CN112268685A - Optical device frequency response measuring method and measuring device - Google Patents

Optical device frequency response measuring method and measuring device Download PDF

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CN112268685A
CN112268685A CN202011122563.XA CN202011122563A CN112268685A CN 112268685 A CN112268685 A CN 112268685A CN 202011122563 A CN202011122563 A CN 202011122563A CN 112268685 A CN112268685 A CN 112268685A
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omega
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optical device
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CN112268685B (en
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潘时龙
卿婷
曹美会
李树鹏
方奕杰
王立晗
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Nanjing University of Aeronautics and Astronautics
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Nanjing University of Aeronautics and Astronautics
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Abstract

The invention discloses a method for measuring the frequency response of an optical device, which is used for measuring the frequency omega1Of a first microwave signal and a frequency of omega2Respectively modulated at a frequency of omega0、ω0Two paths of odd-order suppressed second-order double-sideband signals are generated on the two paths of optical carriers of + delta omega; the two paths of second-order double-sideband signals are coupled and then divided into two paths, one path is used as a reference path to be directly photoelectrically converted into a reference path electric signal, the other path is used as a test path, and the two paths of second-order double-sideband signals are photoelectrically converted into a test path electric signal after passing through an optical device to be tested; with the +2 order frequency component Δ ω +2(ω) in the reference path electrical signal2‑ω1) And-2 order frequency component Δ ω -2(ω)2‑ω1) For reference, extracting the photocurrents of the two frequency components in the electrical signal of the test path, and calculating the frequency of the device to be measured
Figure DDA0002732506960000011
Frequency of (f) and
Figure DDA0002732506960000012
amplitude response and time delay response. The invention also discloses a device for measuring the frequency response of the optical device. Compared with the prior art, the method can greatly improve the measurement precision and the measurement range and reduce the performance requirement on hardware.

Description

Optical device frequency response measuring method and measuring device
Technical Field
The invention relates to a method and a device for measuring frequency response of an optical device, belonging to the technical field of optical device measurement.
Background
The measurement of the spectral response of an optical device is critical to device fabrication and system design. In recent years, with the rapid development of laser technology, photonic systems are widely applied, and higher requirements are put forward on the tests of high-speed optical/electrical and electrical/optical converters, optical fiber amplifiers, lasers, detectors and the like in a new generation of high-speed optical fiber communication system, backbone transmission, aircraft carrier-based optical transmission control system, light-operated phase array radar system and photoelectric weapon equipment system. However, the development of optical measurement technology is still in the future, which not only makes the development and fabrication of high-precision optical devices difficult, but also makes the existing optical devices unable to exert the maximum utility in the system.
In order to realize high-precision optical device measurement, a single-sideband modulation-based optical vector analysis method is proposed in 1998 j.e.roman. The method moves the frequency sweep operation of the traditional optical vector analyzer in the optical domain to the electrical domain, benefits from the mature electrical spectrum analysis technology, and achieves qualitative leap of the test precision. The optical device measurement with the measurement resolution of 78KHz is realized in the frequency band range of 38GHz, and compared with the measurement result of a commercial optical vector analyzer, the response measured by the method reflects the response of the optical device to be measured more clearly. On this basis, some researchers have proposed a series of improved optical device measurement methods based on single sideband modulation, such as j.e.roman, et al in "Spectral characterization of fiber gratings with high resolution" (j.e.roman, m.y.frame, and r.d.eman, "Spectral characterization of fiber gratings with high resolution," operation.let ", vol.23, No.12, pp.939-941,1998"), and also in "acquisition imaging of optical fiber with single-sided modulation" (m.xue, s.l.pan, y.j.z. transform, "optical fiber with single-sided modulation," n.12, pp.939-941,1998 "), and" optical fiber with single-sided modulation, "m.xue, s.l.p. pan, y.j.z.
However, the optical device measurement method based on single sideband modulation also has serious disadvantages. Firstly, the system is very complicated by generating optical single sideband, the current generation method of single sideband modulation is roughly divided into a filtering method and a 90-degree phase shift method, the former needs to use a filter, the complexity and the instability of the system are increased, and the extinction ratio is limited; the latter needs to perform 90 ° phase shift on the microwave signal loaded to the dual-drive photoelectric modulator, needs to use a broadband 90 ° electrical bridge and the dual-drive photoelectric modulator, and is complex in system and inconvenient to adjust. Secondly, the single-sideband frequency sweeping method can only obtain one group of measurement signals by one-time measurement, and the measurement efficiency is low. Finally, single sideband swept methods are severely limited by the instrument, e.g., the single sideband swept range cannot be larger than the photodetector bandwidth.
