CN112285471A - Electronic device detection device - Google Patents
Electronic device detection device Download PDFInfo
- Publication number
- CN112285471A CN112285471A CN202011165700.8A CN202011165700A CN112285471A CN 112285471 A CN112285471 A CN 112285471A CN 202011165700 A CN202011165700 A CN 202011165700A CN 112285471 A CN112285471 A CN 112285471A
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- China
- Prior art keywords
- electronic device
- temperature sensors
- carrier
- device carrier
- temperature
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- 238000001514 detection method Methods 0.000 title claims abstract description 22
- 238000012360 testing method Methods 0.000 claims abstract description 47
- 238000009434 installation Methods 0.000 claims abstract description 15
- 238000007789 sealing Methods 0.000 claims abstract description 13
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 abstract description 7
- 238000007689 inspection Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention belongs to a detection device, in particular to an electronic device detection device, which comprises a shell and a device carrier, wherein the shell is provided with a chute, the device carrier is arranged on the chute in a sliding way, an installation clamping position for installing an electronic device is arranged on the device carrier, a plurality of temperature sensors are arranged in the chute of the shell towards the installation clamping position and correspond to a plurality of heating positions of the electronic device, or the temperature sensors are arranged in an array way, the device carrier comprises a sliding body and a sealing plate connected with the sliding body, the size of the opening section of the sliding groove is consistent with that of the sealing plate, the device carrier is arranged in a sliding way, the temperature sensors are arranged on the inner wall of the chute, the temperature change of the electronic device is confirmed or proved whether the electronic device is normal or not in all directions, and the sealing plate is arranged, the inside and the outside temperature of casing of spout are isolated each other when the test, reduce external environment temperature influence, have improved the test precision.
Description
Technical Field
The invention belongs to a detection device, and particularly relates to an electronic device detection device.
Background
At present, some traditional electronic devices, such as chips, mainboards and the like, are inspected manually or semi-automatically, each inspection item needs manual operation, some electronic devices are emerging technologies, higher technical literacy needs to be provided for inspectors, and great uncertainty factors exist in manual or semi-automatic detection, so that inspection items of products can be omitted after inspection, potential quality hazards exist in the products, in addition, particularly for the electronic devices with larger structure sizes, more items need to be inspected, abnormal conditions cannot be directly judged under the condition that the electronic devices are inspected abnormally, and therefore the inspection efficiency of the products is reduced.
Disclosure of Invention
The invention aims to provide an electronic device detection device which can detect whether each position of an electronic device is normal or not and has high detection efficiency.
The electronic device comprises a shell and a device carrier, wherein a sliding groove is formed in the shell, the device carrier is arranged on the sliding groove in a sliding mode, an installation clamping position for installing an electronic device is arranged on the device carrier, a plurality of temperature sensors are arranged in the sliding groove of the shell towards the installation clamping position and correspond to a plurality of heating positions of the electronic device, or the temperature sensors are arranged in an array mode, the device carrier comprises a sliding body and a sealing plate connected with the sliding plate body, and the sealing plate is consistent with the opening section of the sliding groove in size.
Further, the sliding body and the sealing plate are L-shaped or T-shaped in overall section.
Furthermore, the plurality of temperature sensors are arranged in a rectangular array, and the size of the plurality of temperature sensors arranged in the rectangular array is larger than the external dimension of the electronic device.
Furthermore, the temperature sensors are arranged in a rectangular array at a distance of 1-3 mm.
Furthermore, the installation screens run through the device carrier and the temperature sensors are correspondingly arranged on the upper side wall and the lower side wall of the sliding groove.
The invention also includes a detection switch for detecting whether the device carrier is closed.
The invention also includes a clasp disposed on the device carrier.
Furthermore, a test indicator lamp is arranged on the shell.
Furthermore, a test interface is arranged on the shell.
The invention has the advantages that the device carrier is arranged in a sliding way, and the inner wall of the sliding groove is provided with a plurality of temperature sensors which correspond to the heating parts of the electronic devices or are arranged in an array way, in the process of testing the electronic devices to be tested, whether the electronic devices are normal or not is determined or proved by monitoring the temperature change of the electronic devices in all directions, meanwhile, the temperature sensors and the positions to be tested measure the temperature point to point, the positioning effect is achieved, the comparison between the corresponding sensors and the preset temperature is convenient, the comparison logic is simplified, the measurement accuracy is greatly improved, meanwhile, the temperature sensors are arranged in the sliding groove, the device carrier can slide into the shell, the device carrier can be prevented from being interfered by the outside during the test, and the stability and the accuracy of the temperature detection are ensured, the sealing plate is arranged, the temperature inside of the sliding groove and the temperature outside of, the influence of the external environment temperature is reduced, and the test precision is greatly improved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a right side view of the present invention;
fig. 3 is a sectional view taken along line a-a in fig. 2.
In the figure, 1-housing; 2-a chute; 3-a device carrier; 301-installing a clamping position; 4-buckling; 5-a temperature sensor; 6-indicator light; 7-a test interface; 8-detection switch.
