CN112179291A - Calibration method of self-rotating scanning type line structured light three-dimensional measurement device - Google Patents
Calibration method of self-rotating scanning type line structured light three-dimensional measurement device Download PDFInfo
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- CN112179291A CN112179291A CN202011008958.7A CN202011008958A CN112179291A CN 112179291 A CN112179291 A CN 112179291A CN 202011008958 A CN202011008958 A CN 202011008958A CN 112179291 A CN112179291 A CN 112179291A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
Abstract
The invention discloses a calibration method of a self-rotating scanning line structured light three-dimensional measurement device, and belongs to the technical field of three-dimensional measurement. The self-rotating scanning type linear structured light three-dimensional measuring device mainly comprises a linear structured light profile measuring instrument and a high-precision rotary table, wherein a coordinate system of the self-rotating scanning type linear structured light three-dimensional measuring device is generally established based on a rotating axis of the high-precision rotary table and is not superposed with a coordinate system of the linear structured light profile measuring instrument, and the position relationship between the coordinate system and the coordinate system cannot be accurately determined through mechanical installation. The calibration method realizes the calibration of the position parameters between the coordinate system of the line structured light profile measuring instrument and the coordinate system of the self-rotating scanning line structured light three-dimensional measuring device by means of the plane target, is simple, convenient and effective, and is favorable for improving the measurement precision of the self-rotating scanning line structured light three-dimensional measuring device.
Description
Technical Field
The invention belongs to the technical field of three-dimensional measurement, and particularly relates to a calibration method of a self-rotating scanning line structured light three-dimensional measurement device.
Background
Parts such as large-scale pipelines, pressure vessels, tank bodies and the like are one of important parts of petrochemical engineering and nuclear power engineering projects. After the components such as the pipeline, the pressure container, the tank body and the like are used for a certain period in operation, the geometric dimension detection needs to be carried out on the inside of the pipeline, the inside of the pressure container and the inside of the tank body. Because these parts have been installed at the job site, and the field environment is abominable, and the operating mode is complicated, and personnel are difficult to get into to measure, and traditional three-coordinate measuring machine is difficult to accomplish relevant work more.
In order to measure the internal geometric dimensions of components such as pipelines, pressure vessels, tanks and the like, the self-rotating scanning line structured light three-dimensional measuring device can be mounted on a robot or an automatic device and enters the interior of the components to measure the three-dimensional dimensions. The self-rotating scanning type line structure light three-dimensional measuring device is composed of a line structure light profile measuring instrument and a high-precision rotating platform, wherein the line structure light profile measuring instrument is installed on the high-precision rotating platform, and the high-precision rotating platform drives the line structure light profile measuring instrument to rotate and scan to realize three-dimensional size measurement.
Generally, a coordinate system of a self-rotation scanning type linear structured light three-dimensional measuring device is established on a rotating axis of a high-precision rotating table, and because the coordinate system of a linear structured light profile measuring instrument is not coincident with a rotating axis coordinate system of the high-precision rotating table, data measured by the coordinate system of the linear structured light profile measuring instrument needs to be converted into data under the coordinate system of the self-rotation scanning type linear structured light three-dimensional measuring device, and the relationship between the coordinate system and the coordinate system is difficult to be accurately determined through mechanical installation, so that the calibration of the position relationship between the coordinate system of the linear structured light profile measuring instrument and the rotating axis of the high-precision rotating table becomes a key problem.
Disclosure of Invention
The invention aims to solve the problems and provides a calibration method of a self-rotating scanning type linear structured light three-dimensional measuring device based on multi-plane constraint, which aims to calibrate the parameter relationship between the coordinate system of a linear structured light profile measuring instrument and the coordinate system of the self-rotating scanning type linear structured light three-dimensional measuring device with high precision.
The technical scheme adopted by the invention is as follows: a calibration method for a self-rotating scanning line structured light three-dimensional measuring device comprises the following steps:
step A, designing and processing a plane target with a proper size;
b, placing the planar target to be measured in the measuring range of the self-rotating scanning line structured light three-dimensional measuring device;
c, starting the self-rotating scanning type linear structured light three-dimensional measuring device to acquire three-dimensional data of the plane target under a linear structured light profile measuring instrument coordinate system;
d, changing the position of the plane target to be detected (such as rotating or front-back left-right translation), and repeating the step C to obtain three-dimensional data of the plane target under the coordinate system of the linear structured light profile measuring instrument;
and E, based on the mechanical position relation between the linear structure light profile measuring instrument and the rotating shaft of the high-precision rotating table, preliminarily estimating position parameters between the linear structure light profile measuring instrument and the rotating shaft, and further establishing a conversion relation between three-dimensional data under a coordinate system of the linear structure light profile measuring instrument and three-dimensional measurement data under a self-rotating scanning type linear structure light three-dimensional measuring device. And converting the three-dimensional data of the planar target, which is obtained for many times in the step C, D, in the coordinate system of the linear structured light profile measuring instrument into three-dimensional data of the planar target in the self-rotating scanning type linear structured light three-dimensional measuring device.
