CN112289837A - Display substrate, detection method thereof and display device - Google Patents
Display substrate, detection method thereof and display device Download PDFInfo
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- CN112289837A CN112289837A CN202011166999.9A CN202011166999A CN112289837A CN 112289837 A CN112289837 A CN 112289837A CN 202011166999 A CN202011166999 A CN 202011166999A CN 112289837 A CN112289837 A CN 112289837A
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- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
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- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/131—Interconnections, e.g. wiring lines or terminals
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Abstract
The embodiment of the invention relates to the technical field of display substrate testing, and discloses a display substrate, a detection method thereof and a display device, wherein the display substrate comprises: the display device comprises a plurality of data lines extending from a display area to a non-display area, a plurality of switching transistors positioned in the non-display area, a control chip and a crack detection lead; the control chip is connected with the crack detection lead and provides a level signal for the crack detection lead; the switch transistor has a gate, a first terminal and a second terminal; the control chip provides a conducting signal for the grid electrode of each switching transistor; the first end of each switch transistor is correspondingly connected with one data line, and the second ends of the switch transistors are respectively connected with the crack detection conducting wires positioned at different positions of the non-display area. According to the display substrate, the detection method thereof and the display device, the position of the film layer fracture can be found by using the display substrate in the embodiment.
Description
Technical Field
The embodiment of the invention relates to the technical field of display substrate testing, in particular to a display substrate, a detection method thereof and a display device.
Background
Currently, in OLED flexible products, a Crack detection wire (PCD) design is mostly used, and the Crack detection wire surrounds the display substrate for several circles. The screen body crack detection is used as an important detection procedure for the quality control of the product in the panel industry, and the screen body crack detection in the related technology adopts a resistance measurement mode, so that whether a crack detection lead is broken or not can be detected, and the specific position of the broken lead cannot be detected.
Disclosure of Invention
An object of embodiments of the present invention is to provide a display substrate, a method of detecting the same, and a display device, in which a position of a film layer break can be found using the display substrate in this embodiment.
In order to solve the above technical problem, an embodiment of the present invention provides a display substrate including a display area and a non-display area surrounding the display area; the display substrate includes: a plurality of data lines extending from the display area to the non-display area, and a plurality of switching transistors, a control chip, and crack detection wires located in the non-display area; the control chip is connected with the crack detection lead and provides a level signal for the crack detection lead; the switch transistor has a gate, a first terminal and a second terminal; the control chip provides a conducting signal for the grid electrode of each switch transistor; the first end of each switch transistor is correspondingly connected with one data line, and the second ends of the switch transistors are respectively connected with the crack detection conducting wires positioned at different positions of the non-display area.
In addition, still include: a data driving signal terminal for providing a driving signal for the data line; the control chip is also used for controlling the data driving signal end to be suspended, and the first end of the switch transistor provides signals for the data line. When the screen body crack detection is carried out in the scheme, the control chip can control the data driving signal end to be suspended and does not provide an electric signal for the data driving signal end, so that the problem that the screen body crack detection effect is influenced due to the fact that the signal of the data driving signal end competes with the signal transmitted from the switching transistor is avoided.
In addition, still include: and the pixel driving circuit is connected with the data line, the pixel driving circuit is a 7T1C circuit or a 2T1C circuit, and the switching transistor is a P-type transistor or an N-type transistor.
Preferably, the pixel driving circuit is a 7T1C circuit, the switching transistor is a P-type transistor, and the control chip provides a high-level signal for the crack detection wire. Various embodiments are provided regarding the display substrate.
In addition, the crack detection wire is disposed around the display area. Crack detection wire sets up around the display area in this scheme, can realize the cracked comprehensive detection of rete to whole display area.
In addition, the crack detection conducting wire is arranged around the display area for two circles or more. In the scheme, the crack detection lead is arranged for two or more circles around the display area so as to improve the accuracy of representing whether the display substrate film layer is broken by the crack detection lead.
