CN112326036B - Method for solving shutter temperature drift of infrared temperature measurement equipment - Google Patents
Method for solving shutter temperature drift of infrared temperature measurement equipment Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 38
- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 29
- 230000005855 radiation Effects 0.000 claims abstract description 39
- 238000006243 chemical reaction Methods 0.000 claims abstract description 34
- 238000011088 calibration curve Methods 0.000 claims abstract description 17
- 239000011159 matrix material Substances 0.000 claims abstract description 10
- 206010057040 Temperature intolerance Diseases 0.000 claims abstract description 8
- 230000008543 heat sensitivity Effects 0.000 claims abstract description 8
- 230000005540 biological transmission Effects 0.000 claims description 10
- 238000004861 thermometry Methods 0.000 claims description 7
- 238000004891 communication Methods 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 4
- 230000008542 thermal sensitivity Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Abstract
Solution infrared temperature measurement is establishedThe method for preparing the shutter temperature drift comprises the following steps: acquiring an AD conversion value of shutter thermal radiation energy with uniform background; obtaining a shutter temperature TKTemperature of shutter TKCalculating the temperature of the target object by taking the reference, and acquiring Y by inquiring the temperature of the shutter16KA value; acquiring a target scene radiation AD conversion value X; acquiring a heat sensitivity gain compensation matrix K of each pixel point in advance, and calculating Y of target radiation by combining an AD conversion value B of shutter heat radiation energy and an AD conversion value X of target scene radiation energy16Value of delta Y16(ii) a By taking Y16KValue and acquired Δ Y16Value of before obtaining target temperature compensation corresponding Y16Value Y16T(ii) a Corresponding to Y before compensating for target temperature16The value is compensated by shutter16A value of DeltaY16K(ii) a Pre-compensation by target temperature corresponding to Y16Value Y16TAnd shutter compensation value DeltaY16KObtaining the corresponding Y of the target object16Obtaining a target temperature T according to a calibration curve obtained in advanceTarget. The invention can improve the temperature measurement precision and stability of the infrared temperature measurement product and improve the user experience.
Description
Technical Field
The invention relates to the technical field of infrared temperature measurement, in particular to a method for solving the problem of shutter temperature drift of infrared temperature measurement equipment.
Background
In the prior art, in the process of measuring the temperature by the infrared temperature measuring equipment, the shutter temperature is continuously extracted as the reference of measuring the target temperature, the target temperature is calculated on the basis of the shutter temperature, and the target temperature is calibrated. However, in the prior art, because the frequency of acquiring the temperature rise of the shutter is too high, there is a deviation in acquiring the reference shutter temperature used by the infrared temperature measurement device to measure the target temperature, and the measurement error acquired each time is accumulated, so that there are problems that an error occurs in the accuracy of the target temperature measured by the infrared temperature measurement device, and a large deviation occurs with the actual object temperature.
Disclosure of Invention
In view of the above, the present invention has been developed to provide a method for solving the above problems, or at least partially solving the above problems, of solving the shutter temperature drift of an infrared thermometry apparatus.
A method for solving shutter temperature drift of infrared temperature measurement equipment comprises the following steps:
s100, starting up initialization is carried out on infrared temperature measurement equipment, a shutter is controlled through a GPIO interface to drive an IC chip to close a shutter for the first time, when the shutter is closed, shutter blades are sampled, an AD conversion value B of shutter heat radiation energy with uniform background is obtained, and meanwhile the AD conversion value B of the shutter heat radiation energy with the background before is replaced;
s200.CPU passes I2C communication protocol reads shutter temperature transmission to obtain shutter temperature T at corresponding momentKTemperature of shutter TKCalculating the temperature of the target object by taking the reference, and inquiring the shutter temperature TKObtaining Y16KThe value is saved and is not updated;
s300, receiving infrared radiation of a target object by an infrared detector, and acquiring a target scene radiation quantity AD conversion value X;
s400, obtaining a heat sensitivity gain compensation matrix K of each pixel point in advance, and calculating Y of target radiation through the heat sensitivity gain compensation matrix K of each pixel point, an AD conversion value B of shutter heat radiation energy and an AD conversion value X of target scene radiation energy16Value and marked as Δ Y16；
S500. obtaining Y16K value through S200 and delta Y value obtained through S40016Value of before obtaining target temperature compensation corresponding Y16Value, corresponding to Y before compensating for the target temperature16The value is marked as Y16T；
S600, corresponding to Y before target temperature compensation16The value is compensated by shutter16A value of DeltaY16K；
S700, corresponding to Y before target temperature compensation16Value Y16TAnd shutter compensation value DeltaY16KObtaining the corresponding Y of the target object16Obtaining a target temperature T according to a calibration curve obtained in advanceTarget。
Further, in S100, after the infrared thermometry device is initialized for startup, when the shutter is not closed for the first time, the CPU performs a closing operation on the shutter according to a preset cycle.
