CN112147496B - Electronic switch testing device and method - Google Patents
Electronic switch testing device and method Download PDFInfo
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- CN112147496B CN112147496B CN202010922677.6A CN202010922677A CN112147496B CN 112147496 B CN112147496 B CN 112147496B CN 202010922677 A CN202010922677 A CN 202010922677A CN 112147496 B CN112147496 B CN 112147496B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The application discloses electronic switch testing arrangement and method relates to electronic switch technical field, and electronic switch testing arrangement includes: the device comprises a control unit, a switch to be tested, a load simulation unit, a counting unit and an impact current detection unit. The control unit is used for controlling the on and off states of the switch to be tested; the load simulation unit is used for generating impact current when the load simulation unit is conducted with the power supply through the switch to be tested; the impact current detection unit is used for detecting whether impact current exists when the switch to be tested is conducted, if so, the counting unit is triggered to update a current counting value, the current counting value represents the conduction times of the load simulation unit and the power supply, and if not, a test stopping instruction is sent to the control unit. This application has tested the life of the switch that awaits measuring under great impulse current through simple and easy mode.
Description
Technical Field
The application relates to the technical field of service life detection devices of electronic switches, in particular to a device and a method for testing an electronic switch.
Background
At present, electronic switches are widely used in intelligent lighting systems in various occasions, wherein some lamps in the lighting system may be LED (Light Emitting Diode) lamps, and the LED lamps have certain capacitance, and a large impact current may be generated at the switching moment of the electronic switch, which may cause damage to the electronic switch. Therefore, it is very important to detect the service life of the electronic switch under a large impact current.
Disclosure of Invention
The application provides an electronic switch testing device and method to overcome the defects.
In a first aspect, an embodiment of the present application provides an electronic switch testing apparatus, including: the device comprises a control unit, a switch to be tested, a load simulation unit, a counting unit, a rectifying unit and an impulse current detection unit, wherein the control unit is used for controlling the on-off state of the switch to be tested; the load unit is used for generating impact current when the load simulation unit is conducted with the power supply through the switch to be tested; the impact current detection unit is used for detecting whether impact current exists when the switch to be tested is conducted, if so, the counting unit is triggered to update a current counting value, the current counting value represents the conduction times of the load simulation unit and the power supply, and if not, a test stopping instruction is sent to the control unit.
In a second aspect, an embodiment of the present application further provides an electronic switch testing method, where the method includes: the power supply is controlled to be turned on or off through the control unit; when the power supply is started, the switch to be tested is controlled to be in a conducting state through the control unit; detecting whether an impact current exists or not through an impact current detection unit; if the current count value is the current count value, triggering a counting unit to update the current count value, wherein the current count value represents the conduction times of the load simulation unit and the power supply; and if not, sending a test stopping instruction to the control unit.
The application provides an electronic switch testing device and a method, and the electronic switch testing device comprises: the device comprises a control unit, a switch to be tested, a load simulation unit, a counting unit, a rectifying unit and an impact current detection unit. The power supply is controlled to be turned on or off through the control unit, when the power supply is turned on, the control unit controls the switch to be tested to be in a conducting state, whether impulse current exists or not is detected through the impulse current detection unit, if yes, the counting unit is triggered to update a current counting value, the current counting value represents the conducting times of the load simulation unit and the power supply, and if not, a test stopping instruction is sent to the control unit. Therefore, the service life of the switch to be tested under the condition of larger impact current is tested in a simple and feasible mode.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a block diagram illustrating an electronic switch testing apparatus according to an embodiment of the present application;
FIG. 2 is another block diagram of an electronic switch testing apparatus according to an embodiment of the present application;
FIG. 3 is a block diagram of an electronic switch testing device according to an embodiment of the present application;
FIG. 4 is a block diagram of another embodiment of an electronic switch testing apparatus;
FIG. 5 is a block diagram of an electronic switch testing apparatus according to an embodiment of the present application;
FIG. 6 is a schematic flow chart illustrating an electronic switch testing method provided by an embodiment of the present application;
FIG. 7 is a flow diagram illustrating sub-steps of S630 of FIG. 6 in one embodiment;
fig. 8 is a schematic flow chart illustrating an electronic switch testing method according to an embodiment of the present application.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
In the description of the present invention, the terms "first", "second", and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; may be mechanically, electrically or may be in communication with each other; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood according to specific situations by those of ordinary skill in the art.