In addition, the crack detection lead is led out from one end of the control chip and surrounds the display area for two circles and then returns to one end of the control chip; or the crack detection lead is led out from one end of the control chip and is connected to the other end of the control chip after being wound around the display area for one circle. Two layout modes of the crack detection lead are provided in the scheme.
In addition, the crack detection conducting wire and the data wire are arranged on the same layer. If the film layer where the data line is located is broken in the scheme, the crack detection wire is likely to break, and the accuracy of representing whether the film layer where the data line is located is broken or not by the crack detection wire is further improved.
The embodiment of the invention also provides a display device which comprises the display substrate.
An embodiment of the present invention further provides a method for manufacturing a display substrate according to the above embodiment, including: the control chip provides a conducting signal for the grid electrode of each switching transistor and provides an electric signal for the crack detection lead; and determining the position of the broken crack detection lead in the non-display area according to the screen body display condition corresponding to each data line.
In addition, before the control chip provides a turn-on signal for the gate of each of the switching transistors, the method further includes: the control chip controls the data driving signal end of the pixel driving circuit to be suspended, and the first end of the switch transistor provides signals for the data line of the data driving signal end.
Embodiments of the present invention provide a display substrate including a display area and a non-display area surrounding the display area, relative to the related art; the display substrate includes: a plurality of data lines extending from the display area to the non-display area, and a plurality of switching transistors, a control chip and crack detection wires located in the non-display area; the control chip is connected with the crack detection lead and provides a level signal for the crack detection lead; the switch transistor has a gate, a first terminal and a second terminal; the control chip provides a conducting signal for the grid electrode of each switching transistor; the first end of each switch transistor is correspondingly connected with one data line, and the second ends of the switch transistors are respectively connected with the crack detection conducting wires positioned at different positions of the non-display area.
According to the invention, a plurality of switch transistors are arranged, the control chip is connected with the grid electrode of each switch transistor to provide a conducting signal for each switch transistor, the first end of each switch transistor is correspondingly connected with one data line, and the second end of each switch transistor is respectively connected with crack detection wires positioned at different positions of the non-display area. In this way, when the crack detection wire is not broken, that is, the display substrate film layer is not broken, the second end of the switch transistor can receive the signal of the crack detection wire, and the data line connected with the switch transistor can receive the signal of the crack detection wire because the gate of the switch transistor is turned on; when the crack detection wire is broken, that is, the display substrate film layer is broken, the second end of the switch transistor cannot receive the signal of the crack detection wire, and therefore, the data line connected with the switch transistor cannot receive the signal of the crack detection wire; in this embodiment, the display effect is different when the data line receives and does not receive the signal of the crack detection wire, so as to determine whether the crack detection wire connected to the same switching transistor as the data line is broken, and when it is determined that the crack occurs, the position of the broken position of the display substrate film layer can be determined according to the position of the crack detection wire connected to the switching transistor.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
Fig. 1 is a schematic structural view of a display substrate according to a first embodiment of the present invention;
FIG. 2 is a schematic view of another structure of a display substrate according to a first embodiment of the present invention;
FIG. 3 is a schematic diagram of a 7T1C circuit connection according to a first embodiment of the present invention;
FIG. 4 is a schematic diagram of a 2T1C circuit connection according to a second embodiment of the present invention;
fig. 5 is a flowchart illustrating a method for inspecting a display substrate according to a fourth embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that numerous technical details are set forth in order to provide a better understanding of the present application in various embodiments of the present invention. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments.
In the related technology, the crack detection wire is connected to the plurality of data lines in the display area, when the screen body is broken, the PCD is broken, the resistance of the PCD is increased, and the data voltage on the connected data lines is not written enough, for example, a classic 7T1C circuit, the data voltage is not written enough, and a plurality of lines with different brightness are presented, so that the purpose of detecting the breakage of the film layer of the display substrate is achieved. However, this method cannot find the specific location of the display substrate film layer fracture.
