CN112291492B - Method and device for removing noise of image sensor and storage medium - Google Patents
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- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
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- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
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- H—ELECTRICITY
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- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
Abstract
The disclosure relates to a method and a device for removing noise of an image sensor, and a storage medium, which are used for solving the technical problem that the imaging quality of the image sensor is affected by column fixed pattern noise in the related art. The method for removing the noise of the image sensor comprises the following steps: acquiring a false output signal and a valid signal of the image sensor; performing denoising processing on the effective signal according to the pseudo output signal; outputting the processed effective signal.
Description
Technical Field
The present disclosure relates to the field of sensors, and in particular, to a method and apparatus for removing noise of an image sensor, and a storage medium.
Background
CMOS (Complementary Metal Oxide Semiconductor; complementary metal oxide semiconductor) image sensors, due to column mismatch, can exhibit inherent differences in output between different columns, namely vertical column fixed pattern noise, and due to the presence of column fixed pattern noise, when the image sensor captures an image, the image can exhibit obvious column vertical streaks, which do not change with a scene, and the column fixed pattern noise greatly affects the imaging quality of the image sensor, so removing the column fixed pattern noise is a challenge in the image sensor industry.
Disclosure of Invention
The disclosure provides a method and a device for removing noise of an image sensor and a storage medium, so as to solve the technical problem that the imaging quality of the image sensor is affected by column fixed pattern noise in the related art.
To achieve the above object, a first aspect of embodiments of the present disclosure provides a method of removing noise of an image sensor, the method including:
acquiring a false output signal and a valid signal of the image sensor;
performing denoising processing on the effective signal according to the pseudo output signal;
outputting the processed effective signal.
Optionally, the image sensor includes a pixel array, and a pixel structure of the pixel array includes a photodiode, a transfer transistor, a floating diffusion region, and a reset transistor; the N pole of the photodiode is connected with the source electrode of the transmission transistor, the drain electrode of the transmission transistor is connected with the floating diffusion region, and the source electrode of the reset transistor is connected with the floating diffusion region;
the acquiring the pseudo output signal of the image sensor includes:
controlling the reset transistor to reset the floating diffusion node and recording an output signal Vr1 of the pixel structure after reset;
sampling the pixels again, and recording an output signal Vs1 of the pixel structure;
a difference between the signal Vr1 and the signal Vs1 is output.
Optionally, the acquiring the effective signal of the image sensor includes:
after the pseudo output signal is obtained, sampling the pixel again and recording an output signal Vr2 of the pixel structure;
controlling the transmission transistor to be conducted and recording an output signal Vs2 of the pixel structure after the transmission transistor is conducted;
a difference between the signal Vr2 and the signal Vs2 is output.
Optionally, the performing denoising processing on the effective signal includes:
superposing the pseudo output signals of each column of the pixel array and then taking an average value;
the average value is subtracted from the effective signal for each column of the pixel array.
Optionally, the image sensor includes a column analog-to-digital converter electrically connected to the pixel array and a column random access memory electrically connected to the column analog-to-digital converter; the performing of the denoising process on the effective signal is performed in the column analog-to-digital converter or in the column random access memory.
In a second aspect of embodiments of the present disclosure, there is provided an apparatus for removing noise of an image sensor, the apparatus including:
the acquisition module is used for acquiring the false output signal and the effective signal of the image sensor;
a processing module, configured to perform denoising processing on the effective signal according to the pseudo output signal;
and the output module is used for outputting the processed effective signal.
Optionally, the image sensor includes a pixel array, and a pixel structure of the pixel array includes a photodiode, a transfer transistor, a floating diffusion region, and a reset transistor; the N pole of the photodiode is connected with the source electrode of the transmission transistor, the drain electrode of the transmission transistor is connected with the floating diffusion region, and the source electrode of the reset transistor is connected with the floating diffusion region;
the acquisition module comprises:
the first recording submodule is used for controlling the reset transistor to reset the floating diffusion area node and recording an output signal Vr1 of the pixel structure after reset;
the second recording submodule is used for sampling the pixels again and recording an output signal Vs1 of the pixel structure;
a first output sub-module for outputting a difference between the signal Vr1 and the signal Vs1.