At present, because an LED has certain capacitance, when an electronic switch is switched on and off instantaneously, a large impact current is generated in a circuit, which may cause the electronic switch to fail or burn out, and the service life of the electronic switch when the LED with fixed power is loaded cannot be verified.
Therefore, in order to solve the above technical problems, embodiments of the present application provide an electronic switch testing apparatus and method, which can be used to test the service life of an electronic switch under a large impact current.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an electronic switch testing apparatus 10 according to an embodiment of the present disclosure. The electronic switch testing device 10 includes a control unit 110, a switch to be tested 120, a load simulation unit 130, a counting unit 140, an inrush current detection unit 150, and a power supply 160.
The power source 160, the switch to be tested 120 and the load simulation unit 130 are sequentially connected in series, the control unit 110 is electrically connected with the switch to be tested 120, the power source 160 is electrically connected with the control unit 110, the counting unit 140 is connected with the load simulation unit 130 in parallel, and the impact current detection unit 150 is electrically connected with the load simulation unit 130.
In this embodiment, the control unit 110 is used to control the on/off state of the whole circuit of the electronic switch testing device 10 at the beginning and the end of the test. In detail, the control unit 110 may be connected in series with the switch 120 to be tested to control the on and off states between the switch 120 to be tested and the power supply 160. The control unit 110 may be connected to the switch 120 to be tested only without being connected in series with the switch 120 to be tested, so as to control the on/off state between the switch 120 to be tested and the power supply 160, thereby controlling the on/off state of the circuit of the electronic switch testing apparatus 10.
In one embodiment, the control unit 110 is connected in series with the switch to be tested 120, referring to fig. 2, fig. 2 shows another schematic structural diagram of the electronic switch testing apparatus 10 provided in this embodiment, where the electronic switch testing apparatus 10 includes the control unit 110, the switch to be tested 120, a load simulation unit 130, a counting unit 140, an impulse current detection unit 150, a power supply 160, and a rectification unit 170.
The power supply 160, the switch to be tested 120, the rectifying unit 170 and the load simulation unit 130 are sequentially connected in series, the control unit 110 is connected in series with the switch to be tested 120, the power supply 160 is electrically connected with the control unit 110, the counting unit 140 is connected in parallel with the load simulation unit 130, and the impact current detection unit 150 is electrically connected with the load simulation unit 130.
In this embodiment, the power supply 160 is used to provide a stable voltage to the entire test circuit. The load simulation unit 130 may be configured to generate a rush current when the load simulation unit 130 is conducted with the power supply 160 through the switch 120 to be tested.
The electronic switch testing device 10 may further include a rectifying unit 170, where the rectifying unit 170 is connected in series with the power supply 160, the switch 120 to be tested, and the control unit 110, and is configured to convert the ac voltage output by the power supply 160 into a positive half-axis voltage.
In practical applications, the rectifying unit 170 may be a rectifying bridge, and the rectifying unit 170 may rectify the ac power generated by the power supply 160 into dc power. In some cases, the rectifying unit 170 may further include a rectifying bridge and a filter circuit, i.e., the dc voltage passing through the rectifying bridge is not stable enough, and the rectified voltage may be filtered by the filter circuit to reach a stable voltage.
Alternatively, when the switch 120 under test is in an off state, the load simulation unit 130 may be disconnected from the power supply 160 through the switch 120 under test. When the switch 120 to be tested is in a conducting state, at the moment when the load simulation unit 130 is conducted with the power supply 160, an impulse current is generated in the load simulation unit 130, wherein the impulse current is a large current generated in a circuit at the moment when the load simulation unit is powered on, and generally, the phenomenon of generating the impulse current is mainly reflected in a capacitive load, such as a capacitor.
As shown in fig. 2, the load simulation unit 130 may include a pure resistive load 131 and a capacitor 132, and the capacitor 132 is connected in parallel with the pure resistive load 131. The purely resistive load 131 may be configured to simulate an output load of the capacitive load, and the capacitor 132 may be configured to generate the inrush current when the switch to be tested is turned on with the power supply 160. It can be understood that the output load LED of the whole circuit can be regarded as two parts, namely a capacitive part and a pure resistive part, and correspondingly, the load simulation unit 130 also includes a capacitive part and a pure resistive part, where the capacitive part is the capacitor 132 and the pure resistive part is the pure resistive load 131.