In view of the above, a first embodiment of the present invention relates to a display substrate, which includes a display region and a non-display region surrounding the display region; the display substrate includes: the display device comprises a plurality of data lines extending from a display area to a non-display area, a plurality of switching transistors positioned in the non-display area, a control chip and crack detection wires arranged in the non-display area; the control chip is connected with the crack detection lead and provides a level signal for the crack detection lead; the switch transistor has a gate, a first terminal and a second terminal; the grid electrode of each switch transistor is connected with the control chip, and the control chip also provides a conducting signal for the grid electrode of each switch transistor; the first end of each switch transistor is correspondingly connected with one data line, and the second ends of the switch transistors are respectively connected with the crack detection conducting wires positioned at different positions of the non-display area.
According to the invention, a plurality of switch transistors are arranged, the control chip is connected with the grid electrode of each switch transistor to provide a conducting signal for each switch transistor, the first end of each switch transistor is correspondingly connected with one data line, and the second end of each switch transistor is respectively connected with crack detection wires positioned at different positions of the non-display area. Therefore, when the crack detection wire is not broken, namely the display substrate film layer is not broken, the second end of the switch transistor can receive the signal of the crack detection wire, and the data line connected with the switch transistor can receive the signal of the crack detection wire because the grid electrode of the switch transistor is conducted; when the crack detection wire is broken, namely, the display substrate film layer is broken, the second end of the switch transistor cannot receive the signal of the crack detection wire, so that the data line connected with the switch transistor cannot receive the signal of the crack detection wire; in this embodiment, the display effect is different when the data line receives and does not receive the signal of the crack detection wire, so as to determine whether the crack detection wire connected to the same switching transistor as the data line is broken, and when it is determined that the crack occurs, the position of the broken position of the display substrate film layer can be determined according to the position of the crack detection wire connected to the switching transistor.
The following description specifically describes implementation details of the display substrate of the present embodiment, and the following description is provided only for the sake of understanding and is not necessary for implementing the present embodiment.
The schematic structural diagram of the display substrate in this embodiment is shown in fig. 1 or 2: including a display area 10 and a non-display area 20 surrounding the display area 10.
The display substrate includes: a plurality of data lines 1 extending from the display area 10 to the non-display area 20, a plurality of switching transistors K, i.e., K1, K2, K3 and K4, located at the non-display area 20, an IC control chip 2, and a crack detection wire 3 disposed at the non-display area 20. It is understood that the term "plurality" in this application is more than two.
Specifically, the IC control chip 2 is located below the display area 10 of the display substrate, and the plurality of switching transistors K may be disposed between the display area 10 and the IC control chip 2, thereby reducing the length of a connection line connecting the switching transistors K to the IC control chip 2 and the display area 10.
The crack detection lead 3 is used for representing whether the display substrate film is broken or not, and when the crack detection lead 3 is broken, the display substrate film can be considered to be broken; when the crack detection lead 3 is intact, it can be considered that the substrate film layer is not broken. Since the display area 10 has a plurality of metal traces such as the data lines 1 and the scan lines, the crack detection wires 3 are generally disposed in the non-display area 20 of the display substrate and around the display area 10 to avoid affecting the traces of the display area 10.
The two ends of the crack detection lead 3 are connected with the IC control chip 2, and the IC control chip 2 provides a level signal Vpcd for the crack detection lead 3. Practically, as shown in fig. 1, the crack detection wire 3 is led out from one end of the IC control chip 2 for two circles around the screen body and then returns to one end of the IC control chip 2; alternatively, as shown in fig. 2, the crack detection wire 3 is led out from one end of the IC control chip 2 to surround the screen body for one turn and then connected to the other end of the IC control chip 2. The two implementation manners are only examples, and in practical applications, the crack detection wire 3 may be used to detect the film fracture of the display substrate by only arranging the crack detection wire 3 around the display area 10 for one turn. Certainly, in order to improve the accuracy of the crack detection wire 3 for representing whether the display substrate film is broken, in practical application, the crack detection wire 3 may be arranged around the display area 10 for two or more circles, so as to improve the accuracy of the crack detection wire 3 for representing whether the display substrate film is broken.