Optionally, the acquiring module further includes:
the third recording sub-module is used for sampling the pixels again and recording the output signal Vr2 of the pixel structure after the pseudo output signal is obtained;
the fourth recording submodule is used for controlling the transmission transistor to be conducted and recording an output signal Vs2 of the pixel structure after the transmission transistor is conducted;
and a second output sub-module for outputting a difference between the signal Vr2 and the signal Vs2.
Optionally, the processing module is further configured to: superposing the pseudo output signals of each column of the pixel array and then taking an average value; the average value is subtracted from the effective signal for each column of the pixel array.
A third aspect of the disclosed embodiments provides a computer readable storage medium having stored thereon a computer program which when executed by a processor performs the steps of the method of any of the first aspects above.
In a fourth aspect of embodiments of the present disclosure, there is provided an apparatus for removing noise of an image sensor, including:
a memory having a computer program stored thereon; and
a processor for executing the computer program in the memory to implement the steps of the method of any of the above first aspects.
By adopting the technical scheme, at least the following technical effects can be achieved:
according to the method and the device, the pseudo output signal is obtained by adding the pseudo sampling operation, and the pseudo output signal only contains inherent mismatch of the column, and the effective signal contains both the inherent mismatch and photoelectric conversion information acquired by the pixel structure, so that denoising processing is carried out on the effective signal according to the pseudo output signal, the inherent mismatch of the column can be effectively removed, the imaging quality is improved, and the technical problem that the imaging quality is influenced by column fixed mode noise of an image sensor in the related art is solved. In addition, the reference row is not needed, and only the pseudo sampling operation is needed to be added, so that the reference row can be removed by the image sensor adopted by the method, and the cost of a chip is reduced.
Additional features and advantages of the present disclosure will be set forth in the detailed description which follows.
Drawings
The accompanying drawings are included to provide a further understanding of the disclosure, and are incorporated in and constitute a part of this specification, illustrate the disclosure and together with the description serve to explain, but do not limit the disclosure. In the drawings:
fig. 1 is a flowchart illustrating a method of removing noise of an image sensor according to an exemplary embodiment of the present disclosure.
Fig. 2 is a schematic diagram of an image sensor in the prior art.
Fig. 3 is a schematic diagram of an image sensor according to an exemplary embodiment of the present disclosure.
Fig. 4 is a circuit schematic diagram of a pixel structure in an image sensor according to an exemplary embodiment of the present disclosure.
Fig. 5 is a schematic diagram of a sample signal of an image sensor according to the prior art.
Fig. 6 is a schematic diagram of a sampling signal of an image sensor according to an exemplary embodiment of the present disclosure.
Fig. 7 is a flowchart illustrating a method of removing noise of an image sensor including acquiring a pseudo output signal in steps according to an exemplary embodiment.
Fig. 8 is a flowchart showing a method of removing noise of an image sensor according to an exemplary embodiment, including a step of acquiring a valid signal.
Fig. 9 is a block diagram of an apparatus for removing noise of an image sensor according to an exemplary embodiment of the present disclosure.
Fig. 10 is a block diagram of an acquisition module of an apparatus for removing image sensor noise, which is illustrated in an exemplary embodiment of the present disclosure.
Fig. 11 is a block diagram of another apparatus for removing noise of an image sensor according to an exemplary embodiment of the present disclosure.
Detailed Description
Specific embodiments of the present disclosure are described in detail below with reference to the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating and illustrating the disclosure, are not intended to limit the disclosure.
In the prior art, in order to remove column fixed pattern noise, an image sensor is proposed as in fig. 2, which comprises a reference row pixel array 10, an effective pixel array 11, a column analog-to-digital converter 12, a column random memory (column ADC) 13, a control circuit 14 and a row decoding circuit 15. The image sensor in fig. 2 removes column fixed pattern noise by calculating column signals output from the effective pixel array 11 and the reference row 10, and in general, the more the reference rows are, the better the image sensor removes column fixed pattern noise.