In this embodiment, when the switch 120 to be tested is in a conducting state, at the moment when the capacitor 132 in the load simulation unit 130 is conducted with the power supply, the capacitor 132 is equivalent to a short circuit at this moment, that is, the capacitor 132 generates an impulse current with a larger current value at the moment of conducting. Further, the inrush current detection device 150 is configured to detect whether the inrush current is an inrush current meeting the test requirement, and the counting unit 140 is configured to update the current count value when the inrush current is detected. When the test is stopped, the current count value in the counting unit 140 is the service life of the switch 120 under test at the inrush current meeting the test requirement.
In the embodiment of the present application, the resistance value of the pure resistive load 131 is determined according to the rated power of the capacitive load and the terminal voltage of the load simulation unit 130.
Optionally, the capacitive load is an LED load in the original circuit, and the rated power of the capacitive load is the rated power of the LED load correspondingly to ground, and according to a formula R = U for calculating the resistance 2 It can be known that the resistance value of the pure resistive load 131 is calculated by the rated power of the capacitive load and the terminal voltage of the load simulation unit 130, the terminal voltage of the load simulation unit 130 is the output voltage obtained by the output voltage of the power supply 160 through the rectification unit 170, and correspondingly, the output voltage obtained by the rectification unit 170 is the terminal voltage of the load simulation unit 130. Illustratively, the load simulation unit 130 has a voltage rating of 220 volts and a power rating of 20 watts according to the formula R = U 2 The resistance of the pure resistive load 131 in the load simulation unit 130 can be calculated as 11 ohms.
The impulse current detection unit 150 is electrically connected to the load simulation unit 130 and the counting unit 140 and connected to the control unit 110, and configured to detect whether an impulse current exists when the switch to be tested 120 is turned on, if so, trigger the counting unit 140 to update a current count value, where the current count value represents the number of times of turning on the load simulation unit 130 and the power supply 160, and if not, send a test stop instruction to the control unit 110.
In this embodiment, the load simulation unit 130 and the counting unit 140 may be electrically connected in parallel, the inrush current detection unit 150 is electrically connected to the load simulation unit 130, and the connection may be that one end of the load simulation unit 130 is connected to the inrush current detection unit 150, and further, the inrush current detection unit 150 may detect whether an inrush current exists in a circuit where the load simulation unit 130 is located.
In another embodiment, as shown in fig. 3, the control unit 110 is not connected in series with only the switch 120 to be tested, but is only electrically connected to the switch 120 to be tested, referring to fig. 3, fig. 3 shows another schematic structural diagram of the electronic switch testing apparatus 10 provided in this embodiment, where the electronic switch testing apparatus 10 includes the control unit 110, the switch 120 to be tested, a load simulation unit 130, a counting unit 140, an inrush current detection unit 150, a power supply 160, and a rectification unit 170.
The power supply 160, the switch to be tested 120, the rectifying unit 170 and the load simulating unit 130 are sequentially connected in series, the control unit 110 is electrically connected with only the switch to be tested 120, the power supply 160 is electrically connected with the control unit 110, the counting unit 140 is connected with the load simulating unit 130 in parallel, and the inrush current detecting unit 150 is electrically connected with the load simulating unit 130.
The power supply 160 is used to provide a stable voltage to the entire test circuit. The load simulation unit 130 may be configured to generate a rush current when the load simulation unit 130 is conducted with the power supply 160 through the switch 120 to be tested. The rectifying unit 170 is connected in series with the power supply 160, the switch 120 to be tested, and the control unit 110, and is configured to convert the ac voltage output by the power supply 160 into a positive half-axis voltage.
The load simulation unit 130 may include a pure resistive load 131 and a capacitor 132, and the capacitor 132 is connected in parallel with the pure resistive load 131. The purely resistive load 131 may be configured to simulate an output load of the capacitive load, and the capacitor 132 may be configured to generate the inrush current when the switch to be tested is turned on with the power supply 160.
The impulse current detection unit 150 is electrically connected to the load simulation unit 130 and the counting unit 140, and is connected to the control unit 110, and configured to detect whether an impulse current exists when the switch 120 to be tested is turned on, if so, trigger the counting unit 140 to update a current count value, where the current count value represents the number of times that the load simulation unit 130 and the power supply 160 are turned on, and if not, send a test stop instruction to the control unit 110.