Disclosure of Invention
The technical problem to be solved by the invention is to overcome the defects in the prior art, and provide a method for measuring the frequency response of an optical device, which can greatly improve the measurement precision and the measurement range and reduce the performance requirement on hardware.
The invention specifically adopts the following technical scheme to solve the technical problems:
a method for measuring frequency response of optical device features that the frequency is omega1Is modulated at a frequency omega0The first path of odd-order suppressed second-order double-sideband signal is generated on the first path of optical carrier wave, and the frequency is omega2Is modulated at a frequency omega0Generating a second path of odd-order suppressed second-order double-sideband signal on the other path of optical carrier of + delta omega; coupling the two paths of the suppressed second-order double-sideband signals with odd orders and then dividing the signals into two paths, wherein one path is used as a reference path to be directly photoelectrically converted into a reference path electric signal, and the other path is used as a test path to be photoelectrically converted into a test path electric signal after passing through an optical device to be tested; by reference toFrequency component Δ ω +2(ω) of order +2 in the channel electrical signal2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) For reference, extracting the photocurrents of the two frequency components in the electrical signal of the test path, and calculating the frequency of the device to be measured
Figure BDA0002732506940000021
Frequency of (f) and
Figure BDA0002732506940000022
amplitude response of (d)
Figure BDA0002732506940000023
Figure BDA0002732506940000024
And time delay response
Figure BDA0002732506940000025
Figure BDA0002732506940000026
Figure BDA0002732506940000027
Figure BDA0002732506940000028
Figure BDA0002732506940000031
Figure BDA0002732506940000032
Wherein ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined; i.e. imea(*)、isys(x) connecting the optical devices to be tested to the test paths respectivelyAnd testing the photocurrent of the frequency component in the electrical signal without connecting the optical device to be tested.
Further, the method further comprises: synchronously changing the frequencies of the first microwave signal and the second microwave signal and ensuring the frequency difference (omega)2-ω1) And (5) constantly repeating the steps to obtain the amplitude spectrum response and the time delay spectrum response of the optical device to be tested.
Preferably, the frequency is ω0The other optical carrier of + delta omega is obtained by applying a frequency of omega0Is obtained by shifting the frequency Δ ω of the split signal of the optical carrier.
Preferably, the two paths of suppressed second-order double-sideband signals with odd orders are obtained by modulating with an electro-optical modulator working at a maximum transmission working point.
Based on the same inventive concept, the following technical scheme can be obtained:
an optical device frequency response measuring apparatus comprising:
an electro-optical modulation unit for modulating the frequency to omega1Is modulated at a frequency omega0The first path of odd-order suppressed second-order double-sideband signal is generated on the first path of optical carrier wave, and the frequency is omega2Is modulated at a frequency omega0Generating a second path of odd-order suppressed second-order double-sideband signal on the other path of optical carrier of + delta omega;
the coupling and photoelectric conversion unit is used for coupling the two paths of suppressed second-order double-sideband signals of odd orders and then dividing the two paths of suppressed second-order double-sideband signals into two paths, wherein one path is used as a reference path to be directly subjected to photoelectric conversion into a reference path electric signal, and the other path is used as a test path to be subjected to photoelectric conversion into a test path electric signal after passing through an optical device to be tested;
a measurement and processing unit for measuring the +2 order frequency component Δ ω +2(ω) in the reference path electrical signal2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) For reference, extracting the photocurrents of the two frequency components in the electrical signal of the test path, and calculating the frequency of the device to be measured
Figure BDA0002732506940000033
Frequency of (f) and
Figure BDA0002732506940000041
amplitude response of (d)
Figure BDA0002732506940000042
Figure BDA0002732506940000043
And time delay response
Figure BDA0002732506940000044
Figure BDA0002732506940000045
Figure BDA0002732506940000046
Figure BDA0002732506940000047
Figure BDA0002732506940000048
Figure BDA0002732506940000049
Wherein ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined; i.e. imea(*)、isysAnd the photocurrents are the photocurrents of the frequency components in the electric signals of the test paths under the conditions that the test paths are connected with the optical device to be tested and are not connected with the optical device to be tested respectively.
