CN112180239B - Method for detecting reliability problem of input end and output end of integrated circuit - Google Patents
Method for detecting reliability problem of input end and output end of integrated circuit Download PDFInfo
- Publication number
- CN112180239B CN112180239B CN202011035786.2A CN202011035786A CN112180239B CN 112180239 B CN112180239 B CN 112180239B CN 202011035786 A CN202011035786 A CN 202011035786A CN 112180239 B CN112180239 B CN 112180239B
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- CN
- China
- Prior art keywords
- parasitic
- integrated circuit
- detecting
- leakage
- steps
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202011035786.2A CN112180239B (en) | 2020-09-27 | 2020-09-27 | Method for detecting reliability problem of input end and output end of integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202011035786.2A CN112180239B (en) | 2020-09-27 | 2020-09-27 | Method for detecting reliability problem of input end and output end of integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
CN112180239A CN112180239A (en) | 2021-01-05 |
CN112180239B true CN112180239B (en) | 2022-01-21 |
Family
ID=73945144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202011035786.2A Active CN112180239B (en) | 2020-09-27 | 2020-09-27 | Method for detecting reliability problem of input end and output end of integrated circuit |
Country Status (1)
Country | Link |
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CN (1) | CN112180239B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113451167B (en) * | 2021-07-19 | 2024-05-14 | 捷捷半导体有限公司 | Packaging test method and device and electronic equipment |
CN115097249A (en) * | 2022-07-19 | 2022-09-23 | 上海理工大学 | Method for detecting surface state defect of failed operational amplifier |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6838869B1 (en) * | 2001-04-02 | 2005-01-04 | Advanced Micro Devices, Inc. | Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters |
JP2007207380A (en) * | 2006-02-03 | 2007-08-16 | Renesas Technology Corp | Nonvolatile semiconductor memory device |
CN102385029A (en) * | 2011-08-26 | 2012-03-21 | 上海宏力半导体制造有限公司 | Method for testing high-voltage MOS device |
CN103675577B (en) * | 2012-09-18 | 2016-12-21 | 北京中电华大电子设计有限责任公司 | A kind of circuit realizing the detection of IO reverse leakage in integrated circuits |
CN103969544B (en) * | 2014-03-04 | 2018-02-16 | 深圳博用科技有限公司 | A kind of integrated circuit high pressure pin continuity testing method |
CN105990823A (en) * | 2015-01-28 | 2016-10-05 | 京微雅格(北京)科技有限公司 | Electrostatic discharge (ESD) protection structure at chip input/output port and chip |
CN105510759B (en) * | 2015-11-30 | 2019-05-28 | 华为技术有限公司 | Electric leak detecting device and its detection method |
CN208862817U (en) * | 2018-08-27 | 2019-05-14 | 珠海市中科蓝讯科技有限公司 | Upper pull down resistor circuit, I/O circuit and chip |
-
2020
- 2020-09-27 CN CN202011035786.2A patent/CN112180239B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN112180239A (en) | 2021-01-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Ju Shuirong Inventor after: Xia Huaqiu Inventor after: Zhu Jianzhou Inventor after: Tan Yimin Inventor after: Lv Wensheng Inventor before: Ju Shuirong Inventor before: Xia Huaqiu Inventor before: Zhu Jianzhou Inventor before: Tan Yimin Inventor before: Lv Wensheng |
|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: No. 88, Zhongtong East Road, Shuofang street, Xinwu District, Wuxi City, Jiangsu Province Patentee after: Jiangsu Donghai Semiconductor Co.,Ltd. Address before: No. 88, Zhongtong East Road, Shuofang street, Xinwu District, Wuxi City, Jiangsu Province Patentee before: WUXI ROUM SEMICONDUCTOR TECHNOLOGY Co.,Ltd. |