Further, in S100, the method for obtaining the AD conversion value B of the shutter heat radiation energy includes: the infrared detector receives heat radiated by the shutter blades, analog quantity is converted into a digital signal through the analog-digital IC chip, and an AD conversion value corresponding to the whole scene can be obtained.
Further, in S200, if the current shutter closing is not the first closing after initialization, the process skips step S200 directly and proceeds to step S300.
Further, in S400, Y of the target radiation16Value of delta Y16The specific calculation method comprises the following steps: the difference value of the AD conversion value X of the target scene radiation quantity and the AD conversion value B of the shutter heat radiation energy is calculated, the product of the difference value and the gain compensation matrix K of the heat sensitivity of each pixel point is obtained, and the Y of the target radiation is obtained16Value of delta Y16。
Further, in S500, the Y16K value obtained in S200 and Δ Y obtained in S400 are compared16Summing the values to obtain the corresponding Y before target temperature compensation16Value Y16T。
Further, in S600, the shutter compensates for Y16Value of delta Y16KThe specific acquisition mode is as follows:
s601, directing the infrared temperature measuring equipment to a black body with known target temperature, and enabling a CPU to pass through I2C, reading the temperature sensor in real time by a protocol;
s602, recording a first shutter closing shutter temperature transmission value mark T1At this time, the AD value corresponding to the target temperature is marked as AD1；
S603, when the temperature of the sensor is stable and unchanged, reading data is finished, and after the recording is finished, a value corresponding to the shutter temperature transmission is recorded as T2The AD value corresponding to the target temperature is marked as AD2。
S604, through AD1And AD2Difference of (D) and T2And T1Calculating a compensation coefficient A according to the ratio of the difference values;
s605, subtracting the value T of the temperature sensor at the shutter position read by the CPU after starting up from the shutter temperature obtained in S200 to obtain a difference valueTaking the product of the difference and the compensation coefficient A as the shutter temperature drift compensation Y16Value of delta Y16K。
Further, in S700, the method for obtaining the calibration curve includes: and setting different temperature points by using a certain number of black bodies, and acquiring Y16 corresponding to the different temperature points to obtain a calibration curve with Y16 as a horizontal coordinate and the target temperature as a vertical coordinate.
Further, the period for the CPU to close the shutter is 2 min.
Further, in S700, the target object corresponding Y is obtained16The value is taken as the abscissa and is brought into the calibration curve obtained in advance to obtain the target temperature T of the ordinate of the calibration curveTarget。
The technical scheme provided by the embodiment of the invention has the beneficial effects that at least:
according to the invention, the frequency of acquiring the temperature rise of the shutter is reduced, the whole machine is started to acquire once, and the compensation scheme is adopted in the later stage, so that the shutter temperature drift in the temperature measurement process can be reduced, the temperature measurement precision and stability of the infrared temperature measurement product are improved, and the user experience is improved. Meanwhile, the absolute temperature rise of the shutter can be reduced or a high-precision temperature sensor is used by changing the position of the shutter in the whole machine, so that the measurement precision of the shutter temperature is improved.
The technical solution of the present invention is further described in detail by the accompanying drawings and embodiments.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a flowchart of a method for solving the problem of shutter temperature drift of an infrared temperature measurement device in embodiment 1 of the present invention;
FIG. 2 is a flowchart of an algorithm for solving the problem of shutter temperature drift of the infrared temperature measurement device in embodiment 1 of the present invention;
FIG. 3 is a schematic diagram of a calibration curve in embodiment 1 of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
In order to solve the problem that multiple shutter measurement errors in the prior art cause errors in the target temperature precision measured by infrared temperature measurement equipment, the embodiment of the invention provides a method for solving the shutter temperature drift of the infrared temperature measurement equipment.
Example 1
A method for solving the shutter temperature drift of an infrared temperature measurement device is disclosed as figure 1, and comprises the following steps:
s100, starting up initialization is conducted on the infrared temperature measuring equipment, the shutter is controlled through the GPIO interface to drive the IC chip to close the shutter for the first time, when the shutter is closed, the shutter blades are sampled, an AD conversion value B of shutter heat radiation energy with uniform background is obtained, and meanwhile the AD conversion value B of the shutter heat radiation energy with the background before is replaced.