Further, the measurement and processing unit is further configured to: synchronously changing the frequencies of the first microwave signal and the second microwave signal and ensuring the frequency difference (omega)2-ω1) The above processes are constant and repeated to obtain the light detector to be measuredThe amplitude spectral response and the time delay spectral response of the element.
Preferably, the electro-optical modulation unit includes two electro-optical modulators operating at a maximum transmission operating point, and is configured to modulate the two paths of suppressed second-order double-sideband signals with odd orders.
Preferably, the frequency is ω0The other optical carrier of + delta omega is obtained by applying a frequency of omega0Is obtained by shifting the frequency Δ ω of the split signal of the optical carrier.
Compared with the prior art, the technical scheme of the invention has the following beneficial effects:
the invention is not influenced by a first-order sideband and a high-order sideband, and can improve the measurement precision;
the invention utilizes the second-order sideband, which can improve the measuring range;
thirdly, when the frequency sweep measurement is carried out, the +2 order frequency component delta omega +2 (omega) in the electric signals of the reference path and the test path2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) The photoelectric detector is constant and small, so that only a low-speed photoelectric detector is needed, and the performance requirement of the photoelectric detector is effectively reduced;
and fourthly, the measurement and processing unit only needs to work at a fixed frequency point, so that the performance requirement of the optical device on the measurement of the photocurrent can be reduced.
Drawings
Fig. 1 is a schematic structural diagram of an embodiment of an optical device frequency response measuring apparatus according to the present invention.
Detailed Description
Aiming at the defects in the prior art, the solution idea of the invention is to measure the amplitude spectrum response and the time delay spectrum response of the optical device simultaneously by using the odd-order suppressed second-order double-sideband signal based on the microwave photon technology, so that the measurement range and the measurement precision can be greatly improved, and the performance requirement on the electric signal measurement can be greatly reduced by only measuring the amplitude-phase information of the electric signal at a fixed frequency point.
The invention provides a method for measuring the frequency response of an optical device, which comprises the following steps:
will have a frequency of ω1Is modulated at a frequency omega0The first path of odd-order suppressed second-order double-sideband signal is generated on the first path of optical carrier wave, and the frequency is omega2Is modulated at a frequency omega0Generating a second path of odd-order suppressed second-order double-sideband signal on the other path of optical carrier of + delta omega; coupling the two paths of the suppressed second-order double-sideband signals with odd orders and then dividing the signals into two paths, wherein one path is used as a reference path to be directly photoelectrically converted into a reference path electric signal, and the other path is used as a test path to be photoelectrically converted into a test path electric signal after passing through an optical device to be tested; with the +2 order frequency component Δ ω +2(ω) in the reference path electrical signal2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) For reference, extracting the photocurrents of the two frequency components in the electrical signal of the test path, and calculating the frequency of the device to be measured
Figure BDA0002732506940000051
Frequency of (f) and
Figure BDA0002732506940000052
amplitude response of (d)
Figure BDA0002732506940000053
Figure BDA0002732506940000054
And time delay response
Figure BDA0002732506940000055
Figure BDA0002732506940000056
Figure BDA0002732506940000061
Figure BDA0002732506940000062
Figure BDA0002732506940000063
Figure BDA0002732506940000064
Wherein ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined; i.e. imea(*)、isysAnd the photocurrents are the photocurrents of the frequency components in the electric signals of the test paths under the conditions that the test paths are connected with the optical device to be tested and are not connected with the optical device to be tested respectively.
The invention provides a frequency response measuring device of an optical device, which comprises:
an electro-optical modulation unit for modulating the frequency to omega1Is modulated at a frequency omega0The first path of odd-order suppressed second-order double-sideband signal is generated on the first path of optical carrier wave, and the frequency is omega2Is modulated at a frequency omega0Generating a second path of odd-order suppressed second-order double-sideband signal on the other path of optical carrier of + delta omega;
the coupling and photoelectric conversion unit is used for coupling the two paths of suppressed second-order double-sideband signals of odd orders and then dividing the two paths of suppressed second-order double-sideband signals into two paths, wherein one path is used as a reference path to be directly subjected to photoelectric conversion into a reference path electric signal, and the other path is used as a test path to be subjected to photoelectric conversion into a test path electric signal after passing through an optical device to be tested;
a measurement and processing unit for measuring the +2 order frequency component Δ ω +2(ω) in the reference path electrical signal2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) For reference, extracting the photocurrents of the two frequency components in the electrical signal of the test path, and calculating the frequency of the device to be measured
Figure BDA0002732506940000065
Frequency of (f) and
Figure BDA0002732506940000066
amplitude response of (d)
Figure BDA0002732506940000067
Figure BDA0002732506940000068
And time delay response
Figure BDA0002732506940000069
Figure BDA0002732506940000071
Figure BDA0002732506940000072
Figure BDA0002732506940000073
Figure BDA0002732506940000074
Figure BDA0002732506940000075
Wherein ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined; i.e. imea(*)、isysAnd the photocurrents are the photocurrents of the frequency components in the electric signals of the test paths under the conditions that the test paths are connected with the optical device to be tested and are not connected with the optical device to be tested respectively.