Furthermore, in order to better represent whether the film layer where the data trace is located breaks, the crack detection wire and the data line are arranged on the same layer in the embodiment, so that if the film layer where the data line is located breaks, the crack detection wire is likely to break, and the accuracy of representing whether the film layer where the data trace is located breaks by the crack detection wire is further improved.
The switching transistor K has a gate, a first terminal, and a second terminal. The grid electrode of each switch transistor K is connected with the IC control chip 2, and the IC control chip 2 provides a conducting signal PCD _ SW for the grid electrode of each switch transistor K; the first end of each switching transistor K is correspondingly connected with one data line 1, and the second ends of the switching transistors K are respectively connected with the crack detection conducting wires 3 positioned at different positions of the non-display area 20.
Specifically, the gate of each switching transistor K is connected to the IC control chip 2, and the IC control chip 2 supplies the on signal PCD _ SW to the gate of each switching transistor K to control each switching transistor K to be turned on. The first end of each switch transistor K is correspondingly connected with a data line 1, the second ends of the switch transistors K are respectively connected with the crack detection wires 3 located at different positions of the non-display area 20, so that when the crack detection wires 3 are not broken, namely, the display substrate film layer is not broken, the second ends of the switch transistors K can receive signals of the crack detection wires 3, and the grid electrodes of the switch transistors K are conducted, so that the data lines 1 connected with the switch transistors K can receive the signals of the crack detection wires 3. When the crack detection wire 3 is broken, that is, the display substrate film is broken, the second terminal of the switching transistor K cannot receive the signal of the crack detection wire 3, and therefore, the data line 1 connected to the switching transistor K cannot receive the signal of the crack detection wire 3.
In this embodiment, the display effect is different when the data line 1 receives and does not receive the signal of the crack detection wire 3, so as to determine whether the crack detection wire 3 connected to the same switching transistor K as the data line 1 is broken, and when it is determined that the crack detection wire 3 is broken, the position of the broken display substrate film can be determined according to the position of the crack detection wire 3 connected to the switching transistor K. The first terminal may be a source or a drain, and correspondingly, the second terminal may be a drain or a source, both of which can achieve the purpose of the present embodiment, which is not limited in the present embodiment.
Further, the display substrate further includes: the pixel driving circuit connected to the data line 1 is a 7T1C circuit, and the switching transistor K is a P-type transistor.
Specifically, as shown in fig. 3, in the present embodiment, a description will be given of "display effect when the data line 1 receives and does not receive a signal of the crack detection wire 3" by taking the pixel driving circuit as a 7T1C circuit as an example:
since the switching transistor K in this embodiment is a P-type transistor, the IC control chip 2 needs to apply a low level to the turn-on signal PCD _ SW of the switching transistor K. If the crack detection wire 3 at the position connected with the switch transistor K is broken, no signal is sent to the end of the crack detection wire 3, at this time, a Vint signal is written into the gate of the transistor T7, the transistor T7 is turned on, and the pixel corresponding to the data line 1 connected with the switch transistor K (connected with the broken crack detection wire 3) is displayed in a light-emitting manner.
If the crack detection wire 3 at the position connected with the switch transistor K is not broken, and at this time, a signal is present at the end of the crack detection wire 3, as can be seen from the working principle of the 7T1C circuit, the signal at the end of the crack detection wire 3 is written into the capacitor C, and then the capacitor C writes the signal at the end of the crack detection wire 3 into the gate of the T7, and the T7 is turned off, and the pixel corresponding to the data line 1 connected with the switch transistor K (connected with the unbroken crack detection wire 3) displays a black picture. It should be noted that, since P-type transistors are generally used for T1 to T7 in the 7T1C circuit, the signal at the end of the crack detection wire 3 needs to be at a high level to turn off the T7, so that the screen displays a black screen, which is different from the screen display when the crack detection wire 3 is broken. Based on this, in a scenario where the pixel drive circuit is a 7T1C circuit, the level signal Vpcd supplied from the IC control chip 2 to the crack detection wire 3 needs to be a high level signal.