However, the present inventors have studied and found that the image sensor in fig. 2 requires more reference rows, and the area of the chip increases with the increase of the reference rows, and this method increases the cost of the chip to some extent.
Fig. 1 is a flowchart illustrating a method for removing noise of an image sensor according to an exemplary embodiment to solve a technical problem that an image sensor in the related art affects imaging quality due to the presence of column fixed pattern noise. As shown in fig. 1, the method for removing noise of the image sensor includes:
s11, obtaining a false output signal and a valid signal of the image sensor.
S12, according to the pseudo output signal, denoising processing is carried out on the effective signal.
S13, outputting the processed effective signal.
The present disclosure can be applied to an image sensor in fig. 3, which includes a pixel array 21, a column analog-to-digital converter 22, a column random memory (column ADC) 23, a control circuit 24, and a row decoding circuit 25, as shown in fig. 3.
The pixel structure of the pixel array 21 may include a photodiode 31, a transfer transistor TX, a floating diffusion FD, a reset transistor RST, a source follower transistor SF, and a row gate SEL, as shown in fig. 4; the N-pole of the photodiode 31 is connected to the source of the transfer transistor TX, the drain of the transfer transistor TX is connected to the floating diffusion FD, the source and drain of the reset transistor RST are respectively connected to the floating diffusion FD and the power supply, the gate of the source follower transistor SF is connected to the floating diffusion FD, and the source and drain of the pair of source follower transistors SF are respectively connected to the source and the power supply of the row select pipe SEL. In fig. 3, the pixel array 21 is M rows and N columns, and when the row gate 35 is gated, the current row and N columns output data at the same time.
As shown in fig. 5, the data acquisition mode of the pixel structure in the prior art is that, firstly, the reset transistor RST resets the floating diffusion FD, and at this time, the pixel structure outputs a reset signal Vr; then the transfer transistor TX is turned on to transfer the photoelectric signal in the photodiode 31 to the floating diffusion FD, and the output signal of the pixel structure is Vs. The difference between Vs and Vr is the information of the output image of the pixel structure, but due to the existence of column mismatch, the offset (offset) of each column is different, and column fixed pattern noise appears on the image.
To mitigate column fixed pattern noise, signal sampling of the pixel structure of the present disclosure is as shown in fig. 6, and the present disclosure adds one pseudo-sampling operation, i.e., the pseudo-output signal in step S11, on the basis of fig. 5. Referring to fig. 7, the acquiring the pseudo output signal of the image sensor may include the following steps:
s111, controlling the reset transistor to reset the floating diffusion node and recording the output signal Vr1 of the pixel structure after reset.
And S112, sampling the pixels again, and recording an output signal Vs1 of the pixel structure.
S113, a difference between the signal Vr1 and the signal Vs1 is output.
After the dummy output signal is acquired, a valid signal of the image sensor needs to be acquired again. As shown in fig. 8, the acquiring the effective signal of the image sensor may include the steps of:
s114, after obtaining the dummy output signal, resampling the pixel and recording the output signal Vr2 of the pixel structure.
S115, controlling the pass transistor to be turned on and recording the output signal Vs2 of the pixel structure after the pass transistor is turned on.
S116, outputting a difference between the signal Vr2 and the signal Vs2.
Referring to fig. 3, 4 and 6, first, the reset transistor RST resets the floating diffusion FD, and the pixel structure outputs a reset signal Vr1; then, sampling is performed again, the sampling signal is marked as Vs1, after the collection is completed, the difference between Vr1 and Vs1 is output and stored in the column random access memory 23, and the difference between Vr1 and Vs1 is the pseudo output signal.
Then, the output signal of the pixel structure is sampled again and is recorded as Vr2, and the collection of Vr2 is carried out before the transmission transistor TX is conducted; then, the transfer transistor TX is turned on, the photoelectric signal of the photodiode 31 is transferred to the floating diffusion FD, and at this time, the output signal of the pixel structure is denoted as Vs2, and the difference between Vr2 and Vs2 is the effective signal. After the acquisition is completed, the difference between Vr2 and Vs2 is output and stored in the column random access memory 23.