On the basis, the frequencies of the first microwave signal and the second microwave signal are synchronously changed and the frequency difference (omega) between the two is ensured2-ω1) And (5) constantly repeating the steps to obtain the amplitude spectrum response and the time delay spectrum response of the optical device to be tested.
For the public understanding, the technical scheme of the invention is explained in detail by a specific embodiment and the accompanying drawings:
as shown in fig. 1, the optical device frequency response measuring apparatus in the present embodiment includes: the device comprises a light source, a light beam splitter, a light frequency shifter, an electro-optic modulator 1, an electro-optic modulator 2, a bias point controller 1, a bias point controller 2, a microwave source 1, a microwave source 2, an optical coupler, a photoelectric detector 1, a photoelectric detector 2, a fixed low-frequency amplitude-phase extraction unit and a main control unit. The optical beam splitter outputs the optical carrier omega of the light source0Is divided into an upper path and a lower path; the microwave signal omega output by the microwave source 11Modulated to an upstream optical carrier omega by an electro-optical modulator 10In the above, the electro-optical modulator 1 is biased at the maximum transmission operating point by the bias point controller 1, and the positive and negative second-order sidebands with the odd-order suppressed are respectively omega0+2ω1And ω0-2ω1The double sideband signal of (a); down-path optical carrier omega0Shifting a fixed frequency Δ ω by an optical frequency shifter to generate a frequency shifted optical carrier signal ω0+ Δ ω; the microwave signal omega output by the microwave source 22Modulated to a frequency shifted optical carrier omega by an electro-optical modulator 20At + delta omega, the electro-optical modulator 2 is biased at the maximum transmission working point through the bias point controller 2, and positive and negative second-order sidebands with odd-order suppressed are respectively omega0+Δω+2ω2And ω0+Δω-2ω2The frequency-shifted double sideband signal; the two paths of second-order double-sideband signals are coupled and then divided into two paths by the optical coupler, one path is a reference path, and the optical signals are directly converted into reference path electric signals by the photoelectric detector 2; one path is a test path, a detection signal is transmitted by an optical device to be tested, and then the optical signal is converted into a test path electrical signal by the photoelectric detector 1, and a fixed low-frequency amplitude-phase extraction unit (in the embodiment, a vector network analyzer is adopted) extracts a component in the test path electrical signal by taking a component in the reference path electrical signal as a reference; the main control unit processes the extracted component information to obtain the optical device to be measured
Figure BDA0002732506940000081
(i.e., the mean frequency of the two +2 order sideband frequency components) and
Figure BDA0002732506940000082
(i.e., the mean frequency of the two-2 th order sideband frequency components) amplitude response and delay response information at these two frequencies; changing the frequencies of the first microwave signal and the second microwave signal and ensuring the frequency difference (omega)2-ω1) And (5) constantly repeating the steps to obtain the amplitude spectrum response and the time delay spectrum response of the optical device to be tested.
In order to make the technical solution of the present invention more clearly understood, the following further detailed description of the measurement principle of the present invention:
optical carrier omega output by light source0Is divided into an upper path and a lower path; the microwave signal omega output by the microwave source 11Modulating the signal to an upper path optical carrier through an electro-optical modulator 1 to generate a positive and a negative second-order sidebands respectively omega with odd-order suppressed0+2ω1And ω0-2ω1The double sideband signal of (a), the double sideband signal can be represented as:
Figure BDA0002732506940000083
wherein A isnAn amplitude value (n ═ infinity to + ∞, n is an integer) of an nth-order sideband of the double-sideband signal, and ω is an integer0Is the angular frequency, omega, of the optical carrier1Is the angular frequency of the microwave signal output by the microwave source 1.