The specific use of fig. 1 and 2 is explained by taking the pixel driving circuit as a 7T1C circuit as an example as follows:
in the circuit configuration shown in fig. 1, 2 switching transistors (K1 and K3) are connected to the crack detection wire 3 before one turn around the display area 10, and the other 2 switching transistors (K2 and K4) are connected to the crack detection wire 3 after one turn around the display area 10. Assuming that the pixel corresponding to the data line 1 to which K1 and K3 are connected displays a black screen, it can be understood that the display substrate before the crack detection wire 3 to which the switching transistor K3 is connected is not broken. If the pixels corresponding to the data lines 1 to which K2 and K4 are connected emit light for display, it is clear that the display substrate behind the crack detection wire 3 to which K3 is connected and in front of the crack detection wire 3 to which the switching transistor K4 is connected breaks.
In the circuit configuration shown in fig. 2, 2 switching transistors (K1 and K2) are connected to the crack detection wire 3 on the left side of the display area 10, and the other 2 switching transistors (K3 and K4) are connected to the crack detection wire 3 on the right side of the display area 10. Assuming that the pixel corresponding to the data line 1 to which K1 and K2 are connected displays a black screen, it can be understood that the display substrate before the crack detection wire 3 to which the switching transistor K3 is connected is not broken. If the pixels corresponding to the data lines 1 connected by the K3 and the K4 emit light for display, it is clear that the display substrate behind the crack detection lead 3 connected by the K2 and in front of the crack detection lead 3 connected by the switching transistor K3 is broken, that is, the film layer of the display substrate above the display area 10 is broken.
Further, still include: a data driving signal terminal for supplying a driving signal to the data line 1; when the screen body crack is detected, the IC control chip 2 is also used for controlling the suspension of the data driving signal end, and the first end of the switch transistor K provides a signal for the data line 1.
Specifically, as shown in fig. 3, since the display substrate further includes a data driving signal terminal Vdata for providing a driving signal to the data line 1, and the data driving signal terminal is provided with an electrical signal by the IC control chip 2 to implement light emitting display of the display area 10, in this embodiment, when performing the screen crack detection, the IC control chip 2 controls the data driving signal terminal to be suspended, and does not provide an electrical signal to the data driving signal terminal, so as to avoid that the signal of the data driving signal terminal competes with the signal transmitted from the switching transistor K, and the effect of the screen crack detection is affected.
Compared with the related art, in the display substrate provided by the embodiment of the invention, the plurality of switch transistors K are arranged, the IC control chip 2 is connected with the gate of each switch transistor K to provide the conducting signal PCD _ SW for each switch transistor K, the first end of each switch transistor K is correspondingly connected with one data line 1, and the second end of each switch transistor K is respectively connected with the crack detection conducting wires 3 located at different positions of the non-display area 20. In this way, when the crack detection wire 3 is not broken, that is, the display substrate film layer is not broken, the second terminal of the switch transistor K can receive the signal of the crack detection wire 3, and the data line 1 connected to the switch transistor K can receive the signal of the crack detection wire 3 because the gate of the switch transistor K is turned on; when the crack detection wire 3 is broken, that is, the display substrate film is broken, the second terminal of the switching transistor K cannot receive the signal of the crack detection wire 3, and therefore, the data line 1 connected to the switching transistor K cannot receive the signal of the crack detection wire 3; in this embodiment, the display effect is different when the data line 1 receives and does not receive the signal of the crack detection wire 3, so as to determine whether the crack detection wire 3 connected to the same switching transistor K as the data line 1 is broken, and when it is determined that the crack detection wire 3 is broken, the position of the broken display substrate film can be determined according to the position of the crack detection wire 3 connected to the switching transistor K. The position of the crack detection lead 3 can be accurately found out by a method of lightening the screen body without resistance test, so that the position of the display substrate film layer can be found out.
A second embodiment of the present invention relates to a display substrate, and a schematic structural diagram of the present embodiment is shown in fig. 4, and specifically includes: the second embodiment is substantially the same as the first embodiment, except that the present embodiment shows an implementation when the pixel driving circuit is a 2T1C circuit.