After the pseudo output signal and the effective signal are acquired, denoising processing is performed on the effective signal according to the pseudo output signal. For example, a method of performing denoising processing on the effective signal is put into one, subtracting the pseudo output signal from the effective signal, and then outputting the processed effective signal.
For example, referring to fig. 3, 4 and 6, the column random access memory 23 has pseudo output signals Vr 1-vs1=voffset=v1 and effective signals Vr 2-vs2=voffset+vsignal=v2, and thus, the denoising process may be performed in the column random access memory 23. Since the dummy output signals Vr1 to Vs1 are collected after the floating diffusion FD is reset and before the transfer transistor TX is turned on, the dummy output signals include only the inherent mismatch Voffset of the present column. And Vr2-Vs2 contains both the inherent mismatch Voffset and the photoelectric conversion information acquired by the pixel structure. Therefore, V2-v1=voffset+vsignal-voffset=vsignal, and the operation mode can effectively remove the inherent mismatch Voffset of the columns, improve the imaging quality, and solve the technical problem that the imaging quality of the image sensor is affected by the presence of column fixed pattern noise in the related art. In addition, the operation mode does not need reference lines, and only needs to add pseudo sampling operation, so that the image sensor adopted by the invention can remove the reference lines, and the cost of a chip is reduced.
In another embodiment, the denoising process may also be performed in the column random storage 23 by: firstly, overlapping the pseudo output signals of each column of the pixel array and then taking an average value; the average value is then subtracted from the active signal for each column of the pixel array. The mode can also eliminate column fixed pattern noise and improve imaging quality.
Referring to fig. 3, since the sampling signals Vr1, vs1, vr2 and Vs2 are also present in the column analog-to-digital converter 22, the effective signal denoising process may also be performed in the column analog-to-digital converter.
It should be noted that, the method for removing noise of an image sensor in the present disclosure may also be used for an image sensor with a non-column ADC structure, and for the case of serial output of column pixels of the image sensor, it is necessary to record the pseudo output signals output by all pixels in each column of the pixel array into the random access memory, and then subtract the pseudo output signals by using the effective signals, so that the vertical column fixed mode noise can be subtracted.
According to the method and the device, the pseudo output signal is obtained by adding the pseudo sampling operation, and the pseudo output signal only contains inherent mismatch of the column, and the effective signal contains both the inherent mismatch and photoelectric conversion information acquired by the pixel structure, so that denoising processing is carried out on the effective signal according to the pseudo output signal, the inherent mismatch of the column can be effectively removed, the imaging quality is improved, and the technical problem that the imaging quality is influenced by column fixed mode noise of an image sensor in the related art is solved. In addition, the reference row is not needed, and only the pseudo sampling operation is needed to be added, so that the reference row can be removed by the image sensor adopted by the method, and the cost of a chip is reduced.
It should be noted that, for simplicity of description, the method embodiment shown in fig. 1 is depicted as a series of acts, but it should be understood by those skilled in the art that the present disclosure is not limited by the order of acts depicted. Further, those skilled in the art will also appreciate that the embodiments described in the specification are all preferred embodiments and that the acts referred to are not necessarily required by the present disclosure.
Fig. 9 is an apparatus for removing noise of an image sensor according to an exemplary embodiment of the present disclosure. As shown in fig. 9, the apparatus 300 for removing noise of an image sensor includes:
an acquisition module 310, configured to acquire a dummy output signal and a valid signal of the image sensor;
a processing module 320, configured to perform denoising processing on the effective signal according to the pseudo output signal;
and an output module 330, configured to output the processed valid signal.
Optionally, the image sensor includes a pixel array, and a pixel structure of the pixel array includes a photodiode, a transfer transistor, a floating diffusion region, and a reset transistor; the N pole of the photodiode is connected with the source electrode of the transmission transistor, the drain electrode of the transmission transistor is connected with the floating diffusion region, and the source electrode of the reset transistor is connected with the floating diffusion region;
as shown in fig. 10, the acquisition module 310 includes:
a first recording submodule 311, configured to control the reset transistor to reset the floating diffusion node and record an output signal Vr1 of the pixel structure after the reset;
a second recording sub-module 312, configured to resample the pixel and record the output signal Vs1 of the pixel structure;
a first output sub-module 313 for outputting a difference between the signal Vr1 and the signal Vs1.