In this embodiment, after the infrared temperature measuring device is started, the CPU is powered on, the program is initialized, and the program is initialized through I2And C, decrypting the infrared detector by using the communication protocol, configuring parameters, and controlling the shutter driving IC to close the shutter by using the GPIO after the configuration is completed. When the shutter is closed, sampling shutter blades to obtain an AD conversion value B of shutter thermal radiation energy with uniform background, and replacing the AD conversion value B of the shutter thermal radiation energy with the background before;
preferably, as shown in fig. 2, after the infrared thermometry device is initialized at startup, when the shutter is not closed for the first time, the CPU performs a closing operation on the shutter according to a preset period. In the present embodiment, the period for the CPU to close the shutter is 2 min.
In this embodiment, the method for obtaining the AD conversion value B of the shutter heat radiation energy is: the infrared detector receives heat radiated by the shutter blades, analog quantity is converted into a digital signal through the analog-digital IC chip, and an AD conversion value corresponding to the whole scene can be obtained.
S200.CPU passes I2C communication protocol reads shutter temperature transmission to obtain shutter temperature T at corresponding momentKTemperature of shutter TKCalculating the temperature of the target object by taking the reference, and inquiring the shutter temperature TKObtaining Y16KThe value is saved and not updated.
Specifically, after the whole infrared temperature measuring equipment is electrified and initialized, the shutter driving IC is controlled to close the shutter for the first time through the GPIO, the shutter is closed for the first time, and the CPU passes the I when the AD conversion value B of the background shutter heat radiation energy is collected2C communication protocol reads shutter temperature transmission to obtain shutter temperature T at corresponding momentKTemperature of shutter TKAnd calculating the temperature of the target object by taking the reference, wherein Y16K corresponding to the shutter temperature TK can be obtained by looking up a curve and is stored without updating.
In some preferred embodiments, if the current shutter closing is not the first closing after initialization, step S200 is directly skipped and step S300 is entered.
S300, receiving infrared radiation of a target object by an infrared detector, and acquiring an AD conversion value X of the radiation quantity of a target scene.
S400, obtaining a heat sensitivity gain compensation matrix K of each pixel point in advance, and calculating Y of target radiation through the heat sensitivity gain compensation matrix K of each pixel point, an AD conversion value B of shutter heat radiation energy and an AD conversion value X of target scene radiation energy16Value and marked as Δ Y16。
In this embodiment, Y of the target radiation16Value of delta Y16The specific calculation method comprises the following steps: making a difference value between an AD conversion value X of the target scene radiation quantity and an AD conversion value B of shutter thermal radiation energy, and multiplying the difference value of the two and a gain compensation matrix K of each pixel point thermal sensitivity to obtain Y of the target radiation16Value of delta Y16。
S500. obtaining Y16K value through S200 and delta Y value obtained through S40016Value of before obtaining target temperature compensation corresponding Y16Value, corresponding to Y before compensating for the target temperature16The value is marked as Y16T。
In the present embodiment, the target temperature is compensatedPre-compensation corresponding to Y16Value Y16TThe specific calculation method comprises the following steps: the Y16K value obtained in S200 and the Delta Y value obtained in S400 are compared16Summing the values to obtain the corresponding Y before target temperature compensation16Value Y16T。
S600, corresponding to Y before target temperature compensation16The value is compensated by shutter16A value of DeltaY16K。
In the present embodiment, the shutter compensation Y16Value of delta Y16KThe specific acquisition mode is as follows:
s601, directing the infrared temperature measuring equipment to a black body with known target temperature, and enabling a CPU to pass through I2C, reading the temperature sensor in real time by a protocol;
s602, recording a first shutter closing shutter temperature transmission value mark T1At this time, the AD value corresponding to the target temperature is marked as AD1；
S603, when the temperature of the sensor is stable and unchanged, reading data is finished, and after the recording is finished, a value corresponding to the shutter temperature transmission is recorded as T2The AD value corresponding to the target temperature is marked as AD2。
S604, through AD1And AD2Difference of (D) and T2And T1Calculating a compensation coefficient A according to the ratio of the difference values;
s605, subtracting the value T of the temperature sensor at the shutter position read by the CPU after starting up from the shutter temperature obtained in S200 to obtain a difference value, and taking the product of the difference value and the compensation coefficient A as the shutter temperature drift compensation Y16Value of delta Y16K。
S700, corresponding to Y before target temperature compensation16Value Y16TAnd shutter compensation value DeltaY16KObtaining the corresponding Y of the target object16Obtaining a target temperature T according to a calibration curve obtained in advanceTarget。
In this embodiment, as shown in fig. 3, the method for obtaining the calibration curve includes: and setting different temperature points by using a certain number of black bodies, and acquiring Y16 corresponding to the different temperature points to obtain a calibration curve with Y16 as a horizontal coordinate and the target temperature as a vertical coordinate.