Specifically, the method further comprises the following steps: and the pixel driving circuit is connected with the data line, the pixel driving circuit is a 2T1C circuit, and the switching transistor is a P-type transistor or an N-type transistor. When the pixel driving circuit is a 2T1C circuit. The switch transistor can adopt a P-type transistor or an N-type transistor, and when the P-type transistor is adopted, the control chip provides a low-level signal for the switch transistor; when an N-type transistor is used, the on signal provided by the control chip to the switching transistor needs to be a high level signal.
In this embodiment, a description is given of "display effect when the data line receives and does not receive the signal of the crack detection wire" by taking the example that the pixel driving circuit is a 2T1C circuit, which is specifically shown in table 1 below:
TABLE 1
| Crack detection wire break | Vpcd terminal no signal | Data line no signal | Screen display micro bright picture |
| Crack detection of conductor non-fracture | Vpcd terminal with signal (high) | Data line no signal | The screen body is not displayed and is blackPicture frame |
| Crack detection of conductor non-fracture | Vpcd terminal has signal (Low) | Data line no signal | Screen body displaying white picture |
Two display effects when signals exist at the PCD end are given in the table 1, one is that the Vpcd end is a high level signal, namely, the level signal Vpcd provided by the IC control chip for the crack detection wire is a high level signal, and at this time, the screen body does not display and is a black picture; one is that the Vpcd terminal is a low level signal, that is, the level signal Vpcd provided by the IC control chip for the crack detection wire is a low level signal, and the screen displays a white picture. The display effect in table 1 is illustrated by taking the switching transistor as a P-type transistor as an example, and when the switching transistor is an N-type transistor, a specific display effect can be obtained according to the 2T1C circuit structure, which is not described in detail in this embodiment.
Compared with the related art, the embodiment of the invention provides a display substrate, and the implementation mode of the pixel driving circuit is 2T1C circuit.
A third embodiment of the present invention relates to a display device including the display substrate according to any one of the above embodiments, the display device including: mobile phone, computer, television and other terminal equipment including display screen.
A fourth embodiment of the present invention relates to a method for inspecting a display substrate, and a flowchart of the method for inspecting a display substrate in the present embodiment is shown in fig. 5, and specifically includes:
step 101: the control chip controls the data driving signal end of the pixel driving circuit to be suspended, and the first end of the switching transistor provides signals for the data line of the data driving signal end.
Specifically, the method for inspecting the display substrate in the present embodiment is based on the inspection performed by the display substrate in the first or second embodiment. In this embodiment, the control chip includes a detection mode and a display mode, and when the detection mode is entered, the control chip controls the data driving signal terminal of the pixel driving circuit to be suspended, and the first terminal of the switching transistor provides a signal for the data line of the data driving signal terminal, so as to prevent the signal of the data driving signal terminal from competing with the signal transmitted from the switching transistor and affecting the effect of detecting the screen crack. When the display mode is entered, the control chip controls the first end of the switch transistor to be disconnected with the data line, and the data driving signal end provides signals for the data line, so that normal display is realized.
Step 102: the control chip provides a conducting signal for the grid electrode of each switching transistor and simultaneously provides an electric signal for the crack detection lead.
Step 103: and determining the position of the broken crack detection lead in the non-display area according to the display condition of the screen body corresponding to each data line.
Specifically, for the above steps 102 and 103, the gate of each switching transistor is connected to the control chip, and the control chip provides a turn-on signal to the gate of each switching transistor to control each switching transistor to turn on. The first end of each switch transistor is correspondingly connected with one data line, and the second ends of the switch transistors are respectively connected with the crack detection wires located at different positions of the non-display area, so that when the crack detection wires are not broken, namely, when the display substrate film layer is not broken, the second ends of the switch transistors can receive signals of the crack detection wires, and the grid electrodes of the switch transistors are conducted, so that the data lines connected with the switch transistors can receive the signals of the crack detection wires. When the crack detection wire is broken, that is, the display substrate film is broken, the second terminal of the switching transistor does not receive a signal of the crack detection wire, and thus, the data line connected to the switching transistor does not receive a signal of the crack detection wire.