Optionally, as shown in fig. 10, the obtaining module 310 further includes:
a third recording sub-module 314, configured to sample the pixel again and record the output signal Vr2 of the pixel structure after obtaining the pseudo output signal;
a fourth recording sub-module 315, configured to control the pass transistor to be turned on and record an output signal Vs2 of the pixel structure after the pass transistor is turned on;
a second output sub-module 316 for outputting a difference between the signal Vr2 and the signal Vs2.
Optionally, the processing module 320 is further configured to: superposing the pseudo output signals of each column of the pixel array and then taking an average value; the average value is subtracted from the effective signal for each column of the pixel array.
The specific manner in which the various modules perform the operations in the apparatus of the above embodiments have been described in detail in connection with the embodiments of the method, and will not be described in detail herein.
The present disclosure also provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the method steps of removing image sensor noise described in the above embodiments.
The present disclosure also provides an apparatus for removing noise of an image sensor, including:
a memory having a computer program stored thereon; and
a processor for executing the computer program in the memory to implement the method steps for removing noise of an image sensor described in the above embodiments.
Fig. 11 is a block diagram illustrating an apparatus 400 for removing image sensor noise according to an exemplary embodiment. As shown in fig. 11, the apparatus 400 may include: a processor 401, a memory 402, a multimedia component 403, an input/output (I/O) interface 404, and a communication component 405.
Wherein the processor 401 is configured to control the overall operation of the apparatus 400 to perform all or part of the steps in the method for removing noise of an image sensor described above. The memory 402 is used to store various types of data to support operations at the device 400, which may include, for example, instructions for any application or method operating on the device 400, as well as application-related data. The Memory 402 may be implemented by any type or combination of volatile or non-volatile Memory devices, such as static random access Memory (Static Random Access Memory, SRAM for short), electrically erasable programmable Read-Only Memory (Electrically Erasable Programmable Read-Only Memory, EEPROM for short), erasable programmable Read-Only Memory (Erasable Programmable Read-Only Memory, EPROM for short), programmable Read-Only Memory (Programmable Read-Only Memory, PROM for short), read-Only Memory (ROM for short), magnetic Memory, flash Memory, magnetic disk, or optical disk. The multimedia component 403 may include a screen and an audio component. Wherein the screen may be, for example, a touch screen, the audio component being for outputting and/or inputting audio signals. For example, the audio component may include a microphone for receiving external audio signals. The received audio signal may be further stored in the memory 402 or transmitted through the communication component 405. The audio assembly further comprises at least one speaker for outputting audio signals. The I/O interface 404 provides an interface between the processor 401 and other interface modules, which may be a keyboard, mouse, buttons, etc. These buttons may be virtual buttons or physical buttons. The communication component 405 is used for wired or wireless communication between the apparatus 400 and other devices. Wireless communication, such as Wi-Fi, bluetooth, near field communication (Near Field Communication, NFC for short), 2G, 3G or 4G, or a combination of one or more thereof, the corresponding communication component 405 may thus comprise: wi-Fi module, bluetooth module, NFC module.
In an exemplary embodiment, the apparatus 400 may be implemented by one or more application specific integrated circuits (Application Specific Integrated Circuit, abbreviated ASIC), digital signal processor (Digital Signal Processor, abbreviated DSP), digital signal processing device (Digital Signal Processing Device, abbreviated DSPD), programmable logic device (Programmable Logic Device, abbreviated PLD), field programmable gate array (Field Programmable Gate Array, abbreviated FPGA), controller, microcontroller, microprocessor, or other electronic component for performing the above-described method of removing image sensor noise.
In another exemplary embodiment, a computer readable storage medium is also provided, e.g. a memory 402, comprising program instructions executable by the processor 401 of the apparatus 400 to perform the above described method of removing image sensor noise.
The preferred embodiments of the present disclosure have been described in detail above with reference to the accompanying drawings, but the present disclosure is not limited to the specific details of the above embodiments, and various simple modifications may be made to the technical solutions of the present disclosure within the scope of the technical concept of the present disclosure, and all the simple modifications belong to the protection scope of the present disclosure.