And F, fitting each plane by adopting a least square method based on the condition that three-dimensional data of each group of plane targets under the self-rotating scanning type line structured light three-dimensional measuring device respectively meet plane constraint to obtain the mean square of each planeRoot error rmse1，rmse2，…，rmsem；
Step G, average value of rmse values of fitting results of each group of three-dimensional data is minimized
And (3) iteratively solving a relative position parameter between the coordinate system of the linear structure light profile measuring instrument and the coordinate system of the self-rotation scanning type linear structure light three-dimensional measuring device as a target.
By using the calibration method of the self-rotation scanning type linear structure light three-dimensional measuring device based on the multi-plane constraint, parameter calibration between the coordinate system of the linear structure light profile measuring instrument and the coordinate system of the self-rotation scanning type linear structure light three-dimensional measuring device is completed. Compared with the prior art, the following beneficial effects can be obtained:
the invention completes calibration by means of a plane target, does not depend on the installation precision of a mechanical structure, greatly reduces the equipment installation requirement and improves the system measurement precision. In addition, a complex calibration target is not needed, and the manufacturing difficulty of the target is reduced.
Drawings
FIG. 1 is a working diagram of a self-rotating scanning line structured light three-dimensional measurement system of the present invention;
FIG. 2 is a schematic diagram of a three-dimensional measurement system with a self-rotating scanning line structure;
FIG. 3 is a diagram of the relationship between the coordinate system of the line structured light profile measuring apparatus and the coordinate system of the self-rotating scanning line structured light three-dimensional measuring apparatus according to the present invention;
FIG. 4 is a schematic diagram of a calibration method of a self-rotation scanning line structured light three-dimensional measurement device based on multi-plane constraint according to the present invention;
FIG. 5 is a schematic diagram of coordinate transformation of a calibration method of a self-rotation scanning line structured light three-dimensional measurement device based on multi-plane constraint.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described below with reference to specific examples and accompanying drawings.
The calibration method of the self-rotation scanning line structured light three-dimensional measurement device based on multi-plane constraint can be used for realizing three-dimensional measurement of components such as large pipelines, pressure vessels, tanks and the like. The calibration of the line structured light three-dimensional measuring device is realized by scanning the plane targets at a plurality of positions; then the linear structured light three-dimensional measuring probe collects the single section outline of the part, and the polar coordinates are converted into a Cartesian coordinate system through angle information provided by the rotary scanning of the high-precision rotary table, so that the three-dimensional reconstruction of the internal appearance of the part is completed.
As shown in fig. 1, the self-rotating scanning type linear structure light three-dimensional measuring system comprises a linear structure light profile measuring instrument and a high-precision rotating table, wherein the high-precision rotating table is fixedly connected with a housing of the linear structure light profile measuring instrument, the rotating shaft direction is parallel to the strip laser direction, and the self-rotating scanning of the linear structure light profile measuring instrument is realized by controlling the high-precision rotating table to rotate;
as shown in FIG. 2, the coordinate system of the line structured light profile measuring apparatus is OXYZ, and the coordinate system of the self-rotating scanning line structured light measuring apparatus is OrXrYrZr. Wherein, OrZrThe axis coincides with the central axis of the rotary table, and the OZ axis is parallel to the O axisrZrThe axes are parallel, the YOZ plane coincides with the laser plane, and the point O is at XrOrYrOn a plane. m and n are the distance between the two coordinate origins on the axis OrXrAnd axis OrYrThe position parameters m and n can be calibrated by the calibration method of the self-rotating scanning line structured light three-dimensional measuring device based on multi-plane constraint. The method comprises the following specific steps:
step A, designing and processing a plane target with a proper size; wherein, the size of the target is determined according to the size of the designed three-dimensional measuring device;
step B, placing the plane target in the measuring range of the self-rotating scanning line structured light three-dimensional measuring device, as shown in FIG. 3;
c, starting a self-rotating scanning type linear structured light three-dimensional measuring device to acquire three-dimensional data (x, y, z) of the plane target under a linear structured light profile measuring instrument coordinate system;
d, changing the position of the plane target to be detected (such as rotating or front-back left-right translation), and repeating the step C to obtain three-dimensional data of the plane target under the coordinate system of the linear structured light profile measuring instrument;
e, estimating position parameters m and n according to the installation positions of the high-precision rotating table and the linear structure light profile measuring instrument, and further establishing a conversion relation between three-dimensional data under a coordinate system of the linear structure light profile measuring instrument and three-dimensional measuring data under a coordinate system of a self-rotating scanning type linear structure light three-dimensional measuring device;
the coordinate system conversion method is as follows:
the conversion principle of the measurement data is shown in FIG. 4, when the angle alpha is rotated, the coordinate of the measurement point P under the coordinate system of the line structured light profile measuring instrument is (x)i,yi,zi) The coordinate under the coordinate system of the self-rotating scanning line structured light three-dimensional measuring device is (x)r,yr,zr)：
L＝n-yi
Xr＝R×cos(-γ)
Yr＝R×sin(-γ)
Zr＝Zi
Wherein m ═ OrA,n＝OA,R＝OrO,L＝P’A。
Alpha is a line segment OrA and axis OrXrAt an angle of between, gamma is OrP' and axis OrXrBeta is OrP' andthe angle between the axes OY.