Detailed Description
As shown in fig. 1-3, the electronic component mounting device comprises a housing 1 and a component carrier 3, wherein a sliding groove 2 is formed in the housing 1, the component carrier 3 is slidably disposed on the sliding groove 2, an installation position 301 for installing an electronic component is formed in the component carrier 3, a plurality of temperature sensors 5 are disposed in the sliding groove 2 of the housing 1 and face the installation position 301, the plurality of temperature sensors 5 are disposed corresponding to a plurality of heating portions of the electronic component, or the plurality of temperature sensors 5 are arranged in an array, the component carrier 3 comprises a sliding body and a sealing plate connected with the sliding plate body, and the sealing plate has the same size as the opening cross section of the sliding groove 2.
The invention sets the device carrier 3 in a sliding way, and sets a plurality of temperature sensors 5 corresponding to the heating positions of the electronic device or arranged in an array way on the inner wall of the chute 2, in the process of testing the electronic device to be tested, the temperature change of the electronic device is monitored in all directions to determine or prove whether the electronic device is normal, meanwhile, the temperature sensors 5 and the positions to be tested measure the temperature point to point, the invention has the positioning effect, is convenient for comparing the corresponding sensors with the preset temperature, simplifies the comparison logic and greatly improves the measurement accuracy, meanwhile, the temperature sensors 5 are arranged in the chute 2, and the device carrier 3 can slide into the shell 1, can avoid the external interference during the test, ensures the stability and the accuracy of the temperature detection, and can reduce the number of the temperature sensors when a plurality of temperature sensors 5 are arranged at a plurality of heating positions of the electronic device, the temperature sensor is used for measuring the temperature of the electronic devices, and comprises a plurality of temperature sensors 5, a sealing plate and a main board, wherein the temperature sensors are arranged on the main board, the main board is arranged on the main board, the temperature sensors are arranged on the main board.
The sliding body and the sealing plate are L-shaped or T-shaped in overall section, as shown in figure 1, when the section is L-shaped, the temperature sensor 5 only detects the temperature of one side of the electronic device, when the section is T-shaped, the installation clamping position 301 penetrates through the device carrier 3, the temperature sensor 5 is correspondingly arranged on the upper side wall and the lower side wall of the sliding groove 2, the temperature of two corresponding sides of the electronic device can be detected simultaneously, and the test accuracy is improved.
The plurality of temperature sensors 5 can be in an annular array or a rectangular array, the rectangular array is preferably adopted in the invention, the size of the plurality of temperature sensors 5 arranged in the rectangular array is larger than the external dimension of the electronic device, the temperature sensors are arranged in the rectangular array, most of chips and main boards are adapted, and the design cost is reduced.
The temperature sensors 5 arranged in a rectangular array are spaced from each other by 1-3mm, preferably 1mm, so that the heating parts on the electronic device can be accurately measured.
The device testing device further comprises a detection switch 8 for detecting whether the device carrier 3 is closed, and the testing can be started only after the detection switch 8 detects that the device carrier 3 and the sliding groove 2 are closed, so that the testing error is avoided, and the accuracy is improved.
The invention also comprises a buckle 4 arranged on the device carrier 3, which ensures that the electronic device is firmly and reliably fixed when being positioned in the mounting clamp position 301 and ensures that the contact of the contact is stable.
In order to obtain a test result, the shell 1 is provided with the test indicator lamp 6, and the test indicator lamp 6 can also be used for monitoring whether the test process is normal or not, and gives an alarm when abnormal conditions occur, so that a worker can be reminded in time.
The testing device is characterized in that the shell 1 is provided with a testing interface 7, in the embodiment, a testing mainboard can be arranged in the shell 1 and can also be connected with PC end testing software through the testing interface 7, an interface connected with an electronic device is correspondingly arranged on the installation clamping position 301 of the device carrier 3 and is connected with the PC end testing software through the testing mainboard and the testing interface 7, and the structure and the cost of the testing device are simplified.
The specific working principle of the invention is as follows: taking a test collector mainboard as an example, firstly sliding out a device carrier 3 along a chute 2, installing the collector mainboard to be tested into an installation clamping position 301, meanwhile, an interface on the collector mainboard corresponds to an interface structure on the installation clamping position 301, namely, a golden finger on the collector mainboard is fully contacted with a contact on the installation clamping position 301 and realizes electric connection, then fixing and clamping the collector mainboard through a buckle 4, finally pushing the device carrier 3 into the chute 2, starting testing after the device carrier 3 detected by a detection switch 8 is matched with the chute 2 in place, taking a case that a test mainboard is arranged in a shell 1 and a test interface 7 is connected with PC end test software as an example, after the PC end test software starts testing, sending a one-key detection signal to the test mainboard, and after the test mainboard detects a detection request sent by the PC software, immediately starting the detection of different inspection items of the collector mainboard to be tested, unite a plurality of temperature sensor 5 simultaneously to carry out temperature scanning and with the temperature contrast of setting for different inspection projects or inspection submodule, thereby judge the behavior of different inspection projects or submodule, the normal condition of module in the function of so not only inspection, also examined the reliability of module in the performance, inspection project if the test is normal, then pilot lamp 6 then can green light normally, thereby accomplish the inspection project of whole collector mainboard that awaits measuring, the opposite condition, if inspection project and the temperature that corresponds the module are unusual, pilot lamp 6 then can the red light scintillation, and report PC test software with unusual condition position module accuracy. And finally, the device carrier 3 slides out along the sliding groove 2 after detection is finished, the detection switch 8 detects that the device carrier 3 is separated from the sliding groove 2 for sealing, and the device carrier is sent to the test mainboard to stop testing, so that the whole test action is finished, and the next test action is waited.