The downlink optical carrier omega is transmitted by a frequency shifter0Shifting a fixed frequency Δ ω to produce a shifted optical carrier signal ω0+ Δ ω; the microwave signal omega output by the microwave source 22Modulated to a frequency shifted optical carrier omega by an electro-optical modulator 20At + Δ ω, the generation of the odd order suppressed shifted second order double sideband signal can be expressed as:
Figure BDA0002732506940000084
wherein, BnAmplitude representing the n-order sideband of a frequency shifted second-order double sideband signalValues of values (n ═ infinity to + ∞, n being an integer), ω0+ Δ ω is the angular frequency of the frequency-shifted optical carrier, ω2Is the angular frequency of the microwave signal output by the microwave source 2.
The optical signal generated by coupling the two second-order double-sideband signals can be represented as:
E(t)＝E1(t)+E2(t) (3)
dividing the optical signal E (t) into two paths, one path is a test path, the other path is a reference path, and the test path passes through a device to be tested to obtain:
Figure BDA0002732506940000091
wherein the system function H (ω) is HDUT(ω)·Hsys(ω)，HDUT(ω) is the transfer function of the optical device under test, Hsys(ω) is the transfer function of the system.
The optical signal E' (t) is input into a photoelectric detector for beat frequency, and two microwave signals delta omega +2 (omega) with different frequencies and carrying spectral response information of an optical device can be obtained2-ω1) And Δ ω -2(ω)2-ω1). Extraction of Delta omega +2 (omega)2-ω1) And Δ ω -2(ω)2-ω1) The information of these two frequency components is:
Δω+2(ω2-ω1): this frequency component (we always assume ω2-ω1< Δ ω) is generated by the +2 order sideband of the double sideband signal and the +2 order sideband beat of the shifted double sideband signal,
Figure BDA0002732506940000092
where η is the responsivity of the photodetector.
Δω-2(ω2-ω1): this frequency component (we always assume ω2-ω1< Δ ω) is generated by the-2 order sideband of the double sideband signal and the-2 order sideband beat frequency of the shifted double sideband signal,
Figure BDA0002732506940000101
where η is the responsivity of the photodetector.
The fixed low-frequency amplitude-phase extraction unit can acquire amplitude and phase information of the photocurrent by taking the photocurrent of the reference circuit as reference. In order to eliminate the influence of the measurement system on the measurement result, the amplitude and phase response information of the measurement system is obtained by a direct calibration mode (namely, the optical device to be tested is not connected in the test path, the optical detector 2 is directly inputted with the output end of the coupler to detect the optical signal, and the delta omega +2 (omega) in the test path at the moment is measured2-ω1) And Δ ω -2(ω)2-ω1) The photocurrents of the two frequency components), in which case the photocurrent is expressed as:
Figure BDA0002732506940000102
Figure BDA0002732506940000103
due to Δ ω +2(ω)2-ω1) And Δ ω -2(ω)2-ω1) These two frequency components are small and the same order sideband signals of the double sideband signal and the shifted double sideband signal are treated as identical by the amplitude response of the optical device, i.e.
Figure BDA0002732506940000104
Figure BDA0002732506940000105
The amplitude response is obtained from equations (5) to (10):
Figure BDA0002732506940000106
Figure BDA0002732506940000107
the delay response can also be obtained from equations (5) to (8):
Figure BDA0002732506940000108
Figure BDA0002732506940000109
here, ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined.
Changing omega1And ω2And ensure the frequency difference (omega) between the two2-ω1) The value is a constant value, and then the measurement process is repeated to obtain the amplitude spectrum response and the time delay spectrum response of the optical device to be measured; the main control unit controls the frequency sweeping processes of the two microwave sources, processes the amplitude and phase information output by the fixed low-frequency amplitude and phase extraction unit and outputs the amplitude spectrum response and the time delay spectrum response of the optical device to be tested.