Therefore, the temperature of the molten metal is controlled,
converting the three-dimensional data of the planar target obtained for multiple times in the step C, D under the coordinate system of the linear structured light profile measuring instrument into three-dimensional data of the planar target under the self-rotating scanning type linear structured light three-dimensional measuring device;
and F, fitting each plane by adopting a least square method based on the condition that three-dimensional data of each group of plane targets under the self-rotating scanning type line structured light three-dimensional measuring device respectively meet plane constraint to obtain the root mean square error rmse of each plane1，rmse2，…，rmsem；
Step G, average value of rmse values of fitting results of each group of three-dimensional data is minimizedAnd iteratively solving a relative position parameter between the coordinate system of the linear structure light profile measuring instrument and the coordinate system of the self-rotating scanning linear structure light three-dimensional measuring device to obtain a calibration result, wherein the m and n values with the minimum S values are the calibration result.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (2)
1. A calibration method of a three-dimensional measuring device based on self-rotation scanning line structured light is characterized by comprising the following steps: the method comprises the following steps:
step A, designing and processing a plane target with a proper size;
b, placing the planar target to be measured in the measuring range of the self-rotating scanning line structured light three-dimensional measuring device;
c, starting the self-rotating scanning type linear structured light three-dimensional measuring device to acquire three-dimensional data of the plane target under a linear structured light profile measuring instrument coordinate system;
d, changing the position of the plane target to be detected, and repeating the step C to obtain three-dimensional data of the plane target under the coordinate system of the linear structured light profile measuring instrument if the plane target to be detected rotates or moves forwards, backwards, leftwards and rightwards;
step E, based on the mechanical position relationship between the linear structure light profile measuring instrument and the rotating shaft of the high-precision rotating table, preliminarily estimating position parameters between the linear structure light profile measuring instrument and the rotating shaft, further establishing a conversion relationship between three-dimensional data under a coordinate system of the linear structure light profile measuring instrument and three-dimensional measurement data under a self-rotating scanning type linear structure light three-dimensional measurement device, and converting the three-dimensional data of the planar target, which is obtained for many times in the step C, D, under the coordinate system of the linear structure light profile measuring instrument into three-dimensional data of the planar target under the self-rotating scanning type linear structure light three;
and F, fitting each plane by adopting a least square method based on the condition that three-dimensional data of each group of plane targets under the self-rotating scanning type line structured light three-dimensional measuring device respectively meet plane constraint to obtain the root mean square error rmse of each plane1，rmse2，…，rmsem；
Step G, average value of rmse values of fitting results of each group of three-dimensional data is minimized
And (3) iteratively solving a relative position parameter between the coordinate system of the linear structure light profile measuring instrument and the coordinate system of the self-rotation scanning type linear structure light three-dimensional measuring device as a target.
2. The calibration method of the self-rotation scanning line structured light three-dimensional measurement device based on the multi-plane constraint as recited in claim 1, wherein: the coordinate system conversion method in the step E is as follows:
when the angle alpha is rotated, the coordinate of the measuring point P under the coordinate system of the linear structured light profile measuring instrument is (x)i,yi,zi) The coordinate under the coordinate system of the self-rotating scanning line structured light three-dimensional measuring device is (x)r,yr,zr)：
L＝n-yi
Xr＝R×cos(-γ)
Yr＝R×sin(-γ)
Zr＝Zi
Wherein m ═ OrA,n＝OA,R＝OrO,L＝P’A，
Alpha is a line segment OrA and axis OrXrAt an angle of between, gamma is OrP' and axis OrXrBeta is OrThe angle between P' and the axis OY;
that is to say that the first and second electrodes,
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| CN112833791A (en) * | 2021-02-02 | 2021-05-25 | 浙江大学 | Space-time calibration method for self-rotating line structured light scanning system |
| CN114923453A (en) * | 2022-05-26 | 2022-08-19 | 杭州海康机器人技术有限公司 | Calibration method and device for external parameter of linear contourgraph and electronic equipment |
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