Claims (9)
1. The utility model provides an electron device detection device, characterized by, includes casing (1) and device carrier (3), be provided with spout (2) on casing (1), device carrier (3) slide and set up on spout (2), be provided with installation screens (301) of installation electron device on the device carrier (3), be provided with a plurality of temperature sensor (5) towards installation screens (301) in spout (2) of casing (1), a plurality of temperature sensor (5) correspond the setting with a plurality of position that generates heat of electron device, perhaps, a plurality of temperature sensor (5) are the array and arrange the setting, device carrier (3) are including the slip body and with this body coupling's of slide closing plate, the closing plate is unanimous with spout (2) opening cross-section size.
2. The electronic device testing apparatus as claimed in claim 1, wherein the sliding body and the sealing plate have an L-shaped or T-shaped overall cross-section.
3. The electronic device detecting apparatus according to claim 1, wherein the plurality of temperature sensors (5) are arranged in a rectangular array, and the size of the plurality of temperature sensors (5) arranged in the rectangular array is larger than the outer size of the electronic device.
4. An electronic device testing apparatus as claimed in claim 3, characterized in that a number of temperature sensors (5) arranged in a rectangular array are arranged at a distance of 1-3mm from each other.
5. The electronic device detecting apparatus as claimed in claim 1, wherein the mounting clips (301) are disposed through the device carrier (3), and the temperature sensors (5) are disposed on the upper and lower sidewalls of the chute (2).
6. An electronic device testing apparatus as claimed in any of claims 1-5, further comprising a test switch (8) for testing whether the device carrier (3) is closed.
7. An electronic device testing apparatus as claimed in any of claims 1 to 5, further comprising a catch (4) provided on the device carrier (3).
8. An electronic device testing apparatus as claimed in any of claims 1-5, characterized in that a test indicator light (6) is arranged on the housing (1).
9. An electronic device testing apparatus as claimed in any of claims 1-5, characterized in that a test interface (7) is arranged on the housing (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011165700.8A CN112285471A (en) | 2020-10-27 | 2020-10-27 | Electronic device detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011165700.8A CN112285471A (en) | 2020-10-27 | 2020-10-27 | Electronic device detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112285471A true CN112285471A (en) | 2021-01-29 |
Family
ID=74373359
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011165700.8A Pending CN112285471A (en) | 2020-10-27 | 2020-10-27 | Electronic device detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112285471A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006087772A1 (en) * | 2005-02-15 | 2006-08-24 | Advantest Corporation | Burn-in apparatus |
| CN2886648Y (en) * | 2006-02-09 | 2007-04-04 | 董闻奇 | Computer case with drawout motherboard fixing plate |
| CN201281718Y (en) * | 2008-08-21 | 2009-07-29 | 深圳市图德电子科技有限公司 | PCB board up-down pull type testing clamp jig |
| CN207571285U (en) * | 2017-11-20 | 2018-07-03 | 倍科质量技术服务（昆山）有限公司 | A kind of spot open-close type test box |
| CN209728114U (en) * | 2019-01-29 | 2019-12-03 | 上海今禾电子科技有限公司 | Detection device is used in a kind of stronger mainboard production of stability |
| CN111417280A (en) * | 2020-05-22 | 2020-07-14 | 东莞市技师学院(东莞市高级技工学校) | Detection apparatus for electrical automation equipment |
-
2020
- 2020-10-27 CN CN202011165700.8A patent/CN112285471A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006087772A1 (en) * | 2005-02-15 | 2006-08-24 | Advantest Corporation | Burn-in apparatus |
| CN2886648Y (en) * | 2006-02-09 | 2007-04-04 | 董闻奇 | Computer case with drawout motherboard fixing plate |
| CN201281718Y (en) * | 2008-08-21 | 2009-07-29 | 深圳市图德电子科技有限公司 | PCB board up-down pull type testing clamp jig |
| CN207571285U (en) * | 2017-11-20 | 2018-07-03 | 倍科质量技术服务（昆山）有限公司 | A kind of spot open-close type test box |
| CN209728114U (en) * | 2019-01-29 | 2019-12-03 | 上海今禾电子科技有限公司 | Detection device is used in a kind of stronger mainboard production of stability |
| CN111417280A (en) * | 2020-05-22 | 2020-07-14 | 东莞市技师学院(东莞市高级技工学校) | Detection apparatus for electrical automation equipment |
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