The inrush current detection device 150 is configured to detect whether the inrush current is an inrush current meeting a test requirement, and the counting unit 140 is configured to update a current count value when the inrush current is detected. When the test is stopped, the current count value in the counting unit 140 is the service life of the switch 120 under test at the inrush current meeting the test requirement.
Optionally, the electronic switch testing apparatus 10 further includes a cyclic test program, which is used to periodically control the switch under test 120, the load simulation unit 130, and the switching between the on state and the off state of the power supply 160. The loop test program may be set in the control unit 110 or in the switch to be tested 120.
Optionally, when the loop test program is set in the control unit 110, please refer to fig. 4, fig. 4 shows a schematic structural diagram of the electronic switch testing apparatus 10 provided in this embodiment, in which the electronic switch testing apparatus 10 includes the control unit 110, the switch to be tested 120, the load simulating unit 130, the counting unit 140, the inrush current detecting unit 150, the power supply 160, and the rectifying unit 170.
The power supply 160, the switch to be tested 120, the rectifying unit 170 and the load simulating unit 130 are sequentially connected in series, the control unit 110 is connected in series with the switch to be tested 120, the power supply 160 is electrically connected with the control unit 110, the counting unit 140 is connected in parallel with the load simulating unit 130, and the impact current detecting unit 150 is electrically connected with the load simulating unit 130. The control unit 110 and the switch 120 to be tested in the embodiment of the present application are connected in series at this time, and the connection manner may not be selected to be connected in series, that is, the control unit is only electrically connected to the switch 120 to be tested, which is not limited in this application.
The control unit 110 includes a cyclic test program 180, and correspondingly, when the cyclic test program 180 is disposed in the control unit 110, the control unit 110 is configured to control not only the on-off state of the overall circuit of the electronic switch testing apparatus 10 at the beginning and the end of the test, but also the on-off state of the switch to be tested 120 and the power supply 160 to be switched periodically during the test, for example, the control unit 110 may turn off the switch to be tested 120 repeatedly every 5 seconds through the cyclic test program.
For example, at the moment when the switch 120 to be tested is turned on, the capacitor 132 in the load simulation unit 130 generates a large current, and the inrush current detection unit 150 may detect whether the large current is an inrush current, that is, the inrush current detection unit 150 may detect whether the large current reaches the current value of the inrush current to be tested, for example, in this embodiment, the service life of the switch 120 to be tested under an inrush current of 200 amperes is detected, correspondingly, the inrush current detection unit 150 may detect whether the current value of the large current generated by the capacitor 132 in the load simulation unit 130 reaches 200 amperes, and if the large current reaches 200 amperes, the inrush current detection unit 150 determines that the large current is an inrush current meeting the requirement.
Further, the inrush current detection unit 150 is further configured to repeatedly determine whether the current generated by the load simulation unit 130 is the inrush current within a second preset time period after the switch to be tested 120 is turned on, and if a determination result is yes in the second preset time period, the inrush current detection unit 150 determines that the inrush current is generated in the test circuit within the second preset time period, and correspondingly, the counting unit 140 updates the current count value once for each time the load simulation unit 130 generates a current within the second time period. For example, the second preset time period may be 15s, the loop test program may control the switch 120 to be tested to be switched once every 5s, that is, the switch 120 to be tested may be switched 3 times within 15s, correspondingly, the load simulation unit 130 may generate 3 times of large current within 15s, the inrush current detection unit 150 may check whether the current value of the large current generated 3 times reaches the standard value (e.g., 200A) of the inrush current, if the current detection unit 150 detects that the current values of the large currents for 3 times are 150A, 140A, and 201A respectively, where the current value of the large current for one time reaches 200A, the inrush current detection unit 150 determines that the inrush current is generated in the circuit within 15s, and the counting unit 140 updates the counting value for 3 times within 15 s.
Optionally, the counting unit 140 is configured to count up the current count value by 1 each time the inrush current is detected. Based on the above example, the initial count value of the counting unit 140 is 0, where the initial count value of 0 indicates that the number of times of connection between the load simulation unit 130 and the power supply 160 is 0, and the load simulation unit generates 3 times of large current, the value of the counting unit 140 is accumulated to 1 every time the counting unit 140 detects the large current, and the value of the counting unit 140 is accumulated to three times when the large current is detected three times, and correspondingly, the value of the counting unit 140 is 3, and correspondingly, the value of 3 of the counting unit 140 indicates that the number of times of connection between the load simulation unit 130 and the power supply 160 is 3.