Claims (8)

1. A method for measuring frequency response of optical device is characterized in that the frequency is omega1Is modulated at a frequency omega0The first path of odd-order suppressed second-order double-sideband signal is generated on the first path of optical carrier wave, and the frequency is omega2Is modulated at a frequency omega0Generating a second path of odd-order suppressed second-order double-sideband signal on the other path of optical carrier of + delta omega; coupling the two paths of the suppressed second-order double-sideband signals with odd orders and then dividing the signals into two paths, wherein one path is used as a reference path to be directly photoelectrically converted into a reference path electric signal, and the other path is used as a test path to be photoelectrically converted into a test path electric signal after passing through an optical device to be tested; with reference circuitFrequency component Δ ω +2(ω) of order +2 in the signal2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) For reference, extracting the photocurrents of the two frequency components in the electrical signal of the test path, and calculating the frequency of the device to be measured
Figure FDA0002732506930000011
Frequency of (f) and
Figure FDA0002732506930000012
amplitude response of (d)
Figure FDA0002732506930000013
And time delay response
Figure FDA0002732506930000014
Figure FDA0002732506930000015
Figure FDA0002732506930000016
Figure FDA0002732506930000017
Figure FDA0002732506930000018
Wherein ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined; i.e. imea(*)、isysAnd the photocurrents are the photocurrents of the frequency components in the electric signals of the test paths under the conditions that the test paths are connected with the optical device to be tested and are not connected with the optical device to be tested respectively.
2. The optical device frequency response measuring method of claim 1, further comprising: synchronously changing the frequencies of the first microwave signal and the second microwave signal and ensuring the frequency difference (omega)2-ω1) And (5) constantly repeating the steps to obtain the amplitude spectrum response and the time delay spectrum response of the optical device to be tested.
3. The optical device frequency response measuring method according to claim 1 or 2, wherein the frequency is ω0The other optical carrier of + delta omega is obtained by applying a frequency of omega0Is obtained by shifting the frequency Δ ω of the split signal of the optical carrier.
4. The optical device frequency response measuring method according to claim 1 or 2, wherein the two paths of odd-order suppressed second-order double-sideband signals are obtained by modulation using an electro-optical modulator operating at a maximum transmission operating point.
5. An optical device frequency response measuring apparatus, comprising:
an electro-optical modulation unit for modulating the frequency to omega1Is modulated at a frequency omega0The first path of odd-order suppressed second-order double-sideband signal is generated on the first path of optical carrier wave, and the frequency is omega2Is modulated at a frequency omega0Generating a second path of odd-order suppressed second-order double-sideband signal on the other path of optical carrier of + delta omega;
the coupling and photoelectric conversion unit is used for coupling the two paths of suppressed second-order double-sideband signals of odd orders and then dividing the two paths of suppressed second-order double-sideband signals into two paths, wherein one path is used as a reference path to be directly subjected to photoelectric conversion into a reference path electric signal, and the other path is used as a test path to be subjected to photoelectric conversion into a test path electric signal after passing through an optical device to be tested;
a measurement and processing unit for measuring the +2 order frequency component Δ ω +2(ω) in the reference path electrical signal2-ω1) And-2 order frequency component Δ ω -2(ω)2-ω1) For reference, the photocurrents at the two frequency components in the electrical signal of the test path are extracted, and thenCalculating the frequency of the device to be measured
Figure FDA0002732506930000021
Frequency of (f) and
Figure FDA0002732506930000022
amplitude response of (d)
Figure FDA0002732506930000023
Figure FDA0002732506930000024
And time delay response
Figure FDA0002732506930000025
Figure FDA0002732506930000026
Figure FDA0002732506930000027
Figure FDA0002732506930000028
Figure FDA0002732506930000029
Figure FDA0002732506930000031
Wherein ang () is a function for finding an angle, and for a complex number a ═ α × exp (j θ), ang (a) ═ θ is defined; i.e. imea(*)、isysFrequency components in the electrical signal of the test path under the conditions that the optical device to be tested is connected with the test path and the optical device to be tested is not connected with the test pathThe photocurrent of (c).
6. The optical device frequency response measuring apparatus of claim 5, wherein the measurement and processing unit is further configured to: synchronously changing the frequencies of the first microwave signal and the second microwave signal and ensuring the frequency difference (omega)2-ω1) And (5) constantly repeating the steps to obtain the amplitude spectrum response and the time delay spectrum response of the optical device to be tested.
7. The optical device frequency response measuring apparatus according to claim 5 or 6, wherein the electro-optical modulation unit includes two electro-optical modulators operating at a maximum transmission operating point, and is configured to modulate the two paths of odd-order suppressed second-order double-sideband signals.
8. An optical device frequency response measuring apparatus as claimed in claim 5 or 6, wherein said frequency is ω0The other optical carrier of + delta omega is obtained by applying a frequency of omega0Is obtained by shifting the frequency Δ ω of the split signal of the optical carrier.
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