In the present embodiment, the target temperature TTargetThe acquisition method comprises the following steps: will obtain the corresponding Y of the target object16The value is taken as the abscissa and is brought into the calibration curve obtained in advance to obtain the target temperature T of the ordinate of the calibration curveTarget。
According to the method for solving the shutter temperature drift of the infrared temperature measurement equipment, the frequency of collecting the shutter temperature rise is reduced, the whole machine is started to collect once, the compensation scheme is adopted in the later period, the shutter temperature drift in the temperature measurement process can be reduced, the temperature measurement precision and stability of the infrared temperature measurement product are improved, and the user experience is improved. Meanwhile, the absolute temperature rise of the shutter can be reduced or a high-precision temperature sensor is used by changing the position of the shutter in the whole machine, so that the measurement precision of the shutter temperature is improved.
It should be understood that the specific order or hierarchy of steps in the processes disclosed is an example of exemplary approaches. Based upon design preferences, it is understood that the specific order or hierarchy of steps in the processes may be rearranged without departing from the scope of the present disclosure. The accompanying method claims present elements of the various steps in a sample order, and are not intended to be limited to the specific order or hierarchy presented.
In the foregoing detailed description, various features are grouped together in a single embodiment for the purpose of streamlining the disclosure. This method of disclosure is not to be interpreted as reflecting an intention that the claimed embodiments of the subject matter require more features than are expressly recited in each claim. Rather, as the following claims reflect, invention lies in less than all features of a single disclosed embodiment. Thus, the following claims are hereby expressly incorporated into the detailed description, with each claim standing on its own as a separate preferred embodiment of the invention.
Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present disclosure.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor such the processor can read information from, and write information to, the storage medium. Of course, the storage medium may also be integral to the processor. The processor and the storage medium may reside in an ASIC. The ASIC may reside in a user terminal. Of course, the processor and the storage medium may reside as discrete components in a user terminal.
For a software implementation, the techniques described herein may be implemented with modules (e.g., procedures, functions, and so on) that perform the functions described herein. The software codes may be stored in memory units and executed by processors. The memory unit may be implemented within the processor or external to the processor, in which case it can be communicatively coupled to the processor via various means as is known in the art.
What has been described above includes examples of one or more embodiments. It is, of course, not possible to describe every conceivable combination of components or methodologies for purposes of describing the aforementioned embodiments, but one of ordinary skill in the art may recognize that many further combinations and permutations of various embodiments are possible. Accordingly, the embodiments described herein are intended to embrace all such alterations, modifications and variations that fall within the scope of the appended claims. Furthermore, to the extent that the term "includes" is used in either the detailed description or the claims, such term is intended to be inclusive in a manner similar to the term "comprising" as "comprising" is interpreted when employed as a transitional word in a claim. Furthermore, any use of the term "or" in the specification of the claims is intended to mean a "non-exclusive or".