In this embodiment, when the counting unit 140 does not detect the current within the first preset time period after the switch 120 to be tested is turned on, the current count value is maintained, and the test stopping instruction is sent to the control unit 110.
Further, the control unit 110 receives the test stopping instruction, the control unit 110 may stop the operation of the cyclic test program 180 for repeating the intermittent switch at intervals according to the test stopping instruction, and/or the control unit 110 may stop the service life test of the switch to be tested 120 by turning off the power 160 of the entire test circuit according to the test stopping instruction.
Since the counting unit 140 includes a hall current sensor therein, the counting unit 140 can detect whether or not a current is present in the circuit. The first preset time period is generally less than or equal to the second preset time period. For example, the first preset time period may be 8s, that is, when the counting unit 140 does not detect current within 8s after the switch 120 to be tested is turned on, the counting unit 140 keeps the current count value unchanged, and sends a stop test instruction to the control unit 110, where the stop test instruction is used for the control unit 110 to stop testing the switch 120 to be tested according to the stop test instruction. In practical applications, the counting unit 110 detects no current in the circuit within 8s, which may be the case that the switch to be tested 120 is damaged or the load simulation unit 130 is damaged, so that the whole test circuit is in an open circuit state, and in consideration of this case, the counting unit 140 correspondingly sends a test stopping instruction to the control unit 110 to stop the test when the current is detected within the first preset time period.
Correspondingly, the control unit 110 receives the test stopping instruction sent by the counting unit 140, and the control unit 110 may stop the to-be-tested switch to repeat the cycle test program 180 of the intermittent switch every third preset time period according to the test stopping instruction and/or the control unit 110 may stop the service life test of the to-be-tested switch 120 according to the test stopping instruction by turning off the power supply 160 of the whole test circuit.
The inrush current detection unit 150 is further configured to determine whether the current generated by the load simulation unit 130 is the inrush current multiple times within a second preset time period after the switch 120 to be tested is turned on, and send the test stopping instruction to the control unit 110 if the determination result is negative every time within the second preset time period, where the second preset time period is greater than the first preset time period, and the first time period is greater than the third time period.
Illustratively, still taking the second preset time period as 15s and generating the current 3 times within 15s as an example, if the current values of the currents generated by the load simulation unit 130 detected by the inrush current detection unit 150 three times are 100A, 150A and 130A, respectively, the current value meeting the test requirement is regarded as the inrush current when reaching 200A, and since the current values detected by the inrush current detection unit 150 three times do not reach 200A, in this case, the inrush current detection unit 160 determines that there is no inrush current within the second preset time period, and sends the test stopping instruction to the control unit 110.
Correspondingly, the control unit 110 receives the test stopping instruction sent by the impulse test unit 160, and the control unit 110 may stop to make the switch to be tested repeat the cycle test program 180 of the intermittent switch every third time period according to the test stopping instruction and/or the control unit 110 may turn off the power supply 160 of the whole test circuit according to the test stopping instruction to stop the service life test of the switch to be tested 120.
In one embodiment, when the loop test program is set in the switch to be tested 120, please refer to fig. 5, fig. 5 shows another schematic structural diagram of the electronic switch testing apparatus 10 provided in this embodiment, in which the electronic switch testing apparatus 10 includes a control unit 110, the switch to be tested 120, a load simulation unit 130, a counting unit 140, an impulse current detection unit 150, a power supply 160, and a rectification unit 170.
The power supply 160, the switch to be tested 120, the rectifying unit 170 and the load simulation unit 130 are sequentially connected in series, the control unit 110 is connected in series with the switch to be tested 120, the power supply 160 is electrically connected with the control unit 110, the counting unit 140 is connected in parallel with the load simulation unit 130, and the impact current detection unit 150 is electrically connected with the load simulation unit 130. The control unit 110 and the switch 120 to be tested in the embodiment of the present application are connected in series at this time, and the connection manner may not be selected to be connected in series, that is, the control unit 110 is only electrically connected to the switch 120 to be tested, which is not limited in this application.