In addition, the specific features described in the above embodiments may be combined in any suitable manner without contradiction. The various possible combinations are not described further in this disclosure in order to avoid unnecessary repetition.
Moreover, any combination between the various embodiments of the present disclosure is possible as long as it does not depart from the spirit of the present disclosure, which should also be construed as the disclosure of the present disclosure.
Claims (7)
1. A method of removing noise from an image sensor, the image sensor comprising a pixel array having a pixel structure comprising a photodiode, a transfer transistor, a floating diffusion region, and a reset transistor; the N pole of the photodiode is connected with the source electrode of the transmission transistor, the drain electrode of the transmission transistor is connected with the floating diffusion region, and the source electrode of the reset transistor is connected with the floating diffusion region;
the method comprises the following steps:
acquiring a false output signal and a valid signal of the image sensor;
performing denoising processing on the effective signal according to the pseudo output signal;
outputting the processed effective signal;
the acquiring the pseudo output signal of the image sensor includes:
controlling the reset transistor to reset the floating diffusion node and recording an output signal Vr1 of the pixel structure after reset;
sampling the pixels again, and recording an output signal Vs1 of the pixel structure;
outputting a difference between the signal Vr1 and the signal Vs1;
the acquiring the effective signal of the image sensor includes:
after the pseudo output signal is obtained, sampling the pixel again and recording an output signal Vr2 of the pixel structure;
controlling the transmission transistor to be conducted and recording an output signal Vs2 of the pixel structure after the transmission transistor is conducted;
a difference between the signal Vr2 and the signal Vs2 is output.
2. The method of claim 1, wherein said performing denoising processing on said effective signal comprises:
superposing the pseudo output signals of each column of the pixel array and then taking an average value;
the average value is subtracted from the effective signal for each column of the pixel array.
3. The method of claim 1, wherein the image sensor comprises a column analog-to-digital converter electrically connected to the pixel array and a column random access memory electrically connected to the column analog-to-digital converter; the performing of the denoising process on the effective signal is performed in the column analog-to-digital converter or in the column random access memory.
4. An apparatus for removing noise of an image sensor, wherein the image sensor comprises a pixel array, and a pixel structure of the pixel array comprises a photodiode, a transmission transistor, a floating diffusion region and a reset transistor; the N pole of the photodiode is connected with the source electrode of the transmission transistor, the drain electrode of the transmission transistor is connected with the floating diffusion region, and the source electrode of the reset transistor is connected with the floating diffusion region;
the device comprises:
the acquisition module is used for acquiring the false output signal and the effective signal of the image sensor;
a processing module, configured to perform denoising processing on the effective signal according to the pseudo output signal;
the output module is used for outputting the processed effective signal;
wherein, the acquisition module includes:
the first recording submodule is used for controlling the reset transistor to reset the floating diffusion area node and recording an output signal Vr1 of the pixel structure after reset;
the second recording submodule is used for sampling the pixels again and recording an output signal Vs1 of the pixel structure;
a first output sub-module for outputting a difference between the signal Vr1 and the signal Vs1;
the third recording sub-module is used for sampling the pixels again and recording the output signal Vr2 of the pixel structure after the pseudo output signal is obtained;
the fourth recording submodule is used for controlling the transmission transistor to be conducted and recording an output signal Vs2 of the pixel structure after the transmission transistor is conducted;
and a second output sub-module for outputting a difference between the signal Vr2 and the signal Vs2.
5. The apparatus of claim 4, wherein the processing module is further configured to: superposing the pseudo output signals of each column of the pixel array and then taking an average value; the average value is subtracted from the effective signal for each column of the pixel array.
6. A computer readable storage medium, on which a computer program is stored, characterized in that the program, when being executed by a processor, implements the steps of the method of any of claims 1 to 3.
7. An apparatus for removing noise from an image sensor, comprising:
a memory having a computer program stored thereon; and
a processor for executing the computer program in the memory to carry out the steps of the method of any one of claims 1 to 3.
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