustable resistance testing fixture according to claim 1, wherein the mounting rod (11) and the base (1) are integrally formed.
5. The multi-package compatible and adjustable resistance testing fixture according to claim 1, wherein the testing jig (4) is provided with a first scale mark (41) for displaying a scale.
6. The multi-package compatible and adjustable resistance testing fixture according to claim 1, wherein the connection bar (5) is provided with a second scale mark (51) for displaying a scale.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011281030.6A CN112327056A (en) | 2020-11-16 | 2020-11-16 | Multi-package compatible and adjustable resistance test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011281030.6A CN112327056A (en) | 2020-11-16 | 2020-11-16 | Multi-package compatible and adjustable resistance test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112327056A true CN112327056A (en) | 2021-02-05 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011281030.6A Pending CN112327056A (en) | 2020-11-16 | 2020-11-16 | Multi-package compatible and adjustable resistance test fixture |
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| Country | Link |
|---|---|
| CN (1) | CN112327056A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120169357A1 (en) * | 2010-12-30 | 2012-07-05 | Bradley Calvin Rhett | Internal node resistance testing for a tire |
| CN202421225U (en) * | 2011-12-14 | 2012-09-05 | 中兴通讯股份有限公司 | Test clamp |
| CN204166012U (en) * | 2014-10-20 | 2015-02-18 | 深圳市海和电子有限公司 | A kind of PCBA board multifunctional efficient measurement jig |
| CN213934023U (en) * | 2020-11-16 | 2021-08-10 | 深圳市业展电子有限公司 | Multi-package compatible and adjustable resistance test fixture |
-
2020
- 2020-11-16 CN CN202011281030.6A patent/CN112327056A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120169357A1 (en) * | 2010-12-30 | 2012-07-05 | Bradley Calvin Rhett | Internal node resistance testing for a tire |
| CN202421225U (en) * | 2011-12-14 | 2012-09-05 | 中兴通讯股份有限公司 | Test clamp |
| CN204166012U (en) * | 2014-10-20 | 2015-02-18 | 深圳市海和电子有限公司 | A kind of PCBA board multifunctional efficient measurement jig |
| CN213934023U (en) * | 2020-11-16 | 2021-08-10 | 深圳市业展电子有限公司 | Multi-package compatible and adjustable resistance test fixture |
Non-Patent Citations (1)
| Title |
|---|
| 房少军, 聂国涛: "新型电阻加载微带贴片天线", 大连海事大学学报, no. 02, 15 June 2004 (2004-06-15) * |
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