The switch 120 to be tested includes a cyclic test program 180, and correspondingly, when the cyclic test program 180 is disposed in the switch 120 to be tested, the control unit 110 is only used for controlling the on-off state of the whole circuit of the electronic switch testing apparatus 10 when starting the test and ending the test, and the switch 120 to be tested is responsible for periodically controlling the on-off state switching between the switch 120 to be tested and the power supply 160, for example, the switch 120 to be tested can be controlled by the cyclic test program to repeatedly turn off the switch 120 to be tested every 5 seconds.
The impulse current detection unit 150 is electrically connected to the load simulation unit 130 and the counting unit 140, and is connected to the control unit 110, and configured to detect whether an impulse current exists when the switch 120 to be tested is turned on, if so, trigger the counting unit 140 to update a current count value, where the current count value represents the number of times that the load simulation unit 130 and the power supply 160 are turned on, and if not, send a test stop instruction to the control unit 110.
When the control unit 110 receives the test stopping instruction, the control unit 110 may turn off the power supply 160 of the entire test circuit according to the test stopping instruction, and stop the service life test of the switch to be tested 120.
In this embodiment, when the counting unit 140 does not detect the current within the first preset time period after the switch to be tested 120 is turned on, the current counting value is kept, and the test stopping instruction is sent to the control unit 110, correspondingly, the control unit 110 receives the test stopping instruction, and the control unit 110 may turn off the power 160 of the whole test circuit according to the test stopping instruction, so as to stop the service life test of the switch to be tested 120.
In the embodiment of the application, the service life of any switch to be tested can be tested for multiple times.
It is understood that for any switch under test 120 that is connected, the counting unit 140 is further configured to receive a zero instruction before starting testing the switch under test 120, and clear the historical count data in the counting unit 140 according to the zero instruction.
The counting unit 140 has a power-down protection function, for example, when the power supply 160 in the test circuit is turned off, the counting unit 140 still maintains the current counting value, so that the historical counting data of the counting unit 140 can be cleared before the test of another switch 120 under test is started. The zero setting instruction may be that a tester manually presses an instruction key, and correspondingly, the counting unit 140 receives the zero setting instruction sent by the tester and clears the historical counting data in the counting unit 140 according to the zero setting instruction.
Therefore, in the electronic switch testing device 10 provided in the embodiment of the present application, the control unit 110 controls the power supply 160 to be turned on or off, when the power supply 160 is turned on, the to-be-tested switch 120 is in a conducting state, and the inrush current detection unit 150 detects whether the inrush current exists, if the inrush current exists, the counting unit 140 is triggered to update the current count value, where the current count value represents the conducting times of the load simulation unit 130 and the power supply 160, and if the inrush current does not exist, the control unit 110 is sent a test stopping instruction. Thus, the service life of the switch 120 to be tested under a large impact current is tested in a simple and easy manner.
Referring to fig. 6, fig. 6 shows an electronic switch testing method, which is applied to the electronic switch testing apparatus, and specifically, the method may include: s610 to S650.
S610: the power supply 160 is controlled to be turned on or off by the control unit 110.
In this embodiment, the control unit 110 can control the power supply 160 of the whole test circuit to be turned on or off.
S620: when the power supply 160 is turned on, the switch 120 to be tested is controlled to be in a conducting state by the control unit 110.
Optionally, when the control unit 110 controls the whole test circuit power supply 160 to be turned on, the control unit 110 may also control the switch to be tested 120 to be in the on state, where the control unit 110 controls the on state of the switch to be tested 120 through the loop test program 180 in the control unit 110, that is, the switch to be tested 120 may be turned on every third preset time period (for example, 5 s) through the loop test program 180 in the control unit 110. In one possible example, the switch 120 to be tested may be turned on every third predetermined time period by the loop test program 180 in the switch 120 to be tested.
S630: the presence or absence of a rush current is detected by the rush current detection unit 150.
Alternatively, it may be detected by the inrush current detection unit 150 whether there is an inrush current in the entire test circuit in the on state of the switch 120 to be tested.
Alternatively, the detection of whether there is a rush current may specifically be implemented as shown in fig. 7, that is, S430 may be implemented by the steps shown in fig. 7.
S631, judging whether the detected current is the impact current for multiple times within a second preset time period after the switch to be detected is turned on through the impact current detection unit.
In this embodiment, at the moment when the to-be-tested switch 120 is turned on, the load simulation unit 130 generates a large current, and when the current value of the large current reaches the current value of the impulse current required by the test, for example, 200A, the large current is determined to be the impulse current meeting the condition.