Compared with the related art, according to the detection method of the display substrate provided by the embodiment of the invention, when the crack detection wire is not broken, namely, the film layer of the display substrate is not broken, the second end of the switch transistor can receive the signal of the crack detection wire, and the data line connected with the switch transistor can receive the signal of the crack detection wire because the grid electrode of the switch transistor is conducted; when the crack detection wire is broken, namely, the display substrate film layer is broken, the second end of the switch transistor cannot receive the signal of the crack detection wire, so that the data line connected with the switch transistor cannot receive the signal of the crack detection wire; in this embodiment, the display effect is different when the data line receives and does not receive the signal of the crack detection wire, so as to determine whether the crack detection wire connected to the same switching transistor as the data line is broken, and when it is determined that the crack occurs, the position of the broken position of the display substrate film layer can be determined according to the position of the crack detection wire connected to the switching transistor.
The steps of the above methods are divided for clarity, and the implementation may be combined into one step or split some steps, and the steps are divided into multiple steps, so long as the same logical relationship is included, which are all within the protection scope of the present patent; it is within the scope of the patent to add insignificant modifications to the algorithms or processes or to introduce insignificant design changes to the core design without changing the algorithms or processes.
It is to be understood that this embodiment is a method embodiment related to the first and second embodiments, and that this embodiment can be implemented in cooperation with the first and second embodiments. The related technical details mentioned in the first embodiment and the second embodiment are still valid in this embodiment, and are not described herein again in order to reduce repetition. Accordingly, the related-art details mentioned in the present embodiment can also be applied to the first embodiment and the second embodiment.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice.
Claims (10)
1. A display substrate includes a display area and a non-display area surrounding the display area;
the display substrate includes: a plurality of data lines extending from the display area to the non-display area, and a plurality of switching transistors, a control chip, and crack detection wires located in the non-display area;
the control chip is connected with the crack detection lead and provides a level signal for the crack detection lead;
the switch transistor has a gate, a first terminal and a second terminal; the control chip provides a conducting signal for the grid electrode of each switch transistor;
the first end of each switch transistor is correspondingly connected with one data line, and the second ends of the switch transistors are respectively connected with the crack detection conducting wires positioned at different positions of the non-display area.
2. The display substrate of claim 1, further comprising: a data driving signal terminal for providing a driving signal for the data line;
the control chip is also used for controlling the data driving signal end to be suspended, and the first end of the switch transistor provides signals for the data line.
3. The display substrate of claim 2, further comprising: the pixel driving circuit is connected with the data line, the pixel driving circuit is a 7T1C circuit or a 2T1C circuit, and the switch transistor is a P-type transistor or an N-type transistor;
preferably, the pixel driving circuit is a 7T1C circuit, the switching transistor is a P-type transistor, and the control chip provides a high-level signal for the crack detection wire.
4. The display substrate of claim 1, wherein the crack detection wire is disposed around the display area.
5. The display substrate of claim 4, wherein the crack detection wire is disposed two or more turns around the display area.
6. The display substrate of claim 1, wherein the crack detection wire is led out from one end of the control chip to surround the display area for two circles and then returns to one end of the control chip;
or the crack detection lead is led out from one end of the control chip and is connected to the other end of the control chip after being wound around the display area for one circle.
7. The display substrate of claim 1, wherein the crack detection wire is disposed in the same layer as the data line.
8. A display device comprising the display substrate of any one of claims 1 to 7.
9. The method for inspecting a display substrate according to any one of claims 1 to 7, comprising:
the control chip provides a conducting signal for the grid electrode of each switching transistor and provides an electric signal for the crack detection lead;
and determining the position of the broken crack detection lead in the non-display area according to the screen body display condition corresponding to each data line.
10. The method for inspecting a display substrate according to claim 9, wherein before the control chip provides the turn-on signal to the gate of each of the switching transistors, the method further comprises:
the control chip controls a data driving signal end of the pixel driving circuit to be suspended, and a first end of the switching transistor provides signals for a data line of the data driving signal end.
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