Claims (9)
1. A method for solving the problem of shutter temperature drift of infrared temperature measurement equipment is characterized by comprising the following steps:
s100, starting up initialization is carried out on infrared temperature measurement equipment, a shutter is controlled through a GPIO interface to drive an IC chip to close a shutter for the first time, when the shutter is closed, shutter blades are sampled, an AD conversion value B of shutter heat radiation energy with uniform background is obtained, and meanwhile the AD conversion value B of the shutter heat radiation energy with the background before is replaced;
s200.CPU passes I2C communication protocol reads shutter temperature transmission to obtain shutter temperature T at corresponding momentKTemperature of shutter TKCalculating the temperature of the target object by taking the reference, and inquiring the shutter temperature TKObtaining Y16KThe value is saved and is not updated;
s300, receiving infrared radiation of a target object by an infrared detector, and acquiring a target scene radiation quantity AD conversion value X;
s400, acquiring a heat sensitivity gain compensation matrix K of each pixel point in advance, calculating a Y16 value of target radiation through the heat sensitivity gain compensation matrix K of each pixel point, an AD conversion value B of shutter heat radiation energy and an AD conversion value X of target scene radiation, and marking the value as delta Y16;
s500. obtaining Y16K value through S200 and delta Y value obtained through S40016Value of before obtaining target temperature compensation corresponding Y16Value, corresponding to Y before compensating for the target temperature16The value is marked as Y16T；
S600, carrying out shutter compensation on the corresponding Y16 value before target temperature compensation, and compensating the shutter by Y16A value of DeltaY16K(ii) a Shutter compensation Y16Value of delta Y16KThe specific acquisition mode is as follows:
s601, directing the infrared temperature measuring equipment to a black body with known target temperature, and enabling a CPU to pass through I2C, reading the temperature sensor in real time by a protocol;
s602, recording a first shutter closing shutter temperature transmission value mark T1At this time, the AD value corresponding to the target temperature is marked as AD1；
S603, when the temperature of the sensor is stable and unchanged, reading data is finished, and after the recording is finished, a value corresponding to the shutter temperature transmission is recorded as T2The AD value corresponding to the target temperature is marked as AD2；
S604, through AD1And AD2Difference of (D) and T2And T1Calculating a compensation coefficient A according to the ratio of the difference values;
s605, subtracting the value T of the temperature sensor at the shutter position read by the CPU after starting up from the shutter temperature obtained in S200 to obtain a difference value, and taking the product of the difference value and the compensation coefficient A as the shutter temperature drift compensation Y16Value of delta Y16K；
S700, corresponding to Y before target temperature compensation16Value Y16TAnd shutter compensation value DeltaY16KObtaining the corresponding Y of the target object16Obtaining a target temperature T according to a calibration curve obtained in advanceTarget。
2. The method as claimed in claim 1, wherein in S100, after the infrared thermometry device is initialized, when the shutter is not closed for the first time, the CPU closes the shutter according to a predetermined cycle.
3. The method for solving the shutter temperature drift of the infrared temperature measurement equipment according to claim 1, wherein in S100, the AD conversion value B of the shutter heat radiation energy is obtained by: the infrared detector receives heat radiated by the shutter blades, analog quantity is converted into a digital signal through the analog-digital IC chip, and an AD conversion value corresponding to the whole scene can be obtained.
4. The method for solving the shutter temperature drift of the infrared temperature measurement equipment according to claim 1, wherein in step S200, if the current shutter closing is not the initial shutter closing after initialization, the step S200 is directly skipped, and the procedure goes to step S300.
5. The method for solving the shutter temperature drift of the infrared thermometry equipment according to claim 1, wherein in S400, Y of the target radiation16Value of delta Y16The specific calculation method comprises the following steps: making a difference value between an AD conversion value X of the target scene radiation quantity and an AD conversion value B of shutter thermal radiation energy, and multiplying the difference value of the two and a gain compensation matrix K of each pixel point thermal sensitivity to obtain Y of the target radiation16Value of delta Y16。
6. The method for solving the shutter temperature drift of the infrared thermometry equipment according to claim 1, wherein in S500, the Y16K value obtained in S200 and the delta Y value obtained in S400 are compared16Summing the values to obtain the corresponding Y before target temperature compensation16Value Y16T。
7. The method for solving the shutter temperature drift of the infrared temperature measurement equipment according to claim 1, wherein in S600 and S700, the method for obtaining the calibration curve comprises the following steps: and setting different temperature points by using a certain number of black bodies, and acquiring Y16 corresponding to the different temperature points to obtain a calibration curve with Y16 as a horizontal coordinate and the target temperature as a vertical coordinate.
8. The method for solving the shutter temperature drift of the infrared thermometry equipment according to claim 2, wherein the period for closing the shutter by the CPU is 2 min.
9. The method for solving the shutter temperature drift of the infrared temperature measurement equipment according to claim 7, wherein in S700, the Y corresponding to the target object is obtained16The value is taken as the abscissa and is brought into the calibration curve obtained in advance to obtain the target temperature T of the ordinate of the calibration curveTarget。
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| CN111044156A (en) * | 2019-12-13 | 2020-04-21 | 上海交通大学 | Optical shutter type non-modulation infrared temperature measurement system and method |
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| JP2012058064A (en) * | 2010-09-08 | 2012-03-22 | Nippon Ceramic Co Ltd | Method for correcting data of infrared imaging device |
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| US20100237245A1 (en) * | 2008-12-19 | 2010-09-23 | Fluke Corporation | Shutterless infrared imager algorithm with drift correction |
| CN106679817A (en) * | 2016-12-23 | 2017-05-17 | 武汉星网光测科技有限公司 | Method for calibrating thermal infrared imager |
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