And S632, if the judgment result is negative, determining that the impact current is not generated, wherein the second preset time period is greater than the first preset time period.
For example, the second preset time period may be 15s, that is, within 15s, the load simulation unit 130 may generate 3 times of current, and correspondingly, within 15s, the three generated currents may be detected by the inrush current detection unit 150, for example, the current values detected by the inrush current detection unit 150 three times are 110A, 120A, and 160A, respectively, but the current value of the eligible inrush current is 200A, and it may be determined that none of the currents generated by the load simulation unit 130 and detected by the inrush current detection unit 150 three times is the eligible inrush current, and it may be determined that the inrush current is not generated within the second preset time period, that is, no inrush current is detected by the inrush current detection unit 150.
And S633, if any judgment result is yes, determining that the impact current is generated.
In this embodiment, in a second preset time period, the inrush current detection unit 150 detects that the current generated in any one time of the second preset time period meets the condition of the inrush current, and then determines that the inrush current exists in the second preset time period, and correspondingly, the current generated by the load simulation unit 130 in the second preset time period each time triggers the counting unit 140 to update the current value, that is, the counting unit 140 in the second preset time period counts up 1 for each time the current is detected. For example, the current values detected three times by the inrush current detection unit 150 are 110A, 200A, and 203A, respectively, and the currents generated two times all meet the condition of the inrush current, it may be determined that the inrush current is detected by the inrush current detection unit 150 within the second preset time period, that is, the currents generated each time within the second preset time period may be regarded as the inrush current.
And S640: if yes, the counting unit 140 is triggered to update the current count value, which represents the number of times of conducting the load simulation unit 130 and the power supply 160.
In one possible example, if the inrush current detection unit 150 detects that the switch 120 under test is turned on and there is an inrush current in the test circuit, the test is not stopped, and the counting unit 140 updates the current count value once every time the inrush current is detected, where the count value in the counting unit 140 represents the number of times that the load simulation unit 130 and the power supply 160 are turned on.
S650: if not, a stop test instruction is sent to the control unit 110.
Optionally, if the impulse current detection unit 150 detects that the switch 120 to be tested is under conduction and there is no impulse current in the test circuit, the impulse current detection unit 150 may send a test stop instruction to the control unit 110 to stop the whole test, and when the test is stopped, the count value in the count unit 140 is the service life of the switch 120 to be tested under impulse current. Still taking the example in S433 as an example, the count value in the counting unit 140 is accumulated 3 times, and if the initial value in the counting unit 140 is 0, the current value in the counting unit 140 is 3, which represents that the number of times the load simulation unit 130 and the power supply 160 are turned on is 3 times.
Referring to fig. 8, fig. 8 is another schematic flow chart illustrating an electronic switch testing method according to an embodiment of the present disclosure.
S810: and judging whether current exists or not in a first preset time period after the switch to be tested is switched on through the counting unit.
In this embodiment, the counting unit 140 includes a hall current sensor, and can detect whether current exists in a first preset time period after the switch 120 to be tested is turned on through the hall current sensor, where the first preset time period is not greater than the second preset time period, and the first preset time period may be 8s, that is, whether current exists in 8s after the switch 120 to be tested is turned on through the counting unit 140.
S820: if the judgment result is negative, the counting unit keeps the current counting value and sends the test stopping instruction to the control unit.
Alternatively, when the counting unit 140 does not detect the current within 8s, the counting unit 140 may transmit a stop test instruction to the control unit 110. It can be understood that, when the counting unit 140 does not detect the current within 8s, which may be that the whole test circuit is in an open circuit state due to the damaged switch 120 to be tested or the damaged load simulation unit, based on this situation, a test stopping instruction may be sent to the control unit 110 through the counting unit 140, wherein, when the cyclic test program 180 is located in the control unit 110, the control unit 110 may stop causing the cyclic test program 180 of the discontinuous switch to be repeatedly stopped at intervals according to the test stopping instruction and/or the control unit 110 may turn off the power supply 160 of the whole test circuit according to the test stopping instruction, and stop the service life test of the switch 120 to be tested; when the loop test program 180 is located in the switch 120 to be tested, the control unit can only turn off the power supply 160 of the entire test circuit according to the test stop instruction, and stop the service life test of the switch 120 to be tested. When the test is stopped, the value in the counting unit 140 is the detected service life of the switch 120 under test under the impact current source.
In summary, the electronic switch testing apparatus 10 and the method provided by the present invention control the power supply 160 to be turned on or off through the control unit 110, when the power supply 160 is turned on, the control unit 110 controls the switch 120 to be tested to be in a conducting state, and the inrush current detection unit 150 detects whether there is an inrush current, if there is an inrush current, the counting unit 140 is triggered to update the current count value, where the current count value represents the conducting times of the load simulation unit 130 and the power supply 160, and if not, the control unit 110 is sent a test stopping instruction. Therefore, the service life of the switch to be tested under the condition of larger impact current is tested in a simple and feasible mode.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The apparatus embodiments described above are merely illustrative, and for example, the flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention.
In addition, the functional modules in the embodiments of the present invention may be integrated together to form an independent part, or each module may exist alone, or two or more modules may be integrated to form an independent part.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not necessarily depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.
Claims (9)
1. An electronic switch testing apparatus, the apparatus comprising:
the control unit is connected with the switch to be tested and is used for controlling the on-off state of the switch to be tested;
a switch to be tested connected with a power supply;
the load simulation unit is connected with the switch to be tested in series and used for generating impact current when the load simulation unit is conducted with the power supply through the switch to be tested;
the counting unit is connected with the load simulation unit in parallel; and the number of the first and second groups,
the impact current detection unit is electrically connected with the load simulation unit and the counting unit and is connected with the control unit and used for detecting whether impact current exists or not when the switch to be tested is conducted, if so, the counting unit is triggered to update a current counting value, the current counting value represents the conducting times of the load simulation unit and the power supply, and if not, a test stopping instruction is sent to the control unit;
wherein the load simulation unit includes:
the pure resistive load is used for simulating the output load of the capacitive load; and the number of the first and second groups,
and the capacitor is connected with the pure resistive load in parallel and used for generating the impact current when the switch to be tested is conducted with the power supply.
2. The apparatus of claim 1, wherein the resistance value of the purely resistive load is determined according to a rated power of the capacitive load and a terminal voltage of the load simulation unit.
3. The apparatus according to claim 1 or 2, wherein the counting unit is configured to, each time the inrush current is detected, increment a current count value by 1; and the number of the first and second groups,
and when the counting unit does not detect current within a first preset time period after the switch to be tested is switched on, keeping the current counting value, and sending the test stopping instruction to the control unit.
4. The device according to claim 3, wherein the inrush current detection unit is further configured to determine whether the current generated by the load simulation unit is the inrush current multiple times within a second preset time period after the switch to be tested is turned on, and send the test stopping instruction to the control unit if a determination result is negative each time within the second preset time period, where the second preset time period is longer than the first preset time period.
5. The apparatus of claim 1, further comprising:
and the rectifying unit is used for converting the alternating voltage output by the power supply into positive half-axis voltage.
6. The apparatus of claim 1, wherein for any switch under test that is connected, the counting unit is further configured to receive a zero instruction before starting testing the switch under test, and clear the historical count data in the counting unit according to the zero instruction.
7. A method for detecting the lifetime of a switch, which is applied to the electronic switch test apparatus according to any one of claims 1 to 6, the method comprising:
the power supply is controlled to be turned on or off through the control unit;
when the power supply is started, the control unit controls the switch to be tested to be in a conducting state;
detecting whether an impact current exists or not through an impact current detection unit;
if the current count value is the current count value, triggering a counting unit to update the current count value, wherein the current count value represents the conduction times of the load simulation unit and the power supply;
and if not, sending a test stopping instruction to the control unit.
8. The method of claim 7, further comprising:
judging whether current exists or not in a first preset time period after the switch to be tested is conducted through the counting unit;
if the judgment result is negative, the counting unit keeps the current counting value and sends the test stopping instruction to the control unit.
9. The method according to claim 8, wherein the detecting whether there is a rush current by a rush current detecting unit comprises:
judging whether the detected current is the impact current or not for multiple times within a second preset time period after the switch to be detected is switched on through the impact current detection unit;
if the judgment result is negative, determining that the impact current is not generated, wherein the second preset time period is longer than the first preset time period;
and if any judgment result is yes, determining that the impact current is generated.
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| CN113805051B (en) * | 2021-09-08 | 2023-06-27 | 深圳市欧瑞博科技股份有限公司 | Switch performance testing method and device, electronic equipment and storage medium |
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